CN115426328B

CN115426328B - Shunt switch, and test device, system and method of switch

Info

Publication number: CN115426328B
Application number: CN202210907318.2A
Authority: CN
Inventors: 陶登高; 唐顺武
Original assignee: Yunjian Information Technology Co ltd
Current assignee: Yunjian Information Technology Co ltd
Priority date: 2022-07-29
Filing date: 2022-07-29
Publication date: 2023-08-22
Anticipated expiration: 2042-07-29
Also published as: CN115426328A

Abstract

The application relates to a shunt switch and a testing device, a system and a method of the switch, wherein the shunt switch comprises a first port, a second port and a third port; the second port and the third port are forwarding ports of the first port, and the third port is a forwarding port of the second port; the second port adopts a loop-back mode, and the transmission bandwidth of the third port is larger than that of the first port and the second port; the first port is an input port of the shunt switch and is used for receiving an externally input data packet; the third port is an output port of the shunt switch, and is used for sending the data packet to the outside. The application solves the problem that the service board can not provide corresponding large flow.

Description

Shunt switch, and test device, system and method of switch

Technical Field

The present application relates to the field of switch testing, and in particular, to a shunt switch, and a testing device, system, and method for a switch.

Background

As the density of network product ports increases, the traffic ports also gradually develop from 10GE to 25G, 40G, 100G, 200G, 400G, 800G. As research and development of internal software and hardware tests, a simple and feasible method is needed to verify the reliability, service compliance and the like of products, and as production tests, faulty single boards are needed to be screened out through a large-flow pressure test, so that the delivery quality of the single boards is ensured.

There are various methods of testing service singleboards in the prior art.

For example, one test method is: and using a special flow testing instrument to be in one-to-one butt joint with the external service ports of the tested service board, completing flow receiving and transmitting, and counting each port in butt joint of the tester to see whether the single board is normal or not. However, the testing method needs to occupy a large number of ports of the tester, double optical module resources and the like, and has complex networking and high cost.

Another test method is as follows: and the CPU of the service board is used for carrying out receiving and transmitting loop-back test on the service ports, and after the completion, the CPU compares the receiving and transmitting packets of each port to see whether the packet is lost or not. The test method is simple, but the pressure of the service board is insufficient, and the test requirement of the whole service pressure of the single board cannot be met.

In general, among the various methods for testing the service board, the transceiver loop-back test on the service port is simpler, but a larger data packet amount is required, and the service board itself cannot provide the corresponding data packet amount. While dedicated flow test instruments can provide a large amount of data packets, the corresponding instrument costs are also very high.

Aiming at the problems that in the related technology, a faulty single board needs to be screened out through a high-flow pressure test during the production test of the service board, and the service board cannot provide corresponding high flow, no effective solution is proposed at present.

Disclosure of Invention

In this embodiment, a testing device, a system and a method for a shunt switch are provided, so as to solve the problem that in the related art, when a service board is tested in production, a faulty veneer needs to be screened out through a high-flow pressure test, and the service board cannot provide a corresponding high flow.

In a first aspect, in this embodiment, there is provided a splitter switch, the splitter switch including a first port, a second port, and a third port;

the second port and the third port are forwarding ports of the first port, and the third port is a forwarding port of the second port;

the second port adopts a loop-back mode;

the first port is an input port of the shunt switch and is used for receiving an externally input data packet;

the third port is an output port of the shunt switch, and is used for sending the data packet to the outside.

In some of these embodiments, the number of the second port and the third port in the splitter switch are each a plurality;

the second ports and the third ports are all forwarding ports of the first port, and the third ports are all forwarding ports of each second port;

and a plurality of second ports adopt a loop-back mode.

In some embodiments, the splitter switch further includes a first sub-network card and a second sub-network card connected to each other, where the number of the first ports is one;

the data forwarding bandwidth of the second sub-network card is a preset multiple of the data forwarding bandwidth of the first sub-network card;

the first port and the second port are connected with the first sub-network card, and the third port is connected with the second sub-network card;

the total number of the first ports and the second ports is the same as the preset multiple.

In some embodiments, the first sub-network card is a 100G sub-network card, and the second sub-network card is a 400G sub-network card;

the first port and the second port are both 100G ports, and the third port is a 400G port;

the total number of the first ports and the second ports is four.

In a second aspect, in this embodiment, there is provided a test apparatus for a switch, the apparatus including: a tester and a shunt switch;

the shunt switch is provided in the first aspect;

the output port of the tester is connected with the input port of the shunt switch, and the output port of the shunt switch is the output port of the testing device.

In a third aspect, in this embodiment, there is provided a test system for a switch, the system including: a testing device and a switch to be tested;

the test device is the test device of the switch provided in the second aspect;

the switch to be tested comprises a fourth port and a fifth port, and the output port of the testing device is connected with the fourth port of the switch to be tested;

the fourth port and the fifth port in the switch to be tested are configured to form a forwarding loop, the fourth port is an input port and an output port of the forwarding loop, and the fifth port is a link port of the forwarding loop.

In some embodiments, the number of fourth ports is one, and the number of fifth ports is a plurality;

each fifth port adopts a loop-back mode, the latter fifth port is the forwarding port of the former fifth port, the first fifth port is the forwarding port of the fourth port, and the fourth port is the forwarding port of the last fifth port.

In some embodiments, the number of the switches to be tested is a plurality, and the number of the output ports of the testing device is a plurality;

and a plurality of output ports of the testing device are respectively connected with a plurality of fourth ports of the to-be-tested switch.

In a fourth aspect, in this embodiment, there is provided a method for testing a switch, where the method is applied to the test system of a switch provided in the third aspect, and the method includes:

connecting an output port of a testing device with a fourth port of a switch to be tested, and sending a data packet to the fourth port of the switch to be tested through the output port of the testing device;

detecting whether the number of data packets received by a fourth port of the switch to be tested is the same as the number of data packets sent;

if the number of the data packets is the same, judging that the tested switch is normal;

if the number of the data packets is different, judging that the tested switch is abnormal.

In some of these embodiments, the method further comprises:

configuring a second port and a third port of a shunt switch as forwarding ports of a first port, configuring the third port as a forwarding port of the second port, and configuring the second port as a loopback mode;

the first port is configured as an input port of the shunt switch and is connected with an output port of a tester, and the third port is configured as an output port of the shunt switch;

configuring a fourth port and a fifth port in the switch to be tested to form a forwarding loop; the fourth port is an input port and an output port of the forwarding loop, and the fifth port is a link port of the forwarding loop.

Compared with the related art, the shunting switch, the testing device, the testing system and the testing method of the shunting switch can copy and forward data through the shunting switch, so that the data transmission rate is larger than the data receiving rate. When the shunt switch is applied to the service board test scheme, the first port of the shunt switch can be connected with the output port of the tester, and then the third port is connected with the tested service board port. After receiving the low-rate data sent by the tester, the shunting switch sends high-rate data to the tested service board port through the copying and forwarding of the data, so that the high-flow pressure required by the service board port during testing is met. Therefore, the problem that the service board cannot provide corresponding large flow is solved.

The details of one or more embodiments of the application are set forth in the accompanying drawings and the description below to provide a more thorough understanding of the other features, objects, and advantages of the application.

Drawings

The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the application and do not constitute a limitation on the application. In the drawings:

fig. 1 is a schematic diagram of the structure of the shunt switch of the present embodiment.

Fig. 2 is a schematic diagram of a switch test networking in the preferred embodiment.

Detailed Description

The present application will be described and illustrated with reference to the accompanying drawings and examples for a clearer understanding of the objects, technical solutions and advantages of the present application.

Unless defined otherwise, technical or scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terms "a," "an," "the," "these" and similar terms in this application are not intended to be limiting in number, but may be singular or plural. The terms "comprising," "including," "having," and any variations thereof, as used herein, are intended to encompass non-exclusive inclusion; for example, a process, method, and system, article, or apparatus that comprises a list of steps or modules (units) is not limited to the list of steps or modules (units), but may include other steps or modules (units) not listed or inherent to such process, method, article, or apparatus. The terms "connected," "coupled," and the like in this disclosure are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. The term "plurality" as used herein means two or more. "and/or" describes an association relationship of an association object, meaning that there may be three relationships, e.g., "a and/or B" may mean: a exists alone, A and B exist together, and B exists alone. Typically, the character "/" indicates that the associated object is an "or" relationship. The terms "first," "second," "third," and the like, as referred to in this disclosure, merely distinguish similar objects and do not represent a particular ordering for objects.

In this embodiment, a shunt switch is provided, and fig. 1 is a schematic structural diagram of the shunt switch of this embodiment, as shown in fig. 1:

the splitter switch includes a first port 110, a second port 120, and a third port 130;

the second port 120 and the third port 130 are forwarding ports of the first port 110, and the third port 130 is a forwarding port of the second port 120;

the second port 120 adopts a loop back mode, and the transmission bandwidth of the third port 130 is greater than that of the first port 110 and the second port 120;

the first port 110 is an input port of the bypass switch, and is configured to receive an externally input data packet;

the third port 130 is an output port of the bypass switch for transmitting the data packet to the outside.

Specifically, the splitter switch includes at least a first port 110, a second port 120, and a third port 130. The second port 120 and the third port 130 are forwarding ports of the first port 110, that is, the first port 110 forwards data to the second port 120 and the third port 130 after receiving the data. The third port 130 is a forwarding port of the second port 120, that is, the second port 120 forwards the data to the third port 130 after receiving the data. The second port 120 adopts a loopback mode, wherein the loopback mode is that after the data stream flows out of the port, the data stream continues to flow in from the port; it should be noted that, the loopback mode may be implemented by configuring the shunt switch, or may be implemented by externally connecting a corresponding loopback module to a port, which is already a mature technology in the prior art. After the switch adopts the above configuration, the data received by the first port 110 can be amplified and sent out from the third port 130, so that the data sending rate of the third port 130 is higher, and the effect of amplifying the transmission rate of the data stream is achieved.

In the data splitting forwarding process, the first port 110 first receives a part of data, then the first port 110 copies the data, and then sends a part of data to the third port 130, and simultaneously sends a part of data to the second port 120, and the data is forwarded to the third port 130 by the second port 120 after flowing back in the second port 120. The third port 130 thus actually receives two copies of the data, and the transmission bandwidth of the third port 130 is greater than the first port 110 and the second port 120, so the third port 130 can forward the data at a higher transmission rate. Illustratively, assuming that the transmission bandwidths of the first port 110 and the second port 120 are 100G and the transmission bandwidth of the third port 130 is 200G, when the first port 110 receives data at a 100G rate and then forwards the data to the third port 130 and the second port 120 at a 100G rate, and the second port 120 forwards the data to the third port 130 also at a 100G rate, the third port 130 receives the duplicate data at a 200G rate and then transmits the data to the outside at a 200G rate.

As can be seen from the above examples, the distribution switch can replicate and forward data such that the data transmission rate is greater than the data reception rate. When the splitter switch is used in a service panel test scheme, the first port 110 of the splitter switch may be connected to the output port of the tester, and then the third port 130 may be connected to the service panel port under test. After receiving the low-rate data sent by the tester, the shunting switch sends high-rate data to the tested service board port through the copying and forwarding of the data, so that the high-flow pressure required by the service board port during testing is met. Therefore, the problem that the service board cannot provide corresponding large flow is solved.

In some of these embodiments, the number of second ports 120 and third ports 130 in the splitter switch are multiple;

the plurality of second ports 120 and the plurality of third ports 130 are forwarding ports of the first port 110, and the plurality of third ports 130 are forwarding ports of each second port 120;

the plurality of second ports 120 are each in a loopback mode.

Specifically, when the number of the second ports 120 and the third ports 130 is multiple, the second ports 120 and the third ports 130 are forwarding ports of the first port 110, that is, the first port 110 copies the data after receiving the data and forwards the data to each of the second ports 120 and the third ports 130, and each of the second ports 120 and the third ports 130 receives one copy of the data; the third ports 130 are forwarding ports of each second port 120, that is, each second port 120 copies the data after receiving the data, and forwards the data to each third port 130. For any one of the third ports 130, it will receive the data sent by the first port 110, and the data sent by each of the second ports 120.

The data received by each third port 130 is the same, so that the data can be sent with the same bandwidth, and thus, the plurality of third ports 130 can meet the testing requirements of a plurality of service boards to be tested. If there are three third ports 130, three service boards to be tested may be connected respectively, so that three service boards to be tested may be tested simultaneously.

And the number of second ports 120 determines the amplification of the data transfer rate. For example, when the number of the second ports 120 is one, the third port 130 additionally receives one piece of data, and thus can transmit data at twice the data transmission rate of the first port 110; when the number of the second ports 120 is two, the third port 130 receives two additional data, and thus can transmit data at three times the data transmission rate of the first port 110. It should be noted that, in consideration of limitation of port bandwidth to transmission rate, the set number of the second ports 120 should be determined by the bandwidth size relationship between the first ports 110 and the third ports 130.

Further, in some embodiments, the splitter switch further includes a first sub-network card and a second sub-network card that are connected to each other, where the number of first ports 110 is one;

the data forwarding bandwidth of the second sub network card is a preset multiple of the data forwarding bandwidth of the first sub network card;

the first port 110 and the second port 120 are connected with a first sub-network card, and the third port 130 is connected with a second sub-network card;

the total number of the first ports 110 and the second ports 120 is the same as a preset multiple.

Specifically, the first sub-network card and the second sub-network card are arranged in the shunt switch, and the first port 110 and the second port 120 are provided by the first sub-network card, so that the port bandwidth is the same as the data forwarding bandwidth of the first sub-network card; the third port 130 is provided by the second sub-network card, and thus has the same port bandwidth as the data forwarding bandwidth of the second sub-network card. And the total number of the first ports 110 and the second ports 120 is the same as a preset multiple. For example, when the bandwidth of the second sub-network card is four times that of the first sub-network card, three second ports 120 may be set at this time, so that the data forwarding rate of the third port 130 is four times that of the first port 110. Also, for example, when the bandwidth of the second sub-network card is eight times that of the second sub-network card, seven second ports 120 may be provided.

Illustratively, in one embodiment, the first sub-network card is a 100G sub-network card and the second sub-network card is a 400G sub-network card;

the first port 110 and the second port 120 are both 100G ports, and the third port 130 is a 400G port;

the total number of first ports 110 and second ports 120 is four.

Specifically, in this embodiment, a 100G sub-network card and a 400G sub-network card are used, so that the bandwidths of the first port 110 and the second port 120 are 100G, and the bandwidth of the third port 130 is 400G. Wherein the number of first ports 110 is one and the number of second ports 120 is three. In a specific service board test scenario, data sent by a low rate tester at a 100G rate may be received through the first port 110 and then sent to the service board port under test at a 400G rate through the third port 130.

In this embodiment, there is also provided a testing apparatus for a switch, including: a tester and a shunt switch;

the shunt switch is any one of the shunt switches provided in the embodiment;

Specifically, the test device of the switch in this embodiment is composed of a tester and the shunt switch in this embodiment. The shunt switch can copy and amplify the low-rate data sent by the tester and then forward the high-rate data. Therefore, when the switch to be tested (the built-in service board) is tested, high-speed data can be sent to the switch to be tested, so that the high-flow pressure required by the test is met. Therefore, the problem that the service board cannot provide corresponding large flow is solved.

Compared with the prior art that the high-speed tester is directly adopted, the use cost of the professional high-speed tester is very high; in this embodiment, a combination of the low-rate tester and the shunt switch is adopted, and the sending rate of the tester is amplified by the shunt switch, so that the use cost of the low-rate tester and the shunt switch is far lower than that of the high-rate tester. Therefore, the present embodiment has the technical effect of reducing the use cost.

In this embodiment, there is also provided a test system for a switch, the system including: a testing device and a switch to be tested;

the test device is a test device of the switch provided in the embodiment;

Specifically, the test system of the switch in the embodiment includes a test device and a switch to be tested, where the test device is the test device of the switch provided in the above embodiment, and the specific working principle can refer to the above embodiment. For the switch to be tested, the ports of the switch need to be configured into a forwarding loop, that is, the data stream starts to flow through the initial port, and then flows back to the initial port after passing through all ports. In this embodiment, the fourth port is the initial port of the forwarding loop, i.e. the input/output port. The fifth port is another port in the forwarding loop except the fourth port, that is, the link port through which the data stream passes.

When the test system of the switch works, firstly, the test device sends a data stream to the fourth port in the switch to be tested, the data stream flows in the forwarding loop and finally flows out of the fourth port, and the data stream passes through all fifth ports. Therefore, whether the port has a fault can be judged by judging whether the number of the data packets flowing in and the number of the data packets flowing out of the fourth port are the same. Because when a port fails, a packet loss condition must occur, so that the data packets flowing out of the fourth port are less than the data packets flowing in.

It should be noted that, in a switch to be tested, there may be one forwarding loop, or there may be multiple forwarding loops, that is, there may be multiple fourth ports and multiple sets of fifth ports, where each fourth port and a corresponding set of fifth ports form one forwarding loop. In this case, the test device is required to provide multiple sets of data streams.

Thus, in one embodiment, the number of fourth ports is one and the number of fifth ports is a plurality;

each fifth port adopts a loop-back mode, the next fifth port is a forwarding port of the previous fifth port, the first fifth port is a forwarding port of the fourth port, and the fourth port is a forwarding port of the last fifth port.

Specifically, the switch to be tested in this embodiment has only one fourth port, which forms a forwarding loop with the other fifth ports, so that the switch to be tested only needs the testing device to provide a group of data streams, and only occupies one output port of the testing device. In further detail, in the process of constructing the forwarding loop, the plurality of fifth ports are first set to be in a loopback mode, that is, the data flow flows out from one of the fifth ports or flows in from the same fifth port. And then the plurality of fifth ports are ordered according to any sequence, the next fifth port is configured as a forwarding port of the previous fifth port, the fourth port is used as an input/output port of a forwarding loop, namely, the first fifth port is a forwarding port of the fourth port, and the fourth forwarding port is a forwarding port of the last fifth port, so that the fourth port and the plurality of fifth ports form a forwarding loop.

Further, in one embodiment, the number of switches to be tested is plural, and the number of output ports of the testing device is plural;

the plurality of output ports of the testing device are respectively connected with the fourth ports of the switches to be tested.

Specifically, in this embodiment, the number of switches to be tested is multiple, and each switch to be tested occupies one output port of the testing device, so that multiple output ports in the testing device can be simultaneously connected with multiple switches to be tested, so that multiple switches to be tested can be tested. It should be further noted that the testing device is composed of a shunt switch and a tester, the output port of the testing device is provided by the shunt switch, and the shunt switch having a plurality of output ports occupies only one output port of the tester. Therefore, in the test system of the switch, a plurality of switches to be tested can be tested at the same time by only using one output port of the tester, and the use cost of the professional tester is further reduced.

The embodiment also provides a testing method of the switch, which is applied to the testing system of the switch provided in the embodiment, and comprises the following steps:

connecting an output port of the testing device with a fourth port of the switch to be tested, and sending a data packet to the fourth port of the switch to be tested through the output port of the testing device;

Specifically, the method for testing the switch is implemented on a testing system of the switch in the implementation, firstly, an output port of a testing device is connected with a fourth port of the switch to be tested, and then a high-rate data stream is sent. The data stream flows one turn in a forwarding loop in the switch to be tested and then flows out from the fourth port. Then detecting whether the number of data packets received by a fourth port of the switch to be tested is the same as the number of data packets transmitted, if the number of data packets received by the fourth port is the same, the condition that no packet is lost is indicated, so that all ports in a forwarding loop work normally, and a corresponding service board is also normal, thereby judging that the switch to be tested is normal; if the received and transmitted data packets are different, the packet loss condition exists, so that the ports do not work normally, and the corresponding service boards also have problems, so that the switch to be tested is judged to be abnormal.

In some of these embodiments, the method further comprises:

configuring a second port and a third port of the shunt switch as forwarding ports of the first port, configuring the third port as forwarding ports of the second port, and configuring the second port as a loopback mode;

the first port is configured as an input port of the shunt switch and is connected with an output port of the tester, and the third port is configured as an output port of the shunt switch;

Specifically, before the switch to be tested is tested, the shunt switch and the switch to be tested are required to be configured correspondingly.

The configuration method for the shunt switch comprises the following steps: configuring a second port and a third port of the shunt switch as forwarding ports of the first port, configuring the third port as forwarding ports of the second port, and configuring the second port as a loopback mode; and configuring the first port as an input port of the shunt switch and connected with an output port of the tester, and configuring the third port as an output port of the shunt switch. The output port of the shunt switch is the output port of the testing device, and is connected with the fourth port of the switch to be tested.

The configuration method of the switch to be tested comprises the following steps: configuring a fourth port and a fifth port in the switch to be tested to form a forwarding loop; the fourth port is an input port and an output port of the forwarding loop, and the fifth port is a link port of the forwarding loop.

The technical scheme of the application is described below through a specific preferred embodiment.

The preferred embodiment provides a preferred method for testing the switch, which is a method for testing the service performance of the whole single board of the high-density high-speed switch through simple networking.

Fig. 2 is a schematic diagram of a switch test networking in the preferred embodiment. Referring to fig. 2, the networking configuration for the switch test is as follows:

tester 200: A100G (QSFP 28 type) port is provided, and various data messages can be constructed to meet the test requirement of UUT (device under test).

The shunt switch 100: 100G ports (100G daughter card 140 is shown providing 16 100G QSFP28 ports) and 400G ports (400G daughter card 150 is shown providing 4 400G ports) are provided for port traffic replication and offloading to the device under test.

UUT1-4: the devices under test 1 through 4 all use self-loop modules except for 31 interfaces with the tap changer 100.

Port1 on 100G daughter card 140 of splitter switch 100 interfaces with Port1 (100G) of tester 200 via optical modules and optical fibers.

Port1 on 400G sub-card 150 of the tap changer 100 is cabled to Port31 of device under test 1, port2 on 400G sub-card 150 is cabled to Port31 of device under test 2, port3 on 400G sub-card 150 is cabled to Port31 of device under test 3, and Port4 on 400G sub-card 150 is cabled to Port31 of device under test 4.

And finally judging whether the equipment is normal or not by judging whether the number of the Port31 transceiving packets of the equipment to be tested is the same or not.

Before testing, the split switch 100 and the tested single board need to be configured in sequence, and after configuration, the flow test can be performed.

The shunt switch 100 is configured as follows:

1. configuring three ports of Port2/3/4 of the 100G sub-card 140 of the shunt switch 100 into a loopback mode;

2. the forwarding entries of the bypass switch 100 are configured such that the traffic of Port1 of the 100G sub-card 140 is forwarded to Port2/3/4 ports of the 100G sub-card 140

3. Configuring a forwarding table entry of the bypass switch 100 so that the traffic of Port1 of the 100G sub-card 140 is forwarded to Port1/2/3/4 ports of the 400G sub-card 150;

4. the forwarding entries of the bypass switch 100 are configured such that traffic at Port2/3/4 of the 100G daughter card 140 is forwarded to Port1/2/3/4 of the 400G daughter card 150.

By configuring the bypass switch 100, 100G traffic of Port1 of the tester 200 can output exactly the same 400G traffic to Port1/2/3/4 of the 400G daughter card 150 through the bypass switch 100.

And configuring the tested single board (UUT 1/2/3/4) so that the flow entering the tested single board can travel according to the specified path. Device under test traffic path specification: port31 goes into- > Port1 (self-loop) - > Port2 (self-loop) - > Port3 (self-loop) - > Port4 (self-loop) - > … - > Port30 (self-loop) - > Port32 (self-loop) - > Port31 out.

After the tester 200, the shunt switch 100 and the tested equipment end are configured, the packet receiving and sending test and result comparison can be performed.

The test method of the preferred switch in the preferred embodiment has the following advantages compared with the prior art:

1. the method for networking the flow test is simple and reliable.

2. The cost of environmental materials is saved, only one port of precious tester resources is occupied for one tested single board, a large amount of tester resources and testing environment resources are not occupied, and the utilization rate of the tester is effectively improved.

3. The shunting switch is used for testing high-speed port equipment by using a low-speed tester, and meanwhile, a plurality of tested devices can be tested in parallel.

4. By means of a simple networking mode, the full-load pressure test requirements forwarded by all service ports of the whole tested device can be met by configuring the flow trend of the tested device.

5. The method can be used for the production test requirement of the tested equipment, and service single boards with poor performance can be effectively screened.

It should be understood that the specific embodiments described herein are merely illustrative of this application and are not intended to be limiting. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure in accordance with the embodiments provided herein.

It is to be understood that the drawings are merely illustrative of some embodiments of the present application and that it is possible for those skilled in the art to adapt the present application to other similar situations without the need for inventive work. In addition, it should be appreciated that while the development effort might be complex and lengthy, it will nevertheless be a routine undertaking of design, fabrication, or manufacture for those of ordinary skill having the benefit of this disclosure, and further having the benefit of this disclosure.

The term "embodiment" in this disclosure means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the application. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive. It will be clear or implicitly understood by those of ordinary skill in the art that the embodiments described in the present application can be combined with other embodiments without conflict.

The above examples merely represent a few embodiments of the present application, which are described in more detail and are not to be construed as limiting the scope of the patent claims. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of the application should be assessed as that of the appended claims.

Claims

1. A test system for a switch, the system comprising: a testing device and a switch to be tested; the test device comprises: a tester and a shunt switch;

the shunt switch comprises a first port, a second port and a third port; the second port and the third port are forwarding ports of the first port, and the third port is a forwarding port of the second port; the second port adopts a loop-back mode, and the transmission bandwidth of the third port is larger than that of the first port and the second port; the first port is an input port of the shunt switch and is used for receiving an externally input data packet; the third port is an output port of the shunt switch and is used for sending a data packet to the outside;

the data is transmitted to the third port by the second port after the data is circulated in the second port;

the output port of the tester is connected with the input port of the shunt switch, and the output port of the shunt switch is the output port of the testing device;

the switch to be tested comprises a fourth port and a fifth port, and the output port of the testing device is connected with the fourth port of the switch to be tested; the fourth port and the fifth port in the switch to be tested are configured to form a forwarding loop, the fourth port is an input port and an output port of the forwarding loop, and the fifth port is a link port of the forwarding loop.

2. The system according to claim 1, wherein the number of the fourth ports is one, and the number of the fifth ports is a plurality;

3. The system according to claim 2, wherein the number of switches to be tested is plural, and the number of output ports of the testing device is plural;

4. The system for testing a switch according to claim 1, wherein the number of the second port and the third port in the split switch are each plural;

and a plurality of second ports adopt a loop-back mode.

5. The system for testing a switch according to claim 1, wherein the splitter switch further comprises a first sub-network card and a second sub-network card connected to each other, the number of the first ports being one;

6. The system according to claim 5, wherein the first sub-network card is a 100G sub-network card and the second sub-network card is a 400G sub-network card;

the total number of the first ports and the second ports is four.

7. A method for testing a switch, the method being applied to the test system of the switch of any one of claims 1 to 6, the method comprising:

8. The method of testing a switch of claim 7, further comprising: