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CN103808978B - For carrying the jig of electronic device to be tested - Google Patents

For carrying the jig of electronic device to be tested Download PDF

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Publication number
CN103808978B
CN103808978B CN201210443026.4A CN201210443026A CN103808978B CN 103808978 B CN103808978 B CN 103808978B CN 201210443026 A CN201210443026 A CN 201210443026A CN 103808978 B CN103808978 B CN 103808978B
Authority
CN
China
Prior art keywords
electronic device
tested
plug
sliding groove
jig
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201210443026.4A
Other languages
Chinese (zh)
Other versions
CN103808978A (en
Inventor
吕理清
向健华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Yuzhan Precision Technology Co ltd
Hon Hai Precision Industry Co Ltd
Original Assignee
Shenzhen Yuzhan Precision Technology Co ltd
Hon Hai Precision Industry Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Yuzhan Precision Technology Co ltd, Hon Hai Precision Industry Co Ltd filed Critical Shenzhen Yuzhan Precision Technology Co ltd
Priority to CN201210443026.4A priority Critical patent/CN103808978B/en
Priority to TW101142984A priority patent/TW201423373A/en
Publication of CN103808978A publication Critical patent/CN103808978A/en
Application granted granted Critical
Publication of CN103808978B publication Critical patent/CN103808978B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The present invention provides a kind of jig for being used to carry electronic device to be tested, and including pallet, pallet is provided with the host cavity for accommodating electronic device to be tested, further includes two clamping pieces, a shifting part, a plug-assembly and a conductive contact component;A first sliding groove is additionally provided in pallet, the first sliding groove and the host cavity are mutually separated by a highlighted wall, highlighted wall is provided with two through-holes being connected with the first sliding groove and the host cavity and second sliding slot, second sliding slot is located between two through-holes, two clamping pieces are slidably received in respectively in two through-holes, shifting part is slidably contained in the first sliding groove, shifting part can push two clamping pieces to slide when being slided in the first sliding groove, clamping piece is used to block electronic device to be tested and make the electronic device to be tested that can not move;Conductive contact component is located at the end of pallet, and conductive contact component includes multiple conductive sheets, and each conductive sheet is connected with a conducting terminal of the plug.

Description

For carrying the jig of electronic device to be tested
Technical field
The present invention relates to a kind of jigs for carrying electronic device to be tested.
Background technology
Many electronic devices, such as mobile phone, tablet computer, laptop need to carry out multiple tracks work in process of production The test of sequence, therefore, it is necessary to be directed to different test settings accordingly carrying the jig of electronic device.For example, in electronics It after device is completed, needs electronic device being electrically connected to a test device, which sends to the electronic device and survey Trial signal is to test the software and hardware of electronic device.
Invention content
In view of this, the present invention provides a kind of jig for carrying electronic device to be tested, and electronic device can be electrically connected It is connected to a test device.
A kind of jig for being used to carry electronic device to be tested, including pallet, which is provided with host cavity, the host cavity For accommodating the electronic device to be tested, two clamping pieces, a shifting part, a plug-assembly and a conductive contact group are further included Part;A first sliding groove is additionally provided in the pallet, the first sliding groove and the host cavity are mutually separated by a highlighted wall, the highlighted wall Two through-holes being connected with the first sliding groove and the host cavity and second sliding slot are provided with, which is located at this two Between through-hole, the end of the pallet is provided with the accommodating cavity being connected with the first sliding groove;Two clamping pieces are slidably received respectively Hold in two through-holes, which is slidably contained in the first sliding groove, which slides in the first sliding groove When two clamping pieces can be pushed to be slided in two through-holes, the clamping piece is for blocking the electronic device to be tested and make The electronic device to be tested can not move;The conductive contact component is housed in the accommodating cavity, which includes more A conductive sheet, each conductive sheet are connected with a conducting terminal of the plug, and multiple conductive sheets of the conductive contact component are used for It is contacted with the probe of a test device, so as to which the electronic device to be tested is electrically connected to the test device so that this is to be tested Electronic device can receive the test signal of test device.
Using the jig of the present invention, electronic device can be electrically connected to a test device, so as to allow the test device Test signal is sent to the electronic device to test the software and hardware of electronic device.
Description of the drawings
Fig. 1 is that the jig of the present invention carries the stereogram of electronic device to be tested.
Fig. 2 is the stereogram of the jig of the present invention, illustrates that the locked position of a clamping piece as shown in Figure 1 is moved to one Unlocked position.
Fig. 3 is the exploded view of the jig of the present invention.
Fig. 4 is the plug-assembly of jig of the present invention and the exploded view of conductive contact component.
Fig. 5 is the plug-assembly of the jig of the present invention and the exploded view of another angle of conductive contact component.
Main element symbol description
Jig 100
Electronic device 200
Pallet 10
Host cavity 11
The first sliding groove 12
Side wall 121
Groove 122
Top 123
Opening 124
Bottom 125
Through-hole 126
Highlighted wall 13
Through-hole 131
Protrusion 14
Second sliding slot 15
Guiding rib 16
Accommodating cavity 17
Through-hole 171
Clamping piece 20
Sliding block 21
Protrusion 22
Container 23
Plane 231、233
Inclined-plane 232
Shifting part 30
Convex block 31
Ontology 32
Bending part 33
Push column 34
Plug-assembly 40
Plug 41
Main body 411
Conducting terminal part 412
Supporting part 42
Accommodating chamber 421
Stopper section 422、423
Extension 424
Cover board 43
Accommodating chamber 431
Extension 432
Guide groove 44
Conductive contact component 50
Conductive sheet 51
Top 511
Bottom 512
Isolation part 513
Conductive sheet supporting part 52
Card slot 521
Fixture block 522
Conductive sheet fixed part 53
Cover board 60
Through-hole 61
Connecting portion 70
Host cavity 71
Limiting section 72
Following specific embodiment will be further illustrated the present invention with reference to above-mentioned attached drawing.
Specific embodiment
Referring to Fig.1 and 2, a kind of include 10, two, pallet for carrying the jig 100 of electronic device 200 to be tested Clamping piece 20 and shifting part 30.The pallet 10 is provided with the host cavity 11 being adapted with the profile of electronic device 200, electronics dress Putting 200 can be housed in just in the host cavity 11.Fig. 3 is please also refer to, which further includes the plug-assembly 40, conduction Contact assembly 50 and cover board 60.
In the present embodiment, which is slideably contained in a first sliding groove 12 of the pallet 10.This One sliding slot 12 is mutually separated with the host cavity 11 by highlighted wall 13, which is provided with and the first sliding groove 12 and host cavity 11 Two through-holes 131 being connected, the through-hole 131 are used to slideably accommodate two clamping pieces 20.The plug-assembly 40 is located at Between two clamping pieces 20, it is slidably receivable in the second sliding slot 15 being located in highlighted wall 13 between two through-holes 131 In.The conductive contact component 50 is housed in the accommodating cavity 17 for being set to 10 end of pallet and being connected with host cavity 11.
The clamping piece 20 can opposing tray 10 slides in through-hole 131 along the X-direction in Fig. 1 and Fig. 2, the clamping piece 20 can block the electronic device 200 and be allowed to not move.The shifting part 30 can hang down along in Fig. 1 and Fig. 2 with X-direction Straight Y-direction opposing tray 10 in the first sliding groove 12 slides, which is used to that the clamping piece 20 to be pushed to slide.The plug Component 40 includes plug 41, which includes multiple conductive sheets 51, and each conductive sheet 51 passes through conducting wire(Do not show Go out)With a conducting terminal of plug 41(It is not shown)It is connected.In the present embodiment, the plug-assembly 40 and conductive contact Component 50 can be slided along the X-direction opposing tray 10 in Fig. 1 and Fig. 2.It is provided on the cover board 60 and multiple conductive sheet 51 corresponding through-holes 61.
In use, electronic device 200 to be tested is placed in the host cavity 11 first, and stirs the shifting part 30 and make this Clamping piece 20 blocks the electronic device 200, then pushes the plug-assembly 40, makes the conducting terminal partial insertion electronics of plug 41 In the slot of device 200.Hereafter, jig 100 is placed into test device(It is not shown)On, the probe of test device passes through the lid Through-hole 61 on plate 60 is in contact with conductive sheet 51, so as to which test device be electrically connected with the electronic device 200 to be tested.The survey Trial assembly, which is put, by reading data in electronic device 200 to be tested or data pair is written to electronic device 200 to be tested Electronic device 200 to be tested is tested.After the completion of test, sliding the plug-assembly 40 takes off the conducting terminal part of plug 41 From electronic device 200, then stirring the shifting part 30 makes the no longer clamping of clamping piece 20 electronic device 200, at this point it is possible to should Electronic device 200 takes out from host cavity 11.The concrete structure of jig 100 will be hereafter described in detail.
As shown in figure 3, in the present embodiment, the one side wall 121 of the first sliding groove 12 sets fluted 122, the groove 122 top 123 is provided with opening 124.The side of the shifting part 30 is provided with convex block 31, which is housed in the groove In 122, and it is inconsistent with its top 123.Since the convex block 31 is by the conflict at the top 123, which can not be detached from The first sliding groove 12.When needing to remove shifting part 30, the shifting part 30 is slided until the convex block 31 is moved to the opening 124 Position, the convex block 31 are no longer influenced by the limitation at the top 123, so as to allow that the shifting part 30 is taken out from the first sliding groove 12.
In the present embodiment, each clamping piece 20 includes sliding block 21 and the protrusion 22 stretched out from the end of sliding block 21. In the through-hole 131 of highlighted wall 13 that each sliding block 21 is slidably received in the pallet 10, and can be along in Fig. 1 and Fig. 2 X-direction opposing tray 10 slide.Two protrusions 14 are inwardly stretched out in one end of the pallet 10(Fig. 1 is visible).When the clamping piece 20 when sliding into latched position as shown in Figure 1, and the protrusion 22 and protrusion 14 catch on the upper surface of the electronic device 200, It can not be moved so as to which electronic device 200 is located in the host cavity 11.
As shown in figure 3, in the present embodiment, which further includes ontology 32 and from the both ends of ontology 32 to overhanging The bending part 33 gone out.The ontology 32 is housed in the through-hole 126 on the bottom 125 of the first sliding groove 12, which slides During to the end of ontology 32 and the position of the end thereof contacts of through-hole 126, which can not continue forward slip.
It is formed on the bending part 33 surface opposite with the bottom 125 and pushes column 34, on the sliding block 21 of the clamping piece 20 Container 23 is provided with, which is housed in the container 23.In the present embodiment, the container 23 is opposite Two side includes plane 231, plane 233 and the inclined-plane 232 for connecting plane 231 and 233.The plane 231 and 233 and Fig. 1 It is substantially parallel with the Y-direction in Fig. 2.Therefore, it is moved to when promotion column 34 follows shifting part 30 to move from one end of container 23 During the other end, which can touch one in two inclined-planes 232, so that the clamping piece 20 is by this It pushes the promotion of column 34 and slides.The clamping piece 20 therefore latched position that can be shown in Fig. 1 and unlocked position shown in Fig. 2 Between slide.
As shown in Figures 4 and 5, which further includes plug supporting part 42 and cover board 43, which passes through screw It is fixed on the supporting part 42.The cover board 43 is provided with accommodating chamber 431, and the accommodating chamber 431 and accommodating chamber 421 are formed and plug 41 The consistent cavity of the profile of main body 411, the main body 411 are housed in just in the cavity.The conducting terminal part of the plug 41 412 are fully located at except the cavity.The both ends of the accommodating chamber 421 are respectively arranged with stopper section 422 and 423, the master of the plug 41 The both ends of body 411 are inconsistent with stopper section 422 and 423 respectively, so as to making plug 41 by the limitation of stopper section 422 and 423 and It can not move.The length of the stopper section 422 is slightly less than the width of main body 411, in this way, after the completion of the test of electronic device 200, Operating personnel are pushed during conducting terminal part 412 extracted the slot of electronic device 200 by the plug-assembly 40, operating personnel The pulling force of application is uniformly applied to by stopper section 422 in the main body 411, so as to be conducive to the suitable of conducting terminal part 412 Profit is extracted.
In the present embodiment, the both sides of supporting part 42 are both provided with extension 424, and the both sides of the cover board 43 are also provided with Extension 432 is formed with guide groove 44 between each extension 424 and extension on the other side 432(Fig. 3 is visible), this is led Guiding rib 16 on second sliding slot 15 side wall of the slot 44 with pallet 10 matches, and realizes that plug-assembly 40 is slidably connected to the support Disk 10.
As shown in Figures 4 and 5, which further includes conductive sheet supporting part 52 and conductive sheet fixed part 53.It should Conductive sheet supporting part 52 and the plug supporting part 42 are linked together by a connecting portion 70.In the present embodiment, the conduction Piece supporting part 52, the plug supporting part 42 and the connecting portion 70 are integrally formed by way of injection molding.The connecting portion 70 is set Host cavity 71 is equipped with, which is used to accommodate the conductive sheet of connection plug 41 and the conductive sheet 51 of conductive contact component 50 Conducting wire.In other embodiments, which can be omitted, which is fixed on the accommodating of the pallet 10 In chamber 17, the conductive sheet supporting part 52 and plug supporting part 42 are individually molding part.
In the present embodiment, the conductive sheet 51 of the conductive contact component 50 includes 511 He of top being substantially parallel to each other Bottom 512 and the isolation part 513 for being connected to the one end at top 511 and one end of bottom 512.It is set on the conductive sheet supporting part 52 Mutually isolated card slot 521 is equipped with, fixture block 522 is provided in each card slot 521.Each conductive sheet 51 is housed in a card slot 521 In, and be buckled on fixture block 522 therein, i.e., the inner surface at its top 511, bottom 512 and isolation part 513 respectively with fixture block 522 top, bottom and end are inconsistent.Conductive sheet fixed part 53 is fixed on the end of the conductive sheet supporting part 52, with leading The outer surface of the isolation part 513 of electric piece 51 is inconsistent, so that conductive sheet 51 can not be detached from conductive sheet supporting part 52.In this reality It applies in mode, which is connected to the conductive sheet supporting part 52 by hook.In other embodiments, this is led Electric piece fixed part 53 can be fixed to the conductive sheet supporting part 52 by screw.
As shown in figure 3, in the present embodiment, the bottom of the accommodating cavity 17 of pallet 10 mutually should conductive sheet 51 be provided with it is logical Hole 171.When needed, can jig 100 as shown in Figure 1 be overturn 180 degree to be placed into test device, the probe of test device The bottom 512 of conductive sheet 51 can be contacted to pass through through-hole 171, so as to which test device and the electronic device 200 to be tested are electrically connected It connects.So, it is assumed that electronic device 200 includes front camera and rear camera, when putting camera after a test, can will control Tool 100 is placed into pose shown in FIG. 1 in test device, and rear camera is enable to receive test instruction shooting specific position Sample.When testing front camera, jig 100 is overturn into 180 degree so that front camera being capable of Acceptance Tests instruction shooting To the sample of specific position.
As shown in Figures 4 and 5, in the present embodiment, the side of the connecting portion 70 is extended with limiting section 72, when the plug group When part 40 slides into position shown in FIG. 1, the end of the limiting section 72 is located in the first sliding groove 12(Fig. 1 is visible).When this is inserted When head assembly 40 slides into position shown in Fig. 2, the end of the limiting section 72 is located in the accommodating cavity 17, if at this point, this is stirred When part 30 slides into position shown in Fig. 2, which will block the limiting section 72, and the plug-assembly 40 is made not slide again It moves to position shown in FIG. 1.The effect set in this way is, when the clamping piece 20 is in unlocked position shown in Fig. 2, electronics Device 200 will not may be led to electronic device by the clamping of clamping piece 20 due to electronic device 200 is without being accurately positioned 200 slot and the conducting terminal part 412 of plug 41 be not to just, if being at this time pushed to plug-assembly 40 shown in FIG. 1 During position, the slot of conducting terminal part 412 or electronic device 200 may be damaged.
An advantage of the present invention is that the obverse and reverse of the jig 100 is including corresponding logical with conductive sheet 51 Hole(That is through-hole 61 and 171)So that it can be realized with front pose test as shown in Figure 1 without removing electronic device 200 Electronic device 200 and with overturn the reverse side pose after 180 degree test electronic device 200.Compared with existing jig, needing During with front pose and reverse side pose test electronic device 200, electronics dress need not be removed and be loaded again to jig 100 of the invention 200 are put, reduces the probability that the appearance of electronic device 200 is scratched.
It is another advantage of the present invention that the conducting wire that plug 41 and connection plug 41 are connect with conductive sheet 51 is by cover board 43rd, the protection of plug supporting part 42 and connecting portion 70, so as to be damaged during plug 41 is plugged.
It is another advantage of the present invention that the cooperation of the limiting section 72 of shifting part 30 and plug-assembly 40, can prevent Electronic device 200 without be accurately positioned and may caused by plug 41 conducting terminal part 412 or electronic device 200 insert The damage of slot.
It is another advantage of the present invention that plug-assembly 40 and conductive contact component 50 can be used as an integral installation It is removed to pallet 10 or from pallet 10, convenient for the replacement and repair of plug-assembly 40 and conductive contact component 50.

Claims (5)

1. a kind of, for carrying the jig of electronic device to be tested, including pallet, which is provided with host cavity, which uses In the receiving electronic device to be tested, which is characterized in that further include two clamping pieces, a shifting part, a plug-assembly and one and lead It is in electrical contact component;
A first sliding groove is additionally provided in the pallet, the first sliding groove and the host cavity are mutually separated by a highlighted wall, the protrusion Wall is provided with two through-holes being connected with the first sliding groove and the host cavity and second sliding slot, the second sliding slot be located at this two Between a through-hole, the end of the pallet is provided with the accommodating cavity being connected with the first sliding groove and second sliding slot;
Two clamping pieces are slidably received in respectively in two through-holes, which is slidably contained in the first sliding groove In, which can push two clamping pieces to be slided in two through-holes when being slided in the first sliding groove, the clamping For blocking the electronic device to be tested and the electronic device to be tested being fixed in the host cavity, which slides part Ground is housed in the second sliding slot, wherein, which includes plug, which is provided with container, the container phase To two side include the first plane for being mutually parallel and the second plane and the inclined-plane of the first plane of connection and the second plane, The shifting part includes pushing column, which is housed in the container, when the promotion column follows shifting part in the container When mobile, which can contact one of inclined-plane of the two side walls, so as to which the clamping piece be pushed to slide;
The conductive contact component is housed in the accommodating cavity, the conductive contact component include multiple conductive sheets, each conductive sheet with One conducting terminal of the plug is connected, and multiple conductive sheets of the conductive contact component are used to connect with the probe of a test device It touches, so as to which the electronic device to be tested is electrically connected to the test device so that the electronic device to be tested can receive survey The test signal that trial assembly is put.
2. the jig as described in claim 1 for being used to carry electronic device to be tested, which is characterized in that the clamping piece and plug The glide direction of component is identical.
3. the jig as described in claim 1 for being used to carry electronic device to be tested, which is characterized in that the plug-assembly includes Plug supporting part, the conductive contact component include conductive sheet supporting part, and the plug supporting part and the conductive sheet supporting part pass through one Body formed mode is molded.
It is 4. as claimed in claim 3 for carrying the jig of electronic device to be tested, which is characterized in that the plug supporting part and Connecting portion is provided between the conductive sheet supporting part, limiting section is provided on the connecting portion, is housed when the limiting section is moved to this When in chamber, which can slide into the position for stopping that the limiting section is moved towards the electronic device, so as to prevent plug Component is moved towards the electronic device.
It is 5. as described in claim 1 for carrying the jig of electronic device to be tested, which is characterized in that shifting part ontology and from The outwardly directed bending part in both ends of ontology, the bottom of the first sliding groove of the pallet are provided with the accepting hole for accommodating the ontology, should Plug-assembly is located on the ontology and between two bending part.
CN201210443026.4A 2012-11-08 2012-11-08 For carrying the jig of electronic device to be tested Expired - Fee Related CN103808978B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201210443026.4A CN103808978B (en) 2012-11-08 2012-11-08 For carrying the jig of electronic device to be tested
TW101142984A TW201423373A (en) 2012-11-08 2012-11-16 Fixture for accommodating an electronic device during test

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201210443026.4A CN103808978B (en) 2012-11-08 2012-11-08 For carrying the jig of electronic device to be tested

Publications (2)

Publication Number Publication Date
CN103808978A CN103808978A (en) 2014-05-21
CN103808978B true CN103808978B (en) 2018-06-19

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CN201210443026.4A Expired - Fee Related CN103808978B (en) 2012-11-08 2012-11-08 For carrying the jig of electronic device to be tested

Country Status (2)

Country Link
CN (1) CN103808978B (en)
TW (1) TW201423373A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105277832B (en) * 2015-11-26 2018-08-14 福建联迪商用设备有限公司 POS machine automatic test fixture and working method

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CN101470465A (en) * 2007-12-27 2009-07-01 鸿富锦精密工业(深圳)有限公司 Hinge positioning jig
CN101728707A (en) * 2008-10-31 2010-06-09 深圳富泰宏精密工业有限公司 Chip card holding device
CN101740981A (en) * 2008-11-19 2010-06-16 富士康(昆山)电脑接插件有限公司 Electric connector
CN203350281U (en) * 2012-11-08 2013-12-18 富泰华工业(深圳)有限公司 Tool for bearing to-be-tested electronic device

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Publication number Priority date Publication date Assignee Title
TWI434360B (en) * 2008-09-04 2014-04-11 Star Techn Inc Enclosed type probe station
US8436452B2 (en) * 2010-05-28 2013-05-07 Nanya Technology Corporation Carrier for chip packages

Patent Citations (4)

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Publication number Priority date Publication date Assignee Title
CN101470465A (en) * 2007-12-27 2009-07-01 鸿富锦精密工业(深圳)有限公司 Hinge positioning jig
CN101728707A (en) * 2008-10-31 2010-06-09 深圳富泰宏精密工业有限公司 Chip card holding device
CN101740981A (en) * 2008-11-19 2010-06-16 富士康(昆山)电脑接插件有限公司 Electric connector
CN203350281U (en) * 2012-11-08 2013-12-18 富泰华工业(深圳)有限公司 Tool for bearing to-be-tested electronic device

Also Published As

Publication number Publication date
CN103808978A (en) 2014-05-21
TW201423373A (en) 2014-06-16

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Granted publication date: 20180619

Termination date: 20211108