CN116302735A - Memory slot test system - Google Patents
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Abstract
The invention provides a memory slot test system, wherein the system comprises: the switching card module is used for receiving test output information output by the slot module to be tested when the memory device is accessed with test data; the to-be-tested slot module is used for outputting test output information aiming at the memory device in the test process when the memory device is accessed with test data; the power supply detection module is used for acquiring power supply information of the memory device when the memory device is accessed to the test data; the analysis module is used for receiving the test output information of the adapter card module and the power supply information of the power supply detection module and determining the test result of the slot module to be tested. According to the memory slot testing system provided by the embodiment of the invention, the adapter card module and the slot module to be tested are respectively connected with the memory device in an inserting way, so that the output result of the slot module to be tested can be obtained without damaging the slot module to be tested when the slot module to be tested is tested, and the loss of hardware is reduced.
Description
Technical Field
The present invention relates to the field of computer technologies, and in particular, to a memory slot testing system.
Background
The existing test technical scheme of the memory slot is that theoretical values are given after the theoretical basis of the circuit design of the memory slot is completed, real equipment with the same parameters is used, the theoretical values are connected onto a PCBA (Printed Circuit Board Assembly, assembly printed circuit board) main board, a voltage input end is selected on a memory to be connected onto a universal meter or other test instruments through welding wires, and relevant parameters are recorded after the equipment is pressurized.
In the existing test method, the memory and the main board need to be subjected to wire bonding access, so that the tested main board is damaged. Frequent testing processes result in high hardware loss due to the destruction of the motherboard under test.
Disclosure of Invention
The invention provides a memory slot test system which is used for solving the technical problem that in the process of testing a memory slot in the prior art, the memory and a main board need to be subjected to wire bonding access, so that the tested main board is damaged, and the hardware loss is high.
The invention provides a memory slot test system, comprising:
the first end of the transfer card module is inserted into the slot module to be tested, the second end of the transfer card module is connected with the analysis module, and the transfer card module is used for receiving the test output information output by the slot module to be tested when the memory device is accessed with test data, sending the test output information to the analysis module, and the memory device is inserted into the transfer card module;
the to-be-tested slot module is used for outputting test output information aiming at the memory device in the test process when the memory device is accessed with test data;
the power supply detection module is connected with the analysis module at a first end, and is connected with the memory device at a second end, and is used for acquiring power supply information of the memory device and sending the power supply information to the analysis module when the memory device is connected with test data;
the analysis module is used for receiving the test output information of the adapter card module and the power supply information of the power supply detection module, and determining the test result of the slot module to be tested based on the test output information and the power supply information.
According to the memory slot test system provided by the invention, the memory slot test system further comprises: a bus module;
the first end of the bus module is connected with the memory device, and the second end of the bus module is connected with the slot module to be tested and used for transmitting temperature information of the memory device to the slot module to be tested.
According to the present invention, the memory socket testing system for transmitting the temperature information of the memory device to the socket module to be tested includes:
the bus module transmits the temperature information of the memory device to the slot module to be tested based on a bidirectional two-wire synchronous serial bus.
According to the memory slot test system provided by the invention, the adapter card module is further used for acquiring the temperature information of the slot module to be tested and sending the temperature information to the analysis module.
According to the memory slot test system provided by the invention, after the temperature information is sent to the analysis module, the memory slot test system further comprises:
and the analysis module compares the temperature information with a preset temperature threshold value and determines an operation state analysis result of the slot module to be tested.
According to the memory slot test system provided by the invention, the memory slot test system further comprises: a data link module;
the first end of the data link module is connected with the memory device, and the second end of the data link module is connected with the slot module to be tested and used for transmitting data between the memory device and the slot module to be tested.
According to the memory slot test system provided by the invention, the power supply detection module is also used for supplying power to the memory device.
According to the memory slot test system provided by the invention, the memory slot test system further comprises: an interface module;
the first end of the interface module is connected with the analysis module, and the second end of the interface module is connected with the storage device and used for storing the test result, the test output information and the power supply information of the analysis module.
According to the memory socket testing system provided by the invention, the determining the test result of the socket module to be tested based on the test output information and the power supply information comprises:
based on the power supply information, determining expected output information of the slot module to be tested corresponding to the power supply information;
and comparing the expected output information with the test output information to determine a test result of the slot module to be tested.
According to the memory slot test system provided by the invention, the test output information comprises voltage information, current information and power information.
According to the memory slot testing system provided by the embodiment of the invention, the adapter card module and the slot module to be tested are respectively connected with the memory device in an inserting way, so that the output result of the slot module to be tested can be obtained without damaging the slot module to be tested when the slot module to be tested is tested, and the loss of hardware is reduced. Meanwhile, based on the test output information acquired by the adapter card module and the power supply information of the power supply detection module, the automatic test of the slot module to be detected is realized.
Drawings
In order to more clearly illustrate the invention or the technical solutions of the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described, it being obvious that the drawings in the description below are some embodiments of the invention and that other drawings can be obtained from them without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a memory socket test system according to the present invention;
fig. 2 is a schematic diagram of a device structure of a memory socket test system according to the present invention.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the present invention more apparent, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is apparent that the described embodiments are some embodiments of the present invention, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The server is used as a computer, which runs faster and has higher load than a common computer, and correspondingly uses a large amount of Memory (Memory) as a basis for running and calculating, wherein the Memory is an important part of the server, namely an internal Memory and a main Memory, and is used for temporarily storing operation data in a CPU (Central Processing Unit, a central processing unit) and data exchanged with an external Memory such as a hard disk and the like. The method is a bridge for communicating an external memory with a CPU, and all programs in the computer are run in a memory, so that the strength of the memory performance influences the level of the whole exertion of the computer. The currently used interface types include DDR (Double Data Rate) 3, DDR4, DDR5, etc., and the performance is higher and higher, and a server needs tens of memories for full-allocation test, wherein the DDR5 memories have just been raised, the number is small, the price is high, and frequent plugging is needed in normal flow operation, which is easy to generate loss. Because of the different hardware circuit designs and slot types of the main board, the input voltage, current and power of the DDR5 interface are often influenced, and the input parameters determine whether the performance of the DDR5 interface of the PCBA main board meets the standards. Before the mass production of the product, strict tests are required to ensure that the performance of the product meets the requirements during mass production. The above reasons cause great difficulty in cost control and flow operation of the test. But is a key component of server operation and is a test item.
In the memory slot test process of the related method, the memory and the main board need to be subjected to wire bonding access, so that the tested main board and the memory are damaged. Meanwhile, in order to cope with different test environments, the tester needs to repeatedly collect parameters in different environments with high cost and low efficiency by assistance of external instruments.
In order to solve the problems in the related methods, the present invention provides a memory slot testing system, and fig. 1 is a schematic structural diagram of the memory slot testing system provided by the present invention. Referring to fig. 1, the memory slot test system provided by the present invention includes: the device comprises a riser card module 110, a slot module to be tested 120, a power detection module 130 and an analysis module 140.
The respective parts of the memory socket test system are described below.
The adapter card module 110, the first end of the adapter card module is plugged into the socket module 120 to be tested, the second end of the adapter card module 110 is connected with the analysis module 140, and is used for receiving the test output information output by the socket module 120 to be tested and sending the test output information to the analysis module 140 when the memory device is accessed with the test data, and the memory device is plugged into the adapter card module 110.
The memory device is an important part of the server, also called an internal memory and a main memory, and is used for temporarily storing operation data in a CPU (Central Processing Unit ) and data exchanged with an external memory such as a hard disk. The memory device may be a DDR2, DDR3, DDR4, or DDR5 type memory.
The socket module 120 to be tested is a memory socket, i.e. a socket on the motherboard for inserting a memory device. The type and capacity of memory supported by the motherboard are determined by the memory slots. There are usually at least two memory slots, and at most 4 or 6 or 8 memory slots, mainly the difference of the price of the main board. The memory slots can be used for inserting a plurality of memories, and some chipsets and systems can support 32G or more memories. Memory slots include SIMM (Single Inline Memory Module ), DIMM (Dual-Inline Memory Modules), and the like.
After the memory devices required for testing the memory slots are obtained, the memory devices are plugged into the riser card module 110. The adapter card module includes a memory slot, and the memory device can be directly plugged into the memory slot of the adapter card, so as to realize that the memory device is plugged into the adapter card module 110.
After the memory device is plugged into the adapter card module, the adapter card module plugged with the memory device is plugged into the socket module 120 to be tested. The memory device is plugged into the adapter card module 110, and the adapter card module 110 is plugged into the socket module 120 to be tested, so that the memory device is indirectly plugged into the socket module 120 to be tested.
In the process of testing the memory socket, after the memory device is accessed with the test data, the socket module 120 to be tested is tested. The memory device may be connected to test data, which may be a test voltage connected to the memory device. Since the memory device is indirectly plugged with the socket module 120 to be tested, after the memory device is plugged with the test voltage, the socket module 120 to be tested indirectly plugged with the memory device can obtain the test output information of the socket module 120 to be tested for the test voltage of the memory device. Meanwhile, the second end of the adapter card module 110 is connected to the analysis module 140, and after the analysis module 140 receives the test output information, the output result of the socket module 120 to be tested can be analyzed according to the test output information.
The test output information may be information such as voltage, current, and power output by the socket module 120 to be tested.
It can be understood that, based on the setting of the adapter card module, on one hand, the memory is accessed, on the other hand, the slot module to be tested is accessed, and when the memory device accesses the test data, the output of the slot module to be tested is obtained. The method and the device avoid the connection with the slot to be tested based on the traditional welding mode, acquire the output result of the slot to be tested, and acquire the output result of the slot to be tested under the condition that the slot to be tested is not damaged.
The socket module to be tested 120 is configured to output test output information for the memory device during a test process when the memory device accesses test data.
Since the memory device is indirectly plugged with the socket module 120 to be tested, after the memory device is plugged with the test voltage, the socket module 120 to be tested indirectly plugged with the memory device can obtain the test output information of the socket module 120 to be tested for the test voltage of the memory device.
The test output information is information output by the socket module 120 to be tested after the socket module is connected to the memory device and the test data is connected to the memory device. The information output can be voltage, current, power, etc. After receiving the test output information, the output result of the socket module 120 to be tested may be analyzed for the test output information.
The first end of the power detection module 130 is connected to the analysis module 140, and the second end of the power detection module 130 is connected to the memory device, so as to obtain power information of the memory device when the memory device accesses test data, and send the power information to the analysis module 140.
It can be understood that when the memory device is connected to the test data, the power information of the memory device is obtained during the test process of the memory device. The power information of the memory device reflects the working state of the memory device.
Alternatively, the power information of the memory device may be input voltage information of the memory device. After the input voltage information of the memory device is acquired, the output voltage of the socket module 120 to be tested is acquired. Based on the input voltage information of the memory device and the output voltage of the socket module 120 to be tested, a determination may be made on the test result of the socket module 120 to be tested, to determine whether the voltage output by the socket module 120 to be tested is the expected output.
The power detection module 130 is a parameter of the acquired power plane, such as a voltage, a current, and the like. After the obtained voltage and current information accessed by the memory device, the output of the socket module 120 to be tested is verified based on the obtained voltage and current data output by the socket module 120 to be tested, so that the verification of the socket module 120 to be tested is indirectly realized.
The analysis module 140 is configured to obtain the test output information and the power supply information, and determine a test result of the socket module to be tested 120 based on the test output information and the power supply information.
After the analysis module 140 obtains the test output information of the riser card module 110 and the power information of the power detection module 130, analysis is performed based on the obtained test output information and the power information, and a test result of the socket module 120 to be tested is determined.
For example, after the analysis module 140 obtains the voltage and current information accessed by the memory device, based on the obtained voltage and current data output by the socket module 120 to be tested, the output of the socket module 120 to be tested is verified, so that the verification of the socket module 120 to be tested is indirectly implemented, and based on the determined verification result, the test result of the socket module 120 to be tested can be determined.
According to the memory slot testing system provided by the embodiment of the invention, the adapter card module is connected with the slot module to be tested and the memory device in an inserting way, so that the output result of the slot module to be tested can be obtained by avoiding the damage of the slot module to be tested when the slot module to be tested is tested, and the loss of hardware is reduced. Meanwhile, based on the acquired test output information of the adapter card module and the power supply information of the power supply detection module, the automatic test of the slot module to be detected is realized.
In one embodiment, further comprising: a bus module; the first end of the bus module is connected with the memory device, and the second end of the bus module is connected with the slot module to be tested and used for transmitting temperature information of the memory device to the slot module to be tested.
For the test of the socket module to be tested, the test of the socket module to be tested can be indirectly realized based on the temperature of the monitoring memory device. It can be understood that, in the process of testing the socket module to be tested, if the temperature of the memory device is greatly changed or is higher than the normal range, it can be presumed that the socket module to be tested may be in an abnormal state when the memory device fails.
The first end of the bus module is connected with the memory device, the second end of the bus module is connected with the slot module to be tested, and temperature information of the memory device is transmitted to the slot module to be tested. After the slot module to be tested acquires the temperature information, the acquired temperature information can be transmitted to the analysis module based on the adapter card module and used for further analysis of the slot module to be tested.
According to the memory slot test system provided by the embodiment of the invention, the temperature information of the memory device is transmitted to the slot module to be tested based on the bus module, so that the temperature information of the memory device is monitored in the test process, and the accuracy of the test of the slot module to be tested is further improved.
In one embodiment, transmitting the temperature information of the memory device to the socket module to be tested includes: the bus module transmits the temperature information of the memory device to the slot module to be tested based on a bidirectional two-wire synchronous serial bus.
The bidirectional two-wire synchronous serial bus is an I2C bus, and is a simple bidirectional two-wire synchronous serial bus. It requires only two wires to transfer information between devices connected to the bus.
The bus module transmits temperature information of the memory device to the socket module to be tested based on the I2C bus.
According to the memory slot test system provided by the embodiment of the invention, the bus module is based on the bidirectional two-wire synchronous serial bus, the temperature information of the memory device is transmitted to the slot module to be tested, and the temperature information is transmitted between the memory device and the slot module to be tested.
In one embodiment, the adapter card module is further configured to obtain temperature information of the socket module to be tested, and send the temperature information to the analysis module.
Because the first end of the adapter card module is inserted into the slot module to be tested, the temperature information acquired by the slot module to be tested can be acquired based on the adapter card module. After the adapter card module acquires the temperature information, the acquired temperature information can be transmitted to the analysis module for the analysis module to further analyze the temperature information.
It can be understood that, in the process of testing the socket module to be tested, if the temperature of the memory device is greatly changed or is higher than the normal range, it can be presumed that the socket module to be tested may be in an abnormal state when the memory device fails.
It can be understood that, based on the setting of the adapter card module, on one hand, the memory is accessed, on the other hand, the slot module to be tested is accessed, and when the memory device accesses the test data, the output of the slot module to be tested is obtained. The method and the device avoid the connection with the slot to be tested based on the traditional welding mode, acquire the output result of the slot to be tested, and acquire the output result of the slot to be tested under the condition that the slot to be tested is not damaged. Meanwhile, temperature information acquired by the slot module to be tested is acquired based on the adapter card module. After the adapter card module obtains the temperature information, the obtained temperature information is transmitted to the analysis module so that the analysis module can further analyze the temperature information.
According to the memory slot testing system provided by the embodiment of the invention, the temperature information acquired by the slot module to be tested is acquired based on the adapter card module, and the acquired temperature information is transmitted to the analysis module, so that a foundation is provided for further analysis of the temperature information by the subsequent analysis module.
In one embodiment, after the sending the temperature information to the analysis module, the method further includes: and the analysis module compares the temperature information with a preset temperature threshold value and determines an operation state analysis result of the slot module to be tested.
The preset temperature threshold is determined based on a normal operating range of the memory device. And determining a preset temperature threshold according to the temperature change range of the memory device in the normal test process after the memory device is accessed with the test data. After determining the preset temperature threshold, in the process of monitoring the temperature of the memory device, whether the current memory device is in temperature abnormality can be determined based on the preset temperature threshold. And the corresponding temperature range can be set as a preset temperature threshold according to the test requirement, so that the analysis of the running state of the slot module to be tested is realized.
It can be understood that after determining the preset temperature threshold based on the normal working range of the memory device, the analysis module compares the temperature information with the preset temperature threshold to determine whether the current memory device is normal in the testing process, thereby indirectly realizing the analysis of the running state of the socket module to be tested.
According to the memory slot test system provided by the embodiment of the invention, the temperature information is compared with the preset temperature threshold value based on the analysis module, and whether the temperature of the current memory device is normal in the process of testing is determined, so that the analysis of the running state of the slot module to be tested is indirectly realized.
In one embodiment, further comprising: a data link sub-module; the first end of the data link module is connected with the memory device, and the second end of the data link module is connected with the slot module to be tested and used for transmitting data between the memory device and the slot module to be tested.
The data link module is used for transmitting data between the memory device and the slot module to be tested. The connection between the memory device and the socket module to be tested can be realized based on the fact that the first end of the data link module is connected with the memory device and the second end of the data link module is connected with the socket module to be tested.
It can be understood that when the memory device is accessed to the test data, there is data transmission between the memory device and the socket module to be tested, and the data transmission between the memory device and the socket module to be tested can be realized based on the data link module.
According to the memory slot test system provided by the embodiment of the invention, the first end of the data link module is connected with the memory device, the second end of the data link module is connected with the slot module to be tested, and data transmission between the memory device and the slot module to be tested is realized.
In one embodiment, the power detection module is further configured to power the memory device.
The power supply detection module is used for acquiring power supply information of the memory device when the memory device is accessed to the test data, sending the power supply information to the analysis module and supplying power to the memory device.
The power supply detection module is mainly used for acquiring parameters of a power supply layer, such as parameters of voltage, current and the like. After the obtained voltage and current information accessed by the memory device, verifying the output of the socket module to be tested based on the obtained voltage and current data output by the socket module to be tested, thereby indirectly realizing the verification of the socket module to be tested. Meanwhile, based on the power detection module, power is supplied to the memory device, and the flexibility of the use of the power detection module is improved.
The memory slot test system provided by the embodiment of the invention supplies power to the memory device based on the power supply detection module, so that the normal power supply of the memory device is ensured.
In one embodiment, further comprising: an interface module; the first end of the interface module is connected with the analysis module, and the second end of the interface module is connected with the storage device and used for storing the test result, the test output information and the power supply information of the analysis module.
After the analysis device obtains the test output information of the adapter card module and the power supply information of the power supply detection module, and determines the test result of the slot module to be tested based on the obtained test output information of the adapter card module and the power supply information of the power supply detection module, the test result of the analysis module and the test output information of the adapter card module and the power supply information of the power supply detection module obtained by the analysis module can be obtained based on the interface module connected with the analysis module.
The second end of the interface module is connected with the storage device, and after the interface module obtains the test result, the test output information and the power supply information of the analysis module, the obtained test result, the test output information and the power supply information are sent to the storage device. The storage device receives and stores the test result, the test output information and the power supply information so as to acquire and analyze the stored data according to the requirement.
The memory slot test system provided by the embodiment of the invention is used for transmitting the acquired test result, the test output information and the power supply information to the storage device based on the analysis module. The storage of the test process data of the slot module to be tested is realized.
In one embodiment, determining the test result of the socket module to be tested based on the test output information and the power supply information includes: based on the power supply information, determining expected output information of the slot module to be tested corresponding to the power supply information; and comparing the expected output information with the test output information to determine a test result of the slot module to be tested.
After the test output information and the power supply information are obtained, a test result of the socket module to be tested can be determined based on the test output information and the power supply information. For example, based on the input voltage information of the memory device and the output voltage of the socket module to be tested, the test result of the socket module to be tested may be determined, and whether the voltage output by the socket module to be tested is the expected output may be determined. The power detection module is used for acquiring parameters of a power plane, such as voltage, current and the like. After the obtained voltage and current information accessed by the memory device, verifying the output of the socket module to be tested based on the obtained voltage and current data output by the socket module to be tested, thereby indirectly realizing the verification of the socket module to be tested.
According to the memory slot test system provided by the embodiment of the invention, the test result of the to-be-tested slot module can be determined based on the test output information and the power supply information after the test output information and the power supply information are acquired, so that the determination of the test result of the to-be-tested slot module is realized.
In one embodiment, the test output information includes voltage information, current information, and power information.
And when the memory device is accessed with test data, outputting test output information aiming at the memory device in the test process, wherein the test data information comprises voltage information, current information and power information.
Alternatively, the power information of the memory device may be input voltage information of the memory device. After the input voltage information of the memory device is obtained, the output voltage and the output current of the slot module to be tested are obtained. And based on the output voltage and current of the socket module to be tested, the output power of the socket module to be tested can be determined.
According to the memory slot test system provided by the embodiment of the invention, the test data information comprises the voltage information, the current information and the power information, so that a foundation is provided for subsequent analysis of the test data information output by the slot module to be tested.
The technical scheme provided by the invention is described below by taking a schematic device structure diagram of a memory slot test system provided by the invention as an example:
as shown in fig. 2, the apparatus includes: DDR5 memory slot module 210, DDR5 memory 220, power detection module 230, MCU module 240, serial interface 250, type-C interface 260.
The adapter card is inserted into the DDR5 memory slot module 210 to be tested, and then the adapter card is connected to the real DDR5 memory 220 which needs to be verified and adapted.
The DDR5 memory socket module 210 to be tested is a memory socket, i.e., a socket on the motherboard for inserting a memory device. The type and capacity of memory supported by the motherboard are determined by the memory slots. There are usually at least two memory slots, and at most 4 or 6 or 8 memory slots, mainly the difference of the price of the main board. The memory slots can be used for inserting a plurality of memories, and some chipsets and systems can support 32G or more memories. Memory slots include SIMMs, DIMMs, and the like.
After the DDR5 memory 220 required by the DDR5 memory socket module 210 is obtained, the DDR5 memory 220 is plugged into the adapter card. The adapter card includes a memory slot, and the DDR5 memory 220 can be directly plugged into the memory slot of the adapter card, so as to realize that the DDR5 memory 220 is indirectly plugged into the DDR5 memory slot module 210.
Based on the setting of the adapter card, the memory is accessed on one hand, and the DDR5 memory slot module 210 is accessed on the other hand, and when the DDR5 memory 220 is accessed to test data, the DDR5 memory slot module 210 outputs. The method and the device avoid the connection with the slot to be tested based on the traditional welding mode, acquire the output result of the slot to be tested, and acquire the output result of the slot to be tested under the condition that the slot to be tested is not damaged.
After the DDR5 memory 220 is plugged into the adapter card, the adapter card plugged with the DDR5 memory 220 is plugged into the DDR5 memory socket module 210. The DDR5 memory 220 is plugged into the adapter card, which is plugged into the DDR5 memory slot module 210, thereby realizing indirect plugging of the memory device into the DDR5 memory slot module 210.
The MCU module 240 is configured to obtain voltage and current data output by the DDR5 memory socket module 210 during the testing process after accessing the memory, and combine with a developed driver to perform data conversion on the obtained data with reference to the SPEC of the chip, and write the data into the cache of the MCU module 240.
In the process of testing the DDR5 memory socket module 210, after the DDR5 memory 220 is accessed with test data, the DDR5 memory socket module 210 is tested. The DDR5 memory 220 is connected to test data, and may be connected to test voltage for the DDR5 memory 220. Because the DDR5 memory 220 is indirectly plugged into the DDR5 memory socket module 210, after the DDR5 memory 220 is plugged into the test voltage, the DDR5 memory socket module 210 indirectly plugged into the DDR5 memory 220 can obtain voltage and current data output by the DDR5 memory socket module 210 for the test voltage of the DDR5 memory 220. Meanwhile, after the MCU module 240 receives the output voltage and current data, the MCU module 240 may analyze the output voltage and current data of the DDR5 memory socket module 210 with respect to the output voltage and current data, thereby determining a test analysis result of the DDR5 memory socket module 210.
The serial port interface 250 and the Type-C interface 260 can continuously output the analysis information obtained by the MCU module 240 to an external data receiving end, so as to retain data and subsequent data analysis, and realize unmanned monitoring automatic test.
The power detection module 230 obtains the power information on the real DDR5 memory 220, transmits the power information to the MCU module 240 for further data processing and analysis, and simultaneously supplies power to the real DDR5 memory to ensure normal work power supply.
Based on the I2C bus, the temperature information between the DDR5 memory socket module 210 and the DDR5 memory 220 is transmitted between the DDR5 memory socket module 210 and the DDR5 memory 220. Based on the data link, the DDR5 memory socket module 210 and the DDR5 memory 220 implement data transmission between the DDR5 memory socket module 210 and the DDR5 memory 220.
The apparatus embodiments described above are merely illustrative, wherein the elements illustrated as separate elements may or may not be physically separate, and the elements shown as elements may or may not be physical elements, may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present invention without undue burden.
From the above description of the embodiments, it will be apparent to those skilled in the art that the embodiments may be implemented by means of software plus necessary general hardware platforms, or of course may be implemented by means of hardware. Based on this understanding, the foregoing technical solution may be embodied essentially or in a part contributing to the prior art in the form of a software product, which may be stored in a computer readable storage medium, such as ROM/RAM, a magnetic disk, an optical disk, etc., including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method described in the respective embodiments or some parts of the embodiments.
Finally, it should be noted that: the above embodiments are only for illustrating the technical solution of the present invention, and are not limiting; although the invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present invention.
Claims (10)
1. A memory socket test system, comprising:
the first end of the transfer card module is inserted into the slot module to be tested, the second end of the transfer card module is connected with the analysis module, and the transfer card module is used for receiving the test output information output by the slot module to be tested when the memory device is accessed with test data, sending the test output information to the analysis module, and the memory device is inserted into the transfer card module;
the to-be-tested slot module is used for outputting test output information aiming at the memory device in the test process when the memory device is accessed with test data;
the power supply detection module is connected with the analysis module at a first end, and is connected with the memory device at a second end, and is used for acquiring power supply information of the memory device and sending the power supply information to the analysis module when the memory device is connected with test data;
the analysis module is used for receiving the test output information of the adapter card module and the power supply information of the power supply detection module, and determining the test result of the slot module to be tested based on the test output information and the power supply information.
2. The memory socket testing system of claim 1, further comprising: a bus module;
the first end of the bus module is connected with the memory device, and the second end of the bus module is connected with the slot module to be tested and used for transmitting temperature information of the memory device to the slot module to be tested.
3. The memory socket testing system according to claim 2, wherein the transmitting the temperature information of the memory device to the socket module to be tested comprises:
the bus module transmits the temperature information of the memory device to the slot module to be tested based on a bidirectional two-wire synchronous serial bus.
4. The memory socket testing system according to claim 2, wherein the adapter card module is further configured to obtain temperature information of the socket module to be tested, and send the temperature information to the analysis module.
5. The memory socket testing system of claim 4, wherein after sending the temperature information to the analysis module, further comprising:
and the analysis module compares the temperature information with a preset temperature threshold value and determines an operation state analysis result of the slot module to be tested.
6. The memory socket testing system of claim 1, further comprising: a data link module;
the first end of the data link module is connected with the memory device, and the second end of the data link module is connected with the slot module to be tested and used for transmitting data between the memory device and the slot module to be tested.
7. The memory socket test system of claim 1, wherein the power detection module is further configured to power the memory device.
8. The memory socket testing system of claim 1, further comprising: an interface module;
the first end of the interface module is connected with the analysis module, and the second end of the interface module is connected with the storage device and used for storing the test result, the test output information and the power supply information of the analysis module.
9. The memory socket testing system according to claim 1, wherein the determining the test result of the socket module to be tested based on the test output information and the power supply information comprises:
based on the power supply information, determining expected output information of the slot module to be tested corresponding to the power supply information;
and comparing the expected output information with the test output information to determine a test result of the slot module to be tested.
10. The memory socket test system of any one of claims 1-9, wherein the test output information includes voltage information, current information, and power information.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310070414.0A CN116302735A (en) | 2023-01-19 | 2023-01-19 | Memory slot test system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310070414.0A CN116302735A (en) | 2023-01-19 | 2023-01-19 | Memory slot test system |
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| CN116302735A true CN116302735A (en) | 2023-06-23 |
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| CN202310070414.0A Pending CN116302735A (en) | 2023-01-19 | 2023-01-19 | Memory slot test system |
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| CN (1) | CN116302735A (en) |
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- 2023-01-19 CN CN202310070414.0A patent/CN116302735A/en active Pending
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