CN114546579A

CN114546579A - Radio frequency test method, radio frequency test device and electronic equipment

Info

Publication number: CN114546579A
Application number: CN202210448470.9A
Authority: CN
Inventors: 段相丰; 杨胜领; 尹项托; 程军强
Original assignee: Zhongxing Lianhua Technology Beijing Co ltd
Current assignee: Zhongxing Lianhua Technology Beijing Co ltd
Priority date: 2022-04-27
Filing date: 2022-04-27
Publication date: 2022-05-27

Abstract

The invention provides a radio frequency test method, a radio frequency test device and electronic equipment; relates to the technical field of communication test. The method comprises the following steps: displaying a first page, and determining a test instrument, a tested radio frequency device and test parameters based on the first page; receiving a first user operation, wherein the first user operation is used for starting a test; and responding to the first user operation, testing the radio frequency device to be tested based on the testing instrument, and acquiring test data comprising the test parameters. The invention can reduce the operation difficulty of the radio frequency test and improve the test efficiency.

Description

Radio frequency test method, radio frequency test device and electronic equipment

Technical Field

The present invention relates to the field of communication testing technologies, and in particular, to a radio frequency testing method, a radio frequency testing apparatus, and an electronic device.

Background

Radio frequency refers to high frequency electromagnetic waves with long distance transmission capability. Devices with rf functionality are usually subjected to rf testing to ensure that the rf functionality of the devices is good.

Currently, each instrument needs to be manually controlled during the radio frequency test. For example, when testing the up-conversion power of the rf module, a signal source should first provide a reference signal; and setting the output power of the reference signal; then sending a command to control a local oscillator to output a frequency and controlling an up-conversion module to output a frequency; setting corresponding output frequency on a frequency spectrograph, and setting mark points; and finally, manually reading the power value and recording. These operations need to be repeated for the next point to be tested, which is time consuming and inefficient.

Disclosure of Invention

The invention provides a radio frequency test method, a radio frequency test device and electronic equipment, which are used for solving the problem of low radio frequency test efficiency in the prior art, realizing automatic radio frequency test and improving the test efficiency.

The invention provides a radio frequency test method, which comprises the following steps:

displaying a first page, and determining a test instrument, a tested radio frequency device and test parameters based on the first page;

receiving a first user operation, wherein the first user operation is used for starting a test;

and responding to the first user operation, testing the radio frequency device to be tested based on the testing instrument, and acquiring test data comprising the test parameters.

According to an embodiment provided by the present invention, after determining the test instrument, the rf device under test, and the test parameters based on the first page, the method further includes:

receiving a first input operation of a user, wherein the first input operation is used for determining a first configuration parameter of the test instrument;

in response to the first input operation, sending a first instruction to the test instrument, wherein the first instruction is used for configuring the first configuration parameter to the test instrument;

receiving a second input operation of a user, wherein the second input operation is used for determining a second configuration parameter of the radio frequency device under test;

and responding to the second input operation, and sending a second instruction to the tested radio frequency device, wherein the second instruction is used for configuring the second configuration parameter to the tested radio frequency device.

According to an embodiment of the present invention, the test parameter includes at least one of power, gain flatness, local oscillator leakage, local oscillator power, and spurious.

According to an embodiment of the present invention, the obtaining test data including the test parameters based on the test instrument testing the rf device under test in response to the first user operation includes:

determining a test program corresponding to the test parameters;

and responding to the first user operation, running a test program corresponding to the test parameters, wherein the test program is used for testing based on the test instrument and the tested radio frequency device and obtaining test data.

According to an embodiment of the present invention, the displaying a first page, and determining a test instrument, a radio frequency device under test, and test parameters based on the first page includes:

displaying the first page, wherein the first page is displayed with an equipment address connected to the first page and a plurality of parameters to be tested;

receiving a first operation on the first page, wherein the first operation is used for determining a test instrument to be tested in the equipment address;

receiving a second operation on the first page, wherein the second operation is used for determining a radio frequency device to be tested in the equipment address;

and receiving a third operation on the first page, wherein the third operation is used for determining a test parameter in the parameters to be tested.

According to an embodiment of the present invention, the method further comprises:

receiving a second user operation, wherein the second user operation is used for determining a target file;

in response to the second user action, storing the test data in the target file.

The present invention also provides a radio frequency testing apparatus, comprising:

the display module is used for displaying a first page and determining a test instrument, a tested radio frequency device and test parameters based on the first page;

the device comprises a receiving module, a test starting module and a test starting module, wherein the receiving module is used for receiving first user operation which is used for starting a test;

and the response module is used for responding to the first user operation, testing the tested radio frequency device based on the testing instrument and acquiring the testing data comprising the testing parameters.

The invention also provides an electronic device, which comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor executes the program to realize the radio frequency test method.

The present invention also provides a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements a radio frequency testing method as described in any of the above.

The invention also provides a computer program product comprising a computer program which, when executed by a processor, implements a radio frequency testing method as described in any one of the above.

According to the radio frequency test method, the radio frequency test device and the electronic equipment, a user can directly select the corresponding test instrument, the tested radio frequency device and the test parameters on the page as required, and then the test is started, so that the effect of automatically performing radio frequency test on the test instrument can be realized, and the test data can be obtained. In addition, a user does not need to repeatedly set a testing instrument and a tested device or manually record testing data, so that the labor time can be saved, and the testing efficiency can be improved.

Drawings

In order to more clearly illustrate the technical solutions of the present invention or the prior art, the drawings needed for the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.

FIG. 1 is a schematic flow chart of a radio frequency test method provided by the present invention;

FIG. 2 is a schematic diagram illustrating an exemplary display effect of the RF testing method according to the present invention;

FIG. 3 is a second schematic diagram illustrating the display effect of the RF testing method according to the present invention;

FIG. 4 is a third schematic diagram illustrating the display effect of the RF testing method according to the present invention;

FIG. 5 is a fourth schematic diagram illustrating the display effect of the RF testing method according to the present invention;

FIG. 6 is a second schematic flow chart of the RF testing method provided by the present invention;

FIG. 7 is a third schematic flow chart of a radio frequency testing method according to the present invention;

FIG. 8 is a schematic diagram of an application scenario of the RF testing method provided in the present invention;

FIG. 9 is a schematic structural diagram of an RF testing apparatus provided in the present invention;

fig. 10 is a schematic structural diagram of an electronic device provided by the present invention.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

The radio frequency test method of the present invention is described below with reference to the drawings. For example, the radio frequency testing method of the present invention may be applied to an electronic device with a display function, such as a Personal Computer (PC), a tablet computer, and the like, which is not limited in this embodiment.

Fig. 1 shows a flow chart of a radio frequency testing method provided by the present invention. As shown in fig. 1, the radio frequency test method may include the steps of:

step 100: and displaying a first page, and determining a test instrument, a tested radio frequency device and test parameters based on the first page.

The test instrument may include a power meter, a spectrometer, and other instruments for performing radio frequency tests. The radio frequency device under test refers to a device in a radio frequency unit, for example, a local oscillator (local oscillator), a mixer, etc. The signal may be mixed to change the frequency band in which the signal is located. The frequency of the signal can be increased through the up-converter, so that a low-frequency signal is converted into a high-frequency signal; the frequency of the signal can be reduced by a down converter, so that a high-frequency signal is converted into a low-frequency signal. Therefore, the tested radio frequency device can also comprise an up converter (hereinafter referred to as up conversion) and a down converter (hereinafter referred to as down conversion).

The test parameters refer to indexes of the radio frequency device to be tested, such as power, stray, gain flatness, local oscillator power, local oscillator leakage and the like of the radio frequency device to be tested.

When the radio frequency device needs to be tested, a user can click and open a first page on the electronic equipment, and a test instrument, a tested radio frequency device and test parameters which need to be tested are selected from the first page. For example, all devices under test, all rf devices under test, and all parameters under test may be displayed in the first page. The user can select the testing instrument and the tested radio frequency device to be tested from the displayed devices, and select the testing parameters to be tested from all the parameters.

Step 200: receiving a first user operation, wherein the first user operation is used for starting a test.

In this embodiment, the first user operation may be an operation of clicking a button. Illustratively, a start button may be further included in the first page, and when the electronic device receives an operation of clicking the start button by a user, the test may be started to be executed. In addition, the electronic device may display a start button on another page, such as the second page, to initiate the test. The first user operation may also be other operations, such as an operation of a user double-clicking a start button, a drag operation of a user, and the like, and the embodiment is not limited thereto.

Step 300: and responding to the first user operation, testing the radio frequency device to be tested based on the testing instrument, and acquiring test data comprising the test parameters.

When receiving the first user operation, the electronic equipment starts to execute a test process, and tests the tested radio frequency device based on the test instrument to obtain test data. Further, the test procedure of the test parameters may be written as a code file in advance. When the electronic equipment receives the first user operation, the code file can be operated in response to the operation, a command is sent to the corresponding testing instrument and the tested radio frequency device, the test is executed, and the test data is recorded.

The acquired test data can be uploaded to a designated position of the server and stored. When the user needs to check the test data, the test data can be displayed so that the user can check and analyze the test data conveniently. Various performance indexes of the tested radio frequency device can be calibrated or the optimal value of the indexes can be determined through the test data.

In this embodiment, the user only needs to determine the test instrument, the tested radio frequency device and the test parameters to be tested on the page, and the electronic device can automatically execute the test process to obtain a plurality of test data. The user does not need to participate in the testing process, namely, the user does not need to set the frequency of the testing instrument and the frequency of the tested radio frequency device for each test, and does not need to set the marking points to record data. For a user, the operation is simpler and more efficient, and the difficulty of radio frequency testing can be reduced.

In an exemplary embodiment, an electronic device may display a first page, and display a device address connected to the electronic device and a device type corresponding to the device address on the first page. The equipment address can comprise an address of a test instrument and an address of a radio frequency device to be tested. And the equipment address also comprises the address of the signal source. A signal source is a device for outputting a reference signal. The type of equipment refers to the type of equipment, for example, the type of equipment may be a test instrument, a signal source, a radio frequency device under test, and the like. In addition, each parameter to be tested, which refers to an index to be tested, such as power, gain flatness (hereinafter referred to as flatness), and the like, may also be displayed in the first page.

The electronic equipment can be connected with the radio frequency equipment through the USB-to-serial port, so that the address of the radio frequency device to be tested in the radio frequency equipment can be obtained. The electronic device may also be connected to the test Instrument via a Virtual Instrument Software Architecture (VISA) to obtain an address of the test Instrument. The VISA may provide a software communication interface for the instrument such that the electronic device controls the instrument through the software communication interface.

After the addresses of the devices are acquired, the addresses can be displayed in a first page. If the number of the test instruments is multiple and the number of the tested radio frequency devices is multiple, the electronic equipment can receive a first operation of a user on the first page, and the first operation can be used for determining the test instruments to be tested in the multiple equipment addresses. And receiving a second operation on the first page, wherein the second operation can be used for determining the radio frequency device to be tested in a plurality of device addresses. And receiving a third operation on the first page, wherein the third operation is used for determining a test parameter in a plurality of parameters to be tested.

For example, as shown in fig. 2, a device address, specifically, an address of a test instrument, an address of a signal source, an address of a local oscillator, an address of an up-conversion, and an address of a down-conversion, may be displayed in a control 201 in a first page 200. Each type of address may be displayed separately to facilitate control of different types of devices. For example, the control 203 displays the address of the test instrument, the control 204 displays the address of the signal source, the control 205 displays the address of the local oscillator, the control 206 displays the address of the up-conversion, and the control 207 displays the address of the down-conversion. The user can select the address of the device to be tested in different controls, such as the signal source, local oscillator, etc. of the test.

For example, the test instruments may be determined via control 203. The operation of the user selecting the test instrument may be a first operation, i.e., an operation in control 203. When a test instrument is to be selected from a plurality of test instruments, the user may click on control 203. When the electronic device receives that the control 203 is clicked, the address list of all connected test instruments is displayed for the user to select. The test instrument is then identified based on the address selected by the user in the address list. For example, when the user selects "USB 0::0x0000::0x1111:: INSTR" in the address list, then the instrument corresponding to the address is the selected test instrument. Similarly, the electronic device may determine a signal source or a radio frequency device under test, such as a local oscillator, an up-conversion, and a down-conversion, through operations on the control 204, the control 205, the control 206, and the control 207. The operation of the user selecting the radio frequency device to be tested (e.g. local oscillation, up-conversion, down-conversion) is a second operation, for example, the operation of clicking the control 205 or the operation of clicking the control 206.

Further, the test instrument and the radio frequency device to be tested can be modified by repeatedly executing the first operation and the second operation. For example, a first operation is performed to select an address as a test instrument, and then a second operation is performed to select another address as a test instrument.

With continued reference to FIG. 2, control 202 may display all of the parameters under test. In the control 202, a test parameter to be tested, such as power, flatness (gain flatness), etc., can be selected. For convenience of distinction, the operation of determining the test parameter in the control 202 is taken as the third operation. Similarly, the control 202 also displays a plurality of parameters to be measured through a plurality of controls respectively. When the electronic device receives an operation (i.e., a third operation) that a user clicks one of the controls 202, the to-be-tested parameter corresponding to the operation may be determined as a test parameter. For example, the electronic device may determine that the test parameter is power when it receives a click on control 208 of controls 202.

After the user has determined the various devices to be involved in the test and the test parameters, the test may be initiated through control 209. The control 209 may be an activation button, and when the electronic device receives that the control 209 is clicked, the electronic device may execute a test based on the above-mentioned user-selected devices, and obtain test data.

In an exemplary embodiment, the first page may further include a trigger button, and the device address is updated when a fourth operation of clicking the trigger button is received. Specifically, as shown in fig. 3, when the user clicks the trigger button 301 in the first page 300, the electronic device may retrieve the address of the connected device from the VISA library, so as to update the address on the page, avoid the error of the displayed device address in the case of device change, and ensure the timeliness of the device address.

In addition, the test instrument and the radio frequency device to be tested can be determined in other manners, for example, a plurality of input controls can be displayed in the first page, and the user can directly input the address of the test instrument and the address of the radio frequency device to be tested in the input controls.

In an exemplary embodiment, after the test instrument, the radio frequency device under test and the test parameters are determined, the test instrument or the radio frequency device under test can be configured, so that the test process is more flexible and various test requirements are met. For example, configuring the frequency range of the test instrument, configuring the frequency range of the radio frequency device under test, and so on.

Illustratively, the configuration of the test instrument and the radio frequency device to be tested can also be realized through the first page. Specifically, the first page may display configuration parameters required to be configured by each device, and the actual configuration parameters of each device may be determined through the operation of the user in the first page. The configuration parameter refers to a parameter of the device during operation, and may specifically include a frequency range of the device, a frequency step size and a bandwidth of each change, and may also include a frequency sweep bandwidth, a frequency sweep step, a scanning time, and the like.

When the electronic device receives a first input operation for the test instrument, the configuration parameters of the test instrument can be determined according to the first input operation. For convenience of description, the configuration parameter of the test instrument is taken as a first configuration parameter, and the configuration parameter of the radio frequency device under test is taken as a second configuration parameter. The first input operation refers to an operation of inputting a first configuration parameter, such as inputting a frequency range of the test instrument in an input box, selecting a frequency range of the test instrument in a list, and the like.

Similarly, when the electronic device receives a second input operation for the rf device under test, the electronic device may determine a second configuration parameter of the rf device under test according to the second input operation. After receiving the first configuration parameter and the second configuration parameter, the electronic device may configure the first configuration parameter to the test instrument and configure the second configuration parameter to the radio frequency device under test. Specifically, a first instruction is sent to the test instrument, and a first configuration parameter is configured to the test instrument through the first instruction; and sending a second instruction to the tested radio frequency device, and configuring the second configuration parameters to the tested radio frequency device through the second instruction. For example, the Commands may be sent to the test equipment or the rf device under test through a Programmable instrument Standard Command (SCPI). The first configuration parameter may be generated into a first instruction based on the SCPI, and then the first instruction is sent, and after receiving the first instruction, the test instrument may execute the first instruction, so as to set the value of the corresponding parameter to be the same as the first configuration parameter. Similarly, the second configuration parameter is generated into a second instruction and sent, so that the tested radio frequency device can load the corresponding second configuration parameter.

Illustratively, the first input operation and the second input operation may be received based on the first page. As shown in fig. 4, a control 401 and a control 402 may be included in the first page 400. Controls 401 include a number of configuration parameters for the test instrument, such as a start frequency, a cutoff frequency, a frequency step, a bandwidth, a scan time, an intermediate frequency filter (RBW), a video filter (VBW), etc. that are input to the test instrument. The configuration parameters of the test instrument may further include a reference level, a reference level range, and the like, which is not limited in this embodiment. The user may configure the parameter value of each configuration parameter on the page, and when the electronic device receives a first input operation to the control 401, the electronic device may obtain the parameter value configured by the user according to the operation, as the first configuration parameter. A plurality of configuration parameters of the rf device under test, such as a start frequency, a cut-off frequency, a frequency step, etc., may be displayed in the control 402. The electronic device may receive a second input operation from the user via control 402 to determine a second configuration parameter determined by the user.

In an exemplary embodiment, the first page 400 may also display a plurality of configuration parameters of the signal source, such as a start frequency, a cutoff frequency, a frequency step, a power, and the like of the signal source. And when receiving the operation of the user, determining the parameter values of the configuration parameters of the signal source according to the operation. And, by adding a setting control, such as control 403, in the first page, the configuration parameters can be set quickly. For example, when control 403 is clicked on rf device under test 402, the configuration parameters of the rf device under test may be set to the same configuration parameters as the test instrument.

In addition, other various controls may be displayed in the first page, and are used to implement different functions, for example, a control for setting a maximum value and a minimum value of the flatness, a control for setting a flatness step, and the like, which is not limited to this embodiment.

In other embodiments, the configuration parameters of the test apparatus and the rf device under test may be determined in other manners, such as determining the parameter values of the configuration parameters of each device in advance, determining reference parameter values for some configuration parameters, randomly determining the parameter values of the configuration parameters from the reference parameter values, and so on.

Further, after determining each device and test parameter required for the test, when receiving an operation (i.e., a first user operation) to start the test, the electronic device may automatically test the tested radio frequency device to obtain test data. The test data may be stored in a specific file. Specifically, a storage path of the file is predetermined, and after the test data is obtained, the test data is written into the storage path for storage. And the file under the storage path, namely the test data, can be sent to other equipment, so that the availability of the test data is enhanced.

For example, the test data may also be stored in a target file designated by the user, so that the user can conveniently view and share the test data. Specifically, the electronic device may receive an operation of setting the target file by the user, and the operation may be a second user operation. In response to the second user operation, the test data may be stored in a target file set by the user.

Illustratively, as shown in fig. 5, a control 501 may be displayed in the first page, and the control 501 may be used to set a storage path of the test data, i.e., a target file. When the electronic device receives a second user operation on the control 501 by the user, for example, an operation of clicking the control 501 to select the storage path may be performed to acquire the storage path set by the user. In the testing process, the target file can be searched according to the storage path set by the user, so that the recorded test data can be stored in the target file under the storage path. In addition, the electronic device may also display another page, and the control 501 is displayed in the second page, so as to determine a target file or the like specified by the user. For example, when the electronic device receives an operation of starting a test in a first page, the electronic device may display a second page, and display the control 501 in the second page, thereby determining a storage path of a target file of test data.

In this embodiment, when the electronic device tests the radio frequency device to be tested, the test program corresponding to the test parameter may be determined first. The test program may include an executable file or a code file. Upon receiving an operation (first user operation) of the user to start the test, the electronic device may execute the test program. The test program can test a test instrument and a tested radio frequency device when running to obtain test data.

The testing processes corresponding to different testing parameters can be different, and the testing process according to each testing parameter can be encoded in advance to obtain the testing program corresponding to each testing parameter. For example, when the radio frequency device to be tested needs to be tested, the test instrument is a frequency spectrometer, and the test parameter is power, the test process is as shown in fig. 6, which specifically includes:

step 601: and initializing the equipment. Initializing the devices required by the test such as a test instrument, a signal source, a tested radio frequency device and the like. Namely, initializing the frequency spectrograph, the down-conversion and the signal source. If the device initialization is successful, the electronic device may successfully connect to each device. Step 602: setting the central frequency of the spectrometer as an initial frequency, setting bandwidth, scanning time, RBW, VBW, reference level and reference level range. Step 603: the starting frequency and power of the signal source are set. For the sake of distinction, the start frequency of the spectrometer is denoted as F1 and the cut-off frequency is denoted as F2. Step 604: it is determined whether the start frequency F1 is equal to or less than the cutoff frequency F2. If the starting frequency of the spectrometer is less than or equal to the cut-off frequency, execute step 605: the frequency of the signal source is set to the start frequency F1, and the local oscillator is set to the start frequency F1, and the down-conversion is set to the start frequency F1. Step 606: setting the spectrometer as a starting frequency F1, marking a MARK point and acquiring power. Step 607: and recording the acquired power into a file. According to the storage path specified by the user, the read power can be written into the file in the storage path. Step 608: update start frequency, start frequency F1= start frequency F1+ frequency steps. Then, in step 604, the power at a plurality of different frequencies is recorded in a loop. Until it is determined in step 604 that the start frequency F1 is not less than or equal to the cutoff frequency F2, the test is completed, and the file in the storage path is taken as test data. The test data can be uploaded to the server and can be shared with other electronic equipment, so that a user can analyze the tested radio frequency device conveniently and know the test result of the tested radio frequency device.

The above-mentioned test procedure, i.e. steps 601 to 608, may be written as a code file in advance, to obtain a test program of power under the condition that the test instrument is a spectrometer and the radio frequency device to be tested is down-converted. The electronic equipment can execute the test program, so that the power index of the tested radio frequency device is tested according to the steps, the test error caused by manual misoperation can be reduced, and the measurement precision can be improved. In addition, the method and the device can avoid complex test operation of a user, save labor time and improve test efficiency.

The following describes the testing process of the tested rf device by taking the testing flatness as an example. The down-conversion of the tested radio frequency device and the testing instrument are still taken as examples. As shown in fig. 7, the test procedure includes the following:

step 701: and initializing the equipment. Step 702: setting the center frequency of the spectrometer as a starting frequency (F1), setting bandwidth, scanning time, RBW, VBW, reference level and reference level range. Step 703: the starting frequency and power of the signal source are set. Step 704: it is determined whether the start frequency F1 is equal to or less than the cutoff frequency F2. Step 705: the frequency of the signal source is set to the start frequency F1, and the local oscillator is set to the start frequency F1, and the down-conversion is set to the start frequency F1. Step 706: it is determined whether an initial value of the flatness is equal to or less than a maximum value. The initial value may be a minimum value or a random value. The minimum and maximum values of the flatness may be set by a user, for example, the user may input the minimum and maximum values in the display page. The minimum and maximum values may also be preset values. If the initial value is less than or equal to the maximum value, go to step 707: and acquiring an equilibrium value sent by down-conversion. Step 708: setting a frequency spectrograph to be a starting frequency F1, and marking a MARK point maximum value reading power P1; and MARKs the MARK point minimum read power P2. Step 709: and acquiring a test value, and recording the test value, the equilibrium value and the current frequency value. The recorded results may be stored in a target file. Where the test value is the power at the maximum of MARK, P1, minus the power at the minimum, P2, P1-P2. Then, step 710: the initial value of the flatness is updated, and the updated initial value is the sum of the initial value before updating and the step, that is, the initial value = initial value + step. Then, in step 706, the test value is measured within the range of the minimum value and the maximum value of the flatness, and the test results of different frequencies and flatness are obtained. In step 706, if it is determined that the initial value of the flatness is not equal to or less than the maximum value, step 711 is performed: the initial value is set to a minimum value. Then, step 712: the start frequency F1 is updated. The updated start frequency F1 is the start frequency F1 plus the frequency step before updating. The above steps 704 to 710 are executed again based on the updated start frequency F1 until the updated start frequency F1 is not less than or equal to the cut-off frequency F2, and the test is completed. After the test is finished, the user can check flatness transformation conditions recorded in the file under different frequencies and different equilibrium values, and the optimal flatness of the tested radio frequency device can be determined.

The above-mentioned testing process, i.e. steps 701 to 712, may be pre-programmed into codes to obtain a testing program of flatness under the condition that the testing instrument is a spectrometer and the tested radio frequency device is down-converted.

Similarly, under the condition that the test instrument is a power meter or other instruments and the tested radio frequency device is a local oscillator, down-conversion equipment and the like, other test parameters, such as local oscillator power and a test program of local oscillator leakage, can be determined. The electronic device executes the corresponding test program to obtain the test data of the test parameters. By checking and analyzing the test data, the user can determine various indexes of the tested radio frequency device, so that various parameter indexes of the tested radio frequency device are calibrated, and the accuracy of index measurement is improved.

Fig. 8 shows an application scenario of the present invention. As shown in fig. 8, the electronic device 801 may include a test software 802. The testing software 802 is a software program for executing the above-mentioned radio frequency testing method of the present invention. The electronic device 801 is a Personal Computer (PC), server, or other device having a display function.

The electronic device 801 may connect to the signal source 803 via a VISA interface to send commands to the signal source 803 and to receive data output by the signal source 803. For example, the electronic device 801 may send a command to set the power of the signal output by the signal source 803.

The signal output by the signal source 803 can be received by the rf device under test 804. The rf device 804 can modulate the received signal and transmit the modulated signal. In order to ensure various performance indexes of the radio frequency device 804 to be tested, the electronic device 801 may be connected to the radio frequency device 804 to be tested through the USB to serial port, so as to send a command to the radio frequency device 804 to be tested, or receive data sent by the radio frequency device 804 to be tested. For example, the electronic device 801 may send commands to set various configuration parameters of the frequency range, frequency step, RBW, VBW, reference level range, etc. of the rf device under test 804. For another example, the electronic device 801 may receive data such as a frequency value, a power value, and an equalization value sent by the radio frequency device 804 to be tested.

The test instrument 805 may be a spectrometer, a power meter, or other equipment for radio frequency testing, which is not limited in this embodiment. The testing instrument 805 may perform tests on various indicators of the rf device 804 under test, such as testing the power, flatness, local oscillator power, and so on of the rf device under test. The electronic device 801 may be connected to the test instrument 804 via VISA to control the test instrument 805. For example, the electronic device 801 may send a command to the test equipment 805 to set configuration parameters such as frequency range and frequency step of the test equipment, and the electronic device 801 may receive a power value obtained by the test equipment. The test data that the electronic device 801 can receive is stored in a specific file directory so that the user can view the test data at any time when the user needs to view the test data.

In this embodiment, various indexes of the tested radio frequency device can be automatically tested by the electronic device, so that calibration of multiple indexes is realized. And when the test is needed, a user can set a required test instrument, a tested radio frequency device or test parameters on the display interface of the electronic equipment, the operability is high, the operation is simple, and the test efficiency can be improved.

Furthermore, the invention also provides a radio frequency testing device which can be used for executing the radio frequency testing method. The following describes the radio frequency testing apparatus provided by the present invention, and the radio frequency testing apparatus described below and the radio frequency testing method described above may be referred to correspondingly.

As shown in fig. 9, the rf testing apparatus 900 of the present invention may include a display module 910, a receiving module 920, and a response module 930. Specifically, the display module 910 may be configured to display a first page, and determine a test instrument, a radio frequency device under test, and test parameters based on the first page; the receiving module 920 may be configured to receive a first user operation, where the first user operation is to start a test; the response module 930 may be configured to, in response to the first user operation, perform a test on the rf device under test based on the test instrument, and obtain test data including the test parameters.

In an embodiment of the present invention, the radio frequency testing apparatus 900 further includes: the first operation module is used for receiving a first input operation of a user, and the first input operation is used for determining a first configuration parameter of the test instrument; a first instruction sending module, configured to send a first instruction to the test instrument in response to the first input operation, where the first instruction is used to configure the first configuration parameter to the test instrument; the second operation module is used for receiving a second input operation of a user, and the second input operation is used for determining a second configuration parameter of the radio frequency device to be tested; and the second instruction sending module is used for responding to the second input operation and sending a second instruction to the tested radio frequency device, wherein the second instruction is used for configuring the second configuration parameter to the tested radio frequency device.

In an embodiment of the present invention, the test parameter includes at least one of power, gain flatness, local oscillator leakage, local oscillator power, and spurious.

In an embodiment of the present invention, the response module may specifically include: the program determining module is used for determining a test program corresponding to the test parameters; and the test module is used for responding to the first user operation, running a test program corresponding to the test parameters, and the test program is used for testing based on the test instrument and the tested radio frequency device and obtaining test data.

In an embodiment of the present invention, the display module may specifically include: the page display module is used for displaying the first page, and displaying an equipment address connected to the first page and a plurality of parameters to be tested on the first page; the test instrument determining module is used for receiving a first operation on the first page, and the first operation is used for determining a test instrument to be tested in the equipment address; the tested instrument determining module is used for receiving a second operation on the first page, and the second operation is used for determining a tested radio frequency device to be tested in the equipment address; and the test parameter determining module is used for receiving a third operation on the first page, and the third operation is used for determining a test parameter in the to-be-tested parameters.

In an embodiment of the present invention, the radio frequency testing apparatus 900 may further include: the file determining module is used for receiving a second user operation, and the second user operation is used for determining a target file; and the data storage module is used for responding to the second user operation and storing the test data in the target file.

Each functional module of the radio frequency testing apparatus in the exemplary embodiment of the present invention corresponds to the steps of the exemplary embodiment of the radio frequency testing method, and therefore, for details that are not disclosed in the embodiment of the apparatus of the present invention, refer to the above-mentioned embodiment of the radio frequency testing method.

Fig. 10 illustrates a physical structure diagram of an electronic device, and as shown in fig. 10, the electronic device may include: a processor (processor)1010, a communication Interface (Communications Interface)1020, a memory (memory)1030, and a communication bus 1040, wherein the processor 1010, the communication Interface 1020, and the memory 1030 communicate with each other via the communication bus 1040. Processor 1010 may invoke logic instructions in memory 1030 to perform a radio frequency test method comprising: displaying a first page, and determining a test instrument, a tested radio frequency device and test parameters based on the first page; receiving a first user operation, wherein the first user operation is used for starting a test; and responding to the first user operation, testing the radio frequency device to be tested based on the testing instrument, and acquiring test data comprising the test parameters.

Furthermore, the logic instructions in the memory 1030 can be implemented in software functional units and stored in a computer readable storage medium when the logic instructions are sold or used as independent products. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.

In another aspect, the present invention also provides a computer program product, the computer program product comprising a computer program, the computer program being stored on a non-transitory computer-readable storage medium, wherein when the computer program is executed by a processor, the computer is capable of executing the radio frequency testing method provided by the above methods, and the method comprises: displaying a first page, and determining a test instrument, a tested radio frequency device and test parameters based on the first page; receiving a first user operation, wherein the first user operation is used for starting a test; and responding to the first user operation, testing the radio frequency device to be tested based on the testing instrument, and acquiring test data comprising the test parameters.

In yet another aspect, the present invention also provides a computer-readable storage medium, on which a computer program is stored, the computer program being implemented by a processor to perform the radio frequency testing method provided by the above methods, the method comprising: displaying a first page, and determining a test instrument, a tested radio frequency device and test parameters based on the first page; receiving a first user operation, wherein the first user operation is used for starting a test; and responding to the first user operation, testing the radio frequency device to be tested based on the testing instrument, and acquiring test data comprising the test parameters.

The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.

Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.

Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.

Claims

1. A radio frequency testing method, comprising:

2. The radio frequency test method according to claim 1, wherein after determining the test instrument, the radio frequency device under test and the test parameters based on the first page, further comprising:

3. The radio frequency test method according to claim 1, wherein the test parameters include at least one of power, gain flatness, local oscillator leakage, local oscillator power, and spurs.

4. The radio frequency test method according to claim 1, wherein the obtaining test data including the test parameters based on the test instrument testing the radio frequency device under test in response to the first user operation comprises:

determining a test program corresponding to the test parameters;

5. The radio frequency test method according to claim 1, wherein the displaying a first page, and determining a test instrument, a radio frequency device under test, and test parameters based on the first page comprises:

displaying the first page, wherein the first page is displayed with an equipment address connected to and a plurality of parameters to be tested;

6. The radio frequency test method of claim 1, further comprising:

7. A radio frequency testing apparatus, comprising:

8. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the radio frequency testing method of any one of claims 1 to 6 when executing the program.

9. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the radio frequency testing method according to any one of claims 1 to 6.

10. A computer program product comprising a computer program, characterized in that the computer program, when being executed by a processor, implements the radio frequency testing method according to any of claims 1 to 6.