CN115529623A - Baseband unit testing device and method, terminal equipment and storage medium - Google Patents
Baseband unit testing device and method, terminal equipment and storage medium Download PDFInfo
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- H04W24/08—Testing, supervising or monitoring using real traffic
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- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/08—Monitoring or testing based on specific metrics, e.g. QoS, energy consumption or environmental parameters
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- H—ELECTRICITY
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- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
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- H04L43/0876—Network utilisation, e.g. volume of load or congestion level
- H04L43/0888—Throughput
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- H—ELECTRICITY
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- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W88/00—Devices specially adapted for wireless communication networks, e.g. terminals, base stations or access point devices
- H04W88/08—Access point devices
- H04W88/085—Access point devices with remote components
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Abstract
The embodiment of the invention discloses a baseband unit testing device, a baseband unit testing method, terminal equipment and a storage medium. In the embodiment of the invention, the control module and the test module are arranged in the baseband unit test device, the second end of the control module is connected with the debugging end of the baseband unit, and after the data transmission port of the test module is connected with the optical port of the control module, the control module can issue the forward transmission test instruction, the return transmission test instruction, the uplink decoding test instruction and the throughput rate test instruction to the test module and the baseband unit, so that the test module can carry out forward transmission test, return transmission test, uplink decoding test and throughput rate test between the data transmission port and the baseband unit. The embodiment of the invention can test various functions of the baseband unit through the baseband unit testing device without building a plurality of testing environments, thereby simplifying the testing steps and improving the testing efficiency of the baseband unit.
Description
Technical Field
The embodiment of the application relates to the field of 5G communication, in particular to a baseband unit testing device, a baseband unit testing method, terminal equipment and a storage medium.
Background
In the field of 5G communication, an extended small base station includes a BBU (baseband unit), an EU (extended unit), and an RRU (remote unit). Before the BBU leaves the factory, the core function of the BBU generally needs to be subjected to factory test. The core functions of the BBU include the throughput of the fronthaul optical interface, the 1588 function of the backhaul optical interface, and the correctness of uplink decoding. In the traditional test method, 2 environments need to be built to complete the tests of the core functions, the test process is complex and tedious, the test efficiency is low, more test resources are occupied, and higher cost is consumed.
In summary, how to improve the testing efficiency when testing the core function of the baseband unit becomes a technical problem that needs to be solved urgently at present.
Disclosure of Invention
The embodiment of the invention provides a baseband unit testing device, a baseband unit testing method, terminal equipment and a storage medium, and solves the technical problem of low efficiency in testing the core function of a baseband unit in the prior art. The embodiment of the invention can improve the efficiency of testing the core function of the baseband unit.
In a first aspect, an embodiment of the present invention provides a baseband unit testing apparatus, including: the first end of the control module is used for being connected with the debugging end of the baseband unit, the second end of the control module is connected with the debugging end of the test module, and the data transmission port of the test module is used for being connected with the optical port of the baseband unit.
The control module is used for sending a forward test instruction, a backward test instruction, an uplink decoding test instruction or a throughput rate test instruction to the test module and the baseband unit; the forward transmission test instruction, the return transmission test instruction, the uplink decoding test instruction and the throughput rate test instruction are respectively used for instructing the baseband unit and the test module to carry out forward transmission test, return transmission test, uplink decoding test and throughput rate test;
the test module is used for carrying out forward test between the data transmission port and the baseband unit when receiving a forward test instruction; the device is used for carrying out return test between the data transmission port and the baseband unit after receiving a return test instruction; the device is used for carrying out the uplink decoding test between the data transmission port and the baseband unit when receiving the uplink decoding test instruction; and the data transmission port is connected in a loop way when receiving the throughput rate test instruction, so that the baseband unit can test the throughput rate.
In a second aspect, an embodiment of the present invention provides a baseband unit testing method, where the method is applied to a testing module in the baseband unit testing apparatus in the first aspect, and includes:
when a forward test instruction sent by a control module is received, forward test is carried out between a data transmission port and a baseband unit;
when a return test instruction sent by the control module is received, return test is carried out between the data transmission port and the baseband unit;
when an uplink decoding test instruction sent by a control module is received, an uplink decoding test is carried out between a data transmission port and a baseband unit;
and when receiving a throughput rate test instruction sent by the control module, performing loop connection on the data transmission port to enable the baseband unit to perform throughput rate test.
In a third aspect, an embodiment of the present invention provides a terminal device, where the terminal device includes a processor and a memory;
the memory is used for storing the computer program and transmitting the computer program to the processor;
the processor is adapted to perform a method of testing a baseband unit according to the second aspect according to instructions in a computer program.
In a fourth aspect, embodiments of the present invention provide a storage medium storing computer-executable instructions for performing a baseband unit testing method as in the second aspect when executed by a computer processor.
In the embodiment of the present invention, the control module and the test module are arranged in the baseband unit test apparatus, the second end of the control module is connected to the debugging end of the baseband unit, and after the data transmission port of the test module is connected to the optical port of the control module, the control module can issue the forward transmission test instruction, the return transmission test instruction, the uplink decoding test instruction and the throughput rate test instruction to the test module and the baseband unit, so that the test module performs the forward transmission test, the return transmission test, the uplink decoding test and the throughput rate test between the data transmission port and the baseband unit. The embodiment of the invention can test various functions of the baseband unit through the baseband unit testing device without building a plurality of testing environments, thereby simplifying the testing steps and improving the testing efficiency of the baseband unit.
Drawings
Fig. 1 is a schematic structural diagram of a baseband unit testing apparatus according to an embodiment of the present invention.
Fig. 2 is a flowchart of a baseband unit method according to an embodiment of the present invention.
Fig. 3 is a schematic structural diagram of another baseband unit testing apparatus according to an embodiment of the present invention.
Fig. 4 is a schematic structural diagram of another baseband unit testing apparatus according to an embodiment of the present invention.
Fig. 5 is a schematic diagram of an internal structure of a switch switching unit according to an embodiment of the present invention.
Fig. 6 is a schematic structural diagram of another baseband unit testing apparatus according to an embodiment of the present invention.
Fig. 7 is a schematic structural diagram of a terminal device according to an embodiment of the present invention.
Reference numerals:
the optical switch device comprises a control module 1, a test module 2, a baseband unit 3, a data transmission port 4, an optical port 5, a first connection end SFPB0, a second connection end SFPB1, a third connection end SFPB2, a fourth connection end SFPB3, a fifth connection end SFPB4, a first front optical transmission port SFPA0, a second front optical transmission port SFPA1, a third front optical transmission port SFPA2, a fourth front optical transmission port SFPA3, a return optical transmission port SFPA4, a switch switching unit 21, an uplink signal source unit 22, a master clock unit 23, a slave clock unit 24, a switch unit 12 and a control unit 11.
Detailed Description
The following description and the annexed drawings set forth in detail certain illustrative embodiments of the application so as to enable those skilled in the art to practice them. The examples merely typify possible variations. Individual components and functions are optional unless explicitly required, and the sequence of operations may vary. Portions and features of some embodiments may be included in or substituted for those of others. The scope of the embodiments of the present application includes the full ambit of the claims, as well as all available equivalents of the claims. Embodiments may be referred to, individually or collectively, herein by the term "invention" merely for convenience and without intending to voluntarily limit the scope of this application to any single invention or inventive concept if more than one is in fact disclosed. Herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed. The various embodiments are described in a progressive manner, with each embodiment focusing on differences from the other embodiments, and with like parts being referred to one another. For the structures, products and the like disclosed by the embodiments, the description is relatively simple because the structures, the products and the like correspond to the parts disclosed by the embodiments, and the relevant parts can be just described by referring to the method part.
As shown in fig. 1, fig. 1 is a schematic structural diagram of a baseband unit testing apparatus according to an embodiment of the present invention. The baseband unit testing device provided by the embodiment of the invention comprises: the device comprises a control module 1 and a test module 2, wherein a first end of the control module 1 is used for being connected with a debugging end of a baseband unit 3, a second end of the control module 1 is connected with the debugging end of the test module 2, and a data transmission port 4 of the test module 2 is used for being connected with an optical port 5 of the baseband unit 3.
The control module 1 is used for sending a forward test instruction, a backward test instruction, an uplink decoding test instruction or a throughput rate test instruction to the test module 2 and the baseband unit 3; the forward transmission test instruction, the return test instruction, the uplink decoding test instruction and the throughput rate test instruction are respectively used for instructing the baseband unit 3 and the test module 2 to perform forward transmission test, return test, uplink decoding test and throughput rate test.
In this embodiment, the baseband unit testing apparatus includes a control module 1 and a testing module 2, where the control module 1 is used to control the baseband unit 3 and the testing module 2, and the testing module 2 is used to test different functions of the baseband unit 3. Specifically, in this embodiment, the first end of the control module 1 is used to connect with the debugging end of the baseband unit 3, and the second end of the control module 1 is connected with the debugging end of the test module 2. The control module 1 is configured to send a forward test instruction, a backward test instruction, an uplink decoding test instruction, or a throughput rate test instruction to the test module 2 and the baseband unit 3 through the first end and the second end of the control module. It can be understood that, in order to ensure normal performance of the test, when the control module 1 sends any one of the forward test instruction, the backward test instruction, the uplink decoding test instruction, or the throughput test instruction, it needs to send the instruction to the test module 2 and the baseband unit 3 at the same time.
In this embodiment, the forward test instruction, the backward test instruction, the uplink decoding test instruction, and the throughput test instruction are respectively used to instruct the baseband unit 3 and the test module 2 to perform the forward test, the backward test, the uplink decoding test, and the throughput test. Forward test, which is to test the forward interface of the baseband unit 3; the return test refers to testing a return interface of the baseband unit 3; the uplink decoding test refers to performing a signal decoding test on an uplink of the baseband unit 3; the throughput test is a test of the number of transmitted data per unit time in the baseband unit 3.
The test module 2 is used for carrying out forward test between the data transmission port 4 and the baseband unit 3 when receiving a forward test instruction; the device is used for carrying out return test between the data transmission port 4 and the baseband unit 3 after receiving a return test instruction; the device is used for carrying out the uplink decoding test between the data transmission port 4 and the baseband unit 3 when receiving the uplink decoding test instruction; and is used for performing loop back connection on the data transmission port 4 when receiving the throughput rate test instruction, so as to enable the baseband unit 3 to perform throughput rate test.
In this embodiment, the debugging end of the test module 2 is connected to the first end of the control module 1, and is configured to receive a forward test instruction, a backward test instruction, an uplink decoding test instruction, and a throughput test instruction sent by the control module 1. The data transmission port 4 of the test module 2 is connected with the optical port 5 of the baseband unit 3, and the test module 2 is used for performing various tests between the data transmission port 4 and the baseband unit 3. Specifically, when the control end of the test module 2 receives the forward transmission test instruction sent by the control module 1, the test module 2 can perform data transmission between the data transmission port 4 and the optical port 5 of the baseband unit 3, thereby completing the forward transmission test of the baseband unit 3. Similarly, when the control end of the test module 2 receives the return test instruction sent by the control module 1, data transmission can be performed between the data transmission port 4 and the optical port 5 of the baseband unit 3, so as to complete the return test of the baseband unit 3. When the control end of the test module 2 receives the uplink decoding test instruction sent by the control module 1, the uplink signal can be sent to the optical port 5 of the baseband unit 3 through the data transmission port 4, so that the baseband unit 3 decodes the uplink signal to complete the uplink decoding test. When the control end of the test module 2 receives the throughput test, it is configured to perform loop connection on the data transmission port 4, so that after the optical port 5 of the baseband unit 3 sends the test data to the test module 2, the test module 2 can return the test data to the optical port 5 of the baseband unit 3 again, so that the baseband unit 3 completes the throughput test of the optical port 5.
In addition, an embodiment of the present invention further provides a baseband unit testing method, as shown in fig. 2, where the baseband unit testing method provided in the embodiment of the present invention is applied to the testing module 2 in the baseband unit testing apparatus, and includes:
In this embodiment, after the control module 1 sends the forwarding test instruction to the test module 2 and the baseband unit 3, the baseband unit 3 and the test module 2 can execute the respective preset forwarding test program, the test module 2 starts data transmission with the baseband unit 3 through the data transmission port 4, and the baseband unit 3 and the test module 2 complete the forwarding test through mutual cooperation. After the forward test is completed, the baseband unit 3 may generate a forward test result, and the control module 1 may obtain the forward test result through the debugging end of the baseband unit 3, and determine whether the forward test passes or not according to the forward test result, and if not, the control module 1 may notify the relevant person in an alarm manner.
And 102, when a return test instruction sent by the control module is received, performing return test between the data transmission port and the baseband unit.
Similarly, after the control module 1 sends the backhaul test instruction to the test module 2 and the baseband unit 3, the baseband unit 3 and the test module 2 can execute the respective preset backhaul test program, the test module 2 starts data transmission with the baseband unit 3 through the data transmission port 4, and the baseband unit 3 and the test module 2 complete the backhaul test through mutual cooperation. After the return test is completed, the test module 2 generates a return test result, and the control module 1 can obtain the return test result through the debugging end of the test module 2 and confirm whether the return test passes or not according to the return test result.
And 103, when receiving an uplink decoding test instruction sent by the control module, performing an uplink decoding test between the data transmission port and the baseband unit.
After the control module 1 sends the uplink decoding test instruction to the test module 2 and the baseband unit 3, the baseband unit 3 and the test module 2 can execute respective preset uplink decoding programs, the test module 2 starts to send an uplink signal to the baseband unit 3 through the data transmission port 4, and the uplink decoding program in the baseband unit 3 can perform uplink decoding on the uplink signal. After the uplink decoding test is completed, the baseband unit 3 generates an uplink decoding result, and the control module 1 can obtain the uplink decoding result through the debugging end of the baseband unit 3 and confirm whether the uplink decoding test passes or not according to the uplink decoding result.
And step 104, when receiving the throughput rate test instruction sent by the control module, performing loop back connection on the data transmission port to enable the baseband unit to perform throughput rate test.
In this embodiment, after the control module 1 sends the throughput rate test instruction to the test module 2 and the baseband unit 3, the baseband unit 3 and the test module 2 may execute the respective preset throughput rate test programs. At this time, the test module 2 performs loop-back connection on the data transmission port 4 of itself, for example, if the data transmission port 4 includes two data transmission terminals connected to two optical ports, the test module 2 may short-circuit the two data transmission terminals to complete the loop-back connection. Meanwhile, the baseband unit 3 starts to send test data to the test module 2 through the optical port 5, because the data transmission port 4 is connected in a loop, the test data sent by the baseband unit 3 passes through the data transmission port 4 and then returns to the baseband unit 3 again, and the throughput rate test program of the baseband unit 3 can analyze the sent test data and the received test data, so that the throughput rate test is completed and a throughput rate test result is generated. The control module 1 may obtain the throughput test result through the debugging end of the baseband unit 3, and determine whether the throughput test passes or not according to the throughput test result.
In the embodiment of the present invention, the control module and the test module are arranged in the baseband unit test apparatus, the second end of the control module is connected to the debugging end of the baseband unit, and after the data transmission port of the test module is connected to the optical port of the control module, the control module can issue the forward transmission test instruction, the return transmission test instruction, the uplink decoding test instruction and the throughput rate test instruction to the test module and the baseband unit, so that the test module performs the forward transmission test, the return transmission test, the uplink decoding test and the throughput rate test between the data transmission port and the baseband unit. The embodiment of the invention can test various functions of the baseband unit through the baseband unit testing device without building a plurality of testing environments, simplifies the testing steps, improves the testing efficiency of the baseband unit and solves the technical problem of low testing efficiency when testing the core function of the baseband unit in the prior art.
On the basis of the above embodiment, the data transmission port 4 of the test module 2 includes a first connection end SFPB0, a second connection end SFPB1, a third connection end SFPB2, a fourth connection end SFPB3, and a fifth connection end SFPB4, the optical port 5 of the baseband unit 3 includes a first front optical port SFPA0, a second front optical port SFPA1, a third front optical port SFPA2, a fourth front optical port SFPA3, and a return optical port SFPA4, the first connection end SFPB0 is used for being connected to the first front optical port SFPA0, the second connection end SFPB1 is used for being connected to the second front optical port SFPA1, the third connection end SFPB2 is used for being connected to the third front optical port SFPA2, the fourth connection end SFPB3 is used for being connected to the fourth front optical port SFPA3, and the fifth connection end SFPB4 is used for being connected to the return optical port SFPA4.
In one embodiment, as shown in fig. 3, the data transmission port 4 of the test module 2 includes a first connection end SFPB0, a second connection end SFPB1, a third connection end SFPB2, a fourth connection end SFPB3, and a fifth connection end SFPB4, and the optical port 5 of the baseband unit 3 includes a first front optical transmission port SFPA0, a second front optical transmission port SFPA1, a third front optical transmission port SFPA2, a fourth front optical transmission port SFPA3, and a back optical transmission port SFPA4. The first connection end SFPB0 is used for being connected with the first front optical transmission port SFPA0, the second connection end SFPB1 is used for being connected with the second front optical transmission port SFPA1, the third connection end SFPB2 is used for being connected with the third front optical transmission port SFPA2, the fourth connection end SFPB3 is used for being connected with the fourth front optical transmission port SFPA3, and the test module 2 and the baseband unit 3 perform front transmission testing, uplink decoding testing and throughput testing through the first front optical transmission port SFPA0, the second front optical transmission port SFPA1, the third front optical transmission port SFPA2 and the fourth front optical transmission port SFPA 3. The fifth connection end SFPB4 is used for being connected to the return optical port SFPA4, and the test module 2 and the baseband unit 3 complete the return test through the return optical port SFPA4.
On the basis of the above-described embodiment, the test module 2 includes the switch switching unit 21, the upstream signal source unit 22, the master clock unit 23, and the slave clock unit 24.
The first port of the switch switching unit 21 is connected to the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2 and the fourth connection end SFPB3, and the second port of the switch switching unit 21 is used for being connected to the slave clock unit 24 when the test module 2 receives a forward test instruction; and is used for connecting with the uplink signal source unit 22 when the test module 2 receives the uplink decoding test instruction; the switch switching unit 21 is further configured to perform loop back connection on the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 when the test module 2 receives the throughput test instruction.
In the present embodiment, as shown in fig. 4, the test module 2 includes a switch switching unit 21, an upstream signal source unit 22, a master clock unit 23, and a slave clock unit 24. The first port of the switch switching unit 21 is connected to the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 of the data transmission port 4, and the switch switching unit 21 can connect the data transmission port 4 to different objects by changing the connection relationship of the second port. Specifically, the switch switching unit 21 is configured to connect the second port to the slave clock unit 24 when the test module 2 receives the forwarding test instruction; when the test module 2 receives the uplink decoding test instruction, the second port is connected with the uplink signal source unit 22; when the test module 2 receives the throughput test instruction, the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 are looped back. Illustratively, as shown in fig. 5, a plurality of switches are disposed inside the switch switching unit 21, and the switch switching unit 21 changes the connection relationship of the second port by switching the switches. For example, when the switch switching unit 21 receives the throughput test instruction, the first connection end SFPB0 and the second connection end SFPB1 may be connected, and the third connection end SFPB2 and the fourth connection end SFPB3 may be connected, so that when the baseband unit 3 receives the throughput test instruction, the test data sent by the first front optical transmission port SFPA0, the second front optical transmission port SFPA1, the third front optical transmission port SFPA2, and the fourth front optical transmission port SFPA3 of the baseband unit 3 can be returned to the baseband unit 3 again, so that the baseband unit 3 performs the throughput test by receiving the test data returned again.
The slave clock unit 24 is configured to perform a forward test between the baseband unit 3 and the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 when the test module 2 receives the forward test instruction.
The slave clock unit 24 in the test module 2 is configured to perform a forward test between the baseband unit 3 and the first connection terminal SFPB0, the second connection terminal SFPB1, the third connection terminal SFPB2, and the fourth connection terminal SFPB3 when the test module 2 receives the forward test instruction. Illustratively, the forwarding test is a forwarding 1588 test, a master clock unit is arranged in the baseband unit 3, when the baseband unit 3 and the test module 2 receive a forwarding test instruction, the switch switching unit 21 performs butt joint on the master clock unit of the baseband unit 3 and the slave clock unit 24 of the test module 2, so that the master clock unit of the baseband unit 3 and the slave clock unit 24 of the test module 2 perform the forwarding 1588 test in a manner of sending messages mutually, and after the forwarding 1588 test is completed, the master clock unit in the baseband unit 3 can output a forwarding test result.
The uplink signal source unit 22 is configured to perform an uplink decoding test between the baseband unit 3 and the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 when the test module 2 receives the uplink decoding test instruction.
In this embodiment, the uplink signal source unit 22 is configured to send an uplink signal to the baseband unit 3 through the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 when the test module 2 receives the uplink decoding test instruction, so that the baseband unit 3 performs an uplink decoding test according to the uplink signal sent by the uplink signal source, and outputs an uplink decoding test result after the uplink decoding test is completed.
The main clock unit 23 is connected to the fifth connection end SFPB4, and configured to perform a pass-back test between the baseband unit 3 and the fifth connection end SFPB4 when the test module 2 receives a pass-back test instruction.
The main clock unit 23 in the test module 2 is connected to the fifth connection end SFPB4, and the main clock unit 23 is configured to perform a return test between the baseband unit 3 and the return optical port SFPA4 on the fifth connection end SFPB4 and the baseband unit 3 when the test module 2 receives a return test instruction. Illustratively, the backhaul test is a backhaul 1588 test, a slave clock unit is disposed in the baseband unit 3, and when the baseband unit 3 and the test module 2 receive a backhaul test instruction, the switch switching unit 21 docks the slave clock unit of the baseband unit 3 and the master clock unit 23 of the test module 2, so that the slave clock unit of the baseband unit 3 and the master clock unit 23 of the test module 2 perform the backhaul 1588 test in a manner of sending messages to each other, and after the backhaul 1588 test is completed, the master clock unit 23 in the test module 2 can output a backhaul test result.
On the basis of the test module 2, an embodiment of the present application provides a baseband unit test method, including:
step 201, when a forward test instruction is received, controlling a second port of the switch switching unit to be connected with the slave clock unit, and performing forward test between the baseband unit and the slave clock unit through the first connection end, the second connection end, the third connection end and the fourth connection end.
Step 202, when the return test instruction is received, the master clock unit is used to perform the return test between the fifth connection end and the baseband unit.
And 203, when an uplink decoding test instruction is received, controlling a second port of the switch switching unit to be connected with the uplink signal source unit, and performing an uplink decoding test between the baseband unit and the uplink signal source unit through the first connection end, the second connection end, the third connection end and the fourth connection end.
And 204, when receiving the throughput test instruction, controlling the switch switching unit to perform loop connection on the first connection end, the second connection end, the third connection end and the fourth connection end, so that the baseband unit performs throughput test through the first front optical transmission port, the second front optical transmission port, the third front optical transmission port and the fourth front optical transmission port when receiving the throughput test instruction.
On the basis of the above embodiment, the test module 2 further includes a register, and an output end of the register is connected to a control end of the switch switching unit 21;
the test module 2 is configured to, when receiving a forward test instruction, control the register to output a first value, so that the second port of the switch switching unit 21 is connected to the slave clock unit 24; the control register is used for outputting a second value when receiving the uplink decoding test instruction, so that the second port of the switch switching unit 21 is connected with the uplink signal source unit 22; and the control register is configured to output a third value when receiving the throughput test instruction, so that the switch switching unit 21 performs loop connection on the first connection terminal SFPB0, the second connection terminal SFPB1, the third connection terminal SFPB2, and the fourth connection terminal SFPB 3.
In an embodiment, the testing module 2 further includes a register, an output end of the register is connected to a control end of the switch switching unit 21, and the testing module 2 can control the switch switching unit 21 through the register. Specifically, when the test module 2 receives a forward test instruction sent by the control module 1, the control register outputs a first value, and after the switch switching unit 21 receives the first value, the switch switching unit 21 connects the second port with the slave clock unit 24, so as to start forward test on the baseband unit 3. When the test module 2 receives the uplink decoding test instruction sent by the control module 1, the control register outputs a second numerical value, and after the switch switching unit 21 receives the second numerical value, the switch switching unit 21 connects the second port with the uplink signal source unit 22, so as to start performing an uplink decoding test on the baseband unit 3. When the test module 2 receives the throughput rate test instruction sent by the control module 1, the control register outputs a third numerical value, and after the switch switching unit 21 receives the third numerical value, the switch switching unit 21 performs loop connection on the first connection terminal SFPB0, the second connection terminal SFPB1, the third connection terminal SFPB2, and the fourth connection terminal SFPB3, so that the baseband unit 3 can start the throughput rate test.
On the basis of the test module, the embodiment of the present application further provides a method for controlling a switch switching unit, including:
step 301, when a forward test instruction is received, the control register outputs a first numerical value to connect the second port of the switch switching unit with the slave clock unit;
step 302, when receiving the uplink decoding test instruction, the control register outputs a second value to connect the second port of the switch switching unit with the uplink signal source unit;
step 303, when the throughput rate test instruction is received, the control register outputs a third numerical value, so that the switch switching unit performs loop connection on the first connection end, the second connection end SFPB1, the third connection end, and the fourth connection end.
On the basis of the above embodiment, the slave clock unit 24 is specifically configured to, when the test module 2 receives the forward test instruction, transmit the forward test packet between the baseband unit 3 and the first connection terminal SFPB0, the second connection terminal SFPB1, the third connection terminal SFPB2, and the fourth connection terminal SFPB3, perform forward test according to the forward test packet, generate a forward test result, and send the forward test result to the control module 1.
In this embodiment, after the baseband unit 3 and the test module 2 receive the forwarding test instruction sent by the control module 1, the second end of the switch switching unit 21 is connected to the slave clock unit 24, and the slave clock unit 24 on the test module 2 may perform forwarding test packet transmission with the master clock unit of the baseband unit 3 through the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3, and complete forwarding test according to the transmitted forwarding test packet. Illustratively, the control module 1 logs in the test apparatus through a debugging end of the test module 2 and sends a forward test instruction to the test module 2, and after the test module 2 receives the forward test instruction, the control register outputs a first value, for example, the first value is 1. At this time, the second port of the switch switching unit 21 is connected to the slave clock unit 24 on the test module 2, the slave clock unit 24 on the test module 2 is in butt joint with the master clock unit of the baseband unit 3, and then the slave clock unit 24 on the test module 2 and the master clock unit of the baseband unit 3 can perform the fronthaul 1588 test. When the fronthaul 1588 test is performed, the Master clock unit (Master) of the baseband unit 3 sends a "synchronization" (Sync) message to the Slave clock unit 24 (Slave) of the test module 2, and records the sending time T1 in the first register, and the Slave clock unit 24 (Slave) of the test module 2 receives the "synchronization" message and records the received time T2. A Master clock unit (Master) of the baseband unit 3 sends a "Follow" (Follow _ Up) message to a Slave clock unit 24 (Slave) of the test module 2, embeds the time T1 into the "Follow" message, and the Slave clock unit 24 of the test module 2 sends a "Delay request" (Delay _ Req) message to the Master clock unit of the baseband unit 3 and embeds the timestamp T3. The master clock unit of the baseband unit 3 receives the "Delay request" message and memorizes the time T4, and the master clock unit of the baseband unit 3 embeds the time T4 into a "Delay response" (Delay _ Resp) message and sends the message to the slave clock unit 24 of the test module 2. The slave clock unit 24 of the test module 2 can calculate the time Offset (Offset) between itself and the master clock unit of the baseband unit 3 according to T1, T2, T3 and T4, and send the time Offset (Offset) as the forward test result to the control module 1. The control module 1 determines whether the time Offset (Offset) is within 30ns, if so, the forwarding 1588 test passes, otherwise, the time Offset does not pass.
On the basis of the test module, an embodiment of the present invention further provides a method for performing a forward test on a baseband unit, including:
when a forward test instruction is received, the slave clock unit transmits a forward test message between the baseband unit and the slave clock unit through the first connecting end, the second connecting end, the third connecting end and the fourth connecting end, so that the slave clock unit performs forward test according to the forward test message and generates a forward test result, and then the forward test result is sent to the control module.
On the basis of the above embodiment, the master clock unit 23 is specifically configured to transmit the return test packet between the fifth connection terminal SFPB4 and the baseband unit 3 when the test module 2 receives the return test instruction, so that the baseband unit 3 performs the return test according to the return test packet and generates a return test result, and then sends the return test result to the control module 1.
In this embodiment, after the baseband unit 3 and the test module 2 receive the backhaul test instruction sent by the control module 1, the master clock unit 23 on the test module 2 transmits the backhaul test packet through the fifth connection end SFPB4 and the slave clock unit on the baseband unit 3, so that the baseband unit 3 performs backhaul test according to the backhaul test packet. Specifically, after the control module 1 sends the backhaul test instruction to the baseband unit 3 and the test module 2, the control module may log in the baseband unit 3 through a debugging end of the baseband unit 3, and control a slave clock unit of the baseband unit 3 to operate, and a backhaul 1588 test is performed between a master clock unit 23 on the test module 2 and the slave clock unit of the baseband unit 3. The procedure of the backhaul 1588 test is similar to the procedure of the fronthaul 1588 test described above, and is not described in detail in this embodiment. After the backhaul 158 test is completed, the slave clock unit of the baseband unit 3 outputs the time Offset (Offset) with the master clock unit 23 of the test module 2, and sends the time Offset (Offset) to the control module 1 as a backhaul test result, and the control module 1 determines whether the time Offset (Offset) is within 30ns, if so, the backhaul 1588 test is passed, otherwise, the backhaul 1588 test is not passed.
On the basis of the test module, an embodiment of the present invention further provides a method for performing a backhaul test on a baseband unit, including:
when the return test instruction is received, the main clock unit is used for transmitting the return test message between the fifth connecting end and the baseband unit, so that the baseband unit carries out return test according to the return test message and generates a return test result, and then the return test result is sent to the control module.
On the basis of the foregoing embodiment, the uplink signal source unit 22 is specifically configured to send an uplink signal to the baseband unit 3 through the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 when the test module 2 receives the uplink decoding test instruction, so that the baseband unit 3 performs an uplink decoding test according to the uplink signal and generates an uplink decoding test result, and then sends the uplink decoding test result to the control module 1.
In this embodiment, after the baseband unit 3 and the test module 2 receive the uplink decoding test instruction sent by the control module 1, the second end of the switch switching unit 21 is connected to the uplink signal source unit 22, and the uplink signal source unit 22 sends an uplink signal to the baseband unit 3 through the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3, so that the baseband unit 3 performs an uplink decoding test according to the received uplink signal. Illustratively, the control module 1 logs in the test apparatus through the debug end of the test module 2 and sends an uplink decoding test instruction to the test module 2, and after the test module 2 receives the uplink decoding test instruction, the control register outputs a second value, for example, the second value is 2. At this time, the second port of the switch switching unit 21 is connected to the uplink signal source unit 22 of the test module 2, and the uplink signal source unit 22 starts to transmit an uplink signal, for example, a 5G uplink signal, to the baseband unit 3. Meanwhile, the control module 1 logs in the baseband unit 3 through a debugging end of the baseband unit 3, the control baseband unit 3 starts to execute an uplink decoding program, the uplink decoding program decodes the 5G uplink signal to obtain the number of error packets, the number of error packets is sent to the control module 1 as an uplink decoding test result, the control module 1 judges whether the number of error packets is 0, if so, the uplink decoding test is passed, otherwise, the uplink decoding test is not passed.
On the basis of the test module, an embodiment of the present invention further provides a method for performing an uplink decoding test on a baseband unit, including:
when receiving the uplink decoding test instruction, the uplink signal source unit sends an uplink signal to the baseband unit through the first connecting end, the second connecting end, the third connecting end and the fourth connecting end, so that the baseband unit performs an uplink decoding test according to the uplink signal and generates an uplink decoding test result, and then sends the uplink decoding test result to the control module.
On the basis of the above embodiment, the switch switching unit 21 is specifically configured to, when receiving the throughput rate test instruction, short-circuit the first connection end SFPB0 and the second connection end SFPB1, and short-circuit the third connection end SFPB2 and the fourth connection end SFPB3, so that when receiving the throughput rate test instruction, the baseband unit 3 performs throughput rate test through the first front optical transmission port SFPA0, the second front optical transmission port SFPA1, the third front optical transmission port SFPA2, and the fourth front optical transmission port SFPA3, generates a throughput rate test result, and then sends the throughput rate test result to the control module 1.
In this embodiment, after the baseband unit 3 and the test module 2 receive the throughput test instruction sent by the control module 1, the switch switching unit 21 short-circuits the first connection end SFPB0 and the second connection end SFPB1, and short-circuits the third connection end SFPB2 and the fourth connection end SFPB3, so that when the baseband unit 3 receives the throughput test instruction, the throughput test is performed through the first front optical transmission port SFPA0, the second front optical transmission port SFPA1, the third front optical transmission port SFPA2, and the fourth front optical transmission port SFPA 3. Illustratively, the control module 1 logs in the test apparatus through the debugging end of the test module 2 and sends a forward test instruction to the test module 2, and after the test module 2 receives the forward test instruction, the control register outputs a third value, for example, the first value is 3. At this time, the switch switching unit 21 short-circuits the first connection terminal SFPB0 and the second connection terminal SFPB1, and short-circuits the third connection terminal SFPB2 and the fourth connection terminal SFPB 3. Meanwhile, the control module 1 logs in the baseband unit 3 through the debugging end of the baseband unit 3, and controls the baseband unit 3 to run the throughput test program. Then, the throughput testing program will send the ethernet packet through the first front optical transmission port SFPA0, the second front optical transmission port SFPA1, the third front optical transmission port SFPA2, and the fourth front optical transmission port SFPA3 according to the maximum capacity, and receive the ethernet packet sent back after looping. And then the throughput testing program outputs the throughput of the Ethernet packet which is checked to be error-free by the CRC, and the throughput is used as a throughput testing result and is sent to the control module 1. The control module 1 judges whether the throughput is greater than 9Gbps, if so, the throughput test is passed, otherwise, the throughput test is not passed. The reason why the throughput test is determined to pass or not to pass according to whether the throughput is greater than 9Gbps is that the throughput can reach 9Gps to meet the throughput test requirement because the maximum rate of an optical interface is 10Gbps and the maximum flow applied by a baseband unit only needs 7 Gbps.
On the basis of the test module, an embodiment of the present invention further provides a method for performing throughput rate test on a baseband unit, including:
when a throughput rate test is received, the control switch switching unit is used for short-circuiting the first connecting end and the second connecting end, and the third connecting end and the fourth connecting end, so that when the baseband unit receives a throughput rate test instruction, the throughput rate test is performed through the first front optical transmission port, the second front optical transmission port, the third front optical transmission port and the fourth front optical transmission port, a throughput rate test result is generated, and then the throughput rate test result is sent to the control module.
On the basis of the above embodiment, the control module 1 includes a control unit 11 and a switch unit 12; the first end of the control unit 11 is connected with the input end of the switch unit 12, the first output end of the switch unit 12 is connected with the debugging end of the baseband unit 3, and the second output end of the switch unit 12 is connected with the debugging end of the test module 2.
In one embodiment, as shown in fig. 6, the control module 1 includes a control unit 11 and a switch unit 12, where the control unit 11 may be a chip such as a processor or a microcontroller with a control function, or may also be a device such as a computer, a tablet, or a notebook. And switch unit 12 is a network device for electrical (optical) signal forwarding that provides an exclusive electrical signal path for any two network nodes accessing the switch. For example, in this embodiment, the input terminal of the switch unit 12 is connected to the first terminal of the control unit 11, the first output terminal of the switch unit 12 is connected to the debugging terminal of the baseband unit 3, and the second output terminal of the switch unit 12 is connected to the debugging terminal of the test module 2, so that the switch unit 12 can provide an exclusive electrical signal path for the control unit 11 and the baseband unit 3, and an exclusive electrical signal path for the control unit 11 and the test module 2, respectively.
The control unit 11 is configured to send a forward test instruction, a backward test instruction, an uplink decoding test instruction, or a throughput test instruction to the switch unit 12.
The switch unit 12 is configured to send the forward test instruction, the backward test instruction, and the uplink decoding test instruction throughput test instruction to the baseband unit 3 and the test module 2.
In this embodiment, the control unit 11 is configured to send a forward test instruction, a return test instruction, an uplink decoding test instruction, or a throughput test instruction to the switch unit 12, and after receiving the forward test instruction, the return test instruction, the uplink decoding test instruction, or the throughput test instruction, the switch unit 12 further sends the received instruction to the baseband unit 3 and the test module 2, so that the baseband unit 3 and the test module 2 can execute corresponding tests according to different instructions. In addition, the control unit 11 can also obtain the return test result, the uplink decoding test result and the throughput test result from the baseband unit 3 through the switch unit 12, and obtain the forward test result from the test module 2. In one embodiment, the control unit 11 is further connected to the display module, and the control unit 11 can send the return test result, the uplink decoding test result, the throughput rate test result, and the forward test result to the display module for displaying, so that the staff can check the results.
In the embodiment of the present invention, the switch switching unit, the uplink signal source unit, the master clock unit, and the slave clock unit are disposed in the test module, and when the test module receives a forward test instruction, the second port of the switch switching unit is controlled to be connected to the slave clock unit, and the forward test is performed between the baseband unit and the slave clock unit through the first connection end, the second connection end, the third connection end, and the fourth connection end. And when the test module receives the return test instruction, the return test is carried out by utilizing the main clock unit through the fifth connecting end and the baseband unit. When the test module receives an uplink decoding test instruction, the second port of the control switch switching unit is connected with the uplink signal source unit, and the uplink signal source unit is used for performing uplink decoding test between the baseband unit and the first connecting end, the second connecting end, the third connecting end and the fourth connecting end. When the test module receives the throughput test instruction, the first connection end, the second connection end, the third connection end and the fourth connection end are connected in a loop-back manner, so that the baseband unit performs throughput test through the first front optical transmission port, the second front optical transmission port, the third front optical transmission port and the fourth front optical transmission port when receiving the throughput test instruction. According to the embodiment of the invention, the connection relation of the data transmission ports is changed by using the switch switching unit, so that the test module can complete various tests with the baseband unit through the data transmission ports without building a plurality of test environments, the test steps are simplified, the test efficiency of the baseband unit is improved, the technical problem of low test efficiency when the core function of the baseband unit is tested in the prior art is solved, and the occupied resources and the used cost when different functions of the baseband unit are tested are reduced.
The present embodiment further provides a terminal device, as shown in fig. 7, a terminal device 40, where the terminal device includes a processor 400 and a memory 401;
the memory 401 is configured to store a computer program 402 and to transmit the computer program 402 to the processor;
the processor 400 is configured to execute the steps of one of the above embodiments of the baseband unit testing method according to the instructions in the computer program 402.
Illustratively, the computer program 402 may be partitioned into one or more modules/units, which are stored in the memory 401 and executed by the processor 400 to accomplish the present application. The one or more modules/units may be a series of computer program instruction segments capable of performing specific functions, which are used to describe the execution process of the computer program 402 in the terminal device 40.
The terminal device 40 may be a computing device such as a desktop computer, a notebook, a palm computer, and a cloud server. The terminal device 40 may include, but is not limited to, a processor 400, a memory 401. It will be understood by those skilled in the art that fig. 7 is only an example of the terminal device 40, and does not constitute a limitation to the terminal device 40, and may include more or less components than those shown, or some components may be combined, or different components, for example, the terminal device 40 may further include an input-output device, a network access device, a bus, etc.
The Processor 400 may be a Central Processing Unit (CPU), other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), an off-the-shelf Programmable Gate Array (FPGA) or other Programmable logic device, discrete Gate or transistor logic, discrete hardware components, etc. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
The storage 401 may be an internal storage unit of the terminal device 40, such as a hard disk or a memory of the terminal device 40. The memory 401 may also be an external storage device of the terminal device 40, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like, which are provided on the terminal device 40. Further, the memory 401 may also include both an internal storage unit and an external storage device of the terminal device 40. The memory 401 is used for storing the computer programs and other programs and data required by the terminal device 40. The memory 401 may also be used to temporarily store data that has been output or is to be output.
It is clear to those skilled in the art that, for convenience and brevity of description, the specific working processes of the above-described systems, apparatuses and units may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
In the several embodiments provided in the present application, it should be understood that the disclosed system, apparatus and method may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one logical division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit may be implemented in the form of hardware, or may also be implemented in the form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing computer programs, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
An embodiment of the present invention further provides a storage medium containing computer-executable instructions, where the computer-executable instructions are executed by a computer processor to perform a baseband unit testing method, and the method is applicable to a testing module in the baseband unit testing apparatus, and includes the following steps:
when a forward test instruction sent by a control module is received, forward test is carried out between a data transmission port and a baseband unit;
when a return test instruction sent by the control module is received, return test is carried out between the data transmission port and the baseband unit;
when an uplink decoding test instruction sent by a control module is received, an uplink decoding test is carried out between a data transmission port and a baseband unit;
and when receiving a throughput rate test instruction sent by the control module, performing loop connection on the data transmission port to enable the baseband unit to perform throughput rate test.
It should be noted that the foregoing is only a preferred embodiment of the present invention and the technical principles applied. Those skilled in the art will appreciate that the embodiments of the present invention are not limited to the specific embodiments described herein, and that various obvious changes, adaptations, and substitutions are possible, without departing from the scope of the embodiments of the present invention. Therefore, although the embodiments of the present invention have been described in more detail through the above embodiments, the embodiments of the present invention are not limited to the above embodiments, and many other equivalent embodiments may be included without departing from the concept of the embodiments of the present invention, and the scope of the embodiments of the present invention is determined by the scope of the appended claims.
Claims (12)
1. A baseband unit testing apparatus, comprising: the device comprises a control module and a test module, wherein a first end of the control module is used for being connected with a debugging end of a baseband unit, a second end of the control module is connected with the debugging end of the test module, and a data transmission port of the test module is used for being connected with an optical port of the baseband unit;
the control module is used for sending a forward test instruction, a backward test instruction, an uplink decoding test instruction or a throughput rate test instruction to the test module and the baseband unit; the forward transmission test instruction, the return transmission test instruction, the uplink decoding test instruction and the throughput rate test instruction are respectively used for instructing the baseband unit and the test module to carry out forward transmission test, return transmission test, uplink decoding test and throughput rate test;
the test module is used for carrying out the forward test between the data transmission port and the baseband unit when receiving the forward test instruction; the baseband unit is used for carrying out the backhaul test between the data transmission port and the baseband unit after receiving the backhaul test instruction; the device comprises a data transmission port, a baseband unit and a data transmission port, wherein the data transmission port is used for transmitting a data transmission command to the baseband unit; and the data transmission port is connected in a loop-back manner when the throughput rate test instruction is received, so that the baseband unit can perform the throughput rate test.
2. The baseband unit testing device according to claim 1, wherein the data transmission port of the testing module includes a first connection end, a second connection end, a third connection end, a fourth connection end, and a fifth connection end, the optical ports of the baseband unit include a first front transmission optical port, a second front transmission optical port, a third front transmission optical port, a fourth front transmission optical port, and a back transmission optical port, the first connection end is configured to be connected to the first front transmission optical port, the second connection end is configured to be connected to the second front transmission optical port, the third connection end is configured to be connected to the third front transmission optical port, the fourth connection end is configured to be connected to the fourth front transmission optical port, and the fifth connection end is configured to be connected to the back transmission optical port.
3. The baseband unit testing device according to claim 2, wherein the testing module comprises a switch switching unit, an uplink signal source unit, a master clock unit and a slave clock unit;
the first port of the switch switching unit is connected with the first connecting end, the second connecting end, the third connecting end and the fourth connecting end, and the second port of the switch switching unit is used for being connected with the slave clock unit when the test module receives the forward test instruction; and the test module is used for connecting with the uplink signal source unit when receiving the uplink decoding test instruction; the switch switching unit is further configured to perform loop connection on the first connection end, the second connection end, the third connection end, and the fourth connection end when the test module receives the throughput rate test instruction;
the slave clock unit is used for carrying out the forward test between the baseband unit and the test module through the first connecting end, the second connecting end, the third connecting end and the fourth connecting end when the test module receives the forward test instruction;
the uplink signal source unit is configured to perform the uplink decoding test between the baseband unit and the test module through the first connection end, the second connection end, the third connection end, and the fourth connection end when the test module receives the uplink decoding test instruction;
the master clock unit is connected with the fifth connecting end and is used for carrying out the return test between the fifth connecting end and the baseband unit when the test module receives the return test instruction.
4. The baseband unit testing device according to claim 3, wherein said testing module further comprises a register, an output terminal of said register is connected to a control terminal of said switch switching unit;
the test module is used for controlling the register to output a first numerical value when receiving the forward test instruction so as to connect the second port of the switch switching unit with the slave clock unit; the register is used for controlling the register to output a second numerical value when the uplink decoding test instruction is received, so that a second port of the switch switching unit is connected with the uplink signal source unit; and the controller is configured to control the register to output a third numerical value when the throughput test instruction is received, so that the switch switching unit performs loop connection on the first connection end, the second connection end, the third connection end, and the fourth connection end.
5. The baseband unit test device according to claim 3, wherein the slave clock unit is specifically configured to, when the test module receives the forward test instruction, transmit a forward test packet between the baseband unit and the first connection end, the second connection end, the third connection end, and the fourth connection end, perform the forward test according to the forward test packet, generate a forward test result, and send the forward test result to the control module.
6. The apparatus according to claim 3, wherein the master clock unit is specifically configured to transmit a backhaul test packet between the fifth connection terminal and the baseband unit when the test module receives the backhaul test command, so that the baseband unit performs the backhaul test according to the backhaul test packet and generates a backhaul test result, and then sends the backhaul test result to the control module.
7. The baseband unit testing device according to claim 3, wherein the uplink signal source unit is specifically configured to send an uplink signal to the baseband unit through the first connection end, the second connection end, the third connection end, and the fourth connection end when the testing module receives the uplink decoding test instruction, so that the baseband unit performs an uplink decoding test according to the uplink signal and generates the uplink decoding test result, and then sends the uplink decoding test result to the control module.
8. The device according to claim 3, wherein the switch switching unit is specifically configured to short-circuit the first connection end and the second connection end and short-circuit the third connection end and the fourth connection end when receiving the throughput test instruction, so that when receiving the throughput test instruction, the baseband unit performs throughput test through the first front optical transmission port, the second front optical transmission port, the third front optical transmission port, and the fourth front optical transmission port to generate a throughput test result, and then sends the throughput test result to the control module.
9. The baseband unit testing apparatus according to claim 1, wherein the control module comprises a control unit and a switch unit; the first end of the control unit is connected with the input end of the switch unit, the first output end of the switch unit is connected with the debugging end of the baseband unit, and the second output end of the switch unit is connected with the debugging end of the test module;
the control unit is used for sending the forward transmission test instruction, the backward transmission test instruction, the uplink decoding test instruction or the throughput rate test instruction to the switch unit;
the switch unit is configured to send the forward test instruction, the backward test instruction, the uplink decoding test instruction, or the throughput test instruction to the baseband unit and the test module.
10. A method for testing a baseband unit, the method being applied to a test module in a baseband unit testing apparatus according to any one of claims 1 to 9, comprising:
when a forward test instruction sent by a control module is received, forward test is carried out between a data transmission port and a baseband unit;
when a return test instruction sent by the control module is received, return test is carried out between the data transmission port and the baseband unit;
when an uplink decoding test instruction sent by the control module is received, performing an uplink decoding test between the data transmission port and the baseband unit;
and when receiving a throughput rate test instruction sent by the control module, performing loop connection on the data transmission port to enable the baseband unit to perform throughput rate test.
11. A terminal device, characterized in that the terminal device comprises a processor and a memory;
the memory is used for storing a computer program and transmitting the computer program to the processor;
the processor is adapted to perform a method of testing a baseband unit according to the instructions in the computer program as claimed in claim 10.
12. A storage medium storing computer-executable instructions for performing a baseband unit testing method according to claim 10 when executed by a computer processor.
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| CN114531639A (en) * | 2022-03-17 | 2022-05-24 | 杭州涂鸦信息技术有限公司 | Testing system and method of multi-channel audio module |
| CN114830711A (en) * | 2019-12-16 | 2022-07-29 | 西门子工业软件有限公司 | Apparatus for testing base station |
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| US20190342014A1 (en) * | 2016-07-01 | 2019-11-07 | Telefonaktiebolaget Lm Ericsson (Publ) | Over the air testing of a radio communications device |
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| CN113170323A (en) * | 2018-10-12 | 2021-07-23 | 西门子工业软件有限公司 | Device, system and method for testing radio equipment |
| CN114830711A (en) * | 2019-12-16 | 2022-07-29 | 西门子工业软件有限公司 | Apparatus for testing base station |
| US20220138083A1 (en) * | 2020-11-03 | 2022-05-05 | Robert Bosch Gmbh | Method for operating a control unit when testing software of the control unit, and method for operating a test computer when testing software of a control unit |
| CN114531639A (en) * | 2022-03-17 | 2022-05-24 | 杭州涂鸦信息技术有限公司 | Testing system and method of multi-channel audio module |
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