CN110688305B - Test environment synchronization method, device, medium and electronic equipment - Google Patents

Abstract

The disclosure relates to the technical field of system integration testing, and discloses a testing environment synchronization method, a testing environment synchronization device, a testing environment synchronization medium and electronic equipment. The method comprises the following steps: acquiring configuration item parameter values of subsystems in a first test environment, wherein the first test environment comprises at least one subsystem, and each subsystem in the subsystems has at least one configuration item parameter value; acquiring subsystem identifications of subsystems in a second test environment to be established; and synchronizing the configuration item parameter values of the subsystems in the first test environment to the second test environment based on the configuration item parameter values of the subsystems and the subsystem identifications of the subsystems. Under the condition that the corresponding test environment is established, if the test environment is to be newly added, the corresponding configuration item parameter values in the original test environment are directly synchronized to the test environment to be newly added, so that the configuration item setting efficiency and accuracy can be improved, and the test efficiency can be improved.

Description

Test environment synchronization method, device, medium, electronic equipment

technical field

The present disclosure relates to the technical field of system integration testing, and in particular, to a test environment synchronization method, device, medium and electronic device.

Background technique

With the development of software engineering, large-scale, integrated and systematic has become a trend of current software development. In order to improve the quality of the software system when it is officially launched, and minimize the software loopholes, it is often necessary to test the software system, including functional testing and performance testing.

In the implementation of the prior art, in order to test the software, it is usually necessary to build a test environment, in which there will be multiple subsystems for simultaneous testing; in order to ensure the universal applicability and reliability of the software, for the same software, it is often necessary to build Different test environments, when a created test environment has multiple servers with the same resources as the servers in the previously built test environment, it is considered that a new test environment is created.

The defect of the prior art is that since the calling relationship between the subsystems in the new test environment and the calling relationship between the subsystems in the original test environment need to be partially or completely consistent, and the new test environment The large number of subsystems leads to a large number of configuration items to be set for the new test environment, the setting efficiency of the configuration items is low, and the setting accuracy of the configuration items may also be low.

SUMMARY OF THE INVENTION

In the technical field of system integration testing, in order to solve the technical problem of low efficiency and accuracy in setting configuration items when adding a new testing environment, the present invention provides a testing environment synchronization method, device, medium and electronic equipment .

According to an aspect of the present application, a test environment synchronization method is provided, wherein the method includes:

obtaining configuration item parameter values of each subsystem in a first test environment, wherein the first test environment includes at least one subsystem, and each of the subsystems in each subsystem has at least one configuration item parameter value;

obtaining the subsystem identifiers of the subsystems in the second test environment to be established;

Based on the configuration item parameter values of the subsystems and the subsystem identifiers of the subsystems, the configuration item parameter values of the subsystems in the first test environment are synchronized to the second test environment.

According to another aspect of the present application, a test environment synchronization device is provided, wherein the device includes:

A first acquisition module configured to acquire configuration item parameter values of each subsystem in a first test environment, wherein the first test environment includes at least one subsystem, and each of the subsystems has at least one Configuration item parameter value;

a second obtaining module, configured to obtain the subsystem identifiers of the subsystems in the second test environment to be established;

A synchronization module configured to synchronize the configuration item parameter values of each subsystem in the first test environment to the second test environment based on the configuration item parameter values of the subsystems and the subsystem identifiers of the subsystems .

According to another aspect of the present application, there is provided a computer-readable program medium storing computer program instructions which, when executed by a computer, cause the computer to perform the aforementioned method.

According to another aspect of the present application, an electronic device is provided, the electronic device comprising:

processor;

A memory, where computer-readable instructions are stored thereon, and when the computer-readable instructions are executed by the processor, implement the aforementioned method.

The technical solutions provided by the embodiments of the present invention may include the following beneficial effects:

The test environment synchronization method provided by the present invention includes the following steps: acquiring configuration item parameter values of each subsystem in a first test environment, wherein the first test environment includes at least one subsystem, and each of the subsystems The subsystem has at least one configuration item parameter value; obtains the subsystem identifier of each subsystem in the second test environment to be established; based on the configuration item parameter value of each subsystem and the subsystem identifier of each subsystem, all The configuration item parameter values of each subsystem in the first test environment are synchronized to the second test environment.

In this method, when the corresponding test environment has been established, when a new test environment is to be added, the parameter values of the configuration items of the subsystems in the original test environment are directly synchronized to the test environment to be added, so that the original test environment is added in the new test environment. Part or all of the complicated and boring work of manually adding configuration items in the environment can be completed automatically, which improves the efficiency of setting configuration items and improves the accuracy of setting configuration items.

It is to be understood that the foregoing general description and the following detailed description are exemplary only and do not limit the invention.

Description of drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description serve to explain the principles of the invention.

1 is a schematic diagram of an application scenario of a test environment synchronization method according to an exemplary embodiment;

2 is a flowchart of a method for synchronizing a test environment according to an exemplary embodiment;

FIG. 3 is a flowchart of steps before step 240 according to an embodiment shown in the corresponding embodiment of FIG. 2;

FIG. 4 is a detailed flow chart of step 230 of an embodiment shown according to the corresponding embodiment of FIG. 3;

FIG. 5 is a detailed flowchart of step 231 according to an embodiment shown in the corresponding embodiment of FIG. 4;

FIG. 6 is a flowchart of steps before step 240 and details of step 240 according to an embodiment shown in the corresponding embodiment of FIG. 2;

7 is a block diagram of a test environment synchronization apparatus according to an exemplary embodiment;

FIG. 8 is an exemplary block diagram of an electronic device that implements the above method according to an exemplary embodiment;

FIG. 9 is a computer-readable storage medium for implementing the above method according to an exemplary embodiment.

Detailed ways

Exemplary embodiments will be described in detail herein, examples of which are illustrated in the accompanying drawings. Where the following description refers to the drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the illustrative examples below are not intended to represent all implementations consistent with the present invention. Rather, they are merely examples of apparatus and methods consistent with some aspects of the invention as recited in the appended claims.

Furthermore, the drawings are merely schematic illustrations of the present disclosure and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and thus their repeated descriptions will be omitted. Some of the block diagrams shown in the figures are functional entities that do not necessarily necessarily correspond to physically or logically separate entities.

The present disclosure first provides a test environment synchronization method. The test environment refers to the collection of software environment, hardware environment, and entities such as data and network covered by software testing. Among them, the software to be tested can be small software, such as APP (Application, application program), etc., and can also be integrated with large-scale software systems, such as a database management system, a financial management system, and the like. For the sake of simple description, in one or more embodiments of the present application, the present application will illustrate the technical solutions of the present application from the perspectives of hardware and software systems. The test environment may contain one or more subsystems, that is, these subsystems need to be tested simultaneously. Setting configuration items for these subsystems is an indispensable part of the simultaneous testing of these subsystems. The configuration items are these subsystems. The basis of joint operation records the information required for the associated operation of the subsystems, such as the system interface calling relationship between the two subsystems. For a test environment synchronization method provided by the present disclosure, it means that when a new test environment is to be added, if the relevant subsystems have been configured in the existing test environment, these relevant subsystems will be configured The configuration items of the new test environment are directly synchronized to the newly added test environment, and there is no need to repeat the manual configuration of the related subsystems, which can improve the configuration efficiency of the newly added test environment, thereby improving the test efficiency.

The implementation terminal of the technical solution of the present disclosure can be a portable mobile device, such as a smart phone, a tablet computer, a notebook computer, etc.; it can also be a variety of fixed devices, such as a computer device, a field terminal, a desktop computer, a server, a workstation, etc.; In addition, it can also be a server cluster, a physical infrastructure of cloud computing, and the like.

FIG. 1 is a schematic diagram of an application scenario of a test environment synchronization method according to an exemplary embodiment. As shown in FIG. 1 , a first test environment 110 and a second test environment 130 are included, wherein the first test environment 110 includes four first servers 120 , and the second test environment 130 includes four second servers 140 . Each server can run a subsystem, and the subsystems are connected through communication links. The interconnected subsystems have interdependent relationships. For example, these subsystems have an interface calling relationship with each other. These dependencies make Subsystems in the same test environment can work together to complete one or more tasks, and among them, the configuration item is the key element to build the interdependence between these subsystems, that is, the configuration item determines the two sub-systems in a test environment. how the systems are related. If the first test environment 110 is an existing test environment, in order to conduct a more comprehensive test on the subsystems under the first test environment 110, for example, test whether these subsystems can run stably after the hardware environment is replaced, and test the subsystems. For the purpose of testing different functions of the system, it may be necessary to add a second test environment 130 . The second server 140 under the newly added second test environment 130 may be partially or completely different from the first server 110 under the first test environment 110 (FIG. 1 only shows that all servers in the two test environments are different. situation). In the prior art, no matter whether the dependencies between the subsystems in the newly added test environment are the same as those of the previously established test environment, a person is required to manually configure all the subsystems in the newly added test environment This kind of complicated work often consumes a lot of time during the establishment of the test environment, and the setting efficiency of configuration items is low, which will seriously reduce the test efficiency. The inventor of the present application realizes that although the servers in the two test environments may all be different, the dependencies between the subsystems run by the servers in the two test environments, that is, when constructing the test environments, need to be set for each subsystem. Some or even all of the configuration items may be the same. If these same parts of the configuration items are directly synchronized from the established first test environment 110 to the second test environment 130 to be added, it will be possible to a certain extent. The number of configuration items that need to be manually configured when constructing the second test environment 130 is reduced, so that the setting efficiency of the configuration items can be improved.

Fig. 2 is a flow chart of a test environment synchronization method according to an exemplary embodiment. As shown in Figure 2, it includes the following steps:

Step 210: Obtain configuration item parameter values of each subsystem in the first test environment.

Wherein, the first test environment includes at least one subsystem, and each of the subsystems has at least one configuration item parameter value.

The configuration items are various setting items that need to be configured when each subsystem in the first test environment is running, such as subsystem calls or dependent interfaces. The parameter value of the configuration item is the content that needs to be set specifically when the subsystem is running. The relationship between the configuration item and the parameter value of the configuration item is similar to the relationship between the parameter and the parameter value. For the configuration item of the interface type of a subsystem, the corresponding The parameter value of the configuration item can represent the interface actually called by the subsystem, and the parameter value of the configuration item at this time determines what the interface between the subsystems in the first test environment is and how the interface is called. Therefore, the parameter value of the configuration item is the basis for the coordinated operation of each subsystem in the first test environment, and it is only with the correct parameter value of the configuration item that the joint test of each subsystem in the first test environment can be performed.

In one embodiment, a configuration item parameter value is a block of code that represents a calling relationship between subsystems.

In one embodiment, the parameter values of the configuration items of each subsystem in the first test environment are stored on the terminal of the first test environment after the first test environment is established, and the obtaining of each subsystem in the first test environment The configuration item parameter value includes: sending a configuration item parameter value acquisition request to the terminal of the first test environment; receiving the configuration item parameter value returned by the terminal of the first test environment according to the configuration item parameter value acquisition request.

In one embodiment, a script is embedded in the implementation terminal of the present disclosure, and the acquiring parameter values of configuration items of each subsystem in the first test environment includes: using a script to crawl each sub-system in the first test environment system to obtain configuration item parameter values of each subsystem in the first test environment.

In one embodiment, after each test environment is established, the parameter values of configuration items of each subsystem in the test environment will be stored in the database corresponding to the name of the test environment, and the acquisition of the parameters of each subsystem in the first test environment will be stored in a database. The parameter value of the configuration item includes: querying the database by using the name of the first test environment to obtain the parameter value of the configuration item of each subsystem in the first test environment.

Step 220: Obtain the subsystem identifiers of the subsystems in the second test environment to be established.

As mentioned earlier, a test environment refers to a collection of software environment, hardware environment, and entities such as data and network that are covered by software testing. The second test environment to be established may also include one or more subsystems, so configuration items need to be set for each subsystem in the second test environment.

Each test environment needs to use configuration items to control the interface calling relationship between subsystems. Therefore, if the interface calling relationship between some or all of the subsystems in the second test environment to be established is consistent with that in the first test environment, that is, the corresponding configuration items are consistent, the consistent configuration items can be synchronized to the The setting of this part of the configuration items can be completed in the second test environment to be established.

A subsystem ID is a string that uniquely identifies the subsystem within a test environment.

In one embodiment, the subsystem identifier includes a subsystem name and a subsystem serial number, wherein the subsystem name defines the identity of the subsystem, and the subsystem serial number defines the creation sequence of the test environment to which a subsystem belongs under the same subsystem name .

For example, for the same subsystem, the subsystem identifiers can be A1, A2, A3, etc., among which, the three subsystem identifiers all contain the character "A", which means that the three subsystems are all A system, and the subsystem identifier There are 1, 2, 3, etc. after the character "A" of , respectively, which represent that the subsystem A is located in the first, second and third environments established by using the subsystem A.

In one embodiment, in addition to the subsystem name and the subsystem serial number, the subsystem identification further includes: the subsystem calling serial number. For example, the subsystem identifiers of each subsystem in the second test environment may be A21, D22, B23, C24, respectively, wherein the third character of each subsystem identifier is the subsystem call sequence number, and the The subsystem calling sequence number determines how each subsystem is called in the second test environment. For example, since the subsystem call sequence numbers in the four subsystem identifiers A21, D22, B23, and C24 are 1, 2, 3, and 4, respectively, the subsystem call sequence in the second test environment is that A21 calls D22, and D22 calls B23. B23 calls C24.

In one embodiment, a preset correspondence table between test environment names and subsystem identifiers stores the correspondence between test environment names and subsystem identifiers, and the acquiring the sub-systems of each subsystem in the second test environment to be established The system identification includes: using the name of the second test environment to query the preset correspondence table between the test environment name and the subsystem identification to obtain the subsystem identification of each subsystem in the second test environment.

In one embodiment, a script is embedded in the implementation terminal of the present disclosure, and the acquiring the subsystem identifiers of each subsystem in the second test environment to be established includes: using the script to crawl the to-be-established test environment Subsystem identifiers of each subsystem in the second test environment.

Step 240, based on the configuration item parameter values of the subsystems and the subsystem identifiers of the subsystems, synchronize the configuration item parameter values of the subsystems in the first test environment to the second test environment.

In one embodiment, the acquired parameter values of the configuration items of each subsystem of the first test environment correspond to the configuration items, and the preset correspondence table between the subsystem identifiers and the configuration items stores the correspondence between the subsystem identifiers and the configuration items. relationship, the configuration item parameter values of each subsystem in the first test environment are synchronized to the second test environment based on the configuration item parameter values of the subsystems and the subsystem identifiers of the subsystems, including :

Obtain a configuration item corresponding to the subsystem identifier of each subsystem by querying a preset correspondence table of subsystem identifiers and configuration items, as the first configuration item;

Obtain the configuration item corresponding to the configuration item parameter value of each subsystem as the second configuration item;

If there is at least one configuration item in the second configuration item that is the same as the first configuration item, synchronize the configuration item parameter value corresponding to the second configuration item that is the same as the first configuration item to the second test surroundings.

For example, the correspondence table between subsystem identifiers and configuration items can be shown in the following table:

Subsystem ID A1 B1 D1 C1 configuration item XX1 XX2 XX3 XX4 Subsystem Association Code b1 d1 c1

As can be seen from the above table, in addition to subsystem identifiers and configuration items, the table also contains subsystem association codes, which define the subsystems called by each subsystem. It is worth mentioning that, in order to make each item in the table unique, compared with the corresponding subsystem identification, the letter part in the subsystem association code is set to the lowercase letter corresponding to the uppercase letter in the subsystem identification. , where the configuration item XX4 does not correspond to the subsystem association code, it means that the subsystem identified as C1 does not call the subsystem.

In one embodiment, a correspondence table between parameter values of configuration items and configuration items is preset, and the acquiring configuration items corresponding to the parameter values of configuration items of each subsystem, as the second configuration item, includes:

By querying the preset correspondence table between the parameter values of the configuration items and the configuration items, the configuration items corresponding to the parameter values of the configuration items of the subsystems are acquired as the second configuration items.

In one embodiment, the subsystem identifier includes a subsystem identity code, and a database storing the corresponding relationship between the subsystem identity code and the parameter value of the reference configuration item is pre-established, and the parameter value of the configuration item based on the configuration item parameter value of each subsystem and Subsystem identifiers of each subsystem, and synchronizing the configuration item parameter values of each subsystem in the first test environment to the second test environment, including:

By querying the database, determine the parameter value of the reference configuration item corresponding to the subsystem identity code in the subsystem identification of each subsystem;

determining a configuration item parameter value matching the reference configuration item parameter value in the configuration item parameter values of each subsystem in the first test environment;

Synchronizing the determined parameter value of the configuration item to the second test environment.

In one embodiment, determining a configuration item parameter value that matches the reference configuration item parameter value among the configuration item parameter values of each subsystem in the first test environment includes:

For each reference configuration item parameter value, obtain the same character as the reference configuration item parameter value for each configuration item parameter value in the configuration item parameter values of each subsystem in the first test environment. determine the parameter value of the configuration item with the largest number; in the case that the number corresponding to the parameter value of the configuration item with the largest number is greater than the predetermined number of characters threshold, the parameter value of the configuration item corresponding to the number is used as the This baseline configuration item parameter value matches the configuration item parameter value.

To sum up, according to a test environment synchronization method provided by the embodiment of FIG. 2, when a corresponding test environment has been established, when a new test environment is to be added, the parameter values of the configuration items of the subsystems in the original test environment are directly changed. Synchronizing to the test environment to be added can improve the setting efficiency and accuracy of configuration items.

FIG. 3 is a flowchart of steps before step 240 according to an embodiment shown in the corresponding embodiment of FIG. 2 . As shown in Figure 3, it includes the following steps:

Step 230: According to the subsystem identifier, it is determined that the configuration item parameter values of each subsystem in the first test environment can be synchronized to the second test environment.

In one embodiment, the acquired parameter values of the configuration items of each subsystem of the first test environment correspond to the configuration items, and the preset correspondence table between the subsystem identifiers and the configuration items stores the correspondence between the subsystem identifiers and the configuration items. According to the subsystem identifier, determining that the configuration item parameter values of each subsystem in the first test environment can be synchronized to the second test environment includes:

Obtain a configuration item corresponding to the subsystem identifier of each subsystem by querying a preset correspondence table of subsystem identifiers and configuration items, as the first configuration item;

Obtain the configuration item corresponding to the configuration item parameter value of each subsystem as the second configuration item;

If there is at least one configuration item in the second configuration item that is the same as the first configuration item, it is determined that the parameter values of the configuration items of each subsystem in the first test environment can be compared with the first configuration item. Configuration item parameter values corresponding to the same second configuration item are synchronized to the second test environment.

In the embodiment shown in FIG. 3 , before synchronizing the parameter values of the configuration items to the second test environment and synchronizing to the second test environment, the evaluation that this synchronization can be performed is performed, which reduces the possibility of causing synchronization failure due to synchronization failure. The risk of incorrect configuration item parameter value data.

FIG. 4 is a detailed flowchart of step 230 according to an embodiment shown in the corresponding embodiment of FIG. 3 . In the embodiment shown in the figure, each of the subsystems included in the first test environment has a configuration item parameter value identified by the subsystem of the subsystem. As shown in FIG. 4 , step 230 includes: The following steps:

Step 231: Determine whether there is an identifier corresponding to the subsystem identifier of each subsystem in the first test environment in the subsystem identifiers.

In one embodiment, the determining whether there is an identifier corresponding to the subsystem identifier of each subsystem in the first test environment in the subsystem identifier includes:

For each subsystem identifier in the second test environment, determine whether the subsystem identifier in the first test environment corresponds to the subsystem identifier;

If yes, determine that there is an identifier corresponding to the subsystem identifier of each subsystem in the first test environment in the subsystem identifier;

If not, it is determined that there is no identifier corresponding to the subsystem identifiers of the subsystems in the first test environment in the subsystem identifiers.

In one embodiment, the correspondence between the subsystem identifiers in the first test environment and the subsystem identifiers in the second test environment is pre-stored in a subsystem identifier library, and the subsystem identifiers are retrieved in the subsystem identifier library by retrieving the subsystem identifier library. Whether there is an identifier corresponding to the subsystem identifier of each subsystem in the first test environment is determined in the identifier.

In one embodiment, the correspondence between the subsystem identifiers in the first test environment and the subsystem identifiers in the second test environment is preset according to a certain rule. For example, the subsystem identification consists of a letter and a number. If the identification of a subsystem in the first test environment is the same as the letter part of the identification of another subsystem in the second test environment, but the number part is different, the two subsystems are considered to be is corresponding. For example, one subsystem in the first test environment is identified as A1, and another subsystem in the second test environment is identified as A2, then the two subsystems identified as A1 and A2 are corresponding.

Step 232: According to the determination result, it is determined that the parameter values of the configuration items of each subsystem in the first test environment can be synchronized to the second test environment.

In one embodiment, at the beginning of the establishment of the second test environment, various subsystems in the second test environment will be called in a predetermined order, and according to the determination result, it is determined that the first test environment can The configuration item parameter values of each subsystem in the test environment are synchronized to the second test environment, including:

When the subsystem identifier includes an identifier corresponding to the subsystem identifier of each subsystem in the first test environment, acquire all sub-system identifiers that have a corresponding relationship in the first test environment and the second test environment system identification;

Among the acquired subsystem identifiers in the first test environment, determine that there is a subsystem identifier with a calling relationship between the corresponding subsystems, as the first subsystem identifier;

determining the subsystem identifier corresponding to the determined first subsystem identifier in the acquired subsystem identifiers in the second test environment as the second subsystem identifier;

When there are at least two subsystems in the subsystem identified as the second subsystem identification in the first test environment with the first subsystem identification corresponding to the second subsystem identification of the at least two subsystems When the calling sequence of the subsystems is consistent, it is determined that the configuration item parameter values of each subsystem in the first test environment can be synchronized to the second test environment.

For example, in the first test environment, the calling relationship between the first subsystems established based on the first subsystem identifier is B1-A1-C1-D1, and the acquired second subsystem identifiers are A2, C2, and D2, respectively. If the calling relationship between the subsystems corresponding to the second subsystem identifier is A2-C2-D2, since the calling relationship between the subsystems corresponding to the second subsystem identifier is the same as the first subsystem, and has a consistent calling relationship The number of subsystems is 3, which meets the standard of at least two subsystems. Therefore, in this case, it is determined that the configuration item parameter values of each subsystem in the first test environment can be synchronized to the second test environment. .

To sum up, the advantage of the embodiment shown in FIG. 4 is that since the subsystem identifier is a condition that can be directly used to determine whether two subsystems are the same subsystem, that is, whether synchronization can be performed, in the first test environment In the case where the parameter value of the configuration item of the sub-system under the sub-system includes the sub-system identifier, the corresponding relationship between the sub-system identifiers in the first test environment and the second test environment is used to determine that the values of the subsystems in the first test environment can be changed. The parameter values of the configuration items are synchronized to the second test environment, which can improve the accuracy of judgment, thereby improving the synchronization accuracy of the parameter values of the configuration items.

FIG. 5 is a detailed flowchart of step 231 according to an embodiment shown in the corresponding embodiment of FIG. 4 . In the embodiment shown in FIG. 5 , at the beginning of the establishment of the second test environment, various subsystems in the second test environment will be called in a predetermined order, and the first test environment includes Each of the subsystems also has the configuration item parameter value of the subsystem identification of the subsystem invoked by the subsystem. As shown in Figure 5, step 231 includes the following steps:

Step 2311: Determine the calling sequence of each subsystem in the first test environment according to the subsystem identifier of the subsystem called by each of the subsystems in the first test environment.

In one embodiment, the calling sequence of each subsystem in the first test environment is determined according to the subsystem identifier of the subsystem called by each of the subsystems in the first test environment, including:

For the subsystem identifier of each subsystem in the first test environment, obtain the subsystem identifier that is not called by the subsystem as the first subsystem identifier;

Starting from the subsystem corresponding to the first subsystem identifier, acquiring the subsystem identifier called by the subsystem corresponding to the first subsystem identifier and marking the acquired subsystem identifier as the first subsystem identifier;

Starting from the subsystem corresponding to the first subsystem identifier again, the subsystem identifiers called by the subsystems corresponding to the first subsystem identifier are obtained until the subsystem identifiers of all subsystems in the first test environment are marked as the first subsystem identifier. Subsystem identification;

The acquisition sequence of all acquired first subsystem identifiers is taken as the calling sequence of each subsystem in the first test environment.

Step 2312: Based on the predetermined sequence and the calling sequence, determine whether there is an identifier corresponding to the subsystem identifier of each subsystem in the first test environment in the subsystem identifiers.

In one embodiment, the determining, based on the predetermined sequence and the calling sequence, whether there is an identifier corresponding to the subsystem identifier of each subsystem in the first test environment in the subsystem identifiers includes:

Comparing the sequence of each subsystem in the second test environment sorted according to the predetermined order and the sequence of each subsystem in the first test environment sorted according to the calling sequence to determine whether the two sequences have the same length and the same length Subsequences of subsystems greater than a predetermined threshold; if yes, determine that there are identifiers corresponding to the subsystem identifiers of each subsystem in the first test environment in the subsystem identifiers; if not, determine that the subsystem identifiers There is no identifier corresponding to the subsystem identifier of each subsystem in the first test environment.

To sum up, the advantage of the embodiment shown in FIG. 5 is that whether there is a The corresponding subsystem identification improves the judgment standard of this determination step to a certain extent, which can improve the accuracy of the judgment, thereby improving the accuracy of the parameter value of the synchronization configuration item.

FIG. 6 is a flowchart of steps before step 240 and details of step 240 according to an embodiment shown in the corresponding embodiment of FIG. 2 . As shown in Figure 6, it includes the following steps:

Step 230', determining the number of the acquired subsystem identifiers in the second test environment.

In one embodiment, a counter is embedded in the implementation terminal of the present disclosure, and the number of acquired subsystem identifiers in the second test environment can be calculated through the counter.

Step 241, judging whether the number is greater than 1.

Step 242, when the number is greater than 1, based on the configuration item parameter values of the subsystems and the subsystem identifiers of the subsystems, synchronize the configuration item parameter values of the subsystems in the first test environment to all the subsystems. The second test environment is described.

Since 1 is a relatively small judgment criterion, by comparing the number with the judgment criterion, when the number is not greater than 1, that is, when there is only one subsystem in the newly created second test environment, all tests will not be executed. The step of synchronizing the configuration item parameter values of the subsystems in the first test environment to the second test environment improves the efficiency of creating the second test environment and saves computing resources.

The following are apparatus embodiments of the present invention.

The present disclosure also provides a test environment synchronization device. Fig. 7 is a block diagram of a test environment synchronization apparatus according to an exemplary embodiment. As shown in FIG. 7, apparatus 700 includes:

The first obtaining module 710 is configured to obtain configuration item parameter values of each subsystem in the first test environment, wherein the first test environment includes at least one subsystem, and each of the subsystems has at least one subsystem. A configuration item parameter value;

The second obtaining module 720 is configured to obtain the subsystem identifiers of the subsystems in the second test environment to be established;

The synchronization module 730 is configured to synchronize the configuration item parameter value of each subsystem in the first test environment to the second test based on the configuration item parameter value of each subsystem and the subsystem identifier of each subsystem surroundings.

According to a third aspect of the present disclosure, an electronic device capable of implementing the above method is also provided.

As will be appreciated by one skilled in the art, various aspects of the present invention may be implemented as a system, method or program product. Therefore, various aspects of the present invention can be embodied in the following forms: a complete hardware implementation, a complete software implementation (including firmware, microcode, etc.), or a combination of hardware and software aspects, which may be collectively referred to herein as implementations "circuit", "module" or "system".

An electronic device 800 according to this embodiment of the present invention is described below with reference to FIG. 8 . The electronic device 800 shown in FIG. 8 is only an example, and should not impose any limitation on the function and scope of use of the embodiments of the present invention.

As shown in FIG. 8, electronic device 800 takes the form of a general-purpose computing device. The components of the electronic device 800 may include, but are not limited to, the above-mentioned at least one processing unit 810 , the above-mentioned at least one storage unit 820 , and a bus 830 connecting different system components (including the storage unit 820 and the processing unit 810 ).

Wherein, the storage unit stores program codes, and the program codes can be executed by the processing unit 810, so that the processing unit 810 executes various exemplary embodiments according to the present invention described in the above-mentioned “Methods of Embodiments” of this specification Implementation steps.

The storage unit 820 may include a readable medium in the form of a volatile storage unit, such as a random access storage unit (RAM) 821 and/or a cache storage unit 822 , and may further include a read only storage unit (ROM) 823 .

The storage unit 820 may also include a program/utility 824 having a set (at least one) of program modules 825 including, but not limited to, an operating system, one or more application programs, other program modules, and program data, An implementation of a network environment may be included in each or some combination of these examples.

The bus 830 may be representative of one or more of several types of bus structures, including a memory cell bus or memory cell controller, a peripheral bus, a graphics acceleration port, a processing unit, or a local area using any of a variety of bus structures bus.

The electronic device 800 may also communicate with one or more external devices 1000 (eg, keyboards, pointing devices, Bluetooth devices, etc.), with one or more devices that enable a user to interact with the electronic device 800, and/or with Any device (eg, router, modem, etc.) that enables the electronic device 800 to communicate with one or more other computing devices. Such communication may take place through input/output (I/O) interface 850 . Also, the electronic device 800 may communicate with one or more networks (eg, a local area network (LAN), a wide area network (WAN), and/or a public network such as the Internet) through a network adapter 860 . As shown, network adapter 860 communicates with other modules of electronic device 800 via bus 830 . It should be understood that, although not shown, other hardware and/or software modules may be used in conjunction with electronic device 800, including but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives and data backup storage systems.

From the description of the above embodiments, those skilled in the art can easily understand that the exemplary embodiments described herein may be implemented by software, or may be implemented by software combined with necessary hardware. Therefore, the technical solutions according to the embodiments of the present disclosure may be embodied in the form of software products, and the software products may be stored in a non-volatile storage medium (which may be CD-ROM, U disk, mobile hard disk, etc.) or on the network , including several instructions to cause a computing device (which may be a personal computer, a server, a terminal device, or a network device, etc.) to execute the method according to an embodiment of the present disclosure.

According to a fourth aspect of the present disclosure, there is also provided a computer-readable storage medium on which a program product capable of implementing the above-mentioned method of the present specification is stored. In some possible implementations, aspects of the present invention can also be implemented in the form of a program product comprising program code for enabling the program product to run on a terminal device The terminal device performs the steps according to various exemplary embodiments of the present invention described in the "Example Method" section above in this specification.

Referring to FIG. 9, a program product 900 for implementing the above method according to an embodiment of the present invention is described, which can adopt a portable compact disk read only memory (CD-ROM) and include program codes, and can be used in a terminal device, For example running on a personal computer. However, the program product of the present invention is not limited thereto, and in this document, a readable storage medium may be any tangible medium that contains or stores a program that can be used by or in conjunction with an instruction execution system, apparatus, or device.

The program product may employ any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus or device, or a combination of any of the above. More specific examples (non-exhaustive list) of readable storage media include: electrical connections with one or more wires, portable disks, hard disks, random access memory (RAM), read only memory (ROM), erasable programmable read only memory (EPROM or flash memory), optical fiber, portable compact disk read only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

A computer readable signal medium may include a propagated data signal in baseband or as part of a carrier wave with readable program code embodied thereon. Such propagated data signals may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the foregoing. A readable signal medium can also be any readable medium, other than a readable storage medium, that can transmit, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device.

Program code embodied on a readable medium may be transmitted using any suitable medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.

Program code for carrying out operations of the present invention may be written in any combination of one or more programming languages, including object-oriented programming languages—such as Java, C++, etc., as well as conventional procedural Programming Language - such as the "C" language or similar programming language. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device and partly on a remote computing device, or entirely on the remote computing device or server execute on. In the case of a remote computing device, the remote computing device may be connected to the user computing device through any kind of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computing device (eg, using an Internet service provider business via an Internet connection).

Furthermore, the above-mentioned figures are merely schematic illustrations of the processes included in the methods according to the exemplary embodiments of the present invention, and are not intended to be limiting. It is easy to understand that the processes shown in the above figures do not indicate or limit the chronological order of these processes. In addition, it is also readily understood that these processes may be performed synchronously or asynchronously in multiple modules, for example.

It should be understood that the present invention is not limited to the precise structures described above and illustrated in the accompanying drawings and that various modifications and changes may be made without departing from its scope. The scope of the present invention is limited only by the appended claims.

Claims (5)

1. A test environment synchronization method, the method comprising:

acquiring configuration item parameter values of subsystems in a first test environment, wherein the first test environment comprises at least one subsystem, each subsystem in the subsystems has at least one configuration item parameter value, and each subsystem in the subsystems in the first test environment has a configuration item parameter value of a subsystem identifier of the subsystem;

acquiring subsystem identifications of subsystems in a second test environment to be established, wherein the subsystems in the second test environment are to be called according to a preset sequence at the beginning of the establishment of the second test environment;

for each subsystem identification in a second test environment, judging whether the subsystem identification in the first test environment corresponds to the subsystem identification;

if yes, determining that the subsystem identifications have identifications corresponding to the subsystem identifications of the subsystems in the first test environment;

if not, determining that no identifier corresponding to the subsystem identifier of each subsystem in the first test environment exists in the subsystem identifiers;

when the subsystem identifications have identifications corresponding to the subsystem identifications of the subsystems in the first test environment, acquiring all subsystem identifications having a corresponding relationship in the first test environment and the second test environment;

determining a subsystem identifier with a calling relationship between corresponding subsystems in the acquired subsystem identifiers in the first test environment as a first subsystem identifier;

determining a subsystem identifier corresponding to the determined first subsystem identifier in the acquired subsystem identifiers in the second test environment as a second subsystem identifier;

when the calling sequence of at least two subsystems in the subsystems identified as the second subsystem identifications is consistent with the calling sequence of the subsystems in the first test environment with the first subsystem identifications corresponding to the second subsystem identifications of the at least two subsystems, determining that the parameter values of the configuration items of the subsystems in the first test environment can be synchronized to the second test environment;

and synchronizing the configuration item parameter values of the subsystems in the first test environment to the second test environment based on the configuration item parameter values of the subsystems and the subsystem identifications of the subsystems.

2. The method of claim 1, wherein prior to synchronizing the configuration item parameter values for the subsystems in the first test environment to the second test environment based on the configuration item parameter values for the subsystems and the subsystem identifications for the subsystems, the method comprises:

determining the number of the obtained subsystem identifications in the second test environment;

the synchronizing the configuration item parameter values of the subsystems in the first test environment to the second test environment based on the configuration item parameter values of the subsystems and the subsystem identifications of the subsystems comprises:

judging whether the number is more than 1;

and when the number is larger than 1, synchronizing the configuration item parameter values of the subsystems in the first test environment to the second test environment based on the configuration item parameter values of the subsystems and the subsystem identifications of the subsystems.

3. A test environment synchronization apparatus, the apparatus comprising:

a first obtaining module configured to obtain configuration item parameter values of subsystems in a first test environment, wherein the first test environment includes at least one subsystem, each of the subsystems has at least one configuration item parameter value, and each of the subsystems included in the first test environment has a configuration item parameter value of a subsystem identifier of the subsystem;

the second acquisition module is configured to acquire subsystem identifications of subsystems in a second test environment to be established, wherein the subsystems in the second test environment are to be called according to a preset sequence at the beginning of the establishment of the second test environment;

a synchronization module configured to determine, for each subsystem identity in a second test environment, whether a subsystem identity in the first test environment corresponds to the subsystem identity; if yes, determining that the subsystem identifications have identifications corresponding to the subsystem identifications of the subsystems in the first test environment; if not, determining that no identifier corresponding to the subsystem identifier of each subsystem in the first test environment exists in the subsystem identifiers; when the subsystem identifications have identifications corresponding to the subsystem identifications of the subsystems in the first test environment, acquiring all subsystem identifications having a corresponding relationship in the first test environment and the second test environment; determining a subsystem identifier with a calling relationship between corresponding subsystems in the acquired subsystem identifiers in the first test environment as a first subsystem identifier; determining a subsystem identifier corresponding to the determined first subsystem identifier in the acquired subsystem identifiers in the second test environment as a second subsystem identifier; when the calling sequence of at least two subsystems in the subsystems identified as the second subsystem identifications is consistent with the calling sequence of the subsystems in the first test environment with the first subsystem identifications corresponding to the second subsystem identifications of the at least two subsystems, determining that the parameter values of the configuration items of the subsystems in the first test environment can be synchronized to the second test environment; and synchronizing the configuration item parameter values of the subsystems in the first test environment to the second test environment based on the configuration item parameter values of the subsystems and the subsystem identifications of the subsystems.

4. A computer-readable program medium, characterized in that it stores computer program instructions which, when executed by a computer, cause the computer to perform the method according to any one of claims 1 to 2.

5. An electronic device, characterized in that the electronic device comprises:

a processor;

a memory having stored thereon computer readable instructions which, when executed by the processor, implement the method of any of claims 1 to 2.

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