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CN114138677B - Test method and device, test system and electronic equipment - Google Patents

Test method and device, test system and electronic equipment Download PDF

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Publication number
CN114138677B
CN114138677B CN202111603400.8A CN202111603400A CN114138677B CN 114138677 B CN114138677 B CN 114138677B CN 202111603400 A CN202111603400 A CN 202111603400A CN 114138677 B CN114138677 B CN 114138677B
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China
Prior art keywords
test
job
server
configuration
policy
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CN202111603400.8A
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CN114138677A (en
Inventor
韩培源
束涛
朱能勇
牛欢欢
刘晓明
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Beijing Empyrean Technology Co Ltd
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Beijing Empyrean Technology Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3688Test management for test execution, e.g. scheduling of test suites
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3692Test management for test results analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3696Methods or tools to render software testable

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The embodiment of the application provides a testing method and device, a testing system and electronic equipment, wherein the testing method comprises the following steps: acquiring identifiable test jobs, wherein each test job encapsulates a plurality of test cases; determining a real-time load of a test server running the test job; generating a test strategy configuration according to the real-time load, wherein the test strategy configuration at least comprises: the corresponding relation between the test server and the test job which can be operated by the test server; and generating a scheduling policy of the test job according to the test policy configuration so as to run the test job with the corresponding relation with the test server on the test server. The embodiment of the application realizes the whole test process based on the test job as a unit, avoids complex data types input into EDA software, and has huge data volume, so that the configuration is various, and the manual configuration related to the test is not required to be carried out by consuming a great amount of manpower and time.

Description

Test method and device, test system and electronic equipment
Technical Field
The present application relates to the field of integrated circuits, and in particular, to a testing method and apparatus, a testing system, and an electronic device.
Background
EDA (Electronics DesignAutomation, electronic design automation) software integrates the functions of designing circuits, compiling circuits, debugging circuits, analyzing circuits and the like, and technicians use the EDA software for testing, such as testing whether memories, logics and other IC devices are normal or not, in the field of semiconductor technology in the processes of development, processing, manufacturing and generating. Thus, in the use of the EDA software, the types of data input to the EDA software are complex, the data volume is huge, and the functions required to be configured are numerous in order to achieve the test objective, and further, a great number of tests are required to verify the correctness of the design for each modification of the design, thereby resulting in a great deal of manpower and time being required to perform the manual configuration related to the test.
Disclosure of Invention
The embodiment of the application provides a testing method and device, a testing system and electronic equipment, which are used for overcoming or relieving the technical problems in the prior art.
The application adopts the technical scheme that:
A method of testing, comprising:
acquiring identifiable test jobs, wherein each test job encapsulates a plurality of test cases;
determining a real-time load of a test server running the test job;
generating a test strategy configuration according to the real-time load, wherein the test strategy configuration at least comprises: the corresponding relation between the test server and the test job which can be operated by the test server;
And generating a scheduling policy of the test job according to the test policy configuration so as to run the test job with the corresponding relation with the test server on the test server.
Optionally, in an embodiment, the acquiring the identifiable test job is specifically: a test job identifiable by the LSF is obtained, in which a plurality of test cases are packaged according to a list.
Optionally, in an embodiment, the test job includes a test job description file, where the test job description file includes a test case list, and the test list records at least one of an ID of the test case, a storage path of the test case, and a dependency of the test case in a unit of the test case.
Optionally, in an embodiment, the generating a test policy configuration according to the real-time load includes: generating a test configuration strategy for carrying out regression test on the test cases with failed operation according to the real-time load;
the step of generating a scheduling policy of the test job according to the test policy configuration to run the test job having the correspondence with the test server on the test server, includes: and generating a scheduling policy of the test job aiming at the test case with the operation failure according to the test policy configuration so as to operate the test case with the operation failure, which has the corresponding relation with the test server, on the test server.
Optionally, in an embodiment, the test configuration policy includes a test policy configuration table, where the test policy configuration table is used to record test cases participating in each regression test.
Optionally, in an embodiment, the generating, according to the test policy configuration, a scheduling policy of the test job, after executing, on the test server, the test job having the correspondence with the test server, includes:
and acquiring test results aiming at the test job, and carrying out statistics on the test results of all the test jobs to generate a test report.
A method of testing, comprising:
Reporting real-time load of a test server running test jobs, wherein each test job is packaged with a plurality of test cases;
according to a scheduling strategy of the test job, running the test job with the corresponding relation with the test server on the test server;
The corresponding relation is included in a test strategy configuration generated according to the real-time load, and the scheduling strategy of the test job is generated according to the test strategy configuration.
Optionally, in an embodiment, the test job is a test job identifiable by an LSF, and multiple test cases are packaged in the test job according to a list.
Optionally, in an embodiment, the test job includes a test job description file, where the test job description file includes a test case list, and the test list records at least one of an ID of the test case, a storage path of the test case, and a dependency of the test case in a unit of the test case.
A test device, comprising:
the device comprises a job acquisition unit, a test processing unit and a test processing unit, wherein the job acquisition unit is used for acquiring identifiable test jobs, and each test job is packaged with a plurality of test cases;
a load determining unit for determining a real-time load of a test server running the test job;
The policy configuration unit is configured to generate a test policy configuration according to the real-time load, where the test policy configuration at least includes: the corresponding relation between the test server and the test job which can be operated by the test server;
And the scheduling unit is used for generating a scheduling policy of the test job according to the test policy configuration so as to run the test job with the corresponding relation with the test server on the test server.
A test device, comprising:
The reporting unit is used for reporting the real-time load of the test server running the test jobs, and each test job is packaged with a plurality of test cases;
The operation unit is used for operating the test job with the corresponding relation with the test server on the test server according to the scheduling strategy of the test job;
The corresponding relation is included in a test strategy configuration generated according to the real-time load, and the scheduling strategy of the test job is generated according to the test strategy configuration.
A test system comprising a dispatch server and a test server, wherein:
The scheduling server is used for:
acquiring identifiable test jobs, wherein each test job encapsulates a plurality of test cases;
determining a real-time load of a test server running the test job;
generating a test strategy configuration according to the real-time load, wherein the test strategy configuration at least comprises: the corresponding relation between the test server and the test job which can be operated by the test server;
generating a scheduling policy of the test job according to the test policy configuration so as to run the test job with the corresponding relation with the test server on the test server;
The test server is used for:
Reporting real-time load of a test server running test jobs, wherein each test job is packaged with a plurality of test cases;
according to a scheduling strategy of the test job, running the test job with the corresponding relation with the test server on the test server;
The corresponding relation is included in a test strategy configuration generated according to the real-time load, and the scheduling strategy of the test job is generated according to the test strategy configuration.
An electronic device comprising a memory for storing a computer executable program thereon, and a processor for running the computer executable program to implement any of the methods of the embodiments of the present application.
In the technical scheme of the embodiment of the application, identifiable test jobs are obtained, and each test job is packaged with a plurality of test cases; determining a real-time load of a test server running the test job; generating a test strategy configuration according to the real-time load, wherein the test strategy configuration at least comprises: the corresponding relation between the test server and the test job which can be operated by the test server; and generating a scheduling strategy of the test job according to the test strategy configuration so as to run the test job with the corresponding relation with the test server on the test server, thereby realizing the whole test process based on the test job as a unit, avoiding complex data types and huge data quantity which are input into EDA software, leading to various configurations without consuming a great deal of manpower and time for carrying out the related manual configuration of the test.
Drawings
FIG. 1 is a schematic diagram of a test system according to an embodiment of the present application;
FIG. 2 is a flow chart of a testing method according to an embodiment of the application;
FIG. 3 is a flow chart of a testing method according to an embodiment of the application;
FIG. 4 is a schematic structural diagram of a testing device according to an embodiment of the present application;
FIG. 5 is a schematic diagram of a testing device according to an embodiment of the present application;
Fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present application;
fig. 7 is a schematic diagram of a specific hardware structure of an electronic device according to an embodiment of the present application.
Detailed Description
In order to make the technical problems, technical solutions and advantages to be solved more apparent, the following detailed description will be given with reference to the accompanying drawings and specific embodiments.
In the technical scheme of the embodiment of the application, identifiable test jobs are obtained, and each test job is packaged with a plurality of test cases; determining a real-time load of a test server running the test job; generating a test strategy configuration according to the real-time load, wherein the test strategy configuration at least comprises: the corresponding relation between the test server and the test job which can be operated by the test server; and generating a scheduling strategy of the test job according to the test strategy configuration so as to run the test job with the corresponding relation with the test server on the test server, thereby realizing the whole test process based on the test job as a unit, avoiding complex data types and huge data quantity which are input into EDA software, leading to various configurations without consuming a great deal of manpower and time for carrying out the related manual configuration of the test.
The method of the following embodiments of the present application is, for example, applied to EDA test, and of course, the method of the following embodiments is not limited to EDA test, and may be applied to other test scenarios. The target object for EDA testing is from the IC product under test.
FIG. 1 is a schematic diagram of a test system according to an embodiment of the present application; as shown in fig. 1, the test system includes f101 and a test server 102, where the dispatch server 101 and the test server 102 may be connected by a communication network or other direct connection manner, where:
The scheduling server is used for: acquiring identifiable test jobs, wherein each test job encapsulates a plurality of test cases; determining a real-time load of a test server running the test job; generating a test strategy configuration according to the real-time load, wherein the test strategy configuration at least comprises: the corresponding relation between the test server and the test job which can be operated by the test server; and generating a scheduling policy of the test job according to the test policy configuration so as to run the test job with the corresponding relation with the test server on the test server.
The test server is used for: reporting real-time load of a test server running test jobs, wherein each test job is packaged with a plurality of test cases; according to the scheduling strategy of the test job, the test job with the corresponding relation with the test server is operated on the test server; the corresponding relation is included in a test strategy configuration generated according to the real-time load, and the scheduling strategy of the test job is generated according to the test strategy configuration.
FIG. 2 is a flow chart of a testing method according to an embodiment of the application; as shown in fig. 2, the scheduling server is used as an execution body, and the test method includes:
S201, acquiring identifiable test jobs, wherein each test job is packaged with a plurality of test cases;
illustratively, in this embodiment, the acquiring the identifiable test job is specifically: a test job identifiable by the LSF is obtained, in which a plurality of test cases are packaged according to a list.
Specifically, the LSF (Loading SHARING FACILITY), the chinese paraphrasing is a workload management scheme, and since the LSF provides a guarantee flow of applying for work orders, testing, commissioning, reporting, approving execution, executing, etc. and associates a flow and a system configuration, management of data input to the EDA software can be effectively realized.
Specifically, in this embodiment, one test case corresponds to one lsfjob, so that the test cases are managed.
Illustratively, in this embodiment, the test job may be packaged by the dispatch server and stored on the test server. Of course, in other embodiments, the encapsulation of the test job may also be performed on the test server.
Illustratively, a communication channel is provided between the dispatch server and the test server, and based on the communication channel, an identifiable test job is obtained.
In this embodiment, the test job includes a test job description file, where the test job description file includes a test case list, and the test list records at least one of an ID of a test case, a storage path of the test case, and a dependency of the test case in a unit of the test case.
Therefore, in consideration of resource saving for the scheduling server, the scheduling server only needs to acquire the description file of the test job, and the test cases included in the test job are reserved locally on the testing server.
S202, determining the real-time load of a test server running the test job;
In this embodiment, the real-time load is specifically calculated by the test server, and then reported to the scheduling server by the test server. Or in other embodiments, the scheduling server may monitor the test server in real time to determine the real-time load.
For example, considering that in some application scenarios, there may be a test server, where the several test servers form a test server cluster, a management server is provided in the test server cluster, and the management server determines a real-time load of each test server in the test server cluster and reports the real-time load to the test server.
For example, considering that in some other application scenarios, multiple scheduling servers may be provided, multiple EDA software performing automated design of a product (including test procedures), for which EDA software may be grouped, each group of EDA software configuring one scheduling server and several test servers.
S203, generating a test strategy configuration according to the real-time load, wherein the test strategy configuration at least comprises: the corresponding relation between the test server and the test job which can be operated by the test server;
Illustratively, in this embodiment, the generating a test policy configuration according to the real-time load includes: and generating a test configuration strategy for carrying out regression test on the test cases with failed operation according to the real-time load.
In this embodiment, considering the testing of the EDA software, since many design links are involved in designing the IC product by using the EDA software, many more test cases are further needed for testing. The operation of the test case is affected by various factors, so that the situation that the operation of the test case fails exists, if the monitoring is carried out by people, a great amount of manpower consumption is caused, the ultra-high time cost is further caused, moreover, the monitoring is carried out by people, subjective errors exist, and the monitoring is not in place or is wrong.
For this reason, in this embodiment, through step S203, a test policy configuration is generated, and a correspondence between the test server and the test job is established, so that the operation of the test case can be monitored.
Illustratively, in this embodiment, the test configuration policy includes a test policy configuration table, where the test policy configuration table is used to record test cases that participate in each regression test.
Illustratively, generating a scheduling policy of the test job according to the test policy configuration to run the test job having the correspondence with the test server on the test server includes: and generating a scheduling policy of the test job aiming at the test case with the operation failure according to the test policy configuration so as to operate the test case with the operation failure, which has the corresponding relation with the test server, on the test server.
Therefore, in the test process, the regression test can be effectively applied to the test cases which fail to run under the influence of factors such as server load, network and other corresponding tool software performances, the accuracy and the stability of the execution results of the test cases are ensured, and the quality of the test results is improved.
S204, generating a scheduling policy of the test job according to the test policy configuration so as to run the test job with the corresponding relation with the test server on the test server.
Specifically, in an application scenario, for example, the number of regression tests is set to three, for this purpose, three test lists of regression tests are established, and the test lists are respectively marked as T1, T2 and T3, and of course, the test cases are managed in the test lists in test job units. When the scheme of the embodiment of the application is operated for the first time, the test list T1 records the total number of test cases, when the test cases with operation failure occur for the first time, the test cases are recorded in the test list T2, and so on, and the test cases with operation failure occur for the second time are recorded in the test list T3. In order to manage the test jobs in the test list by taking the test jobs as a unit, when the test jobs are packaged to form the test jobs, different job IDs are allocated for different test jobs, so that the test jobs are managed through the job IDs in the test list in the regression test, namely, the test cases are managed in a similar scale mode in the regression test, so that the management efficiency of the test cases is improved, and the test cases which fail to run are managed, in particular, the test cases which fail to run are allowed to run again. In this application scenario, if a test case is tested three times, it may be determined that the test case fails to be executed, and further, for example, the cause of the failure to be executed may be manually determined.
Here, three regression tests are taken as an example for illustration, but in other application scenarios, the number of regression tests may be more or less than three.
In the step S204, when the scheduling is performed, the test case with the running failure is scheduled to the corresponding test server for running again in the failure situation, and of course, in other embodiments, the running may be scheduled to other test servers to determine whether the running failure of the test case is possible due to the test server.
Further, on the basis of the embodiment of fig. 1, after the generating, according to the test policy configuration, a scheduling policy of the test job to run the test job having the correspondence with the test server on the test server, the method includes: and acquiring test results aiming at the test job, and carrying out statistics on the test results of all the test jobs to generate a test report.
Specifically, the test results may be obtained from a test log; the test report may be statistically generated in units of test jobs.
Specifically, in an application scenario, the whole test process may be controlled based on a script, in which each step is encapsulated into a library file or function that can be called separately, so that an automated execution process is implemented through the call between libraries or functions.
FIG. 3 is a flow chart of a testing method according to an embodiment of the application; as shown in fig. 3, in this embodiment, a test server is used as an execution body, and the test method includes:
s301, reporting real-time load of a test server running test jobs, wherein each test job is packaged with a plurality of test cases;
s302, according to a scheduling strategy of a test job, running the test job with the corresponding relation with the test server on the test server;
The corresponding relation is included in a test strategy configuration generated according to the real-time load, and the scheduling strategy of the test job is generated according to the test strategy configuration.
In this exemplary embodiment, the test job is a test job identifiable by LSF, in which a plurality of test cases are packaged in a list.
In this embodiment, the test job may include a test job description file, where the test job description file includes a test case list, and the test list records at least one of an ID of a test case, a storage path of the test case, and a dependency of the test case in units of the test case.
FIG. 4 is a schematic structural diagram of a testing device according to an embodiment of the present application; as shown in fig. 4, it includes:
A job obtaining unit 401, configured to obtain identifiable test jobs, where each test job encapsulates a plurality of test cases;
A load determining unit 402, configured to determine a real-time load of a test server running the test job;
A policy configuration unit 403, configured to generate a test policy configuration according to the real-time load, where the test policy configuration at least includes: the corresponding relation between the test server and the test job which can be operated by the test server;
And a scheduling unit 404, configured to generate a scheduling policy of the test job according to the test policy configuration, so as to run the test job with the corresponding relationship with the test server on the test server.
Optionally, in an embodiment, the job obtaining unit is specifically configured to: a test job identifiable by the LSF is obtained, in which a plurality of test cases are packaged according to a list.
Optionally, in an embodiment, the test job includes a test job description file, where the test job description file includes a test case list, and the test list records at least one of an ID of the test case, a storage path of the test case, and a dependency of the test case in a unit of the test case.
Optionally, in an embodiment, the policy configuration unit is specifically configured to: generating a test configuration strategy for carrying out regression test on the test cases with failed operation according to the real-time load;
the root scheduling unit is specifically configured to: and generating a scheduling policy of the test job aiming at the test case with the operation failure according to the test policy configuration so as to operate the test case with the operation failure, which has the corresponding relation with the test server, on the test server.
Optionally, in an embodiment, the test configuration policy includes a test policy configuration table, where the test policy configuration table is used to record test cases participating in each regression test.
Optionally, in an embodiment, the apparatus further includes: and the report generating unit is used for generating a scheduling strategy of the test job according to the test strategy configuration, acquiring test results aiming at the test job after the test job with the corresponding relation with the test server is operated on the test server, and carrying out statistics on the test results of all the test jobs to generate a test report.
FIG. 5 is a schematic diagram of a testing device according to an embodiment of the present application; as shown in fig. 5, it includes:
a reporting unit 501, configured to report a real-time load of a test server running test jobs, where each test job encapsulates multiple test cases;
an operation unit 502, configured to operate, on the test server, the test job having the correspondence with the test server according to a scheduling policy of the test job;
The corresponding relation is included in a test strategy configuration generated according to the real-time load, and the scheduling strategy of the test job is generated according to the test strategy configuration.
Fig. 6 is a schematic structural diagram of an electronic device according to an embodiment of the present application; as shown in fig. 6, the electronic device includes a memory 601, on which a computer executable program is stored, and a processor 602 for running the computer executable program to implement any of the methods according to the embodiments of the present application.
Fig. 7 is a schematic diagram of a specific hardware structure of an electronic device according to an embodiment of the present application; as shown in fig. 7, the electronic device may include: a processor 702, a communication interface (Communications Interface), a memory 706, and a communication bus 708.
Wherein:
processor 702, communication interface 704, and memory 706 perform communication with each other via a communication bus 708.
Communication interface 704 for communicating with other electronic devices or servers.
The processor 702 is configured to execute the program 510, and may specifically perform relevant steps in the foregoing embodiments of the method for generating a check code.
In particular, program 510 may include program code including computer-operating instructions.
The processor 702 may be a Central Processing Unit (CPU) or an Application-specific integrated Circuit (ASIC) or one or more integrated circuits configured to implement embodiments of the present application. The one or more processors comprised by the smart device may be the same type of processor, such as one or more CPUs; but may also be different types of processors such as one or more CPUs and one or more ASICs.
Memory 706 for storing program 510. The memory 706 may comprise high-speed RAM memory or may further comprise non-volatile memory (non-volatile memory), such as at least one disk memory.
The program 510 may be specifically operable to cause the processor 702 to:
acquiring identifiable test jobs, wherein each test job encapsulates a plurality of test cases;
determining a real-time load of a test server running the test job;
generating a test strategy configuration according to the real-time load, wherein the test strategy configuration at least comprises: the corresponding relation between the test server and the test job which can be operated by the test server;
And generating a scheduling policy of the test job according to the test policy configuration so as to run the test job with the corresponding relation with the test server on the test server.
Or:
Reporting real-time load of a test server running test jobs, wherein each test job is packaged with a plurality of test cases;
according to a scheduling strategy of the test job, running the test job with the corresponding relation with the test server on the test server;
The corresponding relation is included in a test strategy configuration generated according to the real-time load, and the scheduling strategy of the test job is generated according to the test strategy configuration.
The specific implementation of each step in the program 510 may refer to corresponding steps and corresponding descriptions in units in the method embodiment, which are not repeated herein. It will be clear to those skilled in the art that, for convenience and brevity of description, specific working procedures of the apparatus and modules described above may refer to corresponding procedure descriptions in the foregoing method embodiments, which are not repeated herein.
The present application also provides a computer storage medium having stored thereon a computer executable program, the processor being configured to run the computer executable program to implement any of the methods of the embodiments of the present application.
The above examples are only specific embodiments of the present application, and are not intended to limit the scope of the present application, but it should be understood by those skilled in the art that the present application is not limited thereto, and that the present application is described in detail with reference to the foregoing examples: any person skilled in the art may modify or easily conceive of the technical solution described in the foregoing embodiments, or perform equivalent substitution of some of the technical features, while remaining within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.

Claims (6)

1. A method of testing, comprising:
The method comprises the steps of obtaining identifiable test jobs, wherein each test job encapsulates a plurality of test cases, and the method comprises the following steps of: acquiring a test job identifiable by LSF, wherein a plurality of test cases are packaged in the test job according to a list;
determining a real-time load of a test server running the test job;
generating a test strategy configuration according to the real-time load, wherein the test strategy configuration at least comprises: the corresponding relation between the test server and the test job which can be operated by the test server;
Generating a scheduling policy of the test job according to the test policy configuration to run the test job having the corresponding relation with the test server on the test server, wherein generating the test policy configuration according to the real-time load includes: generating a test configuration strategy for performing regression testing on the test case with failed operation according to the real-time load, and generating a scheduling strategy of the test job according to the test strategy configuration so as to operate the test job with the corresponding relation with the test server on the test server, wherein the method comprises the following steps: generating a scheduling policy of the test job for the test cases with the operation failure according to the test policy configuration so as to operate the test cases with the operation failure, which have the corresponding relation with the test server, on the test server; the test configuration policy includes a test policy configuration table, which is used for recording test cases participating in each regression test, and generating a scheduling policy of the test job according to the test policy configuration, so as to run the test job having the corresponding relation with the test server on the test server, and then includes: obtaining test results aiming at the test job, carrying out statistics on the test results of all the test jobs to generate a test report,
The test job comprises a test job description file, the test job description file comprises a test case list, and the test case list records at least one of an ID of a test case, a storage path of the test case and a dependency relationship of the test case by taking the test case as a unit.
2. A method of testing, comprising:
Reporting real-time load of a test server running test jobs, wherein each test job is packaged with a plurality of test cases;
According to a scheduling strategy of the test job, running the test job with a corresponding relation with the test server on the test server;
wherein the correspondence is included in a test policy configuration generated according to the real-time load, a scheduling policy of the test job is generated according to the test policy configuration,
The test job is a test job identifiable by LSF, in which a plurality of test cases are packaged by list,
The test job comprises a test job description file, the test job description file comprises a test case list, and the test case list records at least one of an ID of a test case, a storage path of the test case and a dependency relationship of the test case by taking the test case as a unit.
3. A test device, comprising:
The device comprises a job acquisition unit, a test processing unit and a test processing unit, wherein the job acquisition unit is used for acquiring identifiable test jobs, each test job is packaged with a plurality of test cases, and the identifiable test jobs are specifically acquired: acquiring a test job identifiable by LSF, wherein a plurality of test cases are packaged in the test job according to a list;
a load determining unit for determining a real-time load of a test server running the test job;
The policy configuration unit is configured to generate a test policy configuration according to the real-time load, where the test policy configuration at least includes: the corresponding relation between the test server and the test job which can be operated by the test server, wherein the generating test strategy configuration according to the real-time load comprises the following steps: generating a test configuration strategy for performing regression testing on the test case with failed operation according to the real-time load, generating a scheduling strategy of the test job according to the test strategy configuration so as to operate the test job with the corresponding relation with the test server on the test server, wherein the method comprises the following steps: generating a scheduling policy of the test job for the test cases with the operation failure according to the test policy configuration so as to operate the test cases with the operation failure, which have the corresponding relation with the test server, on the test server; the test configuration policy includes a test policy configuration table, which is used for recording test cases participating in each regression test, and generating a scheduling policy of the test job according to the test policy configuration, so as to run the test job having the corresponding relation with the test server on the test server, and then includes: obtaining test results aiming at the test jobs, and carrying out statistics on the test results of all the test jobs to generate a test report;
A scheduling unit for generating a scheduling policy of the test job according to the test policy configuration to run the test job having the correspondence with the test server on the test server,
The test job comprises a test job description file, the test job description file comprises a test case list, and the test case list records at least one of an ID of a test case, a storage path of the test case and a dependency relationship of the test case by taking the test case as a unit.
4. A test device, comprising:
The reporting unit is used for reporting the real-time load of the test server running the test jobs, and each test job is packaged with a plurality of test cases;
the operation unit is used for operating the test job with a corresponding relation with the test server on the test server according to the scheduling strategy of the test job;
wherein the correspondence is included in a test policy configuration generated according to the real-time load, a scheduling policy of the test job is generated according to the test policy configuration,
The test job is a test job identifiable by LSF, in which a plurality of test cases are packaged by list,
The test job comprises a test job description file, the test job description file comprises a test case list, and the test case list records at least one of an ID of a test case, a storage path of the test case and a dependency relationship of the test case by taking the test case as a unit.
5. A test system comprising a dispatch server and a test server, wherein:
the scheduling server is configured to implement the test method of claim 1,
The test server is used for realizing the test method of claim 2.
6. An electronic device comprising a memory for storing a computer executable program thereon and a processor for running the computer executable program to implement the method of claim 1 or 2.
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