CN114325341B - Test equipment and test system of circuit board - Google Patents
Test equipment and test system of circuit board Download PDFInfo
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- CN114325341B CN114325341B CN202111676946.6A CN202111676946A CN114325341B CN 114325341 B CN114325341 B CN 114325341B CN 202111676946 A CN202111676946 A CN 202111676946A CN 114325341 B CN114325341 B CN 114325341B
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Abstract
The application provides test equipment and a test system of a circuit board, wherein the test equipment comprises an interface chip, a controller and an analog circuit, the interface chip is used for being electrically connected with the circuit board to be tested, and the interface chip comprises at least one of a CAN communication interface, an Ethernet interface and a serial port; the controller is electrically connected with the interface chip, and the controller obtains at least one of Ethernet connection information, CAN on-off information and serial on-off information of the circuit board to be tested through the interface chip; the analog circuit is electrically connected with the controller, and is used for electrically connecting with the circuit board to be tested, determining whether the circuit board to be tested is short-circuited under the condition that the analog circuit receives a first signal of the controller, obtaining a first determination result and sending the first determination result to the controller, and determining voltage data of the circuit board to be tested under the condition that the analog circuit receives a second signal of the controller and sending the voltage data to the controller. The test efficiency of the circuit board is ensured to be higher.
Description
Technical Field
The application relates to the field of circuits, in particular to test equipment and a test system of a circuit board.
Background
In the practical application process, various tests need to be carried out on the circuit board, corresponding test equipment needs to be adopted for different types of tests, namely, a plurality of test equipment needs to be adopted for testing the circuit board respectively, a plurality of test interfaces are arranged on the circuit board, when the circuit board is tested, connecting terminals on the test equipment need to be connected with the corresponding test interfaces, and the circuit board is tested in sequence by adopting the plurality of test equipment, so that the circuit board needs to be repeatedly disassembled and assembled, and the test efficiency of the circuit board test is low.
The above information disclosed in the background section is only for enhancement of understanding of the background art from the technology described herein and, therefore, may contain some information that does not form the prior art that is already known in the country to a person of ordinary skill in the art.
Disclosure of Invention
The application mainly aims to provide test equipment and test system for a circuit board, which are used for solving the problem of lower test efficiency of the circuit board in the prior art.
According to an aspect of an embodiment of the present application, there is provided a test apparatus for a circuit board, the test apparatus for a circuit board including an interface chip, a controller, and an analog circuit, wherein the interface chip is used for electrically connecting with a circuit board to be tested, and the interface chip includes at least one of a CAN (Controller Area Network ) communication interface, an ethernet interface, and a serial port; the controller is electrically connected with the interface chip, and the controller is used for executing at least one of the following: the Ethernet connection information of the circuit board to be tested is obtained through the interface chip, the CAN on-off information of the circuit board to be tested is obtained through the interface chip, and the serial on-off information of the circuit board to be tested is determined through the interface chip; the analog circuit is electrically connected with the controller, and is used for being electrically connected with the circuit board to be tested, determining whether the circuit board to be tested is short-circuited or not under the condition that a first signal of the controller is received, obtaining a first determination result and sending the first determination result to the controller, and determining voltage data of the circuit board to be tested under the condition that a second signal of the controller is received and sending the voltage data to the controller.
Optionally, the analog circuit includes a current source, a switching device, and a voltage acquisition circuit, where a first end of the current source is used to be electrically connected to the circuit board to be tested; the switching device comprises three terminals, a first end of the switching device is electrically connected with the controller, a second end of the switching device is electrically connected with the first end of the current source, a third end of the switching device is electrically connected with the second end of the current source, and the switching device is used for being opened when the first signal is received and closed when the second signal is received; the first end of the voltage acquisition circuit is electrically connected with the first end of the current source, the second end of the voltage acquisition circuit is electrically connected with the controller, and the voltage acquisition circuit is used for acquiring the voltage data.
Optionally, the voltage acquisition circuit includes a voltage dividing device, an operational amplifier, and an analog-to-digital converter, wherein a first end of the voltage dividing device is electrically connected with a first end of the current source; the first input end of the operational amplifier is electrically connected with the second end of the voltage divider, and the second input end of the operational amplifier is electrically connected with the output end of the operational amplifier; the input end of the analog-to-digital converter is electrically connected with the output end of the operational amplifier, and the output end of the analog-to-digital converter is electrically connected with the controller.
Optionally, the voltage dividing device includes a first resistor and a second resistor, where a first end of the first resistor is a first end of the voltage dividing device, and a second end of the first resistor is a second end of the voltage dividing device; the first end of the second resistor is electrically connected with the second end of the first resistor, and the second end of the second resistor is grounded.
Optionally, the controller is further configured to generate a first timestamp when the first determination result is received.
Optionally, the controller is further configured to generate a second timestamp and determine whether the voltage data is qualified when the voltage data is received, so as to obtain a second determination result.
Optionally, the test device further includes a memory chip, electrically connected to the controller, where the memory chip is configured to receive the first determination result and the corresponding first timestamp sent by the controller, and/or receive the second determination result and the corresponding second timestamp sent by the controller.
Optionally, the CAN communication interface includes at least one of a CAN interface, a CAN FD (flexible Disk) interface, and a CAN 2.0 interface.
Optionally, the test device further comprises a power supply and a voltage converter, a first end of the voltage converter is electrically connected with the power supply, and a second end of the voltage converter is electrically connected with the controller.
Optionally, the test apparatus further includes a JTAG (Joint Test Action Group, joint test workgroup) interface electrically connected to the controller, the JTAG interface being configured to receive a predetermined program and send the predetermined program to the controller.
Optionally, the controller includes a SoC (System On Chip) Chip and an FPGA (Field Programmable Gate Array ).
Optionally, the SoC chip includes a processing system portion and a programmable logic portion.
According to another aspect of the embodiment of the application, a test system is provided, which comprises the test equipment of the circuit board and the circuit board to be tested, wherein the circuit board to be tested is electrically connected with the test equipment.
Optionally, the number of the circuit boards to be tested is multiple, the test system further includes a connection jig, and each circuit board to be tested is electrically connected with the test device through the connection jig.
By applying the technical scheme of the application, the test equipment of the circuit board comprises an interface chip, a controller and an analog circuit, wherein the interface chip is used for being electrically connected with the circuit board to be tested and comprises at least one of a CAN communication interface, an Ethernet interface and a serial port; the controller is electrically connected with the interface chip, and the controller obtains at least one of Ethernet connection information, CAN on-off information and serial on-off information of the circuit board to be tested through the interface chip; the analog circuit is electrically connected with the controller, and is used for being electrically connected with the circuit board to be tested, and determining whether the circuit board to be tested is short-circuited or not under the condition that the analog circuit receives a first signal of the controller, obtaining a first determination result and sending the first determination result to the controller, and determining voltage data of the circuit board to be tested and sending the voltage data to the controller under the condition that the analog circuit receives a second signal of the controller. Compared with the problem of lower test efficiency of the circuit board in the prior art, in the test equipment of the circuit board, the controller CAN acquire at least one of Ethernet connection information, CAN on-off information and serial on-off information of the circuit board to be tested through the interface chip, and the analog circuit CAN determine whether the circuit board to be tested is short-circuited or not and determine voltage data of the circuit board to be tested, so that the test of multiple functions of the circuit board is realized, and the test efficiency of the circuit board is ensured to be higher.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this specification, illustrate embodiments of the application and together with the description serve to explain the application. In the drawings:
FIG. 1 shows a schematic diagram of a test apparatus for a circuit board according to an embodiment of the application;
FIG. 2 shows an analog circuit schematic according to an embodiment of the application;
fig. 3 shows a schematic diagram of a structure of a current source according to an embodiment of the application;
FIG. 4 shows a schematic diagram of a test system according to an embodiment of the application.
Wherein the above figures include the following reference numerals:
20. a controller; 30. an analog circuit; 40. a circuit board to be tested; 50. a memory chip; 60. a power supply; 70. a voltage converter; 80. a JTAG interface; 90. a power adapter; 100. a testing device; 101. a CAN communication interface; 102. an Ethernet interface; 103. a serial port; 104. a CAN interface; 105. CAN FD interface; 106. CAN 2.0 interface; 107. an Ethernet chip; 108. CAN FD controller; 109. a CAN controller; 110. connecting a jig; 111. a digital operating system; 112. a spring test probe module; 113. a voltage sequence resistance module; 114. an interface module; 120. a computer; 301. a current source; 302. a switching device; 303. a voltage acquisition circuit; 304. a voltage dividing device; 305. a first operational amplifier; 306. an analog-to-digital converter; 307. a first resistor; 308. a second resistor; 309. a third resistor; 310. a fourth resistor; 311. a fifth resistor; 312. a sixth resistor; 313. a seventh resistor; 314. an eighth resistor; 315. a second operational amplifier; 401. a test point module; 402. 100/1000base-T/TX module to be tested; 403. a second communication interface module; 404. and other modules to be tested.
Detailed Description
It should be noted that, without conflict, the embodiments of the present application and features of the embodiments may be combined with each other. The application will be described in detail below with reference to the drawings in connection with embodiments.
In order that those skilled in the art will better understand the present application, a technical solution in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in which it is apparent that the described embodiments are only some embodiments of the present application, not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the present application without making any inventive effort, shall fall within the scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and the claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used may be interchanged where appropriate in order to describe the embodiments of the application herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
It will be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" another element, it can be directly on the other element or intervening elements may also be present. Furthermore, in the description and in the claims, when an element is described as being "connected" to another element, the element may be "directly connected" to the other element or "connected" to the other element through a third element.
As described in the background art, in order to solve the problem of low test efficiency of the circuit board in the prior art, in an exemplary embodiment of the present application, a test apparatus and a test system for a circuit board are provided.
According to an exemplary embodiment of the present application, there is provided a test apparatus for a circuit board, as shown in fig. 1 and 4, the test apparatus 100 for a circuit board includes an interface chip, a controller 20, and an analog circuit 30, wherein the interface chip is used for electrically connecting with a circuit board 40 to be tested, and the interface chip includes at least one of a CAN communication interface 101, an ethernet interface 102, and a serial port 103; the controller 20 is electrically connected to the interface chip, and the controller 20 is configured to perform at least one of: the Ethernet connection information of the circuit board 40 to be tested is obtained through the interface chip, the CAN on-off information of the circuit board 40 to be tested is obtained through the interface chip, and the serial on-off information of the circuit board 40 to be tested is determined through the interface chip; the analog circuit 30 is electrically connected to the controller 20, the analog circuit 30 is electrically connected to the circuit board under test 40, the analog circuit 30 is configured to determine whether the circuit board under test 40 is shorted when receiving a first signal from the controller 20, obtain a first determination result, and send the first determination result to the controller 20, and the analog circuit 30 is further configured to determine voltage data of the circuit board under test 40 and send the voltage data to the controller 20 when receiving a second signal from the controller 20.
The test equipment of the circuit board comprises an interface chip, a controller and an analog circuit, wherein the interface chip is used for being electrically connected with the circuit board to be tested and comprises at least one of a CAN communication interface, an Ethernet interface and a serial port; the controller is electrically connected with the interface chip, and the controller obtains at least one of Ethernet connection information, CAN on-off information and serial on-off information of the circuit board to be tested through the interface chip; the analog circuit is electrically connected with the controller, and is used for being electrically connected with the circuit board to be tested, and determining whether the circuit board to be tested is short-circuited or not under the condition that the analog circuit receives a first signal of the controller, obtaining a first determination result and sending the first determination result to the controller, and determining voltage data of the circuit board to be tested and sending the voltage data to the controller under the condition that the analog circuit receives a second signal of the controller. Compared with the problem of lower test efficiency of the circuit board in the prior art, in the test equipment of the circuit board, the controller CAN acquire at least one of the Ethernet connection information, the CAN on-off information and the serial on-off information of the circuit board to be tested through the interface chip, the analog circuit CAN determine whether the circuit board to be tested is short-circuited or not and determine the voltage data of the circuit board to be tested, the test of multiple functions of the circuit board is realized, and the test efficiency of the circuit board is ensured to be higher.
In a specific embodiment, as shown in fig. 1, the test apparatus of the circuit board further includes a digital operating system 111, the digital operating system 111 is connected to the controller 20, and the ethernet interface 102 is connected to the controller 20 through an ethernet chip 107. Specifically, in the case where the test apparatus of the circuit board is used in a vehicle-mounted system, the transmission rate of the ethernet interface 102 is 1000M.
According to an embodiment of the present application, as shown in fig. 1 and 2, the analog circuit 30 includes a current source 301, a switching device 302, and a voltage acquisition circuit 303, where a first end of the current source 301 is used for electrically connecting with the circuit board to be tested; the switching device 302 includes three terminals, a first end of the switching device 302 is electrically connected to the controller 20, a second end of the switching device 302 is electrically connected to a first end of the current source 301, a third end of the switching device 302 is electrically connected to a second end of the current source 301, and the switching device 302 is configured to be opened when the first signal is received and closed when the second signal is received; a first end of the voltage acquisition circuit 303 is electrically connected to a first end of the current source 301, a second end of the voltage acquisition circuit 303 is electrically connected to the controller 20, and the voltage acquisition circuit 303 is configured to acquire the voltage data. The switch device is disconnected when the first signal is received, so that the current source supplies power to the circuit board to be tested, the voltage acquisition circuit is further enabled to acquire voltage data of the circuit board to be tested after power supply, whether the circuit board to be tested is short-circuited or not is further detected, the switch device is closed when the second signal is received, namely, the power supply of the current source is disconnected, the voltage data of the circuit board to be tested is tested, the fact that the analog circuit can determine the voltage data of the circuit board to be tested through the voltage acquisition circuit is guaranteed, and the higher testing efficiency of the circuit board is further guaranteed.
In an actual application process, the voltage acquisition circuit may be any circuit structure that is feasible in the prior art for testing voltage data of a circuit board to be tested, and according to another embodiment of the present application, as shown in fig. 1 and fig. 2, the voltage acquisition circuit 303 includes a voltage dividing device 304, a first operational amplifier 305, and an analog-to-digital converter 306, where a first end of the voltage dividing device 304 is electrically connected to a first end of the current source 301; a first input terminal of the first operational amplifier 305 is electrically connected to a second terminal of the voltage divider 304, and a second input terminal of the first operational amplifier 305 is electrically connected to an output terminal of the first operational amplifier 305; an input terminal of the analog-to-digital converter 306 is electrically connected to an output terminal of the first operational amplifier 305, and an output terminal of the analog-to-digital converter 306 is electrically connected to the controller 20. The voltage divider and the first operational amplifier are used for adjusting the output voltage to the receivable range of the analog-to-digital converter according to the proportion, and then the analog quantity is converted into the voltage digital quantity through the analog-to-digital converter, so that the voltage data of the circuit board to be tested can be determined by the analog circuit through the voltage acquisition circuit, and the higher testing efficiency of the circuit board is further ensured.
According to yet another embodiment of the present application, as shown in fig. 2, the voltage divider 304 includes a first resistor 307 and a second resistor 308, wherein a first end of the first resistor 307 is a first end of the voltage divider 304, and a second end of the first resistor 307 is a second end of the voltage divider 304; a first end of the second resistor 308 is electrically connected to a second end of the first resistor 307, and a second end of the second resistor 308 is grounded.
In one embodiment, as shown in fig. 2 and fig. 4, the switching device 302 is turned off when the first signal is received, the current source 301 directly provides current to the circuit board under test 40 to test the voltage data of the circuit board under test 40, and the switching device 302 is turned off to confirm whether the circuit board under test is shorted; the switching device 302 is turned on when the second signal is received, the branch circuit where the switching device is located may short-circuit the circuit board to be tested, that is, the current generated by the current source 301 may pass through the switching device 302, and not pass through the circuit board to be tested, and the voltage acquisition circuit 303 may detect the voltage data of the circuit board to be tested through the first resistor 307, the second resistor 308, the first operational amplifier 305, and the analog-to-digital converter 306 and send the voltage data to the controller.
In a specific embodiment, as shown in fig. 3, the current source is a howlan current source, and the howlan current source is an operational current source invented by Brad howlan. The Howland current source includes a second operational amplifier 315, a third resistor 309, a fourth resistor 310, a fifth resistor 311, a sixth resistor 312, a seventh resistor 313, and an eighth resistor 314, and their specific connection relationships are shown in fig. 3.
According to a specific embodiment of the present application, the controller is further configured to generate a first timestamp when the first determination result is received. The first timestamp corresponds to the first determination result, so that the subsequent tracing of the time point corresponding to the first confirmation result according to the first timestamp is facilitated.
According to another embodiment of the present application, the controller is further configured to generate a second timestamp and determine whether the voltage data is acceptable when the voltage data is received, so as to obtain a second determination result. By generating the second time stamp and obtaining the second determination result according to whether the voltage data is qualified or not, the subsequent tracing of the time point corresponding to the second confirmation result according to the second time stamp is facilitated.
According to still another embodiment of the present application, as shown in fig. 1, the test apparatus further includes a memory chip 50 electrically connected to the controller 20, where the memory chip 50 is configured to receive the first determination result and the corresponding first timestamp sent by the controller 20, and/or receive the second determination result and the corresponding second timestamp sent by the controller 20. The memory chip ensures that the first determination result, the second determination result, the first timestamp and the second timestamp received by the controller can be stored, and further ensures that the first determination result, the second determination result, the first timestamp and the second timestamp can be found out from the controller more conveniently later.
According to an embodiment of the present application, as shown in fig. 1, the CAN communication interface 101 includes at least one of a CAN interface 104, a CAN FD interface 105, and a CAN 2.0 interface 106. Therefore, the CAN communication interface CAN meet different interface requirements, so that the test of the CAN communication interfaces of different types of the circuit board to be tested is further realized, and the higher test efficiency of the circuit board to be tested is further ensured.
Specifically, as shown in fig. 1, the different types of CAN interfaces 104, 105 and 106 are all connected to the controller 20 through corresponding different CAN controllers, which include a CAN FD controller 108 and a CAN controller 109.
In a specific embodiment, the CAN controller includes TCAN4550 and TCAN1402.
According to another embodiment of the present application, as shown in fig. 1, the test apparatus further includes a power supply 60 and a voltage converter 70, wherein a first end of the voltage converter 70 is electrically connected to the power supply 60, and a second end of the voltage converter 70 is electrically connected to the controller 20. The power supply ensures that the test equipment can supply power internally, and the voltage converter ensures that the power supply can meet the power supply requirements of different modules.
Of course, as shown in fig. 1, the power supply 60 also supplies power to other modules in the test apparatus, such as the memory chip 50, through the voltage converter 70.
In a specific embodiment, as shown in fig. 1, the power supply 60 is connected to the outside through a power adapter 90, and the power supply 60 is in a charged state when connected to the outside through the power adapter 90; when the power supply 60 is not connected with the external power supply, the power supply 60 discharges to supply power to the testing equipment, so that the testing equipment can work normally, and the testing efficiency of the circuit board is further ensured to be higher.
According to still another embodiment of the present application, as shown in fig. 1, the test apparatus further includes a JTAG interface 80, the JTAG interface 80 is electrically connected to the controller 20, and the JTAG interface 80 is configured to receive a predetermined program and transmit the predetermined program to the controller 20.
According to a specific embodiment of the present application, the controller includes a SoC chip and an FPGA. The SOC is the chip integration of the information system core, and can realize the whole process from the determination of system functions to the division of software and hardware and the completion of design.
According to another embodiment of the present application, the SoC chip includes a processing system portion and a programmable logic portion.
The application also provides a test system, as shown in fig. 4, comprising the test device 100 of the circuit board and the circuit board under test 40, wherein the circuit board under test 40 is electrically connected with the test device 100.
The test system comprises the test equipment of the circuit board and the circuit board to be tested, wherein the circuit board to be tested is electrically connected with the test equipment. Compared with the problem of lower test efficiency of the circuit board in the prior art, in the test system, the controller CAN acquire at least one of the Ethernet connection information, the CAN on-off information and the serial on-off information of the circuit board to be tested through the interface chip, and the analog circuit CAN determine whether the circuit board to be tested is short-circuited or not and determine the voltage data of the circuit board to be tested, so that the test of multiple functions of the circuit board is realized, and the test efficiency of the circuit board is ensured to be higher.
According to an embodiment of the present application, as shown in fig. 4, the test system further includes a connection jig 110, and each of the circuit boards 40 to be tested is electrically connected to the test apparatus 100 through the connection jig 110 to realize the test of the electrical properties (short circuit, voltage data, etc.) of the circuit boards 40 to be tested.
In a specific embodiment, as shown in fig. 4, the test system further includes a computer 120, the connection fixture 110 includes a spring test probe module 112, a voltage sequence resistor module 113, and an interface module 114, the circuit board under test 40 includes a test point module 401, a 100/1000base-T/TX module under test 402, a second communication interface module 403, and other modules under test 404, one end of the voltage sequence resistor module 113 is connected to the test device 100, the interface module 114, the other modules under test 404, and the second communication interface module 403 are all connected to the test device 100, the test point module 401 is connected to the spring test probe module 112, and the computer 120 is connected to the test device 100 and the circuit board under test 40, respectively.
In the foregoing embodiments of the present application, the descriptions of the embodiments are emphasized, and for a portion of this disclosure that is not described in detail in this embodiment, reference is made to the related descriptions of other embodiments.
From the above description, it can be seen that the above embodiments of the present application achieve the following technical effects:
1) The test equipment of the circuit board comprises an interface chip, a controller and an analog circuit, wherein the interface chip is used for being electrically connected with the circuit board to be tested and comprises at least one of a CAN communication interface, an Ethernet interface and a serial port; the controller is electrically connected with the interface chip, and the controller obtains at least one of Ethernet connection information, CAN on-off information and serial on-off information of the circuit board to be tested through the interface chip; the analog circuit is electrically connected with the controller, and is used for being electrically connected with the circuit board to be tested, and determining whether the circuit board to be tested is short-circuited or not under the condition that the analog circuit receives a first signal of the controller, obtaining a first determination result and sending the first determination result to the controller, and determining voltage data of the circuit board to be tested and sending the voltage data to the controller under the condition that the analog circuit receives a second signal of the controller. Compared with the problem of lower test efficiency of the circuit board in the prior art, in the test equipment of the circuit board, the controller CAN acquire at least one of the Ethernet connection information, the CAN on-off information and the serial on-off information of the circuit board to be tested through the interface chip, the analog circuit CAN determine whether the circuit board to be tested is short-circuited or not and determine the voltage data of the circuit board to be tested, the test of multiple functions of the circuit board is realized, and the test efficiency of the circuit board is ensured to be higher.
2) The test system comprises the test equipment of the circuit board and the circuit board to be tested, wherein the circuit board to be tested is electrically connected with the test equipment. Compared with the problem of lower test efficiency of the circuit board in the prior art, in the test system, the controller CAN acquire at least one of the Ethernet connection information, the CAN on-off information and the serial on-off information of the circuit board to be tested through the interface chip, and the analog circuit CAN determine whether the circuit board to be tested is short-circuited or not and determine the voltage data of the circuit board to be tested, so that the test of multiple functions of the circuit board is realized, and the test efficiency of the circuit board is ensured to be higher.
The above description is only of the preferred embodiments of the present application and is not intended to limit the present application, but various modifications and variations can be made to the present application by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the protection scope of the present application.
Claims (14)
1. A test apparatus for a circuit board, comprising:
the interface chip is used for being electrically connected with the circuit board to be tested and comprises at least one of a CAN communication interface, an Ethernet interface and a serial port;
and a controller electrically connected with the interface chip, wherein the controller is used for executing at least one of the following steps: the Ethernet connection information of the circuit board to be tested is obtained through the interface chip, the CAN on-off information of the circuit board to be tested is obtained through the interface chip, and the serial on-off information of the circuit board to be tested is determined through the interface chip;
the analog circuit is electrically connected with the controller and is used for being electrically connected with the circuit board to be tested, the analog circuit is used for determining whether the circuit board to be tested is short-circuited or not under the condition that a first signal of the controller is received, obtaining a first determination result and sending the first determination result to the controller, and the analog circuit is also used for determining voltage data of the circuit board to be tested and sending the voltage data to the controller under the condition that a second signal of the controller is received.
2. The circuit board testing apparatus of claim 1, wherein the analog circuit comprises:
the first end of the current source is used for being electrically connected with the circuit board to be tested;
a switching device including three terminals, a first end of the switching device being electrically connected to the controller, a second end of the switching device being electrically connected to a first end of the current source, a third end of the switching device being electrically connected to a second end of the current source, the switching device being adapted to be opened upon receipt of the first signal and closed upon receipt of the second signal;
the voltage acquisition circuit, the first end of voltage acquisition circuit with the first end electricity of current source is connected, the second end of voltage acquisition circuit with the controller electricity is connected, voltage acquisition circuit is used for gathering voltage data.
3. The circuit board testing apparatus of claim 2, wherein the voltage acquisition circuit comprises:
a voltage divider device having a first end electrically connected to the first end of the current source;
the first input end of the operational amplifier is electrically connected with the second end of the voltage dividing device, and the second input end of the operational amplifier is electrically connected with the output end of the operational amplifier;
and the input end of the analog-to-digital converter is electrically connected with the output end of the operational amplifier, and the output end of the analog-to-digital converter is electrically connected with the controller.
4. A test apparatus for a circuit board according to claim 3, wherein the voltage dividing device comprises:
the first end of the first resistor is a first end of the voltage dividing device, and the second end of the first resistor is a second end of the voltage dividing device;
and the first end of the second resistor is electrically connected with the second end of the first resistor, and the second end of the second resistor is grounded.
5. The circuit board testing apparatus of claim 1, wherein the controller is further configured to generate a first timestamp upon receiving the first determination.
6. The circuit board testing apparatus of claim 5, wherein the controller is further configured to, upon receiving the voltage data, generate a second time stamp and determine whether the voltage data is acceptable, resulting in a second determination.
7. The circuit board testing apparatus of claim 6, wherein the testing apparatus further comprises:
the storage chip is electrically connected with the controller and is used for receiving the first determination result and the corresponding first timestamp sent by the controller and/or receiving the second determination result and the corresponding second timestamp sent by the controller.
8. The test device of a circuit board according to any one of claims 1 to 7, wherein the CAN communication interface comprises at least one of a CAN interface, a CAN FD interface, and a CAN 2.0 interface.
9. The test apparatus of a circuit board according to any one of claims 1 to 7, further comprising:
a power supply;
and the first end of the voltage converter is electrically connected with the power supply, and the second end of the voltage converter is electrically connected with the controller.
10. The test apparatus of a circuit board according to any one of claims 1 to 7, further comprising:
and the JTAG interface is electrically connected with the controller and is used for receiving a preset program and sending the preset program to the controller.
11. The apparatus according to any one of claims 1 to 7, wherein the controller includes a SoC chip and an FPGA.
12. The circuit board testing apparatus of claim 11, wherein the SoC chip includes a processing system portion and a programmable logic portion.
13. A test system, comprising:
the test apparatus of a circuit board of any one of claims 1 to 12;
and the circuit board to be tested is electrically connected with the test equipment.
14. The test system of claim 13, wherein there are a plurality of circuit boards under test, the test system further comprising:
and the connecting jigs are used for electrically connecting the circuit boards to be tested with the testing equipment.
Priority Applications (1)
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