CN103926431B - Cable connection device and method for circuit board ionic migration test - Google Patents
Cable connection device and method for circuit board ionic migration test Download PDFInfo
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- CN103926431B CN103926431B CN201410191147.3A CN201410191147A CN103926431B CN 103926431 B CN103926431 B CN 103926431B CN 201410191147 A CN201410191147 A CN 201410191147A CN 103926431 B CN103926431 B CN 103926431B
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Abstract
The invention provides a cable connection device and method for a circuit board ionic migration test. The device comprises two fixed bottom plates which are opposite, four stand columns, an upper frame, a lower frame, a plurality of racks, at least two reinforcing plates, at least two terminal fixing plates, a plurality of terminals, and a top plate. The four stand columns are arranged on the upper end faces of opposite sides of the two fixed bottom plates respectively, stand column fixing blocks are arranged on four corners of the upper frame and four corners of the lower frame respectively, a plurality of guiding grooves are formed in the two long edge bars of the upper frame in the length direction and the two long edge bars of the lower frame in the length direction respectively, the two ends of each rack are inserted to the guiding grooves in the two long edge bars of the upper frame and the two long edge bars of the lower frame respectively and are locked by retaining nuts, tooth grooves are formed in the inner side faces of wide edge bars of the upper frame and wide edge bars of the lower frame respectively, the two reinforcing plates are arranged on the upper end faces of the outer sides of the two fixed bottom plates, the two terminal fixing plates are arranged on the upper end faces of the reinforcing plates respectively, the terminals are arranged in the length direction of the terminal fixing plates, the top plate is rectangular, and fixing sleeves or grooves capable of being fixed on the four stand columns in a sleeved mode are arranged on the four corners of the lower end face of the top plate. Cleaning is convenient after cables are welded, consumption of cables in the ionic migration test is low, the system utilization rate of the ionic migration test is high, and samples are not prone to pollution and short circuit in the test process.
Description
Technical field
The present invention relates to circuit board measuring method, more particularly to a kind of cable connecting arrangement of wiring board Ion transfer test
And method of attachment.
Background technology
In the Ion transfer test of assist side, need wiring board is positioned in hot and humid environmental test chamber, and
Welding cable line, leads in the relevant test equipment outside environmental test chamber in the circuit board, to apply in the circuit board to promote
Bias voltage and carry out megger test that Ion transfer occurs.
Cable connection methods in existing Ion transfer test, are using a test cable, one end of test cable
For connector, the other end is wire, during test, directly couples together Ion transfer test system and test sample, that is, tests
The connector of cable one end is connected on the connector of Ion transfer test system, and the wire of the test cable other end is welded on survey
On test agent, test sample is placed on stainless steel flashboard rack.
Cable connection methods in existing Ion transfer test, the problem that its test cable coupling part is primarily present
It is：
First, typically from environmental test chamber to case outside test equipment need 2 meters to some meters of cable, so long electricity
Cable adds connector, causes when by cable welding to wiring board, and operation is inconvenient.After the completion of especially welding, must
The residual of scaling powder on wiring board need to be cleaned up completely, being connected to such long cable on wiring board can cause cleaning operation
It is inconvenient, sometimes resulting in cleaning does not thoroughly cause test crash.
Second, as the test of general Ion transfer can continue 100-1000 hours or even longer, test cable is tried in environment
In tryoff, after the test of multiple Ion transfer, the conductor part in cable insulation wrapper therein, especially near pad
Part can also be corroded, and when can so cause welding next time, the solderability of the conductor of cable is bad, it is very difficult to weld, so as to not
Obtain and the cable of the very long part of one end of the wire of test cable is not cut, to expose the cable conductor portion not being corroded
Point, can so greatly speed up the consumption of test cable line, be consumed to not enough JA(junction ambient) chamber to the test equipment outside case with
During product to be measured in environmental test chamber to case, the cable can not be reused, and now cable still has 2 meters or so even more
It is long.The cable for remaking connection Ion transfer test system is very troublesome.
3rd, as test cable needs good insulating properties, therefore price is all costly, and general a set of ion is moved
Move test system and only match somebody with somebody a set of test cable, such next group sample is if desired for test, it is necessary to when front a collection of test is completed, and
Test cable is removed into the solderable next group wiring board sample in rear from its wiring board, the utilization of test equipment can be so reduced
Rate.
In cable connection methods in existing Ion transfer test, the problem that sample bay is primarily present is：
First, using stainless steel material, stainless steel material is although corrosion-resistant, but if uses through very long test
Afterwards, some slight corrosion are still had.Cleaning is very difficult to after metal oxide spot is stain in bay in addition, these corrosion
May Contamination measurement sample in test with spot.
Second, using stainless steel material, in testing, if sample has been moved in bay, it is easily caused test specimens
The short circuit of product, forms false failure.If the pad of test sample is very close to the edge of sample, when bay is inserted,
Pad and bay contact short circuit is easily caused, false failure is formed.
3rd, stainless steel bay can only be smaller in width adjustment width, the sample size scope of adaptation.
4th, when sample is tested in environmental test chamber, due to environmental test chamber defect or it is aging cause tank wall every
When hot property is deteriorated, the air of high humility easily condenses on tank wall and case top, if condensation is dropped onto on sample, can cause sample
The insulaion resistance of product declines or short circuit, so as to the failure for causing to test.
The content of the invention
It is an object of the invention to provide a kind of cable connecting arrangement of wiring board Ion transfer test and method of attachment, weldering
Connect easy to clean after cable, the consumption of Ion transfer test cable is little, the utilization rate of Ion transfer test system is high, test process
Middle sample is difficult contaminated and short circuit.
For reaching above-mentioned purpose, the technical scheme is that：
A kind of cable connecting arrangement of wiring board Ion transfer test, which includes, two fix base plate, are oppositely arranged；Four
Column, is arranged at the upper surface of two described fixation base plate opposite sides two-by-two；Upper and lower framework, is rectangular frame structure, and which four
Individual corner is provided with the column fixed block that can be arranged on four root post；Two long margin frame bars of upper and lower framework are along length side
To opening up some guide grooves；Some tooth bars, its two ends are inserted in the guide groove of two long margin frame bars of upper and lower frames respectively, and by fixed spiral shell
Female locking；It is provided with the broadside moulding medial surface of upper and lower framework and tooth bar teeth groove teeth groove of the same size；At least two strengthen
Plate, is respectively arranged at the upper surface of two fixation plate outer sides；At least two binding post fixed plates, are respectively arranged at described adding
Strong plate upper surface；Some binding posts, are arranged along binding post fixed plate length direction respectively；Top board, is rectangle, and size is
The binding post can be covered；Four corner of top board lower surface sets and can be arranged the fixed cover or groove that are fixed on four columns.
Further, described tooth bar is cylinder, along its cylindrical surface peripheral is provided with teeth groove.
Also, described slot form is rectangle, trapezoidal or triangle.
Described binding post is respectively provided with two binding post fixed plates in pairs, and is electrically connected with each other.
In addition, cable connecting arrangement part of the present invention uses fluoroplastics, polyethylene, polypropylene or polyvinyl chloride material
Material makes.
Described top board is made using stainless steel, epoxy resin, polypropylene, polyethylene or fluoro-containing plastic.
The method of attachment of the cable connecting arrangement of wiring board Ion transfer test of the present invention, is characterized in that,
A) first first test cable one end is connected under test line plate；
B) according under test line plate width, spacing of the upper and lower framework on column is adjusted, this is smaller than measurement circuit
Plate width, then fixes upper and lower framework；One or several tooth bars in underframe is selected, according under test line plate length, is being led
Adjusting gear rack position in groove, makes tooth bar be located under test line plate length range, then fixes tooth bar with fixing nut, should
A little tooth bars are supported as the bottom of under test line plate；Two toothed racks of upper frame are selected, in the corresponding guide groove of two toothed racks
Interior adjusting gear rack, makes under test line plate both sides be embedded in the teeth groove of two toothed rack, then tooth bar is solid with fixing nut
Fixed, so far under test line plate is completely fixed；
C) the first test cable other end for having been connected under test line plate is connected in binding post fixed plate
Binding post；The binding post that one end of second test cable is connected in binding post fixed plate will be connected to first,
Two test cables are put into environmental test chamber with the attachment means for securing under test line plate, and the second test cable other end is connected
It is connected on the connector of Ion transfer test system, so far completes the cable connection before testing.
Beneficial effects of the present invention：
First, due to the cable of every time connection binding post and under test line plate it is shorter, ten when being subjected to
Divide convenient.And after the completion of welding, also very convenient when being cleaned, cleaning performance is also more preferable.
Second, as the cable for connecting binding post and under test line plate every time is shorter, can use every time new
Cable, and the conductor of new cable does not corrode, and its solderability is excellent, it is possible to use without the solder stick of scaling powder, from
And eliminate the possibility of pollution of scaling powder.The cable of connection Ion transfer test system and binding post can then be fixed, and not have
The erodable section that needs cut off, therefore will not consume because repeatedly testing.The cable of connection binding post and sample is due to comparing
Short, after carrying out primary ions migration test, the corrosion condition that can regard conductor part is reused or is changed, even if changing,
As its length is shorter, the test equipment outside environmental test chamber to case and environmental test is directly connected to relative to using a cable
The method of case to product to be measured in case, its consumption are less.
3rd, as cable used by welding is separated with the cable for being connected Ion transfer test system, therefore one on carrying out
When criticizing the Ion transfer test of sample, you can to carry out the pretreatments such as the welding cleaning of next group sample, so as to improve test it is
The utilization rate of system.
Compare with the cable connection methods in the test of existing Ion transfer and sample bay, it is an advantage of the invention that：
First, attachment means of the present invention use fluoro-containing plastic, perfluoroplastic or polypropylene material, do not have in wet condition
The problem of corrosion, spot can be cleaned using strong acid or highly basic.
Second, attachment means of the present invention are tried to use fluoro-containing plastic, perfluoroplastic material at the draw-in groove of wiring board in contact measured
Material, even if therefore measurement circuit plate moved in bay, or the pad of under test line plate is very close to be tested
The edge of wiring board, pad are contacted with bay draw-in groove, are also not result in short-circuit failure.
3rd, attachment means of the present invention can be adjusted on width and short transverse, the under test line board size of adaptation
Non- constant width, under test line plate width can be from 15mm to 500mm, and the height of under test line plate is then unrestricted.
4th, top board drips for anti-condensation, as two sides is all exposed in hot and humid environment, the temperature difference on two sides
Different very little, therefore will not condense.Top board can block the condensation drippage of environmental test box top, prevent which from dropping onto line to be tested
Cause test crash on the plate of road.
Description of the drawings
Fig. 1 is the top view of cable connecting arrangement embodiment of the present invention.
Fig. 2 is the front view of cable connecting arrangement embodiment of the present invention.
Fig. 3 is the left view of cable connecting arrangement embodiment of the present invention.
Fig. 4 is the upward view of top board in cable connecting arrangement embodiment of the present invention.
Specific embodiment
Referring to Fig. 1～Fig. 4, the cable connecting arrangement of the wiring board Ion transfer test of the present invention, which includes, two fix bottom
Plate 1,1 ', is oppositely arranged；Four root posts 2,3 (by taking a heel post 2,3 as an example, similarly hereinafter), are arranged at two described fixation bottoms two-by-two
Plate 1, the upper surface of 1 ' opposite side；Upper and lower framework 4,5, is rectangular frame structure, its four corners be provided with can be arranged in it is described
Column fixed block 41,51 on four root posts 2,3；Upper and lower framework 4,5 two long margin frame bars 42,52 (with long margin frame bar 42,
Some guide grooves 421,521 are opened up along its length as a example by 52, similarly hereinafter)；Some tooth bars 6,6 ', its two ends is inserted in upper and lower frames respectively
The guide groove 421,521 of 4,5 two long margin frame bars 42,52 of frame, and locked by fixing nut 7,7 '；The Wide frame of upper and lower framework 4,5
It is provided with bar 43 (by taking broadside moulding 43 as an example, similarly hereinafter) medial surface and tooth bar teeth groove teeth groove of the same size 431；At least two add
Strong plate 8,8 ', the upper surface being respectively arranged on the outside of two fixation base plates 1,1 '；At least two binding post fixed plates 9,9 ', respectively
It is arranged at described reinforcing plate 8,8 ' upper surfaces；Some binding posts 10,10 ', respectively along binding post fixed plate 9,9 ' length
Direction is arranged；Top board 11, is rectangle, and size is to cover the binding post；11 lower surface of top board, four corner sets and can be arranged
It is fixed on the fixed cover 111 or groove of four columns.
Further, described tooth bar 6,6 ' is cylinder, along its cylindrical surface peripheral is provided with teeth groove；Described slot form
For rectangle, trapezoidal or triangle.
In the present embodiment, described binding post is respectively provided with two binding post fixed plates in couples.
Described cable connecting arrangement part is made using fluoroplastics, polyethylene, polypropylene or pvc material.It is described
Top board 11 made using stainless steel, epoxy resin, polypropylene, polyethylene, fluoro-containing plastic or perfluoroplastic material.
The method of attachment of the cable connecting arrangement of wiring board Ion transfer test of the present invention, which includes,
A) first first test cable one end is connected under test line plate；
B) according under test line plate width, spacing of the upper and lower framework on column is adjusted, this is smaller than measurement circuit
Plate width, then fixes upper and lower framework；One or several tooth bars in underframe is selected, according under test line plate length, is being led
Adjusting gear rack position in groove, makes tooth bar be located under test line plate length range, then fixes tooth bar with fixing nut, should
A little tooth bars are supported as the bottom of under test line plate；Two toothed racks of upper frame are selected, in the corresponding guide groove of two toothed racks
Interior adjusting gear rack, makes under test line plate both sides be embedded in the teeth groove of two toothed rack, then tooth bar is solid with fixing nut
Fixed, so far under test line plate is completely fixed；
C) the first test cable other end for having been connected under test line plate is connected in binding post fixed plate
Binding post；The binding post that one end of second test cable is connected in binding post fixed plate will be connected to first,
Two test cables are put into environmental test chamber with the attachment means for securing under test line plate, and the second test cable other end is connected
It is connected on the connector of Ion transfer test system, so far completes the cable connection before testing.
Claims (7)
1. the cable connecting arrangement that a kind of wiring board Ion transfer is tested, it is characterised in that include,
Two fix base plate, are oppositely arranged；
Four root posts, are arranged at the upper surface of two described fixation base plate opposite sides two-by-two；
Upper and lower framework, is rectangular frame structure, and its four corners are provided with the column that can be arranged on four root post and fix
Block；Two long margin frame bars of upper and lower framework open up some guide grooves along its length；
Some tooth bars, its two ends are inserted in the guide groove of two long margin frame bars of upper and lower frames respectively, and are locked by fixing nut；Upper,
It is provided with the broadside moulding medial surface of underframe and tooth bar teeth groove teeth groove of the same size；
At least two reinforcing plates, are respectively arranged at the upper surface of two fixation plate outer sides；
At least two binding post fixed plates, are respectively arranged at described reinforcing plate upper surface；
Some binding posts, are arranged along the binding post fixed plate length direction respectively；
Top board, is rectangle, and size is to cover the binding post；Four corner of top board lower surface set can be arranged be fixed on four stand
The fixed cover or groove of post.
2. the cable connecting arrangement that wiring board Ion transfer as claimed in claim 1 is tested, it is characterised in that described tooth bar
For cylinder, teeth groove is provided with along its cylindrical surface peripheral.
3. the cable connecting arrangement that wiring board Ion transfer as claimed in claim 1 or 2 is tested, it is characterised in that described
Slot form is rectangle, trapezoidal or triangle.
4. the cable connecting arrangement that wiring board Ion transfer as claimed in claim 1 or 2 is tested, it is characterised in that described
Binding post is respectively provided with two binding post fixed plates in pairs.
5. the cable connecting arrangement that wiring board Ion transfer as claimed in claim 1 is tested, it is characterised in that described cable
Attachment means part is made using fluoroplastics, polyethylene, polypropylene or pvc material.
6. the cable connecting arrangement that wiring board Ion transfer as claimed in claim 1 is tested, it is characterised in that described top board
Made using stainless steel, epoxy resin, polypropylene, polyethylene or fluoro-containing plastic.
7. a kind of method of attachment of the cable connecting arrangement tested with wiring board Ion transfer as claimed in claim 1, which is special
Levying is,
A) first first test cable one end is connected under test line plate；
B) according under test line plate width, spacing of the upper and lower framework on column is adjusted, this is smaller than measurement circuit plate width
Degree, then fixes upper and lower framework；One or several tooth bars in underframe is selected, according under test line plate length, in guide groove
Adjusting gear rack position, makes tooth bar be located under test line plate length range, then fixes tooth bar with fixing nut, those teeth
Bar is supported as the bottom of under test line plate；Two toothed racks of upper frame are selected, is adjusted in the corresponding guide groove of two toothed racks
Section tooth bar, makes under test line plate both sides be embedded in the teeth groove of two toothed rack, then fixes tooth bar with fixing nut, extremely
This under test line plate is completely fixed；
C) the first test cable other end for having been connected under test line plate is connected to into the wiring in binding post fixed plate
Terminal；One end of second test cable is connected to into the binding post in binding post fixed plate, first, second survey will be connected to
Examination cable is put into environmental test chamber with the attachment means for securing under test line plate, and the second test cable other end is connected to
On the connector of Ion transfer test system, the cable connection before testing so far is completed.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410191147.3A CN103926431B (en) | 2014-05-07 | 2014-05-07 | Cable connection device and method for circuit board ionic migration test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410191147.3A CN103926431B (en) | 2014-05-07 | 2014-05-07 | Cable connection device and method for circuit board ionic migration test |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103926431A CN103926431A (en) | 2014-07-16 |
| CN103926431B true CN103926431B (en) | 2017-03-22 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410191147.3A Active CN103926431B (en) | 2014-05-07 | 2014-05-07 | Cable connection device and method for circuit board ionic migration test |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6424167B1 (en) * | 2000-03-22 | 2002-07-23 | National Semiconductor Corporation | Vibration resistant test module for use with semiconductor device test apparatus |
| CN201281718Y (en) * | 2008-08-21 | 2009-07-29 | 深圳市图德电子科技有限公司 | PCB board up-down pull type testing clamp jig |
| CN201364343Y (en) * | 2008-12-02 | 2009-12-16 | 深圳麦逊电子有限公司 | PCB flattener for PCB tester |
| CN201382978Y (en) * | 2008-12-30 | 2010-01-13 | 南京协力多层电路板有限公司 | Testing machine of electronic circuit board |
| CN102621049A (en) * | 2012-01-16 | 2012-08-01 | 河海大学 | Concrete chloride ion migration coefficient load testing device under bending stress, and testing method thereof |
-
2014
- 2014-05-07 CN CN201410191147.3A patent/CN103926431B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6424167B1 (en) * | 2000-03-22 | 2002-07-23 | National Semiconductor Corporation | Vibration resistant test module for use with semiconductor device test apparatus |
| CN201281718Y (en) * | 2008-08-21 | 2009-07-29 | 深圳市图德电子科技有限公司 | PCB board up-down pull type testing clamp jig |
| CN201364343Y (en) * | 2008-12-02 | 2009-12-16 | 深圳麦逊电子有限公司 | PCB flattener for PCB tester |
| CN201382978Y (en) * | 2008-12-30 | 2010-01-13 | 南京协力多层电路板有限公司 | Testing machine of electronic circuit board |
| CN102621049A (en) * | 2012-01-16 | 2012-08-01 | 河海大学 | Concrete chloride ion migration coefficient load testing device under bending stress, and testing method thereof |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103926431A (en) | 2014-07-16 |
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