CN110460485B - Device and method for testing Ethernet interface performance - Google Patents
Device and method for testing Ethernet interface performance Download PDFInfo
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- H—ELECTRICITY
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Abstract
The embodiment of the invention discloses a device and a method for testing the performance of an Ethernet interface, which can test the performance of the Ethernet interface with higher speed by using a tester with lower speed. The device comprises: the device comprises a tester, a light splitter and a switching board; the tester sends test data through a first port, the optical splitter is used for copying the test data into n parts which are completely the same and sending the n parts, the switch board is used for receiving the n parts of the test data from the optical splitter and sending the n parts of the test data after gathering the n parts of the test data so that the tested equipment can receive the n parts of the test data from the switch board, one part of the test data is selected and sent out, the tester receives the test data from the tested equipment through a second port, the test data and the test data sent through the first port are compared and checked, and performance test is carried out on the ports interconnected with the switched board and the tested equipment or channels between the ports interconnected with the switched board and the tested equipment according to comparison and check results.
Description
Technical Field
The embodiment of the invention relates to the field of communication, in particular to a device and a method for testing the performance of an Ethernet interface.
Background
The testing of the high-speed ethernet interface generally requires that the port rate of the network test instrument is consistent with the port rate of the tested switching device, i.e. if the port rate of the tested switching device is 100G, the port rate of the network test instrument should also be 100G.
For example, the scenarios of 100 ethernet high-speed interface are generally divided into the following 2 types: (1) switch board panel 100G port testing (hardware connections are shown in fig. 1); (2) the switch board is tested across the board 100G ports (hardware connections are shown in fig. 2). The following takes the switch board 100G port test as an example to illustrate the principle of the ethernet interface test: the network test instrument transmits packets at full bandwidth through 1 port (such as a tester P1), then through 1 port (such as a tested port P1) of the tested device, the tested device forwards the received data packets through another 1 port (such as a tested port P2), and the network test instrument finally receives the data packets transmitted from a tester P1 port through another 1 port (such as a tester P2), compares the data packets, and counts whether packet loss exists. At the same time, tester P2 also sends out a data packet, and finally returns to tester P1 through the reverse path, and compares and counts the result. And determining the port rate of the switching single-board panel 100G through comparison and statistical results.
With the increasing doubling of ethernet switching and interface rates, the interface rate of the test instruments often cannot keep pace with the development of the devices under test. The network tester with the 10G rate can not meet the testing requirements of the 25G, 50G and 100G interface rates, new meters need to be continuously purchased, and the high cost is required for being equipped with the matched Ethernet network testing meter.
Disclosure of Invention
Aiming at the defects and shortcomings of the prior art, the embodiment of the invention provides a device and a method for testing the performance of an Ethernet interface.
In one aspect, an embodiment of the present invention provides an apparatus for testing performance of an ethernet interface, including:
the device comprises a tester, a light splitter and a switching board; wherein,
the first port of the tester is connected with the optical splitter, the optical splitter is connected with the exchange board, the exchange board is connected with the tested equipment, and the tested equipment is connected with the second port of the tester;
the tester sends test data through the first port, the optical splitter is used for copying the test data into n parts which are completely the same and sending the test data out, the switch board is used for receiving the n parts of the test data from the optical splitter and sending the n parts of the test data after gathering so that the tested device can receive the n parts of the test data from the switch board, one part of the test data is selected and sent out, the tester receives the test data from the tested device through the second port, the test data and the test data sent through the first port are compared and checked, and the performance test is carried out on the ports interconnected with the tested device or the channels between the ports interconnected with the switch board and the tested device according to the comparison and check result, wherein n is a positive integer, and the product of the rate of sending the test data by the tester and n is equal to the rate of the ports interconnected with the tested device or the channels between the ports interconnected with the tested device and the tested device And (4) rate.
In the device for testing the performance of the ethernet interface provided by the embodiment of the invention, the optical splitter duplicates the test data sent by one port of the tester into n parts, the switch board collects the n parts of test data and sends the n parts of test data out, so that the tested device selects one part of the n parts of test data to send out, the tester receives the data sent by the tested device through the other port, and the test data sent by one port and the test data received by the other port are compared and verified to test the performance of the ethernet interface, and the product of the rate of sending the test data by the tester and n in the whole scheme is equal to the rate of a tested object (port or channel), so that the tester with lower rate can be used for testing the performance of the ethernet interface with higher rate, and the cost is saved.
In another aspect, an embodiment of the present invention provides a method for testing performance of an ethernet interface, including:
the device comprises a tester, a first optical splitter, a second optical splitter, a first exchange plate and a second exchange plate; wherein,
a first port of the tester is connected with the first optical splitter, the first optical splitter is connected with the first switch board, the first switch board is connected with first tested equipment, and the first tested equipment is connected with a second port of the tester through second tested equipment;
the second port of the tester is connected with the second optical splitter, the second optical splitter is connected with the second switch board, the second switch board is connected with the second tested equipment, and the second tested equipment is connected with the first port of the tester through the first tested equipment;
the tester sends test data through the first port, the first optical splitter is used for copying the test data into n identical parts and sending the n identical parts out, and the first switch board is used for receiving the n parts of test data from the first optical splitter, gathering the n parts of test data and sending the gathered n parts of test data out, so that the first tested equipment receives the n parts of test data from the first switch board and forwards the n parts of test data to the second tested equipment for processing;
the tester receives test data from the second tested equipment through the second port, and compares the test data with the test data sent through the first port for verification, wherein the process of processing data by the second tested equipment is as follows: selecting one piece of test data from the n pieces of test data from the first tested device, and sending out the test data;
the tester sends test data through the second port, the second optical splitter is used for copying the test data into n identical parts and sending out the n identical parts, and the second switch board is used for receiving the n parts of test data from the second optical splitter, gathering the n parts of test data and sending out the gathered n parts of test data so that the second tested equipment can receive the n parts of test data from the second switch board and forward the n parts of test data to the first tested equipment for processing;
the tester receives test data from the first tested equipment through the first port, compares the test data with the test data sent through the second port for verification, and performs performance test on the ports interconnected with the second tested equipment or a channel between the ports according to the two comparison and verification results, wherein n is a positive integer, and the data processing process of the first tested equipment is as follows: and selecting one piece of test data from the n pieces of test data from the second tested device, and sending out the piece of test data, wherein the product of the rate of sending the test data by the tester and n is equal to the rate of the port or the channel between the interconnected ports of the first tested device and the second tested device.
Compared with the device embodiment, the device for testing the performance of the Ethernet interface provided by the embodiment of the invention is provided with 2 optical splitters and 2 exchange boards, the 2 optical splitters and the 2 exchange boards are utilized to realize bidirectional receiving and sending of test data, the tester tests the performance of the Ethernet interface through comparison and verification of the test data which is received and sent bidirectionally, and the product of the rate of sending the test data by the tester and n in the whole scheme is equal to the rate of a tested object (a port or a channel), so that the tester with lower rate can be utilized to test the performance of the Ethernet interface with higher rate.
In a third aspect, an embodiment of the present invention provides a method for testing performance of an ethernet interface based on the foregoing apparatus, including:
the tester sends test data through the first port;
the optical splitter duplicates the test data into n identical parts and sends out the n identical parts;
the switch board receives n test data from the optical splitter, converges the n test data and sends the n test data out, so that the tested equipment can receive the n test data from the switch board, select one test data and send the test data out;
the tester receives the test data from the tested equipment through the second port, compares the test data with the test data sent through the first port, and performs performance test on the ports interconnected with the exchange board and the tested equipment or the channel between the ports according to the comparison and verification result.
In the method for testing the performance of the Ethernet interface provided by the embodiment of the invention, the optical splitter duplicates the test data sent by one port of the tester into n parts, the switch board collects the n parts of test data and sends the n parts of test data out so that the tested device selects one part of the n parts of test data to send out, the tester receives the data sent by the tested device through the other port, and the test data sent by one port and the test data received by the other port are compared and verified to test the performance of the Ethernet interface, and the product of the rate of sending the test data by the tester and n in the whole scheme is equal to the rate of a tested object (port or channel), so that the tester with lower rate can be used for testing the performance of the Ethernet interface with higher rate, and the cost is saved.
In a fourth aspect, an embodiment of the present invention provides a method for testing performance of an ethernet interface based on the foregoing apparatus, including:
the tester sends test data through the first port, the first optical splitter duplicates the test data into n identical parts and sends the n identical parts out, the first switch board receives the n parts of test data from the first optical splitter, and the n parts of test data are gathered and sent out so that the first tested equipment can receive the n parts of test data from the first switch board and forwards the n parts of test data to the second tested equipment for processing;
the tester receives test data from the second tested equipment through the second port, and compares and verifies the test data with the test data sent through the first port;
the tester sends test data through the second port, the second optical splitter duplicates the test data into n identical parts and sends the n identical parts out, the second switch board receives the n parts of test data from the second optical splitter, and the n parts of test data are converged and sent out so that the second tested equipment can receive the n parts of test data from the second switch board and forwards the n parts of test data to the first tested equipment for processing;
the tester receives the test data from the first tested equipment through the first port, compares the test data with the test data sent through the second port for verification, and performs performance test on the ports interconnected with the second tested equipment or the channel between the ports according to the two comparison and verification results.
Compared with the method embodiment, the method for testing the performance of the Ethernet interface provided by the embodiment of the invention has the advantages that 2 optical splitters and 2 exchange boards are arranged, the 2 optical splitters and the 2 exchange boards are utilized to realize the bidirectional receiving and sending of the test data, the tester tests the performance of the Ethernet interface through the comparison and verification of the test data which are received and sent bidirectionally, and the product of the speed of sending the test data by the tester and n in the whole scheme is equal to the speed of a tested object (a port or a channel), so that the tester with lower speed can be utilized to test the performance of the Ethernet interface with higher speed.
Drawings
Fig. 1 is a schematic diagram of a hardware connection for a port test of a conventional switch board 100G;
fig. 2 is a schematic diagram of a hardware connection for cross-board 100G port test of a conventional switch board;
FIG. 3 is a diagram illustrating a hardware connection of an embodiment of an apparatus for testing the performance of an Ethernet interface according to the present invention;
FIG. 4 is a diagram illustrating a hardware connection of another embodiment of an apparatus for testing the performance of an Ethernet interface according to the present invention;
FIG. 5 is a diagram illustrating a hardware connection of another embodiment of an apparatus for testing the performance of an Ethernet interface according to the present invention;
FIG. 6 is a diagram illustrating a hardware connection of another embodiment of an apparatus for testing the performance of an Ethernet interface according to the present invention;
FIG. 7 is a flowchart illustrating an embodiment of a method for testing performance of an Ethernet interface according to the present invention;
fig. 8 is a flowchart illustrating a method for testing performance of an ethernet interface according to another embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some embodiments, but not all embodiments, of the present invention. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments of the present invention without any creative effort belong to the protection scope of the embodiments of the present invention.
Referring to fig. 3, the present embodiment discloses an apparatus for testing performance of an ethernet interface, including:
a tester 10, a beam splitter 11 and an exchange plate 12; wherein,
a first port of the tester 10 is connected to the optical splitter 11, the optical splitter 11 is connected to the switch board 12, the switch board 12 is connected to a device under test, and the device under test is connected to a second port of the tester 10;
the tester 10 sends test data through the first port, the optical splitter 11 is configured to duplicate the test data into n identical parts and send the n identical parts, the switch board 12 is configured to receive the n parts of test data from the optical splitter 11, aggregate the n parts of test data and send the aggregated n parts of test data, so that the device under test receives the n parts of test data from the switch board 12, select one part of test data and send the selected part of test data, the tester 10 receives the test data from the device under test through the second port, compares the test data with the test data sent through the first port to perform performance test on ports interconnected with the device under test or channels interconnected with the switch board 12 according to a comparison and verification result, where n is a positive integer, and a product of a rate of sending the test data by the tester 10 and n is equal to a product of a rate of the switch board 12 and the device under test interconnected with the switch board 12 The speed of the ports or channels therebetween.
In the device for testing the performance of the ethernet interface provided by the embodiment of the invention, the optical splitter duplicates the test data sent by one port of the tester into n parts, the switch board collects the n parts of test data and sends the n parts of test data out, so that the tested device selects one part of the n parts of test data to send out, the tester receives the data sent by the tested device through the other port, and the test data sent by one port and the test data received by the other port are compared and verified to test the performance of the ethernet interface, and the product of the rate of sending the test data by the tester and n in the whole scheme is equal to the rate of a tested object (port or channel), so that the tester with lower rate can be used for testing the performance of the ethernet interface with higher rate, and the cost is saved.
The following describes the testing process of the present invention by taking an example of using a 10G network tester to test the performance of a 100G ethernet interface, and as shown in fig. 4, a specific hardware connection diagram is shown, and the whole testing process needs to use a 10G network tester, an optical splitter, and a 100G switch board.
The 10G network tester is the most critical device in the testing device and is used for sending and receiving test data packets with full bandwidth and counting test counts and results. The optical splitter is a key test auxiliary device in the test device, is used for copying the optical signal (the test data sent by the 10G network tester in the invention) into exactly the same 10 optical signals, and sends out the optical signals, and has very low cost. The 100G switch board (composed of 1 board card or a plurality of cards interconnected by interfaces) is used for receiving data of 10 paths of 10G optical signals from the optical splitter, adding different Vlan heads to the 10 paths of received data according to different received port numbers (for example, setting the Vlan numbers contained in the Vlan heads of 10 paths of test data to be from 1 to 10 respectively), and then aggregating and sending the data through 1 100G ethernet port. The device under test (consisting of 1 board card or 2 boards interconnected by interface) has at least 1 100G port (the 100G port is used for interconnecting with a 100G switch board) and 1 10G port (the 10G port is used for interconnecting with a 10G tester). The tested device receives the data from the 100G exchange board, selects data of 1 Vlan number (for example, Vlan number 1), removes the Vlan header, and then forwards the data through the 10G port of the tested device, and meanwhile discards the data with other Vlan numbers (2 to 10). After receiving data from the tested equipment, the P2 port of the 10G tester compares the data with data sent by the P1 port of the tester to check whether the data is lost or not, whether the data is partially wrong or not, and the like, performs statistics, and determines the performance of a 100G interface (or a channel between the 100G interface and the tested equipment) interconnecting the 100G switch board and the tested equipment according to the statistical result.
The data flow of the whole test process is as follows: 10G tester P1- > optical splitter- >100G switch board- (100G data) > device under test- (10G data) >10G tester P2. It can be understood that the content in the 100G data stream is 10 equivalent 10G data (the paths traversed are identical), so that the test result of 1-way data therein can be considered to reflect the actual test result of the entire 10-way data.
Referring to fig. 5, the present embodiment discloses an apparatus for testing performance of an ethernet interface, including:
a tester 20, a first optical splitter 21, a second optical splitter 22, a first switching board 23, and a second switching board 24; wherein,
a first port of the tester 20 is connected to the first optical splitter 21, the first optical splitter 21 is connected to the first switch board 23, the first switch board 23 is connected to a first device under test, and the first device under test is connected to a second port of the tester 20 through a second device under test;
a second port of the tester 20 is connected to the second optical splitter 22, the second optical splitter 22 is connected to the second switch board 24, the second switch board 24 is connected to the second device under test, and the second device under test is connected to the first port of the tester 20 through the first device under test;
the tester 20 sends test data through the first port, the first optical splitter 21 is configured to duplicate the test data into n identical pieces and send out the n identical pieces of test data, and the first switch board 23 is configured to receive the n pieces of test data from the first optical splitter 21, and send out the n pieces of test data after converging the n pieces of test data, so that the first device under test receives the n pieces of test data from the first switch board 23 and forwards the n pieces of test data to the second device under test for processing;
the tester 20 receives the test data from the second device under test through the second port, and compares the test data with the test data sent through the first port for verification, wherein the process of processing data by the second device under test is as follows: selecting one piece of test data from the n pieces of test data from the first tested device, and sending out the test data;
the tester 20 sends test data through the second port, the second optical splitter 22 is configured to duplicate the test data into n identical parts and send out the n identical parts, and the second switch board 24 is configured to receive the n parts of test data from the second optical splitter 22, and send out the n parts of test data after converging the n parts of test data, so that the second device under test receives the n parts of test data from the second switch board 24 and forwards the n parts of test data to the first device under test for processing;
the tester 20 receives the test data from the first device under test through the first port, compares the test data with the test data sent through the second port, and performs a performance test on the ports interconnected with the second device under test and the first device under test or the channel therebetween according to the two comparison and verification results, where n is a positive integer, and the process of processing data by the first device under test is as follows: selecting one piece of test data from the n pieces of test data from the second device under test, and sending out the piece of test data, wherein the product of the rate of sending the test data by the tester 20 and n is equal to the rate of the port or the channel between the interconnected ports of the first device under test and the second device under test.
Compared with the device embodiment, the device for testing the performance of the Ethernet interface provided by the embodiment of the invention is provided with 2 optical splitters and 2 exchange boards, the 2 optical splitters and the 2 exchange boards are utilized to realize bidirectional receiving and sending of test data, the tester tests the performance of the Ethernet interface through comparison and verification of the test data which is received and sent bidirectionally, and the product of the rate of sending the test data by the tester and n in the whole scheme is equal to the rate of a tested object (a port or a channel), so that the tester with lower rate can be utilized to test the performance of the Ethernet interface with higher rate.
The test process shown in the schematic diagrams of the unidirectional test in fig. 3 and 4 is the most central content of the present invention, and the method for realizing the bidirectional test is further improved by the unidirectional test method, i.e. the process shown in fig. 5 and 6. The following describes the bidirectional testing process of the present invention by taking an example of using a 10G network tester to test the performance of a 100G ethernet interface (a specific hardware connection diagram is shown in fig. 6). The whole test process is the same as the one-way test process, and a 10G network tester, an optical splitter and a 100G switch board are also needed, except that the optical splitter and the 100G switch board are both needed to be used for 2, so that 10G data sent by the P1 and P2 ports of the tester are converted into data flow with 100G bandwidth, and the devices to be tested a and B respectively have at least 2 100G ports (2 100G ports are respectively used for interconnecting with the 100G switch board and the other device to be tested) and 1 10G port (for interconnecting with the 10G tester).
In the bidirectional test, 2 ports P1 and P2 of a 10G tester are mutually data receiving and transmitting ports; the P1 port sends test data, and the process of the P2 port receiving test data is as follows: the 10G tester sends test data through a P1 port, a first optical splitter duplicates the test data into 10 identical parts and sends out, a first 100G switch board receives the 10 parts of test data from the first optical splitter, different Vlan heads are added to 10 paths of received data according to different received port numbers (for example, Vlan numbers contained in the Vlan heads of the 10 paths of test data are respectively set to be from 1 to 10), and then the 10 paths of received data are converged and sent out through 1 100G Ethernet port. The tested device B receives 10 test data from the first exchange board and forwards the test data to the tested device A, the tested device A receives 10 test data from the tested device B, data of 1 Vlan number (for example, the Vlan number is 1) is selected, the Vlan header is removed, the data are forwarded by a 10G port of the tested device A, and meanwhile data with other Vlan numbers (2 to 10) are discarded. The 10G tester receives the test data from the tested device A through the P2 port, compares the test data with the test data sent through the P1 port, checks whether the packet is lost or not, checks whether the data is partially wrong or not, and conducts statistics. The data flow of the process is as follows: 10G tester P1- > first splitter- > first 100G switch board- (100G data) > device under test B- (100G data) — > device under test a- (10G data) — >10G tester P2.
The process of the P2 port sending test data and the process of the P1 port receiving test data are similar to the process of the P1 port sending test data and the process of the P2 port receiving test data, which specifically includes: the 10G tester sends test data through a P2 port, the second optical splitter duplicates the test data into 10 identical parts and sends out, the second 100G switch board receives the 10 parts of test data from the second optical splitter, different Vlan heads are added to 10 paths of received data according to different received port numbers (for example, Vlan numbers contained in the Vlan heads of the 10 paths of test data are respectively set to be from 11 to 20), and then the 10 paths of received data are converged and sent out through 1 100G Ethernet port. The tested device A receives 10 test data from the second exchange board and forwards the test data to the tested device B, the tested device B receives 10 test data from the tested device A, data of 1 Vlan number (for example, the Vlan number is 11) in the test data are selected, the Vlan heads are removed, the data are forwarded by a 10G port of the tested device B, and meanwhile data with other Vlan numbers (12 to 20) are discarded. The 10G tester receives the test data from the tested device B through the P1 port, compares the test data with the test data sent through the P2 port, checks whether the packet is lost or not, checks whether the data is partially wrong or not, and conducts statistics. And the 10G tester performs performance test on the interconnected ports of the tested device A and the tested device B or the channels between the interconnected ports according to the bidirectional comparison and verification result.
The data flow of the process is as follows: 10G tester P2- > optical splitter- >100G switch board- (100G data) > device under test a- (100G data) > device under test B- (10G data) >10G tester P1.
It can be understood that, in the foregoing testing process, whether unidirectional or bidirectional, the 10G tester is used to test the performance of the 100G ethernet interface, on this basis, it is of course also possible to use the 10G tester to test the performance of the ethernet interface at other rates, or use the tester at other rates to test the performance of the ethernet interface at different rates, and it is only necessary to ensure that the product of the number of copies of the test data of the optical splitter and the rate of the tester is equal to the rate of the ethernet interface, specifically, the 10G tester may be used to test the performance of the ethernet interfaces such as 25G, 40G, and 50G.
Referring to fig. 7, the present embodiment discloses a method for testing the performance of an ethernet interface based on the apparatus in the foregoing embodiment, including:
s10, the tester sends test data through the first port;
s11, the optical splitter duplicates the test data into n identical parts and sends out the n identical parts;
s12, the switch board receives n test data from the optical splitter, and the n test data are gathered and sent out so that the tested equipment can receive the n test data from the switch board, select one test data and send out the test data;
and S13, the tester receives the test data from the tested equipment through the second port, compares the test data with the test data sent through the first port for verification, and performs performance test on the ports interconnected with the exchange board and the tested equipment or the channel between the ports according to the comparison and verification result.
In the method for testing the performance of the Ethernet interface provided by the embodiment of the invention, the optical splitter duplicates the test data sent by one port of the tester into n parts, the switch board collects the n parts of test data and sends the n parts of test data out so that the tested device selects one part of the n parts of test data to send out, the tester receives the data sent by the tested device through the other port, and the test data sent by one port and the test data received by the other port are compared and verified to test the performance of the Ethernet interface, and the product of the rate of sending the test data by the tester and n in the whole scheme is equal to the rate of a tested object (port or channel), so that the tester with lower rate can be used for testing the performance of the Ethernet interface with higher rate, and the cost is saved.
On the basis of the foregoing method embodiment, the aggregating and sending out the n test data for the device under test to receive the n test data from the switch board, selecting one of the test data, and sending out the one test data may include:
and aggregating the n test data, and sending the aggregated test data out to allow the tested device to receive the n test data from the exchange board, adding different Vlan heads to the n test data, selecting the test data of 1 Vlan number, and sending out the test data after removing the Vlan head from the test data, wherein the Vlan head comprises the Vlan number.
Referring to fig. 8, the present embodiment discloses a method for testing the performance of an ethernet interface based on the apparatus in the foregoing embodiment, including:
s20, the tester sends test data through the first port, the first optical splitter duplicates the test data into n identical parts and sends out the test data, the first switch board receives the n parts of test data from the first optical splitter, and sends out the test data after gathering the n parts of test data, so that the first tested equipment receives the n parts of test data from the first switch board and forwards the test data to the second tested equipment for processing;
s21, the tester receives the test data from the second tested device through the second port, and compares the test data with the test data sent through the first port for verification;
s22, the tester sends test data through the second port, the second optical splitter duplicates the test data into n identical parts and sends out the test data, the second switch board receives the n parts of test data from the second optical splitter, and the n parts of test data are converged and sent out so that the second tested device can receive the n parts of test data from the second switch board and forwards the n parts of test data to the first tested device for processing;
and S23, the tester receives the test data from the first tested equipment through the first port, compares the test data with the test data sent through the second port for verification, and performs performance test on the ports interconnected with the second tested equipment or the channel between the ports according to the two comparison and verification results.
Compared with the method embodiment, the method for testing the performance of the Ethernet interface provided by the embodiment of the invention has the advantages that 2 optical splitters and 2 exchange boards are arranged, the 2 optical splitters and the 2 exchange boards are utilized to realize the bidirectional receiving and sending of the test data, the tester tests the performance of the Ethernet interface through the comparison and verification of the test data which are received and sent bidirectionally, and the product of the speed of sending the test data by the tester and n in the whole scheme is equal to the speed of a tested object (a port or a channel), so that the tester with lower speed can be utilized to test the performance of the Ethernet interface with higher speed.
On the basis of the foregoing method embodiment, the process of processing data by the second device under test may specifically be: adding different Vlan heads to the n test data from the first tested device, selecting the test data of 1 Vlan number, and sending the test data after removing the Vlan heads from the test data;
the process of processing data by the first device under test may specifically be: adding different Vlan heads to the n test data from the second tested device, selecting the test data of 1 Vlan number, and sending the test data after removing the Vlan heads.
The invention has the following beneficial effects:
1. the existing test instrument and board card resources are greatly utilized, additional purchase of instruments is not needed, and the research and development input cost of the single board is greatly saved;
2. the implementation mode is simple, the operability is strong, and the scheme passes practical verification;
3. the flexibility is high, and the testable interface is extensive, and this test method can test 25G, 40G, 50G, 100G (even higher number rate) interface.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element. The terms "upper", "lower", and the like, indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the referred devices or elements must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are intended to be inclusive and mean, for example, that they may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.
In the description of the present invention, numerous specific details are set forth. It is understood, however, that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description. Similarly, it should be appreciated that in the foregoing description of exemplary embodiments of the invention, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various inventive aspects. However, the disclosed method should not be interpreted as reflecting an intention that: that the invention as claimed requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this invention. It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present invention is not limited to any single aspect, nor is it limited to any single embodiment, nor is it limited to any combination and/or permutation of these aspects and/or embodiments. Moreover, each aspect and/or embodiment of the present invention may be utilized alone or in combination with one or more other aspects and/or embodiments thereof.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention, and they should be construed as being included in the following claims and description.
Claims (10)
1. An apparatus for testing performance of an ethernet interface, comprising:
the device comprises a tester, a light splitter and a switching board; wherein,
the first port of the tester is connected with the optical splitter, the optical splitter is connected with the exchange board, the exchange board is connected with the tested equipment, and the tested equipment is connected with the second port of the tester;
the tester sends test data through the first port, the optical splitter is used for copying the test data into n parts which are completely the same and sending the test data out, the switch board is used for receiving the n parts of the test data from the optical splitter and sending the n parts of the test data after gathering so that the tested device can receive the n parts of the test data from the switch board, one part of the test data is selected and sent out, the tester receives the test data from the tested device through the second port, the test data and the test data sent through the first port are compared and checked, and the performance test is carried out on the ports interconnected with the tested device or the channels between the ports interconnected with the switch board and the tested device according to the comparison and check result, wherein n is a positive integer, and the product of the rate of sending the test data by the tester and n is equal to the rate of the ports interconnected with the tested device or the channels between the ports interconnected with the switched board and the tested device .
2. The apparatus according to claim 1, wherein the switch board aggregates the n test data and sends out the aggregated test data, so that the device under test receives the n test data from the switch board, adds different Vlan heads to the n test data, selects 1 Vlan number of the test data, and sends out the test data with the Vlan head removed, wherein the Vlan head includes a Vlan number.
3. The apparatus of claim 1 or 2, wherein the tester has a velocity of 10G and n is 10.
4. An apparatus for testing performance of an ethernet interface, comprising:
the device comprises a tester, a first optical splitter, a second optical splitter, a first exchange plate and a second exchange plate; wherein,
a first port of the tester is connected with the first optical splitter, the first optical splitter is connected with the first switch board, the first switch board is connected with first tested equipment, and the first tested equipment is connected with a second port of the tester through second tested equipment;
the second port of the tester is connected with the second optical splitter, the second optical splitter is connected with the second switch board, the second switch board is connected with the second tested equipment, and the second tested equipment is connected with the first port of the tester through the first tested equipment;
the tester sends test data through the first port, the first optical splitter is used for copying the test data into n identical parts and sending the n identical parts out, and the first switch board is used for receiving the n parts of test data from the first optical splitter, gathering the n parts of test data and sending the gathered n parts of test data out, so that the first tested equipment receives the n parts of test data from the first switch board and forwards the n parts of test data to the second tested equipment for processing;
the tester receives test data from the second tested equipment through the second port, and compares the test data with the test data sent through the first port for verification, wherein the process of processing data by the second tested equipment is as follows: selecting one piece of test data from the n pieces of test data from the first tested device, and sending out the test data;
the tester sends test data through the second port, the second optical splitter is used for copying the test data into n identical parts and sending out the n identical parts, and the second switch board is used for receiving the n parts of test data from the second optical splitter, gathering the n parts of test data and sending out the gathered n parts of test data so that the second tested equipment can receive the n parts of test data from the second switch board and forward the n parts of test data to the first tested equipment for processing;
the tester receives test data from the first tested equipment through the first port, compares the test data with the test data sent through the second port for verification, and performs performance test on the ports interconnected with the second tested equipment or a channel between the ports according to the two comparison and verification results, wherein n is a positive integer, and the data processing process of the first tested equipment is as follows: and selecting one piece of test data from the n pieces of test data from the second tested device, and sending out the piece of test data, wherein the product of the rate of sending the test data by the tester and n is equal to the rate of the port or the channel between the interconnected ports of the first tested device and the second tested device.
5. The apparatus according to claim 4, wherein the process of processing data by the second device under test is specifically as follows: adding different Vlan heads to the n test data from the first tested device, selecting the test data of 1 Vlan number, and sending the test data after removing the Vlan heads from the test data;
the process of processing data by the first device under test specifically comprises: adding different Vlan heads to the n test data from the second tested device, selecting the test data of 1 Vlan number, and sending the test data after removing the Vlan heads.
6. The apparatus of claim 4 or 5, wherein the tester has a velocity of 10G and n is 10.
7. A method for testing the performance of an ethernet interface based on the apparatus of any one of claims 1 to 3, comprising:
the tester sends test data through the first port;
the optical splitter duplicates the test data into n identical parts and sends out the n identical parts;
the switch board receives n test data from the optical splitter, converges the n test data and sends the n test data out, so that the tested equipment can receive the n test data from the switch board, select one test data and send the test data out;
the tester receives the test data from the tested equipment through the second port, compares the test data with the test data sent through the first port, and performs performance test on the ports interconnected with the exchange board and the tested equipment or the channel between the ports according to the comparison and verification result.
8. The method of claim 7, wherein the aggregating the n test data and sending out the aggregated test data for the device under test to receive the n test data from the switch board, selecting one of the test data, and sending out the selected test data comprises:
and aggregating the n test data, and sending the aggregated test data out to allow the tested device to receive the n test data from the exchange board, adding different Vlan heads to the n test data, selecting the test data of 1 Vlan number, and sending out the test data after removing the Vlan head from the test data, wherein the Vlan head comprises the Vlan number.
9. A method for testing the performance of an Ethernet interface based on the device of any one of claims 4 to 6, comprising:
the tester sends test data through the first port, the first optical splitter duplicates the test data into n identical parts and sends the n identical parts out, the first switch board receives the n parts of test data from the first optical splitter, and the n parts of test data are gathered and sent out so that the first tested equipment can receive the n parts of test data from the first switch board and forwards the n parts of test data to the second tested equipment for processing;
the tester receives test data from the second tested equipment through the second port, and compares and verifies the test data with the test data sent through the first port;
the tester sends test data through the second port, the second optical splitter duplicates the test data into n identical parts and sends the n identical parts out, the second switch board receives the n parts of test data from the second optical splitter, and the n parts of test data are converged and sent out so that the second tested equipment can receive the n parts of test data from the second switch board and forwards the n parts of test data to the first tested equipment for processing;
the tester receives the test data from the first tested equipment through the first port, compares the test data with the test data sent through the second port for verification, and performs performance test on the ports interconnected with the second tested equipment or the channel between the ports according to the two comparison and verification results.
10. The method according to claim 9, wherein the process of processing data by the second device under test is specifically: adding different Vlan heads to the n test data from the first tested device, selecting the test data of 1 Vlan number, and sending the test data after removing the Vlan heads from the test data;
the process of processing data by the first device under test specifically comprises: adding different Vlan heads to the n test data from the second tested device, selecting the test data of 1 Vlan number, and sending the test data after removing the Vlan heads.
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