CN102538708A - Measurement system for three-dimensional shape of optional surface - Google Patents
Measurement system for three-dimensional shape of optional surface Download PDFInfo
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- 238000005259 measurement Methods 0.000 title abstract description 39
- 239000011159 matrix material Substances 0.000 claims abstract description 14
- 238000012545 processing Methods 0.000 claims abstract description 7
- 238000012876 topography Methods 0.000 claims description 14
- 238000003384 imaging method Methods 0.000 claims description 8
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- 230000003287 optical effect Effects 0.000 abstract description 6
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Abstract
The invention provides a measurement system for the three-dimensional shape of an optional surface, which is characterized by comprising a laser dot matrix projection unit, an image acquisition unit and a three-dimensional reconstruction unit, wherein the laser dot matrix projection unit is used for projecting dot-matrix structured light to a surface to be measured and comprises a laser source and an orthogonal grating. The orthogonal grating is disposed on a path of the laser source to the surface to be measured. The image acquisition unit is used for acquiring images of the surface to be measured and sending the images to the three-dimensional reconstruction unit. The three-dimensional reconstruction unit is used for being connected with the image acquisition unit and processing the images to obtain three-dimensional shape data of the surface to be measured. The measurement system can be used for measuring black or deep-color surfaces without restraint from colors of the measured surfaces and measurement environments, and can also be used to obtain precise three-dimensional shape measurement result of the surfaces in poor optical lighting environments.
Description
Technical Field
The invention relates to a three-dimensional surface measuring system, in particular to an optical non-contact measuring system for three-dimensional surface space coordinates.
Background
In many fields of industrial detection and scientific research, three-dimensional topography information of the surface of a complex object needs to be obtained, and an effective measurement method needs to be adopted in order to obtain the three-dimensional topography information of the surface to be detected. Optical three-dimensional topography measurement methods have been widely used in the field of surface inspection and surface measurement due to their non-contact advantages. The optical three-dimensional shape measurement method mainly comprises two types: projection and binocular stereovision measurement.
The projection method consists of a set of projectors and a set of image acquisition system, wherein the image acquisition system comprises an industrial camera and a computer connected with the camera. During measurement, a projector is used for projecting structured light (such as points, lines or stripes) to the surface of a measured object, then a camera is used for collecting an image of the surface of the measured object from another angle, and the height information of one section or the whole surface of the object is obtained by analyzing the deformation of the structured light in the image of the surface of the measured object.
Binocular stereovision measurement uses two cameras to simulate the eyes of a person for depth measurement. First, the spatial positional relationship (external parameters) of the camera, and the internal parameters and lens distortion (internal parameters) of the camera are calibrated. And then, respectively recording images of the same scene of the measured surface from different directions by using the two cameras, matching corresponding points in the two-dimensional images, and calculating the three-dimensional coordinates of the points in a space coordinate system according to internal and external parameters of the two cameras obtained by calibration. When implementing binocular stereo vision measurement, recognizable structures need to be arranged on the measured surface, such as speckles or mark points sprayed on the measured surface. The identifiable structures are used as characteristic points according to image matching identification, and the spatial three-dimensional coordinates of the characteristic points can be obtained through calculation, so that the appearance of the surface to be detected is reconstructed.
The two methods for measuring the three-dimensional surface morphology need to preset recognizable structured light on the measured surface, and then carry out imaging and subsequent image data processing. The structured light is formed on the measured surface by a projector or directly sprayed with recognizable feature points on the measured surface. In practice, it is not easy or possible to project structured light or to spray feature points on the surface of the object in some cases. For example, the black product surface on the factory production line does not allow the characteristic points to be sprayed, and the contrast of the image formed by projecting the ordinary white light source on the black product surface is very poor, so that the measurement cannot be carried out or the effect is poor. For another example, when the measurement is performed at night or in an environment with poor light, even if the surface of the object has obvious structured light, the camera cannot clearly image, and the measurement is impossible.
Disclosure of Invention
The invention provides a measuring system for the three-dimensional shape of any surface, aiming at solving the limitation of the existing three-dimensional surface optical measuring technology and forming a clear structured light pattern on the measured surface without the limitation of the color of the measured surface and the measuring environment condition.
In order to solve the technical problem, the invention provides a system for measuring the three-dimensional shape of any surface, which is characterized by comprising a laser dot matrix projection unit, an image acquisition unit and a three-dimensional reconstruction unit; wherein,
the laser lattice projection unit is used for projecting lattice structured light to the surface to be measured and comprises a laser light source and an orthogonal grating, and the orthogonal grating is arranged on a light path from the laser light source to the surface to be measured;
the image acquisition unit is used for acquiring an image of the measured surface and sending the image to the three-dimensional reconstruction unit;
and the three-dimensional reconstruction unit is connected with the image acquisition unit and used for processing the image to obtain three-dimensional topography data of the measured surface.
Further, the distance between the laser light source and the measured surface is adjustable.
Further, the laser dot matrix projection unit is provided with at least 1 group of orthogonal gratings which are parallel to each other.
Further, the orthogonal grating rotates by taking a connection line at the center of the orthogonal grating as an axis; the connecting line of the centers is vertical to the surfaces of the orthogonal gratings which are parallel to each other.
Further, wherein the laser light source is a laser diode.
Further wherein the axis of the laser diode coincides with a line connecting the centers of the orthogonal gratings.
Further, wherein the image acquisition unit is provided with 2 digital imaging devices.
Further wherein the laser diode is disposed between the 2 digital imaging devices.
Further, the image acquisition unit comprises a digital imaging device for acquiring the image of the measured surface.
Compared with the conventional three-dimensional shape measurement method, the method has the advantages that the method is not limited by the measurement environment, can be used for measuring black or dark mark-free surfaces in industrial detection, and can also be used for measuring under the condition of poor illumination condition to obtain the accurate three-dimensional shape measurement result of the surface of the measured object. And moreover, the orthogonal grating is utilized to project a high-brightness laser dot matrix, and the dot matrix density is increased and decreased by changing the position of the laser diode away from the measured object, as shown in fig. 2, so that the requirements of measurement of different spatial resolutions are met, and the measurement is more flexible.
Drawings
FIG. 1 is a schematic diagram of an embodiment of a system for measuring the three-dimensional topography of an arbitrary surface according to the present invention.
FIG. 2 is a schematic diagram of another embodiment of the system for measuring three-dimensional topography of an arbitrary surface according to the present invention (adjusting the projection density of laser points by changing the distance between the laser diode and the object to be measured).
FIG. 3 is a measurement result of any surface three-dimensional topography measurement system of the present invention after measurement and data processing.
Detailed Description
The technical solution of the present invention will be described in detail below with reference to the accompanying drawings.
Fig. 1 shows an embodiment of the three-dimensional topography measuring system of the present invention, in which the surface to be measured is a side surface of a cylinder 3 to be measured. The three-dimensional topography measurement system comprises: the device comprises a laser dot matrix projection unit, an image acquisition unit and a three-dimensional reconstruction unit. The image acquisition unit is connected with the three-dimensional reconstruction unit.
The laser dot matrix projection unit comprises a laser diode 4 and an orthogonal grating 6, and the laser diode 4 is used as a laser light source for projecting laser to the measured surface. The orthogonal grating 6 is arranged in the optical path between the laser diode 4 and the surface to be measured, i.e. the light projected by the laser diode 4 onto the surface to be measured has to pass the orthogonal grating 6. The small laser diode and the grating structure are combined to form the laser dot matrix projection unit, so that the projection miniaturization is realized, the measurement cost is saved, and the measurement flexibility is improved.
The image acquisition unit includes: a CCD camera 2 and a CCD camera 5 as digital imaging means for acquiring a digital image of the measured surface. The model and various characteristic parameters of the CCD camera 2 and the CCD camera 5 are preferably the same. The digital images obtained by the CCD camera 2 and the CCD camera 5 are transferred to the three-dimensional reconstruction unit. The image acquisition unit further comprises a computer 1 connected with a CCD camera 2 and a CCD camera 5. The computer 1 is provided with an image acquisition software program for processing digital images acquired by the CCD camera 2 and the CCD camera 5.
The three-dimensional reconstruction unit comprises a computer 1. The computer 1 is provided with three-dimensional reconstruction software, and the obtained digital image of the measured surface is processed and analyzed to obtain three-dimensional topography data of the measured surface. The specific method for obtaining the three-dimensional shape data can be realized by adopting the prior art, and is not described herein again.
The use of two CCD cameras is an example of the existing binocular stereopsis measurement, and is not intended to limit the scope of the present invention, i.e., a single CCD camera may be provided using projection.
The key of the invention is that a laser diode 4 and an orthogonal grating 6 are arranged as a light source. The laser diode 4 is used for forming structured light on the measured surface, and when the orthogonal grating 6 is matched with the point-shaped light source, laser is projected to a screen to form a group of laser dot patterns through diffraction effect when the orthogonal grating is irradiated by the point-shaped light source. Therefore, the arbitrary surface three-dimensional shape measuring system can form a high-brightness laser lattice on the measured surface, and the laser lattice formed by the laser light source is not limited by the measuring environment, so the laser lattice formed by the three-dimensional shape measuring system on the measured surface can be used as the structured light with good effect for measurement.
In the second embodiment of the present invention, the distance between the laser diode and the measured object can be changed based on the embodiment shown in fig. 1, and as shown in fig. 2, the density of the laser lattice formed on the surface of the measured cylinder 3 changes, so that only one set of three-dimensional shape measurement system is needed when measurements with different resolutions (different densities of the laser lattice) are required, thereby saving the measurement cost and improving the measurement efficiency and the measurement quality.
FIG. 3 shows the measurement results obtained after processing the image obtained by the three-dimensional topography measurement system shown in FIG. 1.
As shown in fig. 1 and 2, the method of using the system according to the second embodiment of the present invention is as follows:
before measurement, the spatial position relationship (external parameters) and internal parameters (such as lens distortion) of the two CCD cameras are calibrated, and the existing calibration method can be adopted, and will not be described in detail.
First, the laser diode 4 is turned on; namely, laser is used as a light source for forming lattice structured light on the side surface of the measured cylinder. Due to the characteristics of the laser, even under the condition that the black measured surface or the ambient light is weak, clear lattice structured light can be formed on the side face of the measured cylinder, and an accurate measurement result is obtained.
And secondly, adjusting the distance between the laser diode and the measured cylinder to form a laser dot matrix with the density as high as possible on the side surface of the measured cylinder so as to improve the measurement resolution.
Thirdly, the lattice structured light on the side of the cylinder under test is imaged from different angles using two CCD cameras. The laser diode 4 is arranged between the two CCD cameras.
The digital image obtained in the third step can further obtain the final three-dimensional topography data of the measured surface by using a three-dimensional reconstruction unit, such as the result example shown in fig. 3.
Compared with the conventional three-dimensional shape measurement method, the method has the advantages that the method is not limited by the measurement environment, can be used for measuring black or dark mark-free surfaces in industrial detection, and can also be used for measuring under the condition of poor illumination condition to obtain the accurate three-dimensional shape measurement result of the surface of the measured object. And moreover, the orthogonal grating is utilized to project a high-brightness laser dot matrix, and the dot matrix density is increased and decreased by changing the position of the laser diode away from the measured object, as shown in fig. 2, so that the requirements of measurement of different spatial resolutions are met, and the measurement is more flexible.
It should be noted that the above-mentioned embodiments are only preferred embodiments of the present invention, and do not limit the scope of the present invention, and the present invention may be replaced by other equivalent techniques. Therefore, all equivalent changes, direct or indirect applications, made by using the description and drawings of the present invention, or other related technical fields are all included in the scope of the present invention.
Claims (9)
1. A measuring system for the three-dimensional topography of any surface is characterized by comprising a laser dot matrix projection unit, an image acquisition unit and a three-dimensional reconstruction unit; wherein,
the laser lattice projection unit is used for projecting lattice structured light to the surface to be measured and comprises a laser light source and an orthogonal grating, and the orthogonal grating is arranged on a light path from the laser light source to the surface to be measured;
the image acquisition unit is used for acquiring an image of the measured surface and sending the image to the three-dimensional reconstruction unit;
and the three-dimensional reconstruction unit is connected with the image acquisition unit and used for processing the image to obtain three-dimensional topography data of the measured surface.
2. The system of claim 1, wherein the distance between the laser source and the measured surface is adjustable.
3. The system for measuring the three-dimensional shape of any surface according to claim 2, wherein the laser lattice projection unit is provided with at least 1 set of orthogonal gratings which are parallel to each other.
4. The system of claim 3, wherein the orthogonal grating rotates around a line connecting centers of the orthogonal grating as an axis; the connecting line of the centers is vertical to the surfaces of the orthogonal gratings which are parallel to each other.
5. The system of claim 4, wherein the laser source is a laser diode.
6. The system of claim 5, wherein the axis of the laser diode coincides with a line connecting the centers of the orthogonal gratings.
7. The system for measuring the three-dimensional shape of any surface according to claim 6, wherein the image acquisition unit is provided with 2 digital imaging devices.
8. The system of claim 7, wherein the laser diode is disposed between the 2 digital imaging devices.
9. The system of claim 8, wherein the image capturing unit comprises a digital imaging device for capturing images of the surface under test.
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Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103438834A (en) * | 2013-09-17 | 2013-12-11 | 清华大学深圳研究生院 | Hierarchy-type rapid three-dimensional measuring device and method based on structured light projection |
| CN104002021A (en) * | 2014-06-06 | 2014-08-27 | 哈尔滨工业大学 | Device for automatically identifying and tracking multi-layer and multi-pass welding beads |
| CN104154955A (en) * | 2014-05-19 | 2014-11-19 | 北京理工大学 | Method and system for dynamic measurement of liquid surface morphology and dosage of liquid propellant in storage tank |
| CN105180836A (en) * | 2014-05-23 | 2015-12-23 | 精工爱普生株式会社 | Control apparatus, robot, and control method |
| CN106767410A (en) * | 2015-11-19 | 2017-05-31 | 手持产品公司 | high-resolution dot pattern |
| CN107044821A (en) * | 2016-12-30 | 2017-08-15 | 苏州西博三维科技有限公司 | A kind of measuring method and system of contactless tubing object |
| CN108120399A (en) * | 2016-11-30 | 2018-06-05 | 北京航天计量测试技术研究所 | A kind of scan-type highlights background characteristics point identification method |
| CN108701232A (en) * | 2018-05-09 | 2018-10-23 | 深圳阜时科技有限公司 | Method and device, identity recognition device and the electronic equipment of the three-dimensional mapping of target |
| WO2019091010A1 (en) * | 2017-11-08 | 2019-05-16 | 先临三维科技股份有限公司 | Three-dimensional scanning method, apparatus and system, storage medium and processor |
| CN111174722A (en) * | 2018-11-13 | 2020-05-19 | 浙江宇视科技有限公司 | Three-dimensional contour reconstruction method and device |
| CN111380482A (en) * | 2019-12-31 | 2020-07-07 | 吉林大学 | Automobile morphology active vision reconstruction system and method based on straight line and circle invariants |
| CN111504229A (en) * | 2020-04-10 | 2020-08-07 | 武汉理工大学 | Method for dynamically projecting patterns for visual measurement matching on curved plate |
| TWI831771B (en) * | 2018-04-20 | 2024-02-11 | 美商高通公司 | System, method and non-transitory computer-readable medium for active depth systems |
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Cited By (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103438834B (en) * | 2013-09-17 | 2015-10-28 | 清华大学深圳研究生院 | The hierarchical quick three-dimensional measurement mechanism of structure based light projection and measuring method |
| CN103438834A (en) * | 2013-09-17 | 2013-12-11 | 清华大学深圳研究生院 | Hierarchy-type rapid three-dimensional measuring device and method based on structured light projection |
| CN104154955A (en) * | 2014-05-19 | 2014-11-19 | 北京理工大学 | Method and system for dynamic measurement of liquid surface morphology and dosage of liquid propellant in storage tank |
| CN105180836A (en) * | 2014-05-23 | 2015-12-23 | 精工爱普生株式会社 | Control apparatus, robot, and control method |
| CN105180836B (en) * | 2014-05-23 | 2019-08-27 | 精工爱普生株式会社 | Control device, robot and control method |
| CN104002021A (en) * | 2014-06-06 | 2014-08-27 | 哈尔滨工业大学 | Device for automatically identifying and tracking multi-layer and multi-pass welding beads |
| CN106767410B (en) * | 2015-11-19 | 2023-09-19 | 手持产品公司 | High resolution dot pattern |
| CN106767410A (en) * | 2015-11-19 | 2017-05-31 | 手持产品公司 | high-resolution dot pattern |
| CN108120399A (en) * | 2016-11-30 | 2018-06-05 | 北京航天计量测试技术研究所 | A kind of scan-type highlights background characteristics point identification method |
| CN107044821A (en) * | 2016-12-30 | 2017-08-15 | 苏州西博三维科技有限公司 | A kind of measuring method and system of contactless tubing object |
| WO2019091010A1 (en) * | 2017-11-08 | 2019-05-16 | 先临三维科技股份有限公司 | Three-dimensional scanning method, apparatus and system, storage medium and processor |
| TWI831771B (en) * | 2018-04-20 | 2024-02-11 | 美商高通公司 | System, method and non-transitory computer-readable medium for active depth systems |
| CN108701232A (en) * | 2018-05-09 | 2018-10-23 | 深圳阜时科技有限公司 | Method and device, identity recognition device and the electronic equipment of the three-dimensional mapping of target |
| WO2019213863A1 (en) * | 2018-05-09 | 2019-11-14 | 深圳阜时科技有限公司 | Three-dimensional target mapping method and apparatus, personal identification apparatus and electronic device |
| CN111174722A (en) * | 2018-11-13 | 2020-05-19 | 浙江宇视科技有限公司 | Three-dimensional contour reconstruction method and device |
| CN111380482A (en) * | 2019-12-31 | 2020-07-07 | 吉林大学 | Automobile morphology active vision reconstruction system and method based on straight line and circle invariants |
| CN111504229A (en) * | 2020-04-10 | 2020-08-07 | 武汉理工大学 | Method for dynamically projecting patterns for visual measurement matching on curved plate |
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Application publication date: 20120704 |