CN117369062A - Multi-light source high-resolution optical imaging device and method based on optical switch - Google Patents
Multi-light source high-resolution optical imaging device and method based on optical switch Download PDFInfo
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- CN117369062A CN117369062A CN202311215194.2A CN202311215194A CN117369062A CN 117369062 A CN117369062 A CN 117369062A CN 202311215194 A CN202311215194 A CN 202311215194A CN 117369062 A CN117369062 A CN 117369062A
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- 238000012634 optical imaging Methods 0.000 title claims abstract description 20
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- 239000000523 sample Substances 0.000 claims description 33
- 238000001514 detection method Methods 0.000 claims description 30
- 238000003384 imaging method Methods 0.000 claims description 14
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- 238000003786 synthesis reaction Methods 0.000 claims description 2
- 238000012014 optical coherence tomography Methods 0.000 description 6
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4296—Coupling light guides with opto-electronic elements coupling with sources of high radiant energy, e.g. high power lasers, high temperature light sources
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/42—Coupling light guides with opto-electronic elements
- G02B6/4201—Packages, e.g. shape, construction, internal or external details
- G02B6/4204—Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
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Abstract
The invention provides a multi-light source high-resolution optical imaging device and a method based on an optical switch. The two interference signals are synthesized on software to expand the bandwidth range of the light source, so that the depth resolution of the system is improved, and the ultra-high-precision three-dimensional optical imaging with optical non-contact and no damage is realized.
Description
Technical Field
The invention belongs to the technical field of non-contact optical coherence imaging, and particularly relates to a multi-light-source high-resolution optical imaging device and method based on an optical switch.
Background
Optical coherence tomography (Optical Coherence Tomography, OCT) is an internal structure imaging technique that integrates the advantages of non-contact, atraumatic, micron-level high resolution, high-speed real-time imaging, etc. The internal structure imaging technique refers to a technique of penetrating the surface of an object, ascertaining the internal structure of the object, and performing image reconstruction and display. In the detection process, the medium carrier plays a role in penetrating the surface of the object and carrying structural information of the object. The depth resolution of an OCT system is associated with the center wavelength and bandwidth of the light source, the shorter the light source center wavelength, the wider the bandwidth the higher the depth resolution of the system. However, the bandwidth of superluminescent diodes is difficult to widen without limitation due to limitations of manufacturing technology, resulting in limited depth resolution of OCT systems.
Disclosure of Invention
In view of the above, the main object of the present invention is to provide a multi-light-source high-resolution optical imaging device and method based on an optical switch, which overcome the limitation of the light source bandwidth to the depth resolution of the OCT system, greatly improve the depth resolution of the system, and realize ultra-high precision three-dimensional imaging.
The technical scheme adopted for solving the technical problems is as follows:
an optical switch-based multi-light source high-resolution optical imaging device is characterized in that: the superradiation light emitting diode with two bandwidth ranges is connected with the optical fiber coupler by utilizing the optical switch, and the upper computer realizes interference signal measurement with two bandwidth ranges by controlling the state of the optical switch and the acquisition of the spectrometer at the same detection position of the detected target.
Further, the system comprises two super-radiation light emitting diodes with different bandwidth ranges, an optical switch, a 2X 2 single-mode optical fiber coupler, a reference arm, a detection arm bracket, a spectrometer and an upper computer for system control and data acquisition;
the two super-radiation light-emitting diodes radiate broadband light sources with different bandwidths into an optical switch; the optical switch is connected with a 2X 2 optical fiber coupler through a TTL signal control selection superradiation light emitting diode, and the 2X 2 optical fiber coupler divides incident broadband light into reference light and detection light according to the splitting ratio of the coupler; the reference light is collimated into parallel light by a collimating lens in the reference arm and focused to a reflecting mirror by a convex lens, and the reflecting mirror reflects the reference light in a primary way back to the optical fiber coupler; the detection light is collimated into parallel light by a collimating lens and focused to a detected target by a focusing objective lens, and different structural layers of the detected target reflect or back scatter the detection light back to the optical fiber coupler; the detection light reflected or back scattered from different structural layers of the detected target meets the reference light reflected from the reflecting mirror and forms interference at the optical fiber coupler; the interference signal enters the spectrometer, is collimated into parallel light by a collimating mirror in the spectrometer and irradiates into a transmission type grating, and the light beam is unfolded by the grating according to the wavelength, focused to a CMOS camera and transmitted to an upper computer through a GIGE communication protocol.
Further, the reference arm is a reference arm with adjustable length and is used for adjusting the optical path difference between the reference light and the detection light.
Further, the device also comprises an XY displacement table for controlling the movement of the tested sample so as to realize high-precision three-dimensional scanning.
Further, the optical switch is configured to receive a TTL trigger signal sent by the upper computer, and control on-off of the two light sources and the optical fiber coupler.
Further, the imaging method comprises the following steps:
step S1: the super-radiation light-emitting diodes with different bandwidths radiate a broadband light source to enter the optical switch, the upper computer sends TTL square wave signals to control the optical switch and a pulse signal to control the spectrometer, and the optical switch enables the super-radiation light-emitting diode and the optical fiber coupler to be communicated once respectively;
step S2: the communicated light source is divided into reference light and detection light after entering the optical fiber coupler, and the detection light forms a multi-frequency interference signal with the reference light by carrying layered structure information of a sample to be detected and enters the spectrometer;
step S3: the spectrometer starts to collect after receiving the pulse signals, and interference signals detected by the two super-radiation light-emitting diodes at a time are collected;
step S4: synthesizing the two collected interference signals, converting the two interference signals into a wave number domain, and carrying out Fourier transformation to obtain depth structure information of a sample;
step S5: and controlling the XY linear displacement platform to drive the tested sample to move to the next tested point, and circularly performing steps S1-S4 to complete three-dimensional information acquisition and imaging of the tested sample.
Further, in step S3, the multi-frequency interference signal acquired by the spectrometer when the first superluminescent diode is used as the detection source is as follows:
wherein, the 1 st item is a direct current item, the 2 nd item is an auto-coherent item, and the 3 rd item is an interference signal item, which modulates the internal structure information of the tested sample into the frequency of the interference signal; s is S r (lambda) is the spectral power distribution function of the reference light; s is S n (λ)、S m (lambda) is the detected spectral power distribution function of the back reflection or back scattering of the different sample layers; lambda is the wavelength of light; 2d n Indicating the optical path difference between the probe light reflected or back-scattered from the nth layer of the sample and the reference light; 2d nm Indicating the optical path difference of the probe light reflected or back-scattered from the nth and mth layers of the sample; re represents the real part of the complex domain interference signal.
The multi-frequency interference signals acquired by the spectrometer by taking the second super-radiation light-emitting diode as a detection source are as follows:
wherein lambda is 1 ＜λ 3 ＜λ 2 ＜λ 4 。
Further, in step S4, the multi-frequency interference signals of the formula (1) and the formula (2) are synthesized as follows:
wherein S is r 'lambda' is the spectral power distribution function of the synthesized reference light; s'. n (λ)、S' m (lambda) is the detected spectral power distribution function of the back reflection or back scattering of the different sample layers after synthesis.
Converting formula (3) into the wavenumber domain, specifically:
wherein k is the wavenumber and its relation to the wavelength is
Further, in step S4, the internal structure information of the sample to be measured can be obtained by performing fast fourier transform on the interference signal of formula (4), specifically:
where δ is the especially Rake function.
Compared with the prior art, the optical switch is used for connecting the superradiation light-emitting diode with two bandwidth ranges with the optical fiber coupler, and the upper computer realizes interference signal measurement with two bandwidth ranges by controlling the state of the optical switch and the acquisition of the spectrometer at the same detection position of the detected target. The two interference signals are synthesized on software to expand the bandwidth range of the light source, so that the depth resolution of the system is improved, and the ultra-high-precision three-dimensional optical imaging with optical non-contact and no damage is realized.
Drawings
The invention is described in further detail below with reference to the attached drawings and detailed description:
fig. 1 is a system structure diagram of an embodiment of the present invention, in which 1 and 2 are superradiance light emitting diodes in two bandwidth ranges, 3 is an optical switch, 4 is a 2×2 single-mode optical fiber coupler, 5 is a reference arm, 6 is a collimator lens, 7 is a focusing lens, 8 is a reflecting mirror, 9 is a detecting arm, 10 is a collimator lens, 11 is a focusing objective lens, 12 is a detecting arm frame, 13 is an XY displacement table, 14 is a sample to be measured (including a biological sample, a composite material, an optical element, etc.), 15 is an optical fiber collimator lens, 16 is a transmission type grating, 17 is a focusing lens, 18 is a CMOS camera, 19 is a spectrometer, and 20 is an upper computer.
Fig. 2 is a diagram of a spectrometer acquisition signal according to an embodiment of the present invention.
Fig. 3 is a signal processing process diagram according to an embodiment of the present invention.
Fig. 4 is a graph comparing imaging resolution of a single bandwidth light source system and the present system according to an embodiment of the present invention.
Detailed Description
In order to make the features and advantages of the present patent more comprehensible, embodiments accompanied with figures are described in detail below:
it should be noted that the following detailed description is illustrative and is intended to provide further explanation of the present application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments in accordance with the present application. As used herein, the singular is also intended to include the plural unless the context clearly indicates otherwise, and furthermore, it is to be understood that the terms "comprises" and/or "comprising" when used in this specification are taken to specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof.
As shown in fig. 1-4, the embodiment of the present invention provides a multi-light source high-resolution optical imaging device based on an optical switch, which provides a sample, including two types of superluminescent diodes 1 and 2 with bandwidth ranges, an optical switch 3, a single-mode optical fiber coupler 4, a reference arm 5, a collimator lens 6, a focusing lens 7, a reflecting mirror 8, a detecting arm 9, a collimator lens 10, a focusing objective lens 11, a detecting arm frame 12, an xy shift table 13, a sample 14 to be tested (including biological samples, composite materials, optical elements, etc.), an optical fiber collimator lens 15, a transmission grating 16, a focusing lens 17, a cmos camera 18, a spectrometer 19, and an upper computer 20.
Wherein, the two super-radiation LEDs 1 and 2 radiate broadband light sources with different bandwidths into the optical switch 3; the optical switch 3 is controlled by a TTL signal sent by the upper computer 20, then selects a super-radiation light-emitting diode to be connected with the optical fiber coupler 4, and the optical fiber coupler 4 divides incident broadband light into reference light and detection light according to the splitting ratio of the coupler; the reference light is collimated into parallel light by a collimating lens 6 in the reference arm 5 and focused by a convex lens 7 onto a reflecting mirror 8, and the reflecting mirror 8 reflects the reference light back into the optical fiber coupler 4; the detection light is collimated into parallel light by the collimating lens 10 and focused onto the detected target 14 (including biological sample, composite material, optical element, etc.) by the focusing objective lens 11, and the different structural layers of the detected target 14 reflect or back scatter the detection light back into the optical fiber coupler 4; the probe light reflected or backscattered from the different structural layers of the object 14 under test and the reference light reflected from the mirror meet and interfere at the fiber coupler 4; the interference signal enters the spectrometer 19, is collimated into parallel light by the optical fiber collimator 15 in the spectrometer 19, irradiates the parallel light into the transmission type grating 16, and is focused to the CMOS camera 18 after being unfolded according to the wavelength by the grating 16 and is transmitted to the upper computer 20 through the GIGE communication protocol.
In this example, the length of the reference arm 5 is adjustable for adjusting the optical path difference of the reference light and the probe light.
In this example, the XY displacement stage is used to control the movement of the object to be measured to realize high-precision three-dimensional scanning.
In this example, the optical switch is used for receiving the TTL trigger signal sent by the upper computer, and controlling the on-off of the two light sources and the optical fiber coupler.
Preferably, the device can be used for detecting biological samples, composite materials, optical elements and other samples.
Preferably, in this embodiment, there is also provided a multi-light source high-resolution optical imaging method based on an optical switch, including the steps of:
step S1: the super-radiation light-emitting diodes with different bandwidths radiate a broadband light source to enter the optical switch, the upper computer sends TTL square wave signals to control the optical switch and a pulse signal to control the spectrometer, and the optical switch enables the super-radiation light-emitting diode and the optical fiber coupler to be communicated once respectively;
step S2: the communicated light source is divided into reference light and detection light after entering the optical fiber coupler, and the detection light forms a multi-frequency interference signal with the reference light by carrying layered structure information of a sample to be detected and enters the spectrometer;
step S3: the spectrometer starts to collect after receiving the pulse signals, and interference signals detected by the primary super-radiation light-emitting diodes 1 and 2 are collected respectively;
step S4: synthesizing the two collected interference signals, converting the two interference signals into a wave number domain, and carrying out Fourier transformation to obtain depth structure information of the sample;
step S5: and controlling the XY linear displacement platform to drive the tested sample to move to the next tested point, and circularly performing steps S1-S4 to complete three-dimensional information acquisition and imaging of the tested sample.
The present invention is not limited to the above-mentioned preferred embodiments, and any person can obtain other various optical switch-based multi-light source high-resolution optical imaging devices and methods according to the teachings of the present invention, and all equivalent changes and modifications made according to the scope of the present invention should be covered by the present invention.
Claims (9)
1. An optical switch-based multi-light source high-resolution optical imaging device is characterized in that: the superradiation light emitting diode with two bandwidth ranges is connected with the optical fiber coupler by utilizing the optical switch, and the upper computer realizes interference signal measurement with two bandwidth ranges by controlling the state of the optical switch and the acquisition of the spectrometer at the same detection position of the detected target.
2. The optical switch-based multi-light source high resolution optical imaging apparatus of claim 1, wherein: the system comprises two super-radiation light emitting diodes with different bandwidth ranges, an optical switch, a 2X 2 single-mode optical fiber coupler, a reference arm, a detection arm bracket, a spectrometer and an upper computer for system control and data acquisition;
the two super-radiation light-emitting diodes radiate broadband light sources with different bandwidths into an optical switch; the optical switch is connected with a 2X 2 optical fiber coupler through a TTL signal control selection superradiation light emitting diode, and the 2X 2 optical fiber coupler divides incident broadband light into reference light and detection light according to the splitting ratio of the coupler; the reference light is collimated into parallel light by a collimating lens in the reference arm and focused to a reflecting mirror by a convex lens, and the reflecting mirror reflects the reference light in a primary way back to the optical fiber coupler; the detection light is collimated into parallel light by a collimating lens and focused to a detected target by a focusing objective lens, and different structural layers of the detected target reflect or back scatter the detection light back to the optical fiber coupler; the detection light reflected or back scattered from different structural layers of the detected target meets the reference light reflected from the reflecting mirror and forms interference at the optical fiber coupler; the interference signal enters the spectrometer, is collimated into parallel light by a collimating mirror in the spectrometer and irradiates into a transmission type grating, and the light beam is unfolded by the grating according to the wavelength, focused to a CMOS camera and transmitted to an upper computer through a GIGE communication protocol.
3. The optical switch-based multi-light source high resolution optical imaging apparatus of claim 2, wherein: the reference arm is a length-adjustable reference arm and is used for adjusting the optical path difference of the reference light and the detection light.
4. The optical switch-based multi-light source high resolution optical imaging apparatus of claim 2, wherein: the device also comprises an XY displacement table for controlling the movement of the tested sample so as to realize high-precision three-dimensional scanning.
5. The optical switch-based multi-light source high resolution optical imaging apparatus of claim 2, wherein: the optical switch is used for receiving TTL trigger signals sent by the upper computer and controlling the on-off of the two light sources and the optical fiber coupler.
6. The optical switch-based multi-light source high resolution optical imaging apparatus of claim 2, wherein:
the imaging method comprises the following steps:
step S1: the super-radiation light-emitting diodes with different bandwidths radiate a broadband light source to enter the optical switch, the upper computer sends TTL square wave signals to control the optical switch and a pulse signal to control the spectrometer, and the optical switch enables the super-radiation light-emitting diode and the optical fiber coupler to be communicated once respectively;
step S2: the communicated light source is divided into reference light and detection light after entering the optical fiber coupler, and the detection light forms a multi-frequency interference signal with the reference light by carrying layered structure information of a sample to be detected and enters the spectrometer;
step S3: the spectrometer starts to collect after receiving the pulse signals, and interference signals detected by the two super-radiation light-emitting diodes at a time are collected;
step S4: synthesizing the two collected interference signals, converting the two interference signals into a wave number domain, and carrying out Fourier transformation to obtain depth structure information of a sample;
step S5: and controlling the XY linear displacement platform to drive the tested sample to move to the next tested point, and circularly performing steps S1-S4 to complete three-dimensional information acquisition and imaging of the tested sample.
7. The imaging method of the optical switch-based multi-light source high resolution optical imaging apparatus according to claim 6, wherein:
in step S3, the multi-frequency interference signal acquired by the spectrometer when the first superluminescent diode is used as the detection source is as follows:
wherein, the 1 st item is a direct current item, the 2 nd item is an auto-coherent item, and the 3 rd item is an interference signal item, which modulates the internal structure information of the tested sample into the frequency of the interference signal; s is S r (lambda) is the spectral power distribution function of the reference light; s is S n (λ)、S m (lambda) is the detected spectral power distribution function of the back reflection or back scattering of the different sample layers; lambda is the wavelength of light; 2d n Indicating reflection or back-scattering from the nth layer of the sampleOptical path difference between the detection light and the reference light; 2d nm Indicating the optical path difference of the probe light reflected or back-scattered from the nth and mth layers of the sample; re represents the real part of the complex domain interference signal.
The multi-frequency interference signals acquired by the spectrometer by taking the second super-radiation light-emitting diode as a detection source are as follows:
wherein lambda is 1 ＜λ 3 ＜λ 2 ＜λ 4 。
8. The imaging method of the optical switch-based multi-light source high resolution optical imaging apparatus according to claim 6, wherein:
in step S4, the multi-frequency interference signals of the formula (1) and the formula (2) are synthesized as follows:
wherein S is r 'lambda' is the spectral power distribution function of the synthesized reference light; s'. n (λ)、S' m (lambda) is the detected spectral power distribution function of the back reflection or back scattering of the different sample layers after synthesis.
Converting formula (3) into the wavenumber domain, specifically:
wherein k is the wavenumber and its relation to the wavelength is
9. The imaging method of the optical switch-based multi-light source high resolution optical imaging apparatus according to claim 6, wherein:
in step S4, the interference signal of formula (4) is subjected to fast fourier transform to obtain internal structure information of the sample to be measured, specifically:
where δ is the especially Rake function.
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