CN116774302A - Data conversion method and device, electronic equipment and imaging equipment - Google Patents
Data conversion method and device, electronic equipment and imaging equipment Download PDFInfo
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Abstract
The invention provides a data conversion method, a data conversion device, electronic equipment and imaging equipment of a linear array detector, wherein the data conversion method comprises the following steps: acquiring the actual coordinates of each photosensitive element on the X axis; assuming that the position of one photosensitive element is unchanged, shifting the positions of the other photosensitive elements to ensure that the photosensitive elements are equidistantly arranged after shifting, and acquiring the equivalent coordinates of the photosensitive elements on the X axis; calculating the position offset of each photosensitive element according to the actual coordinates and the equivalent coordinates; calculating the electrical quantity offset of each photosensitive element according to the position offset; and obtaining the equivalent electrical quantity according to the actual electrical quantity and the electrical quantity offset. The data conversion method, the data conversion device, the electronic equipment and the imaging equipment have higher imaging quality and better imaging stability.
Description
Technical Field
The present invention relates to the field of optical detection technologies, and in particular, to a data conversion method, a data conversion device, an electronic device, and an imaging device for a linear array detector.
Background
The linear array detector is widely applied to the fields of security inspection, industrial nondestructive detection and the like, and the basic principle is that X-rays penetrate through an object to be detected or are reflected by the object to be detected and then projected onto the linear array detector, the linear array detector converts optical signals into original electrical signals with corresponding sizes, and the original electrical signals are displayed as images after data processing.
The current linear array detector is mostly formed by splicing a plurality of detection plates due to the limitation of the chip production technology level, so that the images at the splicing gaps are misplaced. Aiming at the problems of splicing gaps and image dislocation, two main solutions exist at present, one is to divide the field of view of the detected object into a plurality of blocks, each block is respectively converted into a local image by a detection plate, and then the local images are spliced into a complete image by an image processing technology. The other is to arrange the photosensitive elements in a staggered manner, and when the moving speed of the detected object is high, errors can occur due to the delay problem.
For example, chinese patent publication No. CN110738613a discloses a real-time correction method for image stitching of a linear array detector. The method comprises the steps of taking data of a preset frame number in imaging data as an initial reference value for correction, subtracting the initial reference value from the data of each frame in the imaging data after the preset frame number, and adding the preset value to perform pre-correction processing. The method does not consider the influence of the change of the working environment on the work of the detector, and the image precision gradually decreases along with the increase of the working time. In addition, if the method of re-acquiring the reference value and setting the preset value at intervals is adopted to reduce the influence of the change of the working environment on the operation of the detector, the working efficiency is low. In addition, the preset value is set manually, so that the uncertainty of the image splicing effect is increased.
Disclosure of Invention
In view of the above-mentioned drawbacks of the prior art, an object of the present invention is to provide a data conversion method of a linear array detector for improving imaging quality and stability.
To achieve the above and other related objects, the present invention provides a data conversion method of a line array detector including a plurality of photosensitive elements arranged along an X-axis, each photosensitive element for converting an optical signal into an actual electrical quantity, the data conversion method for converting the actual electrical quantity into an equivalent electrical quantity for imaging, the data conversion method comprising:
acquiring the actual coordinates of each photosensitive element on the X axis;
assuming that the position of one photosensitive element is unchanged, shifting the positions of the other photosensitive elements to ensure that the photosensitive elements are equidistantly arranged after shifting, and acquiring the equivalent coordinates of the photosensitive elements on the X axis;
calculating the position offset of each photosensitive element according to the actual coordinates and the equivalent coordinates;
calculating the electrical quantity offset of each photosensitive element according to the position offset;
and obtaining the equivalent electrical quantity according to the actual electrical quantity and the electrical quantity offset.
In an embodiment of the present invention, the calculating the electrical quantity offset of each photosensitive element according to the position offset includes:
obtaining an electrical gradient according to the change rate of the actual electrical quantity relative to the actual coordinates near the photosensitive element;
multiplying the position offset by the electrical quantity gradient to obtain the electrical quantity offset.
In an embodiment of the present invention, the method for obtaining an electrical gradient specifically includes:
selecting a photosensitive element as a target photosensitive element;
selecting two photosensitive elements near the target photosensitive element as a first reference photosensitive element and a second reference photosensitive element respectively;
subtracting the actual electrical quantity of the first reference photosensitive element from the actual electrical quantity of the second reference photosensitive element to obtain an electrical quantity variation;
subtracting the actual coordinates of the first reference photosensitive element and the second reference photosensitive element to obtain a coordinate variation;
and dividing the electric quantity variation by the coordinate variation to obtain the electric quantity gradient of the target photosensitive element.
In an embodiment of the invention, one of the first reference photosensitive element and the second reference photosensitive element is the target photosensitive element.
In an embodiment of the invention, the first reference photosensitive element and the second reference photosensitive element are adjacent.
In an embodiment of the present invention, the method for obtaining the equivalent coordinates includes:
the position of the photosensitive element with the smallest actual coordinate in the plurality of photosensitive elements is kept unchanged, the positions of the rest photosensitive elements are shifted, and the photosensitive elements after the shifting are equidistantly arranged, so that the equivalent coordinate is obtained; or (b)
The position of the photosensitive element with the largest actual coordinate in the plurality of photosensitive elements is kept unchanged, the positions of the rest photosensitive elements are shifted, and the photosensitive elements after the shifting are distributed equidistantly, so that the equivalent coordinate is obtained; or (b)
And (3) keeping the positions of the photosensitive elements centered in the actual coordinates in the plurality of photosensitive elements unchanged, and shifting the positions of the rest photosensitive elements to ensure that the photosensitive elements after shifting are equidistantly arranged to obtain the equivalent coordinates.
To achieve the above and other related objects, the present invention also provides an electronic device including a memory and a processor for executing a computer program stored in the memory, so that the electronic device executes the data conversion method.
To achieve the above and other related objects, the present invention also provides an imaging apparatus including a line detector including a plurality of photosensitive elements arranged along an X-axis, each of the photosensitive elements being configured to convert an optical signal into an actual electrical quantity, a data converter employing the data conversion device to convert the actual electrical quantity into an equivalent electrical quantity, and a display configured to output an image according to the gray value.
In an embodiment of the invention, the linear array detector includes a plurality of detection plates, the detection plates include a substrate and a plurality of photosensitive elements arranged on the substrate, the center distance between two adjacent photosensitive elements on the same substrate is d1, and the center distance between two adjacent photosensitive elements belonging to two substrates is d2, d2> d1.
As described above, the data conversion method, the data conversion device, the electronic device and the imaging device of the linear array detector of the present invention have the following beneficial effects: the imaging quality is higher, and the imaging stability is better.
Drawings
Fig. 1 is a block diagram showing an embodiment of a prior art linear array probe.
Fig. 2 is a diagram showing the effect of imaging without data conversion in the prior art.
Fig. 3 is a diagram showing the effect of imaging after processing by the data conversion method of the present invention.
FIG. 4 is a flowchart of a data conversion method according to an embodiment of the invention.
Fig. 5 shows a block diagram of an equivalent linear array detector.
Fig. 6 shows a block diagram of the electronic device of the present invention.
Description of element reference numerals
1. A substrate; 2. a photosensitive element.
Detailed Description
Other advantages and effects of the present invention will become apparent to those skilled in the art from the following disclosure, which describes the embodiments of the present invention with reference to specific examples. The invention may be practiced or carried out in other embodiments that depart from the specific details, and the details of the present description may be modified or varied from the spirit and scope of the present invention. It should be noted that the following embodiments and features in the embodiments may be combined with each other without conflict.
It should be noted that the illustrations provided in the following embodiments merely illustrate the basic concept of the present invention by way of illustration, and only the components related to the present invention are shown in the drawings and are not drawn according to the number, shape and size of the components in actual implementation, and the form, number and proportion of the components in actual implementation may be arbitrarily changed, and the layout of the components may be more complicated.
The embodiments of the present invention will be described in detail below with reference to the attached drawings so that those skilled in the art to which the present invention pertains can easily implement the present invention. This invention may be embodied in many different forms and is not limited to the embodiments described herein.
Fig. 1 shows a general composition structure of a line detector, which includes a plurality of detection plates including a substrate 1 and a plurality of photosensitive elements 2 (e.g., PDs) arranged on the substrate, each for converting an optical signal into an actual electrical quantity (e.g., charge quantity). The center distance between two adjacent photosensitive elements on the same substrate is d1, and the center distance between two adjacent photosensitive elements belonging to two substrates is d2.
As shown in fig. 2, the imaging result is directly performed by using the actual electrical quantity, in fig. 2, there are clearly visible vertical ridges, the formation of which is related to the splicing gap, and in an actual display, there are more vertical ridges (refer to fig. 5 in patent CN110738613 a), which can cause visual interference to the security personnel in viewing the detected object.
As shown in fig. 4, in order to improve imaging quality, the present embodiment provides a data conversion method of a line detector including a plurality of photosensitive elements arranged along an X-axis, each photosensitive element for converting an optical signal into an actual electrical quantity, the data conversion method for converting the actual electrical quantity into an equivalent electrical quantity for imaging, the data conversion method including:
in step S100, the actual coordinates of each photosensitive element on the X-axis are obtained. The actual coordinates are measured based on the real objects of the photosensitive elements, and the real objects of the photosensitive elements can be arranged along a straight line or along a curve. When the real objects of the photosensitive elements are arranged along a straight line, the actual coordinates represent the positional relationship of the photosensitive elements at the same spatial coordinates (X-axis). When the real objects of the photosensitive elements are arranged along the curve, the actual coordinates represent the position relationship of each photosensitive element after the curve is straightened. In this embodiment, the position of the origin of coordinates of the X axis is not limited, and when calculating the actual coordinates of the photosensitive elements, the position of a specified point on the photosensitive elements on the X axis may be used to represent the actual coordinates of the photosensitive elements, and only the consistency of the specified points of each photosensitive element needs to be ensured.
Step S200, assuming that the position of one photosensitive element is unchanged, shifting the positions of the other photosensitive elements to enable the photosensitive elements to be equidistantly arranged after shifting, and obtaining the equivalent coordinates of the photosensitive elements on the X axis. As shown in fig. 5, after the equidistant arrangement, the center distance between two adjacent photosensitive elements of two substrates is equal to the center distance between two adjacent photosensitive elements on the same substrate, and both the two adjacent photosensitive elements are d3. The size of d3 is not limited in this embodiment, and may be arbitrarily specified. It should be noted that, this step does not require moving the real object of each photosensitive element, but rather, constructing an equivalent linear array detector. Further, the equivalent linear array detector shown in fig. 5 is also for convenience of description, and is not required to actually draw the equivalent linear array detector in a graphic form or obtain the graphic data of the equivalent linear array detector. As shown in fig. 5, the equivalent linear array detector is not required to consider the actual process implementation method. For example, the substrate 1 is shown by a dotted rectangular frame in fig. 5, and equidistant arrangement of the photosensitive elements can be achieved by partially overlapping between adjacent substrates 1. Preferably, in an embodiment, d3 is equal to d1, that is, the center distance between any two adjacent photosensitive elements after equivalent offset is equal to the center distance between two adjacent photosensitive elements in the detection plate before offset.
Step S300, calculating the position offset of each photosensitive element according to the actual coordinates and the equivalent coordinates. The positional shift amount expresses the displacement amount of the photosensitive element caused by the equivalent shift action of shifting the remaining photosensitive elements in step S200. Specifically, the value of the positional offset is the value of the equivalent coordinates minus the value of the actual coordinates.
Step S400, calculating the electrical quantity offset of each photosensitive element according to the position offset. The electrical quantity offset has the same dimension as the actual electrical quantity, and a correlation function exists between the electrical quantity offset and the position offset. The specific type of the correlation function is not limited in this embodiment, and the correlation function may be a linear function or a nonlinear function, such as a first order function, a higher order function, a natural distribution function, and the like. The correlation function may be the same or different for different photosensitive elements.
And S500, obtaining the equivalent electrical quantity according to the actual electrical quantity and the electrical quantity offset. In this embodiment, the equivalent electrical quantity and the actual electrical quantity have the same dimensions, and for example, the equivalent electrical quantity may be a linear combination of the actual electrical quantity and the electrical quantity offset, or other combination forms. The value of the electrical quantity offset expresses how much the actual electrical quantity is corrected. In general, the larger the gap in the linear array detector real object is, the larger the absolute value of the position offset of the photosensitive element is, and the larger the uncorrected imaging result error is, the more obvious the vertical ridge is. In this embodiment, the absolute value of the electrical quantity offset is positively correlated, e.g., linearly correlated, with the absolute value of the position offset. Therefore, the larger the error is, the larger the correction on the actual electrical quantity is, so that the self-adaptive adjustment of the equivalent electrical quantity is realized.
Through step S500, the actual electrical quantity is converted into an equivalent electrical quantity, and the subsequent step of converting the equivalent electrical quantity into a gray scale image can be performed by using the prior art without improvement. As known to those skilled in the art, the raw data of the line array detector is 16 bits or higher, for example, the raw data of 16 bits may represent 0 to 65535 of 65536 levels, and the raw data is mapped onto 256 gray levels of 0 to 255 of the gray image through a series of data conversion to generate the gray image. In the prior art, the mapped gray data is processed, for example, gradient interpolation calculation is performed on the gray image edge, the lost data information can be larger, and the image edge transition is harder. In the embodiment, the calculation is directly performed on the original data, the data information is not lost basically, the edge effect of the image is good, and the imaging quality is high and stable.
Optionally, step S400 includes:
in step S410, an electrical gradient is obtained according to the rate of change of the actual electrical quantity relative to the actual coordinates in the vicinity of the photosensitive element.
In step S420, the position offset is multiplied by the electrical gradient to obtain an electrical offset.
The present embodiment sets the correlation function between the electrical quantity offset and the positional offset to the electrical quantity gradient near the photosensitive element, in other words, the more intense the gradation change near the photosensitive element, the larger the electrical quantity offset. Thus, the electrical quantity offset is not only related to the size of the physical gap of the linear array detector, but also related to the color tone of a specific detected object. The method is reflected on an image, the first derivative of the edge area of the image is larger, and obvious gray abrupt changes easily occur at the edge area in the uncorrected imaging result, so that visual interference is caused. The correction of the edge area is stronger, and the adaptability to different tone areas is improved.
Optionally, step S410 includes:
in step S411, a photosensitive element is selected as the target photosensitive element. In the above embodiment, the data conversion is realized by converting the actual electrical quantity of each photosensitive element, and the sequence of conversion of each photosensitive element is not limited. In this embodiment, the target photosensitive element is the photosensitive element currently performing data conversion, and at different times, different photosensitive elements will become the target photosensitive element.
In step S412, two photosensitive elements are selected as the first reference photosensitive element and the second reference photosensitive element, respectively, near the target photosensitive element.
In step S413, the actual electrical quantities of the first reference photosensitive element and the second reference photosensitive element are subtracted to obtain an electrical quantity variation.
In step S414, the actual coordinates of the first reference photosensitive element and the second reference photosensitive element are subtracted to obtain the coordinate variation.
In step S415, the electrical quantity change amount is divided by the coordinate change amount to obtain an electrical quantity gradient of the target photosensitive element. In this step, the electrical gradient may be a result of directly dividing the electrical variable by the value of the coordinate variable, or may be a value positively correlated with the result, for example, the result is multiplied by a predetermined coefficient.
Optionally, one of the first reference photosensitive element and the second reference photosensitive element is a target photosensitive element. By the arrangement of the embodiment, the electric quantity gradient can reflect the local characteristics around the target photosensitive element. For example, when the target photosensitive element is located at the edge of the splice gap, the electrical gradient can more accurately express the tone gradient at the splice gap.
Optionally, the first reference photosensitive element and the second reference photosensitive element are adjacent. Further enhancing the local nature of the electrical gradient.
Further, the position offset is the difference obtained by subtracting the value of the actual coordinate from the value of the equivalent coordinate. In other words, the positional shift amount is the coordinate after the shift of the target photosensitive element minus the coordinate before the shift. The offset direction is forward opposite to the X-axis. The first reference photosensitive element is a target photosensitive element, and the second reference photosensitive element is the next photosensitive element of the target photosensitive element positive along the X axis.
Optionally, the method for obtaining the equivalent coordinates includes: the position of the photosensitive element with the smallest actual coordinate in the plurality of photosensitive elements is kept unchanged, the positions of the rest photosensitive elements are shifted, and the photosensitive elements after the shifting are distributed equidistantly to obtain the equivalent coordinate. The embodiment has the advantages of simpler realization and high processing speed. The disadvantage is that the optimized image lost data is concentrated at the processing end of the image, and the original image center is shifted.
Optionally, the method for obtaining the equivalent coordinates includes: the position of the photosensitive element with the largest actual coordinate in the plurality of photosensitive elements is kept unchanged, the positions of the rest photosensitive elements are shifted, and the photosensitive elements after the shifting are distributed equidistantly to obtain the equivalent coordinate. The features of this embodiment are the same as above.
Optionally, the method for obtaining the equivalent coordinates includes: the positions of the photosensitive elements centered in the actual coordinates in the plurality of photosensitive elements are kept unchanged, the positions of the rest photosensitive elements are shifted, and the photosensitive elements after the shifting are distributed equidistantly, so that equivalent coordinates are obtained. The advantage of this embodiment is that the data of the optimized image loss is shared to both ends of the image, the original image center is not changed substantially. The disadvantage is that the implementation is complex and the amount of calculation is increased.
Alternatively, in step S413, if the actual electrical quantity of one of the reference photosensitive elements has been converted into an equivalent electrical quantity, the actual electrical quantity is replaced with the equivalent electrical quantity of the reference photosensitive element to participate in the electrical quantity offset calculation of the target photosensitive element.
Alternatively, the equivalent electrical quantity is calculated as follows:
wherein,,representing the equivalent electrical quantity of the target photosensitive element;
representing the actual electrical quantity of the target photosensitive element;
representing the actual electrical quantity of the second reference photosensitive element;
X i_new representing equivalent coordinates of the target photosensitive element;
X i representing the actual coordinates of the target photosensitive element;
X i+1 representing the actual coordinates of the second reference photosensitive element;
X i+1 -X i representing the amount of change in coordinates in step S414;
indicating the amount of change in the electrical quantity in step S413;
representing the electrical quantity gradient in step S415;
X i_new -X i representing the sensitization of a targetA positional offset of the element;
indicating the amount of electrical quantity offset in step S420.
The present embodiment also provides a data conversion device of a line array detector, the line array detector including a plurality of photosensitive elements arranged along an X-axis, each photosensitive element being configured to convert an optical signal into an actual electrical quantity, a data conversion method being configured to convert the actual electrical quantity into an equivalent electrical quantity for imaging, the data conversion device including:
the coordinate acquisition module is used for acquiring the actual coordinates of each photosensitive element on the X axis;
the coordinate conversion module is used for shifting the positions of the rest photosensitive elements on the assumption that the position of one photosensitive element is unchanged, so that the photosensitive elements after shifting are equidistantly arranged, and the equivalent coordinates of the photosensitive elements on the X axis are obtained;
the first offset calculation module is used for calculating the position offset of each photosensitive element according to the actual coordinates and the equivalent coordinates;
the second offset calculation module is used for calculating the electrical quantity offset of each photosensitive element according to the position offset;
and the output module is used for obtaining the equivalent electrical quantity according to the actual electrical quantity and the electrical quantity offset.
Referring to fig. 6, a schematic structural connection diagram of an electronic device according to an embodiment of the invention is shown. As shown in fig. 6, the present embodiment provides an electronic device, specifically including: a processor and a memory; the memory is used for storing a computer program, and the processor is used for executing the computer program stored in the memory so as to enable the electronic device to execute the steps of the data conversion method of the linear array detector.
The processor may be a general-purpose processor, including a central processing unit (Central Processing Unit, CPU for short), a network processor (Network Processor, NP for short), etc.; but also digital signal processors (Digital Signal Processing, DSP for short), application specific integrated circuits (Application Specific Integrated Circuit, ASIC for short), field programmable gate arrays (Field Programmable Gate Array, FPGA for short) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components.
The memory may include a random access memory (Random Access Memory, abbreviated as RAM) and may further include a non-volatile memory (non-volatile memory), such as at least one magnetic disk memory.
In practice, the electronic device may be a computer that includes all or part of the components of memory, a memory controller, one or more processing units (CPUs), peripheral interfaces, RF circuits, audio circuits, speakers, microphones, input/output (I/O) subsystems, display screens, other output or control devices, and external ports.
The embodiment also provides an imaging device, which comprises a linear array detector, a data converter and a display, wherein the linear array detector comprises a plurality of photosensitive elements which are arranged along an X axis, each photosensitive element is used for converting an optical signal into an actual electrical quantity, the data converter adopts a data conversion device to convert the actual electrical quantity into an equivalent electrical quantity, the data converter is also used for converting the equivalent electrical quantity into a gray value, and the display is used for outputting an image according to the gray value.
Optionally, the linear array detector comprises a plurality of detection plates, the detection plates comprise a substrate and a plurality of photosensitive elements arranged on the substrate, the center distance of two adjacent photosensitive elements on the same substrate is d1, and the center distance of two adjacent photosensitive elements which belong to two substrates is d2, and d2> d1.
In summary, the invention obtains the electrical quantity offset and the equivalent electrical quantity aiming at each photosensitive element by measuring the actual coordinates of the linear array detector and establishing the equivalent coordinates under ideal conditions, fully considers the influence of environmental change and has better stability. In addition, the equivalent electrical quantity and the gray value have a mapping relation, but the precision value is far higher than the gray value, and the imaging precision is higher. The invention has higher industrial utilization value.
The technical features of the above-described embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above-described embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description. When technical features of different embodiments are embodied in the same drawing, the drawing can be regarded as a combination of the embodiments concerned also being disclosed at the same time.
The above embodiments are merely illustrative of the principles of the present invention and its effectiveness, and are not intended to limit the invention. Modifications and variations may be made to the above-described embodiments by those skilled in the art without departing from the spirit and scope of the invention. Accordingly, it is intended that all equivalent modifications and variations of the invention be covered by the claims, which are within the ordinary skill of the art, be within the spirit and scope of the present disclosure.
Claims (10)
1. A data conversion method of a line-array detector including a plurality of photosensitive elements arranged along an X-axis, each photosensitive element for converting an optical signal into an actual electrical quantity, the data conversion method for converting the actual electrical quantity into an equivalent electrical quantity for imaging, characterized by comprising:
acquiring the actual coordinates of each photosensitive element on the X axis;
assuming that the position of one photosensitive element is unchanged, shifting the positions of the other photosensitive elements to ensure that the photosensitive elements are equidistantly arranged after shifting, and acquiring the equivalent coordinates of the photosensitive elements on the X axis;
calculating the position offset of each photosensitive element according to the actual coordinates and the equivalent coordinates;
calculating the electrical quantity offset of each photosensitive element according to the position offset;
and obtaining the equivalent electrical quantity according to the actual electrical quantity and the electrical quantity offset.
2. The method for converting data of a line detector according to claim 1, wherein said calculating an electrical quantity offset of each photosensitive element based on said positional offset comprises:
obtaining an electrical gradient according to the change rate of the actual electrical quantity relative to the actual coordinates near the photosensitive element;
multiplying the position offset by the electrical quantity gradient to obtain the electrical quantity offset.
3. The data conversion method of a linear array detector according to claim 2, wherein the method for obtaining the electrical gradient specifically comprises:
selecting a photosensitive element as a target photosensitive element;
selecting two photosensitive elements near the target photosensitive element as a first reference photosensitive element and a second reference photosensitive element respectively;
subtracting the actual electrical quantity of the first reference photosensitive element from the actual electrical quantity of the second reference photosensitive element to obtain an electrical quantity variation;
subtracting the actual coordinates of the first reference photosensitive element and the second reference photosensitive element to obtain a coordinate variation;
and dividing the electric quantity variation by the coordinate variation to obtain the electric quantity gradient of the target photosensitive element.
4. A data conversion method of a line detector according to claim 3, wherein one of the first reference photosensitive element and the second reference photosensitive element is the target photosensitive element.
5. A method of data conversion for a linear array detector according to claim 3, wherein the first reference photosensitive element and the second reference photosensitive element are adjacent.
6. The data conversion method of a linear array detector according to claim 1, wherein the method for obtaining the equivalent coordinates is as follows:
the position of the photosensitive element with the smallest actual coordinate in the plurality of photosensitive elements is kept unchanged, the positions of the rest photosensitive elements are shifted, and the photosensitive elements after the shifting are equidistantly arranged, so that the equivalent coordinate is obtained; or (b)
The position of the photosensitive element with the largest actual coordinate in the plurality of photosensitive elements is kept unchanged, the positions of the rest photosensitive elements are shifted, and the photosensitive elements after the shifting are distributed equidistantly, so that the equivalent coordinate is obtained; or (b)
And (3) keeping the positions of the photosensitive elements centered in the actual coordinates in the plurality of photosensitive elements unchanged, and shifting the positions of the rest photosensitive elements to ensure that the photosensitive elements after shifting are equidistantly arranged to obtain the equivalent coordinates.
7. A data conversion device of a line detector including a plurality of photosensitive elements arranged along an X-axis, each photosensitive element for converting an optical signal into an actual electrical quantity, the data conversion method for converting the actual electrical quantity into an equivalent electrical quantity for imaging, characterized by comprising:
the coordinate acquisition module is used for acquiring the actual coordinates of each photosensitive element on the X axis;
the coordinate conversion module is used for shifting the positions of the rest photosensitive elements on the assumption that the position of one photosensitive element is unchanged, so that the photosensitive elements after shifting are equidistantly arranged, and the equivalent coordinates of the photosensitive elements on the X axis are obtained;
the first offset calculation module is used for calculating the position offset of each photosensitive element according to the actual coordinates and the equivalent coordinates;
the second offset calculation module is used for calculating the electrical quantity offset of each photosensitive element according to the position offset;
and the output module is used for obtaining the equivalent electrical quantity according to the actual electrical quantity and the electrical quantity offset.
8. An electronic device comprising a memory and a processor, wherein the processor is configured to execute a computer program stored in the memory, so that the electronic device performs the data conversion method according to any one of claims 1 to 6.
9. An imaging apparatus comprising a line detector, a data converter and a display, wherein the line detector comprises a plurality of photosensitive elements arranged along an X-axis, each photosensitive element being configured to convert an optical signal into an actual electrical quantity, the data converter employing the data conversion device of claim 7 to convert the actual electrical quantity into an equivalent electrical quantity, the data converter further being configured to convert the equivalent electrical quantity into a gray value, and the display being configured to output an image according to the gray value.
10. The imaging apparatus of claim 9, wherein the linear array detector comprises a plurality of detection plates, the detection plates comprise a substrate and a plurality of photosensitive elements arranged on the substrate, the center distance between two adjacent photosensitive elements on the same substrate is d1, and the center distance between two adjacent photosensitive elements belonging to two substrates is d2, d2> d1.
Priority Applications (1)
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2693740A2 (en) * | 2012-07-31 | 2014-02-05 | Canon Kabushiki Kaisha | Image sensor driving apparatus, method and radiation imaging apparatus |
| US20150097991A1 (en) * | 2013-10-07 | 2015-04-09 | Canon Kabushiki Kaisha | Ranging apparatus, imaging apparatus, and ranging method |
| US20150319357A1 (en) * | 2014-05-02 | 2015-11-05 | Canon Kabushiki Kaisha | Ranging apparatus, imaging apparatus, ranging method and ranging parameter calculation method |
| CN106124032A (en) * | 2016-08-25 | 2016-11-16 | 中国航空工业集团公司北京长城计量测试技术研究所 | The digital measuring method of a kind of optical frequency modulators modulate delay and device |
| CN115086517A (en) * | 2022-05-26 | 2022-09-20 | 联宝(合肥)电子科技有限公司 | Image acquisition method and device, electronic equipment and storage medium |
| CN115500899A (en) * | 2021-06-23 | 2022-12-23 | 上海逸思医疗科技股份有限公司 | Amplitude compensation method for ultrasonic transducer |
| CN116156342A (en) * | 2023-04-04 | 2023-05-23 | 合肥埃科光电科技股份有限公司 | Multi-linear array image sensor splicing method, linear array image acquisition system, device and equipment |
-
2023
- 2023-08-23 CN CN202311062569.6A patent/CN116774302B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2693740A2 (en) * | 2012-07-31 | 2014-02-05 | Canon Kabushiki Kaisha | Image sensor driving apparatus, method and radiation imaging apparatus |
| US20150097991A1 (en) * | 2013-10-07 | 2015-04-09 | Canon Kabushiki Kaisha | Ranging apparatus, imaging apparatus, and ranging method |
| US20150319357A1 (en) * | 2014-05-02 | 2015-11-05 | Canon Kabushiki Kaisha | Ranging apparatus, imaging apparatus, ranging method and ranging parameter calculation method |
| CN106124032A (en) * | 2016-08-25 | 2016-11-16 | 中国航空工业集团公司北京长城计量测试技术研究所 | The digital measuring method of a kind of optical frequency modulators modulate delay and device |
| CN115500899A (en) * | 2021-06-23 | 2022-12-23 | 上海逸思医疗科技股份有限公司 | Amplitude compensation method for ultrasonic transducer |
| CN115086517A (en) * | 2022-05-26 | 2022-09-20 | 联宝(合肥)电子科技有限公司 | Image acquisition method and device, electronic equipment and storage medium |
| CN116156342A (en) * | 2023-04-04 | 2023-05-23 | 合肥埃科光电科技股份有限公司 | Multi-linear array image sensor splicing method, linear array image acquisition system, device and equipment |
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