CN115770735A - Axial rectifier diode detection and sorting system and method based on machine vision - Google Patents

Abstract

The present invention provides a machine vision-based axial rectifier diode detection and sorting system and method, wherein the detection and sorting system includes: a visual detection device, the visual detection device is used to detect whether the diode to be detected has reached the area to be detected , and obtain the appearance image and resistance value of the diode to be detected when the diode to be detected reaches the area to be detected; the control device is connected to the visual detection device, and the control device is used to receive the appearance image and resistance value of the diode to be detected, and according to The appearance image and resistance value of the diode to be detected determine whether the diode to be detected is a defective product; the sorting device is connected to the control device, and the sorting device is used to sort the defective product. The invention can automatically detect and sort the axially rectified secondary tubes, not only reduces labor costs, but also improves production efficiency.

Description

Axial rectifier diode detection and sorting system and method based on machine vision

technical field

The invention relates to the technical field of diode detection, in particular to a machine vision-based axial rectification diode detection and sorting system and a machine vision-based axial rectification diode detection and sorting method.

Background technique

A rectifier diode is a semiconductor device that converts alternating current into direct current. It has unidirectional conductivity, that is, current can only flow in from the positive pole of the diode and flow out from the negative pole. If a reverse current is applied to the diode, the diode will not conduct.

In general, after the production of the diode is completed, or before the next step of assembly process, the product needs to be inspected, including the appearance inspection and electrical performance inspection of the diode. However, the traditional appearance inspection methods rely on manual work, which will cause the operator's eyesight fatigue, which will lead to unstable inspection results. Secondly, the traditional inspection process of diode electrical performance is relatively cumbersome.

Contents of the invention

In order to solve the above technical problems, the present invention provides a machine vision-based axial rectifier diode detection and sorting system and method, which can automatically detect and sort axial rectifier diodes, which not only reduces labor costs, but also Can improve production efficiency.

The technical scheme that the present invention adopts is as follows:

A machine vision-based axial rectifier diode detection and sorting system, comprising: a visual detection device, the visual detection device is used to detect whether the diode to be detected reaches the area to be detected, and when the diode to be detected reaches the area to be detected Obtain the appearance image and resistance value of the diode to be detected when detecting the area; the control device, the control device is connected with the visual detection device, and the control device is used to receive the appearance image and resistance value of the diode to be detected, and according to The appearance image and resistance value of the diode to be detected determine whether the diode to be detected is a defective product; a sorting device, the sorting device is connected to the control device, and the sorting device is used to sort the defective product for sorting.

A machine vision-based axial rectifier diode detection and sorting system also includes: a transfer device, the transfer device is connected to the control device, and the transfer device is used to transfer the diode to be detected to the area.

The conveying device includes: a feeding vibrating plate, which is used to place the disorderly placed diodes to be detected in a horizontal state along the Y-axis direction during the vibration conveying process; a slot conveying unit , the card slot transfer unit is used to transfer the diode to be detected in a horizontal state to the visual inspection device, and there is a roller transfer module inside the card slot transfer unit.

The feeding vibration plate includes: a vibration plate, a linear feeder, a material distribution baffle and a photoelectric sensor.

The area to be detected includes an appearance detection area and a resistance value detection area.

The visual inspection device includes: an appearance visual inspection unit, the appearance visual inspection unit is used to detect whether the diode to be inspected has reached the appearance detection area, and collect the Detect the body and pin images of the diode and transmit them to the control device, wherein the appearance detection area is located directly below the appearance visual detection unit; the resistance visual detection unit is used to detect Whether the diode to be detected reaches the resistance visual detection area, and when the diode to be detected reaches the resistance visual detection area, the forward and reverse resistance values of the diode to be detected are collected and transmitted to the control On the device, wherein the resistance detection area is located directly below the resistance visual detection unit.

The appearance visual detection unit includes: an appearance photographing camera group, the appearance photographing camera group includes a first appearance photographing camera, a second appearance photographing camera and a third appearance photographing camera, respectively used to obtain the first appearance of the diode to be detected. image, the second image of the diode to be detected and the third image of the diode to be detected, wherein the first image is the outer surface of the body and the pin image of the diode to be detected, and the second image is The body bottom image and the rear pin image of the diode to be detected, the third image is the body bottom image and the front pin image of the diode to be detected; a first sensor, the first sensor is used to detect the Whether the diode to be detected reaches the appearance visual inspection unit.

The resistance visual detection unit includes: a forward resistance test component, the forward resistance test component is used to test when the current flows from the A terminal of the forward resistance test component to the B terminal of the forward test component The resistance value of the diode to be detected at the end; the reverse resistance test component, the reverse resistance test component is used to test when the current flows from the B end of the reverse resistance test component to the reverse resistance The resistance value of the diode to be detected when testing the A terminal of the component; the multimeter, the multimeter is used to display the resistance value of the diode to be detected; the second sensor, the second sensor is used to detect the diode to be detected Whether it reaches the forward resistance test component; the third sensor, the third sensor is used to detect whether the diode to be detected reaches the reverse resistance test component; resistance camera, the resistance camera Used to get an image of the meter on the multimeter in question.

The sorting device includes: a sorting manipulator, and the sorting manipulator is divided into an appearance sorting manipulator and an electrical performance sorting manipulator, wherein the appearance sorting manipulator is used for sorting bad appearance diodes, and the electrical performance sorting manipulator is used for sorting diodes with poor appearance. The sorting manipulator is used for sorting diodes with poor electrical performance; defective product storage boxes, the defective product storage boxes are divided into storage boxes with poor appearance and storage boxes with poor electrical performance, wherein the storage boxes with poor appearance are used to store bad characters, Diodes with poor size, poor body damage, and poor pin oxidation, the storage box with poor electrical performance is used to store diodes with poor resistance and poor polarity printing; capture the camera, and the capture camera is divided into the first capture Taking a camera and a second grabbing camera, wherein the first grabbing camera is used to acquire a position image of the diode to be detected and transmit it to the In the control device, the second grabbing camera is used to acquire the position image of the diode to be tested and transmit it to the control device when the diode to be tested passes through the electrical property sorting hand.

A machine vision-based axial rectifier diode detection and sorting method, comprising the following steps: detecting whether the diode to be detected has reached the area to be detected, and obtaining the diode to be detected when the diode to be detected reaches the area to be detected Appearance image and resistance value of the diode to be detected; receiving the appearance image and resistance value of the diode to be detected, and judging whether the diode to be detected is a defective product according to the appearance image and resistance value of the diode to be detected; sorting.

Beneficial effects of the present invention:

The invention detects whether the diode to be detected has reached the area to be detected by the visual inspection device, obtains the appearance image and resistance value of the diode to be detected and sends it to the control device, the control device judges whether the diode to be detected is a defective product, and controls the sorting device to detect the defective product Sorting is performed, whereby the axial rectifier diodes can be automatically detected and sorted, which not only reduces labor costs, but also improves production efficiency.

Description of drawings

1 is a schematic block diagram of an axial rectifier diode detection and sorting system based on machine vision according to an embodiment of the present invention;

2 is a schematic block diagram of an axial rectifier diode detection and sorting system based on machine vision according to another embodiment of the present invention;

Fig. 3 is a schematic block diagram of a transmission device according to an embodiment of the present invention;

Fig. 4 is a schematic block diagram of a feeding vibration plate according to an embodiment of the present invention;

FIG. 5 is a schematic diagram of an application scenario of an axial rectification diode detection and sorting system based on machine vision according to an embodiment of the present invention;

Fig. 6 is a schematic block diagram of a visual detection device according to an embodiment of the present invention;

Fig. 7 is a schematic block diagram of an appearance visual detection unit according to an embodiment of the present invention;

FIG. 8 is a schematic diagram of an application scenario of an axial rectification diode detection and sorting system based on machine vision according to another embodiment of the present invention;

9 is a schematic block diagram of a resistance visual detection unit according to an embodiment of the present invention;

Fig. 10 is a schematic diagram of an application scenario of an axial rectification diode detection and sorting system based on machine vision according to another embodiment of the present invention;

Fig. 11 is a schematic block diagram of a sorting device according to another embodiment of the present invention;

Fig. 12 is a schematic diagram of an application scenario of an axial rectification diode detection and sorting system based on machine vision according to another embodiment of the present invention;

FIG. 13 is a flow chart of a method for detecting and sorting axial rectifier diodes based on machine vision according to an embodiment of the present invention.

Detailed ways

The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

FIG. 1 is a schematic block diagram of a machine vision-based axial rectifier diode detection and sorting system according to an embodiment of the present invention.

As shown in FIG. 1 , the machine vision-based axial rectifier diode detection and sorting system of the embodiment of the present invention includes a visual detection device 10 , a control device 20 , and a sorting device 30 . Wherein, the visual detection device 10 is used to detect whether the diode to be detected reaches the region to be detected, and obtains the appearance image and resistance value of the diode to be detected when the diode to be detected reaches the region to be detected; the control device 20 is connected with the visual detection device 10, and controls The device 20 is used to receive the appearance image and the resistance value of the diode to be detected, and judge whether the diode to be detected is a defective product according to the appearance image and the resistance value of the diode to be detected; the sorting device 30 is connected with the control device 20, and the sorting device 30 uses For sorting defective products.

In one embodiment of the present invention, the control device 20 can be a computer, which is used to receive the appearance image of the diode to be inspected, and process, extract and identify the appearance features of the appearance image of the diode to be inspected, so as to determine whether there is an appearance defect, And according to the judgment result, the sorting device 30 is controlled to sort the diodes with poor appearance. At the same time, the control device 20 can also accept the resistance image of the diode to be detected, identify and process the resistance value of the diode to be detected, to judge the electrical performance of the diode to be detected, and control the sorting device 30 according to the judgment result. Diodes are sorted.

As shown in FIG. 2 , in one embodiment of the present invention, the machine vision-based axial rectifier diode detection and sorting system may further include a conveying device 40 . The transmission device is connected with the control device, and the transmission device is used to transmit the diode to be detected to the area to be detected. The area to be detected includes an appearance detection area and a resistance value detection area, wherein the appearance detection area is used to detect the appearance of the diode to be detected, and the resistance value The detection area is used to detect the resistance value of the diode to be detected.

As shown in FIG. 3 , in an embodiment of the present invention, the conveying device 40 may further include a feeding vibration plate 41 and a slot conveying unit 42 . Wherein, the feeding vibrating plate is used to place the diodes to be detected that do not need to be placed in a horizontal state along the Y-axis direction during the vibration transmission process. The slot transfer unit 42 is used to transfer the diodes to be detected in a horizontal state to the visual inspection device 10 , and the slot transfer unit 42 has a roller transfer module 421 inside the slot transfer unit 42 , wherein the slot of the slot transfer unit 42 can be made of plastic.

Specifically, as shown in Figure 4 and Figure 5, the feeding vibration plate 41 can be composed of a vibration plate 411, a linear feeder 412, a material distribution baffle 413 and a photoelectric sensor module 414, wherein the photoelectric sensor module 414 can be composed of three photoelectric sensors The device is composed of a linear feeder, the entrance of the discharge port, and the front base of the card slot transmission unit 42, respectively, and the discharge port of the feeding vibrating plate 41 can be made of rubber, so that the diode to be detected is in the It will not be worn out before entering the slot transfer unit 42, and the slot of the slot transfer unit 42 can also be made of rubber, so that the pins of the diode to be detected will not be worn by the slot when the roller transfer module 421 rotates. Further, the material distribution baffle 413 is controlled by the cylinder, and is respectively arranged at the right end of the inlet of the linear feeder 412, the left end of the inlet of the outlet, and directly below the outlet. During the transmission process of the vibrating plate 41 , the diode changes from a state that does not need to be placed to a horizontal state along the Y-axis direction. When entering the entrance of the linear feeder 412, the photoelectric sensor module 414 can sense the diode to be detected, and transmit the induction signal to the control device 20. At this time, the control device 20 counts the diodes to be detected flowing through the entrance of the linear feeder 412. To judge whether the diode flowing into the linear feeder 412 is fully loaded. When the counting of the diodes to be detected by the control device 20 has reached the full load condition, the control device 20 will transmit the signal to the cylinder and the vibrating plate 411. At this time, the cylinder controls the distribution baffle plate 413 to block the diodes delivered by the vibrating plate 411, and the vibrating plate 411 also stops vibrating the material immediately. In addition, the diode to be detected is continuously transmitted to the discharge port under the vibration transmission of the linear feeder 412. When a diode flows into the discharge port, the photoelectric sensor module 414 can sense the diode and transmit the induction signal to the control device 20. The control device 20 sends a signal to the cylinder to make the distribution baffle 413 block the diodes conveyed behind. When the diode flows into the discharge port, it will not come out immediately, and will be blocked by the material distribution baffle 413 directly below. When the photoelectric sensor system senses the card slot on the card slot conveying unit 42, the photoelectric sensor module 414 transmits the sensing signal to the control unit. Device 20, the control device 20 sends a signal to the cylinder, and the cylinder controls the material distribution baffle 413 to retract and reset immediately. At this time, the diode to be detected slides onto the card slot delivery unit 42 and is delivered to the roller delivery module 421. When the diode to be detected is simultaneously delivered on the card slot delivery unit 42 and the roller delivery module 421, it is in the X-axis direction The length of the displacement that occurs on the surface must be consistent.

As shown in FIG. 6 , in one embodiment of the present invention, the visual detection device includes: an appearance visual detection unit 11 and a resistance value visual detection unit 12 . Wherein, the appearance visual detection unit 11 is used to detect whether the diode to be detected has reached the appearance detection area, and when the diode to be detected reaches the appearance detection area, the body and pin images of the diode to be detected are collected and transmitted to the control device, wherein the appearance detection area It is located directly below the appearance visual inspection unit. The resistance value visual detection unit 12 is used to detect whether the diode to be detected reaches the resistance value detection area, and when the diode to be detected reaches the resistance value detection area, the forward and reverse resistance values of the diode to be detected are collected and transmitted to the control device, wherein , the resistance detection area is located directly below the resistance visual detection unit.

As shown in FIG. 7 , in an embodiment of the present invention, the appearance visual inspection unit 11 includes: an appearance photographing camera group 111 and a first sensor 112 . Wherein, the appearance photographing camera group includes a first appearance photographing camera 1111, a second appearance photographing camera 1112 and a third appearance photographing camera 1113, which are respectively used to obtain the first image, the second image and the third image of the diode to be detected, and The above images are sent to the control device 20, wherein the first image of the diode to be tested is the outer surface of the diode to be tested and the pin image, and the second image of the diode to be tested is the bottom image of the diode to be tested and the rear pin image 1. The third image of the diode to be tested is the bottom image of the body and the front pin image of the diode to be tested. The first sensor 112 is used to detect whether the diode to be detected reaches the appearance visual detection unit 11 .

Specifically, as shown in FIG. 8, when the first sensor 112 senses that the diode to be detected is sent to the visual appearance detection area, the sensing signal is sent to the control device 20, and the control device 20 controls the appearance camera group 111 to detect the diode to be detected. Take pictures of the exterior. The first exterior camera 1111 is located directly above the diode to be tested, and is used to capture images of the outer surface of the diode to be tested and pins, and transmit the images to the control device 20 . The second appearance camera 1112 is located at the right rear of the diode to be tested, and can tilt the diode to be tested at a certain angle to obtain the bottom image of the body and the rear pin image of the diode to be tested, and transmit the images to the control device 20 . The third appearance camera 1113 is located at the left front of the diode to be tested, and can obliquely tilt the diode to be tested at a certain angle to obtain images of the bottom of the body and front pins of the diode to be tested, and transmit the images to the control device 20 . Since the diode to be inspected is horizontally moved along the X-axis direction by the slot conveying unit 42 , the roller conveying module 421 is also rotated, so the appearance camera group 111 can obtain the omnidirectional image of the diode to be inspected.

In one embodiment of the present invention, diodes with poor appearance can include bad characters, bad dimensions, pin oxidation and body damage, and during detection, they can be detected and sorted according to priority, wherein character recognition is the first First priority, size measurement is the second priority, pin oxidation and body damage are the third priority. specifically:

(1) Obtain the top-view image of the diode to be detected by the first appearance camera 1111, and transmit the acquired image to the control device 20, and the control device 20 first performs image stitching on the top-view image of the diode to be detected to obtain a 360° image of a single diode panoramic image. Secondly, the control device 20 performs grayscale processing, threshold segmentation and morphological processing on the 360° panoramic image of a single diode, obtains the character area of the diode body to be detected, and can use the character classifier to identify the characters, and the recognized characters and products are given to The specified characters are compared. Finally, compare the characters recognized in sequence with the characters given by the product. If the two are in a positive sequence or reverse sequence, it means that there is no problem with the diode character to be detected. If the order of the two does not correspond, then It shows that there is a problem in the character area of the diode to be detected, and the comparison result is fed back to the control device 20. The control device 20 sorts the diode with a problem in the character by controlling the appearance sorting manipulator 311, and puts it into a storage box with a bad appearance. partition.

(2) Obtain the top-view image of the diode to be detected by the first appearance camera 1111, the control device 20 performs grayscale processing on the top-view image of the diode to be detected, and divide the pin part and the body part of the diode to be detected by the threshold, and The minimum rectangular area is fitted to the pin part and the body part, and then the length and width of the fitted rectangle are measured. Assuming that the same diode is captured by the first appearance camera 1111 to obtain n images, the pin part is fitted with a rectangle with a length from y1 to yn and a width from x1 to xn, the standard length of the pin is y, and the standard diameter is x. The length error of the pin is Q, and the diameter error is P, then the basis for judging the pin is: (|y1-y|+…+|yn-y|)/n<Q and (|x1-x|+…+ |xn-x|)/n<P. If the judgment basis is met, it means that the pin size of the diode to be tested is normal; otherwise, it means that the pin size of the diode to be tested is not good. Wherein, the judgment basis of the body part is the same as that of the pin part. The control device 20 sorts the defective diodes by controlling the appearance sorting manipulator 311 and puts them into corresponding partitions in the storage box with defective appearance.

(3) The axial side image of the diode to be detected is obtained by the second appearance camera 1112 and the third appearance camera 1113, and the axial side image of the diode to be detected is transmitted to the control device 20, and the control device 20 is the axis of the diode to be detected. The side image is preprocessed, and then the lead part and the body part of the diode to be tested are separated to obtain the oxidation characteristics of the outer surface of the lead and the bottom damage characteristics of the diode to be tested. Secondly, according to the top-view image of the diode to be detected obtained by the first appearance camera, the top-view image of the diode to be detected is preprocessed by the control device 20, and then the pin part and the body part of the diode to be detected are separated to obtain the diode to be detected. The damage characteristics of the cylindrical surface of the body, finally, the control device 20 obtains the body image of a single diode by controlling the first grabbing camera 331 installed on the appearance sorting manipulator 311 and sends it to the control device 20, and the control device 20 controls the appearance sorting manipulator 311 Put the diodes with oxidized pins and damaged bodies into the corresponding partitions in the storage box 321 with poor appearance.

As shown in Figures 9 and 10, in one embodiment of the present invention, the resistance visual detection unit 12 includes: a forward resistance test assembly 121, a reverse resistance test assembly 122, a multimeter 123, a second sensor 124, A third sensor 125 and a resistance camera 126 . Wherein, the forward resistance test component 121 is used for testing the resistance value of the diode to be detected when the current flows from the A terminal of the forward resistance test component to the B terminal of the forward test component, and the reverse resistance test component 122 is used for testing When the current flows from the B end of the reverse resistance test assembly to the A end of the reverse resistance test assembly, the resistance value of the diode to be detected, the multimeter 123 is used to display the resistance value of the diode to be detected, and the second sensor 124 is used to detect Whether the diode to be detected reaches the forward resistance test component, the third sensor 125 is used to detect whether the diode to be detected reaches the reverse resistance test component, and the resistance camera 126 is used to obtain the instrument image on the multimeter.

Specifically, as shown in FIG. 10 , the second sensor 124 can sense whether the diode to be tested is directly below the forward resistance testing component 121 , wherein the second sensor 124 is located in front of the forward resistance testing component 121 . When the second sensor 124 senses that the diode to be detected reaches directly below the forward resistance test assembly 121, it sends an induction signal to the control device 20, and at this time, the control device 20 controls the forward resistance test assembly 121 to block the diode to be detected. Value detection and display the resistance value of the diode to be tested on the multimeter. The third sensor 125 can sense whether the diode to be tested is directly below the reverse resistance testing component 122 , wherein the third sensor 125 is located in front of the reverse resistance testing component 122 . When the third sensor 125 senses that the diode to be detected arrives directly below the reverse resistance value testing assembly 122, it sends an induction signal to the control device 20. At this time, the control device 20 controls the reverse resistance value test assembly 122 to block the diode to be detected. Value detection and display the resistance value of the diode to be tested on the multimeter. The resistance camera 126 captures the resistance image of the diode to be tested on the multimeter and sends it to the control device 20 . Among them, during the test process of the forward and reverse resistance testing device, the cylinder drives the connecting rod, and the connecting rod drives the test needle to complete the combined movement of the Z-axis and the Y-axis direction, that is, the test needle S1 can be transmitted with the X-axis direction. The detection diode pin produces an elastic contact, and the corresponding resistance value is tested.

In one embodiment of the present invention, diodes with poor electrical performance may include poor open circuit, poor short circuit, poor printing and poor resistance, and during detection, they can be detected and sorted according to priority, wherein, poor open circuit and short circuit Bad printing is the first priority, bad printing is the second priority, and bad resistance is the third priority. specifically:

(1), the resistance camera 126 acquires an image of the diode to be tested, and the control device 20 performs grayscale processing and binarization processing on the image. Obtain the resistance image tested by the forward resistance value test assembly 121 and the resistance image tested by the reverse resistance value test assembly 122 of a single diode, and perform threshold segmentation and summing on the two resistance images of a single diode by the control device 20 For morphological processing, a character classifier can be used to identify positive and negative resistance values. If the resistance values obtained by the control device 20 are all OL, it means that the internal body of the diode is open, that is, the open circuit is bad. If the resistance values obtained by the control device 20 are all specific values, it means that the internal body of the diode is short-circuited, that is, it is short-circuited.

(2), the resistance value photographing camera 126 obtains the resistance value of a single diode and transmits it to the control device 20, and the control device 20 obtains the body image of a single diode by controlling the second capture camera 332 installed on the electrical performance sorting manipulator 312 After the image is transmitted to the control device 20, the control device 20 preprocesses the image and obtains the white stripe characteristics of the cylindrical surface of a single diode body, so as to determine the position of the negative pole and the corresponding positive pole of the axial diode printing. If the resistance value of a single diode tested by the forward resistance test component 121 is a specific value, the resistance value obtained by the reverse resistance test component 122 is OL, and the printed polarity of the axial diode is consistent with the forward resistance test component 121 When the polarities of the test pins are inconsistent, it can be determined that the polarity of the diode is poorly printed. The control device 20 can sort the poorly printed diodes by controlling the electrical performance sorting manipulator 312, and put them into the poor electrical performance storage box 322. corresponding partitions. If a single diode is tested by the forward resistance test assembly 121, the resulting resistance is OL, and the reverse resistance test assembly 122 obtained resistance is a specific value, and the printed polarity of the single diode is the same as the test pin polarity of the reverse test assembly 122. When the polarity is inconsistent, it can be determined that the polarity of the diode is poorly printed. The control device 20 can sort the poorly printed diodes by controlling the electrical performance sorting manipulator 312, and put them into the corresponding partitions in the electrical poor performance storage box 322.

(3), if the above two conditions are not satisfied, the control device 20 can compare the obtained specific resistance value of a single diode with the resistance value given by the product to determine whether it is within the normal resistance error range. If it is within the error range of the normal resistance value, it means that the resistance value is normal. If it is no longer within the error range of the normal resistance value, it means that the resistance is bad.

In one embodiment of the present invention, the visual detection device 10 may also include a supplementary light source. When the light is relatively dark, the supplementary light source can illuminate the diode to be detected obliquely at a certain angle to provide supplementary light, thereby improving the obtained The clarity of the appearance image and resistance value image of the diode to be tested.

As shown in FIG. 11 , in one embodiment of the present invention, the sorting device includes: a sorting manipulator 31 , a defective product storage box 32 and a capture camera 33 . Wherein, the sorting manipulator 31 includes an appearance sorting manipulator 311 and an electrical performance sorting manipulator 312, which are respectively used for sorting diodes with poor appearance and poor electrical performance, wherein the appearance sorting manipulator 311 and the electrical performance sorting manipulator 312 Both can be five-axis manipulators. The defective product storage box 32 includes a poor appearance storage box 321 and a poor electrical performance storage box 322. Among them, the poor appearance storage box 321 has 4 partitions, which are respectively used to store products with bad characters, bad sizes, bad body damage and bad pin oxidation. The storage box 322 for diodes with poor electrical properties has two partitions, which are respectively used to store diodes with poor resistance and poor polarity printing. Grabbing camera 33 is divided into the first grabbing camera 331 and the second grabbing camera 332, wherein the first grabbing camera 331 is used to obtain the diode to be detected when the diode to be detected passes through the appearance sorting manipulator 311 The position image of the diode to be tested is sent to the control device 20, and the second capture camera 332 is used to capture the position image of the diode to be tested and send it to the control device 20 when the diode to be tested passes through the electrical performance sorting hand 312.

Specifically, as shown in FIG. 12 , when the diode to be detected passes through the appearance sorting manipulator 311, the first capture camera 331 installed on the appearance sorting manipulator 311 acquires the position image of the diode to be detected and transmits it to the control device 20 , the control device 20 controls the appearance sorting manipulator 311 to grab the diodes with poor appearance and place them in the corresponding partitions in the storage box 321 with poor appearance. Similarly, when the diode to be detected passes through the electrical performance sorting manipulator 312, the second capture camera 332 installed on the electrical performance sorting manipulator 311 acquires the position image of the diode to be detected and transmits it to the control device 20, and the control device 20 Control the electrical performance sorting manipulator 312 to grab the diodes with poor electrical performance and place them in corresponding partitions in the storage box 322 with poor electrical performance.

According to the machine vision-based axial rectifier diode detection and sorting system of the embodiment of the present invention, the visual detection device detects whether the diode to be detected has reached the area to be detected, and obtains the appearance image and resistance value of the diode to be detected and sends it to the control device. The device judges whether the diode to be detected is a defective product, and controls the sorting device to sort the defective product. Therefore, the axial rectifier diode can be automatically detected and sorted, which not only reduces labor costs, but also improves production. efficiency.

Corresponding to the above-mentioned embodiments, the present invention also proposes a machine vision-based detection and sorting method for axial rectifier diodes.

As shown in Figure 13, the machine vision-based axial rectifier diode detection and sorting method of the embodiment of the present invention includes the following steps:

S1, detecting whether the diode to be detected reaches the area to be detected, and obtaining the appearance image and resistance value of the diode to be detected when the diode to be detected reaches the area to be detected;

In one embodiment of the present invention, the area to be inspected includes an appearance inspection area and a resistance detection area, wherein the appearance inspection area is used to detect the appearance of the diode to be inspected, and the resistance detection area is used to detect the resistance value of the diode to be inspected.

In one embodiment of the present invention, a conveying device can be used to convey the diode to be inspected to the area to be inspected, and the conveying device can also include a feeding vibrating plate and a slot conveying unit. Wherein, the feeding vibrating plate is used to place the diodes to be detected that do not need to be placed in a horizontal state along the Y-axis direction during the vibration transmission process. The card slot transfer unit is used to transfer the diode to be detected in the horizontal state to the visual inspection device, and the inside of the card slot transfer unit is conveyed by rollers, wherein the card slot of the card slot transfer unit can be made of plastic material.

Specifically, the feeding vibration plate can be composed of a vibrating plate, a linear feeder, a material distribution baffle and a photoelectric sensor module, wherein the photoelectric sensor module can be composed of three photoelectric sensors, which are respectively arranged at the entrance of the linear feeder, the discharge The entrance of the slot, the front base of the card slot transfer unit, and the discharge port of the feeding vibrating plate can be made of rubber, so that the diode to be detected will not be worn before entering the card slot transfer unit. At the same time, the card slot transfer unit The card slot can also be made of rubber, so that the pins of the diode to be detected will not be worn by the card slot when the roller transmission module rotates. Further, the distribution baffle is controlled by the cylinder, and is respectively arranged at the right end of the inlet of the linear feeder, the left end of the inlet of the discharge port and directly below the discharge port. During the transmission process of the vibrating plate, the diode changes from a state that does not need to be placed to a horizontal state along the Y-axis direction. When entering the entrance of the linear feeder, the photoelectric sensor module can sense the diodes to be detected and transmit the induction signal to the control device. At this time, the control device counts the diodes to be detected flowing through the entrance of the linear feeder to judge the incoming linear feeder. Whether the diode on the device is fully loaded. When the counting of the diodes to be detected by the control device has reached the full load condition, the control device will transmit the signal to the cylinder and the vibrating plate. material. In addition, the diode to be detected is continuously transmitted to the discharge port under the vibration transmission of the linear feeder. When the diode flows into the discharge port, the photoelectric sensor module can sense the diode and transmit the induction signal to the control device, and the control device sends The signal is sent to the cylinder to make the distribution baffle block the diodes sent behind. When the diode flows into the discharge port, it will not come out immediately, and will be blocked by the material distribution baffle directly below. When the photoelectric sensor system senses the card slot on the card slot conveying unit, the photoelectric sensor module transmits the sensing signal to the control device to control The device sends a signal to the cylinder, which controls the retraction of the distribution baffle and resets it immediately. At this time, the diode to be detected slides onto the slot transfer unit and is transferred to the roller transfer module. When the diode to be detected is simultaneously transferred on the slot transfer unit and the roller transfer module, its displacement in the X-axis direction Keep the length consistent.

S2, receiving the appearance image and resistance value of the diode to be detected, and judging whether the diode to be detected is a defective product according to the appearance image and resistance value of the diode to be detected;

In one embodiment of the present invention, a computer can be used to receive the appearance image and resistance value of the diode to be inspected, and process, extract and identify the appearance features of the appearance image of the diode to be inspected to determine whether there is an appearance defect, and the As a result of the judgment, sort the diodes with poor appearance. At the same time, the resistance image of the diode to be detected can also be accepted, and the resistance value of the diode to be detected can be identified and processed to judge the electrical performance of the diode to be detected, and the diodes with poor electrical performance can be sorted according to the judgment result.

In one embodiment of the present invention, the appearance image of the diode to be detected can be obtained by using the appearance photographing camera group, specifically, the appearance photographing idea group includes a first appearance photographing camera, a second appearance photographing camera and a third appearance photographing camera, respectively It is used to obtain the first image, the second image and the third image of the diode to be tested, and transmit the above images to the control device, wherein the first image of the diode to be tested is the outer surface of the diode to be tested and the lead image, The second image of the diode to be tested is the image of the bottom of the body of the diode to be tested and the image of the rear pins, and the third image of the diode to be tested is the image of the bottom of the body of the diode to be tested and the image of the front pins. The first sensor is used to detect whether the diode to be detected reaches the appearance visual detection unit. When the first sensor senses that the diode to be detected is delivered to the visual appearance detection area, the sensing signal is sent to the control device, and the control device controls the appearance photographing camera group to take pictures of the appearance of the diode to be detected. The first appearance camera is located directly above the diode to be tested, and is used to acquire images of the outer surface of the diode to be tested and pins, and transmit the images to the control device. The second appearance camera is located at the right rear of the diode to be tested, and can obliquely tilt the diode to be tested at a certain angle to obtain the bottom image of the body and the rear pin image of the diode to be tested, and transmit the images to the control device. The third appearance camera is located in the left front of the diode to be tested, and can obliquely tilt the diode to be tested at a certain angle to obtain the bottom image of the body and the front pin image of the diode to be tested, and transmit the images to the control device.

In one embodiment of the present invention, diodes with poor appearance can include bad characters, bad dimensions, pin oxidation and body damage, and during detection, they can be detected and sorted according to priority, wherein character recognition is the first First priority, size measurement is the second priority, pin oxidation and body damage are the third priority. specifically:

(1) Obtain a bird’s-eye view image of the diode to be inspected by the first appearance camera, and transmit the acquired image to the control device. The control device first performs image stitching on the bird’s-eye view image of the diode to be inspected to obtain a 360° panoramic image of a single diode. Secondly, the control device performs grayscale processing, threshold segmentation and morphological processing on the 360° panoramic image of a single diode, obtains the character area of the diode body to be detected, and can use the character classifier to identify the characters, and the recognized characters and the given product characters for comparison. Finally, compare the characters recognized in sequence with the characters given by the product. If the two are in a positive sequence or reverse sequence, it means that there is no problem with the diode character to be detected. If the order of the two does not correspond, then It shows that there is a problem in the character area of the diode to be detected, and the comparison result is fed back to the control device. The control device sorts the diode with the character problem by controlling the appearance sorting robot, and puts it into the corresponding partition in the storage box with bad appearance.

(2) Obtain the bird's-eye view image of the diode to be detected by the first appearance camera, the control device 20 performs grayscale processing on the bird's-eye view image of the diode to be detected, and divide the pin part and the body part of the diode to be detected by the threshold, and The pin part and the body part are fitted to form a minimum rectangular area, and then the length and width of the fitted rectangle are measured. Assuming that the same diode is captured by the first appearance camera to capture n images, the pin part fits out a rectangle with a length from y1 to yn and a width from x1 to xn, the standard length of the pin is y, the standard diameter is x, and the pin The length error is Q and the diameter error is P, then the basis for judging the pin is: (|y1-y|+…+|yn-y|)/n<Q and (|x1-x|+…+| xn-x|)/n<P. If the judgment basis is met, it means that the pin size of the diode to be tested is normal; otherwise, it means that the pin size of the diode to be tested is not good. Wherein, the judgment basis of the body part is the same as that of the pin part. The control device sorts the diodes with bad size by controlling the appearance sorting manipulator, and puts them into the corresponding partitions in the storage box with bad appearance.

(3) The axial side image of the diode to be detected is obtained by the second appearance camera and the third appearance camera, and the axial side image of the diode to be detected is transmitted to the control device, and the control device performs a preview of the axial side image of the diode to be detected processing, and then separate the pin part and the body part of the diode to be detected, so as to obtain the oxidation characteristics of the outer surface of the pins of the diode to be detected, and the characteristics of the bottom damage. Secondly, according to the top view image of the diode to be detected obtained by the first appearance camera, the control device performs preprocessing on the top view image of the diode to be detected, and then separates the pin part and the body part of the diode to be detected to obtain the body of the diode to be detected Cylindrical surface damage characteristics. Finally, the control device obtains the body image of a single diode by controlling the first grabbing camera installed on the appearance sorting manipulator and sends it to the control device. The control device controls the appearance sorting manipulator to oxidize the pins and damage the body Place the diodes in the corresponding partitions in the ugly storage box.

In one embodiment of the present invention, the resistance value of the diode to be tested can be acquired through a forward resistance test component, a reverse resistance test component, a multimeter, a second sensor, a third sensor and a resistance camera. Among them, the forward resistance test component is used to test the resistance value of the diode to be detected when the current flows from the A terminal of the forward resistance test component to the B terminal of the forward test component, and the reverse resistance test component is used to test when the current The resistance value of the diode to be detected when flowing from the B terminal of the reverse resistance test component to the A terminal of the reverse resistance test component, the multimeter is used to display the resistance value of the diode to be detected, and the second sensor is used to detect whether the diode to be detected is Arriving at the forward resistance test component, the third sensor is used to detect whether the diode to be tested has reached the reverse resistance test component, and the resistance camera is used to obtain the meter image on the multimeter.

Specifically, the second sensor can sense whether the diode to be tested is directly below the forward resistance testing component, wherein the second sensor is located in front of the forward resistance testing component. When the second sensor senses that the diode to be detected is directly below the forward resistance test component, it sends an induction signal to the control device. At this time, the control device controls the forward resistance test component to detect the resistance of the diode to be detected and The resistance of the sense diode is displayed on the multimeter. The third sensor can sense whether the diode to be tested is directly below the reverse resistance testing component, wherein the third sensor is located in front of the reverse resistance testing component. When the third sensor senses that the diode to be detected arrives directly below the reverse resistance test component, it sends an induction signal to the control device. At this time, the control device controls the reverse resistance test component to perform resistance detection on the diode to be detected and The resistance of the sense diode is displayed on the multimeter. The resistance value photographing camera obtains the resistance value image of the diode to be tested on the multimeter and transmits it to the control device. Among them, during the test process of the forward and reverse resistance testing device, the cylinder drives the connecting rod, and the connecting rod drives the test needle to complete the combined movement of the Z-axis and the Y-axis direction, that is, the test needle S1 can be transmitted with the X-axis direction. The detection diode pin produces an elastic contact, and the corresponding resistance value is tested.

In one embodiment of the present invention, diodes with poor electrical performance may include poor open circuit, poor short circuit, poor printing and poor resistance, and during detection, they can be detected and sorted according to priority, wherein, poor open circuit and short circuit Bad printing is the first priority, bad printing is the second priority, and bad resistance is the third priority. specifically:

(1), the resistance value camera acquires the image of the diode to be detected, and performs grayscale processing and binarization processing on the image through the control device. Then obtain the resistance image of the forward resistance test component test and the resistance image of the reverse resistance test component test of a single diode, and perform threshold segmentation and morphological processing on the two resistance images of a single diode through the control device , the character classifier can be used to identify the positive and negative resistance values. If the resistance values obtained by the control device are all OL, it means that the internal body of the diode is open, that is, the open circuit is bad. If the resistance values obtained by the control device are all specific values, it means that the internal body of the diode is short-circuited, that is, the short circuit is defective.

(2) The resistance value camera obtains the resistance value of a single diode and transmits it to the control device, and the control device acquires the body image of a single diode by controlling the second capture camera installed on the electrical performance sorting manipulator and transmits it to the control device, The control device preprocesses the image and obtains the white stripe characteristics of the cylindrical surface of a single diode body, so as to determine the position of the cathode printed on the axial diode and the corresponding position of the anode. If the resistance value of a single diode tested by the forward resistance test component is a specific value, the resistance value obtained by the reverse resistance test component is OL, and the printed polarity of the axial diode is consistent with the test leads of the forward resistance test component. When the polarity of the pins is inconsistent, it can be determined that the polarity of the diode is poorly printed, and the control device can sort the poorly printed diodes by controlling the electrical performance sorting manipulator, and put them into the corresponding partition in the storage box with poor electrical performance; The resistance value of a single diode tested by the forward resistance test component is OL, and the resistance value obtained by the reverse resistance test component is a specific value, and the printed polarity of a single diode is inconsistent with the polarity of the test pin of the reverse resistance test component , it can be determined that the polarity of the diode is poorly printed, and the control device can sort the poorly printed diodes by controlling the electrical performance sorting manipulator, and put them into the corresponding partitions in the storage box with poor electrical performance.

(3) If none of the above two conditions are satisfied, the control device can compare the obtained specific resistance value of a single diode with the given resistance value of the product to determine whether it is within the normal resistance error range. If it is within the error range of the resistance value, it means that the resistance value is normal. If it is not within the error range of the normal resistance value, it means that the resistance is bad.

In one embodiment of the present invention, the visual detection device may also include a supplementary light source. When the light is relatively dark, the supplementary light source can illuminate the diode to be detected obliquely at a certain angle to provide supplementary light, thereby improving the obtained waiting time. Check the clarity of the appearance image and resistance image of the diode.

S3, sorting the defective products.

In one embodiment of the present invention, a sorting manipulator can be used to sort the defective products and put them into the defective product storage box. Among them, the sorting manipulator includes the appearance sorting manipulator and the electrical performance sorting manipulator, which are used to sort the diodes with poor appearance and the diodes with poor electrical performance respectively. Among them, the appearance sorting manipulator and the electrical performance sorting manipulator can be five-axis manipulator. Defective product storage boxes include storage boxes with poor appearance and poor electrical performance. Among them, the storage box with poor appearance has 4 partitions, which are used to store diodes with bad characters, bad size, bad body damage and poor oxidation of pins. The bad storage box has two partitions, which are used to store diodes with bad resistance and bad polarity printing respectively. The grabbing camera is divided into a first grabbing camera and a second grabbing camera, wherein the first grabbing camera is used to acquire and transmit the position image of the diode to be detected when the diode to be detected passes through the appearance sorting manipulator. To the control device, the second capture camera is used to acquire the position image of the diode to be tested and transmit it to the control device when the diode to be tested passes through the electrical property sorting hand.

Specifically, when the diode to be detected passes through the appearance sorting manipulator, the position image of the diode to be detected is captured by the first capture camera installed on the appearance sorting manipulator and sent to the control device, and the control device controls the appearance sorting manipulator to grab Remove defective diodes and place them in the corresponding section of the defective storage box. Similarly, when the diode to be detected passes through the electrical performance sorting manipulator, the second grabbing camera installed on the electrical performance sorting manipulator acquires the position image of the diode to be detected and sends it to the control device, which controls the electrical performance sorting The manipulator grabs the diode with poor electrical performance and places it in the corresponding partition in the storage box with poor electrical performance.

According to the machine vision-based axial rectifier diode detection and sorting system of the embodiment of the present invention, by detecting whether the diode to be detected has reached the area to be detected and obtaining the appearance image and resistance value of the diode to be detected and sending it to the control device, the control device judges whether the diode to be detected has reached the area to be detected. Detect whether the diode is a defective product, and control the sorting device to sort the defective product, so that the axial rectifier diode can be automatically detected and sorted, which not only reduces labor costs, but also improves production efficiency.

In the description of the present invention, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, a feature defined as "first" and "second" may explicitly or implicitly include one or more of these features. "Plurality" means two or more, unless otherwise clearly and specifically defined.

In the present invention, unless otherwise clearly specified and limited, terms such as "installation", "connection", "connection" and "fixation" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection , or integrated; it can be mechanically connected or electrically connected; it can be directly connected or indirectly connected through an intermediary, and it can be the internal communication of two components or the interaction relationship between two components. Those of ordinary skill in the art can understand the specific meanings of the above terms in the present invention according to specific situations.

In the present invention, unless otherwise clearly specified and limited, the first feature may be in direct contact with the first feature or the first and second feature may be in direct contact with the second feature through an intermediary. touch. Moreover, "above", "above" and "above" the first feature on the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. "Below", "beneath" and "beneath" the first feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is less horizontally than the second feature.

In the description of this specification, descriptions referring to the terms "one embodiment", "some embodiments", "example", "specific examples", or "some examples" mean that specific features described in connection with the embodiment or example , structure, material or characteristic is included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the described specific features, structures, materials or characteristics may be combined in any suitable manner in any one or more embodiments or examples. In addition, those skilled in the art can combine and combine different embodiments or examples and features of different embodiments or examples described in this specification without conflicting with each other.

Any process or method descriptions in flowcharts or otherwise described herein may be understood to represent modules, segments or portions of code comprising one or more executable instructions for implementing specific logical functions or steps of the process , and the scope of preferred embodiments of the invention includes alternative implementations in which functions may be performed out of the order shown or discussed, including substantially concurrently or in reverse order depending on the functions involved, which shall It is understood by those skilled in the art to which the embodiments of the present invention pertain.

The logic and/or steps represented in the flowcharts or otherwise described herein, for example, can be considered as a sequenced listing of executable instructions for implementing logical functions, can be embodied in any computer-readable medium, For use with instruction execution systems, devices, or devices (such as computer-based systems, systems including processors, or other systems that can fetch instructions from instruction execution systems, devices, or devices and execute instructions), or in conjunction with these instruction execution systems, devices or equipment for use. For the purposes of this specification, a "computer-readable medium" may be any device that can contain, store, communicate, propagate or transmit a program for use in or in conjunction with an instruction execution system, device or device. More specific examples (non-exhaustive list) of computer-readable media include the following: electrical connection with one or more wires (electronic device), portable computer disk case (magnetic device), random access memory (RAM), Read Only Memory (ROM), Erasable and Editable Read Only Memory (EPROM or Flash Memory), Fiber Optic Devices, and Portable Compact Disc Read Only Memory (CDROM). In addition, the computer-readable medium may even be paper or other suitable medium on which the program can be printed, since the program can be read, for example, by optically scanning the paper or other medium, followed by editing, interpretation or other suitable processing if necessary. The program is processed electronically and stored in computer memory.

It should be understood that various parts of the present invention can be realized by hardware, software, firmware or their combination. In the above described embodiments, various steps or methods may be implemented by software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, it can be implemented by any one or combination of the following techniques known in the art: Discrete logic circuits, ASICs with suitable combinational logic gates, Programmable Gate Arrays (PGAs), Field Programmable Gate Arrays (FPGAs), etc.

Those of ordinary skill in the art can understand that all or part of the steps carried by the methods of the above embodiments can be completed by instructing related hardware through a program, and the program can be stored in a computer-readable storage medium. During execution, one or a combination of the steps of the method embodiments is included.

In addition, each functional unit in each embodiment of the present invention may be integrated into one processing module, each unit may exist separately physically, or two or more units may be integrated into one module. The above-mentioned integrated modules can be implemented in the form of hardware or in the form of software function modules. If the integrated modules are realized in the form of software function modules and sold or used as independent products, they can also be stored in a computer-readable storage medium.

Although the embodiments of the present invention have been shown and described above, it can be understood that the above embodiments are exemplary and should not be construed as limiting the present invention, those skilled in the art can make the above-mentioned The embodiments are subject to changes, modifications, substitutions and variations.

Claims (10)

1. An axial rectifier diode detects and letter sorting system based on machine vision, its characterized in that includes:

the visual detection device is used for detecting whether the diode to be detected reaches the area to be detected or not and acquiring the appearance image and the resistance value of the diode to be detected when the diode to be detected reaches the area to be detected;

the control device is connected with the visual detection device and used for receiving the appearance image and the resistance value of the diode to be detected and judging whether the diode to be detected is a defective product or not according to the appearance image and the resistance value of the diode to be detected;

and the sorting device is connected with the control device and is used for sorting the defective products.

2. The machine-vision-based axial rectifier diode detection and sorting system of claim 1, further comprising:

and the conveying device is connected with the control device and is used for conveying the diode to be detected to the area to be detected.

3. The machine-vision based axial rectifier diode detection and sorting system of claim 2, wherein said conveyor comprises:

the feeding vibration disc is used for swinging the diodes to be detected which are placed out of order into a horizontal state along the Y-axis direction in the vibration conveying process;

the clamping groove conveying unit is used for conveying the diode to be detected in the horizontal state to the visual detection device, and a roller conveying module is arranged on the inner side of the clamping groove conveying unit.

4. The machine-vision-based axial rectifier diode detection and sorting system of claim 3 wherein said feed vibratory pan comprises: vibration dish, sharp feeder, branch material baffle and photoelectric sensor.

5. The machine-vision-based axial rectifier diode detection and sorting system of claim 1, wherein the to-be-detected regions include an appearance detection region and a resistance detection region.

6. The machine-vision-based axial rectifier diode detection and sorting system of claim 1, wherein the vision inspection device comprises:

the appearance visual detection unit is used for detecting whether the diode to be detected reaches the appearance detection area or not, collecting images of a body and a pin of the diode to be detected when the diode to be detected reaches the appearance detection area and transmitting the images to the control device, wherein the appearance detection area is positioned under the appearance visual detection unit;

the resistance value visual detection unit is used for detecting whether the diode to be detected reaches the resistance value detection area or not, collecting the positive and negative resistance values of the diode to be detected when the diode to be detected reaches the resistance value detection area and transmitting the positive and negative resistance values to the control device, wherein the resistance value detection area is located right below the resistance value visual detection unit.

7. The machine-vision based axial rectifier diode detection and sorting system of claim 6, wherein said visual appearance detection unit comprises:

the appearance photographing camera set comprises a first appearance photographing camera, a second appearance photographing camera and a third appearance photographing camera, and is respectively used for acquiring a first image of the diode to be detected, a second image of the diode to be detected and a third image of the diode to be detected, wherein the first image is an outer surface and a pin image of the body of the diode to be detected, the second image is a bottom image and a rear pin image of the body of the diode to be detected, and the third image is a bottom image and a front pin image of the body of the diode to be detected;

a first sensor for detecting whether the diode to be detected reaches the visual appearance detecting unit.

8. The machine vision based axial rectifier diode detection and sorting system of claim 6 wherein said resistance value visual detection unit comprises:

the forward resistance testing component is used for testing the resistance of the diode to be detected when current flows from the end A of the forward resistance testing component to the end B of the forward resistance testing component;

the reverse resistance value testing component is used for testing the resistance value of the diode to be detected when current flows from the end B of the reverse resistance value testing component to the end A of the reverse resistance value testing component;

the universal meter is used for displaying the resistance value of the diode to be detected;

the second sensor is used for detecting whether the diode to be detected reaches the forward resistance value testing component or not;

the third sensor is used for detecting whether the diode to be detected reaches the reverse resistance value testing component or not;

and the resistance value photographing camera is used for acquiring an instrument image on the universal meter.

9. The machine-vision-based axially commutated diode detection and sorting system according to claim 1, wherein the sorting apparatus comprises:

the sorting manipulator is divided into an appearance sorting manipulator and an electrical property sorting manipulator, wherein the appearance sorting manipulator is used for sorting diodes with poor appearance, and the electrical property sorting manipulator is used for sorting diodes with poor electrical property;

the defective product storage box is divided into a defective appearance storage box and a defective electrical property storage box, wherein the defective appearance storage box is used for storing diodes with poor characters, poor sizes, poor body breakage and poor pin oxidation, and the defective electrical property storage box is used for storing diodes with poor resistance and poor polarity printing.

The grabbing and photographing camera is divided into a first grabbing and photographing camera and a second grabbing and photographing camera, wherein the first grabbing and photographing camera is used for acquiring position images of the diode to be detected and transmitting the position images to the control device when the diode to be detected passes through the appearance sorting manipulator, and the second grabbing and photographing camera is used for acquiring position images of the diode to be detected and transmitting the position images to the control device when the diode to be detected passes through the electrical property sorting manipulator.

10. A machine vision-based axial rectifier diode detection and sorting method is characterized by comprising the following steps:

detecting whether a diode to be detected reaches a region to be detected, and acquiring an appearance image and a resistance value of the diode to be detected when the diode to be detected reaches the region to be detected;

receiving the appearance image and the resistance value of the diode to be detected, and judging whether the diode to be detected is a defective product or not according to the appearance image and the resistance value of the diode to be detected;

and sorting the defective products.

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