CN116359127B - Magnetic detection device and magnetic detection method - Google Patents
Magnetic detection device and magnetic detection method Download PDFInfo
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- CN116359127B CN116359127B CN202310133925.2A CN202310133925A CN116359127B CN 116359127 B CN116359127 B CN 116359127B CN 202310133925 A CN202310133925 A CN 202310133925A CN 116359127 B CN116359127 B CN 116359127B
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- 238000001514 detection method Methods 0.000 title claims abstract description 29
- 238000007689 inspection Methods 0.000 claims abstract description 51
- 239000000919 ceramic Substances 0.000 claims abstract description 20
- 239000011521 glass Substances 0.000 claims abstract description 15
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims abstract description 12
- 230000006698 induction Effects 0.000 claims abstract description 9
- 229910052759 nickel Inorganic materials 0.000 claims abstract description 6
- 238000000034 method Methods 0.000 claims description 11
- 230000008859 change Effects 0.000 claims description 5
- 238000010998 test method Methods 0.000 claims 1
- 230000009286 beneficial effect Effects 0.000 abstract description 4
- 239000000047 product Substances 0.000 description 12
- 230000036544 posture Effects 0.000 description 11
- 230000007547 defect Effects 0.000 description 6
- 230000008569 process Effects 0.000 description 4
- 238000005336 cracking Methods 0.000 description 3
- 230000002950 deficient Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000005674 electromagnetic induction Effects 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 239000003985 ceramic capacitor Substances 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- -1 end surface bubbles Substances 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000009740 moulding (composite fabrication) Methods 0.000 description 1
- 238000001556 precipitation Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
- 238000010345 tape casting Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
- 239000013585 weight reducing agent Substances 0.000 description 1
- 238000004383 yellowing Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25B—TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
- B25B11/00—Work holders not covered by any preceding group in the subclass, e.g. magnetic work holders, vacuum work holders
- B25B11/002—Magnetic work holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
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- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
The application provides a magnetic detection device and a magnetic detection method, which are used for detecting an electric element, wherein the electric element comprises a ceramic main body and a plurality of layers of inner electrodes which are sequentially overlapped in the ceramic main body, and the nickel ratio in the inner electrodes is more than 50%; the magnetic detection device comprises an objective table, an electromagnet and a magnifier assembly; the object stage provides a bearing surface provided with an inspection area, and the inspection area is used for placing the electric elements; the electromagnet is arranged on the first side of the bearing surface, and the orthographic projection of the inspection area falls into the orthographic projection of the effective magnetic induction area of the electromagnet along the direction perpendicular to the bearing surface. The magnifying glass assembly is arranged on the second side of the bearing surface, the second side is opposite to the first side, and the observable field of view of the magnifying glass assembly is larger than the inspection area. The application can check the appearance of all products through one operation, is beneficial to improving the efficiency and accuracy of appearance check of electrical elements such as MLCC and the like, and can reduce the damage of human factors to the electrical elements such as MLCC and the like.
Description
Technical Field
The application relates to the technical field of electromagnetism and quality control, in particular to a magnetic control device and a magnetic control method.
Background
With the gradual progress of electronic devices toward miniaturization and weight reduction, electric elements represented by chip multilayer ceramic capacitors (Multi-LAYER CERAMIC Capacitors, MLCCs) have been attracting attention of scientific researchers. As an indispensable basic element of high-performance electrical equipment, currently, MLCCs have been widely used in the fields of electronic automobiles, communication equipment, and the like. The MLCC mainly includes a ceramic body, an internal electrode stacked in the ceramic body, and an end electrode (also called an external electrode) exposed from the ceramic body and connected to the internal electrode. Various defects such as shifting, offset cutting, cracking, rough cutting, oblique cutting, waste cutting, ceramic damage, sticky impurities and other cutting defects often occur in processes such as cutting, chamfering, end surface layering, side surface layering, inclusion cracking, ceramic damage, ceramic yellowing, blackening, poor internal electrode everywhere and other chamfering defects, end surface impurities, end surface bubbles, glass precipitation, end top leakage ceramic, end surface holes and other end burning defects, and also include end top exposed electrode, end top exposed ceramic, corner exposed ceramic, pinholes, cracks, end drop, cracking and other appearance defects. Therefore, it is necessary to inspect the product to ensure quality.
One of the main inspection methods is to inspect the appearance of the product, in short, sample the product (also called semi-finished product) of each process, and place the product under a microscope to see if the appearance is defective. During the inspection process, the inspector will flip the product through the use of tweezers in combination with the dithered cardboard to inspect the sides of the product. However, when the tweezers are used for turning over the products, certain damage is easily caused to the products, and in addition, when the number of the products inspected at one time is large, the products are difficult to comprehensively inspect in the mode, the time spent is too long, and the efficiency is low.
Disclosure of Invention
In view of this, the application provides a magnetic inspection device and a magnetic inspection method, which can inspect the appearance of all products through one operation, is beneficial to improving the efficiency and accuracy of appearance inspection of electrical components such as MLCC, and can reduce the damage of human factors to the electrical components such as MLCC.
The application provides a magnetic detection device which is used for detecting an electric element, wherein the electric element comprises a ceramic main body and a plurality of layers of inner electrodes which are sequentially overlapped in the ceramic main body, and the nickel ratio (namely the mass ratio) in the inner electrodes is more than 50 percent; the magnetic detection device comprises an objective table, an electromagnet and a magnifier assembly.
The object stage provides a bearing surface provided with an inspection area for placing the electrical components. For example, one or more electrical components to be inspected may be placed.
The electromagnet is arranged on the first side of the bearing surface, and the orthographic projection of the inspection area falls into the orthographic projection of the effective magnetic induction area of the electromagnet along the direction perpendicular to the bearing surface.
The magnifying glass assembly is arranged on the second side of the bearing surface, the second side is opposite to the first side, and is opposite to the two sides of the bearing surface, and the observable visual field of the magnifying glass assembly is larger than the inspection area.
Optionally, the magnetic detection device further comprises a knob assembly connected with the electromagnet for rotating the electromagnet to change the magnetic field direction. The direction of the magnetic field generated by electrifying the electromagnet is not changed, and the changing of the direction of the magnetic field is that the direction of the magnetic field of the electromagnet is changed relative to the bearing surface. For example, the knob assembly may be deflected clockwise or counterclockwise through at least a 90 ° angle relative to the bearing surface.
Optionally, the objective table is provided with recess and year thing board, and the electro-magnet sets up in the recess, carries the thing board and can cover the recess, both can hide the electro-magnet, also can guarantee the integration and the relative level and smooth of loading surface.
Optionally, the surface area of the carrier plate is an inspection area.
Optionally, the surfaces of the carrying plate and the carrying surface are flush; the bearing surface is provided with the sign in order to mark the inspection area, and inspection personnel can directly observe the place position of electric elements by naked eyes, does benefit to the improvement inspection efficiency.
The application provides a magnetic detection method based on the magnetic detection device, which comprises the following steps S1 to S3.
S1: the method comprises the steps of placing a plurality of electrical components to be inspected in an inspection area of a bearing surface of a stage.
S2: the electromagnet is electrified, and the plurality of electrical elements are controlled to be in a first arrangement state through the first magnetic field direction.
S3: the magnifying glass assembly is adapted such that its viewable field of view covers the inspection area to allow for the inspection of the plurality of electrical components through the viewable field of view of the magnifying glass assembly.
Optionally, the magnetic detection device comprises a knob assembly connected with the electromagnet; the magnetic detection method further comprises the following steps: the inspector rotates the knob assembly to rotate the electromagnet, for example, to change the posture of the electromagnet from the first magnetic field direction to the second magnetic field direction, so as to control the plurality of electrical elements to be in the second arrangement state.
Optionally, the first magnetic field direction and the second magnetic field direction are perpendicular; the rotary knob assembly includes: the rotary knob assembly is deflected clockwise or counterclockwise within a 90 ° angle relative to the bearing surface.
Optionally, the first magnetic field direction includes a direction perpendicular to the carrying surface, and in the first arrangement state, the multilayer internal electrodes of each electrical element are perpendicular to the carrying surface, that is, each electrical element is arranged on the carrying surface in a standing posture; correspondingly, in the second arrangement state, the multiple layers of internal electrodes of each electrical element are parallel to the bearing surface, i.e. each electrical element is arranged on the bearing surface in a lying down posture.
As described above, the application uses the nickel in the inner electrode of the electrical element such as MLCC to account for more than 50%, has stronger electromagnetic property, can make the electrical element that is placed on the objective table more number produce magnetization by the electromagnet is energized, the direction of the magnetic field that the electromagnet is energized produces makes all electrical elements change from the unordered, differently-oriented arrangement state to the unified arrangement state, for example all standing-up on the bearing surface of the objective table, the inspector can observe the appearance of the electrical element by adjusting the magnifying glass assembly to inspect whether there is a defect, the application can inspect the appearance of all electrical element products through one operation, is favorable to improving the efficiency and accuracy of appearance inspection of the electrical element such as MLCC, in addition, by the electromagnetic induction force turning the electrical element, avoid the hard object such as tweezers contacting the electrical element, can reduce the damage caused by human factors to the electrical element such as MLCC.
Drawings
FIG. 1 is a schematic diagram of a magnetic detection device according to an embodiment of the present application;
fig. 2 is a schematic structural diagram of a magnetic detection device according to an embodiment of the present application in a state of opening a carrier plate;
fig. 3 is a schematic structural perspective view of an electrical device according to an embodiment of the present application;
FIG. 4 is a schematic cross-sectional view of the electrical component shown in FIG. 3 along the direction A-A';
FIG. 5 is a top view of a plurality of electrical components initially arranged on a carrier when the electromagnet is not energized;
FIG. 6 is a top view of a plurality of electrical components in a first configuration on a carrier when an electromagnet is energized;
FIG. 7 is a top view of a plurality of electrical components in a second configuration on a carrier when the electromagnet is energized;
fig. 8 is a schematic flow chart of a magnetic detection method according to an embodiment of the present application.
Detailed Description
According to the application, the direction of the magnetic field generated by electrifying the electromagnet is mainly used for changing the arrangement state of one or more electric elements to be detected from the disordered arrangement state with different directions into the uniform arrangement state, and the direction of the electric elements is further changed through the direction of the magnetic field of the electromagnet, for example, the directions of the electric elements are synchronously changed, namely, the electric elements are turned over at one time, so that the efficiency and the accuracy of appearance inspection are improved, and the electric elements are turned over through electromagnetic induction force, so that hard objects such as tweezers are prevented from contacting the electric elements, and damage to the electric elements such as MLCC (multi-layer magnetic circuit) caused by human factors is reduced.
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be clearly described below with reference to specific embodiments and corresponding drawings. It will be apparent that the embodiments described below are only some, but not all, embodiments of the application. Under the condition of no conflict, the following embodiments and technical features thereof can be combined with each other and also belong to the technical scheme of the application.
In the description of the embodiments of the present application, the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, are merely for convenience in describing the technical solutions of the respective embodiments, and do not indicate or imply that the devices or elements must have a specific orientation, be configured and operated in a specific orientation, and are not to be construed as limiting the present application.
Fig. 1 to 4 are schematic diagrams illustrating a magnetic detection device 1 according to an embodiment of the application in two states. The magnetic test device 1 is used for testing electrical components 2 including, but not limited to, MLCCs, laminated piezoresistors, laminated inductors, filters, diplexers, etc.
As shown in fig. 3 and 4, the electrical component 2 mainly includes a ceramic body 21, a plurality of layers of internal electrodes 22 stacked in sequence in the ceramic body 21, and external electrodes (also called terminal electrodes) 23 provided on the outer surface of the ceramic body 21. The inner electrodes 23 extend to the end surfaces of the ceramic body 21 respectively to be connected with the corresponding outer electrodes 23, and are electrically connected through the outer electrodes 23 to perform corresponding functions, the inner electrodes 22 are prepared from conductive paste through processes of tape casting, forming, drying and the like, and have good conductivity, and the nickel ratio (i.e. mass ratio) in the current inner electrodes 22 is larger than 50%, so that the ceramic body has good magnetized characteristics.
The magnetic inspection device 1 includes a stage 11, an electromagnet 12, and a magnifying glass assembly 13.
Stage 11 provides a bearing surface 111 provided with an inspection zone Z 0, inspection zone Z 0 for placement of electrical components 2. For example, one or more electrical components 2 to be inspected may be placed.
In the scenario shown in fig. 1 and 2, the objective table 11 is provided with a groove 11a and a carrying plate 112, the electromagnet 12 is disposed in the groove 11a, and the carrying plate 112 can cover the groove 11a, so that the electromagnet 12 can be hidden, and the integration and relative flatness of the carrying surface 111 can be ensured. Further, opening carrier plate 112 exposes electromagnet 12 and removes electromagnet 12.
Since the carrier plate 112 and the groove 11a are not integrally formed, the edge connecting the two must have a macroscopic boundary, so that optionally, the surface area of the carrier plate 112 is used as the inspection area Z 0, and the inspector can directly perceive the placement position of the electrical component 2 to be tested by naked eyes.
In other embodiments, the carrying surface 111 of the stage 11 may be a complete plane, i.e. the carrying plate 112 is not provided. The electromagnet 12 may be disposed in a recess of the stage 11, and optionally, a cover plate may be disposed on a side of the stage 11 facing away from the carrying surface 111, where the cover plate may cover the recess, so as to conceal the electromagnet 12. Opening the cover exposes the electromagnet 12 and removes it.
For the case that the surfaces of the carrying plate 11 and the carrying surface 111 are flush, for example, the carrying surface 111 of the carrying table 11 is a complete plane, the embodiment of the application may be provided with a mark, for example, a dashed frame, on the carrying surface 111 to show the inspection area Z 0, so that the inspection personnel can directly observe the placement position of the electrical element 2 with naked eyes, and the placement is quicker, thereby being beneficial to improving the inspection efficiency.
It should be understood that the structural features of the inspection area Z 0, the carrying surface 111, the carrier plate 112, and the shape and size of the stage 11 may be adapted according to practical requirements, and the present application is not limited thereto. For example, based on the fact that the electromagnet 12 is generally cylindrical in shape as a whole, the recess 11a of the stage 11 may be cylindrical in shape, and correspondingly, the inspection zone Z 0 and the carrier plate 112 may each be circular in shape.
The electromagnet 12 is located on a first side of the carrying surface 111, for example, it may be placed in a recess 11a of the carrying surface 111 in the placement orientation shown in fig. 1 and 2, and along a direction y perpendicular to the carrying surface 111, an orthographic projection of the inspection area Z 0 falls into an orthographic projection of an effective magnetic induction area of the electromagnet 12, and a trace 12a for energizing the electromagnet 12 may extend from a side surface of the stage 11.
The direction y may be regarded as the height direction of the magnetic examination device 1 or parallel to the height direction of the magnetic examination device 1; the bearing surface 111 is located on the x-z direction section or parallel to the x-z direction section of the magnetic detection device 1; the directions x, y and z are perpendicular to each other in pairs and can be regarded as three coordinate axes of a three-dimensional rectangular coordinate system. It should be understood that the term "perpendicular" throughout the present application does not require that the angle between the two must be 90 °, but that deviations of + -10 ° are allowed, i.e. that the term "perpendicular" is understood to mean an angle between any two directions of 80 ° to 100 °. Likewise, the term "parallel" throughout the present application does not necessarily require an angle of 0 ° or 180 ° between the two, but rather allows a deviation of ±10°, i.e. the term "parallel" is understood to mean an angle of 0 ° to 10 ° or 170 ° to 190 ° between any two directions.
The effective magnetic induction area is understood to be: the magnetically induced force generated by the energization of the electromagnet 12 can flip the electrical element 2 over the area. The size of the effective magnetic induction area is related to the weight of the electric element 2, the energizing voltage of the electromagnet 12, the number of turns of the coil of the electromagnet 12, and other parameters. For example, each type of electrical component 2 has the same or similar weight, for a first type of electrical component 2, the electromagnet 12 is set to be energized to a first voltage during inspection, while for a second type of electrical component 2, a second voltage may be applied to the electromagnet 12 without changing the structural parameters of the electromagnet 12.
Alternatively, the size of the effective magnetic induction zone may be adapted to follow the type of electrical element 2 to be inspected. For example, the inspection parameters of the magnetic inspection device 1 are set to be unchanged, the type of the electrical element 2 to be inspected is changed, for example, the weight is increased, and the effective magnetic induction area is reduced.
Or the magnetic detection device 1 can be provided with an adjusting button, and an inspector can adjust the electrified voltage of the electromagnet 12 by screwing the adjusting button, so that the effective magnetic induction area is matched with the electric element 2.
The magnifier assembly 13 is disposed on a second side of the bearing surface 111, where the second side and the first side are opposite sides of the bearing surface 111 along the height direction y.
For example, as shown in fig. 1 and 2, the magnifier assembly 13 includes a connector 131, an eyepiece (e.g., a binocular eyepiece as shown in the drawings) 132, and an objective lens 133, the eyepiece 132 and the objective lens 133 being mounted in an up-down positional relationship to the connector 131; a fixing column 113 extending in the height direction y is fixed to the stage 11; the connection member 131 is mounted to the fixing post 113, thereby fixing the magnifier assembly 13 to the stage 11. Alternatively, the connecting member 131 may be sleeved on the fixed column 113, the connecting member 131 is provided with a displacement hand wheel 135, and an inspector can adjust the tightness of the sleeving of the connecting member 131 and the fixed column 113 by screwing the displacement hand wheel 135, so that the magnifier assembly 13 can be moved up and down along the direction y relative to the objective table 11.
The viewable field of view of the magnifier assembly 13 is greater than the inspection zone Z 0 so that all electrical components 2 placed in the inspection zone Z 0 can be visually inspected. The observable field of view is understood to be the effective field of view when eyepiece 132 and objective lens 133 are combined, within which the inspector can clearly observe whether the appearance of all electrical components 2 placed in inspection zone Z 0 is defective or not.
The magnifier assembly 13 may also be provided with a focusing handwheel 134, and the focal length of the objective lens 133 may be adjusted by screwing the focusing handwheel 134, thereby adjusting the sharpness and magnification of the magnifier assembly 13.
The operation and principle of the magnetic inspection device 1 according to the present application for inspecting the electrical component 2 will be described with reference to the magnetic inspection method shown in fig. 8. The magnetic detection method at least comprises the following steps S1 to S3.
S1: the plurality of electrical components 2 to be inspected are placed in the inspection zone Z 0 of the carrying surface 111 of the stage 11. As shown in fig. 5, the plurality of electrical components 2 are placed on the stage 111 in an unordered and differently oriented arrangement, which may include two postures, standing and lying.
S2: the electromagnet 12 is electrified, and the plurality of electrical elements 2 are controlled to be in a first arrangement state through the first magnetic field direction. The inner electrodes 22 of the electrical components 2 have a nickel ratio greater than 50%, and have strong electromagnetic properties, so that a large number of electrical components 2 placed on the stage 11 can be magnetized by energizing the electromagnet 12, and the first magnetic field direction generated by energizing the electromagnet 12 changes all the electrical components 2 from an unordered and differently arranged state to a uniform arranged state, for example, please refer to fig. 5-6, all the electrical components are arranged on the carrying surface 111 of the stage 11 in a standing posture. It should be noted that the electrical components 2 have very small dimensions, and fig. 5 to 7 are views of the electrical components 2 under a microscope.
S3: the magnifying glass assembly 13 is adjusted so that its viewable field of view covers the inspection zone Z 0 to allow for inspection of whether the plurality of electrical components 2 are defective through the viewable field of view of the magnifying glass assembly 13.
Based on the above, the application can check the appearance of all the electric elements 2 by one operation, which is beneficial to improving the efficiency and accuracy of appearance check of the electric elements 2 such as MLCC, in addition, by flipping the electric elements 2 by electromagnetic induction force, the hard objects such as tweezers are prevented from contacting the electric elements 2, and the damage to the electric elements 2 such as MLCC caused by human factors can be reduced.
With continued reference to fig. 1 and 2, the magnetic inspection device 1 may further include a knob assembly 14, where the knob assembly 14 is connected to the electromagnet 12, and for example, the knob assembly 14 may include a holding portion and a connecting rod, where the connecting rod is connected to the electromagnet 12 and extends to the outside of the stage 11, so as to be connected to the holding portion, and the inspector may drive the connecting rod to rotate through the holding portion, so as to drive the electromagnet 12 to rotate.
The knob assembly 14 is primarily used to turn the electromagnet 12 to change the direction of the magnetic field. The direction of the magnetic field generated by the electromagnet 12 is not changed relative to the electromagnet 12 itself, and the changing of the direction of the magnetic field is that the direction of the magnetic field of the electromagnet 12 is changed relative to the bearing surface 111.
Here, the magnetic detection method may further include the following step S4.
S4: the knob assembly 14 is rotated to rotate the electromagnet 12 from the first magnetic field direction to the second magnetic field direction, so as to control the plurality of electrical components 2 to be in the second arrangement state.
The present application changes the direction of the magnetic field by changing the attitude of the electromagnet 12. In a scenario where the first magnetic field direction and the second magnetic field direction are perpendicular, the knob assembly 14 may deflect clockwise or counterclockwise through at least a 90 ° angle relative to the bearing surface 111. For example, the first magnetic field direction includes a direction perpendicular to the carrying surface 111, and in the first arrangement state, the multilayer internal electrodes 22 of each electrical element 2 are perpendicular to the carrying surface 111, that is, each electrical element 2 is arranged on the carrying surface 111 in a standing posture as shown in fig. 6; correspondingly, in the second arrangement state, the multi-layer internal electrodes 22 of each electrical component 2 are parallel to the carrying surface 111, i.e. each electrical component 2 is arranged on the carrying surface 111 in a lying posture as shown in fig. 7.
It should be understood that the step numbers such as S1, S2 are for the purpose of more clearly and briefly describing the corresponding content, and do not constitute a substantial limitation in order, and those skilled in the art may, in implementation, for example, perform S4 before S3, so as to perform appearance inspection when the electrical element 2 is in the lying down posture, then perform appearance inspection when the electrical element 2 is in the standing posture, and perform appearance inspection for switching back and forth between the standing posture and the lying down posture, which are all within the scope of the present application.
The foregoing description is only a partial embodiment of the present application and is not intended to limit the scope of the present application, and all equivalent structural modifications made by those skilled in the art using the present description and accompanying drawings are included in the scope of the present application.
Although the terms first, second, etc. are used herein to describe various information, these information should not be limited by these terms. These terms are only used to distinguish one type of information from another. In addition, the singular forms "a", "an" and "the" are intended to include the plural forms as well. The terms "or" and/or "are to be construed as inclusive, or mean any one or any combination. An exception to this definition will occur only when a combination of elements, functions, steps or operations are in some way inherently mutually exclusive.
Claims (4)
1. The magnetic detection method is characterized by comprising the step of detecting based on a magnetic detection device, wherein the magnetic detection device comprises an objective table, an electromagnet and a magnifier assembly, the objective table provides a bearing surface provided with a detection area, the detection area is used for placing an electric element, the electric element comprises a ceramic main body and a plurality of layers of inner electrodes which are sequentially overlapped in the ceramic main body, and the nickel content of the inner electrodes is more than 50%; the electromagnet is arranged on the first side of the bearing surface, and the orthographic projection of the inspection area falls into the orthographic projection of the effective magnetic induction area of the electromagnet along the direction perpendicular to the bearing surface; the magnifying glass assembly is arranged on a second side of the bearing surface, the second side is opposite to the first side, and the observable field of view of the magnifying glass assembly is larger than the inspection area;
The magnetic detection method comprises the following steps:
placing a plurality of electrical elements to be inspected in an inspection area of a bearing surface of an objective table;
electrifying the electromagnet, and controlling the plurality of electrical elements to be in a first arrangement state through a first magnetic field direction;
the magnifying glass assembly is adjusted so that its viewable field of view covers the inspection area to inspect the plurality of electrical components through the viewable field of view of the magnifying glass assembly.
2. The method of claim 1, wherein the magnetic inspection device comprises a knob assembly coupled to the electromagnet; the magnetic detection method further comprises the following steps:
And rotating the knob assembly to rotate the electromagnet to change the first magnetic field direction into the second magnetic field direction so as to control the plurality of electrical elements to be in a second arrangement state.
3. The method of claim 2, wherein the first magnetic field direction and the second magnetic field direction are perpendicular;
The rotating the knob assembly includes:
Rotating the knob assembly deflects clockwise or counterclockwise through an included angle of 90 ° relative to the bearing surface.
4. A magnetic test method according to any one of claims 1 to 3, wherein the first magnetic field direction comprises a direction perpendicular to the carrying surface, and in the first arrangement the multilayer internal electrodes of each electrical element are perpendicular to the carrying surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310133925.2A CN116359127B (en) | 2023-02-16 | 2023-02-16 | Magnetic detection device and magnetic detection method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310133925.2A CN116359127B (en) | 2023-02-16 | 2023-02-16 | Magnetic detection device and magnetic detection method |
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| Publication Number | Publication Date |
|---|---|
| CN116359127A CN116359127A (en) | 2023-06-30 |
| CN116359127B true CN116359127B (en) | 2024-04-16 |
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| CN202310133925.2A Active CN116359127B (en) | 2023-02-16 | 2023-02-16 | Magnetic detection device and magnetic detection method |
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| JPH07115034A (en) * | 1993-10-18 | 1995-05-02 | Murata Mfg Co Ltd | Discrimination method of direction of lamination ceramic capacitor |
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