CN118093444A

CN118093444A - Test method, test device, electronic equipment and storage medium

Info

Publication number: CN118093444A
Application number: CN202410502940.4A
Authority: CN
Inventors: 何木来; 刘素华; 彭广毫
Original assignee: Shenzhen Kotuoyun Iot Technology Co ltd
Current assignee: Shenzhen Kotuoyun Iot Technology Co ltd
Priority date: 2024-04-25
Filing date: 2024-04-25
Publication date: 2024-05-28
Anticipated expiration: 2044-04-25
Also published as: CN118093444B

Abstract

The application is applicable to the technical field of software testing, and provides a testing method, a testing device, electronic equipment and a storage medium, which are applied to equipment to be tested and comprise the following steps: acquiring function configuration information of equipment to be tested and application programs; the function configuration information is used for describing the function authority of the equipment to be tested for at least one function of the application program; generating test configuration information matched with each function based on the function configuration information; and sending the test configuration information to the test equipment connected with the equipment to be tested, so that the test equipment generates a functional test item based on the test configuration information, and performs functional test on the equipment to be tested based on the functional test item to obtain a test result. By adopting the method, the accuracy and the comprehensiveness of the automatic test of the equipment to be tested can be improved.

Description

Test method, test device, electronic equipment and storage medium

Technical Field

The application belongs to the technical field of software testing, and particularly relates to a testing method, a testing device, electronic equipment and a storage medium.

Background

With the wide application of embedded systems in various industries, especially in the key fields of automobiles, aerospace, medical equipment, industrial automation, light protection, light transmission and the like, the requirements on software quality are higher and higher. The requirements for testing efficiency and testing accuracy of embedded products are also increasing.

In the related art, in the testing process of different embedded products, usually, a factory operator manually configures scripts to generate test items according to actual requirements of the products, or manually selects existing test items from an operation interface of an automatic main control machine, and the manual operations may have manual configuration errors or some important functions are missed or missed, so that the accuracy of functional testing of the products is low.

Disclosure of Invention

In view of the above, embodiments of the present application provide a testing method, apparatus, electronic device, storage medium and computer program product capable of improving accuracy and comprehensiveness of automated testing for a device under test, so as to solve the problems in the prior art.

A first aspect of an embodiment of the present application provides a testing method, applied to a device under test, including:

Acquiring function configuration information of equipment to be tested and application programs; the function configuration information is used for describing the function authority of the equipment to be tested for at least one function of the application program;

generating test configuration information matched with each function based on the function configuration information;

And sending the test configuration information to test equipment connected with the equipment to be tested, so that the test equipment generates a functional test item based on the test configuration information, and performs functional test on the equipment to be tested based on the functional test item to obtain a test result.

In an implementation manner of the first aspect, the generating, based on the function configuration information, test configuration information matched with each of the functions includes:

reading the function configuration information to obtain the function authority of the device to be tested for each function of the application program;

Determining data bits of each function in test configuration information expressed in a byte form;

And updating the value of each data bit to an actual value corresponding to each function authority to obtain the test configuration information.

In an implementation manner of the first aspect, the testing method further includes: determining function identifiers corresponding to functions of the application program;

Determining the function authority of the equipment to be tested for each function according to any equipment to be tested running the application program;

And determining the actual value of each function identifier based on each function authority to obtain the function configuration information of the equipment to be tested, which is matched with the application program.

In an implementation manner of the first aspect, the sending the test configuration information to a test device connected to the device under test includes:

Generating a handshake instruction carrying the test configuration information;

and sending the handshake instruction to test equipment to establish communication connection between the equipment to be tested and the test equipment, and indicating the test equipment to acquire the test configuration information from the handshake instruction.

A second aspect of an embodiment of the present application provides a testing apparatus deployed in a device under test, the apparatus comprising:

The acquisition module is used for acquiring function configuration information of the equipment to be tested and the application program; the function configuration information is used for describing the function authority of the equipment to be tested for at least one function of the application program;

the generating module is used for generating test configuration information matched with each function based on the function configuration information;

And the sending module is used for sending the test configuration information to the test equipment connected with the equipment to be tested, so that the test equipment generates a functional test item based on the test configuration information, and performs functional test on the equipment to be tested based on the functional test item to obtain a test result.

The first aspect of the embodiment of the application has the beneficial effects that: the function configuration information which is matched with the application program and comprises the function authority is obtained, the test configuration information is automatically generated, and the function test item is generated on the test equipment according to the function configuration information, so that the high-efficiency and targeted function test is carried out on the equipment to be tested, and finally, a reliable test result is obtained.

A third aspect of the embodiment of the present application provides a testing method, applied to a testing device, including:

Receiving test configuration information matched with the to-be-tested equipment connected with the test equipment for each function of the application program; the test configuration information is generated based on function configuration information of the equipment to be tested and the application program; the function configuration information is used for describing the function authority of the equipment to be tested for at least one function of the application program;

and generating a function test item based on the test configuration information, and performing function test on the equipment to be tested based on the function test item to obtain a test result.

In an implementation manner of the third aspect, the test configuration information is represented in a first binary system, and the generating the functional test item based on the test configuration information includes:

performing binary conversion on the test configuration information expressed by the first binary system to obtain test configuration information expressed by the second binary system;

Determining data bits associated with each function of the device to be tested for the application program in the test configuration information adopting the second binary representation;

And determining a functional test item of the device to be tested for the application program based on the value of each data bit.

In an implementation manner of the third aspect, the method further includes: determining the test sequence of each functional test item;

and testing each function supported in the equipment to be tested based on the testing sequence to obtain a testing result.

In an implementation manner of the third aspect, after the generating the functional test item based on the test configuration information, the method further includes:

updating the test options for the device to be tested displayed in the test interface of the test device based on the function test item;

and sending a test notification message to the device to be tested, wherein the test notification message is used for notifying the device to be tested to start testing the functions corresponding to the function test items.

A fourth aspect of an embodiment of the present application provides a testing apparatus for deployment in a testing device, the apparatus comprising:

the receiving module is used for receiving test configuration information matched with the to-be-tested equipment connected with the test equipment for each function of the application program;

The test configuration information is generated based on function configuration information of the equipment to be tested and the application program; the function configuration information is used for describing the function authority of the equipment to be tested for at least one function of the application program;

And the test module is used for generating a functional test item based on the test configuration information, and carrying out functional test on the equipment to be tested based on the functional test item to obtain a test result.

A fifth aspect of an embodiment of the present application provides an electronic device, including: comprising a memory, a processor, and a computer program stored in the memory and executable on the processor;

when the electronic device is a device to be tested, the processor performs the steps of the method according to the first aspect when executing the computer program;

When the electronic device is a test device, the processor when executing the computer program performs the steps of the method according to the third aspect.

A sixth aspect of the embodiments of the present application provides a storage medium, which is a computer-readable storage medium storing a computer program which, when executed by a processor, implements the steps of the method according to the first aspect, and the steps of the method according to the third aspect.

The third aspect of the embodiment of the application has the beneficial effects that: by receiving test configuration information matched with the device to be tested and connected with the test device and aiming at each function of the application program, the configuration information is generated based on the function configuration information matched with the device to be tested and the application program, and the function authority of the device to be tested aiming at least one function of the application program is described. And then, generating a functional test item based on the test configuration information, and performing functional test on the equipment to be tested to finally obtain a test result. The flow ensures the pertinence and the accuracy of the test and improves the test efficiency.

It will be appreciated that the advantages of the second to sixth aspects may be found in the relevant description of the first or third aspects, and are not described here again.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are needed in the embodiments or the description of the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained according to these drawings without inventive effort for a person skilled in the art.

FIG. 1 is a schematic diagram of a system architecture of a test method according to an embodiment of the present application;

FIG. 2 is a schematic diagram of an implementation flow of a test method according to an embodiment of the present application;

FIG. 3 is a flowchart illustrating a method for determining test configuration information according to an embodiment of the present application;

fig. 4 is a flowchart of a method for determining functional configuration information according to an embodiment of the present application;

FIG. 5 is a schematic diagram of an implementation flow of another test method according to an embodiment of the present application;

FIG. 6 is an exemplary diagram of functional configuration information provided by an embodiment of the present application;

FIG. 7 is a schematic diagram of a testing apparatus according to an embodiment of the present application;

FIG. 8 is a schematic diagram of another test apparatus according to an embodiment of the present application;

fig. 9 is a schematic diagram of an electronic device according to an embodiment of the present application.

Detailed Description

In the following description, for purposes of explanation and not limitation, specific details are set forth such as the particular system architecture, techniques, etc., in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

It should be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.

It should also be understood that the term "and/or" as used in the present specification and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes such combinations.

As used in the present description and the appended claims, the term "if" may be interpreted as "when..once" or "in response to a determination" or "in response to detection" depending on the context. Similarly, the phrase "if a determination" or "if a [ described condition or event ] is detected" may be interpreted in the context of meaning "upon determination" or "in response to determination" or "upon detection of a [ described condition or event ]" or "in response to detection of a [ described condition or event ]".

Furthermore, the terms "first," "second," "third," and the like in the description of the present specification and in the appended claims, are used for distinguishing between descriptions and not necessarily for indicating or implying a relative importance.

Reference in the specification to "one embodiment" or "some embodiments" or the like means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," and the like in the specification are not necessarily all referring to the same embodiment, but mean "one or more but not all embodiments" unless expressly specified otherwise. The terms "comprising," "including," "having," and variations thereof mean "including but not limited to," unless expressly specified otherwise.

The test method provided by the embodiment of the application can be applied to an application environment shown in figure 1. Wherein the device under test 102 is connected to the test device 104 via a communication network 103. The device under test 102 obtains, through its own processor, function configuration information of the device under test adapted to the application program. Test configuration information matching each function is then generated based on the function configuration information. And finally, the test configuration information is sent to the test equipment 104 connected with the equipment to be tested, so that the test equipment generates a functional test item based on the test configuration information, and performs functional test on the equipment to be tested based on the functional test item to obtain a test result. The test device 104 first receives, through its own processor, test configuration information matching with each function of the application program of the device under test 104 connected to itself. And generating a functional test item based on the test configuration information, and finally performing functional test on the equipment to be tested based on the functional test item to obtain a test result.

The device under test 102 may be, but is not limited to, various hardware devices that may be implemented based on an embedded manner, such as a mobile phone, a tablet computer, a wearable device, a vehicle-mounted device, an augmented Reality (Augmented Reality, AR)/Virtual Reality (VR) device, a notebook computer, an Ultra-Mobile Personal Computer (UMPC), a netbook, a Personal digital assistant (Personal DIGITAL ASSISTANT, PDA), a motherboard or a chip in various fields, and the like. The test equipment 104 may be, but is not limited to, an electronic device such as an automated test host machine. The embodiment of the application does not limit the specific type of the device to be tested and the testing device.

For example, the device under test may be a Station (ST) in a WLAN, a cellular telephone, a cordless telephone, a Session initiation protocol (Session InitiationProtocol, SIP) telephone, a wireless local loop (Wireless Local Loop, WLL) station, a Personal digital assistant (Personal DIGITAL ASSISTANT, PDA) device, a handheld device with wireless communication capabilities, a computing device or other processing device connected to a wireless modem, a vehicle-mounted device, a car networking terminal, a computer, a laptop computer, a handheld communication device, a handheld computing device, a satellite radio, a wireless modem card, a television Set Top Box (STB), a customer premise equipment (Customer Premise Equipment, CPE) and/or other devices for communication over a wireless system as well as next generation communication systems, such as a mobile terminal in a 5G network or a mobile terminal in a future evolving public land mobile network (Public Land Mobile Network, PLMN) network, etc.

The Communication network 103 may provide solutions for Communication including wireless local area network (Wireless Local Area Networks, WLAN) (e.g., wi-Fi network), bluetooth, zigbee, mobile Communication network, global navigation satellite system (Global Navigation SATELLITE SYSTEM, GNSS), frequency modulation (Frequency Modulation, FM), near field Communication (NEAR FIELD Communication, NFC), infrared (IR), etc. applied to network devices. The communication module may be one or more devices integrating at least one communication processing module. The communication module may comprise an antenna, which may have only one array element, or may be an antenna array comprising a plurality of array elements. The communication module can receive electromagnetic waves through an antenna, frequency-modulate and filter electromagnetic wave signals, and send the processed signals to a processor. The communication module can also receive the signal to be transmitted from the processor, frequency modulate and amplify the signal, and convert the signal into electromagnetic waves through the antenna to radiate.

In one embodiment, as shown in fig. 2, a test method is provided, and the method is applied to the device under test in fig. 1, and is described as an example, and includes the following steps S201 to S203. Wherein:

Step S201, obtaining function configuration information of equipment to be tested and application program adaptation; the function configuration information is used for describing the function authority of the device to be tested for at least one function of the application program.

In practical implementation, the device under test is an electronic device applied in various fields (such as optical protection and optical transmission fields, for example, the device under test in the fields may include an optical path control device, including an optical switch, optical protection, and optical amplifier device, etc. An application refers to a computer program implemented based on embedded development technology. The application program is burnt into the equipment to be tested to execute corresponding functions. In order to independently manage each function of the application program, in the development stage of the application program, the application program may be divided into a plurality of functions in a modular design manner, and each function may be represented by a function identifier. And by setting different values for the function identifier, it is indicated whether the device under test supports the function indicated by the function identifier, i.e. whether the device under test has functional rights (supported or not) for the function indicated by the function identifier. The specific form of the function identifier may be various, such as setting the function identifier as a global variable or setting the function identifier as a macro, and the present application is not limited to the specific form of the function identifier.

The device to be tested for deploying the application program can select part or all of the functions from a plurality of functions to realize, and when the application program is deployed, various different types of devices to be tested can select the functions of the application program which can be supported by the device to be tested by self-defining the mode of function configuration information. Thus, each device under test deploying an application has functional configuration information that is adapted to the application. The function configuration information includes a function authority for each function of the application program for the device under test. The function authority refers to whether the device to be tested supports the authority of the corresponding function. In practical implementation, the function configuration information can be burnt into the device to be tested along with the application program, so that the processor of the device to be tested can quickly read the function configuration information.

After the equipment to be tested is started, a processor in the equipment to be tested acquires function configuration information which is adaptive to an application program, and generates test configuration information required by subsequent tests according to the function authority of the equipment to be tested, recorded in the function configuration information, of each function so as to finally determine the function to be tested.

Step S202, based on the function configuration information, test configuration information matched with each function is generated.

The test configuration information is generated according to a preset script configuration definition rule and based on the function authority of the device to be tested, which is recorded in the function configuration information, for each function. The test configuration information includes association information of functional test items of the device under test for at least one function required to be tested by the application program. The script configuration definition rules are used to constrain the correspondence between function configuration information and the functions to be tested. And the device to be tested converts the functional configuration information into corresponding test configuration information according to the script configuration definition rule.

In actual implementation, the test configuration information can be characterized in various forms according to actual requirements. In some embodiments, the test configuration information may be characterized in terms of bytes, i.e., the test configuration information is information comprising at least one Byte (Byte), one Byte representing 8 binary (data) bits. In the test configuration information represented in bytes, each function of the application may be associated with at least one data bit. If the number of the functions is not higher than 8, the test configuration information directly adopts one byte, and each data bit in the byte corresponds to one function. It should be noted that, in order to perform more reliable data transmission, the test configuration information may be converted into information of a target system for data transmission, for example, binary test configuration information may be converted into short test configuration information transmission in various system formats such as decimal system and hexadecimal system.

It should be noted that, the test configuration information may also be represented in a protocol format that is cooperatively customized between the device under test and the test device.

And step S203, the test configuration information is sent to the test equipment connected with the equipment to be tested, so that the test equipment generates a functional test item based on the test configuration information, and performs functional test on the equipment to be tested based on the functional test item to obtain a test result.

In actual implementation, a processor of the device under test determines a test device connected with the device under test and transmits test configuration information to the test device to test at least one function of the device under test for the application program through the test device. The test equipment can automatically generate corresponding function test items according to the test configuration information, and then automatically test the functions indicated by the function test items.

In practical implementation, the test device may further provide a display interface for displaying the functional test items, where each functional test item may be displayed, and a test progress of the function indicated by the current functional test item. And corresponding display interfaces are corresponding to each device to be tested. And can set whether each function test item in the interface can be edited according to the actual automation requirement. If full automation is required, the system is set to be non-editable, and if semi-automation is required, the system can be set to be editable.

In practical implementation, the device to be tested can request to establish communication connection with the test device by sending a handshake instruction to the test device so as to perform data transmission. Specifically, after the device to be tested is started, a handshake instruction is generated and sent to the test device, so that the test device establishes communication connection with the device to be tested after receiving the handshake instruction, then acquires test configuration information matched with the device to be tested, and after the test configuration information is successfully acquired, the test device can send a reply notice to the device to be tested to inform the device to be tested of preparation for starting the test. It should be noted that, the successful reception of the handshake instruction may also notify the test device that the device to be tested has entered the factory test mode, and needs to perform the functional test.

The method for acquiring the test configuration information is described. In some embodiments, the test configuration information may be encapsulated in a handshake instruction sent by the device under test to the test device, and sent to the test device together. After receiving the handshake instruction, the test device can determine the device to be tested to analyze the handshake instruction and acquire test configuration information. Under the condition that a plurality of handshake instructions exist simultaneously, the test equipment can also test according to the test priority of the equipment to be tested.

In practical implementation, the test configuration information of the device to be tested can also exist in a storage space (such as a memory and the like) associated with the device to be tested, and at the moment, a handshake instruction sent by the device to be tested to the test device is used for informing the test device that the device to be tested needs to be tested on one hand, and an access authorization code for accessing the storage space associated with the device to be tested is sent to the test device on the other hand. The test device obtains access rights for the storage space based on the access authorization code, and further can read test configuration information from the storage space.

In the testing method for the device to be tested, the functional configuration information which is matched with the application program and comprises the functional authority is obtained, the testing configuration information is generated, and the functional test item is generated on the testing device according to the functional configuration information, so that the device to be tested is subjected to efficient and targeted functional test, and a reliable testing result is finally obtained. The flow improves the automation degree and the accuracy of the functional test, and ensures the stability and the reliability of the equipment to be tested in practical application.

In one embodiment, as shown in fig. 3, generating test configuration information matching each function based on the function configuration information includes:

step S301, reading the function configuration information to obtain the function authority of the device to be tested for each function of the application program.

In actual implementation, the function configuration information associated with the device to be tested includes the function authority of the device to be tested for each function of the application program, and the processor of the device to be tested reads the function configuration information and determines the function authority of each function of the application program.

In step S302, data bits of each function in the test configuration information expressed in the form of bytes are determined.

In the case where the test configuration information is represented in byte form, the processor of the device under test determines the data bits of each function in the test configuration information. The value of each data bit can be 0 or 1, and different values represent different functional rights. For example, if the value is 1, the device to be tested has a function right for the function indicated by the data bit, that is, the function is supported. If the value is 0, the device to be tested has no function authority for the function indicated by the data bit, i.e. the function is not supported.

By way of example, assuming that the total number of functions of the application program is 8 or less, the length of the test configuration information may be one byte, that is, a byte including 8 data bits. Each function of the application corresponds to a bit of data. Assume that func1 corresponds to Bit0, and a value of Bit0 is set according to the functional authority of the device under test for func 1. If the device under test supports func1, bit0=1, and if the device under test does not support func1, bit0=0.

Step S303, the value of each data bit is updated to the actual value corresponding to each function authority, and the test configuration information is obtained.

In actual implementation, the processor of the device under test determines the value of each data bit according to the actual value of the function rights included in the function configuration information. For any function, if the function authority characterizes the equipment to be tested to support the function, the value of the data bit corresponding to the function is replaced by 1, and if the function authority characterizes the equipment to be tested to not support the function, the value of the data bit corresponding to the function is replaced by 0. Finally, test configuration information including at least one byte is obtained.

In this embodiment, by reading the function configuration information, the permission status of the device to be tested for each function of the application program can be accurately obtained. Further, by determining the data bits of each function in the test configuration information and updating these data bits to the actual values corresponding to the function rights, accurate test configuration information can be effectively generated. The flow ensures that the test configuration information is consistent with the actual function authority of the equipment to be tested, thereby improving the pertinence and the effectiveness of the subsequent function test.

In one embodiment, as shown in fig. 4, generating function configuration information of a device under test adapted to an application program includes:

In step S401, a function identifier corresponding to each function of the application is determined.

In real-time implementation, to facilitate management of each function of an application, a software modular design is typically employed, with each function of the application being characterized by a function identifier. The device under test determines relevant information of each function based on the function identifier.

The description is directed to a specific form of function identifier, which may be a global variable or a macro. For example, there are FUNC1, FUNC2, FUNC3, FUNC4 functional modules of the application, characterized by the function identifier func_xxx_1 adapted to FUNC1, characterized by the function identifier func_xxxx_2 adapted to FUNC2, etc.

Step S402, for any device to be tested running the application program, determining the function authority of the device to be tested for each function.

In actual implementation, the application program may run in different devices under test, and the functions of the application program supported by the different devices under test may be different. For example, the device under test a supports the func1, func2, func3 functions of the application, i.e., the device under test a has functional rights for func1, func2, func3 of the application and has no functional rights for func 4. The device under test b supports the func2, func3, func4 functions of the application, i.e. the device under test b has functional rights for func2, func3, func4 and no functional rights for func 1.

Step S403, based on the authority of each function, determining the actual value of each function identifier to obtain the function configuration information of the device to be tested and the application program.

In actual implementation, the value of the function identifier is used to indicate whether the device under test supports the corresponding function. The value of the function identifier may be a different data type, such as a boolean type, a string, a numeric value, etc. Taking a Boolean type as an example, true as support, false as non-support; taking a character string as an example, taking yes as support and no as non-support; taking the numerical type as an example, 1 is supported, and 0 is not supported.

In the above example, the value of the function identifier is boolean, and the function configuration information of the device to be tested a and the application program are as follows: func_xxx_1=true, func_xxxx_2=true, func_xxxx3=false, func_xxxx4=true.

In this embodiment, by identifying each function identifier of the application program and determining the function rights of the application program to each function for a specific device to be tested, an actual value can be set for each function identifier based on the rights, so as to generate function configuration information fully adapted to the device to be tested. The process ensures the accuracy and pertinence of the function configuration information, provides reliable basis for subsequent test work, and improves the test efficiency and the performance of the application program on the device to be tested.

In one embodiment, transmitting test configuration information to a test device connected to a device under test includes: generating a handshake instruction carrying test configuration information; and sending the handshake instruction to the test equipment to establish communication connection between the equipment to be tested and the test equipment, and indicating the test equipment to acquire test configuration information from the handshake instruction.

In practical implementation, the manner in which the device under test sends the test configuration information to the test device may be that the device under test generates a handshake instruction carrying the test configuration information, where the test configuration information is generally expressed in bytes, so as to facilitate information transmission. The handshake instruction is used for informing the test equipment that the function test needs to be carried out on the device to be tested.

In this embodiment, the handshake instruction is generated, which includes necessary test configuration information, and then the instruction is sent to the test device, so that a communication connection is established between the device under test and the test device. The method enables the test equipment to directly extract the test configuration information from the handshake instruction, simplifies the transmission process of the configuration information, and improves the efficiency and accuracy of the test process.

In one embodiment, as shown in fig. 5, a test method is provided, and the test apparatus in fig. 1 is taken as an example to illustrate the method, and the method includes the following steps:

Step S501, test configuration information matched with a device to be tested connected with the test device for each function of an application program is received; the test configuration information is generated based on function configuration information of the equipment to be tested and the application program; the function configuration information is used for describing the function authority of the device to be tested for at least one function of the application program.

In actual implementation, the test equipment acquires test configuration information matched with each function of the application program of the device to be tested from the device to be tested connected with the test equipment. The test configuration information is generated according to the function configuration information describing the function authority of the device to be tested for at least one function of the application program, and each device to be tested has one function configuration information.

Step S502, generating a functional test item based on the test configuration information.

The function test items refer to test items corresponding to functions of the device to be tested for the application program.

In actual implementation, the test equipment analyzes corresponding test configuration information according to a preset script configuration rule to obtain at least one functional test item. The device to be tested has the associated function test item for the function of the application program with the function authority.

Step S503, based on the function test item, the function test is carried out on the equipment to be tested, and a test result is obtained.

In actual implementation, according to the function test items corresponding to the equipment to be tested, the automatic function test is carried out on the corresponding functions of the application programs running in the equipment to be tested, so that a test result is obtained.

In the test method, the function authority of the device to be tested for at least one function of the application program is described by receiving the test configuration information matched with the device to be tested for each function of the application program and connected with the test device, wherein the configuration information is generated based on the function configuration information matched with the device to be tested and the application program. And then, generating a functional test item based on the test configuration information, and performing functional test on the equipment to be tested to finally obtain a test result. The flow ensures the pertinence and the accuracy of the test, improves the test efficiency and provides a reliable basis for optimizing the functions of the equipment to be tested.

In one embodiment, the test configuration information is in a first binary representation, and generating the functional test item based on the test configuration information includes: performing binary conversion on the test configuration information expressed by the first binary system to obtain test configuration information expressed by the second binary system; determining data bits associated with each function of the device to be tested aiming at the application program in test configuration information which adopts a second binary representation; based on the values of the data bits, functional test items of the device under test for the application program to be tested are determined.

In practical implementation, the test configuration information received by the test device from the device to be tested has different forms, for example, may be in a byte form (i.e. at least includes one byte), or may be in other binary forms (such as decimal, hexadecimal, etc.), if in a script configuration rule used for generating the test configuration information, the test configuration information is in a first binary form (such as binary form), and in order to ensure the reliability of data transmission, the test device receives the test configuration information represented by a second binary form (such as decimal form), and then the test device needs to perform binary conversion on the test configuration information of the second binary form to obtain the test configuration information of the first binary form. Then, in the test configuration information according to the first system, the device under test generates a function test item for a value on a data bit occupied by each function of the application program.

Illustratively, assume that the test configuration information received by the test device is decimal information 0xd0, and that the function configuration information in the script configuration definition rule includes 4 functions for the application program by the script configuration definition rule as shown in the following table 1: func1, func2, func3, func4, and a function identifier corresponding to each function, wherein for the function authority of the function, true is support, false is not support, each function identifier occupies a data bit in configuration information with a byte length, and a corresponding value, and when the function authority is true, the corresponding value of the data bit is 1. See table 1 below:

Based on table 1, in order to accurately analyze according to the script configuration definition rule, the test device first performs a binary conversion on 0xd0 to obtain binary test configuration information 11010000. It is known from the control script configuration definition rule that the device under test can support func1, func2, func4, and the like, and generate functional test items corresponding to func1, func2, func4, respectively.

In this embodiment, the conversion of the test configuration information in the first binary representation to the second binary representation facilitates more efficient processing and transmission of data. In the second binary representation, the data bits associated with the device under test for each function of the application may be more accurately determined. Based on the values of the data bits, functional test items of the device under test for the test required by the application program can be determined more accurately, so that the pertinence and the efficiency of the test are improved.

In one embodiment, based on the functional test item, performing a functional test on the device to be tested to obtain a test result, including: determining the test sequence of each function test item; based on the test sequence, each function supported in the device to be tested is tested, and a test result is obtained.

In actual implementation, the test equipment can set the test sequence of the function test items according to indexes such as the priority of the function corresponding to each function test item, and the function with high priority is tested first. And the test equipment sequentially tests each function supported in the equipment to be tested according to the test sequence to obtain a test result of each function.

In this embodiment, by determining the test sequence of each function test item, each function supported in the device to be tested can be tested according to the predetermined sequence, and a corresponding test result can be obtained. The method is helpful to ensure the ordering and repeatability of the test process, so that the test result is more reliable and consistent, thereby improving the test efficiency and the quality assurance of the equipment to be tested.

In one embodiment, after generating the functional test item based on the test configuration information, the method further comprises: based on the functional test items, the test options for the device under test displayed in the test interface of the test device are updated.

In actual practice, the test equipment may also provide a test interface that displays test options. The method is used for displaying various test options, wherein the test options comprise functional test items, test progress of each functional test item, test state and other information. For any device to be tested, after determining the functional test items of the device to be tested, the test device can update all the test options displayed in the test interface in real time so as to keep consistency with the current device to be tested.

In the embodiment, the test interface of the test equipment is updated based on the function test item, so that the test options displayed in the test interface are ensured to be consistent with the actual function test requirements of the equipment to be tested, the pertinence of the test and the intuitiveness of the user interface are improved, and the tester can execute and manage the function test more conveniently and accurately.

In one embodiment, after generating the functional test item based on the test configuration information, the method further comprises: and sending a test notification message to the device to be tested, wherein the test notification message is used for notifying the device to be tested to start testing the functions corresponding to the function test items.

In this embodiment, by sending the test notification message to the device under test, the device under test may be effectively notified that the device under test is about to start testing the function corresponding to each function test item. The notification mechanism ensures that the device to be tested can be prepared and enter the test state in time, thereby improving the coordination and efficiency of the test process.

In order to describe the test method provided by the present application in detail, an embodiment is described below, in which an application program is taken as an optical fiber switching system, a device to be tested is taken as a motherboard or a chip running the optical fiber switching system, and a test device is taken as an automated test master control machine.

In the research and development stage of the optical fiber switching system, the optical fiber switching system can be at least divided into functional modules (namely, each function in the application program in the foregoing) such as optical power, optical fiber switch switching, wired network and wifi through software function modularization design. Setting a corresponding function identifier for each function module:

function identifier of the optical power function module: support_operation_power;

function identifier of the fiber switch switching function module: support_operation_switch;

function identifier of wired network function module: support_lan;

function identifier of WIFI function module: support_wifi.

In practical application, the definition of the function identifier corresponding to each function for each chip to be tested and the actual value of the function identifier may be stored in the form of a function configuration file, for example, stored in a function configuration file with a file name customize _config. As shown in fig. 6, fig. 6 is an exemplary diagram of function configuration information provided in an embodiment of the present application, in the function configuration information, the type of the value of the function identifier is boolean, if the value of the function identifier is true, it is indicated that the chip to be tested supports the corresponding function, and if the value of the function identifier is false, it is indicated that the chip to be tested does not support the corresponding function. From the information shown in fig. 6, it can be determined that the chip under test can support the above four functions of the optical fiber switching system.

Before testing, after the mainboard to be tested is started, the function identifier in the function configuration file customize _config is analyzed. Then, test configuration information is generated according to script configuration definition rules. To facilitate data transfer, test configuration information is defined in bytes.

By way of example, defining the test configuration information as one byte in length may also define longer, 16-bit or 32-bit as desired, which may support testing more functions. The script configuration definition rules are shown in table 2, see table 2 below:

As can be determined from table 2, the function identifier support_operation_power_power of the OPTICAL fiber function has the first Bit, bit0, which is the data Bit occupied in the test configuration information expressed in bytes. The function identifier support_operation_switch of the OPTICAL switching function has the second Bit, bit1, which is the data Bit occupied in the test configuration information expressed in bytes. Based on the script configuration rules shown in table 2, it can be determined that the byte form of the test configuration information is 11010000. In practical applications, in order to reduce the data length, the binary test configuration information may be further converted into decimal test configuration information, that is, 11010000 is converted into 0xd0.

Aiming at the testing stage of the main board to be tested, under the condition that the main board to be tested is started and enters a factory testing mode, the main board to be tested actively transmits a handshake instruction carrying testing configuration information to an automatic testing main controller, and after receiving the handshake instruction, the automatic testing main controller reads the testing configuration information and converts decimal testing configuration information 0xd0 into binary testing configuration information 11010000. Then, according to the script configuration rule shown in table 1, it is determined 11010000 that the function to be tested, for example, the first data bit is the data bit of the function identifier support_operation_power of the OPTICAL fiber function, and a value of 1 indicates that the motherboard to be tested SUPPORTs the function, and the automated test master control needs to test the function. The third data bit is the data bit of the function identifier support_lan of the network function, and a value of 0 indicates that the motherboard under test does not SUPPORT the function, which does not require testing.

By applying the embodiment of the application, the software is designed in a modularized mode, all functions of the modularized design are macro switches, and the test is started by generating script configuration information according to script definition rules and sending the script configuration information to the mainboard to be tested, so that the problems of function omission or configuration errors caused by manual configuration are avoided.

The embodiment of the application also provides a testing device which is realized based on NAND FLASH memories and is used for executing the steps in the embodiment of the testing method. The test device may be a virtual device in the device under test, operated by a processor of the device under test, or may be the device under test itself.

As shown in fig. 7, a test apparatus 700 deployed in a device under test according to an embodiment of the present application includes:

An obtaining module 710, configured to obtain function configuration information of the device to be tested and the application program; the function configuration information is used for describing the function authority of the device to be tested for at least one function of the application program.

A generating module 720, configured to generate test configuration information matched with each function based on the function configuration information.

And the sending module 730 is configured to send the test configuration information to a test device connected to the device to be tested, so that the test device generates a functional test item based on the test configuration information, and performs a functional test on the device to be tested based on the functional test item, thereby obtaining a test result.

In one embodiment, the generating module is further configured to read = function configuration information to obtain a function authority of the device to be tested for each function of the application program; determining data bits of each function in test configuration information expressed in a byte form; and updating the value of each data bit to an actual value corresponding to each function authority to obtain test configuration information.

In one embodiment, the obtaining module is further configured to determine a function identifier corresponding to each function of the application; determining the function authority of the equipment to be tested for each function aiming at any equipment to be tested running an application program; and determining the actual value of each function identifier based on each function authority to obtain the function configuration information of the equipment to be tested and the application program.

In one embodiment, the sending module is further configured to generate a handshake instruction carrying the test configuration information;

And sending the handshake instruction to the test equipment to establish communication connection between the equipment to be tested and the test equipment, and indicating the test equipment to acquire test configuration information from the handshake instruction.

The embodiment of the application also provides a testing device which is realized based on NAND FLASH memories and is used for executing the steps in the embodiment of the testing method. The test device may be a virtual device deployed in the test apparatus, executed by a processor of the test apparatus, or may be the test apparatus itself.

As shown in fig. 8, a test apparatus 800 deployed in a test device according to an embodiment of the present application includes:

A receiving module 810, configured to receive test configuration information that is matched with a device to be tested connected to the test device for each function of the application program; the test configuration information is generated based on function configuration information of the equipment to be tested and the application program; the function configuration information is used for describing the function authority of the device to be tested for at least one function of the application program.

And the test module 820 is used for generating a functional test item based on the test configuration information, and performing functional test on the device to be tested based on the functional test item to obtain a test result.

In one embodiment, the test module is further configured to perform a binary conversion on the test configuration information in the first binary representation to obtain test configuration information in the second binary representation; determining data bits associated with each function of the device to be tested aiming at the application program in test configuration information which adopts a second binary representation; based on the values of the data bits, functional test items of the device under test for the application program to be tested are determined.

In one embodiment, the test module is further configured to determine a test order of the functional test items; based on the test sequence, each function supported in the device to be tested is tested, and a test result is obtained.

In one embodiment, the test module is further configured to update test options for the device under test displayed in the test interface of the test device based on the functional test items; and sending a test notification message to the device to be tested, wherein the test notification message is used for notifying the device to be tested to start testing the functions corresponding to the function test items.

In application, each module in the testing device can be a software program module, can be realized by different logic circuits integrated in the processor, and can also be realized by a plurality of distributed processors.

Fig. 9 is a schematic structural diagram of an electronic device according to an embodiment of the present application. The electronic device may be the device under test or the test device in fig. 1, and as shown in fig. 9, the electronic device 90 of this embodiment includes: at least one processor 91 (only one is shown in fig. 9), a memory 92 and a computer program 93 stored in the memory 92 and executable on the at least one processor 91, the processor 91 implementing the steps in any of the various test method embodiments described above when executing the computer program 93.

The electronic device may be a computing device such as a desktop computer, a notebook computer, a palm computer, a cloud server, etc. when the electronic device is used as the test device. The electronic device may be a chip, a motherboard, etc. when the electronic device is used as the device to be tested, and the electronic device may include, but is not limited to, a processor 91 and a memory 92. It will be appreciated by those skilled in the art that fig. 9 is merely an example of an electronic device 90 and is not intended to limit the electronic device 90, and may include more or fewer components than shown, or may combine certain components, or may include different components, such as input-output devices, network access devices, etc.

The Processor 91 may be a central processing unit (Central Processing Unit, CPU), the Processor 91 may also be other general purpose processors, digital signal processors (DIGITAL SIGNAL processors, DSP), application SPECIFIC INTEGRATED Circuit (ASIC), field-Programmable gate array (Field-Programmable GATE ARRAY, FPGA) or other Programmable logic device, discrete gate or transistor logic device, discrete hardware components, etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.

The memory 92 may in some embodiments be an internal storage unit of the electronic device 90, such as a hard disk or a memory of the electronic device 90. The memory 92 may also be an external storage device of the electronic device 90 in other embodiments, such as a plug-in hard disk, a smart memory card (SMART MEDIA CARD, SMC), a Secure Digital (SD) card, a flash memory card (FLASH CARD) or the like, which are provided on the electronic device 90. Further, the memory 92 may also include both internal and external storage units of the electronic device 90. The memory 92 is used to store an operating system, application programs, boot loader (BootLoader), data, and other programs, such as program code for the computer program. The memory 92 may also be used to temporarily store data that has been output or is to be output.

It should be noted that, because the content of information interaction and execution process between the above devices/units is based on the same concept as the method embodiment of the present application, specific functions and technical effects thereof may be referred to in the method embodiment section, and will not be described herein.

It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of the functional units and modules is illustrated, and in practical application, the above-described functional distribution may be performed by different functional units and modules according to needs, i.e. the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-described functions. The functional units and modules in the embodiment may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit, where the integrated units may be implemented in a form of hardware or a form of a software functional unit. In addition, the specific names of the functional units and modules are only for distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working process of the units and modules in the above system may refer to the corresponding process in the foregoing method embodiment, which is not described herein again.

The embodiments of the present application also provide a storage medium, which may be a computer readable storage medium storing a computer program, which when executed by a processor implements steps for implementing the various method embodiments described above.

Embodiments of the present application provide a computer program product which, when run on a mobile terminal, causes the mobile terminal to perform steps that enable the implementation of the method embodiments described above.

The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the present application may implement all or part of the flow of the method of the above embodiments, and may be implemented by a computer program to instruct related hardware, where the computer program may be stored in a computer readable storage medium, and when the computer program is executed by a processor, the computer program may implement the steps of each of the method embodiments described above. Wherein the computer program comprises computer program code which may be in source code form, object code form, executable file or some intermediate form etc. The computer readable medium may include at least: any entity or device capable of carrying computer program code to an apparatus/terminal device, recording medium, computer Memory, read-Only Memory (ROM), random access Memory (Random Access Memory, RAM), electrical carrier signals, telecommunications signals, and software distribution media. Such as a U-disk, removable hard disk, magnetic or optical disk, etc.

In the foregoing embodiments, the descriptions of the embodiments are emphasized, and in part, not described or illustrated in any particular embodiment, reference is made to the related descriptions of other embodiments.

Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.

In the embodiments provided in the present application, it should be understood that the disclosed apparatus/electronic device and method may be implemented in other manners. For example, the apparatus/electronic device embodiments described above are merely illustrative, e.g., the division of the modules or units is merely a logical function division, and there may be additional divisions in actual implementation, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection via interfaces, devices or units, which may be in electrical, mechanical or other forms.

The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

The above embodiments are only for illustrating the technical solution of the present application, and not for limiting the same; although the application has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.

Claims

1. A method of testing applied to a device under test, the method comprising:

2. The test method of claim 1, wherein generating test configuration information that matches each of the functions based on the function configuration information comprises:

3. The test method of claim 1, wherein the method further comprises:

Determining function identifiers corresponding to functions of the application program;

4. The test method of claim 1, wherein the sending the test configuration information to a test device connected to the device under test comprises:

Generating a handshake instruction carrying the test configuration information;

5. A method of testing, for use with a test apparatus, the method comprising:

6. The test method of claim 5, wherein the test configuration information is represented in a first binary representation, and wherein generating the functional test item based on the test configuration information comprises:

7. The method according to claim 5, wherein the performing the function test on the device under test based on the function test item to obtain a test result includes:

determining the test sequence of each functional test item;

8. The test method of claim 5, wherein after generating functional test items based on the test configuration information, the method further comprises:

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor;

When the electronic device is a device to be tested, the processor when executing the computer program performs the steps of the method according to any one of claims 1 to 4;

when the electronic device is a test device, the processor, when executing the computer program, performs the steps of the method according to any one of claims 5 to 8.

10. A storage medium being a computer readable storage medium storing a computer program, characterized in that the computer program when executed by a processor realizes the steps of the method according to any one of claims 1 to 8.