CN117929314A - Directional emissivity detection method - Google Patents
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
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Abstract
A directional emissivity detection method comprising the steps of: placing the object to be tested on the test port of the reflecting structure; the light emitted by the light source arranged inside the double-ellipsoidal reflecting structure irradiates the surface of the object to be measured; light reflected from the surface of the object after the incident light irradiation directly enters the detection pixels of the detector through primary reflection of the double-ellipsoid reflecting structure, so that the detection of emissivity is realized. According to the invention, the number of reflection times of light in the test process is reduced, so that the light emitted from the surface of the object to be tested enters the detection pixel of the detector after primary reflection, the energy loss of the light is reduced to the greatest extent, the energy collection efficiency of reflected radiation is improved, the signal to noise ratio of measurement is increased, and higher measurement repeatability is obtained.
Description
Technical Field
The invention belongs to the technical field of infrared testing, and particularly relates to a directional emissivity detection method.
Background
Emissivity is a dimensionless physical quantity that characterizes the ability of an object to radiate heat, and is not only related to the material surface temperature and composition, but is also largely affected by the environment, assembly, structure, surface roughness, and chemical state. The spectral emissivity characterizes the correlation between the emissivity of the object and the radiation wavelength, reflects the intensity of the radiation capability of the object in different spectral regions, and has important significance and application value in the fields of aerospace, aviation, national defense, scientific research, industrial and agricultural production and the like. The method for measuring the emissivity of the material mainly comprises a reflection method, an energy method, a calorimeter method and a multispectral method, wherein the traditional reflection method mostly adopts an integrating sphere to test a measured object, test light enters from an incident hole on the integrating sphere and irradiates the surface of the measured object placed at the test hole, the light emitted from the surface of the measured object is finally converged on a detector positioned on the inner wall of the integrating sphere through multiple reflections of the inner wall of the integrating sphere, and the detector converts the measured signal into a voltage value to be output so as to calculate the emissivity of the measured object. However, in the conventional testing process, the light reflected from the surface of the object to be tested after being irradiated is finally converged on the detecting element of the detector after being reflected for multiple times by the integrating sphere, and the energy of the light is inevitably lost in the process of multiple reflection although the inner wall of the integrating sphere is subjected to gold plating treatment, so that the detector cannot effectively detect the light, and the difficulty of the emissivity test of the object to be tested is increased.
Therefore, when using reflectance testing of objects, it is an important task to reduce the energy loss of light during the test.
Disclosure of Invention
The invention provides a directional emissivity detection method, which aims to overcome the defects in the prior art, and the method reduces the energy loss of light to the greatest extent and improves the detection efficiency by reducing the reflection times of light in the test process so that the light emitted from the surface of a detected object enters into a detection pixel of a detector after one-time reflection.
A directional emissivity detection method comprising the steps of:
s1, placing an object to be tested on a test port of a double-ellipsoid reflecting structure;
s2, irradiating light emitted by a light source arranged in the double-ellipsoidal reflecting structure onto the surface of the object to be detected;
S3, light reflected by the surface of the object after the incident light irradiation directly enters the detection pixel of the detector through primary reflection of the double-ellipsoid reflection structure so as to realize detection of emissivity.
Further, the double-ellipsoid reflecting structure comprises a front half part inner wall gold-plated hollow ellipsoid and a rear half part inner wall gold-plated hollow ellipsoid which are connected together; the front half part of the gold-plated ellipsoid and the rear half part of the inner wall gold-plated hollow ellipsoid are provided with a common focus, the center of the surface of the measured object is positioned at the common focus,
The detector A is arranged at the other focal point of the gold-plated hollow ellipsoid on the inner wall of the front half part, and the detection window is opposite to the detected object;
The detector B is arranged at the other focal point of the gold-plated hollow ellipsoid on the inner wall of the rear half part, and the detection window is opposite to the inner wall of the gold-plated hollow ellipsoid on the inner wall of the rear half part.
Further, after the incident light emitted by the light source in step S3 irradiates the surface of the object to be detected, the surface of the object to be detected generates reflected light, and most of the reflected light directly enters the detection pixel of the detector a after being reflected once by the inner wall ellipsoid of the first half of the gold-plated ellipsoid.
Further, after the incident light emitted by the light source in step S3 irradiates the surface of the object to be detected, the surface of the object to be detected generates reflected light, the light which cannot be reflected by the inner wall of the first half of the inner wall gold-plated hollow ellipsoid irradiates the inner wall of the second half of the inner wall gold-plated hollow ellipsoid, and the light is reflected once by the inner wall ellipsoid of the second half of the inner wall gold-plated hollow ellipsoid and enters the detection pixel of the detector B.
Further, the primary reflection satisfies the following relationship: the parameters of the second half of the gold-plated ellipsoid, the first half of the gold-plated ellipsoid 3, and the parameters of the two detectors have the following relationship:
Wherein a 2 is a long half shaft of the inner wall gold-plated hollow ellipsoid of the rear half part, a 1 is a long half shaft of the inner wall gold-plated hollow ellipsoid of the front half part, c 1 is a half of the distance between two focuses of the inner wall gold-plated hollow ellipsoid 3 of the front half part, beta a、βb is a half of the angle of view of the detector A and the detector B respectively, and L f is the distance between the detector A and the detector B.
Compared with the prior art, the invention has the beneficial effects that:
according to the invention, the number of times of reflection of emergent light on the surface of the measured object is reduced, so that the emergent light enters the detection pixel of the corresponding detector only through primary reflection on the inner wall, the problem of energy loss caused by multiple reflection in the traditional method is avoided, the energy collection efficiency of reflected radiation is improved, the signal to noise ratio of measurement is increased, and higher measurement repeatability is obtained.
The technical scheme of the invention is further described below with reference to the accompanying drawings and examples:
Drawings
FIG. 1 is a diagram showing the placement of a reflective structure and other components in combination with the detection method of the present invention;
FIG. 2 is a diagram showing a propagation path of reflected light on the surface of an object to be detected according to the detection method of the present invention;
FIG. 3 is a diagram showing the relationship between the elliptical arrangement of the front half inner wall gold-plated hollow ellipsoids and the rear half inner wall gold-plated hollow ellipsoids.
Wherein:
1. The light source, 2, the measured object, 3, first half inner wall gild hollow ellipsoid, 4, second half inner wall gild hollow ellipsoid, 5, detector A,6, detector B.
Detailed Description
Embodiments of the technical scheme of the present application will be described in detail below with reference to the accompanying drawings. Unless otherwise defined, technical or scientific terms used herein should be given the ordinary meaning as understood by one of ordinary skill in the art to which this application belongs.
A directional emissivity detection method comprising the steps of:
S1, placing a tested object 2 at a test port of a double-ellipsoid reflecting structure;
S2, irradiating light emitted by a light source 1 placed in the double-ellipsoid reflecting structure to the surface of the measured object 2;
S3, light reflected by the surface of the object 2 after the incident light irradiation directly enters the detection pixel of the detector 5 through primary reflection of the double-ellipsoid emission structure.
Fig. 2 shows a light propagation path diagram of a directional emissivity detection method, in which:
S1: as shown in fig. 1, the related double ellipsoidal reflective structure includes: the front half part inner wall gold-plated hollow ellipsoid 3 and the rear half part inner wall gold-plated hollow ellipsoid 4 are mainly composed of the following components: a light source 1, a measured object 2, a detector A5 and a detector B6; the above structures together constitute an emissivity detection structure.
Preferably, the light source 1 is an electrically modulated infrared radiation light source. The occupation of the structure inner space is reduced, and the blocking of the reflected light on the surface of the measured object is reduced.
Preferably, the incident light emitted by the light source 1 forms an angle of 0-85 degrees with the normal line of the object 2 to be measured.
Preferably, the field angles of view of detector A5 and detector B6 are each 10-180.
Preferably, the inner wall of the rear half of the gold-plated hollow ellipsoid body 4 is provided with an internal thread, the inner wall of the front half of the gold-plated hollow ellipsoid body 3 is provided with an external thread, the inner wall of the front half of the gold-plated hollow ellipsoid body 3 and the inner wall of the rear half of the gold-plated hollow ellipsoid body 4 are connected together through the internal and external threads,
The front half gold-plated ellipsoid 3 and the rear half gold-plated ellipsoid 4 have a common focal point where the test port is located, the center of the surface of the object 2 to be tested is located,
The detector A5 is arranged at the other focal point of the first half gold-plated ellipsoid 3, and the detection window is opposite to the measured object 2;
the detector B6 is arranged at the other focal point of the rear half gold-plated ellipsoid 4, and the detection window is opposite to the inner wall of the rear half gold-plated ellipsoid 4
The center of the surface of the object 2 to be measured is located at the common focal point of the front half gold-plated ellipsoid 3 and the rear half gold-plated ellipsoid 4.
Further, a detector A5 is arranged at the focus of the first half gold-plated ellipsoid 3, and a detection window is opposite to the measured object 2;
the detector B6 is arranged at the focus of the rear half gold-plated ellipsoid 4, and the detection window is opposite to the inner wall of the rear half gold-plated ellipsoid 4.
S2: incident light emitted by the light source 1 irradiates the surface of the object 2 to be measured;
S3: after the incident light emitted by the light source 1 irradiates the surface of the measured object 2, the surface of the measured object 2 generates reflected light, and most of the reflected light directly enters the detection pixel of the detector A5 after being reflected once by the inner wall ellipsoid of the first half gold-plated ellipsoid 3, so that the purpose of collecting and detecting is achieved only by once reflection.
The inner wall of the front half gold-plated ellipsoid 3 cannot collect all the light reflected by the surface of the measured object 2, the light which cannot be reflected by the front half gold-plated ellipsoid 3 irradiates the inner wall of the rear half gold-plated ellipsoid 4, and the light is reflected once by the inner wall ellipsoid of the rear half gold-plated ellipsoid 4 and enters the detection element of the detector B6. The purpose of collecting all the light reflected by the surface of the object 2 to be measured is achieved.
The primary reflection implementation satisfies the following relationship:
The design process of the relation between the long half shaft a 2 of the rear half gold-plated ellipsoid 4 and the long half shaft a 1 of the front half gold-plated ellipsoid 3 is as follows:
Setting: d is the intersection point of the straight line c 1 g and the small ellipse E1 where the front half gold-plated ellipsoid 3 is located, g is the intersection point of the straight line c 1 g and the large ellipse E2 where the rear half gold-plated ellipsoid 4 is located, fa 2 is the other focal point of the small ellipse E1 where the front half gold-plated ellipsoid 3 is located, fb 2 is the other focal point of the rear half gold-plated ellipsoid 4, and c 1 is the common focal point position of the front half gold-plated ellipsoid 3 and the rear half gold-plated ellipsoid 4;
The ellipses of the front half gold-plated ellipsoids 3 are:
Wherein e 1 is the eccentricity of the ellipse of the front half gold-plated ellipsoid 3, a 1 is the long half axis of the ellipse of the front half gold-plated ellipsoid 3, b 1 is the short half axis of the ellipse of the front half gold-plated ellipsoid 3, c 1 is half of the two focal distances of the ellipse of the front half gold-plated ellipsoid 3;
The diameter D a of the opening of the front half gold-plated ellipsoid 3 is as follows:
The equation for the straight line f a2 d is:
yfa2d＝tanβa(x+c1) (3)
From the nature of the ellipse, it is again possible to obtain:
|dfa2|+|dc1|＝2a1 (4)
the coordinates of the point d can be obtained by combining the formulas (3) and (4) as follows:
And combining the coordinates of the point d with the coordinates of the point c 1 to further obtain the equation of the straight line c 1 g as follows:
Meanwhile, the coordinates of the focal point f b2 of the second half gold-plated ellipsoid 4 are known as follows: (- (c 1+Lf), 0).
The equation for the straight line gf b2 can be expressed as:
ygfb2＝-tanβb(x+c1+Lf) (6)
the x and y coordinates of the g point are calculated by equations (5) and (6) as:
Likewise, the properties of ellipses are:
|gfb2|+|gc1|＝2a2
the relationship between a 2、a1、Lf can be found as:
From the relationship in the figure, the distance between the focuses of the large ellipse E2 where the second half gold-plated ellipsoid 4 is located is 2c 1+Lf, and then half of the distance between the two focuses of the large ellipse E2 c 2 is:
The minor half axis b 2 of the large ellipse E2 where the rear half gold-plated ellipsoid 4 is located is:
in the above, |gf b2 | represents the distance between points g and f b2, |gc 1 | represents the distance between points g and c 1, a 2 is the long half axis of the ellipse where the rear half gilded ellipsoid 4 is located, a 1 is the long half axis of the ellipse where the front half gilded ellipsoid 3 is located, c 1 is half the distance between the two foci of the ellipse where the front half gilded ellipsoid 3 is located, β a、βb is half the field angle of the detector A5 and the detector B6, respectively, and L f is the distance between the detector A5 and the detector B6.
Preferably, the inner wall of the front half gold-plated ellipsoid 3 is subjected to gold plating treatment, minimizing the energy loss of light at the inner wall. The major axis of the ellipse where it is located is 80mm, and the minor axis is 38mm.
Preferably, the inner wall of the rear half gold-plated ellipsoid 4 is subjected to gold plating treatment, so that the energy loss of light at the inner wall is reduced to the greatest extent, the major axis of the ellipse is 100mm, and the minor axis is 60mm.
The present invention has been described in terms of preferred embodiments, but is not limited to the invention, and any equivalent embodiments can be made by those skilled in the art without departing from the scope of the invention, as long as the equivalent embodiments are possible using the above-described structures and technical matters.
Claims (10)
1. A directional emissivity detection method is characterized in that: comprises the following steps:
s1, placing a tested object (2) at a test port of a double-ellipsoid reflecting structure;
S2, irradiating light emitted by a light source (1) placed in the double-ellipsoid reflecting structure to the surface of the object (2) to be measured;
S3, light reflected by the surface of the object (2) after the incident light irradiation directly enters the detection pixel of the detector through primary reflection of the double-ellipsoid reflecting structure so as to realize detection of emissivity.
2. The directional emissivity detection method of claim 1, wherein: the light source (1) is an electrically modulated infrared radiation light source.
3. A directional emissivity detection method according to claim 1 or 2, wherein: the double-ellipsoid reflecting structure comprises a front half part inner wall gold-plated hollow ellipsoid (3) and a rear half part inner wall gold-plated hollow ellipsoid (4) which are connected together; the front half part inner wall gold-plated hollow ellipsoid (3) and the rear half part inner wall gold-plated hollow ellipsoid (4) are provided with a common focus, the test port is positioned at the common focus, the center of the surface of the object (2) to be tested is positioned at the common focus,
The detector A (5) is arranged at the other focal point of the gold-plated hollow ellipsoid (3) on the inner wall of the front half part, and the detection window is opposite to the detected object (2);
the detector B (6) is arranged at the other focus of the gold-plated hollow ellipsoid (4) on the inner wall of the rear half part, and the detection window is opposite to the inner wall of the gold-plated ellipsoid (4) on the rear half part.
4. A directional emissivity detection method of claim 3 wherein: in the step S3, after the incident light emitted by the light source (1) irradiates the surface of the object (2) to be detected, the surface of the object (2) to be detected generates reflected light, and most of the reflected light directly enters the detection pixel of the detector A (5) after being reflected once by the inner wall ellipsoid of the first half inner wall gold-plated hollow ellipsoid (3).
5. A directional emissivity detection method of claim 3 or 4, wherein: in the step S3, after the incident light emitted by the light source (1) irradiates the surface of the object (2) to be detected, the surface of the object (2) to be detected generates reflected light, the light which cannot be reflected by the inner wall gold-plated hollow ellipsoid (3) of the front half part irradiates the inner wall of the inner wall gold-plated hollow ellipsoid (4) of the rear half part, and the light enters the detection pixel of the detector B (6) through primary reflection of the inner wall ellipsoid of the inner wall gold-plated hollow ellipsoid (4) of the rear half part.
6. The method for directional emissivity detection of claim 5, wherein: the primary reflection satisfies the following relationship: the parameters of the inner wall of the rear half part of the gold-plated hollow ellipsoid (4), the parameters of the inner wall of the front half part of the gold-plated hollow ellipsoid (3) and the parameters of the two detectors have the following relationship:
Wherein a 2 is a long half shaft of the inner wall gold-plated hollow ellipsoid of the rear half part, a 1 is a long half shaft of the inner wall gold-plated hollow ellipsoid of the front half part, c 1 is a half of the distance between two focuses of the inner wall gold-plated hollow ellipsoid of the front half part, beta a、βb is a half of the angle of view of the detector A and the detector B respectively, and L f is the distance between the detector A and the detector B.
7. The directional emissivity detection method of claim 6, wherein: the half distance c 2 between the two focuses of the hollow ellipsoid (4) with the inner wall of the rear half part being gold-plated isWherein L f is the distance between the detector A and the detector B, and c 1 is half of the distance between two focuses of the gold-plated hollow ellipsoids on the inner wall of the first half;
the short half shaft b 2 of the gold-plated hollow ellipsoid on the inner wall of the rear half part is as follows:
8. A directional emissivity detection method according to claim 6 or 7, wherein: the design process of the relation between the long half shaft a 2 of the inner wall gold-plated hollow ellipsoid (4) of the rear half part and the long half shaft a 1 of the inner wall gold-plated hollow ellipsoid (3) of the front half part is as follows:
Setting: d is the intersection point of a straight line c 1 g and an ellipse where the front half of the gold-plated ellipsoid (3) is located, g is the intersection point of a straight line c 1 g and an ellipse where the rear half of the inner wall gold-plated hollow ellipsoid (4) is located, fa 2 is the other focal point of the front half of the gold-plated ellipsoid (3), and fb 2 is the other focal point of the rear half of the inner wall gold-plated hollow ellipsoid (4);
the first half of the gold-plated ellipsoid has:
wherein e 1 is the eccentricity of the front half inner wall gold-plated hollow ellipsoid, a 1 is the long half shaft of the front half inner wall gold-plated hollow ellipsoid, b 1 is the short half shaft of the front half inner wall gold-plated hollow ellipsoid, and c 1 is half of the two focal distances of the front half inner wall gold-plated hollow ellipsoid;
The diameter D a of the opening of the gold-plated hollow ellipsoid on the inner wall of the front half part is as follows:
The equation for the straight line f a2 d is:
yfa2d＝tanβa(x+c1)(3)
From the nature of the ellipse, it is again possible to obtain:
dfa2+dc1＝2a1(4)
the coordinates of the point d can be obtained by combining the formulas (3) and (4) as follows:
And combining the coordinates of the point d with the coordinates of the point c 1 to further obtain the equation of the straight line c 1 g as follows:
Meanwhile, the coordinates of the focal point f b2 of the gold-plated hollow ellipsoid 4 on the inner wall of the second half part are as follows: (- (c 1+Lf), 0).
The equation for the straight line gf b2 can be expressed as:
ygfb2＝-tanβb(x+c1+Lf)(6)
the x and y coordinates of the g point are calculated by equations (5) and (6) as:
Likewise, the properties of ellipses are:
gfb2+gc1＝2a2
the relationship between a 2、a1、Lf can be found as:
In the above description, a 2 is a long half shaft of the hollow ellipsoid with gold-plated inner wall of the rear half, a 1 is a long half shaft of the hollow ellipsoid with gold-plated inner wall of the front half, c 1 is a half of the distance between two focuses of the hollow ellipsoid with gold-plated inner wall of the front half, β a、βb is a half of the angle of view of the detector a and the detector B, respectively, and L f is the distance between the detector a and the detector B.
9. A directional emissivity detection method of claim 3 wherein: the included angle between the light emitted by the light source (1) and the normal line of the measured object (2) is 0-85 degrees.
10. A directional emissivity detection method of claim 3 wherein: the angle of view of the detector A (5) and the detector B (6) is 10-180 degrees.
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