CN117268723B - Target plate, measuring device and measuring method for multispectral optical axis consistency measurement - Google Patents
Target plate, measuring device and measuring method for multispectral optical axis consistency measurement Download PDFInfo
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- CN117268723B CN117268723B CN202311552376.9A CN202311552376A CN117268723B CN 117268723 B CN117268723 B CN 117268723B CN 202311552376 A CN202311552376 A CN 202311552376A CN 117268723 B CN117268723 B CN 117268723B
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- 230000003287 optical effect Effects 0.000 title claims abstract description 130
- 238000005259 measurement Methods 0.000 title claims abstract description 29
- 238000000034 method Methods 0.000 title abstract description 15
- 239000000758 substrate Substances 0.000 claims abstract description 26
- 238000003780 insertion Methods 0.000 claims description 25
- 230000037431 insertion Effects 0.000 claims description 25
- 238000007789 sealing Methods 0.000 claims description 24
- 238000005192 partition Methods 0.000 claims description 23
- 230000000007 visual effect Effects 0.000 claims description 5
- PXFBZOLANLWPMH-UHFFFAOYSA-N 16-Epiaffinine Natural products C1C(C2=CC=CC=C2N2)=C2C(=O)CC2C(=CC)CN(C)C1C2CO PXFBZOLANLWPMH-UHFFFAOYSA-N 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 3
- 238000007665 sagging Methods 0.000 claims description 3
- 230000009466 transformation Effects 0.000 claims description 3
- 238000001228 spectrum Methods 0.000 claims description 2
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 description 5
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
- 238000009412 basement excavation Methods 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000004297 night vision Effects 0.000 description 1
- 238000004062 sedimentation Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0221—Testing optical properties by determining the optical axis or position of lenses
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Abstract
The invention relates to the technical field of optical measurement and optical adjustment, in particular to a target plate for measuring the consistency of a multispectral optical axis, a measuring device and a measuring method, wherein the target plate for measuring the consistency of the multispectral optical axis comprises a substrate, a hollowed-out rectangle is arranged at the center of the substrate, scale lines are arranged on the periphery of the hollowed-out rectangle, reference scribing lines are also arranged on the substrate, and the center of the reference scribing lines is overlapped with the center point of the hollowed-out rectangle; the invention can simultaneously measure and rapidly judge any two optical axis offset among the white light optical axis, the infrared optical axis and the laser optical axis; meanwhile, a datum point is provided for high-precision measurement of the computer image, so that the optical axis deviation can be measured quickly and accurately; the invention has low cost, stability, reliability and quick measurement, and can realize the optical axis measurement of the multispectral sighting system.
Description
Technical Field
The invention relates to the technical field of optical measurement and optical adjustment, in particular to a target plate, a measuring device and a measuring method for measuring the consistency of multispectral optical axes.
Background
The optical axis of the multispectral observation system refers to the types of optical axes such as a white light optical axis (a visual observation optical axis, a white light camera observation optical axis or a low-light night vision observation optical axis), an infrared optical axis (an infrared camera observation optical axis), a laser optical axis (a laser range finder emission optical axis and a laser range finder receiving optical axis) and the like. Along with different design requirements, various multispectral observation system devices comprise 2-3 kinds of optical axes of a white light optical axis, an infrared optical axis and a laser optical axis.
The multispectral optical axis consistency index is one of the most important indexes of the multispectral viewing system, and is closely related to the using effect of the system, so that the measurement of the multispectral optical axis consistency index is always an important content of the adjustment of the multispectral viewing system.
Optical axis uniformity measurements typically employ a reflective collimator system. The traditional method is that firstly, a white light/infrared target plate is arranged at the focal plane position of a collimator system, and the optical axis offset of a white light optical axis and an infrared optical axis can be measured; then, the photographic paper target paper is placed, a vertical cross or a mark point is arranged on the stroke of the photographic paper target paper, the cross point is aimed by a white light optical axis, laser is emitted, and the optical axis offset of the laser optical axis and the white light optical axis can be roughly distinguished visually or the optical axis offset value can be carefully distinguished by a microscope.
The disadvantages are evident, mainly in the following ways:
1. measuring the consistency of several optical axes, and changing the target surface and even manually marking; and the posture of the detected multispectral observation and aiming system needs to be readjusted and accurately aimed every time the target surface is replaced. Thus, the measurement time is long and the efficiency is low;
2. the optical axis offset of the infrared optical axis and the laser optical axis cannot be directly measured, and the measurement efficiency and the measurement accuracy are low by transitional white light optical axis measurement, especially for a multispectral observation system without a white light optical axis;
3. the difference between the white light optical axis and the ranging optical axis is judged by manual visual observation, and the judgment precision is low because of no dividing scale; the tool microscope has long interpretation time and low efficiency;
therefore, the traditional various target plates cannot meet the rapid and accurate measurement requirement of the multispectral optical axis consistency index, and a reticle target scheme which is low in cost, convenient to use and rapid to measure is urgently needed, so that the spectrum optical axis consistency can be rapidly and accurately measured, and a certain foundation is laid for automatic and accurate interpretation of computer images.
Disclosure of Invention
In order to overcome the defects, the invention aims to provide equipment for preventing sedimentation based on excavation of a large-scale mechanical construction road section.
The invention provides the following technical scheme: the utility model provides a multispectral optical axis uniformity measurement is with target plate, includes the base plate, base plate center department is provided with the fretwork rectangle, the fretwork rectangle is provided with the scale line all around, still be provided with the benchmark marking off on the base plate, the center of benchmark marking off coincides with the central point of fretwork rectangle.
As a preferable technical scheme of the target plate for measuring the consistency of the multispectral optical axis, the reference scribing comprises cross partitions A1, B1, C1 and D1 and sagging short lines A2, B2, C2 and D2 of hollowed-out rectangular four sides.
As a preferable technical scheme of the target plate for measuring the multispectral optical axis consistency, horizontal lines of the cross partitions A1, B1, C1 and D1 are horizontal and parallel to the upper side and the lower side of the hollowed-out rectangle, the horizontal lines of the cross partitions A1 and C1, a middle vertical short line A2 of an AB side of the hollowed-out rectangle and a middle vertical short line C2 of a CD side of the hollowed-out rectangle are collinear.
As a preferable technical scheme of the target plate for measuring the multispectral optical axis consistency, vertical lines of the cross partitions A1, B1, C1 and D1 are vertical and parallel to the left side and the right side of the hollowed rectangle, and the vertical lines of the cross partitions B1 and D1, a middle vertical short line D2 of an AD side of the hollowed rectangle and a middle vertical short line B2 of a BC side of the hollowed rectangle are collinear.
The invention also discloses a measuring device based on the target plate for measuring the multispectral optical axis consistency, which further comprises a clamping device, wherein the clamping device comprises a bracket, a clamping bolt, a front sealing frame and a rear sealing frame, and the front sealing frame and the rear sealing frame are connected through stranded screws and are fixed on the bracket through the clamping bolt.
The preferable technical scheme of the measuring device further comprises a substrate insertion groove, wherein the substrate insertion groove comprises a first opening groove arranged on the front sealing frame and a second opening groove arranged on the rear sealing frame.
As a preferable technical scheme of the measuring device, a first laser observation card insertion groove is formed in the side face of the front sealing frame, and a second laser observation card insertion groove is formed in the side face of the rear sealing frame;
and the first laser observation card insertion groove and the second laser observation card insertion groove are respectively provided with a laser observation card.
The invention also discloses a measuring method based on the measuring device, which comprises the steps of measuring the consistency of the optical axis of the white light and the optical axis of the infrared light, and comprising the following steps:
taking a connecting line of center points of the cross partitions A1 and C1 as a transverse line; the connecting line of the center points of the cross partitions B1 and D1 is a large cross line formed by vertical lines as a reference;
aiming the large word line with an infrared view; the deviation of the white light cross line and the large cross line can be clearly seen by white light observation;
the optical axis deviation can be visually determined according to the scales.
As a preferred technical solution of a measurement method, the consistency of the white light optical axis or the infrared optical axis with the optical axis of the laser light includes:
placing a laser observation card at the rear side of the substrate;
aiming the large cross line by using a white light optical axis or an infrared appearance;
obtaining a laser spot on a laser observation card;
the optical axis deviation can be visually determined according to the scales.
As a preferable technical scheme of the measuring method, the method for judging the consistency of the white light optical axis or the infrared light optical axis and the optical axis of the laser by using a computer comprises the following steps:
arranging a camera, aiming at the dividing target plate for shooting, and obtaining an image containing laser spots;
image processing, namely obtaining center point coordinates of cross partitions A1, B1, C1 and D1;
affine transformation is carried out according to the coordinates of the 4 cross division center points, and an image containing laser spots without deviation is obtained;
forming an electronic dividing line overlapping the large cross line;
indicating the center of a laser spot by a mouse;
and measuring the optical axis deviation according to the pixel difference between the intersection point of the electronic dividing lines and the mouse indication point.
The invention has the beneficial effects that: any two optical axis offset between the white light optical axis, the infrared optical axis and the laser optical axis can be measured simultaneously and can be rapidly interpreted; meanwhile, a datum point is provided for high-precision measurement of the computer image, so that the optical axis deviation can be measured quickly and accurately; the invention has low cost, stability, reliability and quick measurement, and can realize the optical axis measurement of the multispectral sighting system.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the description of the embodiments will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art. Wherein:
FIG. 1 is a schematic view of a target plate structure of the apparatus of the present invention;
FIG. 2 is a schematic representation of the location of a fiducial mark in the present invention;
FIG. 3 is a schematic view of the physical structure of a substrate according to the present invention;
FIG. 4 is a schematic view of the structure of the measuring device of the present invention;
FIG. 5 is a schematic view of an exploded construction of the measuring device of the present invention;
in the figure: the base plate 1, the hollowed rectangle 2, the scale line 3, the reference marking 4, the clamping device 5, the bracket 51, the clamping bolt 52, the front sealing frame 61, the rear sealing frame 62, the base plate inserting groove 63, the first laser observing card inserting groove 64, the second laser observing card inserting groove 65, the laser observing card 7, the stranded screw 8, the first opening groove 611 and the second opening groove 621.
Detailed Description
Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary embodiments are not representative of all implementations consistent with one or more embodiments of the invention. Rather, they are merely examples of apparatus and methods that are consistent with aspects of one or more embodiments of the invention.
It should be noted that: in other embodiments, the steps of the corresponding method are not necessarily performed in the order shown and described. In some other embodiments, the method may include more or fewer steps than described herein. Furthermore, individual steps described in this disclosure may be broken down into multiple steps in other embodiments; while various steps described in this invention may be combined into a single step in other embodiments.
Example 1: referring to fig. 1 to 3, a target board for measuring the consistency of multispectral optical axes comprises a substrate 1, wherein a hollowed rectangle 2 is arranged at the center of the substrate 1, scale lines 3 are arranged around the hollowed rectangle 2, a reference scribing line 4 is further arranged on the substrate 1, and the center of the reference scribing line 4 coincides with the center point of the hollowed rectangle 2.
Further, the reference scribing line 4 comprises cross partitions A1, B1, C1 and D1 and sagging short lines A2, B2, C2 and D2 of four sides of the hollowed rectangle 2; the horizontal lines of the cross partitions A1, B1, C1 and D1 are horizontal and parallel to the upper side and the lower side of the hollowed-out rectangle 2, the horizontal lines of the cross partitions A1 and C1, the middle vertical short line A2 of the AB side of the hollowed-out rectangle 2 and the middle vertical short line C2 of the CD side of the hollowed-out rectangle 2 are collinear.
The vertical lines of the cross partitions A1, B1, C1 and D1 are vertical and parallel to the left side and the right side of the hollowed rectangle 2, the vertical lines of the cross partitions B1 and D1, the middle vertical short line D2 of the AD side of the hollowed rectangle 2 and the middle vertical short line B2 of the BC side of the hollowed rectangle 2 are collinear.
The middle vertical short line is the middle vertical line of the four sides of the hollowed-out rectangle 2.
The middle hollowed rectangle 2 (rectangle ABCD) is transparent, so that the laser photographic paper (or a laser observation card for laser spot imaging) can be clamped behind the hollowed rectangle;
thin lines (cross partitions A1, B1, C1 and D1, 4 middle vertical short lines A2, B2, C2 and D2 on four sides of a rectangular ABCD) in the pattern are all transparent, and the width is 0.1mm-0.3mm variably by laser lithography or chemical etching and is determined according to the requirement of measurement indexes;
the periphery of the rectangle ABCD is a ruler line for measuring the scribing, and the minimum scribing unit is mm; the intersection points of 4 middle short lines on four sides of a general rectangle ABCD are carved with 0 scale, and scale values are sequentially expanded up and down and left and right;
the side length of the rectangle ABCD is determined according to the debugging requirement, assuming collimator focal length: 2000mm, if we take the rectangle side length to be 40mm, its optical axis deviation to laser optical axis and white light optical axis can show that measuring range is + -10 close position.
The whole target plate is rectangular, so that the clamping is convenient;
the target board is made of a thin copper sheet or other ageing-resistant metal sheets, and has a thickness of 0.1mm or more, and is required to be flat and free of burrs.
Example 2: referring to fig. 1 to 5, the present embodiment provides a measuring device based on the foregoing target board for measuring the consistency of the multispectral optical axis, further comprising a clamping device 5, wherein the clamping device 5 comprises a bracket 51, a clamping bolt 52, a front sealing frame 61, a rear sealing frame 62, a substrate inserting groove 63, a first laser observing card inserting groove 64, a second laser observing card inserting groove 65, a laser observing card 7 and a stranded screw 8.
The front seal frame 61 and the rear seal frame 62 are fixed to the bracket 51 by the clamp bolts 52 after being connected by the twisted screws 8.
The substrate 1 is placed in the substrate insertion groove 63; the laser observation card 7 is inserted into the first laser observation card insertion slot 64 and the second laser observation card insertion slot 65, and it should be noted that the first laser observation card insertion slot 64 and the second laser observation card insertion slot 65 are respectively disposed on the front side and the rear side of the substrate insertion slot 63, and the substrate insertion slot 63 is located on the adjacent side surfaces of the first laser observation card insertion slot 64 and the second laser observation card insertion slot 65.
Further, the first laser observation card insertion slot 64 is disposed on the side of the front sealing frame 61, the second laser observation card insertion slot 65 is disposed on the side of the rear sealing frame 62, the first opening slot 611 is disposed at the top of the front sealing frame 61, the second opening slot 621 is disposed at the top of the rear sealing frame 62, and the first opening slot 611 and the second opening slot 621 are combined to form the substrate insertion slot 63 after the front sealing frame 61 and the rear sealing frame 62 are fixed.
Further, the width of the slot of the substrate insertion slot 63 is larger than the thickness of the substrate 1, when the optical axis consistency of the white light axis and the infrared light axis is measured, a backing plate can be placed behind the substrate 1 according to the situation, and when the optical axis consistency of the white light axis or the infrared light axis and the laser optical axis is measured, a laser observation card 7 is placed behind the substrate 1.
Example 3: the embodiment provides a measuring method using the target plate for measuring the consistency of the multispectral optical axis and a measuring device, which comprises the following steps:
measuring the optical axis consistency of a white light optical axis and an infrared optical axis:
because the dividing target plate is made of metal materials, the infrared camera can clearly see the large cross line (taking the connecting line of the central points of the cross divisions A1 and C1 in the pattern as a transverse line and taking the connecting line of the central points of the cross divisions B1 and D1 as a vertical line as a reference);
if the infrared image is not clear enough, an incandescent lamp can be arranged behind the target plate for illumination;
aiming the large cross line by using an infrared appearance; the deviation of the white cross line and the large cross line can be clearly seen by white light observation,
visual observation, the deviation of the optical axis can be judged according to the scales;
and (II) measuring the optical axis consistency of the white light optical axis or the infrared optical axis and the laser optical axis, comprising:
the rear surface of the dividing target plate is clamped with laser photographic paper (or a laser observation card 7);
aiming the large word line by using a white light optical axis or an infrared appearance;
according to different range finders, pulse laser is emitted, a laser spot is obtained on photographic paper, or continuous laser is emitted, and a laser spot is obtained on an observation card;
the optical axis deviation can be visually determined according to the scales.
And (III) judging the optical axis consistency of the white light optical axis or the infrared optical axis and the laser optical axis by using a computer, wherein the method comprises the following steps:
arranging a camera, aiming at the dividing target plate for shooting, and obtaining an image containing laser spots (the camera cannot normally image against the dividing target plate due to the relation of the optical paths of the parallel light system tubes);
image processing, namely increasing indexes such as image contrast and the like, and obtaining center point coordinates of cross partitions A1, B1, C1 and D1;
affine transformation is carried out according to the 4 center point coordinates, and an image containing laser spots without deviation is obtained;
forming an electronic dividing line overlapping the large cross line (the connecting line of the center points of the cross divisions A1 and C1 in the pattern is a transverse line, and the connecting line of the center points of the cross divisions B1 and D1 is a vertical line);
the center of the laser light spot is indicated by a mouse, so that the center of mass of the light spot can be manually judged, and the measurement accuracy is improved;
according to the pixel difference between the intersection point of the electronic dividing line and the mouse indication point, the optical axis deviation can be measured rapidly and accurately; far higher than the manual interpretation of a traditional tool microscope.
A target plate for measuring the consistency of a multispectral optical axis, which is fixed on a clamping mechanism for clamping a dividing target plate and a laser photographic paper (or a laser observation card) and can roughly adjust the positions of the dividing target plate and the laser photographic paper (or the laser observation card); it should be noted that if the reflective collimator system and the multispectral view system object-carrying adjustment table are used in combination, the device is used according to the prior art, and the description is omitted.
The invention has the beneficial effects that: any optical axis deviation of the white light optical axis, the infrared optical axis and the laser optical axis can be intuitively seen and measured; in the traditional method, the optical axis deviation of the infrared optical axis and the laser optical axis cannot be directly measured;
the staff gauge line for measurement is provided, so that personnel can conveniently and quickly judge the level of the deviation and expand and correct the deviation;
the target plate does not need to be replaced and can be quickly interpreted, so that the measuring speed is greatly improved;
judging the computer image, namely judging the centroid of the laser light spot, fitting an electronic dividing line and calculating the optical axis deviation of a pixel level, so that the measurement precision and the speed are greatly improved, and the deviation calculation can reach the measurement precision of 0.01 mil and is far higher than the index measurement requirement;
the test shows that: the invention adopts the target plate device and the using method of innovative design to rapidly and accurately measure the optical axis deviation of various multispectral observing and aiming systems, and lays a foundation for high-precision electronic measurement of the optical axis deviation, thereby meeting the requirements of rapid measurement of the optical axis consistency of various multispectral observing and aiming systems; and the cost is low, the stability and reliability are realized, and the measurement is rapid. The foregoing description of the preferred embodiment(s) of the invention is merely illustrative of the presently preferred embodiment(s) of the invention, and is not intended to limit the embodiment(s) of the invention to the particular form disclosed, since various modifications, equivalent arrangements, improvements, etc., may be made within the spirit and scope of the embodiment(s) of the invention.
Claims (7)
1. The target plate for measuring the multispectral optical axis consistency is characterized by comprising a substrate (1), wherein a hollowed-out rectangle (2) is arranged at the center of the substrate (1), scale lines (3) are arranged around the hollowed-out rectangle (2), a reference scribing line (4) is further arranged on the substrate (1), and the center of the reference scribing line (4) coincides with the center point of the hollowed-out rectangle (2);
measuring optical axis consistency of a white light optical axis and an infrared optical axis, comprising:
taking a connecting line of center points of the cross partitions A1 and C1 as a transverse line; the connecting line of the center points of the cross partitions B1 and D1 is a large cross line formed by vertical lines as a reference;
aiming the large word line with an infrared view; the deviation of the white light cross line and the large cross line can be clearly seen by white light observation;
visual observation, the deviation of the optical axis can be judged according to the scales;
measuring optical axis consistency of a white light optical axis or an infrared optical axis and a laser optical axis, comprising:
a laser observation card (7) is arranged at the rear side of the substrate (1);
aiming the large cross line by using a white light optical axis or an infrared appearance;
obtaining a laser spot on a laser observation card (7);
visual observation, the deviation of the optical axis can be judged according to the scales;
judging the consistency of the white light optical axis or the infrared optical axis and the optical axis of the laser by using a computer, comprising:
arranging a camera, aiming at the dividing target plate for shooting, and obtaining an image containing laser spots;
image processing, namely obtaining center point coordinates of cross partitions A1, B1, C1 and D1;
affine transformation is carried out according to the coordinates of the 4 cross division center points, and an image containing laser spots without deviation is obtained;
forming an electron division line overlapped with the large cross line;
indicating the center of a laser spot by a mouse;
and measuring the optical axis deviation according to the pixel difference between the intersection point of the electronic dividing lines and the mouse indication point.
2. The target plate for multispectral optical axis uniformity measurement according to claim 1, wherein the reference scribe line (4) includes cross partitions A1, B1, C1, D1 and sagging stubs A2, B2, C2, D2 of four sides of the hollowed rectangle (2).
3. The target plate for measuring the consistency of the multispectral optical axis according to claim 2, wherein the horizontal lines of the cross partitions A1, B1, C1 and D1 are all horizontal and parallel to the upper side and the lower side of the hollowed-out rectangle (2), the horizontal lines of the cross partitions A1 and C1, the middle vertical short line A2 of the AB side of the hollowed-out rectangle (2) and the middle vertical short line C2 of the CD side of the hollowed-out rectangle (2) are collinear.
4. A target plate for measuring the consistency of the optical axes of multiple spectrums according to claim 3, wherein the vertical lines of the cross partitions A1, B1, C1 and D1 are vertical and parallel to the left and right sides of the hollowed rectangle (2), the vertical lines of the cross partitions B1 and D1, the middle vertical line D2 of the AD side of the hollowed rectangle (2) and the middle vertical line B2 of the BC side of the hollowed rectangle (2) are collinear.
5. The measuring device based on the target plate for measuring the consistency of the multispectral optical axis according to any one of claims 1 to 4, further comprising a clamping device (5), wherein the clamping device (5) comprises a bracket (51), a clamping bolt (52), a front sealing frame (61) and a rear sealing frame (62), and the front sealing frame (61) and the rear sealing frame (62) are connected through stranded screws 8 and fixed on the bracket (51) through the clamping bolt (52).
6. The measurement device according to claim 5, further comprising a substrate insertion groove (63), wherein the substrate insertion groove (63) includes an open groove one (611) provided on the front seal frame (61) and an open groove two (621) provided on the rear seal frame (62).
7. The measuring device according to claim 6, wherein a first laser observation card insertion groove (64) is formed in the side surface of the front sealing frame (61), and a second laser observation card insertion groove (65) is formed in the side surface of the rear sealing frame (62);
the first laser observation card insertion groove (64) and the second laser observation card insertion groove (65) are respectively provided with a laser observation card (7).
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311552376.9A CN117268723B (en) | 2023-11-21 | 2023-11-21 | Target plate, measuring device and measuring method for multispectral optical axis consistency measurement |
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| Application Number | Priority Date | Filing Date | Title |
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| CN202311552376.9A CN117268723B (en) | 2023-11-21 | 2023-11-21 | Target plate, measuring device and measuring method for multispectral optical axis consistency measurement |
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| CN117268723A CN117268723A (en) | 2023-12-22 |
| CN117268723B true CN117268723B (en) | 2024-03-29 |
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