CN116223913B - Single resistance testing device and system in Wheatstone bridge - Google Patents
Single resistance testing device and system in Wheatstone bridge Download PDFInfo
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- CN116223913B CN116223913B CN202211683217.8A CN202211683217A CN116223913B CN 116223913 B CN116223913 B CN 116223913B CN 202211683217 A CN202211683217 A CN 202211683217A CN 116223913 B CN116223913 B CN 116223913B
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- 238000000926 separation method Methods 0.000 claims description 4
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
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Abstract
The invention discloses a single resistance testing device and a system in a Wheatstone bridge, which are provided with two testing tables, wherein the first testing table and the second testing table both comprise: a magnetic field device and a printed circuit board; the magnetic field device generates a test magnetic field; the Wheatstone bridge is connected with a test circuit of the printed circuit board; the printed circuit board is led out of a plurality of test points which are connected with the upper computer; and the upper computer reversely solves the resistance value of the single resistor in the Wheatstone bridge based on the voltage of each test point, and fits the TC curve of the single resistor based on the test magnetic field and the resistance value of the single resistor. The test device and the test method can acquire the relation between the single bridge arm resistance or the single magnetoresistive element of the chip and the magnetic field, namely the sensitivity of the single bridge arm resistance or the single magnetoresistive element of the chip can be acquired, the test requirement on the sensitivity performance of the chip is met, and meanwhile, the test device and the test method can be used as a standard for judging good quality and reduce the outflow of defective products.
Description
Technical Field
The invention relates to the technical field of Wheatstone bridges, in particular to a single resistance testing device and a single resistance testing system in a Wheatstone bridge.
Background
The bridge circuit of the wheatstone bridge magnetoresistive sensor is generally divided into a half-bridge structure and a full-bridge structure; both the half-bridge circuit structure and the full-bridge circuit structure comprise magnetoresistive elements with different sensitivity directions. For example: in a general design, for a half-bridge circuit, the half-bridge circuit comprises two bridge arms, and the sensitivity directions of magnetoresistive elements on the two bridge arms are opposite; for a full bridge circuit, the full bridge circuit comprises four bridge arms, the sensitivity directions of the magnetoresistive elements on the corresponding bridge arms are the same, and the sensitivity directions of the magnetoresistive elements on the adjacent bridge arms are opposite.
The TC curve refers to a linear curve of the output of the magnetoresistive sensor product, which changes along with the change of the magnetic field, and the basic characteristics of the product, such as the sensitivity, the 0 magnetic field output, the precision and the like, can be obtained through the curve, and the product quality can be judged through the parameters. For the Wheatstone bridge magneto-resistance sensor chip, the standard for judging the performance quality of the sensor chip is to look at the performance of a single bridge arm resistor or a single magneto-resistance element in the chip besides the overall performance of the sensor chip.
The traditional chip test fixture provides an absolute magnetic field (the size and the direction remain unchanged), so that when a Wheatstone bridge magnetoresistive sensor chip is tested, the relation between a single bridge arm resistor or a single magnetoresistive element inside the chip and the magnetic field (the sensitivity of the single bridge arm resistor or the single magnetoresistive element) cannot be obtained, thereby influencing the judgment of the excellent performance of the gradient magnetoresistive sensor chip, causing the outflow of defective products and seriously influencing the benefit.
The traditional testing mode is mainly aimed at chips in absolute magnetic field type, gradient chips cannot be tested, and the traditional testing mode has the defects of low testing efficiency, difficult operation and large workload. Meanwhile, the number of daily production of chips is large, the traditional detection mode is high in cost and low in efficiency, production dislocation is easy to cause, and benefits are seriously influenced.
Disclosure of Invention
Therefore, the technical problem to be solved by the invention is to overcome the defect that single resistor in the Wheatstone bridge is not easy to test in the prior art, so as to provide a single resistor testing device and a single resistor testing system in the Wheatstone bridge.
In order to achieve the above purpose, the present invention provides the following technical solutions:
In a first aspect, an embodiment of the present invention provides a single-resistance testing device in a wheatstone bridge, including a first testing bench and a second testing bench, where the first testing bench and the second testing bench both include: a magnetic field device and a printed circuit board; the magnetic field device generates a test magnetic field; the Wheatstone bridge is connected with a test circuit of the printed circuit board; the printed circuit board is led out of a plurality of test points which are connected with the upper computer; and the upper computer reversely solves the resistance value of the single resistor in the Wheatstone bridge based on the voltage of each test point, and fits the TC curve of the single resistor based on the test magnetic field and the resistance value of the single resistor.
In one embodiment, a printed circuit board of a first test station includes: a power supply end, a grounding end and bridge arm test points; the power end is connected with the first end of each half bridge arm of the Wheatstone bridge and an external excitation source; the grounding end is connected with the second end of each half bridge arm of the Wheatstone bridge; the bridge arm test point is connected with the midpoint of each half bridge arm of the Wheatstone bridge and the upper computer, and the bridge arm test point leads out the midpoint voltage of each half bridge arm.
In one embodiment, the printed circuit board of the second test station includes: the system comprises a first power supply end, a second power supply end, a total voltage test point, a bridge arm test point and a test resistor; the first power end is connected with the first end of each half bridge arm of the Wheatstone bridge, the second end of each half bridge arm and the first end of an external excitation source; the midpoint of each half bridge arm of the Wheatstone bridge is connected with a second power end through a test resistor, and the second power end is connected with a second end of an external excitation source; the total voltage test point is connected with the first end of each half bridge arm and the second end of each half bridge arm of the Wheatstone bridge, and the total voltage test point leads out the total voltage of the Wheatstone bridge; the bridge arm test points are connected with the middle point of each half bridge arm of the Wheatstone bridge, and the bridge arm test points lead out the middle point voltage of each half bridge arm of the Wheatstone bridge.
In an embodiment, the first test station and the second test station each further comprise: the device comprises a first fixed plate, a non-magnetic metal probe, a reference chip and a carrier plate; the Wheatstone bridge is integrated in the chip to be tested, the chip to be tested is fixed in the groove of the first fixing plate, and the bonding pad at the bottom of the chip to be tested is connected with the printed circuit board through the nonmagnetic metal probe; the reference chip is attached to the carrier plate, and the carrier plate is connected with the printed circuit board; the reference chip is used for detecting the magnetic field intensity and sending the magnetic field intensity to the upper computer.
In one embodiment, the magnetic field device comprises: a magnetic core structure, a current coil; the current coil is wound on the magnetic core structure and is supplied with test current.
In one embodiment, the magnetic core structure comprises: a magnetic core and a skeleton; the magnetic core is fixed to the frame.
In an embodiment, the magnetic field device further comprises: the second fixing plate and the first nonmagnetic screw; the first fixing plate, the second fixing plate and the printed circuit board are provided with a plurality of first positioning holes; the first nonmagnetic screw is used for sequentially fixing the first fixing plate, the printed circuit board and the second fixing plate through the first positioning hole.
In an embodiment, the magnetic field device further comprises: a second non-magnetic screw; the second fixing plate and the printed circuit board are provided with a plurality of second positioning holes; the second non-magnetic screw is used for sequentially fixing the printed circuit board and the second fixing plate through the second positioning hole.
In one embodiment, a plurality of second positioning holes are formed in the framework; the second non-magnetic screw is used for fixing the printed circuit board, the second fixing plate and the framework in sequence through the second locating hole.
In one embodiment, the single resistance testing device in the wheatstone bridge further comprises: a base; the skeleton is fixed to the base.
In a second aspect, an embodiment of the present invention provides a single resistance testing system in a wheatstone bridge, based on the testing apparatus of the first aspect, the system includes: the upper computer and the turret type test and separation integrated machine; the base is connected with the turret type testing and sorting integrated machine; the test and sorting integrated machine clamps the chip to be tested to the first test table and the second test table in sequence for testing; the upper computer reversely solves the resistance value of the single resistor in the Wheatstone bridge based on the voltage of each test point, and fits the TC curve of the single resistor based on the test magnetic field and the resistance value of the single resistor; the upper computer judges the performance grade of the chip to be tested based on the fitted TC curve of the single resistor and a preset TC curve; the turret type testing and sorting integrated machine sorts and discharges the chips to be tested based on the performance grade of the chips to be tested.
The invention provides a single resistance testing device in a Wheatstone bridge, which is provided with two testing tables, wherein the first testing table and the second testing table comprise: a magnetic field device and a printed circuit board; the magnetic field device generates a test magnetic field; the Wheatstone bridge is connected with a test circuit of the printed circuit board; the printed circuit board is led out of a plurality of test points which are connected with the upper computer; and the upper computer reversely solves the resistance value of the single resistor in the Wheatstone bridge based on the voltage of each test point, and fits the TC curve of the single resistor based on the test magnetic field and the resistance value of the single resistor. The test device and the test method can acquire the relation between the single bridge arm resistance or the single magnetoresistive element of the chip and the magnetic field, namely the sensitivity of the single bridge arm resistance or the single magnetoresistive element of the chip can be acquired, the test requirement on the sensitivity performance of the chip is met, and meanwhile, the test device and the test method can be used as a standard for judging good quality and reduce the outflow of defective products.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are needed in the description of the embodiments or the prior art will be briefly described, and it is obvious that the drawings in the description below are some embodiments of the present invention, and other drawings can be obtained according to the drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic diagram of a first test bench printed circuit board according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a second test bench printed circuit board according to an embodiment of the present invention;
FIG. 3 is an exploded view of a first test station and a second test station according to an embodiment of the present invention;
FIG. 4 is a block diagram of a specific example of a magnetic core structure provided by an embodiment of the present invention;
FIG. 5 is a structural exploded view of one specific example of a magnetic core structure provided by an embodiment of the present invention;
FIG. 6 is a schematic diagram of a winding structure of a magnetic core according to an embodiment of the present invention;
fig. 7 is a block diagram showing a specific example of a second fixing plate according to an embodiment of the present invention;
FIG. 8 is a block diagram of a specific example of a base provided by an embodiment of the present invention;
Fig. 9 is a block diagram of a specific example of a test apparatus according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made apparent and fully in view of the accompanying drawings, in which some, but not all embodiments of the invention are shown. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In the description of the present invention, it should be noted that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, it should be noted that, unless explicitly specified and limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, and may be either fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; the two components can be directly connected or indirectly connected through an intermediate medium, or can be communicated inside the two components, or can be connected wirelessly or in a wired way. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
In addition, the technical features of the different embodiments of the present invention described below may be combined with each other as long as they do not collide with each other.
Example 1
The embodiment of the invention provides a single-resistance testing device in a Wheatstone bridge, which comprises a first testing table and a second testing table, wherein the first testing table and the second testing table are used for carrying out serial testing. Specifically, the wheatstone bridge is integrated in a chip to be tested, the first test bench and the second test bench test the chip to be tested in sequence to obtain a plurality of test voltages, and the upper computer reversely solves the resistance value of a single resistor in the wheatstone bridge based on each test voltage and fits the TC curve of the single resistor based on the test magnetic field and the resistance value of the single resistor.
Specifically, the first test bench and the second test bench each include: magnetic field device and printed circuit board.
Specifically, the magnetic field device generates a test magnetic field whose field strength and direction are controllable in order to obtain a TC curve (magnetic field-resistance curve).
Specifically, the wheatstone bridge is connected with a test circuit of the printed circuit board; the printed circuit board is led out a plurality of test points, the test points are connected with the upper computer, each test point is led out test voltage, and the test voltage comprises bridge arm midpoint voltage, total voltage and the like, and is not limited herein.
Specifically, the test circuits of the printed circuit boards of the first test bench and the second test bench are different, so that the Wheatstone bridge is arranged in different test circuits to form different test loops, and different test voltages are obtained.
In one embodiment, the printed circuit board of the first test station includes: a power supply end, a grounding end and bridge arm test points; the power end is connected with the first end of each half bridge arm of the Wheatstone bridge and an external excitation source; the grounding end is connected with the second end of each half bridge arm of the Wheatstone bridge; the bridge arm test point is connected with the midpoint of each half bridge arm of the Wheatstone bridge and the upper computer, and the bridge arm test point leads out the midpoint voltage of each half bridge arm.
Specifically, after the wheatstone bridge is connected to the printed circuit board of the first test bench, a test schematic is shown in fig. 1. In fig. 1, R1 to R4 are bridge arm resistances in the wheatstone full bridge circuit, the resistances R1 and R2 form a half bridge arm, and the resistances R3 and R4 form a half bridge arm, so that the two half bridge arms are connected in parallel to form a wheatstone bridge in a full bridge form.
Specifically, in fig. 1, a midpoint (point ①) on a connection line of R1 and R2 is connected to a bridge arm test point, a midpoint (point ②) on a connection line of R3 and R4 is connected to a bridge arm test point, a VCC terminal (point ③) is connected to a power supply terminal, and a GND terminal (point ④) is connected to a ground terminal.
In one embodiment, the printed circuit board of the second test station includes: the system comprises a first power supply end, a second power supply end, a total voltage test point, a bridge arm test point and a test resistor; the first power end is connected with the first end of each half bridge arm of the Wheatstone bridge, the second end of each half bridge arm and the first end of an external excitation source; the midpoint of each half bridge arm of the Wheatstone bridge is connected with a second power end through a test resistor, and the second power end is connected with a second end of an external excitation source; the total voltage test point is connected with the first end of each half bridge arm and the second end of each half bridge arm of the Wheatstone bridge, and the total voltage test point leads out the total voltage of the Wheatstone bridge; the bridge arm test points are connected with the middle point of each half bridge arm of the Wheatstone bridge, and the bridge arm test points lead out the middle point voltage of each half bridge arm of the Wheatstone bridge.
Specifically, after the wheatstone bridge is connected to the printed circuit board of the first test bench, a test schematic is shown in fig. 2. In fig. 2, R1 to R4 are bridge arm resistances in the wheatstone full bridge circuit, the resistances R1 and R2 form a half bridge arm, and the resistances R3 and R4 form a half bridge arm, so that the two half bridge arms are connected in parallel to form a wheatstone bridge in a full bridge form. Wherein R5 and R6 are test resistors on the printed circuit board.
Specifically, in fig. 2, the first end and the second end of each half bridge arm are connected to the first power supply end, that is, the point ① in fig. 2 is connected to the first power supply end; the midpoint of each half bridge arm is connected with a second power end through a test resistor, namely, the midpoint (point ④) on the connecting line of R1 and R2 is connected with a bridge arm test point, and the midpoint (point ⑤) on the connecting line of R3 and R4 is connected with a bridge arm test point; the total voltage test point leads out the total voltage of the Wheatstone bridge, namely, the point ② or the point ③ leads out the total voltage of the Wheatstone bridge; the midpoint voltage of each half bridge arm of the Wheatstone bridge is led out from the bridge arm test points, namely, the midpoint voltage of the connected half bridge arm is led out from the points ④ and ⑤; point ⑥ is connected to a second power supply terminal.
Specifically, in fig. 2, VIP is the total voltage; VI1 and VI2 are voltages at two ends of a single resistor on a branch; resistors on the bridge arms of R1-R4; i1 and I2 are currents of the branch circuit; ip+ is the current input; IP-is the current output.
Taking fig. 1 and fig. 2 as an example, the process of testing the resistance of a single resistor in a wheatstone bridge according to the embodiment of the present invention is as follows:
In fig. 1, the result is from the equality and ohm of the current in the series circuit:
VCC/(R1+R2)＝V1/R2 (1)
In fig. 2, the total voltage of each branch in the parallel circuit is equal, the current in the series circuit is equal, and the total voltage is equal to each voltage sum and ohm's law:
VIP-VI1＝V(R1//R2)，VI1/R5＝I1 (2)
Wherein V (R1//R2) represents the voltage after R1 and R2 are connected in parallel.
From the above formula, it can be deduced
R1＝(VCC-V1)/V1*R2 (3)
R2＝(VIP-VI1)*R5*R1/[(VI1*R1)-(VIP-VT1)*R5] (4)
Is obtainable by the formula (3) and the formula (4)
R2＝(VIP-VI1)*R5/(VI1*(VCC-V1)) (5)
R1＝(VIP-VI1)*R5/V1/VI1 (6)
And because R5, VCC and VIP are known, VI1, VI2, V1 and V2 are acquired signals and also known data, the resistance values of R1 and R2 can be obtained, the curve of the bridge output in the magnetic field can be fitted through the curve of the resistance value changing along with the magnetic field, namely, a TC curve is obtained, and the basic characteristics of the product are obtained through the TC curve.
It should be noted that, in fig. 1 and 2, only the wheatstone bridge is taken as an example of the full-bridge circuit, and the half-bridge circuit can be tested according to this principle.
In one embodiment, as shown in fig. 3, the first test bench and the second test bench each further include: a first fixing plate 7, a non-magnetic metal probe 4, a reference chip 5 and a carrier plate 6.
Specifically, in fig. 3, a wheatstone bridge is integrated in a chip 8 to be tested, the chip 8 to be tested is fixed in a groove of the first fixing plate 7, the groove is provided with a yielding hole 9, and a bonding pad at the bottom of the chip 8 to be tested is connected with the printed circuit board 3 through the nonmagnetic metal probe 4; the reference chip 5 is attached to the carrier plate 6, and the carrier plate 6 is connected with the printed circuit board 3; the reference chip 5 is used for detecting the magnetic field intensity and transmitting the magnetic field intensity to the upper computer.
In a specific embodiment, the magnetic field means comprises: a magnetic core structure, current coil 15 in fig. 5; a current coil 15 is wound around the core structure and is supplied with a test current. Wherein the core structure is shown in fig. 4.
Specifically, as shown in fig. 4, the magnetic core structure includes: a magnetic core 1 and a bobbin 14; the core 1 is fixed to the bobbin 14. The magnetic core 1 is arranged on the framework 14 and then the current coil 15 is wound, and the framework 14 prevents the friction between the conducting wire and the magnetic core 1 from generating short circuit.
The principle of the magnetic field device in the embodiment of the invention is shown in fig. 6, and the direction of the generated magnetic field is judged according to the right-hand spiral rule, and because alternating current is fed, a variable magnetic field can be applied to the chip to be tested and the reference chip 5.
In a specific embodiment, the magnetic field device further comprises: the second fixing plate and the first nonmagnetic screws, and a plurality of first positioning holes are formed in the first fixing plate 7, the second fixing plate and the printed circuit board 3; the first nonmagnetic screw is used for fixing the first fixing plate 7, the printed circuit board 3 and the second fixing plate in sequence through the first positioning hole.
In a specific embodiment, the magnetic field device further comprises: a second non-magnetic screw; the second fixing plate and the printed circuit board 3 are provided with a plurality of second positioning holes; the second non-magnetic screw is used for fixing the printed circuit board 3 and the second fixing plate in sequence through the second positioning hole.
In one embodiment, the frame 14 is provided with a plurality of second positioning holes; the second non-magnetic screw is used for fixing the printed circuit board 3, the second fixing plate and the framework 14 in sequence through the second positioning hole.
Specifically, as shown in fig. 7, the second fixing plate 2 is provided with a first positioning hole 12 and a second positioning hole 10, and the first fixing plate 7, the second fixing plate 2 and the first positioning hole 12 on the printed circuit board 3 are all through holes; meanwhile, the second positioning holes 10 on the second fixing plate 2 and the printed circuit board 3 are through holes.
In one embodiment, as shown in fig. 8, the single resistance testing device in the wheatstone bridge further includes: a base 13; as shown in fig. 9, the frame 14 is fixed to the base 13.
Example 2
The embodiment of the invention provides a single resistance test system in a Wheatstone bridge, which is based on the test device of the embodiment 1 and comprises the following components: the upper computer and the turret type test and separation integrated machine; the base is connected with the turret type testing and sorting integrated machine.
Specifically, the test and sorting integrated machine sequentially clamps the chip to be tested to a first test table and a second test table for testing; the upper computer reversely solves the resistance value of the single resistor in the Wheatstone bridge based on the voltage of each test point, and fits the TC curve of the single resistor based on the test magnetic field and the resistance value of the single resistor; the upper computer judges the performance grade of the chip to be tested based on the fitted TC curve of the single resistor and a preset TC curve; the turret type testing and sorting integrated machine sorts and discharges the chips to be tested based on the performance grade of the chips to be tested.
Specifically, the turret type test and sorting integrated machine is used for automatically sucking the chip to be tested onto the test device (the bonding pad of the chip 8 to be tested is downward placed in the groove at the top of the first fixing plate 7) for testing, and grading the chip to be tested according to good products and defective products after the test is finished. Because a single-resistor test mode is adopted, two test devices are required to carry out serial test, a chip firstly acquires output data through a first test device, then further acquires the output data through a second test device, the acquired data of the two times are uploaded to an upper computer through an acquisition card, then the upper computer carries out data processing, calculation and judgment on good products and defective products, and finally a turret type test and sorting integrated machine carries out grading and discharging according to the good products and the defective products.
It is apparent that the above examples are given by way of illustration only and are not limiting of the embodiments. Other variations or modifications of the above teachings will be apparent to those of ordinary skill in the art. It is not necessary here nor is it exhaustive of all embodiments. And obvious variations or modifications thereof are contemplated as falling within the scope of the present invention.
Claims (9)
1. The utility model provides a single resistance testing arrangement in wheatstone bridge, its characterized in that includes first testboard, second testboard, wherein, first testboard and the second testboard all includes:
a magnetic field device and a printed circuit board;
The magnetic field device generates a test magnetic field;
the Wheatstone bridge is connected with a test circuit of the printed circuit board;
The printed circuit board is led out of a plurality of test points, and the test points are connected with an upper computer;
The upper computer reversely solves the resistance value of the single resistor in the Wheatstone bridge based on the voltage of each test point, and fits the TC curve of the single resistor based on the test magnetic field and the resistance value of the single resistor;
The printed circuit board of the first test bench includes: a power supply end, a grounding end and bridge arm test points; the power end is connected with the first end of each half bridge arm of the Wheatstone bridge and an external excitation source; the grounding end is connected with the second end of each half bridge arm of the Wheatstone bridge; the bridge arm test points are connected with the midpoint of each half bridge arm of the Wheatstone bridge and the upper computer, and the bridge arm test points lead out the midpoint voltage of each half bridge arm;
The printed circuit board of the second test bench includes: the system comprises a first power supply end, a second power supply end, a total voltage test point, a bridge arm test point and a test resistor; the first power end is connected with the first end of each half bridge arm of the Wheatstone bridge, and the second end of each half bridge arm is externally connected with the first end of an excitation source; the midpoint of each half bridge arm of the Wheatstone bridge is connected with the second power end through a test resistor, and the second power end is connected with the second end of an external excitation source; the total voltage test point is connected with the first end of each half bridge arm and the second end of each half bridge arm of the Wheatstone bridge, and the total voltage test point leads out the total voltage of the Wheatstone bridge; the bridge arm test points are connected with the middle point of each half bridge arm of the Wheatstone bridge, and the bridge arm test points lead out the middle point voltage of each half bridge arm of the Wheatstone bridge.
2. The wheatstone bridge single resistance testing apparatus of claim 1, wherein the first test bench and the second test bench each further comprise:
The device comprises a first fixed plate, a non-magnetic metal probe, a reference chip and a carrier plate;
The Wheatstone bridge is integrated in a chip to be tested, the chip to be tested is fixed in the groove of the first fixing plate, and a bonding pad at the bottom of the chip to be tested is connected with the printed circuit board through the nonmagnetic metal probe;
The reference chip is attached to the carrier plate, and the carrier plate is connected with the printed circuit board;
The reference chip is used for detecting the magnetic field intensity and sending the magnetic field intensity to the upper computer.
3. The wheatstone bridge single resistance testing device of claim 2, wherein the magnetic field means comprises:
a magnetic core structure, a current coil;
The current coil is wound on the magnetic core structure and is supplied with test current.
4. A wheatstone bridge single resistance testing device as claimed in claim 3, wherein the magnetic core structure comprises:
A magnetic core and a skeleton;
The magnetic core is fixed to the backbone.
5. The wheatstone bridge single resistance testing device of claim 4, wherein the magnetic field device further comprises:
The second fixing plate and the first nonmagnetic screw;
The first fixing plate, the second fixing plate and the printed circuit board are provided with a plurality of first positioning holes;
The first nonmagnetic screw is used for sequentially fixing the first fixing plate, the printed circuit board and the second fixing plate through the first positioning hole.
6. The wheatstone bridge single resistance testing device of claim 5, wherein the magnetic field device further comprises:
A second non-magnetic screw;
the second fixing plate and the printed circuit board are provided with a plurality of second positioning holes;
the second non-magnetic screw is used for sequentially fixing the printed circuit board and the second fixing plate through the second positioning hole.
7. The wheatstone bridge single resistance testing apparatus as claimed in claim 6, wherein,
A plurality of second positioning holes are formed in the framework;
the second non-magnetic screw is used for sequentially fixing the printed circuit board, the second fixing plate and the framework through the second locating hole.
8. The wheatstone bridge single resistance testing apparatus of claim 7, further comprising:
a base;
the armature is secured to the base.
9. A single resistance testing system in a wheatstone bridge, wherein the system comprises, based on the testing device of claim 8:
the upper computer and the turret type test and separation integrated machine;
The base is connected with the turret type test and separation integrated machine;
the test and sorting integrated machine sequentially clamps the chip to be tested to a first test table and a second test table for testing;
The upper computer reversely solves the resistance value of the single resistor in the Wheatstone bridge based on the voltage of each test point, and fits the TC curve of the single resistor based on the test magnetic field and the resistance value of the single resistor;
The upper computer judges the performance grade of the chip to be tested based on the fitted TC curve of the single resistor and a preset TC curve;
the turret type testing and sorting integrated machine sorts and discharges the chips to be tested based on the performance grade of the chips to be tested.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211683217.8A CN116223913B (en) | 2022-12-27 | 2022-12-27 | Single resistance testing device and system in Wheatstone bridge |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211683217.8A CN116223913B (en) | 2022-12-27 | 2022-12-27 | Single resistance testing device and system in Wheatstone bridge |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116223913A CN116223913A (en) | 2023-06-06 |
| CN116223913B true CN116223913B (en) | 2024-07-05 |
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| CN202211683217.8A Active CN116223913B (en) | 2022-12-27 | 2022-12-27 | Single resistance testing device and system in Wheatstone bridge |
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Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203786208U (en) * | 2014-04-22 | 2014-08-20 | 上海复旦天欣科教仪器有限公司 | Magneto-resistor property measuring device for use in physical experiment |
| CN110441604A (en) * | 2019-07-17 | 2019-11-12 | 湖北工业大学 | The circuit and method of resistance are accurately measured in Wheatstone bridge using computer |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08242027A (en) * | 1995-03-03 | 1996-09-17 | Mitsubishi Electric Corp | Magnetic resistor circuit |
| DE102004056133B4 (en) * | 2004-02-20 | 2007-04-12 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Method for detecting an offset drift in a Wheatstone measuring bridge |
| EP1719990B1 (en) * | 2005-05-06 | 2013-11-06 | Acam-messelectronic GmbH | Method and apparatus for temperature compensation of a sensing bridge |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203786208U (en) * | 2014-04-22 | 2014-08-20 | 上海复旦天欣科教仪器有限公司 | Magneto-resistor property measuring device for use in physical experiment |
| CN110441604A (en) * | 2019-07-17 | 2019-11-12 | 湖北工业大学 | The circuit and method of resistance are accurately measured in Wheatstone bridge using computer |
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| CN116223913A (en) | 2023-06-06 |
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