CN114544010B - Device and method for measuring ultra-short laser pulse width at focal spot - Google Patents
Device and method for measuring ultra-short laser pulse width at focal spot Download PDFInfo
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Abstract
A method for measuring the pulse width of ultrashort laser at focal spot includes such steps as sequentially arranging an iris diaphragm, rotary gradually-changed attenuation reflecting mirror, the second reflecting mirror, focusing by off-axis mirror, and generating laser filamentization from focal point when the power density at focal point exceeds a fixed threshold value. The laser can be locked into a filiform state by the measurement data of the imaging camera; meanwhile, fluorescence generated by laser filament forming is collected through a lens and enters a spectrometer, and the state of the laser filament forming can be locked through measurement data of the spectrometer. Because the aperture of the light beam, the size of the focal spot, the threshold power density of the laser for generating laser filament, etc. are all known, the measured ultra-short laser pulse width is directly proportional to the input threshold energy for generating laser filament, and after strict calibration, the pulse width is equal to the input threshold energy for generating laser filament multiplied by the calibration coefficient. The pulse width measuring method is different from the traditional measuring method, and can easily measure the pulse width at the target point in the targeting.
Description
Technical Field
The invention relates to an ultra-short laser pulse width measurement method, which comprises femtosecond laser pulse width measurement, picosecond laser pulse width measurement and shorter laser pulse width measurement.
Background
The compressed laser pulse width of final physical targeting in the ultra-short laser device is a very important technical index, and determines the real-time power and physical experiment effect when the laser pulse interacts with substances. The shorter the ultrashort laser pulse width, the more accurate the measured laser pulse width is required.
The current methods for measuring the femtosecond and picosecond laser pulse width mainly include an autocorrelation method (for example, patent document: CN108760058B, CN107884079A, CN 207487831U), a frequency resolution optical switching method FROG (Frequency resolved optical grating) and a self-reference spectrum phase coherent electric field reconstruction method SPIDER (self-referencing spectral phase interferometry for direct electric field reconstruction), which are all based on a second-order or third-order process of a nonlinear crystal, and since a measured signal cannot generate a saturated second-order or third-order signal in the nonlinear crystal, that is, the second-order or third-order process is actually in a nonlinear amplification region under a small signal condition, the measured second-order signal or third-order signal is greatly affected by the measured laser pulse intensity, the measured signal intensity may only have 1% -5% of energy fluctuation, but the second-order signal or third-order signal generated thereby may be 5 times, 10 times, or even more different. That is why on-line pulse width measurements sometimes have measurement data and sometimes have no measurement data in the same energy targeting situation (energy fluctuation within 5%) in large high power ultrashort laser pulse devices. It can be seen that in a large-scale high-power ultrashort pulse laser device, the single measurement of the ultrashort laser pulse width by the above method is defective, and it is difficult to guarantee that data can be measured each time in principle.
Second, even if data can be measured, the resulting second and third order signals vary widely, which can result in large errors in the measurement results.
Finally, the current second-order or third-order measurement method is actually a near-field measurement method, that is, the measured laser pulse width is the pulse width of the near field, and the actual requirement is the laser pulse width at the target point, that is, the far field, which is also a defect that is difficult to overcome by the current ultrashort pulse width measurement method.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provide an ultrashort pulse width measuring method (comprising picoseconds, femtoseconds and shorter pulses) at a focal spot, wherein the method is based on the filamentization phenomenon of ultrashort laser at a target point, directly and reversely deduces the pulse width at the target point, and the pulse width at the target point in the targeting process can be easily measured by adopting the ultrashort pulse width measuring method which is different from the traditional ultrashort pulse width measuring method based on autocorrelation and cross correlation, and meanwhile, the method is very simple, and the complex ultrashort pulse width measuring method is as simple as imaging measuring energy.
The technical scheme of the invention is as follows:
an ultrashort pulse width measuring device at a focal spot comprises an iris diaphragm, a rotary gradual attenuation reflecting mirror, a second reflecting mirror, an off-axis focusing mirror, a diffuse reflecting plate, an imaging camera, a focusing lens, a spectrometer, an energy meter and a computer.
The iris diaphragm is sequentially arranged along the light path and can change the caliber of an incident light beam; then enters a rotary gradual attenuation reflecting mirror, and the reflecting mirror can realize continuous attenuation of incident energy through rotation; and then the incident laser is focused after being incident to the off-axis mirror through the second reflecting mirror, when the power density at the focus reaches a fixed threshold value, the laser wire forming phenomenon is generated from the focus, and finally the wire formed laser is scattered through a diffuse reflecting plate. The laser can be locked into a filiform state by the measurement data of the imaging camera; meanwhile, fluorescence generated by laser filament forming is collected through a lens and enters a spectrometer, and the state of the laser filament forming can be locked through measurement data of the spectrometer. Because the aperture of the light beam, the size of the focal spot, the threshold power density of the laser for generating laser filament, etc. are all known, the measured ultra-short laser pulse width is directly proportional to the input threshold energy for generating laser filament, and after strict calibration, the pulse width is equal to the input threshold energy for generating laser filament multiplied by the calibration coefficient.
A method for measuring ultra-short pulse width at a focal spot, comprising the steps of:
step 1: calibrating the size(s) of a focal spot and the ratio of energy in the focal spot to total energy (namely, the concentration of energy in the focal spot: eta) generated by a measuring device under the condition of different beam calibers by adopting laser pulses with known parameters;
step 2: laser threshold power density (P) for laser filamentation in a measurement environment calibrated by laser pulses of known parameters threshold )；
Step 3: when laser filament is produced by using a laser pulse calibration measuring device with known parameters, the state of the laser filament is locked by the measurement data of an imaging camera (6) and a spectrometer (9), and the laser filament state corresponds to the laser threshold power density (P) of the laser filament threshold )；
Step 4: when the unknown laser pulse width is measured on line, the energy entering the measuring device is changed by rotating the gradual attenuation reflecting mirror (2), and when the laser wire forming phenomenon occurs, the input energy at the moment is the threshold energy (E threshold ) Let k=η/sP threshold (as a calibration constant) so that the measured laser pulse width can be obtained as: t=ηe threshold /(sP threshold )＝(η/sP threshold )E threshold ＝kE threshold I.e. the measured laser pulse width is proportional to the input threshold energy at which the laser filamentation is produced.
The iris diaphragm can change the caliber of an incident light beam.
The rotating graded attenuation mirror can continuously attenuate the energy of incident light.
The measurement data of the imaging camera may lock the laser into a filiform state.
The energy meter may record the energy input.
The measurement data of the spectrometer can also lock the state of the laser filamentization.
The invention has the technical effects that:
1) The femtosecond laser pulse width can be measured, the picosecond laser pulse width can be measured, and the shorter laser pulse width can be measured;
2) The measuring method is different from the traditional autocorrelation method, the Frog method and the Spider method based on the second-order or third-order effect of the nonlinear crystal, small fluctuation (1% -5%) of the energy of the measured signal cannot influence the measuring result, and meanwhile, the signal can be collected every time;
3) The measuring method is simple, and the laser pulse width is positively correlated with the input threshold energy of the measuring signal, so that the complex ultrashort pulse width measurement is converted into similar energy measurement;
4) The measurement method directly measures the ultra-short pulse width at the focus, is the most accurate measurement, and the traditional method based on the second-order or third-order effect of the nonlinear crystal, the Frog method and the Spider method are all near-field measurement results and are not pulse widths at the focus after focusing;
drawings
FIG. 1 is a schematic diagram of the structure of example 1 of the present invention.
In the figure: 1-an iris; 2-rotating a graded attenuation mirror; 3-a second mirror; 4-off-axis mirror; 5-diffuse reflection plate; 6-an imaging camera; 7-energy meter; 8-lens; 9-spectrometer; 10-computer.
Detailed Description
The invention is further illustrated in the following examples and figures, which should not be taken to limit the scope of the invention.
When the measured pulse is an ultrashort femtosecond laser pulse with the magnitude of femtosecond (5 fs-0.5 ps), referring to fig. 1, fig. 1 is a schematic diagram of an embodiment 1 of the present invention, which is used for realizing the accurate measurement and analysis requirements of the femtosecond laser pulse width between 5fs-0.5 ps. The measured pulse firstly passes through an iris diaphragm, and the aperture of an incident light beam can be changed by the iris diaphragm, so that the size of a focal spot can be changed; then entering a rotary gradual attenuation reflecting mirror, wherein the rotary gradual attenuation reflecting mirror can realize continuous attenuation of incident energy through rotation; and then the incident laser is focused after being incident to the off-axis mirror through the second reflecting mirror, when the power density at the focus reaches a fixed threshold value, the laser wire forming phenomenon is generated from the focus, and finally the wire formed laser is scattered through a diffuse reflecting plate. The scattered signal may be measured by an imaging camera, and the laser may be locked into a filiform state by measurement data of the imaging camera; meanwhile, fluorescence generated by laser filament forming is collected through a lens and enters a spectrometer, and the state of the laser filament forming can be locked through measurement data of the spectrometer. Because the aperture of the light beam, the size of the focal spot, the threshold power density of the laser for generating laser filament, etc. are all known, the measured ultra-short laser pulse width is directly proportional to the input threshold energy for generating laser filament, and after strict calibration, the pulse width is equal to the input threshold energy for generating laser filament multiplied by the calibration coefficient.
In this embodiment, the laser pulse parameters using known parameters in calibration are as follows: t=30fs, center wavelength λ=808 nm, beam aperture d=Φ20mm, output maximum energy E max =130 mJ, repetition frequency 1Hz. In the ultra-short laser pulse width measuring device, the iris diaphragm is continuously adjustable by 0-phi 20mm, the gradual attenuation reflecting mirror can continuously attenuate and adjust 0-100% of input energy, and the off-axis parabolic mirror f=200mm.
The method for measuring the ultra-short pulse width at the focal spot comprises the following specific operation steps:
step 1: calibrating the size(s) of a focal spot and the ratio of energy in the focal spot to total energy (namely, the concentration of energy in the focal spot: eta) generated by a measuring device under the condition of different beam calibers by adopting laser pulses with known parameters;
off-axis parabolic mirror f=200mm, when beam caliber takes d=Φ20mm, the theoretical diffraction limit focal spot diameter is: 2 r=2.44 λf/d=2.44×0.808× (200/20) =19.7 (μm), the actual nominal focal spot size η=60% of the energy is concentrated within the 3 x diffraction limited focal spot, i.e. the actual focal spot size is: s=pi× (3×19.7/2×10) -4 ) 2 ＝2.74×10 -5 (cm 2 )。
Step 2: laser threshold power density (P) for laser filamentation in a measurement environment calibrated by laser pulses of known parameters threshold )；
Knowing the pulse width t=30fs, when E threshold The power density in the actual focal spot is the threshold power density (P threshold )：
P threshold ＝ηE/(st)＝0.6×0.15×10 -3 /(2.74×10 -5 ×30×10 -15 )＝1.1×10 14 (W/cm 2 )
For the experimental environment in this embodiment, when the power density of the laser reaches the threshold value P threshold ＝1.1×10 14 W/cm 2 When laser filamentation occurs, this threshold is fixed.
Step 3: when laser filament is produced by using a laser pulse calibration measuring device with known parameters, the state of the laser filament is locked by the measurement data of an imaging camera (6) and a spectrometer (9), and the laser filament state corresponds to the laser threshold power density (P) of the laser filament threshold )；
When the laser filamentation phenomenon in the step 2 occurs, the imaging camera and the spectrometer record the filamentation phenomenon at the same time and lock the laser into a filamentation state.
Step 4: when the unknown laser pulse width is measured on line, the energy entering the measuring device is changed by rotating the gradual attenuation reflecting mirror (2), and when the laser wire forming phenomenon occurs, the input energy at the moment is the threshold energy (E threshold ) Let k=η/sP threshold (as a calibration constant) so that the measured laser pulse width can be obtained as: t=ηe threshold /(sP threshold )＝(η/sP threshold )E threshold ＝kE threshold I.e. the measured laser pulse width is proportional to the input threshold energy at which the laser filamentation is produced.
It can be known from the calibration result of step 2 that when t=30fs, E threshold When the ratio is=0.15 mJ, the laser wire forming phenomenon occurs, and the calibration coefficient k=t/E at the moment threshold ＝30/0.15＝200(fs/mJ)。
Therefore, when the calibrated ultra-short pulse width measuring device at the focal spot is used for measuring the unknown ultra-short laser pulse width, the input energy entering the measuring device is regulated in the experiment, and when the input energy E is threshold When=0.4 mJ, the condition of laser filament formation is reached, and laser filament formation is generated, thenThe width of the measuring pulse is as follows:
t testing ＝kE threshold ＝200×0.4＝80(fs)
The results are consistent with pulse width values measured using other methods.
In this laser pulse width measurement, the width of the final laser pulse is proportional to the input threshold energy, thereby making the complex ultrashort laser pulse width measurement as simple as a simple similar energy measurement.
The aperture of the incident beam can be changed by the iris diaphragm;
the rotary gradual attenuation reflecting mirror can continuously attenuate the energy of incident light;
the measurement data of the imaging camera may lock the laser into a filiform state;
the energy meter can record the input energy;
the measurement data of the spectrometer can also lock the state of the laser wire;
the invention has the technical effects that:
1) The femtosecond laser pulse width can be measured, the picosecond laser pulse width can be measured, and the shorter laser pulse width can be measured;
2) The measuring method is different from the traditional autocorrelation method, the Frog method and the Spider method based on the second-order or third-order effect of the nonlinear crystal, small fluctuation (1% -5%) of the energy of the measured signal cannot influence the measuring result, and meanwhile, the signal can be collected every time;
3) The measuring method is simple, and the laser pulse width is positively correlated with the input threshold energy of the measuring signal, so that the complex ultrashort pulse width measurement is converted into similar energy measurement;
4) The measuring method directly measures the ultra-short pulse width at the focus, is the most accurate measurement, and the traditional method based on the second-order or third-order effect of the nonlinear crystal, the Frog method and the Spider method are all near-field measuring results and are not pulse widths at the focus after focusing.
Claims (4)
1. The ultra-short laser pulse width measuring device at the focal spot is characterized by comprising an iris diaphragm (1), a rotary gradual attenuation reflecting mirror (2), a second reflecting mirror (3), an off-axis parabolic mirror (4), a diffuse reflecting plate (5), an imaging camera (6), an energy meter (7), a lens (8), a spectrometer (9) and a computer (10); the computer (10) is respectively connected with the imaging camera (6), the energy meter (7) and the spectrometer (9);
the iris diaphragm (1) and the rotary gradual change attenuation reflecting mirror (2) are sequentially arranged along the light path, and the energy meter (7) is arranged on the transmission light path of the rotary gradual change attenuation reflecting mirror (2), so that the transmitted light is used as an energy sampling measurement result, and the energy of the incident light can be obtained by back-pushing; the method is characterized in that the second reflecting mirror (3), the off-axis parabolic mirror (4) and the diffuse reflecting plate (5) are sequentially arranged on the reflecting light path of the rotating gradual attenuation reflecting mirror (2), after the incident light is focused by the off-axis parabolic mirror (4), when the power density reaches a threshold value, a filamentation phenomenon is generated at a focus point, after the incident light is reflected by the diffuse reflecting plate (5), the filamentation phenomenon is recorded and locked in state by the imaging camera (6), the lens (8) is placed near the focus point of the off-axis parabolic mirror (4) and used for collecting fluorescence generated by the filamentation, and the filamentation phenomenon is recorded and locked in state by the spectrometer (9) after the lens (8), and the pulse width of the measured ultrashort pulse can be obtained after the laser pulse is processed by the computer (10).
2. The ultrashort pulse width measurement device at a focal spot according to claim 1, wherein the iris (1) is used to change the aperture of the incident beam.
3. The ultrashort pulse width measurement device at the focal spot according to claim 1, wherein the rotating graded attenuation mirror (2) is used for continuously attenuating the energy of the incident light.
4. A method for performing ultra-short laser pulse width measurement at a focal spot of an ultra-short laser pulse width measurement device according to claim 1, characterized in that the method comprises the steps of:
step 1: given a known laser pulse width, the focal spot size s, the ratio of energy in the focal spot to total energy, generated at different beam apertures, is: energy concentration η in the focal spot;
step 2: given a known laser pulse width, a laser threshold power density P is generated at the time of laser filament formation threshold ；
Step 3: when laser filament forming is generated, the state of the laser filament forming is locked by the measurement data of an imaging camera (6) and a spectrometer (9), and the state of the laser filament forming is equal to the laser threshold power density P of the laser filament forming threshold One-to-one correspondence;
step 4: when the unknown laser pulse width is measured on line, the energy entering the measuring device is changed by rotating the gradual attenuation reflecting mirror (2), and when the laser wire forming phenomenon occurs, the input energy is the threshold energy E for generating the laser wire forming threshold Let k=η/sP be the calibration constant threshold The measured laser pulse width is: t=ηe threshold /(sP threshold )＝(η/sP threshold )E threshold ＝kE threshold I.e. the measured laser pulse width is proportional to the input threshold energy at which the laser filamentation is produced.
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| WO2018045898A1 (en) * | 2016-09-08 | 2018-03-15 | 中国科学院物理研究所 | Supercontinuum coherent light source |
| WO2020235441A1 (en) * | 2019-05-22 | 2020-11-26 | ウシオ電機株式会社 | Broadband pulsed light source, spectrometry device, and spectrometry method |
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Patent Citations (6)
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| CN101059639A (en) * | 2007-04-30 | 2007-10-24 | 武汉理工大学 | High non-linear photon crystal optical fiber preparation method |
| JP2009222531A (en) * | 2008-03-14 | 2009-10-01 | Univ Of Tokyo | Light source device for nonlinear spectroscopic measuring system, and nonlinear spectroscopic measuring system and method |
| CN101510572A (en) * | 2009-03-06 | 2009-08-19 | 中国石油大学(北京) | Pulsed laser energy detector, and manufacturing method and application thereof |
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