[go: up one dir, main page]
More Web Proxy on the site http://driver.im/

CN110687318A - Analysis method of copper dendrite on surface of diaphragm - Google Patents

Analysis method of copper dendrite on surface of diaphragm Download PDF

Info

Publication number
CN110687318A
CN110687318A CN201810739668.6A CN201810739668A CN110687318A CN 110687318 A CN110687318 A CN 110687318A CN 201810739668 A CN201810739668 A CN 201810739668A CN 110687318 A CN110687318 A CN 110687318A
Authority
CN
China
Prior art keywords
diaphragm
copper
sample
scanning
copper dendrites
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201810739668.6A
Other languages
Chinese (zh)
Inventor
李亚南
杨阳
许飞
刘兴福
罗传军
李莉
李云峰
赵永锋
祁晓英
叶家铭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Duo Fluoride Chemicals Co Ltd
Original Assignee
Duo Fluoride Chemicals Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Duo Fluoride Chemicals Co Ltd filed Critical Duo Fluoride Chemicals Co Ltd
Priority to CN201810739668.6A priority Critical patent/CN110687318A/en
Publication of CN110687318A publication Critical patent/CN110687318A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01QSCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Secondary Cells (AREA)

Abstract

The invention relates to an analysis method of copper dendrite on the surface of a diaphragm. The analysis method comprises the following steps: 1) cleaning a diaphragm obtained by disassembling the lithium ion battery to obtain a sample to be detected; 2) and scanning the sample to be detected by using an atomic force microscope, and analyzing according to the scanning image to obtain the distribution and the growth height of the copper dendrite on the sample to be detected. According to the analysis method of the copper dendrites on the surface of the diaphragm, the diaphragm is cleaned and analyzed by an atomic force microscope, so that the fine characterization analysis of the copper dendrites growing on the diaphragm is realized, the distribution and the growth height of the copper dendrites can be simultaneously characterized, and effective support can be provided for relevant basic theory research or optimization of battery performance.

Description

Analysis method of copper dendrite on surface of diaphragm
Technical Field
The invention belongs to the field of evaluation and analysis of lithium ion batteries, and particularly relates to an analysis method of copper dendrites on the surface of a diaphragm.
Background
At present, most lithium ion batteries adopt liquid electrolytes, diaphragms play roles in isolating positive and negative pole pieces and conducting lithium ions in the lithium ion batteries, and the main materials of the diaphragms are PP (polypropylene), PE (polyethylene), PI (polyimide) and the like. The battery voltage is possibly too low due to self-discharge in the long-term storage process of the battery, so that the copper foil of the negative current collector is dissolved, and the dissolved copper element can be separated out again on the surface of the negative plate or the diaphragm in the charging process, so that the diaphragm is pierced, and the positive and negative electrodes are in short circuit.
The fine characterization analysis of the copper dendrites on the surface of the diaphragm can provide important feedback for the optimization of the battery structure or performance and also provide scientific support for relevant basic theory research. Currently, the prior art lacks such an analysis method for copper dendrites on the surface of the diaphragm.
Disclosure of Invention
The invention aims to provide an analysis method of copper dendrites on the surface of a diaphragm, so as to solve the problem that the existing technology can not perform characterization analysis on the copper dendrites growing on the surface of the diaphragm.
In order to achieve the purpose, the technical scheme adopted by the invention is as follows:
a method for analyzing copper dendrites on the surface of a diaphragm comprises the following steps:
1) cleaning a diaphragm obtained by disassembling the lithium ion battery to obtain a sample to be detected;
2) and scanning the sample to be detected by using an atomic force microscope, and analyzing according to the scanning image to obtain the distribution and the growth height of the copper dendrite on the sample to be detected.
According to the analysis method of the copper dendrites on the surface of the diaphragm, the diaphragm is cleaned and analyzed by an atomic force microscope, so that the fine characterization analysis of the copper dendrites growing on the diaphragm is realized, the distribution and the growth height of the copper dendrites can be simultaneously characterized, and effective support can be provided for relevant basic theory research or optimization of battery performance.
In the step 1), the lithium ion battery can be disassembled by a conventional method to obtain the diaphragm for detection and analysis, and the disassembling process is preferably carried out in a glove box in an inert atmosphere to improve the safety.
The cleaning is to soak the diaphragm in an organic solvent, replace the organic solvent after soaking, carry out ultrasonic treatment, replace the organic solvent after ultrasonic treatment, and then carry out soaking treatment. And then soaking and naturally drying to obtain the sample to be detected. The atomic force microscope images by the tiny acting force between atoms, when the probe is close to the sample surface, because the weak van der Waals acting force exists between the atom at the tip of the probe point and the atom on the sample surface, the micro cantilever fixing the probe is positioned on the equipotential surface corresponding to the acting force between the sample atoms by controlling the constant van der Waals acting force during scanning, the cantilever moves in the direction vertical to the sample surface, the position change corresponding to each scanning point can be measured by an optical detection method, and then the signal is amplified and converted to obtain the scanning image of the sample. The working principle of the atomic microscope is easily obtained, the interaction degree between the probe and the atoms on the surface of the sample can be influenced to a certain degree by processing the sample, and the diaphragm sample obtained by disassembling the battery can directly cause the inaccuracy or the failure of the subsequent analysis and characterization process if the cleaning process is improper. By adopting the optimized cleaning process, the influence of components such as electrolyte on the subsequent analysis and characterization process can be reduced to the greatest extent, the clearer and more accurate surface morphology can be obtained, and the influence of the components on the measurement of the growth height of the copper dendrite can be effectively avoided. More preferably, the soaking time is 5-40 min. The power of the ultrasonic treatment is 60-80Hz, and the time is 5-20 min. The organic solvent is dimethyl carbonate and/or diethyl carbonate.
In the step 2), during scanning, a sample to be detected is bonded on a stainless steel slide. The sample to be measured can be cut into the size of 5mm by 5mm, so that the installation and the measurement of the sample to be measured are facilitated.
The scan was performed using Peak Force mode. The measurement can be carried out by adopting a ScanAsyst inAir mode in a Peak Force mode. The probe used for scanning is RTEAPA-150, and the elastic coefficient k is 6N/m. When scanning, the scanning range is controlled to be (50-120) mu m by (50-120) mu m, and preferably 90 mu m by 90 mu m. The laser is directed at locations 1/3-1/2 on the probe cantilever beam away from the free end face of the cantilever beam.
The threshold of force used during scanning is 5-10 nN. The threshold for the Peak Force tapping amplitude (Peak Force TappinAmplified) is 150-200 nm.
In step 2), the Analysis is performed using NanoScope Analysis software. The height measurement is performed using the Section function in the analysis software.
The analysis method of the copper dendrites on the surface of the diaphragm is suitable for fine characterization of the copper dendrites grown on the diaphragms such as polypropylene PP, polyethylene PE, polyimide PI and the like, can well characterize the height and distribution conditions of the copper dendrites while reproducing the morphology of the copper dendrites, realizes fine evaluation of the diaphragms under different electrochemical conditions, and further can provide effective support for performance optimization of lithium ion batteries.
Drawings
FIG. 1 is a surface topography of a separator without copper dendrites growing on the surface;
FIG. 2 is a surface topography of a diaphragm with small amounts of copper dendrites grown on the surface;
FIG. 3 is a copper dendrite height distribution plot obtained after processing the separator of FIG. 2 using analytical software;
FIG. 4 is a surface topography of a membrane with more copper dendrites grown on the surface.
Detailed Description
The following further describes embodiments of the present invention with reference to the drawings.
Example 1
The analysis method of the copper dendrite on the surface of the diaphragm adopts the following steps:
1) the lithium ion battery was disassembled in a glove box, the separator was separated and cut into 5mm by 5mm squares.
2) And (3) soaking the cut diaphragm in 50mL dimethyl carbonate (DMC) for 30min, replacing a soaking solvent with fresh DMC, performing ultrasonic treatment for 10min at 70Hz, replacing an ultrasonic treatment solvent with fresh DMC again after ultrasonic treatment, soaking for 10min, taking out the diaphragm sample, and naturally airing in a fume hood to obtain a sample to be measured.
3) A sample to be tested is adhered to a stainless steel slide piece through double-sided adhesive, scanning is carried out through a ScanAsystin Air mode in a Peak Force mode, the position where laser is emitted is 1/3, far away from the free end face of a cantilever beam, on the cantilever beam of a probe, the scanning range is 90 mu m by 90 mu m, the probe used for scanning is RTEAPA-150 (the elastic coefficient K is 6N/m), the applied Force threshold value is 5-10nN, and the Peak Force Tapping Amplitude (Peak Force Tapping Amplitude) threshold value is 150nm-180 nm.
4) Processing the scanning image obtained in the step 3) by using NanoScope Analysis software, and performing height measurement by using a Section function.
In the embodiment, the diaphragm used by the lithium ion battery is a single-drawn polypropylene diaphragm, the surface appearance of the diaphragm without copper dendrites growing on the surface is shown in fig. 1, the stretching condition and the pore distribution of the surface of the diaphragm can be obviously seen from fig. 1, and the overall roughness of the diaphragm is small.
The morphology of the separator with a small amount of copper dendrites growing on the surface, which is observed by the method of the embodiment, is shown in fig. 2, and the distribution of the copper dendrites in the pores of the separator can be seen. After the scanned image is processed by using analysis software, the specific height and distribution of the copper dendrites are analyzed and shown in fig. 3 and table 1.
TABLE 1 height distribution of copper dendrites over the scan range
Figure BDA0001722920790000031
Figure BDA0001722920790000041
As can be seen from the results in Table 1, there were 46 points in the scanning range where copper dendrites were grown and the density was 0.46 pieces/. mu.m2The average height is 86.733nm, the minimum height is 55.694nm, and the maximum height is 174.266 nm; the area with copper dendrites grown in the scanning range is 20466.680nm on average2Minimum area 1525.879nm2Maximum area of 123596.188nm2(ii) a The average equivalent diameter of the copper dendrite area is 136.826nm, the minimum equivalent diameter is 44.077nm, and the maximum equivalent diameter is 396.696 nm.
Another diaphragm sample was analyzed with reference to the method of example 1 and the surface topography of the diaphragm was shown in fig. 4, it can be seen that copper dendrites grow along the voids almost filling the diaphragm voids, and the scanned image can be further processed with analytical software to obtain detailed characterization data similar to table 1. With the characterization results, membrane samples of different processes can be finely compared and evaluated, so that data support can be provided for improvement of battery performance.
In other embodiments of the present invention, the cleaning of the separator may be achieved by replacing dimethyl carbonate with diethyl carbonate or a mixed solvent of dimethyl carbonate and diethyl carbonate according to the method of embodiment 1. In the cleaning process, the time of immersion and the conditions of ultrasonic treatment can be adjusted within the range defined by the present invention, and the effect equivalent to that of example 1 can be obtained.

Claims (8)

1. A method for analyzing copper dendrites on the surface of a diaphragm is characterized by comprising the following steps:
1) cleaning a diaphragm obtained by disassembling the lithium ion battery to obtain a sample to be detected;
2) and scanning the sample to be detected by using an atomic force microscope, and analyzing according to the scanning image to obtain the distribution and the growth height of the copper dendrite on the sample to be detected.
2. The method for analyzing copper dendrites on the surface of a separator according to claim 1 wherein in step 1), the cleaning is performed by soaking the separator in an organic solvent, replacing the organic solvent after soaking, performing ultrasonic treatment, replacing the organic solvent after ultrasonic treatment, and performing soaking treatment.
3. The method for analyzing copper dendrites on the surface of a separator according to claim 2 wherein the soaking time is 5-40 min.
4. The method for analyzing copper dendrites on the surface of a separator according to claim 2 wherein the power of the ultrasonic treatment is 60 to 80Hz and the time is 5 to 20 min.
5. The method of analyzing copper dendrites on the surface of a separator according to claim 2 wherein the organic solvent is dimethyl carbonate and/or diethyl carbonate.
6. The method for analyzing copper dendrites on the surface of a diaphragm of claim 1 wherein in step 2), the scanning is performed using a PeakForce mode, and the threshold of force applied during scanning is 5-10 nN.
7. The method for analyzing copper dendrites on the surface of a diaphragm of claim 1 wherein in step 2), the scanning is performed using a PeakForce mode, and the threshold value of the peak force tapping amplitude during scanning is 150-200 nm.
8. The method for analyzing copper dendrites on the surface of a separator according to claim 1 wherein in step 2), the Analysis is performed using NanoScope Analysis software.
CN201810739668.6A 2018-07-06 2018-07-06 Analysis method of copper dendrite on surface of diaphragm Pending CN110687318A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201810739668.6A CN110687318A (en) 2018-07-06 2018-07-06 Analysis method of copper dendrite on surface of diaphragm

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201810739668.6A CN110687318A (en) 2018-07-06 2018-07-06 Analysis method of copper dendrite on surface of diaphragm

Publications (1)

Publication Number Publication Date
CN110687318A true CN110687318A (en) 2020-01-14

Family

ID=69107116

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201810739668.6A Pending CN110687318A (en) 2018-07-06 2018-07-06 Analysis method of copper dendrite on surface of diaphragm

Country Status (1)

Country Link
CN (1) CN110687318A (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102200543A (en) * 2010-03-24 2011-09-28 国家纳米技术与工程研究院 AFM (Atomic Force Microscope)-based device for performing nanoindentation measurement on surface of microparticle
CN102439462A (en) * 2008-11-13 2012-05-02 布鲁克纳米公司 Method and apparatus of operating a scanning probe microscope
CN105203566A (en) * 2015-09-07 2015-12-30 哈尔滨工业大学 Method for detecting lithium extraction of negative electrode of lithium ion battery
CN105826515A (en) * 2016-05-16 2016-08-03 北京师范大学 Lithium ion battery cathode material and application thereof
CN106248998A (en) * 2016-07-22 2016-12-21 同济大学 A kind of asphalt Research on Mechanical Properties method based on atomic force microscopy
CN107064475A (en) * 2017-05-03 2017-08-18 同济大学 Ageing of asphalt degree based on atomic force microscopy method of discrimination in situ
CN107449939A (en) * 2017-08-03 2017-12-08 哈尔滨工业大学 Magnetic drives peak force modulation AFM and multi-parameter method for synchronously measuring
CN108535516A (en) * 2018-02-05 2018-09-14 多氟多(焦作)新能源科技有限公司 A method of measuring pole piece SEI film thicknesses using atomic force microscope

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102439462A (en) * 2008-11-13 2012-05-02 布鲁克纳米公司 Method and apparatus of operating a scanning probe microscope
CN102200543A (en) * 2010-03-24 2011-09-28 国家纳米技术与工程研究院 AFM (Atomic Force Microscope)-based device for performing nanoindentation measurement on surface of microparticle
CN105203566A (en) * 2015-09-07 2015-12-30 哈尔滨工业大学 Method for detecting lithium extraction of negative electrode of lithium ion battery
CN105826515A (en) * 2016-05-16 2016-08-03 北京师范大学 Lithium ion battery cathode material and application thereof
CN106248998A (en) * 2016-07-22 2016-12-21 同济大学 A kind of asphalt Research on Mechanical Properties method based on atomic force microscopy
CN107064475A (en) * 2017-05-03 2017-08-18 同济大学 Ageing of asphalt degree based on atomic force microscopy method of discrimination in situ
CN107449939A (en) * 2017-08-03 2017-12-08 哈尔滨工业大学 Magnetic drives peak force modulation AFM and multi-parameter method for synchronously measuring
CN108535516A (en) * 2018-02-05 2018-09-14 多氟多(焦作)新能源科技有限公司 A method of measuring pole piece SEI film thicknesses using atomic force microscope

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
冯明燕: "锂离子电池硅基负极材料的制备及电化学性能", 《中国优秀博硕士学位论文全文数据库(硕士)工程科技Ⅰ辑》 *
王金良: "碱性锌锰电池内部短路的探讨", 《电池工业》 *
马月: "锂离子电池凝胶及固态聚合物电解质", 《中国优秀博硕士学位论文全文数据库(硕士)工程科技Ⅱ辑》 *

Similar Documents

Publication Publication Date Title
CN110261380B (en) In-situ synchronous observation system for electrode reaction of lithium ion battery
KR100865401B1 (en) Method of measuring wettability for non aqueous electrolyte battery and apparatus for the same
CN111175662A (en) Lithium ion battery evaluation method and lithium ion battery detection system
CN106099106B (en) It is ultrafast to fill lithium ion battery negative material, preparation method and lithium ion battery
CN103252541A (en) Device and method for manufacturing large-length-diameter-ratio nanoscale shafts
CN103132129A (en) Preparation method of electrochemical polishing sample in EBSD (electron back-scattered diffraction) texture analysis of cold rolled deep-draw automobile sheet
CN110687318A (en) Analysis method of copper dendrite on surface of diaphragm
CN103135147A (en) Method and device of identifying raindrop size spectrum
CN112038541A (en) Composite diaphragm material and preparation method and application thereof
CN114200322A (en) Lithium ion battery lithium separation detection method
CN114778633B (en) Single-layer particle electrode for electrochemical analysis and electrochemical analysis method
Legerstee et al. Scanning probe microscopy facility for operando study of redox processes on lithium ion battery electrodes
CN114646731B (en) Decomposition method for irreversible expansion of battery pole piece
CN110568052A (en) Method for comparing low-temperature performance of carbon negative electrode material of lithium ion battery
CN104459561A (en) Method for measuring lead dendrite crystal short-circuiting of superfine glass fiber partition boards of lead-acid storage battery
CN114813873A (en) Microbial electrochemical analysis device and analysis method thereof
CN113240658A (en) Battery charging system and method based on machine vision
CN201804045U (en) Cell cover internal resistance testing tool
CN112130083A (en) Multifunctional Internet of things intelligent detection system for lithium battery
CN112378979B (en) Device and method for detecting abrasive particle sharpness degree of surface of grinding tool
CN109585819A (en) A kind of high-capacity lithium ion cell silicon-carbon composite cathode material and preparation method thereof
CN112305209B (en) Non-contact adherent cell three-dimensional morphology measuring method and cell sealing method
CN112599878A (en) Treatment method and application of electrode waste
CN107026274B (en) Preparation method and application of graphene/carbon paper gas electrode of borax buffer system
CN217901579U (en) Quick collection device of lithium electricity surface defect

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
CB02 Change of applicant information
CB02 Change of applicant information

Address after: 454191 Henan Province, Jiaozuo City Station area coke Rd

Applicant after: Duofudo New Material Co.,Ltd.

Address before: 454191, Feng County, Henan Province, Jiaozuo Feng Feng Chemical Industry Zone

Applicant before: DO-FLUORIDE CHEMICALS Co.,Ltd.

RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20200114