CN115361609B - Electronic device testing circuit and microphone array module - Google Patents
Electronic device testing circuit and microphone array module Download PDFInfo
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- CN115361609B CN115361609B CN202211046006.3A CN202211046006A CN115361609B CN 115361609 B CN115361609 B CN 115361609B CN 202211046006 A CN202211046006 A CN 202211046006A CN 115361609 B CN115361609 B CN 115361609B
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- 238000012360 testing method Methods 0.000 title claims abstract description 101
- 230000002159 abnormal effect Effects 0.000 claims abstract description 19
- 239000003990 capacitor Substances 0.000 claims description 7
- 238000000034 method Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 3
- 230000005856 abnormality Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000013473 artificial intelligence Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000013550 semantic technology Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R1/00—Details of transducers, loudspeakers or microphones
- H04R1/08—Mouthpieces; Microphones; Attachments therefor
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R29/00—Monitoring arrangements; Testing arrangements
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R3/00—Circuits for transducers, loudspeakers or microphones
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R2420/00—Details of connection covered by H04R, not provided for in its groups
- H04R2420/05—Detection of connection of loudspeakers or headphones to amplifiers
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Acoustics & Sound (AREA)
- Signal Processing (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Otolaryngology (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention provides an electronic device testing circuit and a microphone array module, wherein the testing circuit is arranged at a power end of an electronic device to be detected; when the electronic device is in a lost state, the power supply end is set low, and the output signal of the test circuit is closed and in an abnormal working mode; when the electronic device is in a normal state, the power supply end supplies power normally, and the output signal of the test circuit is normal and in a normal working mode; based on the operating mode of the test circuit, a test result of the electronic device is determined. By utilizing the invention, the electronic devices such as the microphone array and the like can be rapidly and effectively tested, and abnormal situations such as missing and losing of the devices are avoided.
Description
Technical Field
The present invention relates to the field of electronic product testing, and more particularly, to an electronic device testing circuit and a microphone array module.
Background
Along with the rapid development of artificial intelligence, the influence of voice technology on life of people is also increasing, but in the practical application of semantic technology, the single microphone algorithm technology can not meet the high quality experience requirement of users due to the influence of noise, echo, even reverberation and other factors existing in the environment.
At present, in order to effectively acquire a voice signal and improve the experience effect of a user, a microphone array, such as a four-microphone linear array or a ring array, is generally adopted as a pickup module, and noise signals are effectively restrained through the microphone array, reverberation and echo are eliminated, so that back-end processing is simpler and easier.
However, in actual production testing, since there are multiple microphones in the array, if there is a loss or damage to one microphone, the test results usually obtained are normal. In other words, in the existing circuit design of the microphone array, when the microphone is missing, the abnormality of the individual microphone cannot be checked by the conventional testing means, so that the overall effect of the product is affected.
Disclosure of Invention
In view of the foregoing, it is an object of the present invention to provide an electronic device testing circuit and a microphone array module for effectively testing each microphone unit in the electronic device and the microphone array module.
The electronic device testing circuit provided by the invention is arranged at the power end of an electronic device to be detected; when the electronic device is in a lost state, the power supply end is set low, and the output signal of the test circuit is closed and in an abnormal working mode; when the electronic device is in a normal state, the power supply end is normal, and the output signal of the test circuit is normal and in a normal working mode; and determining a test result of the electronic device based on the working mode of the test circuit.
Furthermore, an alternative solution is to include: the amplifier comprises an amplifier, an adjustable resistor arranged at the input end of the amplifier and a triode arranged at the output end of the amplifier; the adjustable resistor is arranged between the power end and the grounding end in parallel; the positive input end of the amplifier is connected with one end of the adjustable resistor through a first resistor, the reverse input end of the amplifier is connected with the output end of the amplifier, and the positive input end of the amplifier is connected with the other end of the adjustable resistor through a second resistor; the three ends of the triode are respectively connected with the output end, the power end and the grounding end; and determining the lost or normal state of the electronic device according to the state of the power supply terminal.
In addition, the alternative technical scheme is that the triode is a PNP triode and comprises a base electrode, a collector electrode and an emitter electrode; the base is connected with the output end, the collector is connected with the grounding end through a third resistor, and the emitter is connected with the power end.
In addition, the optional technical scheme is that when the electronic device at the power supply end is lost, no current flows in the adjustable resistor, the output end of the amplifier is 0, the PNP triode is conducted, the power supply end is set low, and the test result is NG; otherwise, when the electronic device at the power supply end exists, the voltage at the output end is equal to the voltage at the two ends of the adjustable resistor, the output end is in a high level, the PNP triode is disconnected, the power supply end supplies power normally, and the test result is qualified.
In addition, the optional technical scheme also comprises a filter circuit; the filter circuit is disposed between the VDD terminal and the GND terminal of the electronic device.
Furthermore, an alternative solution is that the filter circuit comprises at least one filter capacitor arranged in parallel between the VDD terminal and the GND terminal.
Furthermore, an alternative solution is to connect a fourth resistor between the inverting input and the output of the amplifier.
In addition, the optional technical scheme is that the non-inverting input end of the amplifier is connected with the grounding end through a fifth resistor; the first resistor and the fifth resistor are arranged in parallel.
In addition, the selectable technical scheme is that the first resistor, the second resistor, the third resistor, the fourth resistor and the fifth resistor are resistors or impedances with adjustable resistance values.
According to another aspect of the present invention, there is provided a microphone array module including at least two microphones; the power supply end of each microphone is respectively provided with a corresponding test circuit, and the test circuits are as described above; and determining the test result of each microphone in the microphone array module based on the working mode of each test circuit.
By means of the electronic device testing circuit and the microphone array module, whether the current electronic device is missing or damaged can be determined through the working mode of the testing circuit by arranging the testing circuit at the power end of the electronic device, and then effective testing of all devices in the electronic device distributed in an array is achieved.
To the accomplishment of the foregoing and related ends, one or more aspects of the invention comprise the features hereinafter fully described. The following description and the annexed drawings set forth in detail certain illustrative aspects of the invention. These aspects are indicative, however, of but a few of the various ways in which the principles of the invention may be employed. Furthermore, the invention is intended to include all such aspects and their equivalents.
Drawings
Other objects and attainments together with a more complete understanding of the invention will become apparent and appreciated by referring to the following description taken in conjunction with the accompanying drawings. In the drawings:
FIG. 1 is a schematic diagram of an electronic device testing circuit according to an embodiment of the invention;
fig. 2 is a schematic structural diagram of a microphone array according to an embodiment of the invention.
The same reference numerals will be used throughout the drawings to refer to similar or corresponding features or functions.
Detailed Description
In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of one or more embodiments. It may be evident, however, that such embodiment(s) may be practiced without these specific details. In other instances, well-known structures and devices are shown in block diagram form in order to facilitate describing one or more embodiments.
In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings are merely for convenience in describing the present invention and simplifying the description, and do not indicate or imply that the device or element being referred to must have a specific orientation, be configured and operated in a specific orientation, and therefore should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In order to solve the problems that the existing microphone array cannot realize the test of an abnormal microphone when the microphone is abnormal, and the like, the invention provides the electronic device test circuit and the microphone array module, which can change the state of a power supply end based on the current mode of the electronic device through an amplifier in the test circuit, an adjustable resistor arranged at the input end of the amplifier and a triode arranged at the output end of the amplifier, so that the detection result of the electronic device can be determined according to the state of the power supply end.
For a detailed description of the electronic device testing circuit and the microphone array module of the present invention, specific embodiments of the present invention will be described in detail with reference to the accompanying drawings.
Fig. 1 shows a schematic structure of an electronic device testing circuit according to the present invention.
As shown in fig. 1, the electronic device testing circuit of the embodiment of the invention is arranged at the power supply end of the corresponding electronic device, when the electronic device is in a lost state, namely, when the electronic device is in abnormal conditions such as neglected loading or non-conduction, the corresponding power supply end is set low, at the moment, the output signal of the testing circuit is closed, and the testing circuit and the power supply end are in an abnormal working mode; when the electronic device is in a normal state, the power supply end supplies power normally, the output signal of the test circuit is normal, and the test circuit and the power supply end are in a normal working mode; further, the test result of the electronic device can be determined based on the operation mode of the test circuit or the state of the power source terminal, and the problem that the loss detection cannot be performed by the entire output signal when individual devices are not packaged in the electronic device array can be solved.
As a specific example, the above-described test circuit may include: the amplifier comprises an amplifier, an adjustable resistor arranged at the input end of the amplifier and a triode arranged at the output end of the amplifier; the adjustable resistor is arranged between the power end and the grounding end in parallel, the positive input end of the amplifier is connected with one end of the adjustable resistor through a first resistor, the reverse input end of the amplifier is connected with the output end, and the positive input end of the amplifier is connected with the other end of the adjustable resistor through a second resistor; the three ends of the triode are respectively connected with the output end, the power end and the grounding end; and determining the test result of the electronic device according to the state (low or normal) of the power supply terminal.
Wherein, the triode can adopt PNP triode, including base b, collector c, emitter e; the base is connected with the output end, the collector is connected with the ground end through the third resistor, the emitter is connected with the power end, and the conducting condition of the PNP triode is as follows: the emitter is at a high potential and the base is at a low potential.
As can be seen, when the electronic device at the power supply end is lost or abnormal, no current flows through the adjustable resistor, at this time, the output end of the amplifier is 0, the PNP triode is turned on, and the power supply end connected with the emitter is set low due to the conduction of the PNP triode and is in an abnormal working mode, and at this time, the test result of the electronic device is NG; otherwise, when the electronic device at the power supply end exists and is normal, the voltage at the output end of the amplifier is equal to the voltage at the two ends of the adjustable resistor, the output end is at a high level, the PNP triode is disconnected, the power supply end is in a normal working state, and the electronic device corresponding to the power supply end is normal, so that the corresponding test result is qualified.
In the array structure of the electronic devices, in order to implement the abnormal test for each electronic device in the array, the electronic device test circuits are respectively provided at the power supply terminals of the electronic devices, and the test conditions of the array of the electronic devices are determined according to the test results of the test circuits.
In a specific embodiment of the present invention, a filter circuit may be further disposed between the electronic device and the power supply terminal, that is, between the VDD terminal and the GND terminal of the electronic device, where the filter circuit may include at least one filter capacitor disposed in parallel between the VDD terminal and the GND terminal, and may be specifically flexibly disposed according to actual circuit requirements.
In addition, in the electronic device testing circuit of the present invention, a fourth resistor is further connected between the inverting input terminal and the output terminal, and a fifth resistor is disposed between the non-inverting input terminal and the ground terminal of the amplifier, that is, the non-inverting input terminal of the amplifier is connected to the ground terminal through the fifth resistor, wherein the first resistor and the fifth resistor are disposed in parallel.
It should be noted that, in order to ensure the application range and reliability of the circuit, each circuit component can flexibly adjust the resistance based on the parameters of the microphone, and the first resistor, the second resistor, the third resistor, the fourth resistor and the fifth resistor can be all set as resistors or impedances with adjustable resistance values.
As a specific example, in the specific circuit structure shown in fig. 1, a capacitor C1 and a capacitor C2 connected in parallel are provided between the VDD terminal and the GNG terminal of the electronic device M1, and both ends of the adjustable resistor R1 are respectively connected to the capacitor C1 and the power supply terminal 3v3_bd, while the adjustable resistor R1 is also connected to the non-inverting input terminal 3 of the amplifier through a first resistor R9, and connected to the inverting input terminal 2 of the amplifier through a second resistor R8; meanwhile, the inverting input terminal 2 of the amplifier is connected to the output terminal 6 of the amplifier through a fourth resistor R10, and the first resistor R9 is grounded through a fifth resistor R11.
The terminals 4 and 7 of the amplifier are respectively connected with the power supply terminal 3v3_bd and the ground terminal, the base electrode of the PNP triode is connected with the output terminal 6, the emitter electrode is connected with the power supply terminal 3v3_bd, and the collector electrode is connected with the ground terminal through the third resistor R12.
It can be known that, if M1 is lost, neglected or abnormal, no current flows through the adjustable resistor R1, and the voltage value of the output terminal of the amplifier is 0, the transistor Q2 is turned on, the power terminal of the transistor emitter is pulled down, the whole test circuit is in an abnormal working mode, and the test result is NG. Otherwise, if M1 works normally, the voltage of the output end of the amplifier is equal to the voltage value of the two ends of the adjustable resistor R1, the output end of the amplifier is high voltage by setting the resistance value of the adjustable resistor, the triode Q2 is in an off mode, the power supply end works normally, and the test result is qualified.
It should be noted that, the resistance values of the resistors and the capacitance values of the capacitors in the circuit shown in fig. 1 are all examples, and the invention is not limited to the specific parameters shown, and can be flexibly adjusted according to the parameters of the microphone and the requirements of the circuit.
Corresponding to the electronic device testing circuit, the invention also provides a microphone array module.
Specifically, the microphone array module in the embodiment of the invention comprises at least two microphones, wherein corresponding test circuits are respectively arranged at the power supply ends of the microphones, the loss or normal state of the microphones in the microphone array module can be determined based on the working modes of the test circuits, the working modes of the test circuits comprise a normal working mode and an abnormal working mode, when all the test circuits are in the normal working mode, the microphones in the microphone array module are normal, and otherwise, when the test circuits are in the abnormal working mode, the microphones corresponding to the test circuits are abnormal.
When the electronic device testing circuit is used for testing the microphone array module, the method can comprise the following steps:
1. The power supply ends of all microphones in the microphone array to be tested are respectively provided with the electronic device testing circuit;
2. Test results corresponding to the test circuits are collected, and whether each microphone in the microphone array module is abnormal or not and the position of the abnormal microphone are determined based on the test results.
In addition, in order to be convenient for test to the microphone matrix, can carry out audible and visual alarm and remind through alarm module to unusual microphone and position when there is unusual microphone in the microphone array.
As an example, fig. 2 shows a schematic structure of a microphone array module according to an embodiment of the present invention.
Specifically, as shown in fig. 2, the microphone array includes a microphone M1, a microphone M2, a microphone M3, and a microphone M4, in the conventional test manner, if the microphone M1 is lost, only the microphone M2 is left to write DATA, and at the signal falling edge, the microphone M2 places its DATA port in a high impedance state, and the microphone M1 also outputs no DATA signal because of the loss, so that new DATA cannot be acquired at the signal falling edge, and finally, in the case that the microphone M1 is lost, a DATA signal can still be acquired, resulting in a qualified test result.
However, if the electronic device testing circuit is provided at the power supply end of each microphone, an independent test can be performed for each microphone in the microphone matrix, so that the test result is NG and the test accuracy is higher under the condition that the microphone is lost or abnormal.
According to the electronic device testing circuit and the microphone array module provided by the invention, the testing circuit can be used for effectively testing the abnormality of each electronic device in the electronic device array such as a microphone and the like, and the circuit has the advantages of simple structure, wide applicable range and high testing accuracy.
The electronic device testing circuit and the microphone array module according to the present invention are described above by way of example with reference to fig. 1 and 2. It will be appreciated by those skilled in the art that various modifications may be made to the electronic device testing circuit and microphone array module set forth above without departing from the teachings of the present invention. Accordingly, the scope of the invention should be determined from the following claims.
Claims (9)
1. An electronic device testing circuit is characterized by being arranged at a power end of an electronic device to be tested; wherein,
When the electronic device is in a lost state, the power supply end is set low, and the output signal of the test circuit is closed and in an abnormal working mode;
when the electronic device is in a normal state, the power supply end supplies power normally, and the output signal of the test circuit is normal and in a normal working mode;
Determining a test result of the electronic device based on the working mode of the test circuit;
the electronic device testing circuit includes: the amplifier comprises an amplifier, an adjustable resistor arranged at the input end of the amplifier and a triode arranged at the output end of the amplifier; wherein,
The adjustable resistor is arranged between the power end and the grounding end in parallel;
The non-inverting input end of the amplifier is connected with one end of the adjustable resistor through a first resistor, the inverting input end of the amplifier is connected with the output end, and the inverting input end of the amplifier is connected with the other end of the adjustable resistor through a second resistor;
three ends of the triode are respectively connected with the output end, the power end and the grounding end;
and determining the lost or normal state of the electronic device according to the state of the power supply terminal.
2. The electronic device testing circuit of claim 1, wherein,
The triode is a PNP triode and comprises a base electrode, a collector electrode and an emitter electrode;
the base is connected with the output end, the collector is connected with the grounding end through a third resistor, and the emitter is connected with the power end.
3. The electronic device testing circuit of claim 2, wherein,
When the electronic device at the power supply end is lost, no current flows in the adjustable resistor, the output end of the amplifier is 0, the PNP triode is conducted, the power supply end is set low, and the test result is NG; otherwise the first set of parameters is selected,
When the electronic device of the power supply end exists, the voltage of the output end is equal to the voltage of the two ends of the adjustable resistor, the output end is in a high level, the PNP triode is disconnected, the power supply end supplies power normally, and the test result is qualified.
4. The electronic device testing circuit of claim 1, further comprising a filter circuit; the filter circuit is disposed between the VDD terminal and the GND terminal of the electronic device.
5. The electronic device testing circuit of claim 4, wherein,
The filter circuit includes at least one filter capacitor disposed in parallel between the VDD terminal and the GND terminal.
6. The electronic device testing circuit of claim 2, wherein,
A fourth resistor is connected between the inverting input and the output of the amplifier.
7. The electronic device testing circuit of claim 6, wherein,
The non-inverting input end of the amplifier is connected with the grounding end through a fifth resistor;
The first resistor and the fifth resistor are arranged in parallel.
8. The electronic device testing circuit of claim 7, wherein,
The first resistor, the second resistor, the third resistor, the fourth resistor and the fifth resistor are resistors or impedances with adjustable resistance values.
9. A microphone array module comprising at least two microphones; the method is characterized in that corresponding test circuits are respectively arranged at the power supply ends of the microphones, and the test circuits are as claimed in any one of claims 1 to 8; wherein,
And determining the test result of each microphone in the microphone array module based on the working mode of each test circuit.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202211046006.3A CN115361609B (en) | 2022-08-30 | 2022-08-30 | Electronic device testing circuit and microphone array module |
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| CN202211046006.3A CN115361609B (en) | 2022-08-30 | 2022-08-30 | Electronic device testing circuit and microphone array module |
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| CN115361609B true CN115361609B (en) | 2024-07-05 |
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| KR100251141B1 (en) * | 1996-12-10 | 2000-04-15 | 정몽규 | Failure checking circuit for the voice recognition device of an automobile |
| US9900708B2 (en) * | 2013-12-27 | 2018-02-20 | Gn Hearing A/S | Hearing instrument with switchable power supply voltage |
| CN205610936U (en) * | 2016-04-14 | 2016-09-28 | 延锋伟世通（重庆）汽车电子有限公司 | A microphone test circuit for on -vehicle stereo set |
| CN207939738U (en) * | 2018-03-20 | 2018-10-02 | 厦门歌乐电子企业有限公司 | A kind of microphone state detection circuit and vehicle multi-media player |
| CN108933575A (en) * | 2018-07-23 | 2018-12-04 | 南京秀餐网络科技有限公司 | A kind of D-type audio power amplifier for portable audio product |
| CN210720515U (en) * | 2019-08-16 | 2020-06-09 | 惠州市尚霖科创电子有限公司 | Electronic load module for testing |
| CN211452592U (en) * | 2020-04-10 | 2020-09-08 | 深圳市芯跃智联科技有限公司 | Audio signal detection circuit |
| CN212115678U (en) * | 2020-06-17 | 2020-12-08 | 荣成歌尔电子科技有限公司 | Microphone test board and microphone test system |
| CN112327211B (en) * | 2020-09-29 | 2023-07-21 | 惠州市德赛西威汽车电子股份有限公司 | Vehicle-mounted microphone power supply connection state monitoring circuit and method |
| CN113573227B (en) * | 2021-08-03 | 2023-12-12 | Tcl通讯（宁波）有限公司 | Microphone fault detection system, detection method thereof, electronic device and storage medium |
| CN215734804U (en) * | 2021-08-30 | 2022-02-01 | 广东得胜电子有限公司 | Wired bone conduction microphone circuit |
| CN114567837B (en) * | 2022-02-28 | 2024-04-26 | 歌尔微电子股份有限公司 | Sensor microphone output protection circuit and sensor microphone |
| CN114924182A (en) * | 2022-05-20 | 2022-08-19 | 宁波壹科芯电子科技有限公司 | Circuit and method for testing quiescent current of electronic product |
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