CN118501563A - Planar near field test method and device, electronic equipment and readable storage medium - Google Patents
Planar near field test method and device, electronic equipment and readable storage medium Download PDFInfo
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Abstract
The embodiment of the invention provides a planar near field testing method, a device, electronic equipment and a readable storage medium, which comprise the steps of acquiring electric field information of a scanning surface parallel to an antenna to be tested, aperture parameters of an aperture surface and a probe plane spectrum, calculating aperture electric field information of the aperture surface according to the electric field information and the aperture parameters, and performing probe compensation based on the aperture electric field information and the probe plane spectrum to obtain a compensation plane spectrum of the antenna to be tested so as to perform planar near field testing on the antenna to be tested. Because the scanning surface is far away from the antenna to be measured compared with the caliber surface, the scanning area is larger than the scanning area of the caliber surface in order to obtain the electric field information on the scanning surface, therefore, the caliber electric field information of the caliber surface can be obtained by reversely pushing the electric field information of the scanning surface, the influence of cutting off can be effectively reduced, and then probe compensation is carried out on the caliber electric field information to reduce the influence of probe directivity on the plane spectrum of the antenna to be measured, so that the measured antenna property is more accurate.
Description
Technical Field
The embodiment of the invention relates to the technical field of antenna measurement, in particular to a planar near field test method and device, electronic equipment and a readable storage medium.
Background
With the rapid development of modern science and technology, the antenna is an indispensable component in the wireless communication equipment, the quality of the antenna directly affects the performance of the whole system, and the antenna measurement is also more and more important as the most direct method for checking the quality of the antenna, so that the planar near field test method is one of the important means for testing the antenna.
At present, two difficulties exist in a plane near field test method, one is that a truncation error is introduced due to the limited coverage range of a scanning area in plane near field measurement, and the other is that the amplitude phase of an electromagnetic field is measured through a probe, the probe is an antenna, the antenna has specific directivity, signals from different directions are received and overlapped by the probe when plane scanning is performed, and then the signals are converted into level output through a signal analyzer, so that the influence of the directivity of the probe is included in data.
Disclosure of Invention
In view of this, embodiments of the present invention provide a planar near field testing method, apparatus, electronic device, and readable storage medium, which can effectively improve the accuracy of planar near field testing.
In a first aspect, an embodiment of the present invention provides a planar near field testing method, where the method includes:
Acquiring electric field information of a scanning surface parallel to an antenna to be measured, aperture parameters of a caliber surface and probe plane spectrum; the probe plane spectrum is the plane spectrum of an acquisition device for acquiring electric field information of a scanning surface, and the distance between the scanning surface and an antenna to be measured is larger than the distance between the caliber surface and the antenna to be measured;
Calculating aperture electric field information of the aperture surface according to the electric field information and the aperture parameters;
performing probe compensation based on the caliber electric field information and the probe plane spectrum to obtain a compensation plane spectrum of the antenna to be tested;
and carrying out planar near field test on the antenna to be tested according to the compensation planar spectrum.
In one possible embodiment, the caliber parameter includes a preset caliber surface range and grid accuracy;
the caliber electric field information of the caliber surface is calculated by the following steps:
wherein, Representing the component of the electric field information in the tangential x direction of the electric field and the component in the tangential y direction of the electric field respectively; r represents the relative coordinates on the scan plane with respect to the origin coordinates on the aperture plane; respectively representing the component of the caliber electric field information in the tangential direction x of the electric field and the component of the caliber electric field information in the tangential direction y of the electric field; Δx ', Δy' represent grid accuracy; a represents the caliber surface range; r' mn represents coordinates within the caliber plane range; g (r, r' mn) represents the green function of free space, which can be expressed by the following formula: i denotes an imaginary unit, and k denotes an electromagnetic wave vector.
In one possible embodiment, performing probe compensation based on the aperture electric field information and the probe plane spectrum to obtain a compensated plane spectrum of the antenna to be measured, including:
Performing mode expansion on the aperture electric field information by utilizing Fourier transformation to obtain a first plane spectrum of the antenna to be tested;
And carrying out probe compensation on the first plane spectrum based on the probe plane spectrum to obtain a compensation plane spectrum of the antenna to be tested.
In one possible embodiment, before performing mode expansion on the aperture electric field information by using fourier transform to obtain a first plane spectrum of the antenna to be measured, the method further includes:
acquiring fringe field information of a fringe position on the aperture surface from aperture field information, wherein the fringe field information comprises fringe field intensity; the edge position is an electric field position which is a preset distance away from the antenna aperture of the antenna to be measured;
Judging whether the fringe electric field strength is smaller than a preset electric field strength;
executing a step of performing mode expansion on aperture electric field information by utilizing Fourier transform under the condition that the edge electric field intensity is smaller than the preset electric field intensity to obtain a first plane spectrum of the antenna to be tested;
And resetting the caliber parameter under the condition that the fringe electric field strength is larger than or equal to the preset electric field strength until the fringe electric field strength is smaller than the preset electric field strength.
In one possible embodiment, the first planar spectrum of the antenna to be measured is obtained by:
Wherein P (k x,ky) represents a first plane spectrum; Representing caliber electric field information; a represents the caliber surface range; r' mn represents coordinates within the caliber plane range; x' represents the horizontal axis coordinate in the caliber plane range; y' represents the vertical axis coordinates in the caliber plane range; k x、ky represents the component of the wave vector k of the electromagnetic wave in the tangential x direction of the electric field and in the tangential y direction of the electric field, respectively.
In one possible embodiment, the compensation plane spectrum of the antenna to be measured is obtained by:
Wherein P (k x,ky) represents a first plane spectrum; Representing the probe plane spectrum; Representing the compensated planar spectrum, k x、ky、kz represents the component of the wave vector k of the electromagnetic wave in the tangential x direction of the electric field, the component in the tangential y direction of the electric field and the component in the z direction of the electric field, respectively,
In one possible embodiment, performing planar near field testing on an antenna to be tested according to a compensated planar spectrum includes:
And calculating the radiation characteristic parameters of the antenna to be measured according to the compensation plane spectrum.
In one possible embodiment, the radiation characteristic parameter is a far field pattern;
Calculating radiation characteristic parameters of the antenna to be measured by the following steps:
wherein, Representing a far field pattern; r c, θ,Coordinates representing a far-field sphere; Representing a compensated planar spectrum; i represents an imaginary unit; k x、ky、kz represents a component of the electromagnetic wave vector k in the tangential x direction of the electric field, a component in the tangential y direction of the electric field, and a component in the z direction of the electric field, respectively.
In one possible embodiment, the radiation characteristic parameter is plane electric field information of a preset electric field plane; the preset electric field plane is a parallel plane with a parallel distance to the antenna to be measured as a preset distance;
Calculating radiation characteristic parameters of the antenna to be measured by the following steps:
Wherein E (x, y, z=d) represents planar electric field information; x, y and z represent coordinates on a preset electric field plane; d represents a preset distance; Representing a compensated planar spectrum; k x、ky、kz represents a component of the electromagnetic wave vector k in the tangential x direction of the electric field, a component in the tangential y direction of the electric field, and a component in the z direction of the electric field, respectively; i represents an imaginary unit.
In a second aspect, an embodiment of the present invention provides a planar near field testing device, where the device includes:
The acquisition module is used for acquiring electric field information of a scanning surface parallel to the antenna to be detected, aperture parameters of a caliber surface and probe plane wave spectrum; the probe plane spectrum is the plane spectrum of an acquisition device for acquiring electric field information of a scanning surface, and the distance between the scanning surface and an antenna to be measured is larger than the distance between the caliber surface and the antenna to be measured;
The calculation module is used for calculating aperture electric field information of the aperture surface according to the electric field information and the aperture parameters;
The probe compensation module is used for carrying out probe compensation based on the caliber electric field information and the probe plane spectrum to obtain a compensation plane spectrum of the antenna to be tested;
And the plane near field test module is used for carrying out plane near field test on the antenna to be tested according to the compensation plane spectrum.
In a third aspect, an embodiment of the present invention provides an electronic device, including: the processor is used for executing the planar near field test program stored in the memory so as to realize the planar near field test method.
In a fourth aspect, an embodiment of the present invention provides a readable storage medium, where the readable storage medium stores one or more programs, and the one or more programs are executable by one or more processors to implement the planar near field testing method described above.
The embodiment of the application provides a planar near field testing method, a device, electronic equipment and a readable storage medium, which comprise the steps of acquiring electric field information of a scanning surface parallel to an antenna to be tested, aperture parameters of an aperture surface and a probe plane spectrum, calculating aperture electric field information of the aperture surface according to the electric field information and the aperture parameters, compensating the probe based on the aperture electric field information and the probe plane spectrum to obtain a compensation plane spectrum of the antenna to be tested, and performing planar near field testing on the antenna to be tested according to the compensation plane spectrum. Because the scanning surface is far away from the antenna to be tested compared with the caliber surface, the electric field distribution on the scanning surface needs to be dispersed relative to the electric field distribution of the caliber surface, and the electric field information on the scanning surface needs to be larger than the scanning area of the caliber surface in order to obtain the electric field information, so that the influence of cutting off can be effectively reduced by reversely pushing the electric field information of the scanning surface to obtain the caliber electric field information of the caliber surface, and then probe compensation is carried out on the caliber electric field information to reduce the influence of probe directivity on the plane spectrum of the antenna to be tested.
Drawings
FIG. 1 is a flowchart of an embodiment of a planar near field test method according to an embodiment of the present invention;
fig. 2 is a schematic diagram of a simplified model of an antenna to be tested according to an embodiment of the present invention;
FIG. 3 is a flowchart of another embodiment of a planar near field testing method according to an embodiment of the present invention;
fig. 4 is a diagram of a far-field horizontal tangential plane of an antenna according to an embodiment of the present invention;
FIG. 5 is a block diagram of an embodiment of a planar near field test device according to an embodiment of the present invention;
fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present invention.
Icon:
20-an antenna to be tested; 21-a collection device; 22-signal analyzer.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
For the purpose of facilitating an understanding of the embodiments of the present invention, reference will now be made to the following description of specific embodiments, taken in conjunction with the accompanying drawings, which are not intended to limit the embodiments of the invention.
The embodiment of the invention provides a planar near field test method, as shown in fig. 1, which can comprise the following steps:
Step 101, acquiring electric field information of a scanning surface parallel to an antenna to be tested, aperture parameters of a caliber surface and probe plane wave spectrum;
The probe plane spectrum is the plane spectrum of an acquisition device for acquiring electric field information of a scanning surface, and the distance between the scanning surface and an antenna to be measured is larger than the distance between the caliber surface and the antenna to be measured.
In order to facilitate the description of the positional relationship between the scanning plane, the aperture plane and the antenna to be measured, fig. 2 shows a simplified model of the antenna to be measured, as shown in fig. 2, the aperture plane a is a plane that is closely attached to the antenna aperture of the antenna to be measured 20, the electric field distribution is concentrated and is closer to the shape distribution of the surface current of the antenna to be measured, the origin of coordinates in the following description is also selected on this plane, the scanning plane B is a plane that is a distance D from the aperture plane a and is parallel to the aperture plane a and actually performs data measurement, and since the aperture plane a is closely attached to the antenna to be measured 20, the distance between the scanning plane B and the antenna to be measured 20 is considered to be D.
It should be noted that, in order to ensure the accuracy of measurement, the acquisition device is set to scan on a scan plane B parallel to the antenna to be measured at a certain distance (d=3 to 10 wavelengths) from the antenna to be measured, and the amplitude and phase of the electric field sampling, that is, the electric field information, are acquired with a set sampling step length and a sampling range, specifically, the sampling step length is smaller than half of the wavelength of the electromagnetic wave with the corresponding frequency according to the sampling theorem, the sampling range is expanded as much as possible in the mechanical allowable range, although the influence of the truncation can be reduced in the subsequent steps, the influence of the truncation cannot be completely eliminated, and the error of the final result is increased if the initial scan range is too small, so that the larger and better the scan range for the scan plane B is.
In particular, as shown in fig. 2, the electric field information of the scan surface may be measured by hardware such as a plane scanning frame (not shown in fig. 2), the acquisition device 21, and the signal analyzer 22, where the plane scanning frame is used to drive the acquisition device 21 to implement mobile positioning on a two-dimensional scan surface, and other mobile modes may be used as long as scanning of the scan surface can be implemented; the acquisition device 21 is used for receiving the electric field information, and the signal analyzer is connected with the antenna 20 to be tested and the acquisition device 21 for reading the electric field information on the scanning surface. The scanning machine and the signal analyzer used above can be controlled by communication through the electronic device, and therefore, the planar near field test method of the present embodiment can be applied to the electronic device.
The planar scanning frame can be a two-dimensional scanning frame to drive the acquisition device to move in a scanning plane, or can be other machines for realizing planar scanning, for example, the mechanical scanning frame drives the antenna to be detected to move relative to the acquisition device, and the planar scanning frame is not limited herein.
The above-mentioned acquisition device may be a probe for receiving electric field information, or may be any other device capable of receiving electric field information, and is not limited herein, where the probe plane spectrum is a property of the acquisition device itself, and may be obtained by theoretical calculation, numerical simulation, or other experimental methods, or may be obtained by obtaining a device model of the acquisition device, and searching a probe plane spectrum corresponding to the device model from a plane spectrum lookup table, where a plurality of different probe plane spectrums are stored in the plane spectrum lookup table, and a device model corresponding to each probe plane spectrum, and specifically, a method for determining the probe plane spectrum is not limited.
Also, the signal analyzer used in the present embodiment acquires the amplitude and phase of the electric field, and the "signal analyzer" is just a generic name of an instrument for measuring electromagnetic signals, and any other instrument capable of reading the amplitude and phase may be used herein.
In order to obtain the electric field information at the aperture plane by reversely pushing the electric field information of the scanning plane, the aperture parameters capable of representing the characteristics of the aperture plane need to be obtained first, and in this embodiment, the aperture parameters include an aperture plane range and grid accuracy, the aperture parameters can be preset according to actual needs, the aperture plane range is a region range for representing the aperture plane a, and the grid accuracy is an accuracy for representing the aperture plane electric field distribution adopted in subsequent numerical processing.
102, Calculating aperture electric field information of the aperture surface according to the electric field information and the aperture parameters;
in this embodiment, the relationship between the aperture plane and the scanning plane may be established by the equivalent magnetic current principle to obtain an electric field integral equation representing the near field and the equivalent magnetic current, and then a conjugate gradient method is introduced to solve to obtain aperture electric field information.
From the above description, the aperture electric field information of the aperture plane can be calculated by:
wherein, Representing the component of the electric field information in the tangential x direction of the electric field and the component in the tangential y direction of the electric field respectively; r represents the relative coordinates on the scan plane with respect to the origin coordinates on the aperture plane; respectively representing the component of the caliber electric field information in the tangential direction x of the electric field and the component of the caliber electric field information in the tangential direction y of the electric field; Δx ', Δy' represent grid accuracy; a represents the caliber surface range; r' mn represents coordinates within the caliber plane range; g (r, r' mn) represents the green function of free space, which can be expressed by the following formula: i denotes an imaginary unit, and k denotes an electromagnetic wave vector.
It should be noted that the calculated caliber electric field information is not the distribution of the real electric field, and the probe directivity effect of the acquisition device is also transferred to the caliber surface, so that in order to reduce the effect of the probe directivity on the measurement accuracy, the probe compensation needs to be performed in step 103 to obtain the plane spectrum of the antenna to be measured, from which the probe effect is eliminated.
Step 103, probe compensation is carried out based on the caliber electric field information and the probe plane spectrum, and a compensation plane spectrum of the antenna to be tested is obtained;
The current general method of probe compensation is to firstly perform mode expansion on the electric field information acquired by the scanning surface acquisition device to obtain a plane spectrum, and then eliminate the influence of the known probe coefficient on each mode to obtain the plane spectrum of the real electric field. However, if the scanning range is not large enough, the spectrum obtained by transforming the truncated data is different from the complete data, and the spectrum is only matched in a smaller trusted interval, so that the accurate antenna characteristic cannot be further obtained.
Where complete data refers to the desired spectrum, i.e., the spectrum obtained by transforming infinite planar data.
In this embodiment, the aperture electric field information of the aperture plane is obtained by inverse-pushing based on the electric field information of the scanning plane, and since the aperture plane fringe electric field intensity obtained in the above steps is smaller than the preset electric field intensity, the scanning range at the aperture plane is considered to be large enough, and the influence on the cutting is very small, so that the probe compensation is performed on the aperture electric field information, the compensation plane spectrum of the antenna to be measured can be accurately obtained, and the antenna characteristics can be further accurately analyzed.
And 104, performing planar near-field test on the antenna to be tested according to the compensated planar spectrum.
The compensation plane spectrum obtained in the step 103 can be used for accurately calculating far field properties, aperture plane properties or electric field properties on any other distance plane of the antenna to be measured, and the radiation characteristics of the antenna to be measured can be fully analyzed through the electric field properties so as to accurately judge the antenna quality of the antenna to be measured.
The plane near field testing method provided by the embodiment of the application comprises the steps of obtaining electric field information of a scanning plane parallel to an antenna to be tested, aperture parameters of an aperture plane and plane wave spectrum of a probe, calculating aperture electric field information of the aperture plane according to the electric field information and the aperture parameters, compensating the probe based on the aperture electric field information and the plane wave spectrum of the probe to obtain compensation plane wave spectrum of the antenna to be tested, and performing plane near field testing on the antenna to be tested according to the compensation plane wave spectrum. Because the scanning surface is far away from the antenna to be tested compared with the caliber surface, the electric field distribution on the scanning surface needs to be dispersed relative to the electric field distribution of the caliber surface, and the electric field information on the scanning surface needs to be larger than the scanning area of the caliber surface in order to obtain the electric field information, so that the influence of cutting off can be effectively reduced by reversely pushing the electric field information of the scanning surface to obtain the caliber electric field information of the caliber surface, and then probe compensation is carried out on the caliber electric field information to reduce the influence of probe directivity on the plane spectrum of the antenna to be tested.
Referring to fig. 3, a flowchart of an embodiment of another planar near field testing method is provided in an embodiment of the present invention. The process shown in fig. 3 may include the following steps based on the process shown in fig. 1:
step 301, acquiring electric field information of a scanning surface parallel to an antenna to be tested, aperture parameters of a caliber surface and probe plane spectrum;
The probe plane spectrum is the plane spectrum of an acquisition device for acquiring electric field information of a scanning surface, and the distance between the scanning surface and an antenna to be measured is larger than the distance between the caliber surface and the antenna to be measured.
Step 302, calculating aperture electric field information of the aperture surface according to the electric field information and the aperture parameters;
for a detailed description of step 301 and step 302, reference may be made to the related description in the embodiment shown in fig. 1, which is not repeated here.
Step 303, acquiring fringe field information of a fringe position on the aperture surface from aperture electric field information, wherein the fringe field information comprises fringe field intensity;
The edge position is an electric field position which is a preset distance away from the antenna aperture of the antenna to be measured; to determine the rationality of the caliber electric field information result in step 302, especially whether the setting of the sampling range is reasonable, that is, whether the electric field intensity at the edge position is small enough, a common criterion is that the electric field intensity at the edge position is less than-40 dB. For a common aperture antenna, the edge position can be taken as the aperture range extending 2 wavelengths outwards.
Step 304, judging whether the fringe electric field strength is smaller than a preset electric field strength;
If the electric field strength at the edge is smaller than the electric field strength at the edge, which indicates that the caliber parameter setting is not problematic, steps 305-307 may be performed to perform a planar near field test on the antenna to be tested; if the fringe field strength is greater than or equal to the preset field strength, it is indicated that the caliber parameter is set up, the caliber parameter needs to be reset, and then the caliber field information of the caliber surface is calculated according to the field information and the reset caliber parameter, that is, step 302 is executed until the fringe field strength is less than-40 dB of the maximum value.
When resetting the caliber parameters, attention is paid to expanding the caliber surface range and improving the grid precision, so that the calculation time is increased, the caliber parameters are set by balancing the test speed and the precision,
Step 305, performing mode expansion on the caliber electric field information by utilizing Fourier transformation to obtain a first plane spectrum of the antenna to be tested;
The method comprises the steps of performing mode expansion on aperture electric field information, obtaining a first plane spectrum P (k x,ky) containing probe influence based on a mathematical two-dimensional Fourier transform method, and specifically obtaining the first plane spectrum of an antenna to be tested by the following formula:
Wherein P (k x,ky) represents a first plane spectrum; Representing caliber electric field information; a represents the caliber surface range; r' mn represents coordinates within the caliber plane range; x' represents the horizontal axis coordinate in the caliber plane range; y' represents the vertical axis coordinates in the caliber plane range; k x、ky represents the component of the wave vector k of the electromagnetic wave in the tangential x direction of the electric field and in the tangential y direction of the electric field, respectively.
Step 306, performing probe compensation on the first plane spectrum based on the probe plane spectrum to obtain a compensated plane spectrum of the antenna to be tested;
the compensation plane spectrum of the antenna to be measured is obtained by:
Wherein P (k x,ky) represents a first plane spectrum; Representing the probe plane spectrum; Representing the compensated planar spectrum, k x、ky、kz represents the component of the wave vector k of the electromagnetic wave in the tangential x direction of the electric field, the component in the tangential y direction of the electric field and the component in the z direction of the electric field, respectively,
And 307, performing planar near-field test on the antenna to be tested according to the compensated planar spectrum.
In designing and detecting antennas, electromagnetic radiation properties at different distances are often of interest: the electromagnetic field distribution is far-field, namely, the electromagnetic field distribution on a distance far greater than the size of the antenna, which is close to the practical application scene of the antenna, when in practical use, the electromagnetic field distribution of the far-field can be represented through a far-field pattern, and the electromagnetic field distribution is near-field, namely, the electromagnetic field distribution on a distance greater than the size of the antenna, particularly, the electromagnetic field distribution is close to the caliber surface of the antenna, and the working state of the antenna element is intuitively reflected by the electromagnetic field distribution.
If the radiation characteristic parameter is a far field pattern, the specific calculation process for calculating the far field pattern according to the compensation plane spectrum can be realized by the following formula:
wherein, Representing a far field pattern; r c, θ,Coordinates representing a far-field sphere; Representing a compensated planar spectrum; i represents an imaginary unit; k x、ky、kz represents a component of the electromagnetic wave vector k in the tangential x direction of the electric field, a component in the tangential y direction of the electric field, and a component in the z direction of the electric field, respectively.
For convenience of explanation, the far-field pattern can be accurately obtained by using the planar near-field test method in this embodiment, and fig. 4 compares the far-field horizontal tangential pattern of the antenna obtained by measuring the same antenna to be tested in different manners, where the antenna to be tested is a horn antenna, the frequency is 12.5GHz, the distance between scanning surfaces is 80mm, and the probe is a rectangular waveguide probe WR62.
In fig. 4a, L1 is the result obtained using the ideal planar near field test mode. The scanning surface is large enough, the cutting effect is negligible, and the probe compensation can be used. The final result can be used as a standard result of the far field of the antenna to be tested. The specific measurement steps are as follows: 1. performing a large-range planar scan (250 mm x 460 mm) in the near field region, wherein the electric field intensity at the edges of the scan range has been attenuated to less than-40 dB at the maximum; 2. performing probe compensation on the measurement data by using Fourier transformation to obtain a plane spectrum; 3. the far field pattern is calculated using the resulting planar spectrum.
L2 is the result of the small-range scanning measurement to obtain truncated data and the probe compensation is performed as well. The specific procedure is almost the same as L1, the only difference being that the scan range is much smaller (180 mm x 180 mm). The data used in the following calculations were obtained by directly manually truncating the original data of L1. The end result may be a truncated effect.
L3 is a result obtained by using the same small-range scan data as L2 and using the planar near field test method of the present embodiment. For specific steps, refer to steps 301 to 307. The final result can embody the effects of truncation correction and probe compensation.
It can be seen from fig. 4a that the electric field intensities of L2 and L1 are substantially the same in a small angle range near the far field center direction, but the electric field intensities in a large angle range are quite different, and L2 has many significant fluctuations, which are mainly the influence caused by data truncation, and the electric field intensities of L3 and L1 in a small angle range are almost identical, and the trend of the electric field intensities in a large angle range is closer to L1 than that of L2, and the fluctuations caused by data truncation are reduced. From the difference between L2 and L3 and L1 in fig. 4b, it is more clearly seen that the error of the far-field pattern obtained using the method of the present embodiment is much smaller in each angular range than that obtained using the method of L2.
If the radiation characteristic parameter is plane electric field information of a preset electric field plane; the preset electric field plane is a parallel plane with a parallel distance to the antenna to be measured as a preset distance; the specific calculation process of the plane electric field information of the preset electric field plane according to the compensation plane spectrum can be realized by the following formula:
Wherein E (x, y, z=d) represents planar electric field information; x, y and z represent coordinates on a preset electric field plane; d represents a preset distance; Representing a compensated planar spectrum; k x、ky、kz represents a component of the electromagnetic wave vector k in the tangential x direction of the electric field, a component in the tangential y direction of the electric field, and a component in the z direction of the electric field, respectively; i represents an imaginary unit.
When z=0, the calculated plane electric field information is aperture electric field information on the aperture plane, and the aperture electric field information is different from the aperture electric field information calculated in step 302 according to the electric field information and the aperture parameter, because the aperture electric field information calculated on the aperture plane based on the compensated plane spectrum does not include probe influence, and the aperture electric field information calculated in step 302 includes probe influence.
The above calculation formulas are all calculated by taking the plane of the selected caliber plane A as the xy coordinate plane, other coordinates can be defined according to actual needs, and only the formulas need to be replaced or coordinate conversion and the like are added, so that the detailed description is omitted.
According to the planar near field testing method provided by the embodiment of the application, the aperture electric field information of the aperture surface can be obtained through the inverse pushing of the electric field information of the scanning surface, the influence of interception can be effectively reduced, and whether the aperture electric field information obtained through the analysis of the fringe electric field intensity in the fringe electric field information of the fringe position is reasonable or not can be analyzed.
Referring to fig. 5, a block diagram of an embodiment of a planar near field testing device according to an embodiment of the present invention is provided. As shown in fig. 5, the apparatus may include:
The acquisition module 501 is used for acquiring electric field information of a scanning surface parallel to the antenna to be detected, aperture parameters of a caliber surface and probe plane spectrum; the probe plane spectrum is the plane spectrum of an acquisition device for acquiring electric field information of a scanning surface, and the distance between the scanning surface and an antenna to be measured is larger than the distance between the caliber surface and the antenna to be measured;
The calculating module 502 is configured to calculate aperture electric field information of the aperture surface according to the electric field information and the aperture parameter;
The probe compensation module 503 is configured to perform probe compensation based on the caliber electric field information and the probe plane spectrum, so as to obtain a compensated plane spectrum of the antenna to be tested;
The planar near field test module 504 is configured to perform a planar near field test on the antenna to be tested according to the compensated planar spectrum.
In one possible embodiment, the caliber parameter includes a preset caliber surface range and grid accuracy;
the caliber electric field information of the caliber surface is calculated by the following steps:
wherein, Representing the component of the electric field information in the tangential x direction of the electric field and the component in the tangential y direction of the electric field respectively; r represents the relative coordinates on the scan plane with respect to the origin coordinates on the aperture plane; respectively representing the component of the caliber electric field information in the tangential direction x of the electric field and the component of the caliber electric field information in the tangential direction y of the electric field; Δx ', Δy' represent grid accuracy; a represents the caliber surface range; r' mn represents coordinates within the caliber plane range; g (r, r' mn) represents the green function of free space, which can be expressed by the following formula: i denotes an imaginary unit, and k denotes an electromagnetic wave vector.
In one possible implementation, the probe compensation module 403 is further configured to:
Performing mode expansion on the aperture electric field information by utilizing Fourier transformation to obtain a first plane spectrum of the antenna to be tested;
And carrying out probe compensation on the first plane spectrum based on the probe plane spectrum to obtain a compensation plane spectrum of the antenna to be tested.
In one possible embodiment, the apparatus further comprises (not shown in fig. 4):
the fringe electric field information acquisition module is used for acquiring fringe electric field information of a fringe position on the aperture surface from aperture electric field information, wherein the fringe electric field information comprises fringe electric field intensity; the edge position is an electric field position which is a preset distance away from the antenna aperture of the antenna to be measured;
the judging module is used for judging whether the fringe electric field strength is smaller than the preset electric field strength;
The execution module is used for executing the step of carrying out mode expansion on the aperture electric field information by utilizing Fourier transformation under the condition that the edge electric field intensity is smaller than the preset electric field intensity to obtain a first plane spectrum of the antenna to be tested;
And the resetting parameter module is used for resetting the caliber parameter under the condition that the fringe electric field strength is larger than or equal to the preset electric field strength until the fringe electric field strength is smaller than the preset electric field strength.
In one possible embodiment, the first planar spectrum of the antenna to be measured is obtained by:
Wherein P (k x,ky) represents a first plane spectrum; Representing caliber electric field information; a represents the caliber surface range; r' mn represents coordinates within the caliber plane range; x' represents the horizontal axis coordinate in the caliber plane range; y' represents the vertical axis coordinates in the caliber plane range; k x、ky represents the component of the wave vector k of the electromagnetic wave in the tangential x direction of the electric field and in the tangential y direction of the electric field, respectively.
In one possible embodiment, the compensation plane spectrum of the antenna to be measured is obtained by:
Wherein P (k x,ky) represents a first plane spectrum; Representing the probe plane spectrum; Representing the compensated planar spectrum, k x、ky、kz represents the component of the wave vector k of the electromagnetic wave in the tangential x direction of the electric field, the component in the tangential y direction of the electric field and the component in the z direction of the electric field, respectively,
In one possible implementation, the planar near field test module 404 is further configured to:
And calculating the radiation characteristic parameters of the antenna to be measured according to the compensation plane spectrum.
In one possible embodiment, the radiation characteristic parameter is a far field pattern;
Calculating radiation characteristic parameters of the antenna to be measured by the following steps:
wherein, Representing a far field pattern; r c, θ,Coordinates representing a far-field sphere; Representing a compensated planar spectrum; i represents an imaginary unit; k x、ky、kz represents a component of the electromagnetic wave vector k in the tangential x direction of the electric field, a component in the tangential y direction of the electric field, and a component in the z direction of the electric field, respectively.
In one possible embodiment, the radiation characteristic parameter is plane electric field information of a preset electric field plane; the preset electric field plane is a parallel plane with a parallel distance to the antenna to be measured as a preset distance;
Calculating radiation characteristic parameters of the antenna to be measured by the following steps:
Wherein E (x, y, z=d) represents planar electric field information; x, y and z represent coordinates on a preset electric field plane; d represents a preset distance; Representing a compensated planar spectrum; k x、ky、kz represents a component of the electromagnetic wave vector k in the tangential x direction of the electric field, a component in the tangential y direction of the electric field, and a component in the z direction of the electric field, respectively; i represents an imaginary unit.
Fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present invention, and an electronic device 600 shown in fig. 6 includes: at least one processor 601, memory 602, at least one network interface 604, and other user interfaces 603. The various components in the electronic device 600 are coupled together by a bus system 605. It is understood that the bus system 605 is used to enable connected communications between these components. The bus system 605 includes a power bus, a control bus, and a status signal bus in addition to a data bus. But for clarity of illustration the various buses are labeled as bus system 605 in fig. 6.
The user interface 603 may include, among other things, a display, a keyboard, or a pointing device (e.g., a mouse, a trackball, a touch pad, or a touch screen, etc.).
It is to be appreciated that the memory 602 in embodiments of the invention may be either volatile memory or nonvolatile memory, or may include both volatile and nonvolatile memory. The nonvolatile Memory may be a Read-Only Memory (ROM), a Programmable ROM (PROM), an Erasable PROM (EPROM), an Electrically Erasable EPROM (EEPROM), or a flash Memory. The volatile memory may be random access memory (Random Access Memory, RAM) which acts as external cache memory. By way of example, and not limitation, many forms of RAM are available, such as static random access memory (STATIC RAM, SRAM), dynamic random access memory (DYNAMIC RAM, DRAM), synchronous Dynamic Random Access Memory (SDRAM), double data rate Synchronous dynamic random access memory (Double DATA RATE SDRAM, DDRSDRAM), enhanced Synchronous dynamic random access memory (ENHANCED SDRAM, ESDRAM), synchronous link dynamic random access memory (SYNCH LINK DRAM, SLDRAM), and Direct memory bus random access memory (DRRAM). The memory 602 described herein is intended to comprise, without being limited to, these and any other suitable types of memory.
In some implementations, the memory 602 stores the following elements, executable units or data structures, or a subset thereof, or an extended set thereof: an operating system 6021 and application programs 6022.
The operating system 6021 includes various system programs, such as a framework layer, a core library layer, a driver layer, and the like, for implementing various basic services and processing hardware-based tasks. Application 6022 includes various applications such as a media player (MEDIA PLAYER), browser (Browser), etc. for implementing various application services. The program for implementing the method of the embodiment of the present invention may be included in the application 6022.
In the embodiment of the present invention, the processor 601 is configured to execute the method steps provided in the method embodiments by calling a program or an instruction stored in the memory 602, specifically, a program or an instruction stored in the application 6022.
The method disclosed in the above embodiment of the present invention may be applied to the processor 601 or implemented by the processor 601. The processor 601 may be an integrated circuit chip with signal processing capabilities. In implementation, the steps of the above method may be performed by integrated logic circuits of hardware in the processor 601 or instructions in the form of software. The Processor 601 may be a general purpose Processor, a digital signal Processor (DIGITAL SIGNAL Processor, DSP), an Application SPECIFIC INTEGRATED Circuit (ASIC), an off-the-shelf programmable gate array (Field Programmable GATE ARRAY, FPGA) or other programmable logic device, discrete gate or transistor logic device, discrete hardware components. The disclosed methods, steps, and logic blocks in the embodiments of the present invention may be implemented or performed. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of the method disclosed in connection with the embodiments of the present invention may be embodied directly in the execution of a hardware decoding processor, or in the execution of a combination of hardware and software elements in a decoding processor. The software elements may be located in a random access memory, flash memory, read-only memory, programmable read-only memory or electrically erasable programmable memory, registers, etc. as well known in the art. The storage medium is located in a memory 602, and the processor 601 reads information in the memory 602 and performs the steps of the above method in combination with its hardware.
It is to be understood that the embodiments described herein may be implemented in hardware, software, firmware, middleware, microcode, or a combination thereof. For a hardware implementation, the Processing units may be implemented within one or more Application SPECIFIC INTEGRATED Circuits (ASICs), digital signal processors (DIGITAL SIGNAL Processing, DSPs), digital signal Processing devices (DSPDEVICE, DSPD), programmable logic devices (Programmable Logic Device, PLDs), field-Programmable gate arrays (Field-Programmable GATE ARRAY, FPGA), general purpose processors, controllers, micro-controllers, microprocessors, other electronic units for performing the functions described herein, or a combination thereof.
For a software implementation, the techniques described herein may be implemented by means of units that perform the functions described herein. The software codes may be stored in a memory and executed by a processor. The memory may be implemented within the processor or external to the processor.
The electronic device provided in this embodiment may be an electronic device as shown in fig. 6, and may perform all steps of the planar near field testing method shown in fig. 1 to 3, so as to achieve the technical effects of the planar near field testing method shown in fig. 1 to 3, and the detailed description will be omitted herein for brevity.
The embodiment of the invention also provides a storage medium (computer readable storage medium). The storage medium here stores one or more programs. Wherein the storage medium may comprise volatile memory, such as random access memory; the memory may also include non-volatile memory, such as read-only memory, flash memory, hard disk, or solid state disk; the memory may also comprise a combination of the above types of memories.
When the one or more programs in the storage medium are executable by the one or more processors, the planar near field test method described above is implemented.
The processor is used for executing a planar near field test program stored in the memory to realize the steps of the planar near field test method.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative elements and steps are described above generally in terms of function in order to clearly illustrate the interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied in hardware, in a software module executed by a processor, or in a combination of the two. The software modules may be disposed in Random Access Memory (RAM), memory, read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
The foregoing description of the embodiments has been provided for the purpose of illustrating the general principles of the invention, and is not meant to limit the scope of the invention, but to limit the invention to the particular embodiments, and any modifications, equivalents, improvements, etc. that fall within the spirit and principles of the invention are intended to be included within the scope of the invention.
Claims (12)
1. A planar near field test method, the method comprising:
Acquiring electric field information of a scanning surface parallel to an antenna to be measured, aperture parameters of a caliber surface and probe plane spectrum; the probe plane spectrum is a plane spectrum of an acquisition device for acquiring electric field information of the scanning surface, and the distance between the scanning surface and the antenna to be detected is greater than that between the aperture surface and the antenna to be detected;
Calculating aperture electric field information of the aperture surface according to the electric field information and the aperture parameter;
Performing probe compensation based on the caliber electric field information and the probe plane spectrum to obtain a compensation plane spectrum of the antenna to be tested;
And carrying out planar near field test on the antenna to be tested according to the compensation planar spectrum.
2. The method of claim 1, wherein the caliber parameter comprises a preset caliber plane range and grid accuracy;
Calculating caliber electric field information of the caliber surface by the following steps:
wherein, Representing the component of the electric field information in the tangential x direction of the electric field and the component in the tangential y direction of the electric field respectively; r represents the relative coordinates on the scan surface with respect to the origin coordinates on the aperture surface; Respectively representing the component of the caliber electric field information in the tangential direction x of the electric field and the component of the caliber electric field information in the tangential direction y of the electric field; Δx ', Δy' represent the grid accuracy; a represents the caliber surface range; r m′n represents coordinates within the aperture plane range; g (r, r m′n) represents the green function of free space, and can be expressed by the following formula: i denotes an imaginary unit, and k denotes an electromagnetic wave vector.
3. The method of claim 1, wherein the performing probe compensation based on the caliber electric field information and the probe plane spectrum to obtain a compensated plane spectrum of the antenna to be measured comprises:
Performing mode expansion on the caliber electric field information by utilizing Fourier transformation to obtain a first plane spectrum of the antenna to be tested;
And performing probe compensation on the first plane spectrum based on the probe plane spectrum to obtain a compensated plane spectrum of the antenna to be tested.
4. A method according to claim 3, wherein prior to said subjecting said aperture electric field information to mode expansion using fourier transform to obtain a first planar spectrum of said antenna under test, said method further comprises:
acquiring fringe field information of a fringe position on the aperture surface from the aperture electric field information, wherein the fringe field information comprises fringe field intensity; the edge position is an electric field position which is a preset distance away from the antenna aperture of the antenna to be detected;
Judging whether the fringe electric field strength is smaller than a preset electric field strength;
executing a step of performing mode expansion on the caliber electric field information by utilizing Fourier transformation under the condition that the fringe electric field intensity is smaller than the preset electric field intensity to obtain a first plane spectrum of the antenna to be tested;
And resetting the caliber parameter under the condition that the fringe electric field strength is larger than or equal to the preset electric field strength until the fringe electric field strength is smaller than the preset electric field strength.
5. A method according to claim 3, wherein the first planar spectrum of the antenna to be measured is obtained by:
Wherein P (k x,ky) represents the first plane spectrum; Representing the caliber electric field information; a represents the caliber surface range; r' mn represents coordinates within the caliber plane range; x' represents the horizontal axis coordinate within the caliber plane range; y' represents the vertical axis coordinates within the caliber plane range; k x、ky represents the component of the wave vector k of the electromagnetic wave in the tangential x direction of the electric field and in the tangential y direction of the electric field, respectively.
6. A method according to claim 3, characterized in that the compensation plane spectrum of the antenna to be measured is obtained by:
Wherein P (k x,ky) represents the first plane spectrum; Representing the probe plane spectrum; Representing the compensated planar spectrum, k x、ky、kz represents the component of the wave vector k of the electromagnetic wave in the tangential x direction of the electric field, the component in the tangential y direction of the electric field and the component in the z direction of the electric field, respectively,
7. The method of claim 1, wherein performing planar near field testing on the antenna under test according to the compensated planar spectrum comprises:
and calculating the radiation characteristic parameters of the antenna to be measured according to the compensation plane spectrum.
8. The method of claim 7, wherein the radiation characteristic parameter is a far field pattern;
the radiation characteristic parameters of the antenna to be measured are calculated by the following steps:
wherein, Representing a far field pattern; r c, θ,Coordinates representing a far-field sphere; Representing the compensation plane spectrum; i represents an imaginary unit; k x、ky、kz represents a component of the electromagnetic wave vector k in the tangential x direction of the electric field, a component in the tangential y direction of the electric field, and a component in the z direction of the electric field, respectively.
9. The method of claim 7, wherein the radiation characteristic parameter is planar electric field information of a preset electric field plane; the preset electric field plane is a parallel plane which is parallel to the antenna to be tested and is a preset distance;
the radiation characteristic parameters of the antenna to be measured are calculated by the following steps:
Wherein E (x, y, z=d) represents planar electric field information; x, y and z represent coordinates on the preset electric field plane; d represents the preset distance; Representing the compensation plane spectrum; k x、ky、kz represents a component of the electromagnetic wave vector k in the tangential x direction of the electric field, a component in the tangential y direction of the electric field, and a component in the z direction of the electric field, respectively; i represents an imaginary unit.
10. A planar near field test device, the device comprising:
The acquisition module is used for acquiring electric field information of a scanning surface parallel to the antenna to be detected, aperture parameters of a caliber surface and probe plane wave spectrum; the probe plane spectrum is a plane spectrum of an acquisition device for acquiring electric field information of the scanning surface, and the distance between the scanning surface and the antenna to be detected is greater than that between the aperture surface and the antenna to be detected;
the calculation module is used for calculating the caliber electric field information of the caliber surface according to the electric field information and the caliber parameter;
The probe compensation module is used for carrying out probe compensation based on the caliber electric field information and the probe plane spectrum to obtain a compensation plane spectrum of the antenna to be tested;
And the plane near field test module is used for carrying out plane near field test on the antenna to be tested according to the compensation plane spectrum.
11. An electronic device, comprising: a processor and a memory, the processor being configured to execute a planar near field test program stored in the memory to implement the planar near field test method of any one of claims 1 to 9.
12. A readable storage medium, wherein the readable storage medium stores one or more programs executable by one or more processors to implement the planar near field test method of any of claims 1-9.
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| CN202310144057.8A CN118501563A (en) | 2023-02-06 | 2023-02-06 | Planar near field test method and device, electronic equipment and readable storage medium |
| PCT/CN2024/074562 WO2024164874A1 (en) | 2023-02-06 | 2024-01-30 | Planar near-field testing method and apparatus, electronic device, and readable storage medium |
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| JPH08211117A (en) * | 1995-02-02 | 1996-08-20 | Nippon Telegr & Teleph Corp <Ntt> | Method for measuring radiation pattern of antenna |
| CN104391183A (en) * | 2014-10-11 | 2015-03-04 | 中国船舶重工集团公司第七二四研究所 | Near-field-measurement-based rapid calculation method of antenna far-field region characteristic |
| CN107219410B (en) * | 2017-06-21 | 2019-09-06 | 西安空间无线电技术研究所 | A kind of Planar Near-Field Measurement modification method based on probe frequency sweep shift offset |
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| CN109581279B (en) * | 2018-11-06 | 2020-07-10 | 中国电子科技集团公司第三十八研究所 | Method and device for correcting direction finding precision of ultra-wideband multi-beam system |
| CN111044802A (en) * | 2019-12-04 | 2020-04-21 | 上海霍莱沃电子系统技术股份有限公司 | Phased array antenna unit amplitude and phase balancing method and device based on aperture field |
| CN111366793B (en) * | 2020-06-01 | 2020-08-14 | 上海霍莱沃电子系统技术股份有限公司 | Planar antenna near field measurement method and system for reducing truncation error |
| CN113671269A (en) * | 2021-07-05 | 2021-11-19 | 南京航空航天大学 | Spherical near-far field method based on scattering matrix principle |
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