CN110726866B - High-voltage-level voltage qualification rate monitoring method and device - Google Patents
High-voltage-level voltage qualification rate monitoring method and device Download PDFInfo
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16585—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 for individual pulses, ripple or noise and other applications where timing or duration is of importance
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Abstract
The method utilizes data recorded in a power grid operation monitoring system and scene recording equipment to judge the examination type of the bus voltage measured by each measuring point, sets different constraint thresholds for different examination types, automatically calculates the voltage qualification rate of a plant station where the measuring points are located, and solves the problem that the calculation result error is large when the qualification rate is calculated by utilizing the voltage containing abnormal data in the prior art.
Description
Technical Field
The application relates to the technical field of power grid informatization, in particular to a high-voltage-level voltage qualification rate monitoring method and device.
Background
At present, various types of production activities depend on normal operation of a power grid, the power grid comprises power plants, substations, high-voltage distribution equipment and other stations, and the power grid can normally operate under the condition that each station can normally operate. In practical application, it is generally necessary to determine whether the power grid can operate normally by using voltage stability. Voltage stability is closely related to voltage yield, and therefore voltage yield needs to be monitored.
According to the difference of voltage grades of various stations, stations with voltage of 10kV or below are used as low-voltage-grade stations, and stations with voltage higher than 10kV are used as high-voltage-grade stations. For a low-voltage-level station, the voltage of a station bus is automatically monitored by a voltage monitor, whether the voltage of the station bus is qualified or not is determined by monitoring whether the voltage of the station bus is lower than a preset threshold value or not, and then the voltage qualification rate of the bus is determined. For a high-voltage-level plant station, a plurality of measuring points are usually arranged in the plant station, each measuring point is provided with a voltage monitoring device, the voltage monitoring devices are used for monitoring the voltage of a bus where the measuring point is located, the measured bus voltage is sent to a power grid operation monitoring system, whether the voltage of each bus in the plant station is qualified or not is determined by monitoring whether the voltage of each measuring point in the power grid operation monitoring system is maintained within a normal range of the measuring point, and then the voltage qualification rate of each bus in the plant station is determined.
When the voltage qualification rate of each bus in the high-voltage-level station is calculated, all voltages in the power grid operation monitoring system are used for calculation, however, the inventor finds that abnormal data may exist in the voltage obtained by the power grid operation monitoring system due to the fact that the bus measured by the measuring point may have abnormal conditions in the research process of the application, and the error of the calculation result is large when the qualification rate is calculated by using the voltage containing the abnormal data in the prior art.
Disclosure of Invention
The application provides a method and a device for monitoring the voltage qualification rate of a high-voltage grade, which are used for solving the problem that the error of a calculation result is larger when the qualification rate is calculated by using the voltage containing abnormal data in the prior art.
In a first aspect of the present application, a method for monitoring a voltage qualification rate of a high voltage class is provided, which includes:
acquiring the bus voltage of each measuring point in a power grid operation monitoring system;
acquiring a scene recording file in the operation of a power grid;
determining the assessment types of the measuring points in different time periods according to the scene recording file;
setting a constraint threshold value for each measuring point in different time periods according to the assessment type;
dividing the bus voltage into a normal bus voltage and an abnormal bus voltage according to whether the bus voltage meets the constraint threshold, wherein the bus voltage meeting the constraint threshold is used as the normal bus voltage, and the bus voltage not meeting the constraint threshold is used as the abnormal bus voltage;
and calculating the voltage qualification rate of the station where the measuring point is located according to the accumulation time corresponding to the normal bus voltage and the abnormal bus voltage.
Optionally, determining the assessment types of the measuring points in different time periods according to the scene recording file includes:
judging whether the bus where the measuring point is located has an abnormal condition in a time period corresponding to the bus voltage according to the scene recording file;
if no abnormal condition exists, setting the examination type of the measuring point as a static type;
if the abnormal condition exists, judging the type of the abnormal condition of the bus where the measuring point is located;
if the bus where the measuring point is located has a first-type abnormal condition, setting the examination type of the measuring point as a temporary voltage type, wherein the first-type abnormal condition is to test the bus where the measuring point is located;
and if a second type of abnormal condition exists in the bus where the measuring point is located, setting the examination type of the measuring point as a voltage curve type, wherein the second type of abnormal condition is that the bus where the measuring point is located is overhauled or the bus where the measuring point is located is in fault.
Optionally, setting a constraint threshold for each measurement point in different time periods according to the assessment type, including:
if the assessment type of the measuring point is a static type, taking a first historical constraint threshold of the measuring point as a new constraint threshold of the measuring point;
and/or the presence of a gas in the gas,
if the checking type of the measuring point is a temporary voltage type, dividing the measuring point into a temporary voltage time period and a normal voltage time period;
in the normal voltage time period, taking a second historical constraint threshold of the measuring point as a new constraint threshold of the measuring point;
in the temporary voltage time period, taking a first preset constraint threshold in the scene recording file as a new constraint threshold of the measuring point;
and/or the presence of a gas in the gas,
and if the checking type of the measuring point is a voltage curve type, setting a constraint threshold of the measuring point according to a second preset constraint threshold which is recorded in the scene recording file and corresponds to different time periods.
Optionally, calculating a voltage qualification rate of the plant station where the measurement point is located according to the accumulated time corresponding to the normal bus voltage and the abnormal bus voltage, including:
taking the product of the number of the normal bus voltages and the frequency of the monitoring bus voltages as the accumulation time of the normal bus voltages;
taking the product of the number of the abnormal bus voltages and the frequency of the monitoring bus voltages as the accumulation time of the abnormal bus voltages;
and calculating the voltage qualification rate of the plant station where the measuring point is located according to the following formula:
wherein, sigma is the voltage qualification rate of the plant station where the measuring point is located, T0The cumulative time of the abnormal bus voltage is T, and the cumulative time of the normal bus voltage is T.
Optionally, dividing the bus voltage into a normal bus voltage and an abnormal bus voltage according to whether the bus voltage meets the constraint threshold, including:
calculating a limit threshold according to the allowable fluctuation deviation of the bus voltage, wherein the upper limit value of the limit threshold is the sum of the upper limit value of the constraint threshold and the allowable fluctuation deviation, and the lower limit value of the limit threshold is the difference value of the lower limit value of the constraint threshold and the allowable fluctuation deviation;
judging whether the bus voltage is between the upper limit value of the limit threshold and the lower limit value of the limit threshold;
if so, determining that the bus voltage is a normal bus voltage;
otherwise, determining the bus voltage as an abnormal bus voltage.
In a second aspect of the present application, a voltage qualification rate monitoring device for a high voltage class is provided, comprising:
the first acquisition module is used for acquiring the bus voltage of each measuring point in the power grid operation monitoring system;
the second acquisition module is used for acquiring a scene recording file in the operation of the power grid;
the first judgment module is used for determining the examination type of each measuring point in different time periods according to the scene recording file;
the threshold setting module is used for setting a constraint threshold for each measuring point in different time periods according to the assessment type;
the second judgment module is used for dividing the bus voltage into a normal bus voltage and an abnormal bus voltage according to whether the bus voltage meets the constraint threshold, wherein the bus voltage meeting the constraint threshold is used as the normal bus voltage, and the bus voltage not meeting the constraint threshold is used as the abnormal bus voltage;
and the calculation module is used for calculating the voltage qualification rate of the plant station where the measuring point is located according to the accumulation time corresponding to the normal bus voltage and the abnormal bus voltage.
Optionally, the first determining module includes:
the first judgment unit is used for judging whether the bus where the measuring point is located has an abnormal condition in a time period corresponding to the bus voltage according to the scene record file;
the first type determining unit is used for setting the examination type of the measuring point as a static type if no abnormal condition exists;
the second judgment unit is used for judging the type of the abnormal condition of the bus where the measuring point is located if the abnormal condition exists;
the second type determining unit is used for setting the examination type of the measuring point as a temporary voltage type if a first type of abnormal condition exists in a bus where the measuring point is located, wherein the first type of abnormal condition is to test the bus where the measuring point is located;
and the third type determining unit is used for setting the examination type of the measuring point as a voltage curve type if a second type abnormal condition exists in the bus where the measuring point is located, wherein the second type abnormal condition is that the bus where the measuring point is located is overhauled or the bus where the measuring point is located is in fault.
Optionally, the threshold setting module includes:
the first threshold setting unit is used for taking the first historical constraint threshold of the measuring point as a new constraint threshold of the measuring point if the assessment type of the measuring point is a static type;
and/or the presence of a gas in the gas,
the time period dividing unit is used for dividing the measuring point into a temporary voltage time period and a normal voltage time period if the checking type of the measuring point is a temporary voltage type;
a second threshold setting unit, configured to use a second historical constraint threshold of the measurement point as a new constraint threshold of the measurement point in the normal voltage time period;
a third threshold setting unit, configured to use the first preset constraint threshold in the scene recording file as a new constraint threshold of the measurement point in the temporary voltage time period;
and/or the presence of a gas in the gas,
and the fourth threshold setting unit is used for setting the constraint threshold of the measuring point according to a second preset constraint threshold which is recorded in the scene recording file and corresponds to different time periods if the checking type of the measuring point is a voltage curve type.
Optionally, the calculation module includes:
the first accumulated time calculation unit is used for taking the product of the number of the normal bus voltages and the frequency of the monitoring bus voltages as the accumulated time of the normal bus voltages;
the second accumulated time calculation unit is used for taking the product of the number of the abnormal bus voltages and the frequency of the monitoring bus voltages as the accumulated time of the abnormal bus voltages;
the voltage qualification rate calculating unit is used for calculating the voltage qualification rate of the station where the measuring point is located according to the following formula:
wherein, sigma is the voltage qualification rate of the plant station where the measuring point is located, T0The cumulative time of the abnormal bus voltage is T, and the cumulative time of the normal bus voltage is T.
Optionally, the second determining module includes:
a limit threshold value calculation unit, configured to calculate a limit threshold value according to an allowable fluctuation deviation of the bus voltage, where an upper limit value of the limit threshold value is a sum of an upper limit value of the constraint threshold value and the allowable fluctuation deviation, and a lower limit value of the limit threshold value is a difference value between a lower limit value of the constraint threshold value and the allowable fluctuation deviation;
a third judging unit, configured to judge whether the bus voltage is between an upper limit value of the limit threshold and a lower limit value of the limit threshold;
a first bus voltage determination unit for determining that the bus voltage is a normal bus voltage if the bus voltage is between an upper limit value of the limit threshold and a lower limit value of the limit threshold;
and the second bus voltage determining unit is used for determining that the bus voltage is abnormal bus voltage if the bus voltage is not between the upper limit value of the limit threshold and the lower limit value of the limit threshold.
According to the technical scheme, the method for monitoring the voltage qualification rate of the high-voltage grade utilizes data recorded in a power grid operation monitoring system and scene recording equipment to judge the examination type of the bus voltage measured by each measuring point, different constraint thresholds are set for different examination types, and therefore the voltage qualification rate of a plant station where the measuring points are located is automatically calculated, and the problem that the calculation result error is large due to the fact that the qualification rate is calculated by the aid of the voltage containing abnormal data in the prior art is solved.
Drawings
In order to more clearly explain the technical solution of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious to those skilled in the art that other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a flowchart illustrating a method for monitoring a voltage qualification rate of a high voltage class according to an embodiment of the present disclosure;
fig. 2 is a schematic structural diagram of a voltage yield monitoring device of a high voltage class according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be described clearly and completely with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In order to solve the problem that in the prior art, the error of a calculation result is large when the yield is calculated by using a voltage containing abnormal data, the embodiment of the application provides a high-voltage-level voltage yield monitoring method.
The implementation of the embodiment of the application is based on the existing power grid operation monitoring system, data stored in the power grid operation monitoring system can be transmitted to the terminal in a wired or wireless mode, and the terminal carries out calculation according to the data transmitted by the power grid operation monitoring system.
In the embodiment of the present application, the terminal is a computer, such as a computer, a processor, and the like, having computing and storing functions.
In order to obtain the field conditions of each bus in different stations, the embodiment of the application is further provided with a scene recording device at each station, and the terminal can communicate with each scene recording device to obtain the scene recording file stored by the scene recording device.
Referring to a work flow chart shown in fig. 1, an embodiment of the present application provides a method for monitoring a voltage yield of a high voltage class, including the following steps:
The power grid operation monitoring system comprises a plurality of files for recording different data, the file obtained in the step is a file for recording bus voltage, for example, an E-format file in the existing power grid operation monitoring system is a file for recording bus voltage, and the step only needs to obtain the E-format file in the power grid operation monitoring system and then analyze the E-format file.
When the E-format file records bus voltage data, it usually records a measurement point name, a plant name, recording time, and the like corresponding to the bus voltage, and stores the obtained bus voltage according to different plants and different measurement points.
And 102, acquiring a scene record file in the operation of the power grid.
The scene recording file comprises the field conditions of the buses measured by the measuring points in different time periods.
In the embodiment of the application, the scene recording equipment is arranged at each station, can be manually controlled, or is connected with a sensor arranged on the site and is controlled by the sensor. For example, when a bus measured at a certain measuring point is overhauled or other abnormal conditions occur, the scene recording device records an overhauling time period or a time period corresponding to the occurrence of other abnormal conditions, and if no abnormal condition occurs, the scene recording device does not record the overhauling time period or the time period corresponding to the occurrence of other abnormal conditions.
And 103, determining the assessment types of the measuring points in different time periods according to the scene record file.
Optionally, determining the assessment types of the measuring points in different time periods according to the scene recording file includes the following steps:
judging whether the bus where the measuring point is located has an abnormal condition in a time period corresponding to the bus voltage according to the scene recording file;
if no abnormal condition exists, setting the examination type of the measuring point as a static type;
if the abnormal condition exists, judging the type of the abnormal condition of the bus where the measuring point is located;
if the bus where the measuring point is located has a first-type abnormal condition, setting the examination type of the measuring point as a temporary voltage type, wherein the first-type abnormal condition is to test the bus where the measuring point is located;
and if a second type of abnormal condition exists in the bus where the measuring point is located, setting the examination type of the measuring point as a voltage curve type, wherein the second type of abnormal condition is that the bus where the measuring point is located is overhauled or the bus where the measuring point is located is in fault.
And 104, setting a constraint threshold value for each measuring point in different time periods according to the assessment type.
In the step, if the bus where the measuring point is located has the first-type abnormal condition and/or the second-type abnormal condition, the terminal firstly searches whether a preset constraint threshold is recorded in a time period in which the abnormal condition exists from the scene record file. When an abnormal condition occurs, the bus voltage is different from the value under the normal condition, and at this time, a preset constraint threshold value for judging whether the bus voltage is normal is usually recorded in the scene record file, so that the terminal can find the preset constraint threshold value corresponding to the time period with the abnormal condition from the scene record file, and can judge the bus voltage according to the preset constraint threshold value.
And 105, dividing the bus voltage into a normal bus voltage and an abnormal bus voltage according to whether the bus voltage meets the constraint threshold, wherein the bus voltage meeting the constraint threshold is used as the normal bus voltage, and the bus voltage not meeting the constraint threshold is used as the abnormal bus voltage.
And 106, calculating the voltage qualification rate of the station where the measuring point is located according to the accumulation time corresponding to the normal bus voltage and the abnormal bus voltage.
In the step, because each plant station comprises a plurality of measuring points, the bus voltage data of different measuring points of the same plant station are collected, and the voltage qualification rate is calculated by taking the plant station as a unit, so that the voltage qualification rate of the plant station can be obtained.
According to the technical scheme, the method for monitoring the voltage qualification rate of the high-voltage grade utilizes data recorded in a power grid operation monitoring system and scene recording equipment to judge the examination type of the bus voltage measured by each measuring point, different constraint thresholds are set for different examination types, and therefore the voltage qualification rate of a plant station where the measuring points are located is automatically calculated, and the problem that the calculation result error is large due to the fact that the qualification rate is calculated by the aid of the voltage containing abnormal data in the prior art is solved.
Optionally, setting a constraint threshold for each measurement point in different time periods according to the assessment type, including:
if the assessment type of the measuring point is a static type, taking a first historical constraint threshold of the measuring point as a new constraint threshold of the measuring point;
and/or the presence of a gas in the gas,
if the checking type of the measuring point is a temporary voltage type, dividing the measuring point into a temporary voltage time period and a normal voltage time period;
in the normal voltage time period, taking a second historical constraint threshold of the measuring point as a new constraint threshold of the measuring point;
in the temporary voltage time period, taking a first preset constraint threshold in the scene recording file as a new constraint threshold of the measuring point;
and/or the presence of a gas in the gas,
and if the checking type of the measuring point is a voltage curve type, setting a constraint threshold of the measuring point according to a second preset constraint threshold which is recorded in the scene recording file and corresponds to different time periods.
In the embodiment of the application, the bus voltage is divided into three constraint types, correspondingly, constraint thresholds need to be set respectively according to different constraint types, and based on the scene record file and the historical constraint thresholds, the function of automatically setting the constraint thresholds of the bus voltage corresponding to the three constraint types can be realized.
In the embodiment of the application, the historical constraint threshold is a constraint threshold of the bus voltage of the same measuring point at the historical moment. Typically, the constraint threshold for normal bus voltage may be set with reference to its historical constraint threshold.
Optionally, calculating a voltage qualification rate of the plant station where the measurement point is located according to the accumulated time corresponding to the normal bus voltage and the abnormal bus voltage, including:
taking the product of the number of the normal bus voltages and the frequency of the monitoring bus voltages as the accumulation time of the normal bus voltages;
taking the product of the number of the abnormal bus voltages and the frequency of the monitoring bus voltages as the accumulation time of the abnormal bus voltages;
and calculating the voltage qualification rate of the plant station where the measuring point is located according to the following formula:
wherein, sigma is the voltage qualification rate of the plant station where the measuring point is located, T0The cumulative time of the abnormal bus voltage is T, and the cumulative time of the normal bus voltage is T.
In the embodiment of the present application, the monitoring of the bus voltage is based on a fixed time interval, and the time interval may be set according to different situations, for example, the set time interval is 1min, and the time interval is taken as the frequency of monitoring the bus voltage. The bus voltage is obtained by continuously monitoring the bus at each measurement point based on the frequency of the bus voltage, the product of the number of the bus voltages obtained in a fixed time period and the frequency is used as the cumulative time, for example, when the frequency is 1 min/100 of the number of the bus voltages, the cumulative time is 100 × 1 min/100 min, and the voltage pass rate is further calculated.
After the voltage qualification rate is calculated, a voltage qualification rate report can be generated according to the voltage qualification rate of each plant, and the voltage qualification rate report shows the name of the plant, the accumulation time of the abnormal bus voltage (out-of-limit accumulation time), the accumulation time of the normal bus voltage (effective accumulation time), the voltage qualification rate and the continuous out-of-limit accumulation time. The time interval between adjacent bus voltages is equal to the frequency of monitoring the bus voltages during the continuous out-of-limit accumulation time.
In addition, in order to conveniently check the voltage condition of the measuring points, the terminal can also automatically generate a voltage detail view of the measuring points, display the bus voltage of each measuring point every minute and mark the out-of-limit bus voltage.
In order to facilitate operation control personnel to master the overall situation and the variation trend of the measuring points, the bus voltage measured by each measuring point is drawn into a voltage curve graph and a voltage out-of-limit situation graph, the voltage curve graph and the voltage out-of-limit situation graph comprise year and month graphs, the variation situation and the variation trend of the voltage of the measuring points are longitudinally reflected, and the operation control personnel can analyze the voltage stability situation in an intuitive display mode.
Due to the self reason of the power grid operation monitoring system, sudden change of the external environment, a bus scene and the like, abnormal data inevitably exist in the voltage data acquired by the power grid operation monitoring system, and in this case, the abnormal bus voltage can be filtered through a fault screening algorithm.
Optionally, dividing the bus voltage into a normal bus voltage and an abnormal bus voltage according to whether the bus voltage meets the constraint threshold, including:
calculating a limit threshold according to the allowable fluctuation deviation of the bus voltage, wherein the upper limit value of the limit threshold is the sum of the upper limit value of the constraint threshold and the allowable fluctuation deviation, and the lower limit value of the limit threshold is the difference value of the lower limit value of the constraint threshold and the allowable fluctuation deviation;
judging whether the bus voltage is between the upper limit value of the limit threshold and the lower limit value of the limit threshold;
if so, determining that the bus voltage is a normal bus voltage;
otherwise, determining the bus voltage as an abnormal bus voltage.
Referring to the schematic structural diagram shown in fig. 2, an embodiment of the present application provides a voltage yield monitoring device for a high voltage class, including:
the first acquisition module 100 is used for acquiring bus voltages of various measuring points in the power grid operation monitoring system;
the second obtaining module 200 is configured to obtain a scene recording file in the operation of the power grid;
the first judgment module 300 is used for determining the assessment types of the measuring points in different time periods according to the scene recording file;
the threshold setting module 400 is used for setting a constraint threshold for each measuring point in different time periods according to the assessment type;
a second determining module 500, configured to divide the bus voltage into a normal bus voltage and an abnormal bus voltage according to whether the bus voltage meets the constraint threshold, where the bus voltage meeting the constraint threshold is used as the normal bus voltage, and the bus voltage not meeting the constraint threshold is used as the abnormal bus voltage;
and the calculating module 600 is configured to calculate a voltage qualification rate of the plant station where the measuring point is located according to the accumulated time corresponding to the normal bus voltage and the abnormal bus voltage.
Optionally, the first determining module includes:
the first judgment unit is used for judging whether the bus where the measuring point is located has an abnormal condition in a time period corresponding to the bus voltage according to the scene record file;
the first type determining unit is used for setting the examination type of the measuring point as a static type if no abnormal condition exists;
the second judgment unit is used for judging the type of the abnormal condition of the bus where the measuring point is located if the abnormal condition exists;
the second type determining unit is used for setting the examination type of the measuring point as a temporary voltage type if a first type of abnormal condition exists in a bus where the measuring point is located, wherein the first type of abnormal condition is to test the bus where the measuring point is located;
and the third type determining unit is used for setting the examination type of the measuring point as a voltage curve type if a second type abnormal condition exists in the bus where the measuring point is located, wherein the second type abnormal condition is that the bus where the measuring point is located is overhauled or the bus where the measuring point is located is in fault.
Optionally, the threshold setting module includes:
the first threshold setting unit is used for taking the first historical constraint threshold of the measuring point as a new constraint threshold of the measuring point if the assessment type of the measuring point is a static type;
and/or the presence of a gas in the gas,
the time period dividing unit is used for dividing the measuring point into a temporary voltage time period and a normal voltage time period if the checking type of the measuring point is a temporary voltage type;
a second threshold setting unit, configured to use a second historical constraint threshold of the measurement point as a new constraint threshold of the measurement point in the normal voltage time period;
a third threshold setting unit, configured to use the first preset constraint threshold in the scene recording file as a new constraint threshold of the measurement point in the temporary voltage time period;
and/or the presence of a gas in the gas,
and the fourth threshold setting unit is used for setting the constraint threshold of the measuring point according to a second preset constraint threshold which is recorded in the scene recording file and corresponds to different time periods if the checking type of the measuring point is a voltage curve type.
Optionally, the calculation module includes:
the first accumulated time calculation unit is used for taking the product of the number of the normal bus voltages and the frequency of the monitoring bus voltages as the accumulated time of the normal bus voltages;
the second accumulated time calculation unit is used for taking the product of the number of the abnormal bus voltages and the frequency of the monitoring bus voltages as the accumulated time of the abnormal bus voltages;
the voltage qualification rate calculating unit is used for calculating the voltage qualification rate of the station where the measuring point is located according to the following formula:
wherein, sigma is the voltage qualification rate of the plant station where the measuring point is located, T0The cumulative time of the abnormal bus voltage is T, and the cumulative time of the normal bus voltage is T.
Optionally, the second determining module includes:
a limit threshold value calculation unit, configured to calculate a limit threshold value according to an allowable fluctuation deviation of the bus voltage, where an upper limit value of the limit threshold value is a sum of an upper limit value of the constraint threshold value and the allowable fluctuation deviation, and a lower limit value of the limit threshold value is a difference value between a lower limit value of the constraint threshold value and the allowable fluctuation deviation;
a third judging unit, configured to judge whether the bus voltage is between an upper limit value of the limit threshold and a lower limit value of the limit threshold;
a first bus voltage determination unit for determining that the bus voltage is a normal bus voltage if the bus voltage is between an upper limit value of the limit threshold and a lower limit value of the limit threshold;
and the second bus voltage determining unit is used for determining that the bus voltage is abnormal bus voltage if the bus voltage is not between the upper limit value of the limit threshold and the lower limit value of the limit threshold.
Those skilled in the art will readily appreciate that the techniques of the embodiments of the present invention may be implemented as software plus a required general purpose hardware platform. Based on such understanding, the technical solutions in the embodiments of the present invention may be essentially or partially implemented in the form of a software product, which may be stored in a storage medium, such as ROM/RAM, magnetic disk, optical disk, etc., and includes several instructions for enabling a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method according to the embodiments or some parts of the embodiments.
The same and similar parts in the various embodiments in this specification may be referred to each other. In particular, as for the apparatus embodiment, since it is substantially similar to the method embodiment, the description is simple, and the relevant points can be referred to the description in the method embodiment.
The present application has been described in detail with reference to specific embodiments and illustrative examples, but the description is not intended to limit the application. Those skilled in the art will appreciate that various equivalent substitutions, modifications or improvements may be made to the presently disclosed embodiments and implementations thereof without departing from the spirit and scope of the present disclosure, and these fall within the scope of the present disclosure. The protection scope of this application is subject to the appended claims.
Claims (10)
1. A method for monitoring the voltage qualification rate of a high-voltage grade is characterized by comprising the following steps:
acquiring the bus voltage of each measuring point in a power grid operation monitoring system;
acquiring a scene record file in the operation of a power grid, wherein the scene record file comprises the field conditions of buses measured by each measuring point in different time periods, and the field conditions comprise normal conditions and abnormal conditions;
determining the assessment types of the measuring points in different time periods according to the scene recording file;
setting a constraint threshold value for each measuring point in different time periods according to the assessment type;
dividing the bus voltage into a normal bus voltage and an abnormal bus voltage according to whether the bus voltage meets the constraint threshold, wherein the bus voltage meeting the constraint threshold is used as the normal bus voltage, and the bus voltage not meeting the constraint threshold is used as the abnormal bus voltage;
and calculating the voltage qualification rate of the station where the measuring point is located according to the accumulation time corresponding to the normal bus voltage and the abnormal bus voltage.
2. The method of claim 1, wherein determining the assessment types of the measuring points in different time periods according to the scene record file comprises:
judging whether the bus where the measuring point is located has an abnormal condition in a time period corresponding to the bus voltage according to the scene recording file;
if no abnormal condition exists, setting the examination type of the measuring point as a static type;
if the abnormal condition exists, judging the type of the abnormal condition of the bus where the measuring point is located;
if the bus where the measuring point is located has a first-type abnormal condition, setting the examination type of the measuring point as a temporary voltage type, wherein the first-type abnormal condition is to test the bus where the measuring point is located;
and if a second type of abnormal condition exists in the bus where the measuring point is located, setting the examination type of the measuring point as a voltage curve type, wherein the second type of abnormal condition is that the bus where the measuring point is located is overhauled or the bus where the measuring point is located is in fault.
3. The method of claim 2, wherein setting constraint thresholds for the measuring points in different time periods according to the assessment types comprises:
if the assessment type of the measuring point is a static type, taking a first historical constraint threshold of the measuring point as a new constraint threshold of the measuring point;
and/or the presence of a gas in the gas,
if the checking type of the measuring point is a temporary voltage type, dividing the measuring point into a measuring point in a temporary voltage time period and a measuring point in a normal voltage time period;
in the normal voltage time period, taking a second historical constraint threshold of the measuring point as a new constraint threshold of the measuring point;
in the temporary voltage time period, taking a first preset constraint threshold in the scene recording file as a new constraint threshold of the measuring point;
and/or the presence of a gas in the gas,
and if the checking type of the measuring point is a voltage curve type, setting a constraint threshold of the measuring point according to a second preset constraint threshold which is recorded in the scene recording file and corresponds to different time periods.
4. The method of claim 1, wherein calculating the voltage qualification rate of the plant station where the measuring point is located according to the accumulated time corresponding to the normal bus voltage and the abnormal bus voltage comprises:
taking the product of the number of the normal bus voltages and the frequency of the monitoring bus voltages as the accumulation time of the normal bus voltages;
taking the product of the number of the abnormal bus voltages and the frequency of the monitoring bus voltages as the accumulation time of the abnormal bus voltages;
and calculating the voltage qualification rate of the plant station where the measuring point is located according to the following formula:
wherein, sigma is the voltage qualification rate of the plant station where the measuring point is located, T0The cumulative time of the abnormal bus voltage is T, and the cumulative time of the normal bus voltage is T.
5. The method of claim 1, wherein the dividing the bus voltage into a normal bus voltage and an abnormal bus voltage based on whether the bus voltage meets the constraint threshold comprises:
calculating a limit threshold according to the allowable fluctuation deviation of the bus voltage, wherein the upper limit value of the limit threshold is the sum of the upper limit value of the constraint threshold and the allowable fluctuation deviation, and the lower limit value of the limit threshold is the difference value of the lower limit value of the constraint threshold and the allowable fluctuation deviation;
judging whether the bus voltage is between the upper limit value of the limit threshold and the lower limit value of the limit threshold;
if so, determining that the bus voltage is a normal bus voltage;
otherwise, determining the bus voltage as an abnormal bus voltage.
6. A voltage qualification rate monitoring device of high voltage class, comprising:
the first acquisition module is used for acquiring the bus voltage of each measuring point in the power grid operation monitoring system;
the second acquisition module is used for acquiring a scene recording file in the operation of the power grid, wherein the scene recording file comprises the field conditions of the buses measured by each measuring point in different time periods, and the field conditions comprise normal conditions and abnormal conditions;
the first judgment module is used for determining the examination type of each measuring point in different time periods according to the scene recording file;
the threshold setting module is used for setting a constraint threshold for each measuring point in different time periods according to the assessment type;
the second judgment module is used for dividing the bus voltage into a normal bus voltage and an abnormal bus voltage according to whether the bus voltage meets the constraint threshold, wherein the bus voltage meeting the constraint threshold is used as the normal bus voltage, and the bus voltage not meeting the constraint threshold is used as the abnormal bus voltage;
and the calculation module is used for calculating the voltage qualification rate of the plant station where the measuring point is located according to the accumulation time corresponding to the normal bus voltage and the abnormal bus voltage.
7. The apparatus of claim 6, wherein the first determining module comprises:
the first judgment unit is used for judging whether the bus where the measuring point is located has an abnormal condition in a time period corresponding to the bus voltage according to the scene record file;
the first type determining unit is used for setting the examination type of the measuring point as a static type if no abnormal condition exists;
the second judgment unit is used for judging the type of the abnormal condition of the bus where the measuring point is located if the abnormal condition exists;
the second type determining unit is used for setting the examination type of the measuring point as a temporary voltage type if a first type of abnormal condition exists in a bus where the measuring point is located, wherein the first type of abnormal condition is to test the bus where the measuring point is located;
and the third type determining unit is used for setting the examination type of the measuring point as a voltage curve type if a second type abnormal condition exists in the bus where the measuring point is located, wherein the second type abnormal condition is that the bus where the measuring point is located is overhauled or the bus where the measuring point is located is in fault.
8. The apparatus of claim 7, wherein the threshold setting module comprises:
the first threshold setting unit is used for taking the first historical constraint threshold of the measuring point as a new constraint threshold of the measuring point if the assessment type of the measuring point is a static type;
and/or the presence of a gas in the gas,
the time period dividing unit is used for dividing the measuring points into measuring points in a temporary voltage time period and measuring points in a normal voltage time period if the checking type of the measuring points is a temporary voltage type;
a second threshold setting unit, configured to use a second historical constraint threshold of the measurement point as a new constraint threshold of the measurement point in the normal voltage time period;
a third threshold setting unit, configured to use the first preset constraint threshold in the scene recording file as a new constraint threshold of the measurement point in the temporary voltage time period;
and/or the presence of a gas in the gas,
and the fourth threshold setting unit is used for setting the constraint threshold of the measuring point according to a second preset constraint threshold which is recorded in the scene recording file and corresponds to different time periods if the checking type of the measuring point is a voltage curve type.
9. The apparatus of claim 6, wherein the computing module comprises:
the first accumulated time calculation unit is used for taking the product of the number of the normal bus voltages and the frequency of the monitoring bus voltages as the accumulated time of the normal bus voltages;
the second accumulated time calculation unit is used for taking the product of the number of the abnormal bus voltages and the frequency of the monitoring bus voltages as the accumulated time of the abnormal bus voltages;
the voltage qualification rate calculating unit is used for calculating the voltage qualification rate of the station where the measuring point is located according to the following formula:
wherein, sigma is the voltage qualification rate of the plant station where the measuring point is located, T0The cumulative time of the abnormal bus voltage is T, and the cumulative time of the normal bus voltage is T.
10. The apparatus of claim 6, wherein the second determining module comprises:
a limit threshold value calculation unit, configured to calculate a limit threshold value according to an allowable fluctuation deviation of the bus voltage, where an upper limit value of the limit threshold value is a sum of an upper limit value of the constraint threshold value and the allowable fluctuation deviation, and a lower limit value of the limit threshold value is a difference value between a lower limit value of the constraint threshold value and the allowable fluctuation deviation;
a third judging unit, configured to judge whether the bus voltage is between an upper limit value of the limit threshold and a lower limit value of the limit threshold;
a first bus voltage determination unit for determining that the bus voltage is a normal bus voltage if the bus voltage is between an upper limit value of the limit threshold and a lower limit value of the limit threshold;
and the second bus voltage determining unit is used for determining that the bus voltage is abnormal bus voltage if the bus voltage is not between the upper limit value of the limit threshold and the lower limit value of the limit threshold.
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