CN110632087A - Surface defect detection device - Google Patents
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- CN110632087A CN110632087A CN201911077209.7A CN201911077209A CN110632087A CN 110632087 A CN110632087 A CN 110632087A CN 201911077209 A CN201911077209 A CN 201911077209A CN 110632087 A CN110632087 A CN 110632087A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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Abstract
The invention provides a surface defect detection device, which belongs to the technical field of detection and comprises a plurality of groups of light sources, a pulse module, an imaging module and a processing module, wherein the plurality of groups of light sources respectively irradiate the surface of a detected product at different angles; the pulse module is respectively connected with the multiple groups of light sources so as to respectively control the on and off of the multiple groups of light sources through pulse modulation signals of the pulse module; the imaging module is in signal connection with the pulse module and is used for acquiring an image of a detected product according to a signal sent by the pulse module; the processing module is in signal connection with the imaging module and is used for receiving and processing the image acquired by the imaging module. Utilize the light source group of multi-angle to adopt the timesharing technique of lighting up, through the image data to the illumination of the different angles of a lot of collection to the same department in measured product surface for increase defect and background contrast, and carry out analysis processes to these many images, avoid examining because of the improper hourglass that causes of illumination angle, thereby promote product quality.
Description
Technical Field
The invention relates to the technical field of detection, in particular to a surface defect detection device.
Background
With the vigorous development of the global manufacturing industry, the manufacturing industry market in China is advancing to a high-speed development way, and various product products need to be subjected to quality detection. Among them, in the production process and use process of flat products such as metal flat plate, steel strip, ceramic tile, glass and the like, various defects such as scratches, cracks, depressions, bubbles, stains and the like occur on the surface of the products inevitably. If not handled in time, these defects will affect the quality and safety of the product.
At present, the mainstream surface detection modes for the flat plate products mainly comprise manual detection, electromagnetic detection, ray detection, machine vision detection and the like. Wherein the manual detection has high cost and low efficiency, and the detection level is influenced by subjective factors. The electromagnetic detection structure is complex, the detection efficiency is low, and the electromagnetic detection method is not suitable for large-scale production and detection. The detection precision and efficiency of the ray detection are high, but the manufacturing cost is relatively expensive. The machine vision detection technology is the most common non-contact detection mode at present, has high detection precision, high efficiency and stable and reliable detection result, and the product is detected by utilizing the vision detection technology, so that the labor cost is reduced, and the quality and the yield of the product are greatly improved.
In the visual inspection technology, a surface light source or a line light source is generally used for providing illumination, a camera receives diffuse reflection light from the surface of a product and receives the diffuse reflection light by a detector for photoelectric conversion, and an obtained analog signal is subjected to A/D conversion to obtain a digital signal which is processed by a signal processing system. In the detection of common flat plate products, because surface defects are random, a proper illumination angle is difficult to find for illumination imaging to increase the contrast, and the use of a uniform surface light source can also lead to the homogenization of defect characteristics and the low contrast ratio between the presented defect and the background.
Disclosure of Invention
The invention aims to provide a surface defect detection device, which can reduce the omission ratio and improve the product quality by lighting the light sources with different angles in a time-sharing manner so as to set a proper illumination angle.
The embodiment of the invention is realized by the following steps:
the embodiment of the invention provides a surface defect detection device, which comprises a plurality of groups of light sources, wherein the light sources irradiate the surface of a detected product at different angles; the pulse module is respectively connected with the multiple groups of light sources so as to respectively control the on and off of the multiple groups of light sources through pulse modulation signals of the pulse module; the imaging module is in signal connection with the pulse module and is used for acquiring an image of the product to be detected according to a signal sent by the pulse module; and the processing module is in signal connection with the imaging module and is used for receiving and processing the image acquired by the imaging module.
Optionally, the pulse modulation signal of the pulse module is a pulse width modulation signal, the pulse module includes a controller, a logic device and a driving unit, the controller is connected with the driving unit through the logic device, the driving unit is respectively connected with the multiple groups of light sources, the logic device converts the control signal of the controller into a corresponding pulse width modulation signal and sends the pulse width modulation signal to the driving unit, and the driving unit controls the on and off of the multiple groups of light sources according to the pulse width modulation signal.
Optionally, the logic is a complex programmable logic device.
Optionally, the lighting device further comprises a reflector arranged on the light outgoing side far away from the light source, the reflector is provided with a curved surface reflecting surface, the light emitting angle of the light source is larger than 60 degrees, and the multiple groups of light sources are arranged on the curved surface reflecting surface of the reflector, so that light emitted by the light source is reflected on the reflector.
Optionally, the number of the light sources in one group is two, and the two light sources in one group are symmetrically arranged on two sides of the central axis of the reflector.
Optionally, the light source further comprises a plurality of plano-convex cylindrical lenses, each plano-convex cylindrical lens corresponds to one light source, and each plano-convex cylindrical lens is arranged on the light outgoing side corresponding to the light source.
Optionally, the plurality of groups of light sources are arranged in a line.
Optionally, the processing module and the imaging module are connected by a sensor.
Optionally, the device further comprises a conveyor belt, which is arranged on the light-emitting side of the light sources and arranged along the arrangement direction of the plurality of groups of light sources, and is used for conveying the detected product.
Optionally, the heat dissipation module is further included, and the heat dissipation module is disposed on the reflector.
The embodiment of the invention has the beneficial effects that:
the surface defect detection device provided by the embodiment of the invention comprises a plurality of groups of light sources, a pulse module, an imaging module and a processing module, wherein the plurality of groups of light sources respectively irradiate the surface of a detected product at different angles to obtain a plurality of groups of image data of the surface of the detected product under different-angle illumination so as to increase the contrast between the surface defect of the detected product and the background, the pulse modulation signals of the pulse module are respectively connected with the plurality of groups of light sources through the pulse module, the imaging module is used for acquiring the image of the detected product according to the signals sent by the pulse module and feeding the image back to the processing module for processing so as to detect the surface defect of the detected product. The surface defect detection device provided by the embodiment of the invention utilizes the multi-angle light source group and adopts the time-sharing lighting technology, and the image data of multiple times of illumination at different angles is collected at the same position on the surface of the detected product so as to increase the contrast ratio of the defect and the background, and the multiple images are analyzed and processed, so that the missing detection caused by improper illumination angles is avoided, and the product quality is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.
FIG. 1 is a schematic structural diagram of a surface defect detecting apparatus according to an embodiment of the present invention;
FIG. 2 is a second schematic structural diagram of a surface defect detecting apparatus according to an embodiment of the present invention;
FIG. 3 is a third schematic structural diagram of a surface defect detecting apparatus according to an embodiment of the present invention;
FIG. 4 is a fourth schematic structural diagram of a surface defect detecting apparatus according to an embodiment of the present invention;
fig. 5 is a timing diagram of triggering the visible light camera and timing diagrams of turning on and off the multiple groups of light sources according to the embodiment of the present invention.
Icon: 1-a reflector; 2-a first sub-light source; 3-a second sub-light source; 4-a third sub-light source; 201-a fourth sub-light source; 301-a fifth sub-light source; 401-a sixth sub-light source; 5-plano-convex cylindrical lens; 6-a first visible light camera; 601-a second visible light camera; 7-the product to be tested; 8-a conveyor belt.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.
Referring to fig. 1, the present embodiment provides a surface defect detecting apparatus for detecting surface defects of products, particularly surface defects of flat plate products, which includes a plurality of sets of light sources, a pulse module, an imaging module, a processing module, a reflector 1 and a convex cylindrical lens 5.
The multiple groups of light sources respectively irradiate the surface of the detected product 7 at different angles, the light sources can be high-power white light LED lamp strips, and the surface of the light sources is provided with densely arranged LED lamp beads for forming uniform illumination on the detection surface. The LED lamp strip is driven in a constant current mode, the frequency of a light source can be guaranteed, and the service life and the good dimming performance of the lamp bead are guaranteed. The multiple groups of light sources are arranged in a linear shape and irradiate towards the surface of the detected product 7.
The group of light sources includes two light sources symmetrically disposed on both sides of the central axis of the reflector 1, as shown in fig. 1, the first sub light source 2 and the fourth sub light source 201 are a group of light sources, the second sub light source 3 and the fifth sub light source 301 are a group of light sources, the third sub light source 4 and the sixth sub light source 401 are a group of light sources, and the fourth sub light source 201, the fifth sub light source 301 and the sixth sub light source 401 are light sources corresponding to the first sub light source 2, the second sub light source 3 and the third sub light source 4, respectively, at the other end of the reflector 1, and have the same light emitting characteristics as the first sub light source 2, the second sub light source 3 and the third sub light source 4.
Certainly, the present embodiment is not limited to the three groups of light sources, the more the light source groups are, the more the photographed images illuminated at different angles are, the more accurate the result is, and certainly, under the condition of ensuring the detection precision, the more the light source groups are, the smaller the actual line frequency of the corresponding camera is, and the reasonable design should be performed according to the production condition.
This embodiment makes multiunit light source with the angle setting of difference on reflector 1 through setting up multiunit light source to constitute multi-angle line light source module, its luminance is high, and concentration nature is good. For example, as shown in fig. 1, the three groups of light sources of the present embodiment are all disposed on the reflector 1, the reflector 1 has a curved reflective surface, for example, a parabolic reflective surface, the reflective surface is reflected by a plated reflective film, and the reflector is disposed on the light exit side away from the light source, but because the reflector 1 has a curved reflective surface, reflective surfaces with different angles can be formed, when the light emitting angle of the light source is large, the light emitted from the light source is in a scattering shape, a part of the light can be emitted to the reflector 1, and then reflected by the reflective surface of the reflector 1, the light emitted from the light source can be greatly converged on the same narrow band, thereby improving the light utilization rate.
Generally, when the light emitting angle of the light source is greater than 60 °, the light emitted from the light source can be received by the reflector 1. The larger the light emitting angle of the light source is, the more the light emitted by the light source is emitted to the reflector 1, the light emitting angle of the general patch LED lamp is 120 degrees, and therefore, the more the light received by the reflector 1 is, and the better the light utilization rate is.
The reflector 1 can be further provided with a heat dissipation module which can be a water cooling system or an air cooling system and the like, so that the normal operation of the high-power LED lamp is ensured.
In addition, the light-emitting side of each light source is also correspondingly provided with a plano-convex cylindrical lens 5, as shown in fig. 2, the plano-convex cylindrical lens 5 forms a linear image and is used for controlling the size of the light beam in one direction only, and the plano-convex cylindrical lens 5 is arranged on the light-emitting side of the light source due to the fact that the focal length changes along with the wavelength, so that emergent light of the light source is shaped and converged, the brightness is improved, and meanwhile, the light utilization rate is increased.
The embodiment further comprises a pulse module, an imaging module and a processing module, wherein the pulse module is respectively connected with the multiple groups of light sources so as to respectively control the on and off of the multiple groups of light sources through pulse modulation signals of the pulse module.
The pulse module can comprise a controller, a logic device and a driving unit, wherein the controller is connected with the driving unit through the logic device, the controller receives a user instruction and sends a control signal to the logic device according to the user instruction, the logic device converts the control signal into a corresponding PWM signal (PWM pulse width modulation, which is a method for digitally coding the level of an analog signal) through internal logic calculation and sends the PWM signal to the driving unit, the output end of the driving unit is connected with the light source, and the driving unit controls the working state of the light source according to the PWM signal so as to enable the multiple groups of light sources to be periodically turned on and off.
The user instruction can be realized by electrically connecting the operation panel with the controller, and the operation panel can be a touch screen.
The Logic Device can be a Complex Programmable Logic Device (CPLD), and the multi-angle line light source module sends out a Pulse Width Modulation (PWM) signal to control on and off based on the CPLD module.
As shown in fig. 5, a is a timing chart of the triggering of the visible light camera, B is a timing chart of the turning-on and turning-off of the first group of light sources, C is a timing chart of the turning-on and turning-off of the second group of light sources, and D is a timing chart of the turning-on and turning-off of the third group of light sources. When a first group of light sources, such as the first sub-light source 2 and the fourth sub-light source 201, are at high level, the other two groups of light sources are at low level and are not lighted; at the next moment, the second group of light sources, for example, the second sub-light source 3 and the fifth sub-light source 301 are on, and the other two groups of lights are off; similarly, there is only one set of light sources to light at a time, referred to as time-shared lighting.
The imaging module is in signal connection with the pulse module and is used for acquiring the image of the tested product 7 according to the signal sent by the pulse module. The processing module is in signal connection with the imaging module and is used for receiving and processing the image acquired by the imaging module.
The imaging module is illustratively a visible light camera, and has the characteristics of high-speed acquisition and high resolution, and the present embodiment has two visible light cameras, namely a first visible light camera 6 and a second visible light camera 601, which are respectively symmetrically arranged on two sides of the central axis of the reflector 1 and face the product 7 to be measured so as to capture an image of the product 7 to be measured.
The imaging module is connected with the logic device of the pulse module, the controller sends an external trigger signal (user instruction) to the logic device, the logic device converts the external trigger signal into a corresponding synchronous signal and sends the synchronous signal to the driving unit, the driving unit controls the light source and the imaging module to work synchronously according to the synchronous signal, and the imaging module acquires an image of a detected product 7 according to a signal sent by the pulse module.
The visible light camera is optically connected with a sensor, the sensor can be a linear array CCD (Charge Coupled Device) sensor, and the visible light camera transmits the acquired product image to the processing module through the sensor.
At the same time when any one group of light sources in the multi-angle line light source module are turned on, as shown in fig. 5, the rising edge of the camera trigger signal emitted by the CPLD triggers once, that is, the first visible light camera 6 and the second visible light camera 601 are exposed, so that the product image at the illumination angle is acquired. In one period, each group of light sources are respectively lightened once, each visible light camera is respectively exposed for 3 times, and the two visible light cameras output six rows of data which are respectively the rows of data at different observation angles and different illumination angles. For example, the PWM modulation signal frequency is 21K HZ, the real line frequency of the single camera is 7K HZ.
After the six rows of data are obtained, the processing module can firstly perform certain digital image processing, then calculate the variance delta of the single row of data, and compare the variance delta with a preset threshold value T, if delta is larger than T, the data of the row are judged to have larger discrete degree, namely the surface of the product has defects. The processing module is in signal connection with the imaging module and is used for receiving and processing the image acquired by the imaging module.
As shown in fig. 3 and 4, the present embodiment further includes a conveyor belt 8 disposed on the light-emitting side of the light source and arranged along the arrangement direction of the plurality of groups of light sources, so as to provide the moving speed of the detected product 7 for conveying the detected product 7, so that the detected product 7 sequentially passes through the light-emitting side directions of the plurality of light sources through the conveyor belt 8 and is irradiated by the plurality of light sources at different angles, thereby obtaining image data illuminated at different angles, and increasing the contrast between the surface defect of the detected product 7 and the background.
The speed of the conveyor belt 8 can be adjusted as required to suit the inspection output of different products in the surface inspection industry.
When the surface defect detection device provided by the embodiment of the invention works, a detected product 7 moves through the conveyor belt 8, a plurality of groups of light sources are arranged on the parabolic reflector 1 and are arranged in a linear manner, in the moving process of the detected product 7, the parabolic multi-angle line light source module is used for carrying out time-sharing lighting to control the on and off of different groups of light sources, so that the purpose of switching the lighting angles is achieved, then a linear array visible light camera is used for collecting image data of the surface of the detected product 7 under lighting at different angles, and a variance threshold algorithm is operated according to the obtained multi-line data to judge whether the line data are data carrying defect characteristics, so that the surface defect of the detected product 7 is judged.
In the surface defect detection device provided by the embodiment of the invention, the multiple groups of light sources respectively irradiate the surface of the detected product 7 at different angles to obtain the image data of the surface of the detected product 7 under the illumination of the multiple groups of light sources at different angles, so as to increase the contrast between the surface defect of the detected product 7 and the background, the pulse modulation signals of the pulse modules respectively control the on and off of the multiple groups of light sources through the connection of the pulse modules and the multiple groups of light sources, and the imaging module acquires the image of the detected product 7 according to the signals sent by the pulse modules and feeds the image back to the processing module for processing so as to detect the surface defect of the detected product 7. The embodiment of the invention provides a surface defect detection device.
The surface defect detection device provided by the embodiment of the invention utilizes the multi-angle line light source and adopts the time-sharing lighting technology, and the image data of multiple times of different-angle illumination is collected at the same position on the surface of the product, so that the contrast ratio of the defect and the background is increased, the most appropriate illumination angle is found, and the multiple images are analyzed and processed, thereby avoiding the missing detection caused by the improper illumination angle, and further improving the product quality. The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A surface defect detecting apparatus, comprising:
the light sources irradiate the surface of the product to be detected at different angles;
the pulse module is respectively connected with the multiple groups of light sources so as to respectively control the on and off of the multiple groups of light sources through pulse modulation signals of the pulse module;
the imaging module is in signal connection with the pulse module and is used for acquiring an image of the product to be detected according to a signal sent by the pulse module;
and the processing module is in signal connection with the imaging module and is used for receiving and processing the image acquired by the imaging module.
2. The surface defect detecting apparatus of claim 1, wherein the pulse modulation signal of the pulse module is a pulse width modulation signal, the pulse module comprises a controller, a logic device and a driving unit, the controller is connected with the driving unit through the logic device, the driving unit is respectively connected with the plurality of groups of light sources, the logic device converts the control signal of the controller into a corresponding pulse width modulation signal and sends the pulse width modulation signal to the driving unit, and the driving unit controls the on/off of the plurality of groups of light sources according to the pulse width modulation signal.
3. The surface defect inspection apparatus of claim 2, wherein the logic is a complex programmable logic device.
4. The surface defect detecting device of claim 1, further comprising a reflector disposed on a light exit side away from the light sources, the reflector having a curved reflective surface, the light sources having an emission angle greater than 60 °, the plurality of sets of light sources being disposed on the curved reflective surface of the reflector such that light emitted by the light sources is reflected on the reflector.
5. The surface defect detecting apparatus of claim 4, wherein the number of the light sources of one group is two, and the two light sources of one group are symmetrically disposed on both sides of the central axis of the reflector.
6. The surface defect detecting apparatus of claim 1, further comprising a plurality of plano-convex cylindrical lenses, each plano-convex cylindrical lens corresponding to one of the light sources, each plano-convex cylindrical lens being disposed on a light exit side corresponding to the light source.
7. The apparatus according to any one of claims 1 to 6, wherein the plurality of sets of light sources are arranged in a line.
8. The surface defect detection apparatus of claim 1, wherein the processing module and the imaging module are connected by a sensor.
9. The surface defect detecting device of claim 1, further comprising a conveyor belt disposed at the light emitting side of the light sources and arranged along the arrangement direction of the plurality of groups of light sources for conveying the product to be detected.
10. The surface defect detecting apparatus of claim 4, further comprising a heat sink module disposed on the reflector.
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