CN110007118A - For the aging of product and the electric supply system of reliability test - Google Patents
For the aging of product and the electric supply system of reliability test Download PDFInfo
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- CN110007118A CN110007118A CN201910306107.1A CN201910306107A CN110007118A CN 110007118 A CN110007118 A CN 110007118A CN 201910306107 A CN201910306107 A CN 201910306107A CN 110007118 A CN110007118 A CN 110007118A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The present invention relates to power supply technical fields; more particularly to it is a kind of for the aging of product and the electric supply system of reliability test; including Monitor Computer Control System, supply voltage output circuit, output power detection circuit, fault secure circuit and MCU control circuit; Monitor Computer Control System is used to show the failure of tested instrument, and the test parameter for tested instrument to be arranged；Supply voltage output circuit provides power supply for tested instrument, and output power detection circuit is used to detect the output power of tested instrument, when MCU control circuit detects that tested instrument breaks down, disconnects supply voltage output circuit by fault secure circuit.The present invention simulates the various severe supply voltages that industry spot seals in power port, power source performance aging and reliability test are carried out by the method, failure caused by tested instrument power part is interfered by extraneous high pulse voltage can be promoted, the reliability and stability of itself are improved.
Description
Technical field
The present invention relates to power supply technical fields more particularly to a kind of for the aging of product and the power supply of reliability test
Power supply system.
Background technique
The mains fluctuations of industry spot are big, and interference is strong, are easy to cause field instrument power work abnormal, or even damage
It is bad.Although industrial instrument supplier has done the reliability design of number of modules, deterioration, failure and the performance of element
Difference in terms of consistency, it will cause product scene can not normal use.Therefore, instrument does power supply before being applied to scene
It can test particularly important.
Summary of the invention
The present invention provides a kind of for the aging of product and the electric supply system of reliability test, and can simulate actually makes
The various harsh conditions that used time power supply encounters, so that power supply system is more safe and reliable.
In order to achieve the object of the present invention, used technical solution is: for the aging of product and the electricity of reliability test
Source power supply system, including Monitor Computer Control System, supply voltage output circuit, output power detection circuit, fault secure circuit
And MCU control circuit, Monitor Computer Control System are used to show the failure of tested instrument, and the test ginseng for tested instrument to be arranged
Number；Supply voltage output circuit provides power supply for tested instrument, and output power detection circuit is for detecting tested instrument
Output power, MCU control circuit, which detects, disconnects supply voltage output by fault secure circuit when tested instrument breaks down
Circuit, MCU control circuit are connected with supply voltage output circuit, output power detection circuit and fault secure circuit respectively.
As prioritization scheme of the invention, the electric supply system for the aging of product and reliability test further includes
RS485 communicating circuit, Monitor Computer Control System are connect by RS485 communicating circuit with MCU control circuit, the tested instrument of transmission
Test parameter is such as: output power parameter, power consumption parameter, high voltage test time, low voltage test time, high-voltage pulse are surveyed
Try time and action of low-voltage pulse testing time etc..
As prioritization scheme of the invention, supply voltage output circuit includes the first Magnetic isolation chip U1, the first metal-oxide-semiconductor
Q1, the second Magnetic isolation chip U2, the second metal-oxide-semiconductor Q2, third Magnetic isolation chip U3 and third metal-oxide-semiconductor Q3, MCU control circuit pass through
First Magnetic isolation chip U1 exports the conducting and shutdown that low and high level controls the first metal-oxide-semiconductor Q1, and the first metal-oxide-semiconductor Q1 adds high voltage
It is loaded onto power supply output plus terminal；MCU control circuit exports low and high level by the second Magnetic isolation chip U2 and controls the second metal-oxide-semiconductor Q2's
Low-voltage is loaded onto power supply output plus terminal by conducting and shutdown, the second metal-oxide-semiconductor Q2；MCU control circuit passes through third Magnetic isolation core
Piece U3 export low and high level control third metal-oxide-semiconductor Q3 conducting and shutdown, third metal-oxide-semiconductor Q3 by pulse voltage be loaded onto power supply it is defeated
Anode out.
As prioritization scheme of the invention, supply voltage output circuit further includes third diode D3, the 4th diode D4
Be connected with the anode of the 7th diode D7, third diode D3 with the source electrode of the first metal-oxide-semiconductor Q1, the 4th diode D4 positive and
The source electrode of second metal-oxide-semiconductor Q2 is connected, and the anode of the 7th diode D7 is connected with the source electrode of third metal-oxide-semiconductor Q3.
As prioritization scheme of the invention, output power detection circuit includes voltage detecting circuit and current detection circuit,
Voltage detecting circuit includes the 9th resistance R9, the tenth resistance R10, thirteenth resistor R13 and the 8th amplifier U8, current detection circuit
Including the 19th resistance R19, the 20th resistance R20 and the 9th amplifier U9, one end of the 9th resistance R9 and thirteenth resistor R13's
One end is connected with the anode of the 8th amplifier U8, and the other end of the 9th resistance R9 is connected with one end of the tenth resistance R10, the tenth electricity
The other end connection power supply output plus terminal of R10 is hindered, the output end of the 8th amplifier U8 is connect with MCU control circuit, the 19th resistance
One end of R19 connect the anode of the 9th amplifier U9 with one end of the 20th resistance R20, and the output end and MCU of the 9th amplifier U9 is controlled
Circuit connection processed.
As prioritization scheme of the invention, current detection circuit further includes the 17th resistance R17, the 18th resistance R18,
Six capacitor C6 and the 7th capacitor C7, the 17th resistance R17 and the 7th capacitor C7 composition filter circuit are connected to the 9th amplifier U9's
Anode, the 18th resistance R18 and the 6th capacitor C6 composition filter circuit are connected to the output end of the 9th amplifier U9.
As prioritization scheme of the invention, fault secure circuit includes the 4th metal-oxide-semiconductor Q4, the 15th resistance R15, the 16th
Resistance R16, the 5th capacitor C5 and voltage-stablizer U6, the grid of the 4th metal-oxide-semiconductor Q4 are connected with MCU control circuit, the 4th metal-oxide-semiconductor Q4's
Drain electrode connection is for electricity output negative terminal, and the second pin of voltage-stablizer U6 is connected with the grid of the 4th metal-oxide-semiconductor Q4, the 15th resistance R15
One end and one end of the 16th resistance R16 be connected with the first pin of voltage-stablizer U6, the other end of the 16th resistance R16 with
The source electrode of 4th metal-oxide-semiconductor Q4 is connected, and the 5th capacitor C5 is connected between the source electrode and grid of the 4th metal-oxide-semiconductor Q4.
As prioritization scheme of the invention, the electric supply system for the aging of product and reliability test further includes alarm
Indicator light circuit, police instruction circuit for lamp are connect with MCU control circuit.
As prioritization scheme of the invention, MCU control circuit is single-chip microcontroller or DSP or programmable logic device.
The present invention has the effect of positive: 1) present invention provides high voltage, low-voltage, height by supply voltage output circuit
Four kinds of voltage forms of voltage pulse and low voltage pulse can simulate the various severe supply voltage inputs of industry spot, pass through
The method does aging and reliability test, can be greatly lowered product itself because caused by power circuit be tested instrument fault,
To improve the safety and reliability of itself.
2) present invention can effectively prevent tested instrument damage by fault secure circuit, be sentenced by output power detection circuit
Whether disconnected tested instrument works in normal condition, is in addition also equipped with the functions such as the overcurrent protection of power supply, has effectively ensured itself
With the safety of tested instrument, the intelligent test of aging, reliability test is realized by Monitor Computer Control System.
Detailed description of the invention
The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments.
Fig. 1 is whole functional block diagram of the invention；
Fig. 2 is the circuit diagram of supply voltage output circuit；
Fig. 3 is the circuit diagram of output power detection circuit and fault secure circuit.
Wherein: 1, Monitor Computer Control System, 2, supply voltage output circuit, 3, output power detection circuit, 4, failure guarantor
Protection circuit, 5, MCU control circuit, 6, tested instrument, 7, RS485 communicating circuit, 8, police instruction circuit for lamp.
Specific embodiment
As shown in Figure 1-3, the invention discloses a kind of for the aging of product and the electric supply system of reliability test, packet
Include Monitor Computer Control System 1, supply voltage output circuit 2, output power detection circuit 3, fault secure circuit 4 and MCU control
Circuit 5, Monitor Computer Control System 1 are used to show the failure of tested instrument 6, and the test parameter for adjusting tested instrument 6；For
Piezoelectric voltage output circuit 2 is that tested instrument 6 provides power supply, and output power detection circuit 3 is used to detect the confession of tested instrument 6
Electrical power, MCU control circuit 5, which detects, disconnects supply voltage output by fault secure circuit 4 when tested instrument breaks down
Circuit 2, MCU control circuit 5 respectively with 4 phase of supply voltage output circuit 2, output power detection circuit 3 and fault secure circuit
Connection.
Electric supply system for the aging of product and reliability test further includes RS485 communicating circuit 7, ipc monitor
System 1 is connect by RS485 communicating circuit 7 with MCU control circuit 5, and the test parameter of tested instrument 6 includes output power ginseng
Number, power consumption parameter, high voltage test time, low voltage test time, high-voltage pulse testing time and action of low-voltage pulse test
Time.In addition, the address of tested instrument 6 can also be arranged in Monitor Computer Control System 1, tested instrument 6 is numbered, is conveniently looked into
Look for, each com port can 256, band tested instrument 6, by extend com port, the quantity of instrument 6 can be tested with infinite expanding.
Supply voltage output circuit 2 includes the first Magnetic isolation chip U1, the first metal-oxide-semiconductor Q1, the second Magnetic isolation chip U2, the
Two metal-oxide-semiconductor Q2, third Magnetic isolation chip U3 and third metal-oxide-semiconductor Q3, MCU control circuit 5 are exported by the first Magnetic isolation chip U1
Low and high level controls the conducting and shutdown of the first metal-oxide-semiconductor Q1, and high voltage is loaded onto power supply output plus terminal by the first metal-oxide-semiconductor Q1；MCU
Control circuit 5 exports the conducting and shutdown that low and high level controls the second metal-oxide-semiconductor Q2, the 2nd MOS by the second Magnetic isolation chip U2
Low-voltage is loaded onto power supply output plus terminal by pipe Q2；MCU control circuit 5 exports low and high level control by third Magnetic isolation chip U3
Pulse voltage is loaded onto power supply output plus terminal by the conducting and shutdown of third metal-oxide-semiconductor Q3 processed, third metal-oxide-semiconductor Q3.Supply voltage is defeated
Circuit 2 is that tested instrument 6 provides power supply power supply out, provides high voltage output, low-voltage output, high-voltage pulse output and low-tension pulse
Punching output and pulse output.High voltage output, low-voltage output and pulse output are mutually isolated.High-voltage pulse output is high voltage
Superimposed pulse output is exported, action of low-voltage pulse output is that low-voltage output superimposed pulse exports.Supply voltage output circuit 2 will be high electric
Pressure, low-voltage and pulse voltage are loaded onto the power end of tested instrument 6, and the possible transient state in simulation powersupply system scene is excessively electric
Pressure impact.
Supply voltage output circuit 2 further includes third diode D3, the 4th diode D4 and the 7th diode D7, and the three or two
The anode of pole pipe D3 is connected with the source electrode of the first metal-oxide-semiconductor Q1, the source electrode phase of the anode and the second metal-oxide-semiconductor Q2 of the 4th diode D4
Even, the anode of the 7th diode D7 is connected with the source electrode of third metal-oxide-semiconductor Q3.Third diode D3, the 4th diode D4 and the 7th
Diode D7 is the diode for preventing electric current from flowing backward output.
Output power detection circuit 3 includes voltage detecting circuit and current detection circuit, and voltage detecting circuit includes the 9th
Resistance R9, the tenth resistance R10, thirteenth resistor R13 and the 8th amplifier U8, current detection circuit include the 19th resistance R19, the
One end of 20 resistance R20 and the 9th amplifier U9, the 9th resistance R9 and one end of thirteenth resistor R13 are with the 8th amplifier U8's
Anode is connected, and the other end of the 9th resistance R9 is connected with one end of the tenth resistance R10, and the other end of the tenth resistance R10, which connects, to be supplied
The output end of electricity output anode, the 8th amplifier U8 is connect with MCU control circuit 5, one end of the 19th resistance R19 and the 20th electricity
The one end for hindering R20 connects the anode of the 9th amplifier U9, and the output end of the 9th amplifier U9 is connect with MCU control circuit 5.
Current detection circuit further includes the 17th resistance R17, the 18th resistance R18, the 6th capacitor C6 and the 7th capacitor C7,
17th resistance R17 and the 7th capacitor C7 composition filter circuit is connected to the anode of the 9th amplifier U9, the 18th resistance R18 and the
Six capacitor C6 composition filter circuit is connected to the output end of the 9th amplifier U9.
MCU control circuit 5 is by detecting the output power of tested instrument 6, to judge whether tested instrument 6 works just
Normal state cuts off supply voltage output circuit 2 if the output power of tested instrument 6 is more than setting threshold value.Voltage detecting is adopted
It is divided with the 9th resistance R9, the tenth resistance R10 and thirteenth resistor R13, is output to MCU control circuit through the 8th amplifier U8 isolation
5 measurement ports.Current detecting is sampled using the 19th resistance R19, the 20th resistance R20, through the electricity of the 17th resistance R17 and the 7th
Hold C7 to filter into the 9th amplifier U9 amplification, amplification factor 1+R21/R22, then is filtered through the 18th resistance R18 and the 6th capacitor C6
Wave is output to the measurement of MCU control circuit 5.MCU control circuit 5 calculates performance number (W=by measurement supply voltage and electric current
U*I), through the threshold value comparison with setting, to judge the working condition of tested instrument 6.
Fault secure circuit 4 include the 4th metal-oxide-semiconductor Q4, the 15th resistance R15, the 16th resistance R16, the 5th capacitor C5 and
Voltage-stablizer U6, the grid of the 4th metal-oxide-semiconductor Q4 are connected with MCU control circuit 5, and the drain electrode connection of the 4th metal-oxide-semiconductor Q4 is negative for electricity output
End, the second pin of voltage-stablizer U6 are connected with the grid of the 4th metal-oxide-semiconductor Q4, one end of the 15th resistance R15 and the 16th resistance
One end of R16 is connected with the first pin of voltage-stablizer U6, the other end of the 16th resistance R16 and the source electrode of the 4th metal-oxide-semiconductor Q4
It is connected, the 5th capacitor C5 is connected between the source electrode and grid of the 4th metal-oxide-semiconductor Q4.
When MCU control circuit 5 detects the power consumption of tested instrument 6 more than given threshold, the electricity of cutting power supply at once
Voltage follower circuit 2 prevents tested instrument 6 from damaging.When tested 6 failure of instrument, in order to protect this for the aging of product and reliable
Property test electric supply system safety, need by supply voltage output circuit 2 in time disconnect, prevent because be tested instrument 6 it is short
Road and be burned out.When MCU control circuit 5 detects failure, the 4th metal-oxide-semiconductor Q4 of low level control is exported by I/O port and disconnects confession
Electrical circuit.15th resistance R15, the 16th resistance R16, the 5th capacitor C5 and voltage-stablizer U6 form current-limiting protection circuit, work as confession
When electric current is excessive, the 19th resistance R19 and the 20th resistance R20 voltage are increased, through the 15th resistance R15 and the 16th resistance
The voltage that R16 is divided to the first pin of voltage-stablizer U6 reduces, to reduce the 1 foot voltage of the 4th metal-oxide-semiconductor Q4, makes the 4th MOS
Pipe Q4 internal resistance increases, and loop current reduces, and plays the role of overcurrent protection.
Electric supply system for the aging of product and reliability test further includes police instruction circuit for lamp 8, police instruction
Circuit for lamp 8 is connect with MCU control circuit 5.5 moment of MCU control circuit monitors the state of tested instrument 6, once it is faulty, pass through
Police instruction circuit for lamp 8 is alarmed.When the power consumption and output power of tested instrument 6 are more than the threshold value of setting, Ke Yitong
It crosses police instruction circuit for lamp 8 or is transmitted to Monitor Computer Control System 1 and prompt failure；Police instruction circuit for lamp 8 is red highlighted LED
Lamp, when there is alarm, alarm lamp interval flashing is prompted faulty.
MCU control circuit 5 is single-chip microcontroller or DSP or programmable logic device, and communication port can be protected using TVS, be prevented
Only common mode or differential mode voltage height damage device, and drive RS485 communicating circuit 7.
The control output high-low voltage of MCU control circuit 5, powers, superimposed pulse is impacted in the process, and is led to tested instrument 6
The power supply power consumption for crossing the tested instrument 6 of 3 moment of output power detection circuit monitoring, when the power consumption of tested instrument 6 is more than the threshold of setting
When value, MCU control circuit 5 runs through supply voltage output circuit 2 and cuts off to the power supply of tested instrument 6, while red alarm
Indicator light flashing, and test failure is uploaded to by Monitor Computer Control System 1 by RS485 communicating circuit 7.
Particular embodiments described above has carried out further in detail the purpose of the present invention, technical scheme and beneficial effects
It describes in detail bright, it should be understood that the above is only a specific embodiment of the present invention, is not intended to restrict the invention, it is all
Within the spirit and principles in the present invention, any modification, equivalent substitution, improvement and etc. done should be included in guarantor of the invention
Within the scope of shield.
Claims (9)
1. for the aging of product and the electric supply system of reliability test, including Monitor Computer Control System (1), supply voltage are defeated
Circuit (2), output power detection circuit (3), fault secure circuit (4) and MCU control circuit (5) out, the host computer prison
Control system (1) is used to show the failure of tested instrument (6), and the test parameter for tested instrument (6) to be arranged；The power supply
Voltage follower circuit (2) is that tested instrument (6) provide power supply, and the output power detection circuit (3) is for detecting quilt
The output power of instrument (6) is surveyed, the MCU control circuit (5), which detects, passes through error protection when tested instrument breaks down
Circuit (4) disconnect supply voltage output circuit (2), the MCU control circuit (5) respectively with supply voltage output circuit (2),
Output power detection circuit (3) is connected with fault secure circuit (4).
2. the electric supply system according to claim 1 for being used for the aging of product and reliability test, it is characterised in that: use
In the electric supply system of the aging of product and reliability test further include RS485 communicating circuit (7), Monitor Computer Control System (1)
It is connect by RS485 communicating circuit (7) with MCU control circuit (5), the test parameter of tested instrument (6) includes output power ginseng
Number, power consumption parameter, high voltage test time, low voltage test time, high-voltage pulse testing time and action of low-voltage pulse test
Time.
3. according to claim 1 or 2 exist for the aging of product and the electric supply system of reliability test, feature
In: the supply voltage output circuit (2) includes the first Magnetic isolation chip U1, the first metal-oxide-semiconductor Q1, the second Magnetic isolation chip
U2, the second metal-oxide-semiconductor Q2, third Magnetic isolation chip U3 and third metal-oxide-semiconductor Q3, MCU control circuit (5) pass through the first Magnetic isolation chip
U1 exports the conducting and shutdown that low and high level controls the first metal-oxide-semiconductor Q1, and high voltage is loaded onto for electricity output just by the first metal-oxide-semiconductor Q1
End；MCU control circuit (5) exports the conducting and shutdown that low and high level controls the second metal-oxide-semiconductor Q2 by the second Magnetic isolation chip U2,
Low-voltage is loaded onto power supply output plus terminal by the second metal-oxide-semiconductor Q2；MCU control circuit (5) is exported by third Magnetic isolation chip U3
Low and high level controls the conducting and shutdown of third metal-oxide-semiconductor Q3, and pulse voltage is loaded onto power supply output plus terminal by third metal-oxide-semiconductor Q3.
4. the electric supply system according to claim 3 for being used for the aging of product and reliability test, it is characterised in that: institute
The supply voltage output circuit (2) stated further includes third diode D3, the 4th diode D4 and the 7th diode D7, the three or two pole
The anode of pipe D3 is connected with the source electrode of the first metal-oxide-semiconductor Q1, and the anode of the 4th diode D4 is connected with the source electrode of the second metal-oxide-semiconductor Q2,
The anode of 7th diode D7 is connected with the source electrode of third metal-oxide-semiconductor Q3.
5. according to claim 1 or 2 exist for the aging of product and the electric supply system of reliability test, feature
In: the output power detection circuit (3) includes voltage detecting circuit and current detection circuit, the voltage detecting circuit packet
The 9th resistance R9, the tenth resistance R10, thirteenth resistor R13 and the 8th amplifier U8 are included, the current detection circuit includes the tenth
One end of nine resistance R19, the 20th resistance R20 and the 9th amplifier U9, one end of the 9th resistance R9 and thirteenth resistor R13 with
The anode of 8th amplifier U8 is connected, and the other end of the 9th resistance R9 is connected with one end of the tenth resistance R10, the tenth resistance R10's
Other end connection power supply output plus terminal, the output end of the 8th amplifier U8 are connect with MCU control circuit (5), the 19th resistance R19's
One end connect the anode of the 9th amplifier U9, the output end and MCU control circuit of the 9th amplifier U9 with one end of the 20th resistance R20
(5) it connects.
6. the electric supply system according to claim 5 for being used for the aging of product and reliability test, it is characterised in that: institute
The current detection circuit stated further includes the 17th resistance R17, the 18th resistance R18, the 6th capacitor C6 and the 7th capacitor C7, and the tenth
Seven resistance R17 and the 7th capacitor C7 composition filter circuit is connected to the anode of the 9th amplifier U9, the electricity of the 18th resistance R18 and the 6th
Hold the output end that C6 composition filter circuit is connected to the 9th amplifier U9.
7. according to claim 1 or 2 exist for the aging of product and the electric supply system of reliability test, feature
In: the fault secure circuit (4) includes the 4th metal-oxide-semiconductor Q4, the 15th resistance R15, the 16th resistance R16, the 5th capacitor
The grid of C5 and voltage-stablizer U6, the 4th metal-oxide-semiconductor Q4 are connected with MCU control circuit (5), and the drain electrode of the 4th metal-oxide-semiconductor Q4 connects power supply
Negative terminal is exported, the second pin of voltage-stablizer U6 is connected with the grid of the 4th metal-oxide-semiconductor Q4, one end and the tenth of the 15th resistance R15
One end of six resistance R16 is connected with the first pin of voltage-stablizer U6, the other end and the 4th metal-oxide-semiconductor Q4 of the 16th resistance R16
Source electrode be connected, the 5th capacitor C5 is connected between the source electrode and grid of the 4th metal-oxide-semiconductor Q4.
8. according to claim 1 or 2 exist for the aging of product and the electric supply system of reliability test, feature
In: the electric supply system for the aging of product and reliability test further includes police instruction circuit for lamp (8), alarm lamp electricity
Road (8) is connect with MCU control circuit (5).
9. according to claim 1 or 2 exist for the aging of product and the electric supply system of reliability test, feature
In: the MCU control circuit (5) is single-chip microcontroller or DSP or programmable logic device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910306107.1A CN110007118A (en) | 2019-04-17 | 2019-04-17 | For the aging of product and the electric supply system of reliability test |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910306107.1A CN110007118A (en) | 2019-04-17 | 2019-04-17 | For the aging of product and the electric supply system of reliability test |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112834913A (en) * | 2021-01-08 | 2021-05-25 | 胜达克半导体科技(上海)有限公司 | High-voltage testing method for stacking tester channel |
| CN112925250A (en) * | 2021-03-05 | 2021-06-08 | 广州市微生物研究所有限公司 | Control method and control circuit for electrical parameter aging test of plasma air purifier |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101650411A (en) * | 2009-07-31 | 2010-02-17 | 迈普通信技术股份有限公司 | Universal power-aging testing system |
| KR20100007112U (en) * | 2008-12-31 | 2010-07-08 | 노틸러스효성 주식회사 | Testing Apparatus of Switched-mode power supply |
| CN102540103A (en) * | 2010-12-09 | 2012-07-04 | 西安中科麦特电子技术设备有限公司 | Novel light emitting diode (LED) switching power supply test system |
| CN103852733A (en) * | 2014-02-17 | 2014-06-11 | 上海大学 | LED power supply performance analysis device and method |
| CN105954576A (en) * | 2016-06-20 | 2016-09-21 | 珠海格力节能环保制冷技术研究中心有限公司 | Input power calculation circuit of motor |
| CN106053931A (en) * | 2016-08-09 | 2016-10-26 | 河南森尼瑞电气有限公司 | Relay protection device based on 12-bit AD in SOC chip |
| CN106645927A (en) * | 2017-01-23 | 2017-05-10 | 上海理工大学 | Power detection circuit for switching power supply |
| CN207817470U (en) * | 2018-01-30 | 2018-09-04 | 深圳前海辰辉通用科技发展有限公司 | A kind of universal burn-in control system based on computer remote monitoring |
| CN207937583U (en) * | 2018-02-11 | 2018-10-02 | 四川长虹电器股份有限公司 | A kind of test ageing system of power supply adaptor |
-
2019
- 2019-04-17 CN CN201910306107.1A patent/CN110007118A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20100007112U (en) * | 2008-12-31 | 2010-07-08 | 노틸러스효성 주식회사 | Testing Apparatus of Switched-mode power supply |
| CN101650411A (en) * | 2009-07-31 | 2010-02-17 | 迈普通信技术股份有限公司 | Universal power-aging testing system |
| CN102540103A (en) * | 2010-12-09 | 2012-07-04 | 西安中科麦特电子技术设备有限公司 | Novel light emitting diode (LED) switching power supply test system |
| CN103852733A (en) * | 2014-02-17 | 2014-06-11 | 上海大学 | LED power supply performance analysis device and method |
| CN105954576A (en) * | 2016-06-20 | 2016-09-21 | 珠海格力节能环保制冷技术研究中心有限公司 | Input power calculation circuit of motor |
| CN106053931A (en) * | 2016-08-09 | 2016-10-26 | 河南森尼瑞电气有限公司 | Relay protection device based on 12-bit AD in SOC chip |
| CN106645927A (en) * | 2017-01-23 | 2017-05-10 | 上海理工大学 | Power detection circuit for switching power supply |
| CN207817470U (en) * | 2018-01-30 | 2018-09-04 | 深圳前海辰辉通用科技发展有限公司 | A kind of universal burn-in control system based on computer remote monitoring |
| CN207937583U (en) * | 2018-02-11 | 2018-10-02 | 四川长虹电器股份有限公司 | A kind of test ageing system of power supply adaptor |
Non-Patent Citations (2)
| Title |
|---|
| 王为学等: "《电除尘器自动控制装置》", 31 March 1988, 湖北科学技术出版社 * |
| 范丽思等: "《电磁环境模拟技术》", 31 January 2012 * |
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| CN112834913B (en) * | 2021-01-08 | 2024-04-26 | 胜达克半导体科技(上海)股份有限公司 | High-voltage testing method for stacking tester channel |
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Application publication date: 20190712 |