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CN103135004B - A kind of method, a kind of method and device thereof measuring electromagnetic property of test card structure - Google Patents

A kind of method, a kind of method and device thereof measuring electromagnetic property of test card structure Download PDF

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CN103135004B
CN103135004B CN201110390947.4A CN201110390947A CN103135004B CN 103135004 B CN103135004 B CN 103135004B CN 201110390947 A CN201110390947 A CN 201110390947A CN 103135004 B CN103135004 B CN 103135004B
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uniform
matrix
test design
test
columns
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CN103135004A (en
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刘若鹏
季春霖
刘斌
易翔
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Kuang Chi Institute of Advanced Technology
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Kuang Chi Institute of Advanced Technology
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Abstract

The invention discloses the method for a kind of test card structure, measure the method for electromagnetic property and device thereof, described method comprises: according to the number of levels of influence factor and factor, determine the ranks number of orthogonal arrage; Adopt orthogonal design method to construct the content of described orthogonal arrage first two columns, defining the matrix that described content formed is L1; The content of the uniform designs table adopting Uniform ity Design Method structure deviation minimum; Clockwise cyclical method is adopted the composition of content of uniform designs table minimum for described deviation to be become the matrix L 2 matched with described L1; The content of associate(d) matrix L1 and L2, completes the structure of multifactor orthogonal arrage; According to described multifactor orthogonal arrage, simulated measurement is carried out to each testing site in constructed artificial electromagnetic material, obtain the electromagnetic property data of electromagnetic material structural unit.By the way, the present invention can while trying one's best with less test number (TN), and the testing site selected by guarantee is dispersed, has more spatial representative.

Description

Method for constructing test table, method for measuring electromagnetic property and device thereof
Technical Field
The invention relates to the technical field of metamaterials, in particular to a method for constructing a multi-factor orthogonal test table based on uniform test design, a method for measuring the electromagnetic property of an artificial electromagnetic material structure unit and a device thereof.
Background
The measurement of the electromagnetic properties of the structural units of the artificial electromagnetic material is an important link in the design process of the artificial electromagnetic material. How to select the artificial electromagnetic material structure unit with a certain size for electromagnetic simulation measurement is a problem which needs to be solved in the whole design process.
The geometric shape information of a single microstructure unit is described by a group of parameters, and the values of the parameters represent the size of the shape. Within a reasonable parameter value range, each parameter corresponds to a plurality of value levels. In order to obtain the electromagnetic response characteristic law for a specific type of microstructure unit, a great deal of experiments are often required. How to arrange experiments and obtain the electromagnetic response rule of the structural unit of a specific type by using the least number of experiments is a problem which is often encountered in the design and development of metamaterials. To achieve this, it must first be achieved that when the initial test point is selected, it is sufficient to ensure that all the selected points have the property of being "uniformly dispersed". The Lo.t0 orthogonal design method widely used in the field can arrange multi-factor tests, but the inherent test table construction mode limits the uniform dispersion of test points to a certain extent, so that in some specific areas, the information loss condition caused by insufficient number of selected points of the test points can occur.
In the electromagnetic characteristic simulation experiment for designing the artificial electromagnetic material structure unit, because the topological structure of the artificial electromagnetic material structure unit has more corresponding geometric parameters, the experiment is arranged by using an orthogonal experiment method. The sampling only selects a representative test point from the comprehensive test to carry out the test, and the selected test point has two characteristics of uniform dispersion and uniformity which can be compared with each other. Orthogonal experimental design requirements: 1. the same number of experiments were done for each level of any factor; 2. the same number of experiments were performed with the horizontal combination of any two factors.
Therefore, using this design principle to arrange experiments, if there are q levels of each factor, then at least q need to be done2And (5) carrying out secondary test. In the field of orthogonal test design, many different test table construction methods focus on how to better select a test point with "representativeness" from the third column in the test table. The currently popular "lo.t 0 orthogonal design method" in the present stage adopts the forms of "congruence algorithm" and "clockwise and counterclockwise rotation", and selects a representative test point starting from the third column, as shown in fig. 1, the third column is clockwise rotation 101, the fourth column is counterclockwise rotation 102, and it can be seen from the figure that the spatial position repetition rate of the previous three-row horizontal combination is high.
Assume a 3-factor 5 level experiment, as shown in Table 1
Level 1 Level 2 Level 3 Level 4 Level 5
Factor one 1 2 3 4 5
Factor two 1 2 3 4 5
Factor three 1 2 3 4 5
TABLE 1 experiment at 3-factor-5 level
The experimental design table was constructed according to the "lo.t 0 orthogonal design method" as shown in table 2:
factor 1 Factor 2 Factor 3
1 1 1
1 2 2
1 3 3
1 4 4
1 5 5
2 1 2
2 2 3
2 3 4
2 4 5
2 5 1
3 1 3
3 2 4
3 3 5
3 4 1
3 5 2
4 1 4
4 2 5
4 3 1
4 4 2
4 5 3
5 1 5
5 2 1
5 3 2
5 4 3
5 5 4
Table 2lo.t0 orthogonal table
Plotting the spatial positions, as shown in fig. 2, it can be seen that the areas marked by circles indicate that this way of selecting points will cause a part of the information to be blank, so that the information expression capability brought by these test points after the experiment will also be less satisfactory.
Therefore, there is a need to provide a method and apparatus for measuring electromagnetic properties of structural units of artificial electromagnetic materials, which effectively solve the above existing problems.
Disclosure of Invention
The invention mainly solves the technical problem of providing a method for constructing a multi-factor orthogonal test table based on uniform test design, a method for measuring the electromagnetic property of an artificial electromagnetic material structure unit and a device thereof, which can enable selected test points to be more uniformly dispersed and representative under the condition of the test times as few as possible.
In order to solve the technical problems, the invention adopts a technical scheme that: there is provided a method of measuring electromagnetic properties of a structural element of an artificial electromagnetic material, comprising: determining the number of rows q of the orthogonal test table according to the number s of the test influencing factors and the horizontal number q of each factor2And the number of columns s; number of rows q from the orthogonal test table2And the number of columns s, constructing the contents of the first two columns of the orthogonal test table by adopting an orthogonal test design method, and defining a matrix formed by the contents of the first two columns of the orthogonal test table as a matrix L1; according to the horizontal number q, adopting a uniform test design method to construct the content of a uniform test design table with minimum deviation; constructing the content of the uniform test design table with the minimum deviation into a matrix L2 matched with the matrix L1 by adopting a clockwise rotation method or a counterclockwise rotation method; combining the contents of the matrix L1 and the matrix L2 to complete the construction of a multi-factor orthogonal test table based on uniform test design; and carrying out simulation measurement on each test point in the constructed artificial electromagnetic material according to the multi-factor orthogonal test table to obtain electromagnetic property data of the electromagnetic material structural unit.
The method for constructing the contents of the first two columns of the orthogonal test table by adopting the orthogonal test design method comprises the following steps: forming element pairs by sequentially combining each horizontal of a first factor column in the first two columns of the orthogonal test table with all horizontal of a second factor column, and sequentially arranging the element pairs into a matrix L1: q. q.s2×2。
Wherein the step of constructing the uniform test design table with the minimum deviation by using the uniform test design method comprises the following steps: constructing the number of rows and columns of the uniform test design table according to a good lattice point method; according to the uniformity testDesigning the number of rows and columns of the table, and generating the jth column of the uniform test design table by utilizing congruence operation until all contents of the uniform test design table are finished; measuring the uniformity of the uniform test design table by using the centralized L2 deviation according to the content of the uniform test design table, and taking the uniform test design table with the minimum deviation as the uniform test design table and recording the uniform test design table as a Uq(qs)。
Wherein, the step of constructing the number of rows and columns of the uniform test design table according to the good lattice point method comprises the following steps: determining a positive integer h which is relatively prime to q and smaller than q according to the horizontal number q of the factors, and forming the positive integer h into a vector h, wherein h is (h)1,h2,…,hm) Where m is defined by the Euler functionAnd (6) determining.
Wherein the generating a jth column of the uniform test design table, e.g., u, using congruence operationsij=ihj[modq]In the step (a), the uijRecursively generated by the following formula:
u1j=hj
wherein i 1, a, q 1, j 1, m.
Wherein the step of constructing the content of the uniform test design table with the minimum deviation into a matrix L2 matched with the matrix L1 by using a clockwise rotation method or a counterclockwise rotation method comprises: will be the Uq(qs) Clockwise rotation or anticlockwise rotation is carried out to form q uniform design matrixes; overlapping the q uniformly designed matrixes in sequence to construct a q matrix2× s, L2.
To solve the technical problem, the inventionThe other technical scheme is as follows: there is provided an apparatus for measuring electromagnetic properties of structural units of artificial electromagnetic material, comprising: a row and column determining module for determining the number of rows q of the orthogonal test table according to the number s of the test influencing factors and the horizontal number q of each factor2And the number of columns s; a first constructing module for constructing a test table based on the number of rows q of the orthogonal test table2And the number of columns s, constructing the contents of the first two columns of the orthogonal test table by adopting an orthogonal test design method, and defining a matrix formed by the contents of the first two columns of the orthogonal test table as a matrix L1; according to the horizontal number q, adopting a uniform test design method to construct the content of a uniform test design table with minimum deviation; a second constructing module, which constructs the content of the uniform test design table with the minimum deviation into a matrix L2 matched with the matrix L1 by adopting a clockwise rotation method or a counterclockwise rotation method; a third construction module which combines the contents of the matrix L1 and the matrix L2 to complete the construction of a multi-factor orthogonal test table based on uniform test design; and the simulation measurement module is used for performing simulation measurement on each test point in the constructed artificial electromagnetic material according to the multi-factor orthogonal test table to obtain electromagnetic property data of the electromagnetic material structural unit.
The first constructing module is specifically configured to sequentially combine each horizontal of a first factor column in the first two columns of the orthogonal test table with all horizontal element pairs of a second factor column, and sequentially arrange the element pairs into a matrix L1: q. q.s2×2。
The first construction module is specifically used for constructing the row number and the column number of the uniform test design table according to a good lattice point method; generating a jth column of the uniform test design table by utilizing congruence operation according to the number of rows and columns of the uniform test design table until all contents of the uniform test design table are finished; measuring the uniformity of the uniform test design table by using the centralized L2 deviation according to the content of the uniform test design table, and taking the uniform test design table with the minimum deviation as the uniform test design table and recording the uniform test design table as a Uq(qs)。
Wherein,the first construction module is specifically configured to determine, based on the horizontal number q of the factor, a positive integer h that is relatively prime to q and smaller than q, and to form the positive integer h into a vector h (h ═ h)1,h2,…,hm) Where m is defined by the Euler functionAnd (6) determining.
Wherein the second construction module is specifically for coupling the Uq(qs) Clockwise rotation or anticlockwise rotation is carried out to form q uniform design matrixes; overlapping the q uniformly designed matrixes in sequence to construct a q matrix2× s, L2.
In order to solve the technical problem, the invention adopts another technical scheme that: a method for constructing a multi-factor orthogonal test table based on uniform test design is provided, which comprises the following steps: determining the number of rows q of the orthogonal test table according to the number s of the test influencing factors and the horizontal number q of each factor2And the number of columns s; number of rows q from the orthogonal test table2And the number of columns s, constructing the contents of the first two columns of the orthogonal test table by adopting an orthogonal test design method, and defining a matrix formed by the contents of the first two columns of the orthogonal test table as a matrix L1; according to the horizontal number q, adopting a uniform test design method to construct the content of a uniform test design table with minimum deviation; constructing the content of the uniform test design table with the minimum deviation into a matrix L2 matched with the matrix L1 by adopting a clockwise rotation method or a counterclockwise rotation method; and combining the contents of the matrix L1 and the matrix L2 to complete the construction of the multi-factor orthogonal test table based on the uniform test design.
The invention has the beneficial effects that: different from the situation of the prior art, the invention designs the contents of the first two columns of the orthogonal table by using an orthogonal test design method, then designs the contents of all the columns behind the orthogonal table by using a uniform test design method, and the uniform orthogonal test table obtained by the method can obtain the electromagnetic response rule to the specific structural unit type by using fewer test times as much as possible, and simultaneously ensures that the selected test points are uniformly dispersed, thereby having spatial representativeness.
Drawings
Fig. 1 is a schematic diagram of a prior art lo.t0 orthogonal experimental design method;
FIG. 2 is a schematic representation of the spatial location of a 3-factor 5 horizontal orthogonal experimental design table test point of the prior art;
FIG. 3 is a flow chart of one embodiment of a method of measuring electromagnetic properties of structural elements of an artificial electromagnetic material of the present invention;
FIG. 4 is a schematic representation of the spatial locations of the test points of the uniform orthogonal test design table of the present invention;
FIG. 5 is a schematic structural diagram of an embodiment of the apparatus for measuring electromagnetic properties of structural units of artificial electromagnetic materials according to the present invention.
Detailed Description
The present invention will be described in detail below with reference to the accompanying drawings and examples.
FIG. 3 is a flow chart of an embodiment of the method for measuring the electromagnetic properties of the structural elements of the artificial electromagnetic material of the present invention, as shown in FIG. 3, the method comprising the steps of:
step 301: determining the number of rows q of the orthogonal test table according to the number s of the test influencing factors and the horizontal number q of each factor2And the number of columns s. The test influencing factor is a parameter that influences a certain test. The different states or contents of the factors are called levels, and the level number of the factor is a corresponding value level number in a reasonable parameter value range. Temperature as a factor in the test, and 100 ℃, 110 ℃ and 120 ℃ are 3 levels of temperature; as another example of catalyst considerations, catalysts A and catalysts B are two levels of catalyst. Therefore, if a test affects the causeThe number of elements is 3, the number of levels per factor is 5, the number of rows in the orthogonal test table is 25, the number of columns is 3, and 25 tests are required.
Step 302: constructing the contents of the first two columns of the orthogonal test table by adopting an orthogonal test design method according to the row number q2 and the column number s of the orthogonal test table, and defining a matrix formed by the contents of the first two columns of the orthogonal test table as a matrix L1; and constructing the content of a uniform test design table with the minimum deviation by adopting a uniform test design method according to the horizontal number q. The so-called uniform test design table is called U table for short, and is a table constructed according to the characteristic of uniform dispersion, and the uniform test design table with the same horizontal number is marked as Un(nm) Wherein U represents the symbol of the uniform test design table, n is the factor level number and also represents the number of rows, i.e. the number of tests; m is the number of columns of the uniform table, representing the maximum number of arrangeable factors, e.g. U5(54) That is, it means that the design table has 4 columns, and 4 factors can be arranged at the maximum, the number of trials is 5, and each factor has 5 levels. The combination of factors and the number of levels for each factor constitutes the content of the uniform test design table.
In a preferred embodiment, the step of constructing the contents of the first two columns of the orthogonal test table by using an orthogonal test design method includes: forming element pairs by sequentially combining each horizontal of a first factor column in the first two columns of the orthogonal test table with all horizontal of a second factor column, and sequentially arranging the element pairs into a matrix L1: q. q.s2× 2. for example, the number of levels for each factor is 5, then the matrix L1: 25 × 2, as shown in Table 3 below:
column 1 Column 2
1 1
1 2
1 3
1 4
1 5
2 1
2 2
2 3
2 4
2 5
3 1
3 2
3 3
3 4
3 5
4 1
4 2
4 3
4 4
4 5
5 1
5 2
5 3
5 4
5 5
Table 3 matrix L1: 25X 2
In another preferred embodiment, the uniform test design with the minimum deviation is constructed by using a uniform test design methodThe steps of the table include: constructing the number of rows and columns of the uniform test design table according to a good lattice point method; generating a jth column of the uniform test design table by utilizing congruence operation according to the number of rows and columns of the uniform test design table until all contents of the uniform test design table are finished; measuring the uniformity of the uniform test design table by using the centralized L2 deviation according to the content of the uniform test design table, and taking the uniform test design table with the minimum deviation as the uniform test design table and recording the uniform test design table as a Uq(qs)。
Wherein, the step of constructing the number of rows and columns of the uniform test design table according to the good lattice point method comprises the following steps: determining a positive integer h which is relatively prime to q and smaller than q according to the horizontal number q of the factors, and forming the positive integer h into a vector h, wherein h is (h)1,h2,…,hm) Where m is defined by the Euler functionAnd (6) determining. Wherein the generating a jth column of the uniform test design table, e.g., u, using congruence operationsij=ihj[modq]In the step (a), the uijRecursively generated by the following formula:
u1j=hj
wherein i 1, a, q 1, j 1, m.
If the greatest common factor of n integers is 1, the n integers are referred to as co-prime. The euler function is the number of numbers that are coprime to n among numbers less than or equal to n, for a positive integer n. For example, if the number of influencing factors is 3, the number of levels of each factor is 5, positive integers which are relatively prime to 5 and smaller than 5 are 1, 2, 3 and 4, then these positive integers are formed into a vector h, h being (1, 2, 3 and 4) which is formed by the euler functionKnowing that m equals 4, the uniform test design table is 5 rows and 4 columns. Generating the jth column of the uniform test design table, e.g., u, using congruence operationsij=ihj[modq][modq]Referring to the congruence algorithm, column 1 is 1, 2, 3, 4, 5, column 2, 4, 1, 3, 5, column 3, 1, 4, 2, 5, column four is 4, 3, 2, 1, 5. The centered L2 bias is used to measure the overall uniformity of all possible projections of a point set, where the uniformity of the uniform test design table is measured, the smaller the bias, the better the uniformity of the uniform test design table. Using a centralized L2 deviation, taking a uniform test design table with the minimum deviation as the uniform test design table, taking 1, 2 and 4 columns as U5(53)。
Step 303: the content of the uniform test design table with the minimum deviation is constructed into a matrix L2 matched with the matrix L1 by a clockwise rotation method or a counterclockwise rotation method. By clockwise rotation is meant alternate rotation in the direction of rotation of the timepiece, and conversely counterclockwise rotation.
In a preferred embodiment, the step of constructing the content of the uniform test design table with the minimum deviation into the matrix L2 matching the matrix L1 by using a clockwise rotation method or a counterclockwise rotation method comprises: will be the Uq(qs) Clockwise rotation or anticlockwise rotation is carried out to form q uniform design matrixes; overlapping the q uniformly designed matrixes in sequence to construct a q matrix2× s.A large matrix L2. for example, one test influencing factor is 3, the number of levels of each factor is 5, and U is assigned5(53) Clockwise rotation is carried out to form 5 uniform design matrixes, the 5 uniform design matrixes are sequentially overlapped to form a large matrix L2 of 25 × 3, and the large matrix L2 is as shown in a table 4:
column 1 Column 2 Column 3
1 2 4
2 4 3
3 1 2
4 3 1
5 5 5
2 4 3
3 1 2
4 3 1
5 5 5
1 2 4
3 1 2
4 3 1
5 5 5
1 2 4
2 4 3
4 3 1
5 5 5
1 2 4
2 4 3
3 1 2
5 5 5
1 2 4
2 4 3
3 1 2
4 3 1
TABLE 4U5(53) Clockwise rotation constructed matrix L2
Step 304: and combining the contents of the matrix L1 and the matrix L2 to complete the construction of the multi-factor orthogonal test table based on the uniform test design.
For example, 3 test influencing factors are provided, the horizontal number of each factor is 5, the final constructed orthonormal test table is shown in table 5, the spatial positions of the test points of the orthonormal test table are plotted to obtain fig. 4, and three coordinate axes are factor one, factor two and factor three respectively. It is more clearly apparent from fig. 4 that the spatial representativeness of the new method test points is better than that of the conventional orthogonal design method (as shown in fig. 2).
Factor 1 Factor 2 Factor 3
1 1 2
1 2 4
1 3 1
1 4 3
1 5 5
2 1 4
2 2 1
2 3 3
2 4 5
2 5 2
3 1 1
3 2 3
3 3 5
3 4 2
3 5 4
4 1 3
4 2 5
4 3 2
4 4 4
4 5 1
5 1 5
5 2 2
5 3 4
5 4 1
5 5 3
TABLE 5 homogeneous orthogonal test Table
Step 305: and carrying out simulation measurement on each test point in the constructed artificial electromagnetic material according to the multi-factor orthogonal test table to obtain electromagnetic property data of the electromagnetic material structural unit. For example, the geometric shape of an artificial electromagnetic material structural unit is described by 3 factors, each factor has 5 value levels, and the electromagnetic property data of 25 electromagnetic material structural units are obtained by performing simulation measurement on the 25 test points according to the uniform orthogonal test table in table 5.
The embodiment utilizes an orthogonal test design method to design the contents of the first two columns of the orthogonal table, then utilizes a uniform test design method to design the contents of all the columns behind the orthogonal table, and the uniform orthogonal test table obtained by the method can obtain the electromagnetic response rule of a specific structural unit type with less test times as much as possible, and simultaneously ensures that the selected test points are uniformly dispersed and have spatial representativeness.
FIG. 5 is a schematic structural diagram of an embodiment of the apparatus for measuring electromagnetic properties of structural units of artificial electromagnetic materials according to the present invention. As shown in fig. 5, the apparatus includes: a row and column determination module 501, a first construction module 502, a second construction module 503, a third construction module 504, and a simulation measurement module 505.
The row-column determining module 501 is used for determining the number of rows q of the orthogonal test table according to the number s of the test influencing factors and the horizontal number q of each factor2And the number of columns s. For example, if one test influencing factor is 3 and the number of horizontal lines per factor is 5, then the number of rows in the orthogonal test table is 25 and the number of columns is 3, and 25 tests are required.
The first construction module 502 is used for the number of rows q according to the orthogonal test table2And the number of columns s, constructing the contents of the first two columns of the orthogonal test table by adopting an orthogonal test design method, and defining a matrix formed by the contents of the first two columns of the orthogonal test table as a matrix L1; and constructing the content of a uniform test design table with the minimum deviation by adopting a uniform test design method according to the horizontal number q.
In a preferred embodiment of the present invention,the first constructing module is specifically configured to sequentially combine each horizontal of a first factor column in the first two columns of the orthogonal test table with all horizontal of a second factor column to form an element pair, and sequentially arrange the element pairs into a matrix L1: q. q.s2× 2. for example, the number of levels per factor is 5, then the matrix L1: 25 × 2.
In another preferred embodiment, the first constructing module is specifically configured to construct the number of rows and the number of columns of the uniform test design table according to a well-check dot method; generating a jth column of the uniform test design table by utilizing congruence operation according to the number of rows and columns of the uniform test design table until all contents of the uniform test design table are finished; measuring the uniformity of the uniform test design table by using the centralized L2 deviation according to the content of the uniform test design table, and taking the uniform test design table with the minimum deviation as the uniform test design table and recording the uniform test design table as a Uq(qs). Wherein, the step of constructing the number of rows and columns of the uniform test design table according to the good lattice point method comprises the following steps: determining a positive integer h which is relatively prime to q and smaller than q according to the horizontal number q of the factors, and forming the positive integer h into a vector h, wherein h is (h)1,h2,…,hm) Where m is defined by the Euler functionAnd (6) determining. Wherein the generating a jth column of the uniform test design table, e.g., u, using congruence operationsij=ihj[modq]In the step (a), the uijRecursively generated by the following formula:
u1j=hj
wherein i 1, a, q 1, j 1, m.
For example, one test influencing factor is 3, and the number of levels for each factor is5, positive integers which are relatively prime to 5 and smaller than 5 are 1, 2, 3 and 4, and these positive integers are formed into a vector h, h being (1, 2, 3 and 4) formed by the Euler functionKnowing that m equals 4, the uniform test design table is 5 rows and 4 columns. Generating the jth column of the uniform test design table by utilizing congruence operation until all contents of the uniform test design table are generated, applying centralized L2 deviation, taking the uniform test design table with the minimum deviation as the uniform test design table and recording the uniform test design table as U5(53)。
The second construction module 503 is configured to construct the content of the uniform test design table with the minimum deviation into a matrix L2 that matches the matrix L1 using a clockwise rotation method or a counterclockwise rotation method.
In a preferred embodiment, the second building block is particularly adapted to connect the U to the second building blockq(qs) Clockwise rotation or anticlockwise rotation is carried out to form q uniform design matrixes; overlapping the q uniformly designed matrixes in sequence to construct a q matrix2× s.A large matrix L2. for example, one test influencing factor is 3, the number of levels of each factor is 5, and U is assigned5(53) And clockwise rotation is carried out to form 5 uniform design matrixes, and the 5 uniform design matrixes are sequentially overlapped to form a 25 × 3 large matrix L2.
The third construction module 504 is used for combining the contents of the matrix L1 and the matrix L2 to complete the construction of the multi-factor orthogonal test table based on the uniform test design. For example, 3 test influencing factors are provided, the horizontal number of each factor is 5, the final constructed orthonormal test table is shown in table 5, the spatial positions of the test points of the orthonormal test table are plotted to obtain fig. 4, and three coordinate axes are factor one, factor two and factor three respectively. It is more clearly apparent from fig. 4 that the spatial representativeness of the new method test points is better than that of the conventional orthogonal design method (as shown in fig. 2).
The simulation measurement module 505 is configured to perform simulation measurement on each test point in the constructed artificial electromagnetic material according to the multi-factor orthogonal test table, so as to obtain electromagnetic property data of the electromagnetic material structural unit. For example, the geometric shape of an artificial electromagnetic material structural unit is described by 3 factors, each factor has 5 value levels, and the electromagnetic property data of 25 electromagnetic material structural units are obtained by performing simulation measurement on the 25 test points according to the uniform orthogonal test table in table 5.
The method and the device for measuring the electromagnetic property of the artificial electromagnetic material structure unit are different from the prior art, the contents of the first two columns of the orthogonal table are designed by using an orthogonal test design method, then the contents of all the columns behind the orthogonal table are designed by using a uniform test design method, and the uniform orthogonal test table obtained by the method can obtain the electromagnetic response rule to the specific structure unit type by using fewer test times as far as possible, ensure that the selected test points are uniformly dispersed, and have spatial representativeness.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims (12)

1. A method of measuring electromagnetic properties of a structural element of an artificial electromagnetic material, comprising:
determining the number of rows q of the orthogonal test table according to the number s of the test influencing factors and the horizontal number q of each factor2And the number of columns s;
number of rows q from the orthogonal test table2And the number of columns s, constructing the contents of the first two columns of the orthogonal test table by adopting an orthogonal test design method, and defining a matrix formed by the contents of the first two columns of the orthogonal test table as a matrix L1; according to said level number q, usingThe uniform test design method constructs the content of a uniform test design table with the minimum deviation;
constructing the content of the uniform test design table with the minimum deviation into a matrix L2 matched with the matrix L1 by adopting a clockwise rotation method or a counterclockwise rotation method;
combining the contents of the matrix L1 and the matrix L2 to complete the construction of a multi-factor orthogonal test table based on uniform test design;
and carrying out simulation measurement on each test point in the constructed artificial electromagnetic material according to the multi-factor orthogonal test table to obtain electromagnetic property data of the electromagnetic material structural unit.
2. The method of claim 1,
the step of constructing the contents of the first two columns of the orthogonal test table by adopting an orthogonal test design method comprises the following steps: forming element pairs by sequentially combining each horizontal of a first factor column in the first two columns of the orthogonal test table with all horizontal of a second factor column, and sequentially arranging the element pairs into a matrix L1: q. q.s2×2。
3. The method of claim 1,
the step of constructing the uniform test design table with the minimum deviation by adopting the uniform test design method comprises the following steps: constructing the number of rows and columns of the uniform test design table according to a good lattice point method; generating a jth column of the uniform test design table by utilizing congruence operation according to the number of rows and columns of the uniform test design table until all contents of the uniform test design table are finished; measuring the uniformity of the uniform test design table by using the centralized L2 deviation according to the content of the uniform test design table, and taking the uniform test design table with the minimum deviation as the uniform test design table and recording the uniform test design table as a Uq(qs)。
4. The method of claim 3,
the step of constructing the number of rows and columns of the uniform test design table according to the good lattice point method comprises the following steps: determining a positive integer h which is relatively prime to q and smaller than q according to the horizontal number q of the factors, and forming the positive integer h into a vector h, wherein h is (h)1,h2,...,hm) Where m is defined by the Euler functionAnd (6) determining.
5. The method of claim 4,
generating the jth column u of the uniform test design table by using congruence operationijIn the step (a), the uijRecursively generated by the following formula:
uij=hj
wherein i 1, a, q 1, j 1, m.
6. The method of claim 3,
the step of constructing the content of the uniform test design table with the minimum deviation into a matrix L2 matched with the matrix L1 by using a clockwise rotation method or a counterclockwise rotation method includes:
will be the Uq(qs) Clockwise rotation or anticlockwise rotation is carried out to form q uniform design matrixes;
overlapping the q uniformly designed matrixes in sequence to construct a q matrix2× s, L2.
7. An apparatus for measuring electromagnetic properties of a structural element of an artificial electromagnetic material, comprising:
a rank determination module for determining the number s of the influencing factors and the level number of each factor according to the testq, determining the number of rows q of the orthogonal test table2And the number of columns s;
a first constructing module for constructing a matrix according to the number of rows q of the orthogonal test table2And the number of columns s, constructing the contents of the first two columns of the orthogonal test table by adopting an orthogonal test design method, and defining a matrix formed by the contents of the first two columns of the orthogonal test table as a matrix L1; according to the horizontal number q, adopting a uniform test design method to construct the content of a uniform test design table with minimum deviation;
a second constructing module, configured to construct the content of the uniform test design table with the minimum deviation into a matrix L2 matched with the matrix L1 by using a clockwise rotation method or a counterclockwise rotation method;
a third construction module, which is used for combining the contents of the matrix L1 and the matrix L2 to complete the construction of a multi-factor orthogonal test table based on uniform test design;
and the simulation measurement module is used for performing simulation measurement on each test point in the constructed artificial electromagnetic material according to the multi-factor orthogonal test table to obtain electromagnetic property data of the electromagnetic material structural unit.
8. The apparatus of claim 7,
the first constructing module is specifically configured to sequentially combine each horizontal of a first factor column in the first two columns of the orthogonal test table with all horizontal of a second factor column to form an element pair, and sequentially arrange the element pairs into a matrix L1: q. q.s2×2。
9. The apparatus of claim 7,
the first construction module is specifically used for constructing the row number and the column number of the uniform test design table according to a good lattice point method; generating a jth column of the uniform test design table by utilizing congruence operation according to the number of rows and columns of the uniform test design table until all contents of the uniform test design table are finished; measuring the uniform test design table according to the content of the uniform test design table by using a centralized L2 deviationTaking the uniform test design table with the minimum deviation as the uniform test design table and recording the uniform test design table as Uq(qs)。
10. The apparatus of claim 9,
the first construction module determines a positive integer h which is relatively prime to q and smaller than q according to the horizontal number q of the factors, and the positive integer h is formed into a vector h (h ═ h)1,h2,…,hm) Where m is defined by the Euler functionAnd (6) determining.
11. The apparatus of claim 9,
the second construction module is particularly for coupling the Uq(qs) Clockwise rotation or anticlockwise rotation is carried out to form q uniform design matrixes; overlapping the q uniformly designed matrixes in sequence to construct a q matrix2× s, L2.
12. A method for multi-factor orthogonal test table construction based on homogeneous test design, comprising:
determining the number of rows q of the orthogonal test table according to the number s of the test influencing factors and the horizontal number q of each factor2And the number of columns s;
number of rows q from the orthogonal test table2And the number of columns s, constructing the contents of the first two columns of the orthogonal test table by adopting an orthogonal test design method, and defining a matrix formed by the contents of the first two columns of the orthogonal test table as a matrix L1; according to the horizontal number q, adopting a uniform test design method to construct the content of a uniform test design table with minimum deviation;
constructing the content of the uniform test design table with the minimum deviation into a matrix L2 matched with the matrix L1 by adopting a clockwise rotation method or a counterclockwise rotation method;
and combining the contents of the matrix L1 and the matrix L2 to complete the construction of the multi-factor orthogonal test table based on the uniform test design.
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