CN118011272A - Leakage current detection method and system for universal meter chip pins - Google Patents
Leakage current detection method and system for universal meter chip pins Download PDFInfo
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- 238000001514 detection method Methods 0.000 title claims abstract description 32
- 238000005070 sampling Methods 0.000 claims abstract description 88
- 238000005259 measurement Methods 0.000 claims abstract description 52
- 238000000034 method Methods 0.000 claims description 9
- 238000012545 processing Methods 0.000 claims description 6
- 238000004806 packaging method and process Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 4
- 230000000694 effects Effects 0.000 description 3
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- 238000012360 testing method Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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- General Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention provides a leakage current detection method and a leakage current detection system for pins of a universal meter chip, wherein an internal chip sampling resistor is additionally arranged in the manufacturing process of the universal meter chip, and an acquisition end of an ADC (analog to digital converter) arranged in the universal meter chip is connected to the internal chip sampling resistor; when leakage current is detected, the voltage on the sampling resistor inside the chip is directly collected by the ADC arranged in the universal meter chip through the short circuit of the external signal input end, the value of the leakage current of the pin of the chip measurement can be directly calculated according to the size of the collected voltage, the measurement is quick, convenient and accurate, and an external circuit is not required to be built and the measurement is carried out by using an instrument.
Description
Technical Field
The invention relates to the technical field of leakage current detection, in particular to a leakage current detection method and system for pins of a universal meter chip.
Background
The existence of a reverse diode can be equivalently arranged between the power supply and the ground of the pin pair of the chip, and the ground of the pin pair of the chip is open-circuited under ideal conditions, but in the actual situation, the pins are in a high-resistance state, and a tiny current flows when a voltage is applied, and the current is called leakage current. Any diode will have a reverse leakage current that varies from 1pA to 1nA depending on the process conditions and the diode area size.
In recent years, with the development of integrated circuits, the requirements on the reliability of the carrier-chip are higher and higher, especially the requirements on the ESD (Electro-STATIC DISCHARGE, electrostatic discharge) performance are also continuously improved, and in order to improve the ESD performance, ESD MASK (MASK protection) is specially added to the pins of the chip, so that the turn-on voltage of the reverse diode between the pins and the ground can be reduced, the ESD performance of the pins is improved, and meanwhile, the leakage current of the pins is also increased.
The increase of the leakage current of the chip pins can generate a plurality of adverse effects, and particularly the problem that DCV (direct current voltage) short circuit cannot return to zero and the like can be caused when the universal meter chip is applied. The leakage current of the pins of the chip on the market can be measured by a plurality of external auxiliary circuits and high-precision instruments, so that the operation is complex, the efficiency is low, and the leakage current measurement is inaccurate possibly due to the influence of the auxiliary circuits.
Disclosure of Invention
In order to solve the problems that the existing multimeter chip leakage current detection needs to use a plurality of external auxiliary circuits and high-precision instruments to have complicated operation, inaccurate measurement and the like, the invention provides a novel leakage current detection method for the multimeter chip pins. The invention also relates to a leakage current detection system of the universal meter chip pin.
The technical scheme of the invention is as follows:
A leakage current detection method of a universal meter chip pin is used for detecting leakage current generated by an equivalent reverse diode between a measurement pin of the universal meter chip and the ground, and is characterized in that a chip internal sampling resistor is additionally arranged between the measurement pin and a COM end when the universal meter chip is manufactured, an acquisition end of an ADC (analog to digital converter) arranged in the universal meter chip is connected to the chip internal sampling resistor, and then the universal meter chip is packaged;
And then connecting an external signal input end to the measurement pin through an input resistor connected in series, shorting the external signal input end and the COM end, directly collecting the voltage on the chip internal sampling resistor by an ADC (analog-to-digital converter) built in the universal meter chip, calculating the value of the leakage current of the measurement pin of the universal meter chip according to the collected voltage on the chip internal sampling resistor, comparing the value with a preset leakage current threshold, and judging as a bad chip with large leakage current when the calculated value of the leakage current of the measurement pin of the universal meter chip is larger than the leakage current threshold, and removing the bad chip.
Preferably, the measuring pin of the universal meter chip adopts an A1 pin, and an equivalent reverse diode is arranged between the A1 pin and the power supply and between the A1 pin and the ground.
Preferably, the built-in ADC of the multimeter chip calculates the voltage on the internal sampling resistor of the chip according to the reference voltage, the measuring range and the ADC code value.
Preferably, the built-in ADC of the universal meter chip is a 24-bit ADC or a 20-bit ADC.
Preferably, when the multimeter chip is manufactured, a chip internal sampling resistor with the resistance value ranging from 10KΩ to 10MΩ is additionally arranged between the measuring pin and the COM end; the resistance value of the input resistor connected in series with the external signal input end is larger than that of the sampling resistor in the chip.
Preferably, when the multimeter chip is manufactured, the chip internal sampling resistor additionally arranged between the measuring pin and the COM end is a combined structure which is formed by a plurality of electronic switches and a plurality of additional resistors in series-parallel connection and is selected by a plurality of resistance values, and the additional resistors are combined by controlling the opening and closing of the electronic switches so as to be selected by a plurality of resistance values, so that leakage currents with different sizes are measured; the voltage dividing ratio of the input resistor connected with the external signal input end in series and the sampling resistor in the chip is configured according to actual requirements.
Preferably, the chip internal sampling resistor additionally arranged between the measuring pin and the COM end comprises a first additional resistor, a second additional resistor and a third additional resistor which are sequentially connected in series; the measuring pin is connected to the first additional resistor through the first electronic switch, connected between the first additional resistor and the second additional resistor through the second electronic switch, and connected between the second additional resistor and the third additional resistor through the third electronic switch.
A leakage current detection system of a universal meter chip pin is used for detecting leakage current generated by an equivalent reverse diode between a measurement pin of the universal meter chip and the ground, and is characterized by comprising a chip internal sampling resistor adding module, an external signal input end short circuit module, a universal meter chip built-in ADC voltage acquisition module and a leakage current calculation processing module which are connected in sequence,
The chip internal sampling resistor adding module is used for adding a chip internal sampling resistor between the measuring pin and the COM end when the multimeter chip is manufactured, connecting the acquisition end of the ADC arranged in the multimeter chip to the chip internal sampling resistor, and packaging the multimeter chip; the external signal input end short circuit module is used for connecting an external signal input end to the measurement pin through an input resistor connected in series and then short-circuiting the external signal input end and the COM end; then the built-in ADC voltage acquisition module of the multimeter chip directly acquires the voltage on the sampling resistor in the chip; and the leakage current calculation processing module calculates the value of the leakage current of the measuring pin of the universal meter chip according to the voltage on the sampling resistor in the chip, compares the value with a preset leakage current threshold value, and judges and eliminates the bad chip with large leakage current when the calculated value of the leakage current of the measuring pin of the universal meter chip is larger than the leakage current threshold value.
Preferably, the built-in ADC voltage acquisition module of the multimeter chip calculates and obtains the voltage on the internal sampling resistor of the chip according to the reference voltage, the measurement range and the ADC code value of the multimeter chip;
And/or the resistance range of the chip internal sampling resistor added between the measuring pin and the COM end by the chip internal sampling resistor adding module is 10KΩ -10 MΩ; and the resistance value of the input resistor connected in series by the short circuit modules at the external signal input end is larger than that of the sampling resistor in the chip.
Preferably, the chip internal sampling resistor adding module is a combined structure which comprises a plurality of electronic switches and a plurality of adding resistors which are connected in series and parallel and are selected by a plurality of resistance values, and each adding resistor is combined by controlling the opening and closing of each electronic switch so as to be selected by a plurality of resistance values;
and the voltage division ratio of the input resistor connected in series by the external signal input end short circuit module and the sampling resistor in the chip is configured according to actual requirements.
The beneficial effects of the invention are as follows:
According to the leakage current detection method for the pins of the universal meter chip, when the universal meter chip is manufactured, the chip internal sampling resistor is additionally arranged between the measurement pins and the COM end, the acquisition end of the ADC arranged in the universal meter chip is connected to the chip internal sampling resistor, the universal meter chip is packaged after the manufacturing of the universal meter chip is completed, and then the leakage current detection is performed, so that the internal structure of the universal meter chip is changed, the chip internal sampling resistor is additionally arranged, and the connection relation and the function of the ADC arranged in the universal meter chip are adjusted. When the leakage current is detected, the voltage on the sampling resistor inside the chip is directly acquired through the short circuit of the external signal input end, the value of the leakage current of the chip measurement pin can be directly calculated according to the acquired voltage, and compared with the preset leakage current threshold value, when the calculated value of the leakage current of the measurement pin of the multimeter chip is larger than the leakage current threshold value, the bad chip with large leakage current is judged and directly removed, an external auxiliary circuit is not required to be built and an instrument is not required to be used for leakage current measurement, the problems of complex operation, low efficiency, inaccurate leakage current measurement caused by the influence of the auxiliary circuit and the like in the prior art are avoided, the measurement is quick, convenient and accurate, the leakage current detection efficiency is improved, the adverse effect caused by the increase of the leakage current of the chip pin is eliminated, the problem that DCV short circuit cannot return to zero when the multimeter chip is applied is avoided, and the reliability of the multimeter chip is improved.
The invention also relates to a leakage current detection system of the multimeter chip pin, which corresponds to the leakage current detection method of the multimeter chip pin, and can be understood as a system for realizing the leakage current detection method of the multimeter chip pin.
Drawings
FIG. 1 is a flow chart of a method for detecting leakage current of a multimeter chip pin according to the present invention.
FIG. 2 is a circuit diagram of a first multimeter chip of the present invention for detecting leakage current from a multimeter chip pin.
FIG. 3 is a circuit diagram of a second multimeter chip of the present invention for detecting leakage current from a multimeter chip pin.
Detailed Description
The present invention will be described below with reference to the accompanying drawings.
The invention relates to a leakage current detection method of a universal meter chip pin, which is used for detecting leakage current generated by an equivalent reverse diode between a measurement pin of the universal meter chip and the ground, and a flow chart of the method is shown in figure 1. The step changes the internal structure of the universal meter chip, adds the connection relation and the function of the sampling resistor in the chip and adjusts the ADC in the universal meter chip, so to speak, the ADC in the universal meter chip adds the function of directly collecting the voltage on the added sampling resistor in the chip on the basis of the original function.
When leakage current is detected, an external signal input end is connected to the measurement pin through an input resistor connected in series, then the external signal input end is in short circuit with a COM end, an ADC (analog-to-digital converter) built in a universal meter chip directly collects voltage on an internal sampling resistor of the chip, the value of the leakage current of the measurement pin of the universal meter chip is calculated according to the collected voltage on the internal sampling resistor of the chip, the value is compared with a preset leakage current threshold, and when the calculated value of the leakage current of the measurement pin of the universal meter chip is larger than the leakage current threshold, a bad chip with large leakage current is judged and removed. According to the leakage current detection method for the universal meter chip pin, an external auxiliary circuit is not required to be built and an instrument is not required to be used for leakage current measurement, so that the measurement is quick, convenient and accurate, and the leakage current detection efficiency is improved.
Example 1
The structure of the multimeter chip is improved during the manufacture, and in particular, as shown in fig. 2, the multimeter chip is divided into four parts as shown by a dashed box: external signal input, chip port pin selection, chip internal sampling resistor and chip internal ADC acquisition, wherein the external signal input is of a chip external structure, and the other three dotted frames are of a chip internal structure. When the chip port pin is selected, the analog pins of the universal meter chip are A0-A7, the voltage measurement of the universal meter chip is commonly used A1, so the A1 pin is used for example, and is also called a measurement pin A1 or a chip pin A1, and an equivalent reverse diode D1 exists between the chip pin A1 and a power supply VDD. An equivalent reverse diode D2 exists between the chip pin A1 and the ground GND, i.e. a leakage current I1 is generated. A chip internal sampling resistor R2 is additionally arranged between the measuring pin A1 and the COM end, the resistance range can be 10KΩ -10 MΩ, and the embodiment is preferably 1.1MΩ; and two acquisition ends (V1, V2) of the ADC arranged in the multimeter chip are connected to the chip internal sampling resistor R2, and the multimeter chip is packaged after the multimeter chip is manufactured.
During leakage current detection, an external signal input end Vin is connected to a measurement pin A1 through an input resistor R1 connected in series, the resistance value of the input resistor R1 is larger than that of an internal sampling resistor R2 of the chip, the embodiment is preferably that R1 is 10MΩ, then the external signal input end Vin and a COM end are in short circuit, and an ADC (analog to digital converter) built in a universal meter chip directly collects the voltage on the internal sampling resistor R2 of the chip. Ideally, the 10M input resistor R1 and the 1.1M resistor of the chip internal sampling resistor R2 are shorted at both ends Vin and COM, the current flowing is 0, and the adc can test a voltage of 0 mV. However, due to the existence of the equivalent reverse diode D2 between the chip pin A1 and ground, a leakage current I1 is generated, and the voltage tested by the ADC is I1 x 1.1M. If I1 is 100pA, the ADC tests a voltage of 0.1mV. Since the LCD shows an external voltage when the multimeter is applied, it will be 0.1mV times (10+1.1)/1.1 when calculated, i.e. approximately times 10, at which time the LCD will show 1mV (the common multimeter minimum measured voltage is 1 mV), resulting in no return to zero for the DCV short. Similarly, if I1 is 200pA, the LCD will display 2mV at this time, and the short circuit in DCV will not return to zero.
For another example, when 100mV is input to the external signal input terminal Vin for voltage calibration, the voltage across the chip internal sampling resistor R2 (1.1 MΩ) is about 10mV. If there is already an error of 0.1mV on 1.1M, corresponding to 1% of its actual voltage, due to the effect of the leakage current I1, the error of 1% is obviously unacceptable at voltage calibration (multimeter voltage measurement accuracy less than 0.5%).
The invention directly collects the voltage on the added chip internal sampling resistor R2 through the built-in ADC of the multimeter chip, and the ADC calculates the voltage on the chip internal sampling resistor according to the self reference voltage, the measuring range and the ADC code value. Preferably, the built-in ADC of the multimeter chip is a 24-bit ADC or a 20-bit ADC.
For example, a high-precision 24-bit ADC is built in the multimeter chip, the reference voltage is AVDDR, the measurement leakage current does not need to be gained, namely gain=1, the code value of the measurement result of the ADC can be read to ADC [23:0] (the code value of the ADC) through a register of the chip, so that the voltage V R2 (24-bit ADC measurement voltage formula: vin=adc code value, reference voltage/Gain, 2, (24-1), and 2 23 because the measurement range has positive and negative values) on the chip internal sampling resistor R2 can be calculated.
The program in the universal meter chip can directly calculate the value of the leakage current I1 of the chip pin A1 according to the voltage V R2 at two ends of the sampling resistor R2 in the chip:
And comparing the calculated value of the leakage current of the measuring pin of the universal meter chip with a leakage current threshold preset by a program in the universal meter chip, and judging as a bad chip with large leakage current and rejecting the bad chip when the calculated value of the leakage current of the measuring pin of the universal meter chip is larger than the leakage current threshold. After the value of I1 is obtained, bad chips with large leakage current can be directly removed according to the set leakage current threshold value (preferably, the leakage current threshold value is set to 100pA, and the assumption is that the leakage current threshold value is more than 100 pA). For example, if I1 is 200pA, the bad chip with large leakage current can be directly removed.
Example two
Furthermore, the chip internal sampling resistor additionally arranged between the measuring pin and the COM end is preferably a combined structure which is formed by a plurality of electronic switches and a plurality of additional resistors in series-parallel connection and is selected by a plurality of resistance values, and the additional resistors are combined by controlling the opening and closing of each electronic switch through a program in the multimeter chip to be selected by a plurality of resistance values, so that leakage currents with different sizes can be measured; the voltage dividing ratio of the input resistor connected with the external signal input end in series and the sampling resistor in the chip is configured according to actual requirements.
Specifically, as shown in fig. 3, the third dotted line box shows the selection of the chip internal sampling resistor, and the chip internal sampling resistor RES added between the measurement pin A1 and the COM terminal includes a first adding resistor R2 (preferably 1mΩ), a second adding resistor R3 (preferably 100kΩ), and a third adding resistor R4 (preferably 10kΩ) connected in series in order; the measuring pin A1 is connected to the first additional resistor R2 through the first electronic switch K1, is connected between the first additional resistor R2 and the second additional resistor R3 through the second electronic switch K2, and is connected between the second additional resistor R3 and the third additional resistor R4 through the third electronic switch K3. And at the moment, four acquisition ends (V1, V2, V3 and V4) of the ADC (analog to digital converter) arranged in the multimeter chip are connected to two ends of the sampling resistor in the chip and nodes between the series additional resistors.
The chip internal sampling Resistor (RES) of the chip leakage current detection method can be selected in various ways. Res=r2+r3+r4 can be chosen, where K1 is off, K2 and K3 are on; res=r3+r4 can also be chosen, where K2 is off, K1 and K3 are on; or res=r4, where K3 is off, and K1 and K2 are on. Different chip internal sampling resistance RES selection can measure I1 leakage current with different magnitudes. The calculation process is described with reference to embodiment one. The value of the leakage current I1 of the chip pin A1 can be directly calculated after the voltages at two ends of the sampling resistors in the chips with different resistance values are collected, and bad chips with large leakage current can be directly removed according to the set threshold value (supposedly more than 100 pA) after the value of the I1 is obtained.
The invention also relates to a leakage current detection system of the universal meter chip pin, which corresponds to the leakage current detection method of the universal meter chip pin, can be understood as a system for realizing the leakage current detection method of the universal meter chip pin, is used for detecting the leakage current generated by the equivalent reverse diode between the measurement pin of the universal meter chip and the ground, and comprises a chip internal sampling resistor adding module, an external signal input end short circuit module, a universal meter chip internal ADC voltage acquisition module and a leakage current calculation processing module which are connected in sequence.
The chip internal sampling resistor adding module is used for adding a chip internal sampling resistor between the measuring pin and the COM end when the multimeter chip is manufactured, as shown in FIG. 2, connecting the acquisition end of the ADC built in the multimeter chip to the chip internal sampling resistor, and packaging the multimeter chip; the external signal input end short circuit module is used for connecting an external signal input end to the measurement pin through an input resistor connected in series and then short-circuiting the external signal input end and the COM end; then the built-in ADC voltage acquisition module of the multimeter chip directly acquires the voltage on the sampling resistor in the chip; and the leakage current calculation processing module calculates the value of the leakage current of the measuring pin of the universal meter chip according to the voltage on the sampling resistor in the chip, compares the value with a preset leakage current threshold value, and judges and eliminates the bad chip with large leakage current when the calculated value of the leakage current of the measuring pin of the universal meter chip is larger than the leakage current threshold value.
Further, the built-in ADC voltage acquisition module of the multimeter chip is used for calculating the voltage on the internal sampling resistor of the chip according to the reference voltage, the measurement range and the ADC code value of the multimeter chip;
And/or the resistance range of the chip internal sampling resistor added between the measuring pin and the COM end by the chip internal sampling resistor adding module is 10KΩ -10 MΩ; and the resistance value of the input resistor connected in series by the short circuit modules at the external signal input end is larger than that of the sampling resistor in the chip.
Further, the chip internal sampling resistor adding module is a combined structure which comprises a plurality of electronic switches and a plurality of adding resistors connected in series and parallel and is selected by various resistance values, as shown in fig. 3, the combined structure is preferred, and each adding resistor is combined by controlling the opening and closing of each electronic switch so as to be selected by various resistance values; and the voltage division ratio of the input resistor connected in series by the external signal input end short circuit module and the sampling resistor in the chip is configured according to actual requirements.
According to the leakage current detection system of the universal meter chip pin, all the modules work cooperatively, the chip internal sampling resistor is additionally arranged during manufacturing of the universal meter chip, the chip internal ADC directly collects the voltage on the chip internal sampling resistor through the short circuit of the external signal input end during leakage current detection, the value of the chip measurement pin leakage current can be directly calculated according to the collected voltage, and the leakage current measurement is fast, convenient and accurate, and the leakage current measurement is carried out without using a plurality of external auxiliary circuits and using instruments.
It should be noted that the above-described embodiments will enable those skilled in the art to more fully understand the invention, but do not limit it in any way. Therefore, although the present invention has been described in detail with reference to the drawings and examples, it will be understood by those skilled in the art that the present invention may be modified or equivalent, and in all cases, all technical solutions and modifications which do not depart from the spirit and scope of the present invention are intended to be included in the scope of the present invention.
Claims (10)
1. A leakage current detection method of a universal meter chip pin is used for detecting leakage current generated by an equivalent reverse diode between a measurement pin of the universal meter chip and the ground, and is characterized in that a chip internal sampling resistor is additionally arranged between the measurement pin and a COM end when the universal meter chip is manufactured, an acquisition end of an ADC (analog to digital converter) arranged in the universal meter chip is connected to the chip internal sampling resistor, and then the universal meter chip is packaged;
And then connecting an external signal input end to the measurement pin through an input resistor connected in series, shorting the external signal input end and the COM end, directly collecting the voltage on the chip internal sampling resistor by an ADC (analog-to-digital converter) built in the universal meter chip, calculating the value of the leakage current of the measurement pin of the universal meter chip according to the collected voltage on the chip internal sampling resistor, comparing the value with a preset leakage current threshold, and judging as a bad chip with large leakage current when the calculated value of the leakage current of the measurement pin of the universal meter chip is larger than the leakage current threshold, and removing the bad chip.
2. The method for detecting leakage current of a multimeter chip pin according to claim 1, wherein the multimeter chip has a measurement pin A1, and the A1 pin has an equivalent reverse diode between a power supply and a ground.
3. The method for detecting leakage current of a pin of a multimeter chip according to claim 1 or 2, wherein the built-in ADC of the multimeter chip calculates a voltage on the chip internal sampling resistor according to a reference voltage, a measurement range and an ADC code value of the built-in ADC.
4. The method for detecting leakage current of a multimeter chip pin according to claim 3, wherein the built-in ADC of the multimeter chip is a 24-bit ADC or a 20-bit ADC.
5. The leakage current detection method of a multimeter chip pin according to claim 3, wherein an internal chip sampling resistor with a resistance value ranging from 10kΩ to 10mΩ is added between the measurement pin and the COM terminal when the multimeter chip is manufactured; the resistance value of the input resistor connected in series with the external signal input end is larger than that of the sampling resistor in the chip.
6. The method for detecting leakage current of a multimeter chip pin according to claim 5, wherein when the multimeter chip is manufactured, an internal chip sampling resistor additionally arranged between the measuring pin and a COM end is a combined structure which is formed by connecting a plurality of electronic switches and a plurality of additional resistors in series and parallel and is selected by a plurality of resistance values, and the additional resistors are combined by controlling the opening and closing of the electronic switches so as to be selected by a plurality of resistance values, so that leakage currents with different sizes are measured; the voltage dividing ratio of the input resistor connected with the external signal input end in series and the sampling resistor in the chip is configured according to actual requirements.
7. The method for detecting leakage current of a multimeter chip pin according to claim 6, wherein the chip internal sampling resistor added between the measurement pin and the COM terminal comprises a first added resistor, a second added resistor and a third added resistor connected in series in sequence; the measuring pin is connected to the first additional resistor through the first electronic switch, connected between the first additional resistor and the second additional resistor through the second electronic switch, and connected between the second additional resistor and the third additional resistor through the third electronic switch.
8. A leakage current detection system of a universal meter chip pin is used for detecting leakage current generated by an equivalent reverse diode between a measurement pin of the universal meter chip and the ground, and is characterized by comprising a chip internal sampling resistor adding module, an external signal input end short circuit module, a universal meter chip built-in ADC voltage acquisition module and a leakage current calculation processing module which are connected in sequence,
The chip internal sampling resistor adding module is used for adding a chip internal sampling resistor between the measuring pin and the COM end when the multimeter chip is manufactured, connecting the acquisition end of the ADC arranged in the multimeter chip to the chip internal sampling resistor, and packaging the multimeter chip; the external signal input end short circuit module is used for connecting an external signal input end to the measurement pin through an input resistor connected in series and then short-circuiting the external signal input end and the COM end; then the built-in ADC voltage acquisition module of the multimeter chip directly acquires the voltage on the sampling resistor in the chip; and the leakage current calculation processing module calculates the value of the leakage current of the measuring pin of the universal meter chip according to the voltage on the sampling resistor in the chip, compares the value with a preset leakage current threshold value, and judges and eliminates the bad chip with large leakage current when the calculated value of the leakage current of the measuring pin of the universal meter chip is larger than the leakage current threshold value.
9. The leakage current detection system of the multimeter chip pin of claim 8, wherein the multimeter chip built-in ADC voltage acquisition module calculates the voltage on the chip internal sampling resistor according to the reference voltage, the measurement range and the ADC code value of the multimeter chip;
And/or the resistance range of the chip internal sampling resistor added between the measuring pin and the COM end by the chip internal sampling resistor adding module is 10KΩ -10 MΩ; and the resistance value of the input resistor connected in series by the short circuit modules at the external signal input end is larger than that of the sampling resistor in the chip.
10. The leakage current detection system of the multimeter chip pin of claim 8 or 9, wherein the chip internal sampling resistor adding module is a combined structure which comprises a plurality of electronic switches and a plurality of adding resistors connected in series and parallel and is selected by a plurality of resistance values, and each adding resistor is combined by controlling the opening and closing of each electronic switch to be selected by a plurality of resistance values;
and the voltage division ratio of the input resistor connected in series by the external signal input end short circuit module and the sampling resistor in the chip is configured according to actual requirements.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202410138005.4A CN118011272A (en) | 2024-01-31 | 2024-01-31 | Leakage current detection method and system for universal meter chip pins |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202410138005.4A CN118011272A (en) | 2024-01-31 | 2024-01-31 | Leakage current detection method and system for universal meter chip pins |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118795217A (en) * | 2024-09-14 | 2024-10-18 | 深圳市英美华科技有限公司 | Chip current detection circuit, data line and electronic equipment |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118795217A (en) * | 2024-09-14 | 2024-10-18 | 深圳市英美华科技有限公司 | Chip current detection circuit, data line and electronic equipment |
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