CN102967444B - Measuring and self-calibration method for xenon lamp light source - Google Patents

Abstract

The invention discloses a measuring and self-calibration method for a xenon lamp light source. The measuring and self-calibration method comprises (1) measuring a new light pipe of a xenon lamp, obtaining a spectrogram, a total irradiation amount and irradiation intensity of a characteristic wavelength section of the new light pipe, and simultaneously calibrating a xenon lamp measuring system; (2) when the xenon lamp light pipe works for a period of time and needs measuring and calibration, adopting a measuring method which is the same as the step (1) to measure the xenon lamp light pipe working for a period of time, obtaining a spectrogram, a total irradiation amount and irradiation intensity at the position of the characteristic wavelength section of the xenon lamp light pipe, comparing the spectrograms and the irradiation intensity at the position of the characteristic wavelength section of the new xenon lamp light pipe and the xenon lamp light pipe working for a period of time, and obtaining attenuation conditions of the xenon lamp light pipe; and (3) analyzing consistency of the spectrograms of the new light pipe and the light pipe working for a period of time so as to determine whether to adjust power of the xenon lamp or replace a new light pipe. According to the method, the aim of self-calibration of the xenon lamp is achieved through a spectrum technology.

Description

A kind of measurement of xenon source and method for self-calibrating

Technical field

The present invention relates to a kind of measuring technique of xenon source, specifically refer to a kind of measurement and method for self-calibrating of xenon source.

Background technology

As everyone knows, macromolecular material use or storage process in owing to being subject to the impact of environment, as light, heat, oxygen, humidity, stress, chemical etching etc., its performance can be deteriorated or forfeiture, this phenomenon is known as the aging of macromolecular material.Only affect the key factor of macromolecule material aging.At present develop in the world a series of light aging equipment and studied the light aging behavior of macromolecular material.Xenon lamp aging chamber is one of accelerated test equipment of commonly using the most of research macromolecule material aging behavior.Xenon lamp aging chamber is to utilize xenon arc lamp as artificial light sources, macromolecular material is irradiated to the ageing process of simulation macromolecular material in physical environment; By the adjustment of test parameters, realize certain accelerated deterioration effect simultaneously.Measurement to xenon arc lamp spectrum, aging behavior, modified test method and the testing equipment of analyzing studying macromolecular material are all very important.

Xenon arc lamp is as artificial light sources, and spectrum and intensity of illumination can change along with the prolongation of test period.When material carries out in the process of light aging test in Xenon weather-ometer, total irradiation intensity of xenon lamp can be decayed gradually along with the prolongation of test period, after reaching certain test period, just need to calibrate xenon lamp light pipe, carry out the stable of warranty test parameter by the mode that regulates xenon lamp power or change light pipe.The current calibration steps of xenon lamp is mainly divided into two parts, the one, by calibration light pipe, the measuring system of xenon lamp itself is calibrated, by the irradiation intensity of the characteristic wavelength section (340nm or 420nm) that specifies in standard of calibration light pipe is measured, by regulating xenon lamp power, the irradiation intensity of adjustment feature wavelength period reaches standard-required; Optical correction is carried out to xenon lamp light pipe exactly in second aspect.

At present, China there is no producer can produce calibration light pipe, therefore if the first step of realization to xenon lamp calibration need to be bought the measuring system that external calibration light pipe is calibrated xenon lamp.China does not also carry out the unified standard of optical correction at present to xenon lamp light pipe, optical correction can be carried out to xenon lamp light pipe in the domestic laboratory that there is no at present.Complete the second step of xenon lamp calibration, need to entrust laboratory overseas to complete, not only whole calibration cycle is long, and calibration expense is also very expensive.In addition, at present external calibration laboratory needs a set of proprietary equipment in the time that xenon lamp light pipe is carried out to optical correction, and this complete equipment China does not produce, and needs import.In sum, the xenon lamp collimation technique of China is limited by abroad always.

In addition, along with increasing research is found, the spectrum of xenon lamp has important impact to the ageing process impact of macromolecular material.Therefore understand the situation of change of xenon lamp light pipe spectrum in process of the test, maintain relatively stable being also very important of xenon lamp light pipe spectrum in process of the test.

In order to shorten calibration flow process, reduce calibration cost, analyse in depth the agine mechaism of macromolecular material, a kind of simple xenon lamp method for self-calibrating of exploitation just seems very necessary.

Summary of the invention

The object of this invention is to provide a kind of measurement and method for self-calibrating of xenon source, the method is by being used spectrometer and using the spectrum of front and back light pipe to measure with the optical fiber of cosine corrector to xenon lamp, relatively the irradiation intensity of both spectrum and characteristic wavelength judges the attenuation of light pipe, by judging the consistance of spectrogram and by regulating the power of xenon lamp, the irradiation intensity of light pipe is increased to meet standard-required to have reached the self-alignment object of xenon lamp.

Above-mentioned purpose of the present invention realizes by the following technical solutions: a kind of measurement of xenon source and method for self-calibrating, the method comprises the steps:

(1) the new light pipe of xenon lamp is measured, obtain the irradiation intensity of the spectrogram of new light pipe, total irradiation and characteristic wavelength section, described characteristic wavelength section refers to the xenon lamp characteristic wavelength that international standard specifies, for 340nm or 420nm, the irradiation intensity of characteristic wavelength section and the irradiation intensity data of the characteristic wavelength section that xenon lamp instrument panel shows of measuring gained are contrasted simultaneously, accurately whether can determine data that instrument shows, thereby the measuring system of xenon lamp is calibrated;

(2) in the time needing to measure and calibrate after xenon lamp pipe work a period of time, adopt the measuring method identical with step (1) to measure the xenon lamp light pipe of a period of time of having worked, obtain the spectrogram of this xenon lamp light pipe, the irradiation intensity of total irradiation and characteristic wave long section position, the relatively new light pipe of xenon lamp and total irradiation of xenon lamp light pipe and the irradiation intensity of characteristic wave long section position of work a period of time, when xenon lamp light pipe is reduced to irradiation intensity 90% below of new light pipe in characteristic wavelength section at the irradiation intensity of characteristic wavelength section, or total irradiation of xenon lamp light pipe be reduced to new light pipe total irradiation below 90% time, think that the irradiation of xenon lamp light pipe has decay, need xenon lamp to calibrate.

Be formulated and be:

$\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}=340}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}=340}^0}\&times;100\%<90\%$ ①

Or:

$\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}=420}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}=420}^0}\&times;100\%<90\%$ ②

Also or:

$\frac{\mathrm{Ee}}{{\mathrm{Ee}}^0}\&times;100\%<90\%$ ③

In formula:

Ee _λ=340---use the light pipe of a period of time at the irradiation intensity at 340nm wavelength period place, the W/m of unit ²

Ee _λ=420---use the light pipe of a period of time at the irradiation intensity at 420nm wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at 340nm wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at 420nm wavelength period place, the W/m of unit ²

He---use the light pipe of a period of time to measure total irradiation of gained, the J/m of unit ²

He ⁰---new light pipe is measured total irradiation of gained, the J/m of unit ².

In the present invention, in described step (1), the new light pipe of xenon lamp being measured to the concrete grammar adopting is: use fiber spectrometer and the optical fiber with cosine corrector, after the new light pipe of xenon lamp vertically installs, the light sensor that fibre-optical probe and xenon lamp carry is all positioned at xenon lamp cavity inner wall, and in same level position, by optical fiber and fiber spectrometer, the new light pipe of xenon lamp is measured, the data of the light sensor collection that xenon lamp carries simultaneously show by xenon lamp instrument.

As a further improvement on the present invention, the method also comprises the steps:

(3) analyze the consistance of spectrogram of new light pipe and the light pipe of work a period of time.When the similarity of 95% spectral intensity data of new light pipe and the light pipe of a period of time of having worked reaches 95% when above, think that both have reached consistent.

That is: $\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}}/\mathrm{He}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}}^0/{\mathrm{He}}^0}\&times;100\%>95\%$ ④

In formula:

Ee _λ---use the light pipe of a period of time at the irradiation intensity at a certain wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at Same Wavelength section place, the W/m of unit ²

He---use the light pipe of a period of time to measure total irradiation of gained, the J/m of unit ²

He ⁰---new light pipe is measured total irradiation of gained, the J/m of unit ²

(4) if the two spectrogram is consistent, be total irradiation variant (with reference to formula 3.), can, by regulating the power of xenon lamp, light pipe irradiation be increased.When the light pipe of a period of time of having worked is increased to unanimously at the irradiation intensity of same characteristic wavelength section with new light pipe at the irradiation intensity of characteristic wavelength section, complete the self calibration to xenon lamp light pipe.

(5) if 95% spectral intensity data of the light pipe of a period of time of having worked do not reach consistent with the spectral intensity data of new light pipe, and also can not make the two reach consistent at the irradiation intensity of characteristic wavelength section by power adjustments, light pipe has reached mission life, the light pipe that need to more renew.

That is: $\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}}/\mathrm{He}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}}^0/{\mathrm{He}}^0}\&times;100\%>95\%$

In formula:

Ee _λ---use the light pipe of a period of time at the irradiation intensity at a certain wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at Same Wavelength section place, the W/m of unit ²

He---use the light pipe of a period of time to measure total irradiation of gained, the J/m of unit ²

He ⁰---new light pipe is measured total irradiation of gained, the J/m of unit ².

Method of the present invention before use, needs to adopt standard sources to calibrate whole measuring system before each spectral measurement, guarantees the accuracy of measuring.

General calibration steps is to carry out measurement and calibration according to the irradiation intensity of the characteristic wave strong point showing on xenon lamp panel at present, and this kind of calibration steps is accurate not.And this method is to calibrate according to the total irradiation of spectrogram, light pipe of light pipe itself and the irradiation intensity of special wavelength section, can not be subject to the impact of xenon lamp structure itself, therefore calibration steps is more accurate.Compared with prior art, the present invention has following remarkable result:

(1) this xenon source Measurement and calibration according to the irradiation intensity that is the spectrogram of light pipe itself, total irradiation and special wavelength section (340nm or 420nm), this will make to calibrate more accurate.

(2) xenon lamp light pipe behaviour work light source, the stability of himself spectrum is better, and this has just ensured that the spectrogram reappearance measuring is better, has also avoided the impact of human factor, thereby can guarantee the accuracy of calibration result simultaneously.

(3) can calibrate xenon lamp in working order, needn't under specific calibration procedure, carry out, simplify calibration flow process.By new light pipe calibration measurement system, can not use calibration light pipe, provide cost savings.

(4) fibre ribbon using has cosine corrector, makes the interior light sensor of scope and xenon lamp consistent of the radiation (light) that optical fiber collects, and has ensured the comparability of measurement result.

(5) fibre-optical probe with light sensor in xenon lamp in same equivalent position, this irradiation that special wavelength section (340nm or 420nm) of spectrometer measurement is located has comparability with the data that show on instrument panel, thereby can calibrate the optical measuring system of xenon lamp itself.

(6) before measuring, use standard energy lamp to calibrate whole measuring system, guaranteed that the benchmark of each measurement result is consistent, ensured reappearance and the comparability of measurement result.

Brief description of the drawings

Below in conjunction with the drawings and specific embodiments, the present invention is described in further detail.

Fig. 1 is the spectrogram that adopts the new light pipe that measures of method of the present invention;

Fig. 2 is the spectrogram of light pipe a period of time of after that adopted the use that measures of method of the present invention;

Fig. 3 is the combination figure of Fig. 1 and Fig. 2, the attenuation of light pipe spectrum is compared, wherein, the spectrogram of new light pipe up, the spectrogram that has used light pipe a period of time of after below.

Embodiment

The measurement of a kind of xenon source of the present invention and method for self-calibrating are before use, according to calibration needs, after whole measuring system connects, use standard energy lamp to calibrate whole measuring system, the benchmark of guaranteeing each measurement result is consistent, and this measurement and method for self-calibrating comprise the steps:

(1) use measuring system to measure the new light pipe of xenon lamp, the new light pipe of xenon lamp is measured to the concrete grammar adopting is: use fiber spectrometer and the optical fiber with cosine corrector, after the new light pipe of xenon lamp vertically installs, the light sensor that fibre-optical probe and xenon lamp carry is all positioned at xenon lamp cavity inner wall, and in same level position, by optical fiber and fiber spectrometer, the new light pipe of xenon lamp is measured, the data of the light sensor collection that xenon lamp carries simultaneously show by xenon lamp instrument.Can directly record the irradiation intensity of the spectrogram of new light pipe, total irradiation and characteristic wavelength section by optical fiber and fiber spectrometer, wherein, the spectrogram of new light pipe as shown in Figure 1, total irradiation intensity of light pipe is that fiber spectrometer calculates automatically by integration, is directly presented in measurement result.Described characteristic wavelength section refers to the xenon lamp characteristic wavelength that international standard specifies, for 340nm or 420nm, the irradiation intensity of characteristic wavelength section and the irradiation intensity data of the characteristic wavelength section that xenon lamp instrument panel shows of measuring gained are contrasted simultaneously, accurately whether can determine data that instrument shows, thereby the measuring system of xenon lamp is calibrated;

(2) in the time needing to measure and calibrate after xenon lamp pipe work a period of time, adopt the measuring method identical with step (1) to measure the xenon lamp light pipe of a period of time of having worked, the irradiation intensity that obtains the spectrogram of this xenon lamp light pipe, total irradiation and characteristic wave long section position, spectrogram as shown in Figure 2.The relatively new light pipe of xenon lamp and total irradiation of xenon lamp light pipe and the irradiation intensity of characteristic wave long section position of work a period of time, as Fig. 3.When xenon lamp light pipe is reduced to irradiation intensity 90% below of new light pipe in characteristic wavelength section at the irradiation intensity of characteristic wavelength section, or total irradiation of xenon lamp light pipe be reduced to new light pipe total irradiation below 90% time, think that the irradiation of xenon lamp light pipe has decay, needs xenon lamp to calibrate.

That is:

$\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}=340}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}=340}^0}\&times;100\%<90\%$ ①

Or:

$\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}=420}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}=420}^0}\&times;100\%<90\%$ ②

Also or:

$\frac{\mathrm{Ee}}{{\mathrm{Ee}}^0}\&times;100\%<90\%$ ③

In formula:

Ee _λ=340---use the light pipe of a period of time at the irradiation intensity at 340nm wavelength period place, the W/m of unit ²

Ee _λ=420---use the light pipe of a period of time at the irradiation intensity at 420nm wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at 340nm wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at 420nm wavelength period place, the W/m of unit ²

He---use the light pipe of a period of time to measure total irradiation of gained, the J/m of unit ²

He ⁰---new light pipe is measured total irradiation of gained, the J/m of unit ²

(3) analyze the consistance of spectrogram of new light pipe and the light pipe of work a period of time.When the similarity of 95% spectral intensity data of new light pipe and the light pipe of a period of time of having worked reaches 95% when above, think that both have reached consistent.That is to say, meet formula data 4. and accounted for 95% when above of all measurement data, think that both have reached consistent.

That is: $\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}}/\mathrm{He}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}}^0/{\mathrm{He}}^0}\&times;100\%>95\%$ ④

In formula:

Ee _λ---use the light pipe of a period of time at the irradiation intensity at a certain wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at Same Wavelength section place, the W/m of unit ²

He---use the light pipe of a period of time to measure total irradiation of gained, the J/m of unit ²

He ⁰---new light pipe is measured total irradiation of gained, the J/m of unit ²

(4) if the two spectrogram is consistent, be total irradiation variant (with reference to formula 3.), can, by regulating the power of xenon lamp, light pipe irradiation be increased.When the light pipe of a period of time of having worked is increased to unanimously at the irradiation intensity of same characteristic wavelength section with new light pipe at the irradiation intensity of characteristic wavelength section, complete the self calibration to xenon lamp light pipe.

(5) if 95% spectral intensity data of the light pipe of a period of time of having worked do not reach consistent with the spectral intensity data of new light pipe, and also can not make the two reach consistent at the irradiation intensity of characteristic wavelength section by power adjustments, light pipe has reached mission life, the light pipe that need to more renew.

That is: $\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}}/\mathrm{He}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}}^0/{\mathrm{He}}^0}\&times;100\%>95\%$

In formula:

Ee _λ---use the light pipe of a period of time at the irradiation intensity at a certain wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at Same Wavelength section place, the W/m of unit ²

He---use the light pipe of a period of time to measure total irradiation of gained, the J/m of unit ²

He ⁰---new light pipe is measured total irradiation of gained, the J/m of unit ².

The above embodiment of the present invention is not limiting the scope of the present invention; embodiments of the present invention are not limited to this; all this kind is according to foregoing of the present invention; according to ordinary skill knowledge and the customary means of this area; do not departing under the above-mentioned basic fundamental thought of the present invention prerequisite; amendment, replacement or the change of other various ways that said structure of the present invention is made, within all should dropping on protection scope of the present invention.

Claims (4)

1. the measurement of xenon source and a method for self-calibrating, is characterized in that: the method comprises the steps:

(1) the new light pipe of xenon lamp is measured, obtain the irradiation intensity of the spectrogram of new light pipe, total irradiation and characteristic wavelength section, described characteristic wavelength section refers to the xenon lamp characteristic wavelength that international standard specifies, for 340nm or 420nm, the irradiation intensity of characteristic wavelength section and the irradiation intensity data of the characteristic wavelength section that xenon lamp instrument panel shows of measuring gained are contrasted simultaneously, accurately whether can determine data that instrument shows, thereby the measuring system of xenon lamp is calibrated;

(2) in the time needing to measure and calibrate after xenon lamp pipe work a period of time, adopt the measuring method identical with step (1) to measure the xenon lamp light pipe of a period of time of having worked, obtain the spectrogram of this xenon lamp light pipe, the irradiation intensity of total irradiation and characteristic wave long section position, the relatively new light pipe of xenon lamp and total irradiation of xenon lamp light pipe and the irradiation intensity of characteristic wave long section position of work a period of time, when xenon lamp light pipe is reduced to irradiation intensity 90% below of new light pipe in characteristic wavelength section at the irradiation intensity of characteristic wavelength section, or total irradiation of xenon lamp light pipe be reduced to new light pipe total irradiation below 90% time, think that the irradiation of xenon lamp light pipe has decay, need xenon lamp to calibrate,

Be formulated and be:

$\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}=340}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}=340}^0}\&times;100\%<90\%$ ①

Or:

$\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}=420}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}=420}^0}\&times;100\%<90\%$ ②

Also or:

$\frac{\mathrm{He}}{{\mathrm{He}}^0}\&times;100\%<90\%$ ③

In formula:

Ee _λ=340---use the light pipe of a period of time at the irradiation intensity at 340nm wavelength period place, the W/m of unit ²

Ee _λ=420---use the light pipe of a period of time at the irradiation intensity at 420nm wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at 340nm wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at 420nm wavelength period place, the W/m of unit ²

He---use the light pipe of a period of time to measure total irradiation of gained, the J/m of unit ²

He ⁰---new light pipe is measured total irradiation of gained, the J/m of unit ².

2. the measurement of xenon source according to claim 1 and method for self-calibrating, it is characterized in that: in described step (1), the new light pipe of xenon lamp being measured to the concrete grammar adopting is: use fiber spectrometer and the optical fiber with cosine corrector, after the new light pipe of xenon lamp vertically installs, the light sensor that fibre-optical probe and xenon lamp carry is all positioned at xenon lamp cavity inner wall, and in same level position, by optical fiber and fiber spectrometer, the new light pipe of xenon lamp is measured, the data of the light sensor collection that xenon lamp carries simultaneously show by xenon lamp instrument.

3. the measurement of xenon source according to claim 2 and method for self-calibrating, the method also comprises the steps:

(3) analyze the consistance of spectrogram of new light pipe and the light pipe of work a period of time, when the similarity of 95% spectral intensity data of new light pipe and the light pipe of a period of time of having worked reaches 95% when above, think that both have reached unanimously,

That is: $\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}}/\mathrm{He}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}}^0/{\mathrm{He}}^0}\&times;100\%>95\%$ ④

In formula:

Ee _λ---use the light pipe of a period of time at the irradiation intensity at a certain wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at Same Wavelength section place, the W/m of unit ²

He---use the light pipe of a period of time to measure total irradiation of gained, the J/m of unit ²

He ⁰---new light pipe is measured total irradiation of gained, the J/m of unit ²

(4) if the two spectrogram is consistent, be that total irradiation is variant, with reference to formula 3., by regulating the power of xenon lamp, light pipe irradiation is increased; When the light pipe of a period of time of having worked is increased to unanimously at the irradiation intensity of same characteristic wavelength section with new light pipe at the irradiation intensity of characteristic wavelength section, complete the self calibration to xenon lamp light pipe;

(5) if 95% spectral intensity data of the light pipe of a period of time of having worked do not reach consistent with the spectral intensity data of new light pipe, and also can not make the two reach consistent at the irradiation intensity of characteristic wavelength section by power adjustments, light pipe has reached mission life, the light pipe that need to more renew;

That is: $\frac{{\mathrm{Ee}}_{\mathrm{\&lambda;}}/\mathrm{He}}{{\mathrm{Ee}}_{\mathrm{\&lambda;}}^0/{\mathrm{He}}^0}\&times;100\%<95\%$

In formula:

Ee _λ---use the light pipe of a period of time at the irradiation intensity at a certain wavelength period place, the W/m of unit ²

---new light pipe is at the irradiation intensity at Same Wavelength section place, the W/m of unit ²

He---use the light pipe of a period of time to measure total irradiation of gained, the J/m of unit ²

He ⁰---new light pipe is measured total irradiation of gained, the J/m of unit ².

4. according to measurement and the method for self-calibrating of the xenon source described in claim 1 or 2 or 3, it is characterized in that: the method before use, needs to adopt standard sources to calibrate whole measuring system before each spectral measurement, guarantees the accuracy of measuring.