CN117214594A - Leakage current nondestructive continuous testing device for chip capacitor and using method - Google Patents
Leakage current nondestructive continuous testing device for chip capacitor and using method Download PDFInfo
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- CN117214594A CN117214594A CN202311096370.5A CN202311096370A CN117214594A CN 117214594 A CN117214594 A CN 117214594A CN 202311096370 A CN202311096370 A CN 202311096370A CN 117214594 A CN117214594 A CN 117214594A
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- 238000012360 testing method Methods 0.000 title claims abstract description 91
- 239000003990 capacitor Substances 0.000 title claims abstract description 66
- 238000000034 method Methods 0.000 title claims abstract description 15
- 238000007599 discharging Methods 0.000 claims abstract description 29
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 58
- 229910052742 iron Inorganic materials 0.000 claims description 29
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 3
- 238000010521 absorption reaction Methods 0.000 claims description 3
- 239000000853 adhesive Substances 0.000 claims description 3
- 230000001070 adhesive effect Effects 0.000 claims description 3
- 239000011889 copper foil Substances 0.000 claims description 3
- 230000001066 destructive effect Effects 0.000 claims 1
- 238000005452 bending Methods 0.000 abstract description 4
- 230000002427 irreversible effect Effects 0.000 abstract description 3
- 239000002184 metal Substances 0.000 abstract description 3
- 229910052751 metal Inorganic materials 0.000 abstract description 3
- 238000001514 detection method Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000004140 cleaning Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 241000270722 Crocodylidae Species 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- LNNWVNGFPYWNQE-GMIGKAJZSA-N desomorphine Chemical compound C1C2=CC=C(O)C3=C2[C@]24CCN(C)[C@H]1[C@@H]2CCC[C@@H]4O3 LNNWVNGFPYWNQE-GMIGKAJZSA-N 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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Abstract
The invention relates to the technical field of chip electrolytic capacitors, in particular to a leakage current nondestructive continuous testing device for a chip capacitor and a use method thereof, which solve the problems that in the prior art, bending part electrodes are broken often due to metal fatigue, and then the chip electrolytic capacitor is scrapped, the method is easy to cause irreversible damage to the chip electrolytic capacitor, and the operation is inconvenient, the efficiency is low, and continuous testing cannot be realized. The invention relates to a leakage current nondestructive continuous testing device for a chip capacitor and a using method thereof, wherein the leakage current nondestructive continuous testing device comprises an anode charging electromagnetic rail, a cathode charging electromagnetic rail, an anode testing magnetic rail, a cathode testing magnetic rail and an anode discharging electromagnetic rail.
Description
Technical Field
The invention relates to the technical field of chip electrolytic capacitors, in particular to a leakage current nondestructive continuous testing device for a chip capacitor and a using method thereof.
Background
The chip electrolytic capacitor has the advantages of miniaturization, good stability, high reliability, low price and the like, so that the chip electrolytic capacitor is widely applied to the fields of consumer electronics, communication equipment, automobile electronics, medical equipment and the like, and automatic testing is realized at a production end, but large-scale automatic detection equipment is not usually equipped in the field of small-batch testing such as small sample shipment, research and development batch testing and the like of industry, and if the chip electrolytic capacitor occupies the production detection equipment for testing, the total working hours of links such as machine adjustment, material cleaning, testing and the like are not quick, and the utilization rate of the production end can be greatly influenced.
The traditional manual test is that the electrode bending part is required to be straightened and then clamped by the crocodile clamp to realize the leakage current test of the single sheet electrolytic capacitor, and the electrode is required to be bent again after the test is finished, but the electrode is often broken at the bending part due to metal fatigue, so that the sheet electrolytic capacitor is scrapped, the method is easy to cause irreversible damage to the sheet electrolytic capacitor, and the method is inconvenient to operate, low in efficiency and incapable of realizing continuous test. Therefore, the leakage current nondestructive continuous testing tool and the using method suitable for 10-30 chip electrolytic capacitors are required to be researched.
Disclosure of Invention
The invention aims to provide a leakage current nondestructive continuous testing device for a chip capacitor and a using method thereof, which solve the problems that in the prior art, bending part electrodes are broken often because of metal fatigue, and then the chip electrolytic capacitor is scrapped, the method is easy to cause irreversible damage to the chip electrolytic capacitor, and the operation is inconvenient, the efficiency is low and continuous testing cannot be realized.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
a leakage current nondestructive continuous testing tool for a chip electrolytic capacitor comprises an anode charging electromagnetic rail, a cathode charging electromagnetic rail, an anode testing magnetic rail, a cathode testing magnetic rail, an anode discharging electromagnetic rail and a cathode discharging electromagnetic rail, wherein the anode and the cathode of the anode charging electromagnetic rail are homopolar and are fixed on two sides of an insulating plate; the negative electrode charging magnetic rail and the negative electrode testing magnetic rail are connected into a whole through magnetic force, an insulating sheet is placed between the positive electrode charging magnetic rail and the positive electrode testing magnetic rail and is connected into a whole through magnetic force, a layer of conductive copper foil is adhered to the surfaces of all magnetic rails to improve the conductive efficiency of a contact part, the positive electrode charging magnetic rail is connected with a ground wire end of a leakage current tester through an iron terminal, the negative electrode charging magnetic rail is connected with a negative electrode end of the leakage current tester through an iron terminal, the positive electrode testing magnetic rail is connected with a positive electrode end of the leakage current tester through the iron terminal, the positive electrode discharging magnetic rail is independently fixed on the right side of the testing magnetic rail, the positive electrode discharging magnetic rail is separated through an insulating plate, the arrangement sequence of the positive electrode and the negative electrode is consistent with that of the testing magnetic rail, the positive electrode discharging magnetic rail is connected with the positive electrode and the negative electrode of a discharging resistor through the iron terminal, and the insulating plate is fixed on two tooling bases.
Preferably, the charging magnetic track can be integrated, and a plurality of blocks of the charging magnetic tracks can be serially connected and lengthened so as to meet the test requirement of charging a plurality of sheet electrolytic capacitors at one time.
Preferably, the contact width of the magnetic track can be widened by adding the magnetic block so as to meet the test requirement of the extra-large-diameter chip electrolytic capacitor.
Preferably, the insulating plates between the positive and negative magnetic tracks can be replaced with different thicknesses so as to meet the test requirement of the ultra-small diameter sheet electrolytic capacitor.
Preferably, the positive and negative magnetic tracks and the insulating plate can be fixed by insulating structural adhesive to enhance the fixing strength, and can also be fixed by magnetic force absorption.
The using method of the leakage current nondestructive continuous testing tool for the chip electrolytic capacitor comprises the following steps of:
s1, selecting the width of a corresponding insulating plate and the width of a magnetic track according to the outer diameter of a test piece type electrolytic capacitor to be tested;
s2, selecting the length of a corresponding insulating plate, the length and the number of charging magnetic tracks according to the number of the to-be-tested test piece type electrolytic capacitors;
s3, assembling the charging magnetic rail, the testing magnetic rail, the discharging resistor on the insulating plate;
s4, connecting an anode of the electromagnetic charging rail with a ground terminal of the leakage current tester through an iron terminal, connecting a cathode of the electromagnetic charging rail with a cathode of the leakage current tester through an iron terminal, connecting an anode of the test magnetic rail with an anode of the leakage current tester through an iron terminal, independently fixing the electromagnetic discharging rail on the right side of the test magnetic rail, separating the anode and the cathode of the discharge magnetic rail through an insulating plate, enabling the arrangement sequence of the anode and the cathode to be consistent with the test magnetic rail, and connecting the anode and the cathode of the electromagnetic discharging rail with the anode of the discharge resistor through the iron terminal;
s5, taking 15 internal sheet type electrolytic capacitors, correspondingly placing positive and negative electrodes above the charging electromagnetic rail, setting charging voltage, current and charging time on the leakage current tester, and starting charging;
s6, finishing charging and reading seconds on the leakage current tester, finishing charging the chip electrolytic capacitor on the charging magnetic track, taking one chip electrolytic capacitor, correspondingly placing the positive electrode and the negative electrode above the testing magnetic track, and measuring and storing the leakage current value by the tester;
s7, correspondingly placing the positive electrode and the negative electrode of the sheet electrolytic capacitor which is subjected to the test above the electromagnetic rail, waiting for 2-3 seconds, and taking down the sheet electrolytic capacitor which is subjected to the discharge;
s8, grabbing the next piece of electrolytic capacitor for testing, and repeating the above operation until all pieces of electrolytic capacitors are tested.
The invention has at least the following beneficial effects:
the leakage current can be continuously tested in a nondestructive mode without repeatedly disassembling and assembling the bevel electrode of the chip electrolytic capacitor or performing secondary welding, and compared with the large-scale automatic detection equipment which needs to finish links such as machine adjustment, material cleaning and testing, the invention has the advantages of more convenient and rapid operation and simple structure.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for the description of the embodiments will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of the structure of the present invention;
FIG. 2 is a schematic diagram of a discharge resistor structure according to the present invention;
FIG. 3 is a schematic view of the structure of an insulating plate according to the present invention;
fig. 4 is a schematic view of the structure of the tooling base.
In the figure: 1. charging an electromagnetic rail at the positive electrode; 2. charging an electromagnetic rail on a negative electrode; 3. the positive pole tests the magnetic track; 4. testing a magnetic track by a negative electrode; 5. the positive electrode discharges the electromagnetic rail; 6. a negative electrode is placed on the electromagnetic rail; 7. an insulating plate; 8. an insulating sheet; 9. an iron terminal; 10. an iron terminal; 11. a discharge resistor; 12. a tooling base; 13. an iron terminal; 14. an iron terminal; 15. and an iron terminal.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
Example 1
Referring to fig. 1-4, a leakage current nondestructive continuous testing device for a chip capacitor and a using method thereof, wherein the leakage current nondestructive continuous testing device comprises an anode charging electromagnetic rail 1, a cathode charging electromagnetic rail 2, an anode testing magnetic rail 3, a cathode testing magnetic rail 4, an anode discharging electromagnetic rail 5 and a cathode discharging electromagnetic rail 6, wherein the anode and the cathode of which are respectively arranged on the same side are respectively distributed and fixed on two sides of an insulating plate 7; the negative electrode charging magnetic rail 2 and the negative electrode testing magnetic rail 4 are connected into a whole through magnetic force, an insulating sheet 8 is placed between the positive electrode charging magnetic rail and the positive electrode testing magnetic rail and is connected into a whole through magnetic force, a layer of conductive copper foil is adhered to the surfaces of all magnetic rails to improve the conductive efficiency of a contact part, the positive electrode charging magnetic rail 1 is connected with the ground wire end of a leakage current tester through an iron terminal 9, the negative electrode charging magnetic rail 2 is connected with the negative electrode end of the leakage current tester through an iron terminal, the positive electrode testing magnetic rail 3 is connected with the positive electrode end of the leakage current tester through an iron terminal 10, the discharging magnetic rails 5 and 6 are independently fixed on the right side of the testing magnetic rail, the positive electrode discharging magnetic rails 5 and 6 are separated through insulating plates 7, the arrangement sequence of the positive electrode and the negative electrode discharging magnetic rails 5 and 6 are consistent with the testing magnetic rails 3 and 4, the positive electrode discharging magnetic rails 5 and 6 are connected with the positive electrode and the negative electrode of a discharging resistor 11 through the iron terminal, and the insulating plates 7 are fixed on two tool bases 12.
The preferred embodiments are: in the scheme, the charging magnetic tracks 1 and 2 can be integrated, and a plurality of blocks can be connected in series for lengthening, so that the test requirement of charging a plurality of sheet electrolytic capacitors at one time can be met.
The selected implementation cases are as follows: in the scheme, the contact width of the magnetic track can be widened by adding the magnetic block, so that the test requirement of the extra-large-diameter chip electrolytic capacitor is met.
The selected implementation cases are as follows: in the scheme, the insulating plates 7 between the positive and negative magnetic tracks 1 and 2 can be replaced with different thicknesses so as to meet the test requirement of the ultra-small diameter sheet electrolytic capacitor.
The selected implementation cases are as follows: in the scheme, the positive and negative magnetic tracks 1 and 2 and the insulating plate 7 can be fixed by insulating structural adhesive to enhance the fixing strength, and can also be fixed by magnetic force absorption.
Example two
Referring to fig. 1 to 4, the method for using the leakage current nondestructive continuous testing tool for the chip electrolytic capacitor comprises the following steps:
s1, selecting the width of a corresponding insulating plate and the width of a magnetic track according to the outer diameter of the to-be-tested test piece type electrolytic capacitor.
S2, selecting the length of the corresponding insulating plate, the length and the number of the charging magnetic tracks according to the number of the to-be-tested test piece type electrolytic capacitors.
S3, assembling the charging magnetic tracks 1 and 2, the test magnetic tracks 3 and 4, the discharging magnetic tracks 5 and 6, the discharging resistor 11 and the insulating plate 7.
S4, the positive pole 1 of the charging magnetic track is connected with the ground terminal of the leakage current tester through an iron terminal 9, the negative pole 2 of the charging magnetic track is connected with the negative pole end of the leakage current tester through an iron terminal 10, the positive pole 3 of the testing magnetic track is connected with the positive pole end of the leakage current tester through an iron terminal 10, the discharging magnetic tracks 5 and 6 are independently fixed on the right sides of the testing magnetic tracks 3 and 4, the positive pole 5 and the negative pole 6 of the discharging magnetic tracks are separated through insulating plates, the arrangement sequence of the positive pole and the negative pole is consistent with that of the testing magnetic tracks 3 and 4, and the positive pole 5 and the negative pole 6 of the discharging magnetic tracks are connected with the positive pole and the negative pole of the discharging resistor 11 through iron terminals.
S5, taking 15 internal sheet type electrolytic capacitors, correspondingly placing positive and negative electrodes above the charging electromagnetic rails 1 and 2, setting charging voltage, current and charging time on a leakage current tester, and starting charging.
S6, the charging and reading seconds on the leakage current tester are finished, the charging of the chip electrolytic capacitors on the charging magnetic tracks 1 and 2 is finished, one chip electrolytic capacitor is taken, the positive electrode and the negative electrode are correspondingly placed above the test magnetic tracks 3 and 4, and the leakage current value is measured by the tester and stored.
S7, correspondingly placing the positive electrode and the negative electrode of the sheet electrolytic capacitor which is subjected to the test above the electromagnetic rails 5 and 6, waiting for 2-3 seconds, and taking down the sheet electrolytic capacitor which is subjected to the discharge.
S8, grabbing the next piece of electrolytic capacitor for testing, and repeating the above operation until all pieces of electrolytic capacitors are tested.
The foregoing has shown and described the basic principles, principal features and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, and that the above embodiments and descriptions are merely illustrative of the principles of the present invention, and various changes and modifications may be made therein without departing from the spirit and scope of the invention, which is defined by the appended claims. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (6)
1. A leakage current non-destructive continuous testing apparatus for chip capacitors, comprising:
the positive electrode charging electromagnetic rail (1), the negative electrode charging electromagnetic rail (2), the positive electrode testing magnetic rail (3), the negative electrode testing magnetic rail (4), the positive electrode discharging electromagnetic rail (5) and the negative electrode discharging electromagnetic rail (6) are respectively arranged on the same side, and the positive electrode and the negative electrode are distributed and fixed on the two sides of the insulating plate (7); the negative electrode charging magnetic rail (2) and the negative electrode test magnetic rail (4) are connected into a whole through magnetic force, an insulating sheet (8) is arranged between the positive electrode charging magnetic rail and the positive electrode test magnetic rail and connected into a whole through magnetic force, a layer of conductive copper foil is adhered on the surfaces of all magnetic rails to improve the conductive efficiency of a contact part, the positive electrode charging magnetic rail (1) is connected with the ground terminal of a leakage current tester through an iron terminal (9), the negative electrode charging magnetic rail (2) is connected with the negative terminal of the leakage current tester through an iron terminal (15), the positive pole test magnetic track (3) is connected with the positive pole end of the leakage current tester through an iron terminal (10), the discharge magnetic tracks (5, 6) are independently fixed on the right side of the test magnetic track, the positive and negative pole discharge magnetic tracks (5, 6) are separated through an insulating plate (7), the arrangement sequence of the positive and negative poles is consistent with that of the test magnetic tracks (3, 4), the positive and negative pole discharge magnetic tracks (5, 6) are connected with the positive and negative poles of the discharge resistor (11) through iron terminals (13, 14), and the insulating plate (7) is fixed on two tool bases (12).
2. The leakage current nondestructive continuous testing device for the chip capacitor according to claim 1, wherein the charging magnetic tracks (1, 2) can be integrated or lengthened by a plurality of serially connected blocks so as to meet the testing requirement of charging the chip electrolytic capacitor several times at one time.
3. The leakage current nondestructive continuous testing device for chip capacitors according to claim 1, wherein the track contact width can be widened by adding magnetic blocks to meet the testing requirements of the chip electrolytic capacitors with extra large diameter.
4. The leakage current nondestructive continuous testing device for chip capacitors according to claim 1, wherein insulating plates (7) between the positive and negative magnetic tracks (1, 2) can be replaced with different thicknesses to meet the testing requirements of the chip electrolytic capacitors with very small diameters.
5. The leakage current nondestructive continuous testing device for chip capacitors according to claim 1, wherein the positive and negative magnetic tracks (1, 2) and the insulating plate (7) can be fixed by insulating structural adhesive to enhance the fixing strength, and can also be fixed by magnetic force absorption only.
6. A method for using the leakage current nondestructive continuous test for chip capacitors according to claims 1-5, characterized in that:
s1, selecting the width of a corresponding insulating plate and the width of a magnetic track according to the outer diameter of a test piece type electrolytic capacitor to be tested;
s2, selecting the length of a corresponding insulating plate, the length and the number of charging magnetic tracks according to the number of the to-be-tested test piece type electrolytic capacitors;
s3, assembling the charging magnetic tracks (1, 2), the testing magnetic tracks (3, 4), the discharging magnetic tracks (5, 6), the discharging resistor (11) on the insulating board (7);
s4, connecting a positive electrode (1) of the electromagnetic charging rail with a ground terminal of a leakage current tester through an iron terminal (9), connecting a negative electrode (2) of the electromagnetic charging rail with a negative electrode of the leakage current tester through the iron terminal, connecting a positive electrode (3) of the electromagnetic charging rail with a positive electrode of the leakage current tester through an iron terminal (10), independently fixing discharge magnetic rails (5, 6) on the right sides of the test magnetic rails (3, 4), separating positive and negative electrodes (5, 6) of the electromagnetic discharging rail through insulating plates, and connecting positive and negative electrodes (5, 6) of the electromagnetic discharging rail with positive and negative electrodes of a discharge resistor (11) through the iron terminal, wherein the positive and negative electrodes are arranged in sequence with the test magnetic rails (3, 4);
s5, taking 15 internal sheet type electrolytic capacitors, correspondingly placing positive and negative electrodes above the charging electromagnetic rails (1, 2), setting charging voltage, current and charging time on a leakage current tester, and starting charging;
s6, after the charging and reading seconds are finished on the leakage current tester, the charging of the chip electrolytic capacitors on the charging magnetic tracks (1, 2) is finished, a chip electrolytic capacitor is taken, positive and negative poles are correspondingly placed above the test magnetic tracks (3, 4), and the leakage current value is measured by the tester and stored;
s7, correspondingly placing the positive electrode and the negative electrode of the sheet electrolytic capacitor which is subjected to the test above the electromagnetic rails (5 and 6), waiting for 2-3 seconds, and taking down the sheet electrolytic capacitor which is subjected to the discharge;
s8, grabbing the next piece of electrolytic capacitor for testing, and repeating the above operation until all pieces of electrolytic capacitors are tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311096370.5A CN117214594A (en) | 2023-08-29 | 2023-08-29 | Leakage current nondestructive continuous testing device for chip capacitor and using method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202311096370.5A CN117214594A (en) | 2023-08-29 | 2023-08-29 | Leakage current nondestructive continuous testing device for chip capacitor and using method |
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| Publication Number | Publication Date |
|---|---|
| CN117214594A true CN117214594A (en) | 2023-12-12 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202311096370.5A Pending CN117214594A (en) | 2023-08-29 | 2023-08-29 | Leakage current nondestructive continuous testing device for chip capacitor and using method |
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| CN (1) | CN117214594A (en) |
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- 2023-08-29 CN CN202311096370.5A patent/CN117214594A/en active Pending
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