CN115770735A - Axial rectifier diode detecting and sorting system and method based on machine vision - Google Patents

Abstract

The invention provides a machine vision-based axial rectifier diode detection and sorting system and a machine vision-based axial rectifier diode detection and sorting method, wherein the detection and sorting system comprises: the visual detection device is used for detecting whether the diode to be detected reaches the area to be detected or not and acquiring an appearance image and a resistance value of the diode to be detected when the diode to be detected reaches the area to be detected; the control device is connected with the visual detection device and used for receiving the appearance image and the resistance value of the diode to be detected and judging whether the diode to be detected is a defective product or not according to the appearance image and the resistance value of the diode to be detected; and the sorting device is connected with the control device and used for sorting the defective products. The automatic detection and sorting device can automatically detect and sort the axial rectifying diodes, not only reduces the labor cost, but also can improve the production efficiency.

Description

Axial rectifier diode detecting and sorting system and method based on machine vision

Technical Field

The invention relates to the technical field of diode detection, in particular to an axial rectifier diode detection and sorting system based on machine vision and an axial rectifier diode detection and sorting method based on machine vision.

Background

A rectifier diode is a semiconductor device that converts alternating current to direct current and has unidirectional conductivity, i.e., current can only flow in from the anode and out of the cathode of the diode. If a reverse current is applied to the diode, the diode does not conduct.

Generally, after the diode is manufactured or before the diode is subjected to the next assembly process, the product needs to be tested, including appearance test and electrical property test of the diode. However, the traditional appearance detection means all depend on manual work, which can cause the visual fatigue of an operator, thereby causing the instability of the detection result, and secondly, the traditional flow of the electrical property detection of the diode is complicated.

Disclosure of Invention

In order to solve the technical problems, the invention provides a system and a method for detecting and sorting axial rectifier diodes based on machine vision, which can automatically detect and sort the axial rectifier diodes, thereby not only reducing the labor cost, but also improving the production efficiency.

The technical scheme adopted by the invention is as follows:

a machine vision based axial rectifier diode detection and sorting system comprising: the device comprises a visual detection device, a control device and a display device, wherein the visual detection device is used for detecting whether a diode to be detected reaches a region to be detected or not, and acquiring an appearance image and a resistance value of the diode to be detected when the diode to be detected reaches the region to be detected; the control device is connected with the visual detection device and used for receiving the appearance image and the resistance value of the diode to be detected and judging whether the diode to be detected is a defective product or not according to the appearance image and the resistance value of the diode to be detected; and the sorting device is connected with the control device and is used for sorting the defective products.

A machine vision-based axial rectifier diode detection and sorting system further comprises: and the conveying device is connected with the control device and is used for conveying the diode to be detected to the area to be detected.

The transfer device includes: the feeding vibration disc is used for swinging the diodes to be detected which are placed out of order into a horizontal state along the Y-axis direction in the vibration conveying process; the clamping groove transmission unit is used for transmitting the diode to be detected in the horizontal state to the visual detection device, and a roller transmission module is arranged on the inner side of the clamping groove transmission unit.

The material loading vibration dish includes: vibration dish, sharp feeder, branch material baffle and photoelectric sensor.

The area to be detected comprises an appearance detection area and a resistance value detection area.

The visual inspection device includes: the appearance visual detection unit is used for detecting whether the diode to be detected reaches the appearance detection area or not, acquiring images of a body and pins of the diode to be detected when the diode reaches the appearance detection area and transmitting the images to the control device, wherein the appearance detection area is positioned under the appearance visual detection unit; the resistance value visual detection unit is used for detecting whether the diode to be detected reaches the resistance value visual detection area or not, collecting the positive and negative resistance values of the diode to be detected when the diode to be detected reaches the resistance value visual detection area and transmitting the positive and negative resistance values to the control device, wherein the resistance value detection area is located right below the resistance value visual detection unit.

The appearance vision detection unit includes: the appearance photographing camera set comprises a first appearance photographing camera, a second appearance photographing camera and a third appearance photographing camera, and is respectively used for acquiring a first image of the diode to be detected, a second image of the diode to be detected and a third image of the diode to be detected, wherein the first image is an outer surface and a pin image of the diode to be detected, the second image is a bottom image and a rear pin image of the diode to be detected, and the third image is a bottom image and a front pin image of the diode to be detected; a first sensor for detecting whether the diode to be detected reaches the visual appearance detection unit.

The resistance value visual detection unit includes: the forward resistance testing component is used for testing the resistance of the diode to be detected when current flows from the end A of the forward resistance testing component to the end B of the forward resistance testing component; the reverse resistance value testing component is used for testing the resistance value of the diode to be detected when current flows from the end B of the reverse resistance value testing component to the end A of the reverse resistance value testing component; the universal meter is used for displaying the resistance value of the diode to be detected; the second sensor is used for detecting whether the diode to be detected reaches the forward resistance value testing component or not; the third sensor is used for detecting whether the diode to be detected reaches the reverse resistance value testing component or not; and the resistance value photographing camera is used for acquiring an instrument image on the universal meter.

The sorting device comprises: the sorting mechanical hand comprises an appearance sorting mechanical hand and an electrical property sorting mechanical hand, wherein the appearance sorting mechanical hand is used for sorting diodes with poor appearance, and the electrical property sorting mechanical hand is used for sorting diodes with poor electrical property; the defective product storage box is divided into a defective appearance storage box and a defective electrical property storage box, wherein the defective appearance storage box is used for storing diodes with poor characters, poor sizes, poor body breakage and poor pin oxidation, and the defective electrical property storage box is used for storing diodes with poor resistance and poor polarity printing; the device comprises a grabbing and photographing camera and a control device, wherein the grabbing and photographing camera is divided into a first grabbing and photographing camera and a second grabbing and photographing camera, the first grabbing and photographing camera is used for acquiring position images of the diode to be detected and transmitting the position images to the control device when the diode to be detected passes through an appearance sorting manipulator, and the second grabbing and photographing camera is used for acquiring position images of the diode to be detected and transmitting the position images to the control device when the diode to be detected passes through an electrical property sorting manipulator.

A machine vision-based axial rectifier diode detection and sorting method comprises the following steps: detecting whether a diode to be detected reaches a region to be detected, and acquiring an appearance image and a resistance value of the diode to be detected when the diode to be detected reaches the region to be detected; receiving the appearance image and the resistance value of the diode to be detected, and judging whether the diode to be detected is a defective product or not according to the appearance image and the resistance value of the diode to be detected; and sorting the defective products.

The invention has the beneficial effects that:

according to the invention, whether the diode to be detected reaches the area to be detected is detected through the visual detection device, the appearance image and the resistance value of the diode to be detected are acquired and transmitted to the control device, the control device judges whether the diode to be detected is a defective product, and the sorting device is controlled to sort the defective product, so that the axial rectifier diode can be automatically detected and sorted, the labor cost is reduced, and the production efficiency can be improved.

Drawings

FIG. 1 is a block diagram of a machine vision based axial rectifier diode detection and sorting system according to an embodiment of the present invention;

FIG. 2 is a block diagram of a machine vision based axial rectifier diode detection and sorting system according to another embodiment of the present invention;

FIG. 3 is a block diagram of a transfer device according to one embodiment of the present invention;

FIG. 4 is a block diagram of a loading vibratory pan according to one embodiment of the invention;

FIG. 5 is a schematic diagram of an application scenario of a machine vision-based axial rectifier diode detection and sorting system according to an embodiment of the present invention;

FIG. 6 is a block diagram of a visual inspection device according to an embodiment of the present invention;

FIG. 7 is a block diagram of an appearance inspection unit according to an embodiment of the present invention;

FIG. 8 is a schematic view of an application scenario of a machine vision based axial rectifier diode detection and sorting system according to another embodiment of the present invention;

FIG. 9 is a block diagram of a resistance value visual inspection unit according to an embodiment of the present invention;

FIG. 10 is a schematic diagram of an application scenario of a machine vision based axial rectifier diode detection and sorting system according to another embodiment of the present invention;

FIG. 11 is a block schematic diagram of a sorting apparatus according to another embodiment of the invention;

fig. 12 is a schematic view of an application scenario of a machine vision based axial rectifier diode detection and sorting system according to another embodiment of the present invention;

fig. 13 is a flowchart of a machine vision-based method for detecting and sorting axial rectifier diodes according to an embodiment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, belong to the protection scope of the present invention.

Fig. 1 is a block diagram of an axial rectifier diode detection and sorting system based on machine vision according to an embodiment of the present invention.

As shown in fig. 1, the system for detecting and sorting axial rectifier diodes based on machine vision according to the embodiment of the present invention includes a visual detection device 10, a control device 20, and a sorting device 30. The visual detection device 10 is used for detecting whether the diode to be detected reaches the area to be detected, and acquiring an appearance image and a resistance value of the diode to be detected when the diode to be detected reaches the area to be detected; the control device 20 is connected with the visual detection device 10, and the control device 20 is configured to receive the appearance image and the resistance value of the diode to be detected, and determine whether the diode to be detected is a defective product according to the appearance image and the resistance value of the diode to be detected; the sorting device 30 is connected to the control device 20, and the sorting device 30 is used for sorting defective products.

In an embodiment of the present invention, the control device 20 may be a computer, configured to receive the appearance image of the diode to be detected, process, extract and identify appearance features of the appearance image of the diode to be detected, so as to determine whether an appearance defect exists, and control the sorting device 30 to sort the diode with poor appearance according to the determination result. Meanwhile, the control device 20 may also receive the resistance value image of the diode to be detected, identify and process the resistance value of the diode to be detected to determine the electrical property of the diode to be detected, and control the sorting device 30 to sort the diode with poor electrical property according to the determination result.

As shown in fig. 2, in one embodiment of the present invention, the machine vision based axial rectifier diode detection and sorting system may further include a conveyor 40. The conveying device is connected with the control device and used for conveying the diode to be detected to the region to be detected, the region to be detected comprises an appearance detection region and a resistance value detection region, the appearance detection region is used for detecting the appearance of the diode to be detected, and the resistance value detection region is used for detecting the resistance value of the diode to be detected.

As shown in fig. 3, in one embodiment of the present invention, the transfer device 40 may further include a feeding vibration tray 41 and a card slot transfer unit 42. The feeding vibration disc is used for placing the diode to be detected which does not need to be placed in a horizontal state along the Y-axis direction in the vibration transmission process. The card slot transmission unit 42 is used for transmitting the diode to be detected in a horizontal state to the visual detection device 10, and the inside of the card slot transmission unit 42 transmits the module 421 through the roller, wherein the card slot of the card slot transmission unit 42 may be made of plastic material.

Specifically, as shown in fig. 4 and 5, the feeding vibration tray 41 may include a vibration tray 411, a linear feeder 412, a material distribution baffle 413, and a photoelectric sensing module 414, wherein the photoelectric sensing module 414 may include three photoelectric sensors, which are respectively disposed at an inlet of the linear feeder, an inlet of a discharge port, and a front base of the card slot conveying unit 42, and the discharge port of the feeding vibration tray 41 may be made of rubber, so that the diode to be detected is not worn before entering the card slot conveying unit 42, and meanwhile, the card slot of the card slot conveying unit 42 may also be made of rubber, so that when the diode to be detected rotates in the roller conveying module 421, the pin thereof is not worn by the card slot. Further, the material separating baffle 413 is controlled by a cylinder and is respectively arranged at the right end of the inlet of the linear feeder 412, the left end of the inlet of the discharge port and right below the discharge port. The diode is changed from a state of not being laid out to a horizontal state in the Y-axis direction during the transfer of the vibration plate 41. Upon entering the inlet of the linear feeder 412, the photo-electric sensing module 414 senses the diode to be detected and transmits a sensing signal to the control device 20, and the control device 20 counts the number of the diode to be detected flowing through the inlet of the linear feeder 412 to determine whether the diode flowing into the linear feeder 412 is fully loaded. When the count of the diodes to be detected by the control device 20 reaches the full-load condition, the control device 20 transmits a signal to the air cylinder and the vibrating plate 411, at this time, the air cylinder controls the material distribution baffle 413 to block the diodes transmitted by the vibrating plate 411, and the vibrating plate 411 stops vibrating and transmitting materials immediately. In addition, the diodes to be detected are continuously conveyed to the discharge port under the vibration conveying of the linear feeder 412, when the diodes flow into the discharge port, the photoelectric sensing module 414 can sense the diodes and transmit sensing signals to the control device 20, and the control device 20 sends signals to the air cylinder to enable the distribution baffle 413 to block the diodes conveyed later. The diode will not come out immediately when flowing into the discharge port, and will be blocked by the material distributing baffle 413 right below, when the photoelectric sensing system senses the card slot on the card slot conveying unit 42, the photoelectric sensing module 414 transmits the sensing signal to the control device 20, the control device 20 sends a signal to the cylinder, and the cylinder controls the material distributing baffle 413 to retract and reset immediately. At this time, the diode to be detected slides down onto the card slot conveying unit 42 and is conveyed to the roller conveying module 421, and when the diode to be detected is simultaneously conveyed on the card slot conveying unit 42 and the roller conveying module 421, the displacement length of the diode to be detected in the X-axis direction is kept consistent.

As shown in fig. 6, in one embodiment of the present invention, a visual inspection apparatus includes: an appearance vision detecting unit 11 and a resistance value vision detecting unit 12. The appearance visual detection unit 11 is configured to detect whether the diode to be detected reaches an appearance detection area, and acquire images of a body and a pin of the diode to be detected when the diode to be detected reaches the appearance detection area and transmit the images to the control device, where the appearance detection area is located right below the appearance visual detection unit. The resistance value visual detection unit 12 is used for detecting whether the diode to be detected reaches a resistance value detection area, collecting the positive and negative resistance values of the diode to be detected when the diode to be detected reaches the resistance value detection area, and transmitting the positive and negative resistance values to the control device, wherein the resistance value detection area is located right below the resistance value visual detection unit.

As shown in fig. 7, in one embodiment of the present invention, the outward appearance visual inspection unit 11 includes: a appearance photographing camera group 111 and a first sensor 112. The appearance photographing camera set comprises a first appearance photographing camera 1111, a second appearance photographing camera 1112 and a third appearance photographing camera 1113, which are respectively used for acquiring a first image, a second image and a third image of the diode to be detected and transmitting the images to the control device 20, wherein the first image of the diode to be detected is an outer surface and a pin image of the body of the diode to be detected, the second image of the diode to be detected is a bottom image and a rear pin image of the body of the diode to be detected, and the third image of the diode to be detected is a bottom image and a front pin image of the body of the diode to be detected. The first sensor 112 is used to detect whether the diode to be detected reaches the visual appearance detecting unit 11.

Specifically, as shown in fig. 8, when the first sensor 112 senses that the diode to be detected is transmitted to the visual appearance detection area, a sensing signal is transmitted to the control device 20, and the control device 20 controls the appearance photographing camera set 111 to photograph the appearance of the diode to be detected. The first appearance photographing camera 1111 is located right above the diode to be detected, and is configured to acquire an image of the outer surface of the body and the pins of the diode to be detected, and transmit the image to the control device 20. The second appearance camera 1112 is located right behind the diode to be detected, and may obliquely treat the diode to be detected at a certain angle to obtain a bottom image of the body and a rear pin image of the diode to be detected, and transmit the images to the control device 20. The third appearance photographing camera 1113 is located at the left front of the diode to be detected, and can obliquely photograph the diode to be detected at a certain angle to obtain a bottom image and a front pin image of the body of the diode to be detected, and transmit the images to the control device 20. Since the diode to be detected horizontally moves along the X-axis direction by the slot transfer unit 42 and also rotates on the roller transfer module 421, the appearance photographing unit 111 can obtain an omnidirectional image of the diode to be detected.

In one embodiment of the present invention, the diode with poor appearance may include character defects, size defects, pin oxidation, and body breakage, and may be detected and sorted by priority when detected, wherein the characters are identified as a first priority, the size is measured as a second priority, and the pin oxidation and the body breakage are a third priority. Specifically, the method comprises the following steps:

first, the first appearance photographing camera 1111 acquires an overhead view image of the diode to be detected, and transmits the acquired image to the control device 20, and the control device 20 firstly performs image stitching on the overhead view image of the diode to be detected to acquire a 360-degree panoramic image of a single diode. Secondly, the control device 20 performs gray processing, threshold segmentation and morphological processing on the 360-degree panoramic image of the single diode to obtain a character area of the diode body to be detected, can recognize characters by using a character classifier, and compares the recognized characters with the characters given by the product. Finally, the characters recognized in sequence are compared with the characters given by the product, if the two characters are in a corresponding relationship of positive sequence or reverse sequence, it is indicated that the diode to be detected has no problem, if the two characters do not correspond in sequence, it is indicated that the character area of the diode to be detected has a problem, the comparison result is fed back to the control device 20, and the control device 20 sorts the diode with the problem character by controlling the appearance sorting manipulator 311 and places the diode into the corresponding subarea in the storage box with poor appearance.

And (II) acquiring a top view image of the diode to be detected by the first appearance photographing camera 1111, performing gray processing on the top view image of the diode to be detected by the control device 20, dividing a pin part and a body part of the diode to be detected by a threshold value, fitting a minimum rectangular area to the pin part and the body part, and measuring the length and width of the fitted rectangle. Assuming that the same diode is used for acquiring n images by the first appearance photographing camera 1111, the pin part fits a rectangle with a length of y1 to yn and a width of x1 to xn, the standard length of the pin is y and the standard diameter of the pin is x, the length error of the pin is Q and the diameter error of the pin is P, and the judgment basis of the pin is as follows: (| y1-y | + \8230 | + | yn-y |)/n < Q and (| x1-x | + \8230 | + | xn-x |)/n < P. If the judgment basis is met, the size of the pin of the diode to be detected is normal, otherwise, the size of the pin of the diode to be detected is poor. The judgment basis of the body part is the same as that of the pin part. The control device 20 sorts the diodes with bad sizes by controlling the appearance sorting robot 311 and puts them into the corresponding partitions in the storage box with bad appearance.

And thirdly, obtaining the axial side image of the diode to be detected through the second appearance photographing camera 1112 and the third appearance photographing camera 1113, transmitting the axial side image of the diode to be detected to the control device 20, preprocessing the axial side image of the diode to be detected by the control device 20, and then separating the pin part and the body part of the diode to be detected to obtain the outer surface oxidation characteristic and the bottom damage characteristic of the pin of the diode to be detected. Secondly, according to the overlook image of the diode to be detected obtained by the first appearance photographing camera, the overlook image of the diode to be detected is preprocessed through the control device 20, then the pin part and the body part of the diode to be detected are separated, the cylindrical surface damage characteristic of the body of the diode to be detected is obtained, finally, the control device 20 obtains the body image of a single diode through the first grabbing photographing camera 331 installed on the appearance sorting manipulator 311 and transmits the body image to the control device 20, and the control device 20 controls the appearance sorting manipulator 311 to place the diode with the oxidized pins and the damaged body into corresponding partitions in the poor-appearance storage box 321.

As shown in fig. 9 and 10, in one embodiment of the present invention, the resistance value visual detection unit 12 includes: a forward resistance test assembly 121, a reverse resistance test assembly 122, a multimeter 123, a second sensor 124, a third sensor 125, and a resistance photographing camera 126. The resistance value of the diode to be detected is tested when current flows from the end A of the forward resistance value testing component to the end B of the forward resistance value testing component, the resistance value of the diode to be detected is tested when current flows from the end B of the reverse resistance value testing component to the end A of the reverse resistance value testing component, the universal meter 123 is used for displaying the resistance value of the diode to be detected, the second sensor 124 is used for detecting whether the diode to be detected reaches the forward resistance value testing component, the third sensor 125 is used for detecting whether the diode to be detected reaches the reverse resistance value testing component, and the resistance value photographing camera 126 is used for acquiring instrument images on the universal meter.

Specifically, as shown in fig. 10, the second sensor 124 may sense whether the diode to be detected reaches a position right below the forward resistance value testing component 121, wherein the second sensor 124 is located in front of the forward resistance value testing component 121. When the second sensor 124 senses that the diode to be detected reaches the position right below the forward resistance testing component 121, a sensing signal is sent to the control device 20, and at this time, the control device 20 controls the forward resistance testing component 121 to detect the resistance of the diode to be detected and displays the resistance of the diode to be detected on the multimeter. The third sensor 125 can sense whether the diode to be detected reaches a position right below the reverse resistance testing component 122, wherein the third sensor 125 is located in front of the reverse resistance testing component 122. When the third sensor 125 senses that the diode to be detected reaches the position right below the reverse resistance value testing component 122, a sensing signal is sent to the control device 20, and at this time, the control device 20 controls the reverse resistance value testing component 122 to detect the resistance value of the diode to be detected and displays the resistance value of the diode to be detected on the multimeter. The resistance value photographing camera 126 acquires a resistance value image of a diode to be detected on the multimeter and transmits the resistance value image to the control device 20. During the testing process of the forward and reverse resistance testing device, the cylinder drives the connecting rod and the connecting rod to drive the testing needle to complete the resultant motion of the Z-axis and Y-axis direction movement, namely, the testing needle S1 can be in elastic contact with the pin of the diode to be tested, which is driven in the X-axis direction, and the corresponding resistance is tested.

In one embodiment of the present invention, the poor electrical performance diodes may include open circuit defects, short circuit defects, print defects, and resistive defects, and may be detected and sorted by priority when detected, wherein open circuit defects and short circuit defects are of a first priority, print defects are of a second priority, and resistive defects are of a third priority. Specifically, the method comprises the following steps:

first, the resistance value photographing camera 126 acquires an image of the diode to be detected, and performs gray processing and binarization processing on the image through the control device 20. And then obtaining a resistance image tested by the forward resistance testing component 121 and a resistance image tested by the reverse resistance testing component 122 of a single diode, respectively performing threshold segmentation and morphological processing on the two resistance images of the single diode through the control device 20, and identifying the forward resistance and the reverse resistance by using a character classifier. If the resistance values obtained by the control device 20 are all OL, it indicates that the internal of the diode is open-circuited, i.e. the open-circuited state is poor. If the resistance values obtained by the control device 20 are all specific values, it is indicated that the internal short circuit of the diode body is a short circuit failure.

And (ii) the resistance value photographing camera 126 acquires the resistance value of a single diode and transmits the resistance value to the control device 20, the control device 20 acquires a body image of the single diode by controlling the second capturing photographing camera 332 mounted on the electrical sorting manipulator 312 and transmits the body image to the control device 20, and the control device 20 preprocesses the body image and acquires the white stripe characteristics of the cylindrical surface of the body of the single diode, so that the cathode position and the corresponding anode position of the axial diode printing can be determined. If the resistance value of a single diode obtained by the test of the forward resistance value testing component 121 is a specific value, the resistance value obtained by the reverse resistance value testing component 122 is OL, and the printing polarity of the axial diode is inconsistent with the polarity of the test pin of the forward resistance value testing component 121, the polarity printing of the diode can be determined to be poor, and the control device 20 can sort the diode with poor printing by controlling the electrical property sorting manipulator 312 and put the diode into a corresponding partition in the storage box 322 with poor electrical property. If the resistance value of a single diode obtained by the forward resistance value testing component 121 is OL, the resistance value obtained by the reverse resistance value testing component 122 is a specific value, and the printing polarity of the single diode is inconsistent with the polarity of the testing pin of the reverse resistance value testing component 122, the polarity printing of the diode can be determined to be poor, and the control device 20 can sort the diodes with poor printing by controlling the electrical property sorting manipulator 312 and put the diodes into corresponding partitions in the storage box 322 with poor electrical property.

And thirdly, if the two conditions are not met, the control device 20 can compare the obtained specific resistance value of the single diode with the resistance value given by the product to judge whether the obtained specific resistance value is within the normal resistance value error range, if the obtained specific resistance value is within the normal resistance value error range, the obtained specific resistance value is normal, and if the obtained specific resistance value is not within the normal resistance value error range, the obtained specific resistance value is poor in resistance.

In an embodiment of the present invention, the visual inspection device 10 may further include a light supplement light source, and when the light is dark, the light supplement light source may obliquely illuminate the diode to be inspected at a certain angle to provide light supplement, so as to improve the definition of the obtained appearance image and the resistance value image of the diode to be inspected.

As shown in fig. 11, in one embodiment of the present invention, the sorting apparatus includes: a sorting robot 31, a defective product storage box 32, and a capturing camera 33. The sorting manipulator 31 comprises an appearance sorting manipulator 311 and an electrical property sorting manipulator 312 which are respectively used for sorting diodes with poor appearance and diodes with poor electrical property, wherein the appearance sorting manipulator 311 and the electrical property sorting manipulator 312 can be five-axis manipulators. The defective product storage box 32 includes a defective appearance storage box 321 and a defective electrical performance storage box 322, wherein the defective appearance storage box 321 has 4 partitions for storing diodes with poor characters, poor sizes, poor body breakage and poor pin oxidation, and the defective electrical performance storage box 322 has two partitions for storing diodes with poor resistance and poor polarity printing. The capturing camera 33 is divided into a first capturing camera 331 and a second capturing camera 332, wherein the first capturing camera 331 is configured to acquire a position image of the diode to be detected and transmit the position image to the control device 20 when the diode to be detected passes through the appearance sorting manipulator 311, and the second capturing camera 332 is configured to acquire a position image of the diode to be detected and transmit the position image to the control device 20 when the diode to be detected passes through the electrical property sorting manipulator 312.

Specifically, as shown in fig. 12, when the diode to be detected passes through the appearance sorting robot 311, the first capture camera 331 installed on the appearance sorting robot 311 acquires a position image of the diode to be detected and transmits the position image to the control device 20, and the control device 20 controls the appearance sorting robot 311 to capture the diode with poor appearance and place the diode with poor appearance in the corresponding partition in the storage box 321 with poor appearance. Similarly, when the diode to be detected passes through the electrical property sorting manipulator 312, the second capturing camera 332 mounted on the electrical property sorting manipulator 311 acquires the position image of the diode to be detected and transmits the position image to the control device 20, and the control device 20 controls the electrical property sorting manipulator 312 to capture the diode with poor electrical property and place the diode with poor electrical property in the corresponding partition in the storage box 322 with poor electrical property.

According to the machine vision-based axial rectifier diode detection and sorting system, whether the diode to be detected reaches the area to be detected or not is detected through the vision detection device, the appearance image and the resistance value of the diode to be detected are acquired and transmitted to the control device, the control device judges whether the diode to be detected is a defective product or not, and the sorting device is controlled to sort the defective product, so that the axial rectifier diode can be automatically detected and sorted, the labor cost is reduced, and the production efficiency can be improved.

Corresponding to the embodiment, the invention further provides a machine vision-based axial rectifier diode detection and sorting method.

As shown in fig. 13, the method for detecting and sorting axial rectifier diodes based on machine vision according to the embodiment of the present invention includes the following steps:

s1, detecting whether a diode to be detected reaches a region to be detected, and acquiring an appearance image and a resistance value of the diode to be detected when the diode to be detected reaches the region to be detected;

in an embodiment of the invention, the to-be-detected region includes an appearance detection region and a resistance value detection region, wherein the appearance detection region is used for detecting an appearance of the to-be-detected diode, and the resistance value detection region is used for detecting a resistance value of the to-be-detected diode.

In one embodiment of the present invention, a conveying device may be used for conveying the diode to be detected to the area to be detected, and the conveying device may further include a feeding vibration tray and a card slot conveying unit. The feeding vibration disc is used for placing the diode to be detected which does not need to be placed in a horizontal state along the Y-axis direction in the vibration transmission process. The clamping groove transmission unit is used for transmitting the diode to be detected in the horizontal state to the visual detection device, the inner side of the clamping groove transmission unit is provided with the roller transmission module, and the clamping groove of the clamping groove transmission unit can be made of plastic materials.

Specifically, material loading vibration dish can be by the vibration dish, the sharp feeder, divide material baffle and photoelectric sensing module to constitute, wherein, the photoelectric sensing module can constitute by three photoelectric sensing ware, set up respectively in the entrance of sharp feeder, the entrance of discharge gate, on the place ahead base of draw-in groove conveying unit, and the discharge gate of material loading vibration dish can be the rubber material, the messenger detects the diode and can not worn and torn before getting into draw-in groove conveying unit, and simultaneously, the draw-in groove of draw-in groove conveying unit also can be the rubber material, when the messenger detects the diode and takes place the rotation at gyro wheel conveying module, its pin can not worn and torn by the draw-in groove. Furthermore, the material distribution baffle is controlled by an air cylinder and is respectively arranged at the right end of the inlet of the linear feeder, the left end of the inlet of the discharge port and under the discharge port. The diode is changed from a state of no need of placement to a horizontal state along the Y-axis direction in the conveying process of the vibration disk. When entering the inlet of the linear feeder, the photoelectric sensing module can sense the diode to be detected and transmit a sensing signal to the control device, and at the moment, the control device counts the diode to be detected flowing through the inlet of the linear feeder and judges whether the diode flowing into the linear feeder is fully loaded or not. When the count of the diode to be detected by the control device reaches the full-load condition, the control device transmits a signal to the air cylinder and the vibrating disk, at the moment, the air cylinder controls the material distribution baffle to block the diode transmitted by the vibrating disk, and the vibrating disk stops vibrating and transmitting materials immediately. In addition, the diode to be detected is continuously conveyed to the discharge port under the vibration conveying of the linear feeder, when the diode flows into the discharge port, the photoelectric sensing module can sense the diode and transmit a sensing signal to the control device, and the control device sends a signal to the air cylinder to enable the distribution baffle plate to block the diode conveyed behind. The diode can not come out immediately when flowing into the discharge gate, can be blocked by the branch material baffle directly below, and when photoelectric sensing system sensed the draw-in groove on the draw-in groove conveying unit, photoelectric sensing module transmitted sensing signal for controlling means, and controlling means sends the signal and gives the cylinder, and the cylinder control divides the retraction of material baffle and resets immediately. At the moment, the diode to be detected slides on the clamping groove conveying unit and is conveyed to the roller conveying module, and when the diode to be detected is conveyed on the clamping groove conveying unit and the roller conveying module simultaneously, the displacement length of the diode to be detected in the X-axis direction is kept consistent.

S2, receiving the appearance image and the resistance value of the diode to be detected, and judging whether the diode to be detected is a defective product or not according to the appearance image and the resistance value of the diode to be detected;

in an embodiment of the invention, a computer can be used for receiving the appearance image and the resistance value of the diode to be detected, processing the appearance image of the diode to be detected, extracting and identifying appearance characteristics so as to judge whether an appearance defect exists or not, and sorting the diode with poor appearance according to the judgment result. Meanwhile, the resistance value image of the diode to be detected can be received, the resistance value of the diode to be detected is identified and processed, the electrical property of the diode to be detected is judged, and the diode with poor electrical property is sorted according to the judgment result.

In an embodiment of the present invention, an appearance photographing camera set may be used to obtain an appearance image of a diode to be detected, and specifically, the appearance photographing set includes a first appearance photographing camera, a second appearance photographing camera, and a third appearance photographing camera, which are respectively used to obtain a first image, a second image, and a third image of the diode to be detected, and transmit the images to a control device, where the first image of the diode to be detected is an outer surface and a pin image of a body of the diode to be detected, the second image of the diode to be detected is a bottom image and a rear pin image of the body of the diode to be detected, and the third image of the diode to be detected is a bottom image and a front pin image of the body of the diode to be detected. The first sensor is used for detecting whether the diode to be detected reaches the appearance visual detection unit. When the first sensor senses that the diode to be detected is transmitted to the appearance visual detection area, the sensing signal is transmitted to the control device, and the control device controls the appearance photographing camera group to photograph the appearance of the diode to be detected. The first appearance photographing camera is positioned right above the diode to be detected and used for acquiring images of the outer surface of the body and the pins of the diode to be detected and transmitting the images to the control device. The second appearance shooting camera is positioned at the right rear part of the diode to be detected, can obliquely treat the diode to be detected at a certain angle so as to obtain a bottom image and a rear pin image of the body of the diode to be detected, and transmits the images to the control device. The third appearance photographing camera is positioned in the left front of the diode to be detected, can obliquely treat the diode to be detected at a certain angle so as to obtain a bottom image and a front pin image of the body of the diode to be detected, and transmits the images to the control device.

In one embodiment of the present invention, the diode with poor appearance may include character defects, size defects, pin oxidation, and body breakage, and may be detected and sorted by priority when detected, wherein the characters are identified as a first priority, the size is measured as a second priority, and the pin oxidation and body breakage are identified as a third priority. Specifically, the method comprises the following steps:

the method comprises the following steps that firstly, a first appearance photographing camera is used for obtaining an overlook image of a diode to be detected, the obtained image is transmitted to a control device, and the control device firstly carries out image splicing on the overlook image of the diode to be detected so as to obtain a 360-degree panoramic image of a single diode. Secondly, the control device performs gray processing, threshold segmentation and morphological processing on a 360-degree panoramic image of a single diode to obtain a character area of the diode body to be detected, a character classifier can be used for recognizing characters, and the recognized characters are compared with the characters given by the product. And finally, comparing the characters recognized in sequence with the characters given by the product, if the two characters are in a corresponding relation of positive sequence or negative sequence, indicating that the diode to be detected has no problem, and if the two characters do not correspond to each other in sequence, indicating that the character area of the diode to be detected has a problem, and feeding back the comparison result to the control device, wherein the control device sorts the diode with the problem character by controlling the appearance sorting manipulator and puts the diode into the corresponding subarea in the storage box with poor appearance.

And (II) acquiring an overhead view image of the diode to be detected through the first appearance photographing camera, performing gray processing on the overhead view image of the diode to be detected by the control device 20, dividing the pin part and the body part of the diode to be detected by a threshold value, fitting the pin part and the body part to form a minimum rectangular area, and measuring the length and width dimensions of the fitted rectangle. Assuming that the same diode is used for acquiring n images by a first appearance photographing camera, a rectangular part of the pin is fitted with the length of y1 to yn and the width of x1 to xn, the standard length of the pin is y, the standard diameter of the pin is x, the length error of the pin is Q, and the diameter error of the pin is P, so that the pin is judged according to the following steps: (| y1-y | + \8230 | + | yn-y |)/n < Q and (| x1-x | + \8230 | + | xn-x |)/n < P. If the judgment basis is met, the pin size of the diode to be detected is normal, otherwise, the pin size of the diode to be detected is poor. The judgment basis of the body part is the same as that of the pin part. The control device sorts the diodes with poor sizes by controlling the appearance sorting mechanical arm and puts the diodes into corresponding partitions in the storage box with poor appearance.

And thirdly, obtaining an axial side image of the diode to be detected through the second appearance photographing camera and the third appearance photographing camera, transmitting the axial side image of the diode to be detected to the control device, preprocessing the axial side image of the diode to be detected by the control device, and separating the pin part and the body part of the diode to be detected so as to obtain the outer surface oxidation characteristic and the bottom damage characteristic of the pin of the diode to be detected. Secondly, according to the overlook image of the diode to be detected, which is obtained by the first appearance photographing camera, the overlook image of the diode to be detected is preprocessed through the control device, then the pin part and the body part of the diode to be detected are separated, the damage characteristic of the cylindrical surface of the body of the diode to be detected is obtained, finally, the control device obtains the body image of a single diode through controlling the first grabbing photographing camera arranged on the appearance sorting mechanical arm and transmits the body image to the control device, and the control device controls the appearance sorting mechanical arm to place the diode with the oxidized pins and the damaged body into corresponding partitions in the poor-appearance storage box.

In one embodiment of the invention, the resistance value of the diode to be detected can be acquired through the forward resistance value testing component, the reverse resistance value testing component, the universal meter, the second sensor, the third sensor and the resistance value photographing camera. The resistance value of the diode to be detected is tested when the current flows from the end A of the forward resistance value testing component to the end B of the forward resistance value testing component, the resistance value of the diode to be detected is tested when the current flows from the end B of the reverse resistance value testing component to the end A of the reverse resistance value testing component, the universal meter is used for displaying the resistance value of the diode to be detected, the second sensor is used for detecting whether the diode to be detected reaches the forward resistance value testing component, the third sensor is used for detecting whether the diode to be detected reaches the reverse resistance value testing component, and the resistance value photographing camera is used for acquiring instrument images on the universal meter.

Specifically, the second sensor can sense whether the diode to be detected reaches the position right below the forward resistance testing component, wherein the second sensor is located in front of the forward resistance testing component. When the second sensor senses that the diode to be detected reaches the position right below the forward resistance testing component, the second sensor sends a sensing signal to the control device, and at the moment, the control device controls the forward resistance testing component to detect the resistance of the diode to be detected and displays the resistance of the diode to be detected on the universal meter. The third sensor can sense whether the diode to be detected reaches the position right below the reverse resistance value testing component, wherein the third sensor is located in front of the reverse resistance value testing component. When the third sensor senses that the diode to be detected reaches the position right below the reverse resistance value testing component, the third sensor sends a sensing signal to the control device, and at the moment, the control device controls the reverse resistance value testing component to detect the resistance value of the diode to be detected and displays the resistance value of the diode to be detected on the universal meter. The resistance value photographing camera acquires a resistance value image of a diode to be detected on the universal meter and transmits the resistance value image to the control device. During the testing process of the forward and reverse resistance testing device, the cylinder drives the connecting rod and the connecting rod to drive the testing needle to complete the resultant motion of the Z-axis and Y-axis direction movement, namely, the testing needle S1 can be in elastic contact with the pin of the diode to be tested, which is driven in the X-axis direction, and the corresponding resistance is tested.

In one embodiment of the present invention, the diodes with poor electrical properties may include open circuit defects, short circuit defects, print defects, and electrical resistance defects, and when detected, may be detected and sorted by priority, wherein open circuit defects and short circuit defects are a first priority, print defects are a second priority, and electrical resistance defects are a third priority. Specifically, the method comprises the following steps:

and (I) acquiring an image of the diode to be detected by the resistance value photographing camera, and performing gray scale processing and binarization processing on the image by the control device. And then acquiring a resistance image tested by the forward resistance testing component and a resistance image tested by the reverse resistance testing component of a single diode, respectively carrying out threshold segmentation and morphological processing on the two resistance images of the single diode through a control device, and identifying the forward resistance and the reverse resistance by using a character classifier. If the resistance values obtained by the control device are all OL, the internal open circuit of the diode body is indicated, namely the open circuit is poor. If the resistance values obtained by the control device are specific numerical values, the internal short circuit of the diode body is indicated, and the short circuit is poor.

And (II) the resistance value photographing camera acquires the resistance value of a single diode and transmits the resistance value to the control device, the control device acquires a body image of the single diode and transmits the body image to the control device by controlling the second capturing photographing camera installed on the electrical property sorting manipulator, and the control device preprocesses the image and acquires the white stripe characteristics of the cylindrical surface of the body of the single diode, so that the position of the cathode printed by the axial diode and the position of the corresponding anode can be determined. If the resistance value of a single diode obtained by testing of the forward resistance value testing assembly is a specific numerical value, the resistance value obtained by the reverse resistance value testing assembly is OL, and the printing polarity of the axial diode is inconsistent with the polarity of the testing pin of the forward resistance value testing assembly, the polarity printing failure of the diode can be determined, and the control device can sort the diodes with poor printing by controlling the electrical property sorting manipulator and put the diodes into corresponding partitions in a storage box with poor electrical property; if the resistance value of a single diode obtained by testing of the forward resistance value testing assembly is OL, the resistance value of the reverse resistance value testing assembly is a specific numerical value, and the printing polarity of the single diode is inconsistent with the polarity of the testing pin of the reverse resistance value testing assembly, the polarity printing of the diode can be determined to be poor, and the control device can control the electrical property sorting manipulator to sort the diodes with poor printing and place the diodes into corresponding partitions in a storage box with poor electrical property.

And thirdly, if the two conditions are not met, the control device can compare the obtained specific resistance value of the single diode with the given resistance value of the product to judge whether the obtained specific resistance value is within the error range of the normal resistance value, if the obtained specific resistance value is within the error range of the normal resistance value, the resistance value is normal, and if the obtained specific resistance value is not within the error range of the normal resistance value, the resistance is poor.

In an embodiment of the invention, the visual detection device may further include a light supplement light source, and when the light is dark, the light supplement light source may obliquely illuminate the diode to be detected at a certain angle to provide light supplement, so as to improve the definition of the obtained appearance image and resistance value image of the diode to be detected.

And S3, sorting the defective products.

In one embodiment of the invention, defective products may be sorted and placed in a defective product storage box using a sorting robot. The sorting manipulator comprises an appearance sorting manipulator and an electrical property sorting manipulator which are respectively used for sorting diodes with poor appearance and diodes with poor electrical property, wherein the appearance sorting manipulator and the electrical property sorting manipulator can be five-axis manipulators. The defective product storage box comprises a defective appearance storage box and a defective electrical property storage box, wherein the defective appearance storage box is provided with 4 partitions and is respectively used for storing diodes with defective characters, defective sizes, defective body breakage and defective pin oxidation, and the defective electrical property storage box is provided with two partitions and is respectively used for storing diodes with defective resistance and defective polarity printing. The grabbing photographing camera is divided into a first grabbing photographing camera and a second grabbing photographing camera, wherein the first grabbing photographing camera is used for acquiring the position image of the diode to be detected and transmitting the position image to the control device when the diode to be detected passes through the appearance sorting manipulator, and the second grabbing photographing camera is used for acquiring the position image of the diode to be detected and transmitting the position image to the control device when the diode to be detected passes through the electrical property sorting manipulator.

Specifically, when the diode to be detected passes through the appearance sorting mechanical arm, the first grabbing camera installed on the appearance sorting mechanical arm acquires a position image of the diode to be detected and transmits the position image to the control device, and the control device controls the appearance sorting mechanical arm to grab the diode with poor appearance and place the diode in a corresponding partition in the storage box with poor appearance. Similarly, when the diode to be detected passes through the electrical property sorting mechanical hand, the second grabbing and photographing camera mounted on the electrical property sorting mechanical hand is used for acquiring the position image of the diode to be detected and transmitting the position image to the control device, and the control device controls the electrical property sorting mechanical hand to grab the diode with poor electrical property and place the diode in the corresponding partition in the storage box with poor electrical property.

According to the machine vision-based axial rectifier diode detection and sorting system, whether the diode to be detected reaches the area to be detected is detected, the appearance image and the resistance value of the diode to be detected are obtained and transmitted to the control device, the control device judges whether the diode to be detected is a defective product, and the sorting device is controlled to sort the defective product, so that the axial rectifier diode can be automatically detected and sorted, the labor cost is reduced, and the production efficiency can be improved.

In the description of the present invention, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or to imply that the number of technical features indicated is significant. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. The meaning of "plurality" is two or more unless specifically limited otherwise.

In the present invention, unless otherwise explicitly stated or limited, the terms "mounted," "connected," "fixed," and the like are to be construed broadly, e.g., as being permanently connected, detachably connected, or integral; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or may be connected through the use of two elements or the interaction of two elements. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "above," and "over" a second feature may be directly on or obliquely above the second feature, or simply mean that the first feature is at a higher level than the second feature. A first feature "under," "beneath," and "under" a second feature may be directly under or obliquely under the second feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

In the description of the specification, reference to the description of "one embodiment," "some embodiments," "an example," "a specific example," or "some examples" or the like means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and alternate implementations are included within the scope of the preferred embodiment of the present invention in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present invention.

The logic and/or steps represented in the flowcharts or otherwise described herein, e.g., an ordered listing of executable instructions that can be considered to implement logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium could even be paper or another suitable medium upon which the program is printed, as the program can be electronically captured, via for instance optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner if necessary, and then stored in a computer memory.

It should be understood that portions of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or combination of the following technologies, which are well known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.

It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.

In addition, functional units in the embodiments of the present invention may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.

Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.

Claims (10)

1. An axial rectifier diode detects and letter sorting system based on machine vision, its characterized in that includes:

the visual detection device is used for detecting whether the diode to be detected reaches the area to be detected or not and acquiring the appearance image and the resistance value of the diode to be detected when the diode to be detected reaches the area to be detected;

the control device is connected with the visual detection device and used for receiving the appearance image and the resistance value of the diode to be detected and judging whether the diode to be detected is a defective product or not according to the appearance image and the resistance value of the diode to be detected;

and the sorting device is connected with the control device and is used for sorting the defective products.

2. The machine-vision-based axial rectifier diode detection and sorting system of claim 1, further comprising:

and the conveying device is connected with the control device and is used for conveying the diode to be detected to the area to be detected.

3. The machine-vision based axial rectifier diode detection and sorting system of claim 2, wherein said conveyor comprises:

the feeding vibration disc is used for swinging the diodes to be detected which are placed out of order into a horizontal state along the Y-axis direction in the vibration conveying process;

the clamping groove conveying unit is used for conveying the diode to be detected in the horizontal state to the visual detection device, and a roller conveying module is arranged on the inner side of the clamping groove conveying unit.

4. The machine-vision-based axial rectifier diode detection and sorting system of claim 3 wherein said feed vibratory pan comprises: vibration dish, sharp feeder, branch material baffle and photoelectric sensor.

5. The machine-vision-based axial rectifier diode detection and sorting system of claim 1, wherein the to-be-detected regions include an appearance detection region and a resistance detection region.

6. The machine-vision-based axial rectifier diode detection and sorting system of claim 1, wherein the vision inspection device comprises:

the appearance visual detection unit is used for detecting whether the diode to be detected reaches the appearance detection area or not, collecting images of a body and a pin of the diode to be detected when the diode to be detected reaches the appearance detection area and transmitting the images to the control device, wherein the appearance detection area is positioned under the appearance visual detection unit;

the resistance value visual detection unit is used for detecting whether the diode to be detected reaches the resistance value detection area or not, collecting the positive and negative resistance values of the diode to be detected when the diode to be detected reaches the resistance value detection area and transmitting the positive and negative resistance values to the control device, wherein the resistance value detection area is located right below the resistance value visual detection unit.

7. The machine-vision based axial rectifier diode detection and sorting system of claim 6, wherein said visual appearance detection unit comprises:

the appearance photographing camera set comprises a first appearance photographing camera, a second appearance photographing camera and a third appearance photographing camera, and is respectively used for acquiring a first image of the diode to be detected, a second image of the diode to be detected and a third image of the diode to be detected, wherein the first image is an outer surface and a pin image of the body of the diode to be detected, the second image is a bottom image and a rear pin image of the body of the diode to be detected, and the third image is a bottom image and a front pin image of the body of the diode to be detected;

a first sensor for detecting whether the diode to be detected reaches the visual appearance detecting unit.

8. The machine vision based axial rectifier diode detection and sorting system of claim 6 wherein said resistance value visual detection unit comprises:

the forward resistance testing component is used for testing the resistance of the diode to be detected when current flows from the end A of the forward resistance testing component to the end B of the forward resistance testing component;

the reverse resistance value testing component is used for testing the resistance value of the diode to be detected when current flows from the end B of the reverse resistance value testing component to the end A of the reverse resistance value testing component;

the universal meter is used for displaying the resistance value of the diode to be detected;

the second sensor is used for detecting whether the diode to be detected reaches the forward resistance value testing component or not;

the third sensor is used for detecting whether the diode to be detected reaches the reverse resistance value testing component or not;

and the resistance value photographing camera is used for acquiring an instrument image on the universal meter.

9. The machine-vision-based axially commutated diode detection and sorting system according to claim 1, wherein the sorting apparatus comprises:

the sorting manipulator is divided into an appearance sorting manipulator and an electrical property sorting manipulator, wherein the appearance sorting manipulator is used for sorting diodes with poor appearance, and the electrical property sorting manipulator is used for sorting diodes with poor electrical property;

the defective product storage box is divided into a defective appearance storage box and a defective electrical property storage box, wherein the defective appearance storage box is used for storing diodes with poor characters, poor sizes, poor body breakage and poor pin oxidation, and the defective electrical property storage box is used for storing diodes with poor resistance and poor polarity printing.

The grabbing and photographing camera is divided into a first grabbing and photographing camera and a second grabbing and photographing camera, wherein the first grabbing and photographing camera is used for acquiring position images of the diode to be detected and transmitting the position images to the control device when the diode to be detected passes through the appearance sorting manipulator, and the second grabbing and photographing camera is used for acquiring position images of the diode to be detected and transmitting the position images to the control device when the diode to be detected passes through the electrical property sorting manipulator.

10. A machine vision-based axial rectifier diode detection and sorting method is characterized by comprising the following steps:

detecting whether a diode to be detected reaches a region to be detected, and acquiring an appearance image and a resistance value of the diode to be detected when the diode to be detected reaches the region to be detected;

receiving the appearance image and the resistance value of the diode to be detected, and judging whether the diode to be detected is a defective product or not according to the appearance image and the resistance value of the diode to be detected;

and sorting the defective products.

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