CN114359074B - Panel detection method and device, electronic equipment and storage medium - Google Patents
Panel detection method and device, electronic equipment and storage medium Download PDFInfo
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Abstract
The embodiment of the invention provides a panel detection method, a device, electronic equipment and a storage medium. The method comprises the following steps: acquiring an image of a panel to be detected; in the image of the panel to be detected, for an electrode pair consisting of a glass electrode and a core electrode of the panel to be detected, performing the following detection steps to determine whether the panel to be detected is qualified, wherein the glass electrode and the core electrode of the electrode pair are bonded: identifying a glass electrode and a core electrode in the electrode pair; determining lateral center positions of the identified glass electrode and core electrode; and determining the lateral offset of particles between the glass electrode and the core electrode in the electrode pair according to the determined lateral center positions of the glass electrode and the core electrode. Compared with the traditional indirect measurement mode, the technical scheme is simpler and easier to operate, and the detection omission risk is lower. Meanwhile, the measurement mode in the technical scheme is not affected by uneven particle distribution, and accuracy of a panel detection result is improved.
Description
Technical Field
The present invention relates to the field of panel detection technology, and more particularly, to a panel detection method, a panel detection apparatus, an electronic device, and a storage medium.
Background
The flexible circuit board On Glass (FOG) technology is a technology in which a flexible circuit board (FPC) is directly bound On a Glass plate, and is widely applied to various display products such as liquid crystal display, electroluminescence technology and the like. The FOG process aims the electrodes of the flexible circuit board at the glass electrodes (lamp) on the glass plate, uses an anisotropic conductive film (Anisotropic Conductive Film, abbreviated as ACF) as a bonding dielectric material, and realizes the connection and conduction between the electrodes on the flexible circuit board and the glass electrodes on the glass plate through high temperature and high pressure for a certain time. Similarly, a Chip On Film (COF) product on a flexible substrate is a chip package product formed by directly packaging a semiconductor chip on a flexible substrate (film) and then bonding an electrode of the flexible substrate to a glass electrode on a glass plate, and the process is similar to FOG. The panel detection technique may be used to detect connection and conduction quality of an electrode such as a flexible circuit board or an electrode of a flexible substrate (either the electrode of the flexible circuit board or the electrode of the flexible substrate may be regarded as a core electrode of the panel) with a glass electrode on a glass plate for judging the quality of the panel according to a certain standard.
Particle indentation is an important detection indicator in the panel binding process. Because the electrode material of the panel is flexible, swelling or warping may occur during the binding process. And each electrode may experience a press-fit offset, resulting in panel failure.
In the prior art, the press-fit offset of the panel electrode is usually measured in an indirect manner to detect whether the core electrode is connected and/or conducted with the glass electrode. The mode is influenced by random particle distribution and the like, so that a certain detection omission risk exists, and the accuracy of a panel detection result is further influenced. Further, the waste of materials and man-hours in the subsequent working section may be increased based on the panel detection result with lower accuracy, and the yield of panel products is reduced.
Disclosure of Invention
The present invention has been made in view of the above-described problems. According to an aspect of the present invention, there is provided a panel detection method, the method comprising:
Acquiring an image of a panel to be detected;
In the image of the panel to be detected, for an electrode pair consisting of a glass electrode and a core electrode of the panel to be detected, performing the following detection steps to determine whether the panel to be detected is qualified, wherein the glass electrode and the core electrode of the electrode pair are bonded:
Identifying a glass electrode and a core electrode in the electrode pair;
determining lateral center positions of the identified glass electrode and core electrode;
and determining the lateral offset of particles between the glass electrode and the core electrode in the electrode pair according to the determined lateral center positions of the glass electrode and the core electrode.
Illustratively, determining the lateral center position of the identified glass electrode and core electrode includes:
Determining an abscissa value of a first point on a longitudinal centerline of the identified one of the glass electrode and the core electrode, and determining an abscissa value of a second point on a longitudinal centerline of the identified other of the glass electrode and the core electrode;
determining a lateral offset of particles between the glass electrode and the core electrode in the electrode pair based on the determined lateral center positions of the glass electrode and the core electrode, comprising:
The difference between the abscissa value of the first point and the abscissa value of the second point is calculated as the lateral offset of the particles.
Illustratively, determining an abscissa value of a first point on a longitudinal centerline of the identified one of the glass electrode and the core electrode comprises:
determining left and right edges of one;
determining a width of one according to the left edge and the right edge of the one;
Determining an abscissa value of a first point on a longitudinal centerline of one according to a position of a left edge or a right edge of the one and a width of the one; and
Determining an abscissa value of a second point on a longitudinal centerline of the other of the identified glass electrode and core electrode, comprising:
determining left and right edges of the other;
Determining the width of the other according to the left edge and the right edge of the other;
an abscissa value of the second point on the longitudinal centerline of the other of the identified glass electrode and core electrode is determined based on the position of the left or right edge of the other and the width of the other.
Illustratively, one of the first and second points is not visible on the corresponding electrode, and the other of the first and second points is visible on the corresponding electrode;
for an electrode corresponding to the invisible point, determining an abscissa value of the invisible point on a longitudinal centerline of the electrode according to a position of a left edge or a right edge of the electrode and a width of the electrode, including:
Determining a straight line where the left edge or the right edge of the electrode is located;
determining a reference point on the determined straight line, wherein the ordinate value of the reference point is equal to the ordinate value of the visible point;
the abscissa value of the invisible point on the longitudinal centerline of the electrode is determined based on the abscissa value of the reference point and the width of the electrode.
Illustratively, the detecting step is performed across all pairs of electrodes of the panel to be detected.
According to another aspect of the present invention, there is provided a panel detection apparatus, the apparatus comprising:
The acquisition module is used for acquiring an image of the panel to be detected;
the detection module is used for carrying out the following detection operation on an electrode pair consisting of a glass electrode and a core electrode of the panel to be detected in the image of the panel to be detected to determine whether the panel to be detected is qualified or not, wherein the glass electrode and the core electrode in the electrode pair are connected:
Identifying a glass electrode and a core electrode in the electrode pair, and correspondingly determining the transverse center positions of the identified glass electrode and core electrode;
and determining the lateral offset of particles between the glass electrode and the core electrode in the electrode pair according to the determined lateral center positions of the glass electrode and the core electrode.
Illustratively, acquiring an image of a panel to be detected includes:
and under the condition that the first light source and the second light source which are oppositely arranged vertically irradiate the panel to be detected at the same time, imaging the panel to be detected to generate an image of the panel to be detected.
Illustratively, wherein the first light source and/or the second light source is a point light source emitting parallel light.
According to still another aspect of the present invention, there is provided an electronic device including an image capturing apparatus, a processor, and a memory, wherein the image capturing apparatus is configured to acquire an image of a panel to be detected, and the memory stores computer program instructions thereon, and the computer program instructions are configured to execute the panel detection method when executed by the processor.
According to still another aspect of the present invention, there is provided a storage medium having stored thereon program instructions for executing the above-described panel detection method when running.
According to the technical scheme, the particle lateral offset can be directly determined according to the distance deviation between the lateral center positions of the two electrodes which are connected, so as to determine whether the panel is qualified. Compared with the traditional indirect measurement mode, the technical scheme is simpler and easier to operate, and the detection omission risk is lower. Meanwhile, the measurement mode in the technical scheme is not affected by uneven particle distribution, and accuracy of a panel detection result is improved. Unqualified materials in the panel can be timely discharged based on accurate panel detection results, waste of materials and working hours brought to subsequent working sections is avoided, and the yield of panel products is improved
The foregoing description is only an overview of the present invention, and is intended to be implemented in accordance with the teachings of the present invention in order that the same may be more clearly understood and to make the same and other objects, features and advantages of the present invention more readily apparent.
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The above and other objects, features and advantages of the present invention will become more apparent from the following more particular description of embodiments of the present invention, as illustrated in the accompanying drawings. The accompanying drawings are included to provide a further understanding of embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate the invention and together with the embodiments of the invention, and not constitute a limitation to the invention. In the drawings, like reference numerals generally refer to like parts or steps.
FIG. 1 shows a schematic flow chart of a panel detection method according to an embodiment of the invention;
Fig. 2 shows a schematic flow chart of the detection steps for an electrode pair of a panel to be detected according to an embodiment of the invention;
FIG. 3 shows a partial schematic view of a panel detection system according to an embodiment of the invention;
FIG. 4 shows a partial schematic view of an image of a panel to be inspected according to an embodiment of the invention;
FIG. 5 shows a simplified schematic of one electrode pair of a panel to be inspected according to an embodiment of the invention;
FIG. 6 shows a simplified schematic diagram of another electrode pair of a panel to be inspected according to an embodiment of the invention;
FIG. 7 shows a schematic diagram of a panel detection device according to an embodiment of the invention;
Fig. 8 shows a schematic diagram of an electronic device according to an embodiment of the invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, exemplary embodiments according to the present invention will be described in detail with reference to the accompanying drawings. It should be apparent that the described embodiments are only some embodiments of the present invention and not all embodiments of the present invention, and it should be understood that the present invention is not limited by the example embodiments described herein. Based on the embodiments of the invention described in the present application, all other embodiments that a person skilled in the art would have without inventive effort shall fall within the scope of the invention.
According to one embodiment of the present invention, a panel detection method is provided. The panel detection method is used for determining whether the panel to be detected is qualified or not by directly determining the offset between the glass electrode and the core electrode of the panel to be detected. A panel detection method 100 according to an embodiment of the present invention is described below with reference to fig. 1 and 2. As shown in fig. 1, the panel detection method 100 includes the following steps.
Step S110, an image of the panel to be detected is acquired.
In a specific embodiment, the panel to be detected may be a panel based on the FOG technology, a panel based on the COF technology, or the like.
The image of the panel to be detected may be an original image directly acquired by the image acquisition device in the panel detection system 300 as shown in fig. 3, or may be an image obtained after preprocessing the original image. The preprocessing operation may include all operations for more clearly performing panel inspection. For example, the preprocessing operation may include a denoising operation such as filtering. The image may contain all or part of the electrodes in the panel to be detected.
Step S120, in the image of the panel to be detected, for the electrode pair composed of the glass electrode and the core electrode of the panel to be detected, detection steps S121 to S123 shown in fig. 2 are performed to determine whether the panel to be detected is acceptable.
It will be appreciated that the panel is typically formed by bonding a core portion comprising the chip circuitry to a glass substrate. The electrode on the glass substrate is called a glass electrode. The electrode of the core portion is called the core electrode. As previously mentioned, the panel to be detected may be a panel based on FOG technology. For this case, the core electrode is a flexible circuit board electrode. The panel to be detected may also be a panel based on COF technology. In this case, the core electrode is an electrode of a flexible substrate in which a semiconductor chip is packaged. On one panel to be inspected, a plurality of glass electrodes and a plurality of core electrodes are generally included. One glass electrode is typically bonded to one core electrode, for example by ACF, whereby the glass electrode and the core electrode correspond one-to-one in the image of the panel to be inspected. The glass electrode and the core electrode corresponding to each other can be considered to constitute one electrode pair.
Fig. 4 shows an image of a panel to be detected in an embodiment according to the invention. The image shown in fig. 4 may be an image of a panel to be detected acquired by the panel detection system 300 shown in fig. 3. The panel image to be detected comprises a plurality of electrode pairs consisting of glass electrodes and core electrodes, wherein 401 is the core electrode of one electrode pair, 402 is the glass electrode of the electrode pair, and 403 and 404 are the core electrode and the glass electrode of the other electrode pair respectively. Since the core electrode and the glass electrode are bonded, the core electrode is covered with the glass electrode in the bonding region, which is not shown in fig. 4.
Referring to fig. 4, the electrode pairs of the glass electrode and the core electrode are arranged laterally. While the widths of the glass electrode and the core electrode in the lateral direction are smaller. Therefore, in embodiments of the present application, lateral offset of the glass electrode and the core electrode is of concern, which has a greater impact on the quality of the panel relative to the longitudinal offset of the glass electrode and the core electrode. In this step S120, the lateral offset between the glass electrode and the core electrode in the electrode pair can be directly detected, and since there are effective ACF particles in the bonding region between the two (it can be understood that the ACF particles actually exert their effect in the bonding region and form particle indentations by bonding the two), the lateral offset between the electrodes in the electrode pair can represent the lateral offset of the ACF particles between the electrodes to some extent. The effective ACF particles can provide good conductivity, so the conductivity of the electrode can be detected from the lateral displacement of the particles.
For one electrode pair, for example, if the lateral offset of particles between the glass electrode and the core electrode in that electrode pair exceeds a certain offset threshold, then the panel quality is considered negatively affected, and the panel to be inspected may be determined to be unacceptable. Conversely, if the lateral offset of particles between the glass electrode and the core electrode in the electrode pair is less than or equal to a particular offset threshold, the panel to be inspected may be determined to be acceptable.
As shown in fig. 2, step S120 may include steps S121 to S123. Step S121 to step S123 are described in detail below.
Step S121, in the image of the panel to be detected, the glass electrode and the core electrode in the electrode pair are identified.
As shown in fig. 4, the gray value of the glass electrode is small in the image, the gray value of the background area outside the electrode is large in the image, and the gray value of the core electrode is centered in the image. The image of the panel to be detected can be divided according to the gray value rule, so that the glass electrode and the core electrode in the electrode pair are identified.
Still alternatively, the glass electrode and the core electrode of the electrode pair may be identified in the image of the panel to be detected in response to an operation by the user. For example, edges of the glass electrode and/or the core electrode may be determined in response to a user-initiated mouse event or keyboard event, thereby identifying the glass electrode and/or the core electrode. For example, the edges of the glass electrode and/or the core electrode may be determined according to the position of the cursor drag in response to an event in which the user drags the cursor on the image with the mouse. Of course, the edge of the glass electrode and/or the core electrode may be determined based on the boundary coordinates of the glass electrode and the core electrode that have been acquired in other operations, thereby identifying the glass electrode and/or the core electrode. Other operations herein may be to detect other indicators of the panel, and the boundary coordinates of the glass electrode and the core electrode need to be used in the detection process, so that the boundary coordinates of the glass electrode and the core electrode are stored, and thus may be used for identifying the glass electrode and/or the core electrode in the present invention.
Step S122, determining the lateral center positions of the identified glass electrode and core electrode.
After the glass electrode and the core electrode are identified through step S122, the positions thereof may be determined, and thus the edges thereof, i.e., the left and right edges of each electrode, may be determined, respectively. The lateral center position refers to the position of the centers of the left and right edges on the electrode. All points in the lateral center position constitute the longitudinal center line of the electrode, which is substantially longitudinally extending. The lateral center position may represent the position of the electrode in the lateral direction.
It is to be understood that in the present application, the recognition order of the glass electrode and the core electrode is not limited to the above-described step S121 and step S122, and may be in any desired order.
And step S123, determining the lateral offset of particles between the glass electrode and the core electrode in the electrode pair according to the determined lateral center positions of the glass electrode and the core electrode.
Illustratively, the lateral center positions of each of the glass electrode and the core electrode in one electrode pair may be obtained from step S122. The lateral offset between the glass electrode and the core electrode can be determined based on the deviation between the lateral center positions of the two. The lateral offset is independent of the width of the two electrodes concerned, but only of the position of the electrodes in the lateral direction. The lateral offset of 0 indicates that the associated two electrodes are aligned in the lateral direction, with the junction area being the largest. The larger the lateral offset, the greater the lateral deflection of the associated two electrodes, and the smaller the joint area may be. Since the bonding region distributes effective ACF particles, the lateral offset between the glass electrode and the core electrode in one electrode pair thus obtained represents to some extent the lateral offset of the particles between the glass electrode and the core electrode in that electrode pair. As previously described, it is possible to determine whether the panel to be inspected is acceptable based on the lateral offset of the particles.
Illustratively, this detection step S120 is performed by traversing all electrode pairs of the panel to be detected. The panel to be detected comprises a plurality of electrode pairs, and the transverse offset of particles between the glass electrode and the core electrode in each electrode pair can be determined one by one until the detection of all the electrode pairs in the whole panel to be detected is completed, so as to determine whether the panel to be detected is qualified. For example, the proportion of electrode pairs with lateral offsets smaller than or equal to the offset threshold value in all electrode pairs can be determined according to the lateral offset of each electrode pair, and when the proportion exceeds the proportion threshold value, the panel to be detected is determined to be qualified. This ratio is, for example, any value between 90% and 100%.
According to the technical scheme, the quality of the panel to be detected is determined according to the particle offset of all the electrode pairs, and the detection result is more accurate.
According to the technical scheme, the particle lateral offset can be directly determined according to the distance deviation between the lateral center positions of the two electrodes which are connected, so as to determine whether the panel is qualified. Compared with the traditional indirect measurement mode, the technical scheme is simpler and easier to operate, and the detection omission risk is lower. Meanwhile, the measurement mode in the technical scheme is not affected by uneven particle distribution, and accuracy of a panel detection result is improved. Unqualified materials in the panel can be timely discharged based on accurate panel detection results, waste of materials and working hours is avoided for subsequent working sections, and the yield of panel products is improved.
For example, in order to clearly image the panel to be detected, an image of the panel to be detected may be captured by an image capturing device such as a camera in the panel detection system, for example, a DIC camera. At the time of photographing, the panel to be detected may be irradiated with one or more light sources to generate an image thereof. Optionally, in the case that the first light source and the second light source which are disposed oppositely vertically irradiate the panel to be detected at the same time, the panel to be detected is imaged to generate an image of the panel to be detected. In this example, the photographed light source includes a first light source and a second light source, and the light emitted by the first light source and the second light source are opposite and simultaneously vertically irradiate the panel to be detected.
Fig. 3 shows a schematic diagram of a portion of a panel detection system 300 according to one embodiment of the invention. As shown, the first light source 310 is disposed opposite the second light source 320. Light emitted by the first light source 310 vertically strikes the panel 330 to be detected from top to bottom, and light emitted by the second light source 320 vertically strikes the panel 330 to be detected from bottom to top through specular reflection. Thereby, the light path for photographing the panel to be detected in the image pickup device is collimated.
In the scheme, the two light sources are utilized to vertically irradiate the panel to be detected at the same time, so that a clearer image of the panel to be detected can be obtained. Particularly, for the technical scheme of the application, since the glass electrode and the core electrode are required to be respectively identified, the glass electrode and the core electrode in the image can be ensured to be shot smoothly and imaged more clearly by adopting the mode of acquiring the image of the panel to be detected. Thereby ensuring the detection quality of the panel to be detected.
Illustratively, the first light source 310 and/or the second light source 320 are point light sources that emit parallel light. Light emitted by the point light source emitting parallel light irradiates the panel to be detected vertically, so that object image double image caused by oblique lighting is avoided, and the accuracy of the image of the panel to be detected is further improved.
Illustratively, the above-described steps S122 and S123 are further described with reference to fig. 5. Fig. 5 shows a simplified diagram of one electrode pair in the panel to be inspected identified by step S121, wherein the upper rectangle represents the core electrode and the lower rectangle represents the glass electrode, according to one embodiment. For the purpose of describing the scheme, the area where the glass electrode is combined with the core electrode is shown, it will be understood by those skilled in the art that in the image of the panel, this portion is shown only as the glass electrode, the core electrode being invisible.
Illustratively, in the image of the panel to be detected, a rectangular coordinate system is established based on a predetermined positioning identifier, such as the upper left corner of the image. The lateral center positions of the glass electrode and the core electrode may be determined based on the rectangular coordinate system. The electrode pair shown in fig. 5 is one of the electrode pairs arranged in the lateral direction, and as shown in fig. 5, the arrangement direction (lateral direction) of the electrode pair may be set to be the direction of the x-axis of the rectangular coordinate system, and the direction (longitudinal direction) perpendicular to the arrangement direction of the electrode pair may be determined to be the direction of the y-axis.
Illustratively, the lateral center positions of the glass electrode and the core electrode may be obtained by a longitudinal centerline of the glass electrode and the core electrode. Specifically, step S122 may include determining an abscissa value of a first point on a longitudinal centerline of one of the identified glass electrode and core electrode to represent a lateral center position of the one; and determining an abscissa value of a second point on a longitudinal centerline of the other of the identified glass electrode and core electrode to represent a lateral center position of the other. It is understood that the above operation may be performed with respect to the glass electrode, or may be performed with respect to the core electrode, which is not limited thereto. Step S123, according to the determined lateral center positions of the glass electrode and the core electrode, determines a lateral offset of particles between the glass electrode and the core electrode in the electrode pair, and may include: the difference between the abscissa value of the first point and the abscissa value of the second point is calculated as the lateral offset of the particles.
As shown in fig. 5, the longitudinal center line b of the glass electrode is a center line extending in the longitudinal direction of the glass electrode, and the longitudinal center line a of the core electrode is a center line extending in the longitudinal direction of the core electrode. In the image of the panel to be inspected, the direction of the longitudinal centre line of the electrode is generally coincident with the direction of the left and right edge lines of the electrode. And the longitudinal centerline of the glass electrode is parallel to the longitudinal centerline of the core electrode.
Illustratively, in the electrode pair shown in fig. 5, a point O is taken on the longitudinal centerline a of the core electrode, and since the lateral distance from the O point to the left edge of the core electrode is equal to the lateral distance from the O point to the right edge of the core electrode, the position of the O point may represent the lateral center position of the core electrode in the electrode pair. Similarly, the position of a point O 1,O1 on the longitudinal centerline b of the glass electrode can represent the lateral center position of the electrode to the glass electrode.
Illustratively, from the rectangular coordinate system established as described above, the abscissa value X O of the point O at the lateral center position of the core electrode in the electrode pair and the abscissa value X O1 of the point O 1 of the glass electrode in the electrode pair shown in fig. 5 can be obtained. The difference X O-XO1 between X O and X O1 was calculated. The difference X O-XO1 may represent the lateral offset between the lateral center positions of the glass electrode and the core electrode in the electrode pair, and to some extent the lateral offset of the particles between the glass electrode and the core electrode in the electrode pair. As previously described, it is possible to determine whether the panel to be inspected is acceptable based on the lateral offset of the particles.
It will be appreciated that the difference in the abscissa values between the O-point and the O 1 point may be either positive or negative, representing the different direction of deflection of the particles in the electrode pair. For example, for the glass electrode and core electrode of the electrode pair shown in FIG. 5, the difference X O-XO1 is negative, representing a negative shift of the core electrode of the electrode pair relative to the glass electrode toward the X-axis. Conversely, if the difference X O-XO1 is positive for the glass electrode and the core electrode of an electrode pair, this represents a positive offset of the core electrode of the electrode pair relative to the glass electrode to the X-axis.
According to the technical scheme, for the identified image of the panel to be detected, the particle lateral offset between the glass electrode and the core electrode in the electrode pair is determined by obtaining the difference value of the abscissa value of one point on the longitudinal center line of the core electrode in each electrode pair and one point on the longitudinal center line of the glass electrode. The lateral offset of the particles between the two electrodes is ultimately converted to a difference in the abscissa between the two points only required. The method is simple, has low operation cost, can intuitively reflect the quality of panel detection, and improves the efficiency of panel detection.
Illustratively, the foregoing determining an abscissa value of a first point on a longitudinal centerline of one of the identified glass electrode and core electrode comprises the steps of: step S1221, determining left and right edges of the one; step S1222, determining the width of the one according to the left edge and the right edge of the one; step S1223, determining an abscissa value of the first point on the longitudinal centerline of the one according to the position of the left edge or the right edge of the one and the width of the one. Similarly, the foregoing determination of the abscissa value of the second point on the longitudinal centerline of the other of the identified glass electrode and core electrode includes: step S1224, determining the left edge and the right edge of the other; step S1225, determining the width of the other according to the left edge and the right edge of the other; step S1226, determining an abscissa value of the second point on the longitudinal centerline of the other of the identified glass electrode and core electrode according to the position of the left edge or the right edge of the other and the width of the other.
Illustratively, referring again to fig. 5, first, a point P on the left edge of the glass electrode may be determined, and then another point Q on the right edge line of the glass electrode may be determined. The width m of the glass electrode can be calculated from the abscissa values of the point P and the point Q, and m= |x p-XQ |. Where X P is the abscissa value of point P and X Q is the abscissa value of point Q. From the abscissa value of point P or point Q and m, the abscissa value of first point O 1, e.g., X O1＝XP +m/2, may be determined. It will be appreciated that in the above scheme, the ordinate of the point P and the point Q may be the same or different.
Similarly, the abscissa value X O of a point O on the longitudinal center line a of the core electrode in the electrode pair shown in fig. 5 can be determined with reference to the above-described method of acquiring a point on the longitudinal center line of the glass electrode.
According to the technical scheme, the edge of the electrode is determined, the width of the electrode is further determined, and finally, the abscissa value of a point on the longitudinal center line of the electrode can be determined by loading simple mathematical operation based on the edge and the width. The method is visual, accurate, simple in flow, high in operability, simpler and more convenient than the traditional panel detection technology, and the detection technology cost is greatly saved.
For example, in the manufacturing process of the panel, there may be a certain difference in the directions of the electrode pairs of the panel to be detected in the coordinate system due to a difference in product requirements or anisotropy in the manufacturing process, and the like. Fig. 6 shows a simplified schematic of another electrode pair in a panel to be inspected. The extending directions of the electrode pairs are not all completely perpendicular to the arrangement direction of the electrode pairs. In order to ensure the accuracy of panel detection, the abscissa values of points with the same ordinate value on the longitudinal center lines of the core electrode and the glass electrode can be respectively obtained, and the particle lateral offset between the glass electrode and the core electrode in the electrode pair can be obtained by calculating the difference value of the abscissa values of the two points. It will be appreciated that in one electrode pair, one of the points on the longitudinal centerline of the glass electrode and the point on the longitudinal centerline of the core electrode taken as described above is visible on the corresponding electrode while the other is not. Referring to fig. 6, point O 2 on the longitudinal centerline of the core electrode is visible on the core electrode, while point O 3 on the longitudinal centerline of the glass electrode is located outside the glass electrode, which is not visible on the glass electrode. It will be appreciated that if point O 5 (not shown) on the longitudinal centerline of the glass electrode is visible on the glass electrode, point O 4 (not shown) on the longitudinal centerline of the core electrode, which is the same longitudinal coordinate value as point O 5, is not visible on the core electrode because the glass electrode obscures the core electrode in the image of the panel to be inspected.
Illustratively, the point O 2(XO2,YO2 on the longitudinal centerline of the core electrode in the electrode pair shown in fig. 6 may be obtained according to the method of obtaining the abscissa value of the point on the longitudinal centerline of the core electrode in the electrode pair shown in fig. 5, as described above.
By way of example and not limitation, for point O 3 on the longitudinal centerline of the glass electrode, determining a point on its longitudinal centerline that is the same as the longitudinal coordinate value of point O 2 based on the position of the left or right edge of the glass electrode and the width m 1 of the electrode may include the following steps. The straight line where the left edge or the right edge of the glass electrode is located is determined. In this embodiment, as shown in fig. 6, a straight line l where the left edge of the glass electrode is located is determined. Taking a point P 1 as a reference point on line l, the ordinate value of this point P 1 is equal to the ordinate value Y O2 of the point O 2. The abscissa value of the invisible point O 3 on the longitudinal centerline of the electrode can be determined from the abscissa value of the reference point P 1 and the width m 1 of the glass electrode. A straight line parallel to the X-axis may be drawn through reference point P 1 and a point O 3 may be determined on the straight line, where the distance between point P 1 and point O 3 is equal to m 1/2 and point O 3 is to the right of P 1, thereby determining the abscissa value X O3 of point O 3.
Further, a difference X O2-XO3 between the abscissa values of the points O 2 and O 3 may be calculated, and the difference X O2-XO3 may represent the lateral offset of particles between the glass electrode and the core electrode in the electrode pair shown in fig. 6.
According to the technical scheme, various forms of the electrode pairs in the panel to be detected are considered, the transverse center position points of the glass electrode and the core electrode in the same ordinate of the electrode pairs are determined, and the transverse offset of particles between the core electrode and the glass electrode is further determined. According to the technical scheme, on the basis of guaranteeing the panel detection quality, the unstable factors of the panel manufacturing process are considered, the applicability is stronger, the panel detection is more reasonable, and the waste of materials is further reduced.
According to another aspect of the present invention, there is also provided a panel detection apparatus. Fig. 7 shows a schematic block diagram of a panel detection device 700 according to an embodiment of the invention. As shown in fig. 7, the apparatus 700 includes an acquisition module 710 and a detection module 720. The acquiring module 710 is configured to acquire an image of a panel to be detected; the detection module 720 is configured to perform, in an image of the panel to be detected, for an electrode pair composed of a glass electrode and a core electrode of the panel to be detected, a detection operation to determine whether the panel to be detected is qualified, where the glass electrode and the core electrode of the electrode pair are bonded: identifying a glass electrode and a core electrode in the electrode pair, and correspondingly determining the transverse center positions of the identified glass electrode and core electrode; and determining the lateral offset of particles between the glass electrode and the core electrode in the electrode pair according to the determined lateral center positions of the glass electrode and the core electrode.
According to still another aspect of the present invention, there is also provided an electronic apparatus. Fig. 8 shows a schematic block diagram of an electronic device 800 according to an embodiment of the invention. As shown in fig. 8, the electronic device 800 includes an image acquisition device 810, a processor 820, and a memory 830. The image capturing device 810 is configured to capture an image of a panel to be detected, and the memory 830 stores computer program instructions that are executed by the processor 820 to perform the panel detection method according to the embodiment of the present invention.
According to still another aspect of the present invention, there is also provided a storage medium on which program instructions are stored, the program instructions being for executing the panel detection method of the embodiment of the present invention when executed. The storage medium may include, for example, a storage component of a tablet computer, a hard disk of a personal computer, read-only memory (ROM), erasable programmable read-only memory (EPROM), portable compact disc read-only memory (CD-ROM), USB memory, or any combination of the foregoing storage media. The computer-readable storage medium may be any combination of one or more computer-readable storage media.
Those skilled in the art will understand the specific implementation schemes of the panel detection apparatus, the electronic device and the storage medium by reading the above description about the panel detection method, and for brevity, the description is omitted here.
Although the illustrative embodiments have been described herein with reference to the accompanying drawings, it is to be understood that the above illustrative embodiments are merely illustrative and are not intended to limit the scope of the present invention thereto. Various changes and modifications may be made therein by one of ordinary skill in the art without departing from the scope and spirit of the invention. All such changes and modifications are intended to be included within the scope of the present invention as set forth in the appended claims.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
In the several embodiments provided by the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described device embodiments are merely illustrative, e.g., the division of the elements is merely a logical functional division, and there may be additional divisions when actually implemented, e.g., multiple elements or components may be combined or integrated into another device, or some features may be omitted or not performed.
In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
Similarly, it should be appreciated that in order to streamline the invention and aid in understanding one or more of the various inventive aspects, various features of the invention are sometimes grouped together in a single embodiment, figure, or description thereof in the description of exemplary embodiments of the invention. However, the method of the present invention should not be construed as reflecting the following intent: i.e., the claimed invention requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this invention.
It will be understood by those skilled in the art that all of the features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or units of any method or apparatus so disclosed, may be combined in any combination, except combinations where the features are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings), may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise.
Furthermore, those skilled in the art will appreciate that while some embodiments described herein include some features but not others included in other embodiments, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the claims, any of the claimed embodiments may be used in any combination.
Various component embodiments of the invention may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. Those skilled in the art will appreciate that some or all of the functions of some of the modules in a panel detection arrangement according to embodiments of the invention may be implemented in practice using a microprocessor or Digital Signal Processor (DSP). The present invention can also be implemented as an apparatus program (e.g., a computer program and a computer program product) for performing a portion or all of the methods described herein. Such a program embodying the present invention may be stored on a computer readable medium, or may have the form of one or more signals. Such signals may be downloaded from an internet website, provided on a carrier signal, or provided in any other form.
It should be noted that the above-mentioned embodiments illustrate rather than limit the invention, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The invention may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The use of the words first, second, third, etc. do not denote any order. These words may be interpreted as names.
The foregoing description is merely illustrative of specific embodiments of the present invention and the scope of the present invention is not limited thereto, and any person skilled in the art can easily think about variations or substitutions within the scope of the present invention. The protection scope of the invention is subject to the protection scope of the claims.
Claims (10)
1. A method of panel inspection, the method comprising:
Acquiring an image of a panel to be detected;
In the image of the panel to be detected, for an electrode pair consisting of a glass electrode and a core electrode of the panel to be detected, performing the following detection steps to determine whether the panel to be detected is qualified, wherein the glass electrode and the core electrode of the electrode pair are bonded:
identifying a glass electrode and a core electrode of the electrode pair;
determining lateral center positions of the identified glass electrode and core electrode;
And determining the lateral offset of particles between the glass electrode and the core electrode in the electrode pair according to the determined lateral center positions of the glass electrode and the core electrode.
2. The method of claim 1, wherein,
The determining the lateral center position of the identified glass electrode and core electrode comprises:
Determining an abscissa value of a first point on a longitudinal centerline of the identified one of the glass electrode and the core electrode, and determining an abscissa value of a second point on a longitudinal centerline of the identified other of the glass electrode and the core electrode;
the step of determining the lateral offset of particles between the glass electrode and the core electrode in the electrode pair according to the determined lateral center positions of the glass electrode and the core electrode, comprising:
A difference between the abscissa value of the first point and the abscissa value of the second point is calculated as the particle lateral offset.
3. The method of claim 2, wherein,
The determining an abscissa value of a first point on a longitudinal centerline of one of the identified glass electrode and core electrode comprises:
Determining left and right edges of the one;
determining a width of the one according to the left edge and the right edge of the one;
Determining an abscissa value of a first point on a longitudinal centerline of the one according to a position of a left edge or a right edge of the one and a width of the one; and
The determining an abscissa value of a second point on a longitudinal centerline of the other of the identified glass electrode and core electrode comprises:
Determining left and right edges of the other;
determining a width of the other according to the left edge and the right edge of the other;
An abscissa value of a second point on a longitudinal centerline of the other of the identified glass electrode and core electrode is determined based on a position of the left or right edge of the other and a width of the other.
4. A method as claimed in claim 3, wherein one of the first and second points is not visible on the corresponding electrode and the other of the first and second points is visible on the corresponding electrode;
for an electrode corresponding to the invisible point, determining an abscissa value of the invisible point on a longitudinal centerline of the electrode according to a position of a left edge or a right edge of the electrode and a width of the electrode, including:
Determining a straight line where the left edge or the right edge of the electrode is located;
determining a reference point on the determined straight line, wherein the ordinate value of the reference point is equal to the ordinate value of the visible point;
And determining the abscissa value of the invisible point on the longitudinal central line of the electrode according to the abscissa value of the reference point and the width of the electrode.
5. The method of any one of claims 1 to 4, wherein the detecting step is performed across all electrode pairs of the panel to be detected.
6. The method of any one of claims 1 to 4, wherein the acquiring an image of a panel to be detected comprises:
and under the condition that the first light source and the second light source which are oppositely arranged vertically irradiate the panel to be detected at the same time, imaging the panel to be detected so as to generate an image of the panel to be detected.
7. The method of claim 6, wherein the first light source and/or the second light source is a point light source that emits parallel light.
8. A panel inspection apparatus, the apparatus comprising:
The acquisition module is used for acquiring an image of the panel to be detected;
The detection module is used for executing the following detection operation aiming at an electrode pair formed by a glass electrode and a core electrode of the panel to be detected in the image of the panel to be detected to determine whether the panel to be detected is qualified, wherein the glass electrode and the core electrode in the electrode pair are connected:
identifying a glass electrode and a core electrode in the electrode pair, and correspondingly determining the transverse center positions of the identified glass electrode and core electrode;
And determining the lateral offset of particles between the glass electrode and the core electrode in the electrode pair according to the determined lateral center positions of the glass electrode and the core electrode.
9. An electronic device comprising an image acquisition device for acquiring an image of a panel to be inspected, a processor and a memory in which computer program instructions are stored which, when executed by the processor, are adapted to carry out the panel inspection method according to any one of claims 1 to 7.
10. A storage medium having stored thereon program instructions for performing the panel detection method of any one of claims 1 to 7 when run.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN202956747U (en) * | 2012-06-26 | 2013-05-29 | 彩优微电子(昆山)有限公司 | Mutual capacitance touch screen |
| WO2019205290A1 (en) * | 2018-04-28 | 2019-10-31 | 平安科技（深圳）有限公司 | Image detection method and apparatus, computer device, and storage medium |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN202956747U (en) * | 2012-06-26 | 2013-05-29 | 彩优微电子(昆山)有限公司 | Mutual capacitance touch screen |
| WO2019205290A1 (en) * | 2018-04-28 | 2019-10-31 | 平安科技（深圳）有限公司 | Image detection method and apparatus, computer device, and storage medium |
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