CN102540126A - Direct-current voltage calibrating method - Google Patents
Direct-current voltage calibrating method Download PDFInfo
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- CN102540126A CN102540126A CN2011104357279A CN201110435727A CN102540126A CN 102540126 A CN102540126 A CN 102540126A CN 2011104357279 A CN2011104357279 A CN 2011104357279A CN 201110435727 A CN201110435727 A CN 201110435727A CN 102540126 A CN102540126 A CN 102540126A
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Abstract
A direct-current voltage calibrating method comprises a sampling calibration circuit voltage error coefficient obtaining and storing step and a calibrating step of a direct-current voltage to be calibrated. The sampling calibration circuit voltage error coefficient obtaining and storing step comprises a. selecting and connecting a direct-current reference voltage source to be connected in a sampling calibration circuit, and measuring the external voltage value of a calibration power supply; b. comparing the voltage value obtained in the step a with the voltage value of the reference voltage source to obtain a voltage error coefficient; and c. writing the voltage error coefficient and a control program in a memory area of a chip memorizing program. In the invention, the direct-current voltage calibrating error coefficient is directly written in a chip to be used for the memory area of the memory program, a data memorizing area of a chip is not needed, so that the enough degree of freedom can be provided for the selection of the chip, for example, the calibration of the direct-current voltage can be realized by selecting a chip without data retaining capability in the data memorizing area, so that the control requirement of the whole product cost can be realized more conveniently, the realization is easy, and the method has higher accuracy.
Description
Technical field
The present invention relates to the improvement technology of sun power lithium battery.
Background technology
Along with the high speed development of electron trade, for meeting the need of market, solve requirements at the higher level and the cost control of electronic product to the DC voltage sampling precision, for the sampling calibration of DC voltage, industry adopts the self calibration mode usually.The self calibration mode is exactly the DC voltage sampled value that at first obtains surveying through the sampling to outside DC voltage reference source; Chip contrasts according to this actual measurement DC voltage sampled value and reference dc voltage source and calculates the error coefficient of circuit; This error coefficient is deposited in the data storage area of chip; According to depositing in the error coefficient in the chip data memory block, the DC voltage sampled value of circuit actual measurement is regulated when product is used, obtain outside more accurately DC voltage.This DC voltage self calibration mode need be stored precalibrated error coefficient in the data storage area of chip, and must keep the error coefficient deposited during dead electricity, regulates so that can call this error coefficient at any time during practical application.As everyone knows; This chip also must have other data storage area and be used to store this error coefficient except needs have the memory block of storage chip program; Because it is higher relatively that the band data storage area has the chip price cost of data holding ability, therefore produced cost of products also can rise to some extent.This brings some new cost pressure factors for the electron trade of competition more and more fierce, is unfavorable for the cost control requirement of product.
Summary of the invention
In view of this, the present invention's technical matters that will solve provides a kind of DC voltage calibration steps that a kind of cost is low, be easier to realize.
Thus, technical scheme proposed by the invention is following:
A kind of DC voltage calibration steps comprises that sampling calibration circuit voltage error coefficient obtains the calibration steps of storing step and DC voltage to be calibrated, and described sampling calibration circuit voltage error coefficient obtains storing step and comprises:
A. choose the DC reference voltage source and be connected in the sampling calibration circuit, measure the outside magnitude of voltage of this power calibration;
B. magnitude of voltage and the reference voltage source magnitude of voltage that obtains in a step compared, obtain the voltage error coefficient;
C. voltage error coefficient and control program are write the memory block of chip-stored program.
Wherein, described calibration steps comprises:
D. outside direct voltage source to be calibrated is inserted the sampling calibration circuit, chip is sampled to this voltage source, obtains the voltage sample value;
E. this voltage sample value and the voltage error coefficient that is pre-stored in the chip are added up, promptly obtain the accurate magnitude of voltage of outside direct voltage source.
The present invention is used for stored program memory block with the DC voltage calibration error coefficient chip that writes direct; Need not utilize the data storage area of chip; This just for selecting chip that enough degree of freedom are provided, such as selecting for use the data storage area not realize the calibration of DC voltage with the chip of data holding ability, more helps realizing the control requirement to the overall product cost; Be easy to realize, and this method has higher accuracy.
Embodiment
For ease of those skilled in the art's understanding, the present invention is made further detailed description below in conjunction with specific embodiment.
A kind of DC voltage calibration steps comprises that sampling calibration circuit voltage error coefficient obtains the calibration steps of storing step and DC voltage to be calibrated, and described sampling calibration circuit voltage error coefficient obtains storing step and comprises:
A. choose the DC reference voltage source and be connected in the sampling calibration circuit, measure the outside magnitude of voltage of this power calibration;
B. magnitude of voltage and the reference voltage source magnitude of voltage that obtains in a step compared, obtain the voltage error coefficient;
C. voltage error coefficient and control program are write the memory block of chip-stored program.
Wherein, described calibration steps comprises:
D. outside direct voltage source to be calibrated is inserted the sampling calibration circuit, chip is sampled to this voltage source, obtains the voltage sample value;
E. this voltage sample value and the voltage error coefficient that is pre-stored in the chip are added up, promptly obtain the accurate magnitude of voltage of outside direct voltage source.
The calibration steps of this parameter of writing direct is with the error coefficient memory block of chip-stored program of writing direct, and need be with the precalibrated error coefficient of the chip-stored of data holding ability.The selection degree of freedom of chip is increased, help the control of cost of products aspect.
It more than is some concrete implementation of the present invention; It describes comparatively concrete and detailed; But can not therefore be interpreted as restriction, should be pointed out that for the person of ordinary skill of the art claim of the present invention; Under the prerequisite that does not break away from the present invention's design, these conspicuous replacement forms all belong to protection scope of the present invention.
Claims (2)
1. DC voltage calibration steps comprises that sampling calibration circuit voltage error coefficient obtains the calibration steps of storing step and DC voltage to be calibrated, is characterized in that described sampling calibration circuit voltage error coefficient obtains storing step and comprises:
A. choose the DC reference voltage source and be connected in the sampling calibration circuit, measure the outside magnitude of voltage of this power calibration;
B. magnitude of voltage and the reference voltage source magnitude of voltage that obtains in a step compared, obtain the voltage error coefficient;
C. voltage error coefficient and control program are write the memory block of chip-stored program.
2. DC voltage calibration steps according to claim 1 is characterized in that, described calibration steps comprises:
D. outside direct voltage source to be calibrated is inserted the sampling calibration circuit, chip is sampled to this voltage source, obtains the voltage sample value;
E. this voltage sample value and the voltage error coefficient that is pre-stored in the chip are added up, promptly obtain the accurate magnitude of voltage of outside direct voltage source.
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| CN2011104357279A CN102540126A (en) | 2011-12-23 | 2011-12-23 | Direct-current voltage calibrating method |
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| CN2011104357279A CN102540126A (en) | 2011-12-23 | 2011-12-23 | Direct-current voltage calibrating method |
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| CN102540126A true CN102540126A (en) | 2012-07-04 |
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103543353A (en) * | 2013-09-24 | 2014-01-29 | 许继集团有限公司 | Direct-current sampling method in wide-temperature environment |
| CN103852620A (en) * | 2012-12-06 | 2014-06-11 | 苏州工业园区新宏博通讯科技有限公司 | Self-adaptation test method of automatic reclosing lock |
| CN104360300A (en) * | 2014-11-21 | 2015-02-18 | 惠州市蓝微电子有限公司 | Automatic voltage accuracy correcting and adjusting method for voltage calibrating device |
| CN106950524A (en) * | 2017-02-22 | 2017-07-14 | 歌尔科技有限公司 | Calibration method, device and calibration system for voltage measuring apparatus |
| CN108089239A (en) * | 2017-12-19 | 2018-05-29 | 中国地震局地壳应力研究所 | A kind of d.c.voltage calibrator and client |
| CN108802654A (en) * | 2018-07-06 | 2018-11-13 | 山东大学 | A kind of the automatic Calibration acquisition system and method for forming and capacity dividing test power supply |
| CN109031176A (en) * | 2018-07-05 | 2018-12-18 | 中国人民解放军91388部队 | A kind of Multifunction electricity source measurement standard method |
| CN110618663A (en) * | 2019-08-29 | 2019-12-27 | 深圳市余看智能科技有限公司 | Calibration method of control board |
| CN110673058A (en) * | 2019-11-14 | 2020-01-10 | 广州赛宝计量检测中心服务有限公司 | Calibration circuit and equipment for direct-current power supply metering parameters |
| CN112362957A (en) * | 2020-11-27 | 2021-02-12 | 珠海格力电器股份有限公司 | Sampling circuit and shunt |
| CN112557876A (en) * | 2020-12-10 | 2021-03-26 | 苏州英嘉通半导体有限公司 | Device for calibrating chip simulation parameters and test method thereof |
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Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103852620A (en) * | 2012-12-06 | 2014-06-11 | 苏州工业园区新宏博通讯科技有限公司 | Self-adaptation test method of automatic reclosing lock |
| CN103543353A (en) * | 2013-09-24 | 2014-01-29 | 许继集团有限公司 | Direct-current sampling method in wide-temperature environment |
| CN103543353B (en) * | 2013-09-24 | 2016-04-13 | 许继集团有限公司 | Direct current acquisition method under a kind of wide temperature environment |
| CN104360300A (en) * | 2014-11-21 | 2015-02-18 | 惠州市蓝微电子有限公司 | Automatic voltage accuracy correcting and adjusting method for voltage calibrating device |
| CN104360300B (en) * | 2014-11-21 | 2017-07-18 | 惠州市蓝微电子有限公司 | A kind of voltage accuracy of voltage calibration equipment corrects adjusting process automatically |
| CN106950524A (en) * | 2017-02-22 | 2017-07-14 | 歌尔科技有限公司 | Calibration method, device and calibration system for voltage measuring apparatus |
| CN108089239A (en) * | 2017-12-19 | 2018-05-29 | 中国地震局地壳应力研究所 | A kind of d.c.voltage calibrator and client |
| CN109031176A (en) * | 2018-07-05 | 2018-12-18 | 中国人民解放军91388部队 | A kind of Multifunction electricity source measurement standard method |
| CN108802654A (en) * | 2018-07-06 | 2018-11-13 | 山东大学 | A kind of the automatic Calibration acquisition system and method for forming and capacity dividing test power supply |
| CN110618663A (en) * | 2019-08-29 | 2019-12-27 | 深圳市余看智能科技有限公司 | Calibration method of control board |
| CN110673058A (en) * | 2019-11-14 | 2020-01-10 | 广州赛宝计量检测中心服务有限公司 | Calibration circuit and equipment for direct-current power supply metering parameters |
| CN112362957A (en) * | 2020-11-27 | 2021-02-12 | 珠海格力电器股份有限公司 | Sampling circuit and shunt |
| CN112557876A (en) * | 2020-12-10 | 2021-03-26 | 苏州英嘉通半导体有限公司 | Device for calibrating chip simulation parameters and test method thereof |
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Application publication date: 20120704 |