CN103983871A

CN103983871A - VXI module tester based on FPGA

Info

Publication number: CN103983871A
Application number: CN201410206188.5A
Authority: CN
Inventors: 李冰; 陈美远; 刘江华; 张少杰; 于海强
Original assignee: Harbin Engineering University
Current assignee: Harbin Engineering University
Priority date: 2014-05-16
Filing date: 2014-05-16
Publication date: 2014-08-13
Anticipated expiration: 2034-05-16
Also published as: CN103983871B

Abstract

The invention relates to a VXI module tester based on an FPGA. According to the VXI module tester based on the FPGA, the FPGA meets the requirements of various modules of a VXI bus protocol. The VXI module tester comprises an FPGA core processing module, an analog signal providing module, an analog signal acquisition module, a digital signal acquisition module, a digital signal providing module, a test task setting module, a test process and result display module, a switch opto-isolator module and a linear opto-isolator module. The VXI module tester is an instrument special for testing the VXI modules, and a VXI system is widely used for the fields of aerospace, industrial production and the like. The problem of testing of all modules in the VXI system can be easily solved, faults and hidden dangers in the VXI system are effectively reduced, and the completion effect on large-scale application of the VXI system is achieved.

Description

A kind of VXI module tester based on FPGA

Technical field

What the present invention relates to is a kind of VXI module tester based on FPGA of a kind of field programmable gate array various modules of meeting vxi bus agreement.

Background technology

FPGA is the english abbreviation of field programmable gate array, and inside comprises configurable logic blocks CLB (Configurable Logic Block), input/output module IOB (Input Output Block) and three parts of interconnector (Interconnect).The logical block of FPGA can change according to deviser's demand with being connected, and system designer can couple together the logical block of FPGA inside by editable connection as required, so by programming, FPGA can realize multiple different function.Use hardware program language can produce easily various required sequential simultaneously, in system testing, there is very large advantage.Vxi bus is the expansion of VME bus at instrument field, is the modularization robotic instrument system that computing machine is handled.Through development for many years, it relies on effective standardization, adopts modular mode, has realized interchangeability and the interoperability of seriation, universalization and vxi bus instrument.Its open architecture meets the requirement of information products completely.Today, vxi bus instrument and system are generally accepted for common people, and become the main flow of instrument system development.

Because VXI system is to be made up of one or more VXI modules, the performance quality of module directly affects the performance of whole VXI system, therefore the test of the performance of module own is just seemed to particularly important.And present stage is for the detection of VXI module, all rest on the simple device such as engineering experience and multimeter and some position of module is carried out in the level of local detection, do not have a kind of moulding, systematized means of testing and instrument, and this mode needs dismounting VXI module sometimes, and can not be used further to reliability requirement working environment by the module of dismounting, not only test result is unintelligible, also the feasible degree of work that has reduced module, therefore the invention of this testing tool has the urgent market demand simultaneously.

Summary of the invention

The object of the present invention is to provide a kind of testing tool that can test VXI performance of module quality.

The object of the present invention is achieved like this:

The present invention includes fpga core processing module, simulating signal provides module, collection of simulant signal module, digital signal acquiring module, digital signal provides module, test assignment setting module, test process and result display module, switch light-coupled isolation module, linear optical coupling isolation module, be connected with VXI module by J14A interface, under electrical isolation, provide module by simulating signal, digital signal provides module to VXI module input valid data, by collection of simulant signal module, digital signal acquiring module gathers the output of VXI module, diagnose VXI module whether intact by data processing again, whether the performance of the velocity determination VXI module by data stream can also meet the requirement of VXI system, complete the test of VXI module, fpga core processing module, uses FPGA as kernel control chip, EPCS family chip storage code, and SDRAM is used for storing data, FPGA is determining that control simulation and digital signal acquiring part after test assignment gather the output signal of VXI module, control figure signal provides module and simulating signal to provide module to provide test signal to VXI module, test process utilizes SDRAM access data as required, by input/output signal and program preset value are relatively obtained to test result, corresponding information is presented on colorful display screen, collection of simulant signal/provide module to adopt AD and DA converter and application accordingly to support circuit to form, adopts precision photoelectric coupler to realize electrical isolation between module and does not change the feature of simulating output waveform, AD converter receives the order from FPGA, realizes the collection of module simulation output waveform, FPGA controls DA converter to tested module input test waveform, digital signal acquiring module and digital signal provide module to adopt common I/O mouth to form, realize the electrical isolation between module by switching mode photoelectrical coupler, utilize input port to gather the data of module output, utilize delivery outlet to provide test data or interrupt trigger signal to VXI module, test assignment setting module is made up of the 4*4 matrix keyboard of standard, switch light-coupled isolation module, linear optical coupling isolation module are made up of switch photoelectric coupled device and precision photoelectric coupler part, for realizing the linear photoconductor coupling of simulating signal between instrument and VXI module and the switch photoelectric coupling of digital signal, reach the effect of protection VXI module and testing tool.

Test process and result display module are made up of 2.4 cun of TFT colorful display screens, for showing current test assignment, and test process and test result, and possible failure message.

Beneficial effect of the present invention is:

1. the instrument that the present invention proposes a kind of special test VXI module, VXI system is just being widely used in the field such as Aero-Space and commercial production; The present invention is conducive to solve the test problem of each module in VXI system, effectively reduces the fault and the hidden danger that in VXI system, exist, and the large-scale application of VXI system is had to complete effect.

2. in the present invention, adopt the FPGA of powerful, applying flexible as core processor, there is the feature of field-programmable, can realize the huge test assignment of multiple difference by field programming, be conducive to reduce costs, expanded instrumental function.

3. the present invention adopts modular expansion mode, for special test assignment, can build the test environment meeting the demands by amendment among a small circle, completes smoothly test assignment.

4. the present invention has perfect quarantine measures, can effectively avoid the phase mutual interference between testing tool and VXI module, has higher measuring accuracy and confidence level.

5. system has the interpersonal interactive interface that improves close friend, by test process controllable visual, for tester provides abundanter detecting information, is conducive to carry out fault analysis.

Brief description of the drawings

Fig. 1 is system architecture diagram of the present invention;

Fig. 2 is system layout of the present invention schematic diagram;

Fig. 3 is software flow pattern of the present invention.

Embodiment

For example the present invention is described in more detail below in conjunction with accompanying drawing:

The present invention, taking exciter response measuring technology as principle, by VXI module being applied to the dynamic exciting of certain specification and feature, tests its output response, by the analysis to Excitation and response, and the residing dynamic property of the equipment that draws; The Static output that gathers VXI module in static state, the data that collect by processing draw the residing state of module and static properties.

For the test of completion system VXI module, the present invention is by fpga core processing module, collection of simulant signal/provide module, digital signal acquiring/provide module, test assignment setting module and test process and result display module to form, be connected with VXI module by typical J14A connector, between instrument and module, adopt switch/linear optical coupling to realize electrical isolation.

Collection of simulant signal/provide module adopts AD and DA converter and corresponding application to support circuit to form, and adopts precision photoelectric coupler in electrical isolation, not change the feature of simulation output waveform realizing between module; AD converter receives the order from FPGA, realizes the collection of module simulation output waveform; FPGA controls as required DA converter and inputs required test waveform to tested module.

Digital signal acquiring/provide module to adopt common I/O mouth to form, realize the electrical isolation between module by switching mode photoelectrical coupler, utilize input port to gather the data of module output, utilize delivery outlet to provide test required data or interrupt trigger signal to VXI module.

Test assignment setting module is made up of the 4*4 matrix keyboard of standard, by different Macintosh input test demands.

Fpga core processing module uses FPGA as kernel control chip, EPCS family chip storage code, and SDRAM is used for storing data; FPGA is determining that control simulation and digital signal acquiring part after test assignment gather the output signal of VXI module, control simulation and digital signal provide part to provide corresponding test signal to VXI module as required simultaneously, test process utilizes SDRAM access data as required, by input/output signal and program preset value are relatively obtained to test result, corresponding information is presented on colorful display screen.

In the present invention, the actual problem solving is: in VXI system, each VXI module is because long-term its function and the reliability of using dare not ensure, now just need to test VXI module, and also there is no the testing tool designing for VXI module specially now, can only lean on basic micro-judgment; The present invention proposes a kind ofly specially for the testing tool of VXI module, high efficient and reliable VXI module is tested in real system, ensures the reliability service of VXI system.

In conjunction with Fig. 1, Fig. 1 is system architecture diagram of the present invention; Native system is by fpga core processing module, collection of simulant signal/provide module, digital signal acquiring/provide module, test assignment setting module, test process and result display module and switch/linear optical coupling isolation module etc. to form.At data input pin, simulating signal and digital signal enter collection of simulant signal module and digital signal acquiring module by linear and switch light-coupled isolation respectively, collection of simulant signal module is changed simulating signal is changed into digital signal transfers to FPGA by AD, and digital signal is directly gathered by the I/O mouth of FPGA; At data output end, digital signal is directly exported by FPGA, outputs to VXI module interface end by switch light-coupled isolation, and simulating signal is controlled DA chip by FPGA, after changing by DA, be output as simulating signal, this simulating signal is passed through linear optical coupling Isolation input in the middle of VXI module; FPGA control module is as the system core, the each module co-ordination of unified call system, obtain external tasks information by task setting module, call corresponding module according to the difference of test assignment and complete data output or acquisition tasks, draw test result and be presented on color screen by data processing.

In conjunction with Fig. 2, Fig. 2 is system layout of the present invention schematic diagram, the present invention is for the test of the each VXI module of VXI system, VXI module is generally all with similar interfaces such as J14A, to realize and outside data interaction, native system utilizes this class interface of VXI module just, under the prerequisite of electrical isolation, control DA and common I/O mouth is inputted effective analog/digital signal to VXI module by FPGA, and gather by AD and common I/O mouth the analog and digital signal that VXI module is exported, diagnose this VXI module whether intact by data processing again, by the speed of data stream, whether the performance that can measure VXI module can also meet the existing requirement of VXI system, complete the multinomial test assignment of VXI module by similar method.

In conjunction with Fig. 3, Fig. 3 is software flow pattern of the present invention; After powering on, first system completes initial work; Judge whether busy signal is " 0 ", " 0 " expression system free time, can carry out task setting, " 1 " representative system is just busy, can not carry out task setting; In the time that busy signal is " 0 ", wait for extraneous incoming task set information; Confirming after task set busy signal and calling corresponding program, according to task needs, corresponding input/output module is set, then exports corresponding data to VXI module by input/output module, and utilize the output information of data collecting module collected VXI module; Finally, by the data of output and the data that collect are carried out to data processing, obtain result the busy signal that resets of this time test, come back to busy signal judgement, to set new task.

Claims

1. the VXI module tester based on FPGA, comprise fpga core processing module, simulating signal provides module, collection of simulant signal module, digital signal acquiring module, digital signal provides module, test assignment setting module, test process and result display module, switch light-coupled isolation module, linear optical coupling isolation module, it is characterized in that: be connected with VXI module by J14A interface, under electrical isolation, provide module by simulating signal, digital signal provides module to VXI module input valid data, by collection of simulant signal module, digital signal acquiring module gathers the output of VXI module, diagnose VXI module whether intact by data processing again, whether the performance of the velocity determination VXI module by data stream can also meet the requirement of VXI system, complete the test of VXI module, fpga core processing module, uses FPGA as kernel control chip, EPCS family chip storage code, and SDRAM is used for storing data, FPGA is determining that control simulation and digital signal acquiring part after test assignment gather the output signal of VXI module, control figure signal provides module and simulating signal to provide module to provide test signal to VXI module, test process utilizes SDRAM access data as required, by input/output signal and program preset value are relatively obtained to test result, corresponding information is presented on colorful display screen, collection of simulant signal/provide module to adopt AD and DA converter and application accordingly to support circuit to form, adopts precision photoelectric coupler to realize electrical isolation between module and does not change the feature of simulating output waveform, AD converter receives the order from FPGA, realizes the collection of module simulation output waveform, FPGA controls DA converter to tested module input test waveform, digital signal acquiring module and digital signal provide module to adopt common I/O mouth to form, realize the electrical isolation between module by switching mode photoelectrical coupler, utilize input port to gather the data of module output, utilize delivery outlet to provide test data or interrupt trigger signal to VXI module, test assignment setting module is made up of the 4*4 matrix keyboard of standard, switch light-coupled isolation module, linear optical coupling isolation module are made up of switch photoelectric coupled device and precision photoelectric coupler part, for realizing the linear photoconductor coupling of simulating signal between instrument and VXI module and the switch photoelectric coupling of digital signal, reach the effect of protection VXI module and testing tool.

2. a kind of VXI module tester based on FPGA according to claim 1, it is characterized in that: described test process and result display module are made up of 2.4 cun of TFT colorful display screens, be used for showing current test assignment, test process and test result, and possible failure message.