CN114527307B - 一种带有断簧保护特性的三头测试探针 - Google Patents
一种带有断簧保护特性的三头测试探针 Download PDFInfo
- Publication number
- CN114527307B CN114527307B CN202210129131.4A CN202210129131A CN114527307B CN 114527307 B CN114527307 B CN 114527307B CN 202210129131 A CN202210129131 A CN 202210129131A CN 114527307 B CN114527307 B CN 114527307B
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- China
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- needle
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- test
- test probe
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- 238000012360 testing method Methods 0.000 title claims abstract description 70
- 239000000523 sample Substances 0.000 title claims abstract description 56
- 230000000670 limiting effect Effects 0.000 claims description 12
- 230000006835 compression Effects 0.000 claims description 6
- 238000007906 compression Methods 0.000 claims description 6
- 238000009413 insulation Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 abstract 1
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210129131.4A CN114527307B (zh) | 2022-02-11 | 2022-02-11 | 一种带有断簧保护特性的三头测试探针 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210129131.4A CN114527307B (zh) | 2022-02-11 | 2022-02-11 | 一种带有断簧保护特性的三头测试探针 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN114527307A CN114527307A (zh) | 2022-05-24 |
CN114527307B true CN114527307B (zh) | 2024-03-22 |
Family
ID=81622904
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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CN202210129131.4A Active CN114527307B (zh) | 2022-02-11 | 2022-02-11 | 一种带有断簧保护特性的三头测试探针 |
Country Status (1)
Country | Link |
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CN (1) | CN114527307B (zh) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000039595A1 (en) * | 1998-12-30 | 2000-07-06 | Proteus Corporation | Dual-pin probe for testing circuit boards |
JP2000249721A (ja) * | 1999-03-02 | 2000-09-14 | Sony Corp | プローブカード |
JP2004170360A (ja) * | 2002-11-22 | 2004-06-17 | Kanto Tsusoku Kiki Kk | 積層型プローブ及び接触子 |
CN101846695A (zh) * | 2009-03-24 | 2010-09-29 | 京元电子股份有限公司 | 测试探针及探针座 |
US9590359B1 (en) * | 2015-09-30 | 2017-03-07 | Raytheon Company | Coaxial electrical interconnect |
CN213023363U (zh) * | 2020-06-19 | 2021-04-20 | 江苏海德频率科技有限公司 | 一种用于谐振器生产线的改进型测试装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1889080A2 (en) * | 2005-06-10 | 2008-02-20 | Delaware Capital Formation, Inc. | Electrical contact probe with compliant internal interconnect |
US20100285698A1 (en) * | 2008-01-02 | 2010-11-11 | Hong-Dae Lee | Probe pin composed in one body and the method of making it |
EP2237052A1 (en) * | 2009-03-31 | 2010-10-06 | Capres A/S | Automated multi-point probe manipulation |
US20120098561A1 (en) * | 2010-10-21 | 2012-04-26 | Brymen Technology Corporation | Test probe with dual switching probe tip |
US10634732B2 (en) * | 2017-08-11 | 2020-04-28 | Ut-Battelle, Llc | Electrical meter probe contact verification system |
-
2022
- 2022-02-11 CN CN202210129131.4A patent/CN114527307B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2000039595A1 (en) * | 1998-12-30 | 2000-07-06 | Proteus Corporation | Dual-pin probe for testing circuit boards |
JP2000249721A (ja) * | 1999-03-02 | 2000-09-14 | Sony Corp | プローブカード |
JP2004170360A (ja) * | 2002-11-22 | 2004-06-17 | Kanto Tsusoku Kiki Kk | 積層型プローブ及び接触子 |
CN101846695A (zh) * | 2009-03-24 | 2010-09-29 | 京元电子股份有限公司 | 测试探针及探针座 |
US9590359B1 (en) * | 2015-09-30 | 2017-03-07 | Raytheon Company | Coaxial electrical interconnect |
CN213023363U (zh) * | 2020-06-19 | 2021-04-20 | 江苏海德频率科技有限公司 | 一种用于谐振器生产线的改进型测试装置 |
Also Published As
Publication number | Publication date |
---|---|
CN114527307A (zh) | 2022-05-24 |
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Legal Events
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PB01 | Publication | ||
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SE01 | Entry into force of request for substantive examination | ||
CB02 | Change of applicant information | ||
CB02 | Change of applicant information |
Address after: 714000 No. 18, chongye Second Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province Applicant after: Weinan Muwang Intelligent Technology Co.,Ltd. Address before: 714000 northwest corner of Dongfeng Street and Shiquan Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province Applicant before: WEINAN HI-TECH ZONE WOOD KING TECHNOLOGY Co.,Ltd. |
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TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20240205 Address after: Room 104, Building 8, the Taihu Lake Photon Science Park, No. 198, Jialingjiang Road, High tech Zone, Suzhou City, Jiangsu Province, 215000 Applicant after: Muwangxin (Suzhou) Semiconductor Technology Co.,Ltd. Country or region after: China Address before: 714000 No. 18, chongye Second Road, high tech Industrial Development Zone, Weinan City, Shaanxi Province Applicant before: Weinan Muwang Intelligent Technology Co.,Ltd. Country or region before: China |
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