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CN114740277B - Method and system for correcting radiation characteristics of curved surface array - Google Patents

Method and system for correcting radiation characteristics of curved surface array Download PDF

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Publication number
CN114740277B
CN114740277B CN202210327283.5A CN202210327283A CN114740277B CN 114740277 B CN114740277 B CN 114740277B CN 202210327283 A CN202210327283 A CN 202210327283A CN 114740277 B CN114740277 B CN 114740277B
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array
curved surface
array element
curved
projection
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CN114740277A (en
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蒋彦雯
范红旗
曾桂兰
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National University of Defense Technology
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    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of antennas

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Abstract

The application relates to a method and a system for correcting radiation characteristics of a curved surface array, wherein the method comprises the following steps: determining two array elements closest to the center of the array on the curved surface array as correction base points; calculating the array element projection positions of each array element on the projected curved surface array based on the correction base points; the array element spacing on the projected curved surface array is the same as the array element spacing on the equal-length uniform plane array; acquiring the real position of each array element on the curved surface array; calculating the difference between the actual position of each array element and the projection position of the corresponding array element to obtain the projection position error of each array element on the curved surface array; and carrying out phase compensation processing on the directional diagram of the curved surface array by utilizing the projection position errors of the array elements to obtain the directional diagram of the curved surface array after the radiation characteristic correction. By adopting the improved projection method, the phase compensation of the uniform curved surface array with any curvature can be realized, the array directional diagram close to the performance of the planar array is obtained, and the phase compensation effect of the curved surface array antenna is remarkably improved.

Description

Method and system for correcting radiation characteristics of curved surface array
Technical Field
The invention belongs to the technical field of antenna signal processing, and relates to a radiation characteristic correction method and system of a curved surface array.
Background
With the continuous development of antenna technology, different types of antenna layers are endlessly and widely applied to various high and new technical fields. The conformal array antenna (Conformal ANTENNA ARRAY, CAA) refers to an antenna array which keeps the shape of an object consistent, namely, each array unit is distributed on the surface of an electronic system carrier and enables the surface of the array to be attached to the shape of a carrier platform, and the antenna is also called as a conformal array. Compared with the traditional planar array antenna, the conformal array antenna can also give consideration to the aerodynamic characteristics of the carrier on the basis of meeting the performance requirements of the antenna, and the space utilization rate in the carrier is improved to a certain extent due to the special installation position of the antenna. In addition, the conformal array antennas are distributed in a three-dimensional space, so that the coverage area of an airspace and the like are correspondingly improved. The advantages of the conformal array antenna make the conformal array antenna become a research hot spot in the antenna field, and the conformal array antenna is widely focused in related fields such as radar, communication and navigation, and is a main direction of antenna development in the future.
The radiation characteristic correction (array manifold error correction) of the conformal array antenna is a key technical basis for the application and development of the conformal array antenna, and at present, a phase compensation method is generally adopted for correction, including an array element connection phase compensation method, a radial phase compensation method, a Z-direction phase compensation method and the like, wherein the Z-direction phase compensation method is most widely applied, and the Z-direction phase compensation method is also called a projection method. The curved array antenna belongs to a typical conformal array antenna, however, in the process of implementing the present invention, the inventor finds that the conventional projection method has a problem of correcting the radiation characteristic of the curved array antenna, and still has a technical problem of poor phase compensation effect.
Disclosure of Invention
In view of the above problems in the conventional methods, the present invention provides a method for correcting radiation characteristics of a curved array and a system for correcting radiation characteristics of a curved array, and further provides a signal processing device and a computer-readable storage medium, which can significantly improve the phase compensation effect on a curved array antenna.
In order to achieve the above object, the embodiment of the present invention adopts the following technical scheme:
in one aspect, a method for correcting radiation characteristics of a curved array is provided, including the steps of:
determining two array elements closest to the center of the array on the curved surface array as correction base points;
calculating the array element projection positions of each array element on the projected curved surface array based on the correction base points; the array element spacing on the projected curved surface array is the same as the array element spacing on the equal-length uniform plane array;
acquiring the real position of each array element on the curved surface array;
Calculating the difference between the actual position of each array element and the projection position of the corresponding array element to obtain the projection position error of each array element on the curved surface array;
and carrying out phase compensation processing on the directional diagram of the curved surface array by utilizing the projection position errors of the array elements to obtain the directional diagram of the curved surface array after the radiation characteristic correction.
In another aspect, there is also provided a radiation characteristic correction system for a curved array, comprising:
The base point determining module is used for determining two array elements closest to the center of the array on the curved surface array as correction base points;
The projection position module is used for calculating the array element projection positions of all the array elements on the projected curved surface array based on the correction base points; the array element spacing on the projected curved surface array is the same as the array element spacing on the equal-length uniform plane array;
the array element position module is used for acquiring the actual positions of the array elements of each array element on the curved surface array;
the projection error module is used for obtaining the projection position error of each array element on the curved surface array by calculating the difference between the actual position of each array element and the projection position of the corresponding array element;
And the compensation processing module is used for carrying out phase compensation processing on the directional diagram of the curved surface array by utilizing the projection position errors of the array elements to obtain the directional diagram of the curved surface array after the radiation characteristic correction.
In still another aspect, there is provided a signal processing apparatus including a memory storing a computer program and a processor implementing the steps of the radiation characteristic correction method of the curved array described above when the processor executes the computer program.
In yet another aspect, there is also provided a computer readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of the radiation characteristic correction method of a curved array described above.
One of the above technical solutions has the following advantages and beneficial effects:
According to the radiation characteristic correction method and system for the curved surface array, an improved projection method is adopted, namely, the position of an array element close to the center of the curved surface array is used as a correction reference, the projection positions of array elements of other array elements are obtained through array element interval calculation, then the position difference between the actual position of the array element of each array element on the curved surface array and the projection position of the array element of the corresponding array element after projection by adopting the improved projection method is calculated, and finally the obtained projection position error is utilized to carry out phase compensation processing on the directional diagram of the curved surface array, so that the directional diagram after radiation characteristic correction is obtained. Therefore, the scheme has the characteristics of wider application range, more excellent phase compensation effect and the like in the uniform curved surface array, and can realize the phase compensation of the uniform curved surface array with any curvature, so as to obtain an array pattern close to the performance of the planar array, thereby remarkably improving the phase compensation effect of the curved surface array antenna.
Drawings
FIG. 1 is a diagram of array signal emissions in one embodiment;
FIG. 2 is a flow chart of a method for correcting radiation characteristics of a curved array according to an embodiment;
FIG. 3 is a schematic diagram showing the relationship between the array element m and the curvature angle on a curved array according to one embodiment;
FIG. 4 is a schematic view of an array element projection by a conventional projection method;
FIG. 5 is a schematic diagram showing the contrast of array element projection by the improved projection method and the conventional projection method in one embodiment;
fig. 6 is a schematic diagram of the curved array before and after phase compensation when m=64, q=pi/2 in one embodiment;
fig. 7 is a schematic diagram of the front and back direction diagram of phase compensation of the curved array when m=64 and q=2×pi/3 in one embodiment;
fig. 8 is a schematic diagram of the phase compensation front-back direction of the curved array when m=64 and q=pi in one embodiment;
FIG. 9 is a diagram of the ratio of the side lobe ratios of the integral states at different curvatures in one embodiment;
FIG. 10 is a graphical representation of the variation of RMSE with increasing curvature for two methods in one embodiment;
FIG. 11 is a schematic block diagram of a radiation characteristic correction system of a curved array according to an embodiment.
Detailed Description
The present application will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present application more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the application.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and/or" as used herein includes any and all combinations of one or more of the associated listed items.
Embodiments of the present invention will be described in detail below with reference to the attached drawings in the drawings of the embodiments of the present invention.
Curved array antennas are a typical type of conformal array antenna. When the uniform planar array antenna is adopted, the wave path difference between each array element and the center of the array is an equal ratio array, and main lobe beams with good focusing performance can be formed by spatial superposition; for the curved array antenna, the wave path difference between the transmitting and receiving of each array element is not kept in an equal ratio relationship, so that the main lobe performance of the directional diagram is seriously deteriorated. In practical engineering application, in order to make the radiation characteristic of the curved array antenna approximate to that of the planar array antenna, and avoid the influence of array deformation on the performance of the directional diagram, the deformation of the conformal array antenna needs to be corrected, which is a technical problem with important research significance and is also a key factor for restricting the development and application of the conformal array antenna.
However, analysis finds that when the curvature of the curved array antenna is too high, the phase compensation effect of the conventional projection method becomes worse, and the practical application requirement cannot be met. Therefore, the application provides a new correction method (also called improved projection method) aiming at the technical problem that the phase compensation effect is poor when the radiation characteristic of the curved array antenna is corrected by the traditional projection method, and the array element positions of the curved array close to the center of the array are used as correction references, and the rest array element positions are obtained by using array element interval calculation, so that the corrected array pattern is obtained, and the corrected array pattern has the characteristics of wider application range, more excellent phase compensation effect and the like in the uniform curved array, and can realize the phase compensation of the uniform curved array with any curvature so as to obtain the array pattern close to the performance of the planar array.
For the purpose of facilitating the following visual and detailed description of the method, the following description is given in a rectangular coordinate system. It will be appreciated by those skilled in the art that the following method may be applied in other coordinate systems, and may be applied in a homomorphism by merely transforming the coordinate relationship (between coordinate systems) of the relevant parameters, and thus the following method is not limited to be applied in rectangular coordinate systems.
As shown in fig. 1, which is an array signal emission schematic diagram, in fig. 1, the number of array elements is M, where the intervals between the array elements of the uniform planar array are denoted as l, and the array elements are distributed on the x-axis in an equidistant manner, unlike the conventional planar array, when the array substrate adopts a flexible and variable material, the planar array can be deformed into a curved surface array with any curvature, which is shown as a curved surface array 1 and a curved surface array 2 in fig. 1, respectively, and it is assumed that the curvatures of the two curved surface arrays are q 1 and q 2(q1>q2, respectively, and the larger the curvature q is, the greater the bending degree of the curved surface array is represented. When the azimuth angle is θ, the array pattern distribution formed by overlapping each array element in space can be expressed as:
wherein x m and y m are respectively an x-axis coordinate and a y-axis coordinate corresponding to the M-th array element, m=1, 2. k=2pi f/c is wave number, f is the frequency of the emitted signal, and c is the speed of light.
For a planar array, the element coordinates y m are all set to zero, and equation (1) can be rewritten as:
Referring to fig. 2, an embodiment of the present application provides a method for correcting radiation characteristics of a curved array, which includes steps S12 to S20:
s12, determining two array elements closest to the center of the array on the curved surface array as correction base points.
It will be understood that the center of the array refers to the arc midpoint of the curved array, and thus, the correction base, i.e., the two array elements (positions) on both sides of the arc midpoint of the curved array closest to the midpoint.
S14, calculating the array element projection positions of each array element on the projected curved surface array based on the correction base points; the array element spacing on the projected curved array is the same as the array element spacing on the equal-length uniform planar array.
It is understood that an equal length uniform planar array refers to a uniform planar array having an array length equal to the array length of a curved array in which the same number of array elements can be distributed across both arrays. Therefore, the projection plane of the curved surface array can be set to be the plane of the equal-length uniform plane array or the x-axis plane.
S16, acquiring the real position of each array element on the curved surface array.
It is understood that the real position of each element refers to the position coordinate of each element in the current coordinate system on the curved surface array. The actual position of the array elements of the individual array elements may be provided in advance or may be read from the coordinate system by direct measurement by the carrier device or obtained in some other way.
In one embodiment, regarding the step S16 described above, it includes:
acquiring the curvature and the array length of the curved surface array, and performing equidistant segmentation on the curvature;
Determining element azimuth angles corresponding to each array element on the curved surface array according to the segmented curvature;
and calculating according to the curvature, the array length and the element azimuth angle to obtain the real position of each element.
It can be understood that, for a curved surface array, an arc model is used to fit the curvature of the array and the coordinates x m and y m corresponding to the positions of the array elements, as shown in fig. 3, the curvature value q corresponding to the curved surface array is set, and since the curved surface array is a uniform curved surface array (for a non-uniform curved surface array, the curved surface array can also be processed by dividing into a plurality of uniform curved surface arrays), and the curvature is equally divided into M parts, the angle corresponding to the array element M (i.e. the element azimuth angle) can be recorded as:
α=q/M*m-q/2 (3)
In one embodiment, the actual position of the array element is calculated by the following formula:
Wherein x m represents an x-axis coordinate of each array element on the curved surface array in a rectangular coordinate system, y m represents a y-axis coordinate of each array element on the curved surface array in the rectangular coordinate system, r represents a radius of a circle where the curved surface array is located, α represents an element azimuth angle, m=1, 2.
Specifically, when the curved surface array is deformed, the length of the array is kept unchanged all the time, 1 is L 1=(M-1)*l,L1, namely the arc length in fig. 2, the radius of a circle is r=L 1/q, and then the values of x m and y m can be obtained through calculation in the formula (4).
As shown in fig. 4, it can be seen that the higher the degree of surface formation of the planar array, the greater the distortion of the curved surface occurs, and the greater the position difference between each array element on the deformed curved surface array and the corresponding array element of the planar array, such as the position difference X' corresponding to the curved surface array with small curvature and the position difference x″ corresponding to the curved surface array with large curvature; after the planar array is curved, the difference between the two array element positions which are generally close to the center of the array and the original position is relatively small, so that the array element positions which are close to the center of the array are used as correction references, the rest array element positions can be obtained through the calculation of the array element interval l, and the corrected array pattern is further obtained. Wherein the array element n is an array element in the array.
In one embodiment, the projected positions of the array elements of each array element on the projected back surface array are calculated by the following formula:
Wherein m represents a left correction base point closest to the center of the array on the curved surface array, m+1 represents a left correction base point closest to the center of the array on the curved surface array, and l represents an array element pitch.
Specifically, two array elements closest to the center of the curved array are selected as base points, as shown in fig. 5, and assuming that the two array elements closest to the center of the array are respectively an array element m and an array element m+1, when the improved projection method is adopted, the distance between each array element after projection (array element distance) is kept the same as that of the uniform planar array, and then the array element projection position coordinates of the rest array elements can be obtained by calculating the above formula (5). As shown in fig. 5, schematic diagrams of the positions of the array element m-1, the array element m+1, and the array element m+2 adjacent to the array element m after projection are given.
S18, calculating the difference between the actual position of each array element and the projection position of the corresponding array element to obtain the projection position error of each array element on the curved surface array.
It can be understood that after the actual position of each array element and the projected position of the projected array element on the curved surface array are obtained, the projection position error of each array element can be calculated respectively.
In one embodiment, the projection position error of each array element on the curved array is calculated by the following formula:
Wherein m represents the m-th array element on the curved surface array, And the x-axis coordinate of the array element projection position corresponding to the array element m in a rectangular coordinate system is represented.
The projection part can quickly obtain the projection position error data of each array element by the position error calculation mode without considering the position coordinate in the y-axis direction.
S20, performing phase compensation processing on the directional diagram of the curved surface array by utilizing the projection position errors of the array elements to obtain the directional diagram of the curved surface array after the radiation characteristic correction.
It can be understood that after the projection position error of each array element is obtained, the error data can be used as a phase compensation term for the calculation of the directional diagram of the curved surface array, so as to obtain a corrected directional diagram.
In one embodiment, the radiation characteristic corrected directional diagram of the curved array is calculated by the following formula:
Wherein P improve represents a direction diagram of the curved surface array after radiation characteristic correction, M represents the array element number of the curved surface array, k represents wave number, x m represents x-axis coordinates of each array element on the curved surface array in a rectangular coordinate system, y m represents y-axis coordinates of each array element on the curved surface array in the rectangular coordinate system, θ represents azimuth angle, and D represents projection position error.
Specifically, the phase compensation processing is performed on the curved array directional diagram by the equation (7) by using the calculated position errors of each array element.
As shown in fig. 5, solid arrows are the position change tracks of the array elements corresponding to the improved projection method, dashed arrows are the position change tracks of the array elements corresponding to the conventional projection method, and the conventional projection method performs phase compensation by directly setting the coordinates of each array element on the curved array in the y-axis direction to zero, so that the calculation formula of the directional diagram from the curved array received at the target position P is as follows:
It can be seen that the phase compensation mode is essentially different from the improved projection method adopted by the application.
According to the radiation characteristic correction method of the curved surface array, an improved projection method is adopted, namely, the position of an array element close to the center of the curved surface array is used as a correction reference, the projection positions of array elements of other array elements are obtained through array element interval calculation, then, the position difference between the actual position of the array element of each array element on the curved surface array and the projection position of the array element of the corresponding array element after projection by the improved projection method is calculated, and finally, the obtained projection position error is utilized to conduct phase compensation processing on the directional diagram of the curved surface array, so that the directional diagram after radiation characteristic correction is obtained. Therefore, the scheme has the characteristics of wider application range, more excellent phase compensation effect and the like in the uniform curved surface array, and can realize the phase compensation of the uniform curved surface array with any curvature, so as to obtain an array pattern close to the performance of the planar array, thereby remarkably improving the phase compensation effect of the curved surface array antenna.
In one embodiment, in order to more intuitively and fully describe the radiation characteristic correction method of the curved array, the following is an example of taking a certain curved array as an example, and performing simulation application and comparison description on the radiation characteristic correction method of the curved array provided by the invention.
It should be noted that, the embodiments given in the present disclosure are only illustrative, and not the only limitation of the specific embodiments of the present disclosure, and those skilled in the art may apply the above-mentioned method for correcting radiation characteristics of a curved array to simulate different curved arrays under the illustration of the embodiments provided by the present disclosure.
Setting the array element number as M=64, the transmitting signal frequency as f=5.68 GHz, the array element interval as l=lambda/2, lambda=c/f as wavelength, and the angle range of the directional diagram as theta epsilon [ -90 degrees, 90 degrees ]. When the curved surface array pattern is simulated, the curvatures are respectively q=pi/2, q=2×pi/3 and q=pi, wherein q=0 represents that the array is in a planar array state at the moment, and the rest q values which are sequentially increased respectively represent three curved surface arrays with increasingly serious bending degrees.
As shown in fig. 6-8, the plane array pattern, the original curved array pattern, and the compensated array pattern of two phase compensation methods (conventional and the above described method of the present application) are plotted for m=64, l=0.05 for different q values. As shown in fig. 6, when the value of q is small, that is, the curved array is curved to a smaller extent than the planar array, the compensation effects of the two projection methods of the main lobe and the adjacent side lobes are different but not large, and the improved projection method for the side lobe compensation effect far from the main lobe is superior to the conventional projection method, so that both the phase compensation projection method and the conventional improved projection method can be performed on the curved array under the condition of low curvature.
As shown in fig. 7, the advantages of the improved projection method provided by the application are gradually revealed, especially in the comparison of the three diagrams of fig. 6 to 8, it can be obviously seen that as the curvature is increased, the phase compensation effect of the improved projection method is obviously better than that of the traditional projection method, the phase compensation is carried out by the traditional projection method, the side lobe difference of the direction diagram is larger than that of the plane array direction diagram, and the direction diagram of the curved array and the plane array waveform after the phase compensation of the improved projection method can basically keep consistent. Therefore, in a curved surface state of high curvature, phase compensation using the modified projection method is a good choice.
To further compare the performance of the improved projection method proposed by the present application with that of the conventional projection method, the Integral Side Lobe Ratio (ISLR) and Root Mean Square Error (RMSE) of the array pattern were calculated:
ISLR and RMSE comparison results are shown in fig. 9 and 10, respectively, it can be found from fig. 9 that under different curvatures, the integral sidelobe ratio of the direction diagram compensated by the improved projection method is very close to that of the original planar array, and the difference between the integral sidelobe ratio of the direction diagram compensated by the traditional projection method and the planar array gradually increases along with the larger curvature. It can be seen from fig. 10 that the overall RMSE trend of the projection method is toward a larger and larger trend as the curvature increases, but the RMSE value of the improved projection method is still in a small range, and therefore, the effect of the improved projection method is superior to that of the conventional projection method, and the compensation effect of the conventional projection method is rapidly deteriorated as the curvature increases.
Combining ISLR and RMSE analysis results leads to the conclusion that: when the curvature is increased, although the main lobe focusing performance is almost the same, the sidelobe performance of the traditional projection method is seriously deteriorated, so that the gap between the phase-compensated curved surface array direction diagram ISLR and the plane array is increased, and the RMSE value is also continuously increased.
It should be understood that, although the steps in the flowchart of fig. 1 are shown in sequence as indicated by the arrows, the steps are not necessarily performed in sequence as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least a portion of the steps of fig. 1 may include multiple sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, nor does the order in which the sub-steps or stages are performed necessarily occur sequentially, but may be performed alternately or alternately with other steps or at least a portion of the sub-steps or stages of other steps.
Referring to fig. 11, in one embodiment, a radiation characteristic correction system 100 of a curved surface array is further provided, which includes a base point determining module 11, a projection position module 13, an array element position module 15, a projection error module 17, and a compensation processing module 19. The base point determining module 11 is configured to determine two array elements closest to the center of the curved surface array as correction base points. The projection position module 13 is used for calculating the array element projection positions of each array element on the projected back curved surface array based on the correction base points; the array element spacing on the projected curved array is the same as the array element spacing on the equal-length uniform planar array. The array element position module 15 is used for obtaining the actual positions of the array elements of each array element on the curved surface array. The projection error module 17 is configured to obtain a projection position error of each array element on the curved array by calculating a difference between a real position of each array element and a projection position of a corresponding array element. The compensation processing module 19 is configured to perform phase compensation processing on the directional diagram of the curved surface array by using the projection position error of each array element, so as to obtain a directional diagram of the curved surface array after the radiation characteristic correction.
The radiation characteristic correction system 100 of the curved surface array adopts an improved projection method through cooperation of the modules, namely, the position of an array element close to the center of the curved surface array is used as a correction reference, the projection positions of the array elements of the rest array elements are obtained through array element interval calculation, then, the position difference between the actual position of the array element of each array element on the curved surface array and the projection position of the array element of the corresponding array element after projection by adopting the improved projection method is calculated, and finally, the obtained projection position error is utilized to carry out phase compensation processing on the directional diagram of the curved surface array, so as to obtain the directional diagram after radiation characteristic correction. Therefore, the scheme has the characteristics of wider application range, more excellent phase compensation effect and the like in the uniform curved surface array, and can realize the phase compensation of the uniform curved surface array with any curvature, so as to obtain an array pattern close to the performance of the planar array, thereby remarkably improving the phase compensation effect of the curved surface array antenna.
In one embodiment, the array element position module 15 includes an array parameter sub-module, an array element position sub-module, and an array element position sub-module. The array parameter submodule is used for acquiring the curvature and the array length of the curved surface array and carrying out equidistant segmentation on the curvature. And the array element azimuth sub-module is used for determining element azimuth angles corresponding to each array element on the curved surface array according to the curvature after segmentation. And the array element position submodule is used for calculating the actual position of each array element according to the curvature, the array length and the element azimuth angle.
For specific limitations of the radiation characteristic correction system 100 of the curved array, reference may be made to the corresponding limitations of the radiation characteristic correction method of the curved array hereinabove, and no further description is given here. The various modules in the above-described curved array radiation characteristic correction system 100 may be implemented in whole or in part by software, hardware, and combinations thereof. The above modules may be embedded in hardware or may be stored in a memory of the above device, or may be stored in software, so that the processor may call and execute operations corresponding to the above modules, where the above device may be, but is not limited to, various antenna signal processing devices or on-board systems existing in the art.
In yet another aspect, there is provided a signal processing apparatus including a memory storing a computer program and a processor which when executing the computer program performs the following processing steps: determining two array elements closest to the center of the array on the curved surface array as correction base points; calculating the array element projection positions of each array element on the projected curved surface array based on the correction base points; the array element spacing on the projected curved surface array is the same as the array element spacing on the equal-length uniform plane array; acquiring the real position of each array element on the curved surface array; calculating the difference between the actual position of each array element and the projection position of the corresponding array element to obtain the projection position error of each array element on the curved surface array; and carrying out phase compensation processing on the directional diagram of the curved surface array by utilizing the projection position errors of the array elements to obtain the directional diagram of the curved surface array after the radiation characteristic correction.
It should be noted that the signal processing device may be any type of antenna signal processing device in the art, including on-board and off-board devices, which may include other components not specifically listed in the present specification, in addition to the core components such as the memory and the processor, which may be understood by those skilled in the art, and may be specifically determined according to the specific device model.
In one embodiment, the processor may also implement the steps or sub-steps added to the embodiments of the method for correcting radiation characteristics of a curved array described above when executing the computer program.
In yet another aspect, there is provided a computer readable storage medium having stored thereon a computer program, wherein the computer program when executed by a processor performs the following processing steps: determining two array elements closest to the center of the array on the curved surface array as correction base points; calculating the array element projection positions of each array element on the projected curved surface array based on the correction base points; the array element spacing on the projected curved surface array is the same as the array element spacing on the equal-length uniform plane array; acquiring the real position of each array element on the curved surface array; calculating the difference between the actual position of each array element and the projection position of the corresponding array element to obtain the projection position error of each array element on the curved surface array; and carrying out phase compensation processing on the directional diagram of the curved surface array by utilizing the projection position errors of the array elements to obtain the directional diagram of the curved surface array after the radiation characteristic correction.
In one embodiment, the computer program may further implement the steps or sub-steps added to the embodiments of the method for correcting radiation characteristics of a curved array.
Those skilled in the art will appreciate that implementing all or part of the above-described methods may be accomplished by way of a computer program, which may be stored on a non-transitory computer readable storage medium, that when executed may comprise the steps of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in embodiments provided herein may include non-volatile and/or volatile memory. The nonvolatile memory can include Read Only Memory (ROM), programmable ROM (PROM), electrically Programmable ROM (EPROM), electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (SYNCHLINK) DRAM (SLDRAM), memory bus dynamic random access memory (Rambus DRAM, RDRAM for short), and interface dynamic random access memory (DRDRAM), among others.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The foregoing examples illustrate only a few embodiments of the application, which are described in detail and are not to be construed as limiting the scope of the application. It should be noted that it is possible for those skilled in the art to make several variations and modifications without departing from the spirit of the present application, which fall within the protection scope of the present application. The scope of the application is therefore intended to be covered by the appended claims.

Claims (10)

1. A method for correcting radiation characteristics of a curved array, comprising the steps of:
determining two array elements closest to the center of the array on the curved surface array as correction base points;
Calculating the array element projection positions of each array element on the curved surface array after projection based on the correction base points; the array element spacing on the curved surface array after projection is the same as the array element spacing on the equal-length uniform plane array;
Acquiring the real position of each array element on the curved surface array;
obtaining projection position errors of each array element on the curved surface array by calculating the difference between the actual position of each array element and the projection position of the corresponding array element;
And carrying out phase compensation processing on the directional diagram of the curved surface array by utilizing the projection position errors of each array element to obtain the directional diagram of the curved surface array after the radiation characteristic correction.
2. The method of claim 1, wherein the step of obtaining actual positions of the array elements of each array element on the curved array comprises:
Acquiring the curvature and the array length of the curved surface array, and performing equidistant segmentation on the curvature;
determining element azimuth angles corresponding to each array element on the curved surface array according to the segmented curvature;
and calculating the real position of each array element according to the curvature, the array length and the element azimuth angle.
3. The method for correcting radiation characteristics of a curved array according to claim 2, wherein the actual positions of the array elements are calculated by the following formula:
xm=r*sin(α)
ym=r*[1-cos(α)]
Wherein x m represents an x-axis coordinate of each array element on the curved surface array in a rectangular coordinate system, y m represents a y-axis coordinate of each array element on the curved surface array in a rectangular coordinate system, r represents a radius of a circle where the curved surface array is located, α represents the element azimuth angle, m=1, 2, & gt, M represents the number of array elements of the curved surface array;
Wherein r=l 1/q,L1 denotes an array length of the curved array, and q denotes a curvature of the curved array;
Wherein α=q/M-q/2.
4. A radiation characteristic correcting method for a curved surface array according to any one of claims 1 to 3, wherein the radiation characteristic corrected directional diagram of the curved surface array is calculated by the following formula:
Wherein P improve represents a direction diagram of the curved surface array after the radiation characteristic correction, M represents the number of array elements of the curved surface array, k represents the wave number, x m represents the x-axis coordinate of each array element on the curved surface array in a rectangular coordinate system, y m represents the y-axis coordinate of each array element on the curved surface array in a rectangular coordinate system, θ represents the azimuth angle, and D represents the projection position error.
5. The method of claim 4, wherein the projected positions of the array elements of the curved array after projection are calculated by the following formula:
Wherein m represents a left correction base point closest to the center of the array on the curved surface array, m+1 represents a left correction base point closest to the center of the array on the curved surface array, and l represents an array element distance.
6. The method of claim 4, wherein the projection position error of each array element on the curved array is calculated by the following formula:
Wherein m represents the m-th array element on the curved surface array, And the x-axis coordinate of the array element projection position corresponding to the array element m in a rectangular coordinate system is represented.
7. A radiation characteristic correction system for a curved array, comprising:
The base point determining module is used for determining two array elements closest to the center of the array on the curved surface array as correction base points;
The projection position module is used for calculating the array element projection positions of each array element on the curved surface array after projection based on the correction base points; the array element spacing on the curved surface array after projection is the same as the array element spacing on the equal-length uniform plane array;
The array element position module is used for acquiring the actual positions of the array elements of each array element on the curved surface array;
the projection error module is used for obtaining the projection position error of each array element on the curved surface array by calculating the difference between the actual position of each array element and the projection position of the corresponding array element;
And the compensation processing module is used for carrying out phase compensation processing on the directional diagram of the curved surface array by utilizing the projection position errors of each array element to obtain the directional diagram of the curved surface array after the radiation characteristic correction.
8. The system for correcting radiation characteristics of a curved array according to claim 7, wherein said element position module comprises:
The array parameter submodule is used for acquiring the curvature and the array length of the curved surface array and carrying out equidistant segmentation on the curvature;
an array element azimuth sub-module, configured to determine element azimuth angles corresponding to each array element on the curved array according to the segmented curvature;
And the array element position sub-module is used for calculating the real position of each array element according to the curvature, the array length and the element azimuth angle.
9. A signal processing device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor, when executing the computer program, implements the steps of the method for correcting radiation characteristics of a curved array according to any one of claims 1 to 6.
10. A computer-readable storage medium having stored thereon a computer program, characterized in that the computer program, when executed by a processor, implements the steps of the radiation characteristic correction method of a curved array according to any of claims 1 to 6.
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