CN103018594B - A kind of method of testing of capacitive touch screen, system and electronic equipment - Google Patents
A kind of method of testing of capacitive touch screen, system and electronic equipment Download PDFInfo
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Abstract
The invention belongs to testing touch screen technical field, provide a kind of method of testing of capacitive touch screen, system and electronic equipment.Method wherein comprises: obtain the sampled signal that on capacitive touch screen, each node capacitor is corresponding respectively; After converting sampled signal to accessible touch data, the standard value according to prestoring is analyzed touch data, exports analysis result.Method and system provided by the invention achieve the autorun to capacitive touch screen, avoid the operating experience formula test mode of test man, shorten the test duration, improve the reliability of test result.In addition, when the test macro of this capacitive touch screen is built in the system test with display screen, display screen can be used for the analysis result that display analysis module exports, thus utilize complete machine to serve as the measurement jig of specialty, when not relying on external equipment, the performance test of complete independently capacitive touch screen.
Description
Technical field
The invention belongs to testing touch screen technical field, particularly relate to a kind of method of testing of capacitive touch screen, system and electronic equipment.
Background technology
Capacitive touch screen is that a kind of electric current of human body that utilizes responds to the touch-screen carrying out work, and it is widely used in various mobile terminal, particularly smart mobile phone.
Because plant produced touch-screen there is yield issues and process deviation, also have some touch-screens can cause damage because of later stage factor, such as touch-screen scratches, flexible circuit dash-board injury, therefore as the necessary links of quality control, for the electronic equipment adopting capacitive touch screen, in its production run except needing the modules before to assembling and parts test, the complete machine after to assembling is also needed to test, this complete machine refers to and is at least equipped with capacitive touch screen and touch-screen driving chip, can run the electronic equipment of base program.
The method of testing of the capacitive touch screen that prior art provides has been come the operating experience of complete machine by test man, this kind of method of testing length consuming time, Test coverage face is limited, the test to some capacitive nodes may be ignored, and test result depends on the subjective feeling of test man, test result reliability is poor.
Above-mentioned information disclosed in this background technology this part is only for increasing the understanding to background technology of the present invention, and therefore it may comprise the prior art known to persons of ordinary skill in the art do not formed this state.
Summary of the invention
The object of the present invention is to provide a kind of method of testing of capacitive touch screen, be intended to solve existingly by test man, the limited and problem that test result reliability is poor in method length consuming time to capacitive touch screen test, Test coverage face is realized to the operating experience of complete machine.
The present invention is achieved in that a kind of method of testing of capacitive touch screen, said method comprising the steps of:
Obtain the sampled signal that on capacitive touch screen, each node capacitor is corresponding respectively;
After converting described sampled signal to accessible touch data, according to the standard value prestored, described touch data is analyzed, export analysis result;
Described standard value comprises an adjacent deviation standard value and/or a whole screen deviation standard value;
When described standard value comprises an adjacent deviation standard value, the standard value that described basis prestores is analyzed described touch data, and the step exporting analysis result comprises the following steps:
Calculate the absolute value of difference between the touch data of present node electric capacity and the touch data of each adjacent node electric capacity, and by the touch data of the absolute value of each difference divided by described present node electric capacity, obtain the adjacent deviate suitable with the number of described adjacent node electric capacity;
Judge whether each adjacent deviate exceedes described adjacent deviation standard value, and the position coordinates of present node electric capacity corresponding for the adjacent deviate exceeding described adjacent deviation standard value is exported as described analysis result;
When described standard value comprises a whole screen deviation standard value, the standard value that described basis prestores is analyzed described touch data, and the step exporting analysis result comprises the following steps:
Calculate the mean value of the touch data of whole node capacitor, and after the touch data of present node electric capacity is deducted described mean value, by the absolute value of data that obtains divided by the touch data of described present node electric capacity, obtain the whole screen deviate that described present node electric capacity is corresponding;
Judge whether each whole screen deviate exceedes described whole screen deviation standard value, and the position coordinates of present node electric capacity corresponding for the whole screen deviate exceeding described whole screen deviation standard value is exported as described analysis result.
Another object of the present invention is to the test macro providing a kind of capacitive touch screen, described system comprises:
Memory module, for pre-stored criteria value;
Acquisition module, for obtaining the sampled signal that on capacitive touch screen, each node capacitor is corresponding respectively; And
Analysis module, after the described sampled signal for being obtained by described acquisition module converts accessible touch data to, analyzes described touch data according to the described standard value that described memory module prestores, and exports analysis result;
Described analysis module comprises pretreatment module, and the described sampled signal that described pretreatment module is used for described acquisition module to obtain converts accessible touch data to;
The described standard value that described memory module prestores comprises adjacent deviation standard value and/or whole screen deviation standard value;
Described analysis module also comprises adjacent variance analysis module and/or whole screen variance analysis module;
Described adjacent variance analysis module is for the absolute value of difference between the touch data of present node electric capacity that calculates described pretreatment module and be converted to and the touch data of each adjacent node electric capacity, and by the touch data of the absolute value of each difference divided by present node electric capacity, obtain the adjacent deviate suitable with adjacent node electric capacity number, judge whether each adjacent deviate exceedes described adjacent deviation standard value afterwards, and the position coordinates of present node electric capacity corresponding for the adjacent deviate exceeding described adjacent deviation standard value is exported as described analysis result;
For calculating, described pretreatment module is converted to described whole screen variance analysis module, the mean value of the touch data of whole node capacitor, and after the touch data of present node electric capacity is deducted described mean value, by the absolute value of data that the obtains touch data divided by present node electric capacity, obtain the whole screen deviate that present node electric capacity is corresponding, judge whether each whole screen deviate exceedes described whole screen deviation standard value afterwards, and the position coordinates of present node electric capacity corresponding for the whole screen deviate exceeding described whole screen deviation standard value is exported as described analysis result.
Another object of the present invention is to provide a kind of electronic equipment, comprise capacitive touch screen, described electronic equipment also comprises the test macro of a capacitive touch screen as above.
The method of testing of capacitive touch screen provided by the invention and system prestore the standard value of capacitive node sampled data, in test process, the sampled signal of each capacitive node of automatic acquisition, and the performance to each capacitive node is analyzed according to standard value and sampled signal, export analysis result, achieve the autorun to capacitive touch screen, avoid the operating experience formula test mode of test man, shorten the test duration, improve the reliability of test result.In addition, when the test macro of this capacitive touch screen is built in the system test with display screen, display screen can be used for the analysis result that display analysis module exports, thus utilize complete machine to serve as the measurement jig of specialty, when not relying on external equipment, the performance test of complete independently capacitive touch screen.
Accompanying drawing explanation
Fig. 1 is the process flow diagram of the method for testing of capacitive touch screen provided by the invention;
Fig. 2 is the structural drawing of the test macro of capacitive touch screen provided by the invention;
Fig. 3 is the structural drawing of analysis module in Fig. 2.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
For the method for testing Problems existing of existing capacitive touch screen, the method of testing of capacitive touch screen provided by the invention prestores the standard value of capacitive node sampled data, in test process, the sampled signal of each capacitive node of automatic acquisition, and the performance to each capacitive node is analyzed according to standard value and sampled signal.
Fig. 1 shows the flow process of the method for testing of capacitive touch screen provided by the invention.
In step s 11, the sampled signal that on capacitive touch screen, each node capacitor is corresponding is respectively obtained.Sampled signal wherein can be the corresponding electric impulse signal that the capacitive node on capacitive touch screen sends after being subject to external trigger, and/or directly obtain from the touch-screen driving chip of capacitive touch screen, the original touch location data that characterize the capacitive node position that is triggered, and/or directly obtain from the driving chip of the touch-screen of capacitive touch screen, all raw data of characterizing all capacitive nodes.
In step s 12, after converting sampled signal to accessible touch data, the standard value according to prestoring is analyzed touch data, exports analysis result.
In the present invention, when sampled signal is electric impulse signal, data sampled signal being converted to accessible touch data are specially: electric impulse signal is carried out analog/digital conversion process, obtains touch data, and when sampled signal is the original touch location data directly obtained from touch-screen driving chip, because original touch data are store with certain data memory format in touch-screen driving chip, therefore the original touch data by this kind of data memory format stores are needed to combine, cutting and/or the process such as to abandon, to convert accessible data layout to, such as, if the original touch location data of original touch location data in touch-screen driving chip are shorts, and the low address space in touch-screen driving chip deposits the high byte data of original touch location data, the low byte data of original touch location data are deposited in high address space in touch-screen driving chip, the step then sampled signal being converted to accessible touch data is: original touch location data are carried out combined treatment, the original touch location data of low address are moved to left after 8, add the original touch location data of high address.
As one embodiment of the present of invention, namely analyze touch data according to the standard value prestored is that the standard value that basis prestores carries out maximal value test analysis to touch data, now, the standard value prestored comprises a maximal value, then according to the standard value prestored, touch data is analyzed, the step exporting analysis result is specially: judge whether touch data exceedes maximal value, and exported as analysis result by the position coordinates of node capacitor corresponding for the touch data exceeding maximal value.
As an alternative embodiment of the invention, namely analyze touch data according to the standard value prestored is that the standard value that basis prestores carries out minimum value test analysis to touch data, now, the standard value prestored comprises a minimum value, then according to the standard value prestored, touch data is analyzed, the step exporting analysis result is specially: judge whether touch data reaches minimum value, and the position coordinates of node capacitor corresponding for the touch data not reaching minimum value is exported as analysis result, certainly, while the position coordinates of output node electric capacity, also the touch data of correspondence together can be exported.
As yet another embodiment of the present invention, namely analyze touch data according to the standard value prestored is that the standard value that basis prestores carries out adjacent test bias analysis to touch data, now, the standard value prestored comprises an adjacent deviation standard value, then according to the standard value prestored, touch data is analyzed, the step exporting analysis result specifically comprises the following steps: the absolute value calculating difference between the touch data of present node electric capacity and the touch data of each adjacent node electric capacity, and by the touch data of the absolute value of each difference divided by present node electric capacity, obtain the adjacent deviate suitable with adjacent node electric capacity number, judge whether each adjacent deviate exceedes adjacent deviation standard value, and the position coordinates of present node electric capacity corresponding for the adjacent deviate exceeding adjacent deviation standard value is exported as analysis result, certainly, while the position coordinates exporting present node electric capacity, also the touch data of correspondence, adjacent deviate together can be exported.
As yet another embodiment of the present invention, namely analyze touch data according to the standard value prestored is that the standard value that basis prestores carries out the analysis of whole screen test bias to touch data, now, the standard value prestored comprises a whole screen deviation standard value, then according to the standard value prestored, touch data is analyzed, the step exporting analysis result specifically comprises the following steps: the mean value calculating the touch data of whole node capacitor, and after the touch data of present node electric capacity is deducted this mean value, by the absolute value of data that the obtains touch data divided by present node electric capacity, obtain the whole screen deviate that present node electric capacity is corresponding, judge whether each whole screen deviate exceedes whole screen deviation standard value, and the position coordinates of present node electric capacity corresponding for the whole screen deviate exceeding whole screen deviation standard value is exported as analysis result, certainly, while the position coordinates exporting present node electric capacity, also the touch data of correspondence, whole screen deviate together can be exported.
And in actual application, also can comprise above-mentioned combinations maximal value test analysis carried out to touch data, touch data carried out to minimum value test analysis, touch data carried out to adjacent test bias analysis, touch data carried out to two or more analyses in the analysis of whole screen test bias according to the standard value prestored to the step that touch data is analyzed simultaneously.Illustrate each detailed process analyzed below:
Suppose that the touch data distribution of the node capacitor in capacitive touch screen last point of region to be tested is as shown in following table one:
Table one
| X1 | X2 | X3 | |
| Y1 | 3000 | 2500 | 2000 |
| Y2 | 3100 | 2600 | 1800 |
| Y3 | 3300 | 2700 | 2200 |
Wherein, position coordinates (the X1 of node capacitor, Y1) touch data is 3000, position coordinates (the X1 of node capacitor, Y2) touch data is 3100, position coordinates (the X1 of node capacitor, Y3) touch data is 3300, position coordinates (the X2 of node capacitor, Y1) touch data is 2500, position coordinates (the X2 of node capacitor, Y2) touch data is 2600, position coordinates (the X2 of node capacitor, Y3) touch data is 2700, position coordinates (the X3 of node capacitor, Y1) touch data is 2000, position coordinates (the X3 of node capacitor, Y2) touch data is 1800, position coordinates (the X3 of node capacitor, Y3) touch data is 2200.Simultaneously, suppose that the maximal value prestored is 3200, the minimum value prestored is 2000, and the adjacent deviation standard value prestored is 0.2, and the whole screen deviation standard value prestored is 0.25, then in maximal value test analysis, can judge that the touch data that the node capacitor of position coordinates (X1, Y3) is corresponding exceeds maximal value, thus export the position coordinates (X1 as analysis result, Y3), or prompting exceed maximal value etc., carrying out in minimum value test analysis to touch data, can judge that the touch data that the node capacitor of position coordinates (X3, Y2) is corresponding does not reach minimum value, thus export the position coordinates (X3 as analysis result, Y2), or prompting exceed minimum value etc., touch data is being carried out in adjacent test bias analysis, calculate the adjacent deviate of each node capacitor, with position coordinates (X2, Y2) be example, first position coordinates (X2 is calculated, Y2) with position coordinates (X2, Y1) between, the difference of touch data is 100, corresponding adjacent deviate is 100/2600=0.038, in like manner calculate position coordinates (X2, Y2) with position coordinates (X2, Y3) the adjacent deviate between is 100/2600=0.038, position coordinates (X2, Y2) with position coordinates (X1, Y2) the adjacent deviate between is 500/2600=0.192, position coordinates (X2, Y2) with position coordinates (X3, Y2) the adjacent deviate between is 800/2600=0.307, owing to there is the adjacent deviate 0.307 exceeding adjacent deviation standard value, then export the position coordinates (X2 as analysis result, Y2), or prompting exceeds adjacent deviation etc., carrying out touch data in the analysis of whole screen test bias, the mean value calculating the touch data of whole node capacitor is 2578, and obtains whole screen deviate corresponding to present node electric capacity as shown in following table two:
Table two
| X1 | X2 | X3 | |
| Y1 | 0.141 | 0.031 | 0.289 |
| Y2 | 0.168 | 0.008 | 0.432 |
| Y3 | 0.219 | 0.045 | 0.172 |
Can find out, position coordinates (X3, and position coordinates (X3 Y1), Y2) whole screen deviation standard value of having divided other whole screen deviate to exceed, then export the position coordinates (X3 as analysis result, Y1) and position coordinates (X3, Y2), or prompting exceed whole screen deviation etc.
The method of testing of capacitive touch screen provided by the invention prestores the standard value of capacitive node sampled data, in test process, the sampled signal of each capacitive node of automatic acquisition, and the performance to each capacitive node is analyzed according to standard value and sampled signal, export analysis result, achieve the autorun to capacitive touch screen, avoid the operating experience formula test mode of test man, shorten the test duration, improve the reliability of test result.When this method of testing is applied to the system test with display screen, display screen can the analysis result of display translation.
Fig. 2 shows the structure of the test macro of capacitive touch screen provided by the invention, for convenience of explanation, illustrate only part related to the present invention.
The test macro of capacitive touch screen provided by the invention comprises: memory module 13, for pre-stored criteria value; Acquisition module 11, for obtaining the sampled signal that on capacitive touch screen, each node capacitor is corresponding respectively, this sampled signal can be the corresponding electric impulse signal that the capacitive node on capacitive touch screen sends after being subject to external trigger, and/or directly obtain from the touch-screen driving chip of capacitive touch screen, the original touch location data that characterize the capacitive node position that is triggered, and/or directly obtain from the driving chip of the touch-screen of capacitive touch screen, all raw data of characterizing all capacitive nodes; Analysis module 12, after the sampled signal for being obtained by acquisition module 11 converts accessible touch data to, analyzes touch data according to the standard value that memory module 13 prestores, and exports analysis result.
Fig. 3 shows the structure of analysis module 12 in Fig. 2.
Particularly, when the standard value that memory module 13 prestores comprises a maximal value, as one embodiment of the present of invention, analysis module 12 can comprise: pretreatment module 121, and the sampled signal for being obtained by acquisition module 11 converts accessible touch data to; Maximal value analysis module 122, for judging the maximal value whether touch data that pretreatment module 121 is converted to exceedes memory module 13 and prestore, and exports the position coordinates of node capacitor corresponding for the touch data exceeding this maximal value as analysis result.
When the standard value that memory module 13 prestores comprises a minimum value, as another embodiment of the present invention, analysis module 12 can comprise: pretreatment module 121, and the sampled signal for being obtained by acquisition module 11 converts accessible touch data to; Minimum value analysis module 123, for judging the minimum value whether touch data that pretreatment module 121 is converted to reaches memory module 13 and prestore, and exports the position coordinates of node capacitor corresponding for the touch data not reaching this minimum value as analysis result;
When the standard value that memory module 13 prestores comprises an adjacent deviation standard value, as one more embodiment of the present invention, analysis module 12 can comprise: pretreatment module 121, and the sampled signal for being obtained by acquisition module 11 converts accessible touch data to, adjacent variance analysis module 124, for calculating, pretreatment module 121 is converted to, the absolute value of difference between the touch data of present node electric capacity and the touch data of each adjacent node electric capacity, and by the touch data of the absolute value of each difference divided by present node electric capacity, obtain the adjacent deviate suitable with adjacent node electric capacity number, judge the adjacent deviation standard value whether each adjacent deviate exceedes memory module 13 and prestore afterwards, and the position coordinates of present node electric capacity corresponding for the adjacent deviate exceeding adjacent deviation standard value is exported as analysis result.
When the standard value that memory module 13 prestores comprises a whole screen deviation standard value, as one more embodiment of the present invention, analysis module 12 can comprise: pretreatment module 121, and the sampled signal for being obtained by acquisition module 11 converts accessible touch data to, whole screen variance analysis module 125, for calculating, pretreatment module 121 is converted to, the mean value of the touch data of whole node capacitor, and after the touch data of present node electric capacity is deducted this mean value, by the absolute value of data that the obtains touch data divided by present node electric capacity, obtain the whole screen deviate that present node electric capacity is corresponding, judge the whole screen deviation standard value whether each whole screen deviate exceedes memory module 13 and prestore afterwards, and the position coordinates of present node electric capacity corresponding for the whole screen deviate exceeding whole screen deviation standard value is exported as analysis result.
Certainly, in actual application, it is two or more that analysis module 12 can also comprise in maximal value analysis module 122, minimum value analysis module 123, adjacent variance analysis module 124, whole screen variance analysis module 125 simultaneously.
In the test macro of capacitive touch screen provided by the invention, memory module 13 prestores the standard value of capacitive node sampled data, in test process, the sampled signal of each capacitive node of acquisition module 11 automatic acquisition, analysis module 12 according to standard value and sampled signal the performance to each capacitive node analyze, export analysis result, achieve the autorun to capacitive touch screen, avoid the operating experience formula test mode of test man, shorten the test duration, improve the reliability of test result.When this test macro is built in the system test with display screen, display screen can be used for the analysis result that display analysis module 12 exports, thus utilize complete machine to serve as the measurement jig of specialty, and when not relying on external equipment, the performance test of complete independently capacitive touch screen.
Present invention also offers a kind of electronic equipment, this electronic equipment comprises capacitive touch screen, also comprises the test macro of a capacitive touch screen as above.Preferably, this electronic equipment is capacitance touch equipment.
Further, when sampled signal be wherein acquisition module 11 utilize communication protocol directly to obtain from the touch-screen driving chip of capacitive touch screen time, this electronic equipment also includes the touch-screen driving chip of capacitive touch screen further.
In addition, conveniently test, electronic equipment also comprises a display screen, for the analysis result that display analysis module 12 exports.
The method of testing of capacitive touch screen provided by the invention and system prestore the standard value of capacitive node sampled data, in test process, the sampled signal of each capacitive node of automatic acquisition, and the performance to each capacitive node is analyzed according to standard value and sampled signal, export analysis result, achieve the autorun to capacitive touch screen, avoid the operating experience formula test mode of test man, shorten the test duration, improve the reliability of test result.In addition, when the test macro of this capacitive touch screen is built in the system test with display screen, display screen can be used for the analysis result that display analysis module 12 exports, thus utilize complete machine to serve as the measurement jig of specialty, when not relying on external equipment, the performance test of complete independently capacitive touch screen.
One of ordinary skill in the art will appreciate that all or part of step realized in above-described embodiment method is that the hardware that can control to be correlated with by program completes, described program can be stored in the storage mediums such as ROM/RAM, disk, Flash, disk, CD.
The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention, all any amendments done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.
Claims (8)
1. a method of testing for capacitive touch screen, is characterized in that, said method comprising the steps of:
Obtain the sampled signal that on capacitive touch screen, each node capacitor is corresponding respectively;
After converting described sampled signal to accessible touch data, according to the standard value prestored, described touch data is analyzed, export analysis result;
Described standard value comprises an adjacent deviation standard value and/or a whole screen deviation standard value;
When described standard value comprises an adjacent deviation standard value, the standard value that described basis prestores is analyzed described touch data, and the step exporting analysis result comprises the following steps:
Calculate the absolute value of difference between the touch data of present node electric capacity and the touch data of each adjacent node electric capacity, and by the touch data of the absolute value of each difference divided by described present node electric capacity, obtain the adjacent deviate suitable with the number of described adjacent node electric capacity;
Judge whether each adjacent deviate exceedes described adjacent deviation standard value, and the position coordinates of present node electric capacity corresponding for the adjacent deviate exceeding described adjacent deviation standard value is exported as described analysis result;
When described standard value comprises a whole screen deviation standard value, the standard value that described basis prestores is analyzed described touch data, and the step exporting analysis result comprises the following steps:
Calculate the mean value of the touch data of whole node capacitor, and after the touch data of present node electric capacity is deducted described mean value, by the absolute value of data that obtains divided by the touch data of described present node electric capacity, obtain the whole screen deviate that described present node electric capacity is corresponding;
Judge whether each whole screen deviate exceedes described whole screen deviation standard value, and the position coordinates of present node electric capacity corresponding for the whole screen deviate exceeding described whole screen deviation standard value is exported as described analysis result.
2. the method for testing of capacitive touch screen as claimed in claim 1, it is characterized in that, described sampled signal is the corresponding electric impulse signal that the described capacitive node on described capacitive touch screen sends after being subject to external trigger, and/or directly obtain from the touch-screen driving chip of described capacitive touch screen, the original touch location data that characterize the capacitive node position that is triggered, and/or directly obtain from the driving chip of the touch-screen of described capacitive touch screen, all raw data of characterizing all capacitive nodes.
3. the method for testing of capacitive touch screen as claimed in claim 1, it is characterized in that, described standard value comprises a maximal value, and the standard value that described basis prestores is analyzed described touch data, and the step exporting analysis result is specially:
Judge whether described touch data exceedes described maximal value, and the position coordinates of node capacitor corresponding for the touch data exceeding described maximal value is exported as described analysis result.
4. the method for testing of capacitive touch screen as claimed in claim 1, it is characterized in that, described standard value comprises a minimum value, and the standard value that described basis prestores is analyzed described touch data, and the step exporting analysis result is specially:
Judge whether described touch data reaches described minimum value, and the position coordinates of node capacitor corresponding for the touch data not reaching described minimum value is exported as described analysis result.
5. a test macro for capacitive touch screen, is characterized in that, described system comprises:
Memory module, for pre-stored criteria value;
Acquisition module, for obtaining the sampled signal that on capacitive touch screen, each node capacitor is corresponding respectively; And
Analysis module, after the described sampled signal for being obtained by described acquisition module converts accessible touch data to, analyzes described touch data according to the described standard value that described memory module prestores, and exports analysis result;
Described analysis module comprises pretreatment module, and the described sampled signal that described pretreatment module is used for described acquisition module to obtain converts accessible touch data to;
The described standard value that described memory module prestores comprises adjacent deviation standard value and/or whole screen deviation standard value;
Described analysis module also comprises adjacent variance analysis module and/or whole screen variance analysis module;
Described adjacent variance analysis module is for the absolute value of difference between the touch data of present node electric capacity that calculates described pretreatment module and be converted to and the touch data of each adjacent node electric capacity, and by the touch data of the absolute value of each difference divided by present node electric capacity, obtain the adjacent deviate suitable with adjacent node electric capacity number, judge whether each adjacent deviate exceedes described adjacent deviation standard value afterwards, and the position coordinates of present node electric capacity corresponding for the adjacent deviate exceeding described adjacent deviation standard value is exported as described analysis result;
For calculating, described pretreatment module is converted to described whole screen variance analysis module, the mean value of the touch data of whole node capacitor, and after the touch data of present node electric capacity is deducted described mean value, by the absolute value of data that the obtains touch data divided by present node electric capacity, obtain the whole screen deviate that present node electric capacity is corresponding, judge whether each whole screen deviate exceedes described whole screen deviation standard value afterwards, and the position coordinates of present node electric capacity corresponding for the whole screen deviate exceeding described whole screen deviation standard value is exported as described analysis result.
6. the test macro of capacitive touch screen as claimed in claim 5, it is characterized in that, the described standard value that described memory module prestores comprises maximal value, minimum value, and described analysis module also comprises:
Maximal value analysis module, for judging whether the described touch data that described pretreatment module is converted to exceedes described maximal value, and exports the position coordinates of node capacitor corresponding for the touch data exceeding described maximal value as described analysis result;
Minimum value analysis module, for judging whether the described touch data that described pretreatment module is converted to reaches described minimum value, and exports the position coordinates of node capacitor corresponding for the touch data not reaching described minimum value as described analysis result.
7. an electronic equipment, comprises capacitive touch screen, it is characterized in that, described electronic equipment also comprises the test macro of a capacitive touch screen as claimed in claim 5.
8. electronic equipment as claimed in claim 7, it is characterized in that, described electronic equipment is capacitance touch equipment, and described electronic equipment also comprises:
The touch-screen driving chip of described capacitive touch screen; And
Display screen, for showing the described analysis result that described analysis module exports.
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| CN109188143B (en) * | 2018-09-20 | 2024-05-31 | 新辉开科技（深圳）有限公司 | Method and system for detecting capacitive touch screen functional sheet |
| CN110188014A (en) * | 2019-05-29 | 2019-08-30 | 浙江大学 | A kind of anti-interference test method for capacitive touch screen |
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