CN102494623A - Non-contact measuring method and device for center distance of optical surface in lens - Google Patents
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Abstract
本发明涉及一种镜头中光学表面中心间距的非接触式测量方法及测量装置,本发明将宽带光源出射的光通过干涉结构产生干涉信号,对干涉信号进行采样、图像重构即可得到镜头中光学表面的二维层析图像,在样品臂中使用细平行光束作为扫描光束,通过移动光纤准直器来改变相干层析成像的起始位置,进而得到镜头中不同深度各个光学表面的特征图像,最后根据光学表面在其特征图像中的位置和成像起始位置的移动距离得到两光学表面中心的距离。本发明具有非接触无损测量、测量精度高、数据处理简单的优点,可灵活应用于光学加工、光学装校及光学检测等领域。
The invention relates to a non-contact measurement method and a measurement device for the center distance of an optical surface in a lens. In the invention, the light emitted by a broadband light source is passed through an interference structure to generate an interference signal, and the interference signal is sampled and the image is reconstructed to obtain the center of the lens. Two-dimensional tomographic image of the optical surface, using a thin parallel beam as the scanning beam in the sample arm, changing the starting position of the coherent tomography by moving the fiber collimator, and then obtaining the characteristic images of each optical surface at different depths in the lens , and finally the distance between the centers of the two optical surfaces is obtained according to the position of the optical surface in its characteristic image and the moving distance of the imaging start position. The invention has the advantages of non-contact and non-destructive measurement, high measurement accuracy and simple data processing, and can be flexibly applied to the fields of optical processing, optical assembly and calibration, optical detection and the like.
Description
技术领域 technical field
本发明属于光学测量领域,具体涉及一种镜头中光学表面中心间距的非接触式测量方法及测量装置,它适用于光学装校过程中对镜头或镜头组的空气间隔或透镜中心厚度的检测。The invention belongs to the field of optical measurement, and in particular relates to a non-contact measuring method and a measuring device for the distance between the centers of optical surfaces in a lens.
背景技术 Background technique
光学系统的装校,特别是物镜的装校直接影响光学仪器成像质量和性能,是非常关键的工艺。物镜的装校过程主要有三个方面的要求:1)校正每个面的偏心误差;2)保证空气间隔;3)在安装牢固的前提下,保证镜面不变形。空气间隔的测量和控制是物镜生产的关键工艺之一。如果空气间隔不能严格控制,会带来球差、色差及影响焦距、倍率等,甚至严重影响物镜成像质量。空气间隔的测量和控制是物镜生产的关键工艺之一。The calibration of the optical system, especially the calibration of the objective lens, directly affects the imaging quality and performance of optical instruments, and is a very critical process. The calibration process of the objective lens mainly has three requirements: 1) correct the eccentric error of each surface; 2) ensure the air gap; 3) ensure that the mirror surface is not deformed under the premise of firm installation. The measurement and control of the air gap is one of the key processes in the production of objective lenses. If the air gap cannot be strictly controlled, it will cause spherical aberration, chromatic aberration and affect the focal length, magnification, etc., and even seriously affect the imaging quality of the objective lens. The measurement and control of the air gap is one of the key processes in the production of objective lenses.
目前光学表面间距有多种测量方法,主要分为两类:接触式测量和非接触式测量。国内仍然普遍沿用接触式方法进行测量。接触式测量方法通常有两种:一是测量前一透镜的上顶点与后一透镜的上顶点的距离,然后减去透镜厚度;二是测量球面顶点到镜座断面的距离。接触式测量仪器主要有:百分表、千分表或光栅测微仪等。接触式测量的主要缺点是容易划伤透镜表面。为避免划伤,通常在测量头与被测表面之间加一层保护纸,因此测量精度低。而且接触式测量的耗时长,无法在光学加工和装较的过程中实现实时引导。对于有些镀有特殊膜层的表面,严禁接触式测量,因此必须采用非接触式测量。At present, there are many measurement methods for optical surface spacing, which are mainly divided into two categories: contact measurement and non-contact measurement. The contact method is still widely used in China for measurement. There are usually two contact measurement methods: one is to measure the distance between the upper vertex of the previous lens and the upper vertex of the latter lens, and then subtract the lens thickness; the second is to measure the distance from the vertex of the spherical surface to the section of the lens holder. Contact measuring instruments mainly include: dial indicator, dial indicator or grating micrometer, etc. The main disadvantage of contact measurement is that it is easy to scratch the lens surface. In order to avoid scratches, a layer of protective paper is usually added between the measuring head and the surface to be measured, so the measurement accuracy is low. Moreover, contact measurement takes a long time, and it is impossible to realize real-time guidance in the process of optical processing and assembly. For some surfaces coated with special coatings, contact measurement is strictly prohibited, so non-contact measurement must be used.
在中国专利申请号“01133730.3”中提出了一种新型非接触式光学系统空气间隔测量方法,由Fizeau干涉仪构成主要光学检测系统,使干涉仪标准镜头的焦点聚于被测透镜的顶点上,通过一光电成像转换器将被测透镜镜面顶点波前翻转自准干涉而予以定位,指示光栅与干涉仪的标准镜头联动,通过光栅传感器和数显表组成的读数系统读取标准镜头的移动量从而获取光学系统的空气间隔值。In the Chinese patent application number "01133730.3", a new non-contact optical system air gap measurement method is proposed. The main optical detection system is composed of a Fizeau interferometer, so that the focus of the standard lens of the interferometer is focused on the apex of the measured lens. Through a photoelectric imaging converter, the wavefront of the vertex of the measured lens mirror is reversed and positioned by self-collimating interference, indicating that the grating is linked with the standard lens of the interferometer, and the movement of the standard lens is read through a reading system composed of a grating sensor and a digital display. Thus, the air separation value of the optical system is obtained.
该测量方法相比接触式测量具有以下优点:实现了非接触式无损测量,大大提高了测量精度;可用于镀膜等特殊透镜的装校检测;读数方便简单。该测量方法实现了非接触式测量,但其自身仍然存在很多缺陷:标准镜头的焦点定位由调整干涉条纹的弯曲程度实现,调整过程中操作繁琐,工作量较大,引入了较大的人为误差。Compared with contact measurement, this measurement method has the following advantages: it realizes non-contact non-destructive measurement, which greatly improves the measurement accuracy; it can be used for the installation and inspection of special lenses such as coatings; the reading is convenient and simple. This measurement method realizes non-contact measurement, but it still has many defects: the focus positioning of the standard lens is realized by adjusting the bending degree of the interference fringes, and the adjustment process is cumbersome, the workload is large, and a large human error is introduced .
光学相干层析技术(OCT)是一种新近发展的层析技术,将低相干干涉仪和共焦扫描显微术结合在一起,利用外差探测技术来获取样品的内部信息,其成像深度达mm量级,空间分辨率保持在μm量级,是一种在很多领域具有广阔前景的高分辨率无损实时成像工具。Optical coherence tomography (OCT) is a newly developed tomographic technology that combines low-coherence interferometer and confocal scanning microscopy, and uses heterodyne detection technology to obtain internal information of samples. It is a high-resolution non-destructive real-time imaging tool with broad prospects in many fields, and the spatial resolution is maintained at the μm level.
发明内容 Contents of the invention
本发明的目的在于针对现有技术中存在的不足之处,提供一种镜头中光学表面中心间距的非接触式测量方法及测量装置,可以非接触地测量镜头中光学表面中心间距,同时具有测量精度高、数据处理简单、可以实现实时引导、使用灵活的优点。The object of the present invention is to aim at the deficiencies in the prior art, to provide a non-contact measuring method and measuring device for the distance between the centers of the optical surfaces in the lens, which can measure the distance between the centers of the optical surfaces in the lens in a non-contact manner, and has the function of measuring It has the advantages of high precision, simple data processing, real-time guidance and flexible use.
本发明提供的技术方案为:一种镜头中光学表面中心间距的非接触式测量方法,步骤如下:The technical solution provided by the present invention is: a non-contact measurement method for the distance between the centers of the optical surfaces in the lens, the steps are as follows:
步骤10,对待测镜头第一个光学表面进行光学相干层析成像;
其中,步骤10之前还包括步骤00,使样品臂扫描光束通过待测镜头光轴;所述使样品臂扫描光束通过待测镜头光轴的判定标准为,遮掩参考臂反射光后,光电探测器探测到的光强最大。Wherein, step 00 is also included before
步骤20,改变相干层析成像起始位置,对待测镜头下一个光学表面进行光学相干层析成像;
其中,步骤20包括:Wherein,
步骤21,使相干层析成像起始位置移动Δz,获得一光学相干层析图像;Step 21, moving the starting position of the coherence tomography by Δz to obtain an optical coherence tomography image;
步骤22,观察步骤21中获得的光学相干层析图像中是否有下一个光学表面的特征图像,若否继续执行步骤21,若是执行步骤23;Step 22, observe whether there is a characteristic image of the next optical surface in the optical coherence tomography image obtained in step 21, if not, continue to perform step 21, if not, perform step 23;
步骤23,记此次相干层析成像起始位置移动总量为xi,i∈{1,2,...,N-1},N为与待测光学表面间距相关的光学表面总数,即有N-1个相邻光学表面间距。Step 23, record the total amount of movement of the starting position of the coherence tomography as x i , i∈{1, 2, ..., N-1}, N is the total number of optical surfaces related to the distance between the optical surfaces to be measured, That is, there are N-1 distances between adjacent optical surfaces.
步骤30,若已得到与待测镜头的待测光学表面间距相关的全部光学表面的特征图像,执行步骤40,否则执行步骤20;Step 30, if the characteristic images of all optical surfaces related to the distance between the optical surfaces of the lens to be tested have been obtained, perform step 40, otherwise perform
步骤40,对已得到的特征图像进行数据处理,求得所需的光学表面间距值;Step 40, performing data processing on the obtained characteristic image to obtain the required optical surface spacing value;
其中,步骤40包括:Wherein, step 40 includes:
步骤41,在已得到的特征图像中确定光学表面中心位置,记第j个光学表面在其特征图像中的像素点位置为zj,j∈{1,2,...,N};Step 41, determine the center position of the optical surface in the obtained characteristic image, record the pixel point position of the jth optical surface in its characteristic image as z j , j∈{1, 2, ..., N};
步骤42,计算相邻两光学表面间距值,并记第i个相邻光学表面间距值为li,计算公式为i∈{1,2,...,N-1},xi为对应相干层析成像起始位置移动量,ni为间隔的材料折射率,d为层析图像单个像素点对应光程值;Step 42, calculate the distance between two adjacent optical surfaces, and record the distance between the i-th adjacent optical surfaces as l i , the calculation formula is i ∈ {1, 2, ..., N-1}, x i is the movement amount of the starting position of the corresponding coherence tomography, n i is the refractive index of the interval material, and d is the optical path corresponding to a single pixel of the tomographic image value;
步骤43,根据步骤42得到的相邻两光学表面间距值得到所需两光学表面间距值。In step 43 , according to the distance between two adjacent optical surfaces obtained in step 42 , the required distance between two optical surfaces is obtained.
其中,步骤00中所述扫描光束为细平行光束。Wherein, the scanning light beam in step 00 is a thin parallel light beam.
其中,步骤20中改变相干层析成像起始位置的方法为移动样品臂中光纤准直器或者移动光学延迟线中光纤准直器,或者同时移动样品臂中光纤准直器和光学延迟线中光纤准直器。Wherein, the method for changing the starting position of the coherent tomography in
其中,步骤30中所述特征图像为光学相干层析成像得到的二维横截面层析图像。Wherein, the characteristic image described in step 30 is a two-dimensional cross-sectional tomographic image obtained by optical coherence tomography.
其中,步骤21中所述Δz小于相干层析成像系统轴向成像范围。Wherein, the Δz in step 21 is smaller than the axial imaging range of the coherent tomography system.
其中,所述相干层析成像起始位置移动是沿光线入射方向向样品位置移动。Wherein, the movement of the starting position of the coherent tomography is to move toward the sample position along the incident direction of light.
本发明还提供一种镜头中光学表面中心间距的非接触式测量装置,该测量装置包括宽带光源,光纤耦合器,两个偏振控制器,位相调制器,光学延迟线,样品扫描装置,光电探测器,低噪声前置放大器,数据采集卡,计算机;The invention also provides a non-contact measuring device for the distance between the centers of the optical surfaces in the lens, the measuring device includes a broadband light source, a fiber coupler, two polarization controllers, a phase modulator, an optical delay line, a sample scanning device, and a photoelectric detector device, low noise preamplifier, data acquisition card, computer;
该测量装置采用光纤化的迈克尔逊干涉结构,从宽带光源发出的光经光纤耦合器分光后,分别进入参考臂和样品臂;进入参考臂的一路依次通过偏振控制器、位相调制器和光学延迟线,光学延迟线采用谱域快速扫描延迟线,光学延迟线由光纤准直器,衍射光栅,傅里叶透镜,扫描振镜,反射镜组成;进入样品臂的一路通过另一个偏振控制器和样品扫描装置,样品扫描装置包括光纤准直器,高精度导轨,电动微位移平台和待测样品,两路反射光在光纤耦合器汇合时发生干涉,干涉信号由光电探测器探测后,在低噪声前置放大器进行放大、滤波,然后接入数据采集卡和计算机。The measurement device adopts a fiber-optic Michelson interference structure. After the light emitted from the broadband light source is split by the fiber coupler, it enters the reference arm and the sample arm respectively; the path entering the reference arm passes through a polarization controller, a phase modulator and an optical delay in sequence. The optical delay line adopts a fast scanning delay line in the spectral domain. The optical delay line is composed of a fiber collimator, a diffraction grating, a Fourier lens, a scanning galvanometer, and a mirror; the way into the sample arm passes through another polarization controller and Sample scanning device, the sample scanning device includes fiber optic collimator, high-precision guide rail, motorized micro-displacement platform and the sample to be tested. The two reflected lights interfere when the fiber coupler converges. After the interference signal is detected by the photodetector, the The noise preamplifier is amplified, filtered, and then connected to the data acquisition card and computer.
本发明相对于现有技术的优点在于:The present invention has the advantage over prior art that:
1、本发明所述的镜头中光学表面中心间距的非接触式测量方法,对样品无损,可灵活应用于装校及检测领域;1. The non-contact measurement method for the center distance of the optical surface in the lens according to the present invention is non-destructive to the sample and can be flexibly applied to the field of installation and detection;
2、本发明利用了光学相干层析成像技术,因此测量精度高,可达微米量级;2. The present invention utilizes optical coherence tomography technology, so the measurement accuracy is high, up to micron level;
3、本发明使用细平行光束扫描,并由高精度导轨移动光纤准直器,进而改变层析成像范围,测量范围达几十毫米;数据处理简单。3. The present invention uses thin parallel light beams to scan, and moves the optical fiber collimator by high-precision guide rails, thereby changing the range of tomographic imaging, and the measurement range reaches tens of millimeters; the data processing is simple.
附图说明 Description of drawings
图1为本发明工作流程图;Fig. 1 is a work flow chart of the present invention;
图2为本发明检测装置结构示意图;Fig. 2 is the structural representation of detection device of the present invention;
图3为本发明实施方案采用的光学延迟线结构示意图;3 is a schematic diagram of the structure of an optical delay line used in an embodiment of the present invention;
图4为本发明实施方案采用的样品扫描装置结构示意图;4 is a schematic structural diagram of a sample scanning device used in an embodiment of the present invention;
图5为数据处理示意图;Fig. 5 is a schematic diagram of data processing;
图6物镜样品间距测量结果示意图。Figure 6 Schematic diagram of the measurement results of the distance between the objective lens and the sample.
具体实施方式 Detailed ways
下面结合附图及具体实施方式对本发明作进一步的说明。The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
如图2所示,本发明装置包括宽带光源1,光纤耦合器2,偏振控制器3、4,位相调制器5,光学延迟线6,样品扫描装置7,光电探测器8,低噪声前置放大器9,数据采集卡10,计算机11。As shown in Figure 2, the device of the present invention includes a
测量装置采用光纤化的迈克尔逊干涉结构,从宽带光源1发出的光经光纤耦合器2分光后,分别进入参考臂和样品臂。进入参考臂的一路依次通过偏振控制器3、位相调制器5和光学延迟线6,光学延迟线6选用谱域快速扫描延迟线(Rapid Scan Optical Delay Line,RSOD),光学延迟线6由光纤准直器12,衍射光栅13,傅里叶透镜14,扫描振镜15,反射镜16组成,如图3所示;进入样品臂的一路通过偏振控制器4和样品扫描装置7,样品扫描装置7包括光纤准直器18,高精度导轨17,电动微位移平台19和待测样品20,如图4所示。两路反射光在光纤耦合器2汇合时发生干涉,干涉信号由光电探测器8探测后,在低噪声前置放大器9进行放大、滤波,然后接入数据采集卡10和计算机11。The measurement device adopts a fiber-optic Michelson interference structure. The light emitted from the
本发明的原理是:由于宽带光源1的低相干性,当参考臂光程固定时,只有参考臂反射光与样品臂后向反射光光程差小于宽带光源1的相干长度,才能发生干涉,即只有样品特定深度的后向反射光才能发生干涉,干涉光光强在两臂光程差为零时最大,随着光程差的增加而迅速减小。当光学延迟线6进行光程扫描时,分别与样品不同深度的后向反射光发生干涉,干涉信号包络代表样品深度方向上折射率信息。对于折射率突变的光学表面,包络中心代表光学表面位置信息,因此相邻包络的中心距离就代表相邻光学表面的间距,而且光学延迟线6的光程变化是严格可控的,所以通过获取相邻包络中心对应的光程差,再除以相邻光学表面之间材料折射率就可以得到其间距值。The principle of the present invention is: due to the low coherence of the
光电探测器8产生的电流信号首先送到低噪声前置放大器9,进行放大、电压转换、滤波,将直流分量滤掉,再由数据采集卡10进行数据采集送入计算机11,进行希尔伯特变换提取干涉信号的包络信息,即振幅信息,然后将振幅信号转换为图像灰度值,计算机根据相应算法得到样品相应深度范围的特征图像,该算法为现有技术中已经成熟应用,此处不做详述。The current signal generated by the
由上面所述,特征图像的轴向灰度包络即为干涉信号包络。对于折射率突变的光学表面,灰度极值点代表光学表面位置信息,因此灰度极值点之间的距离就代表相应光学表面的间距,而且光学延迟线6的光程变化是严格可控的,成像深度方向范围是可以精确标定的,所以通过获取灰度极值点在特征图像中位置可以得到相应光学表面与成像起始位置之间实际距离。From the above, the axial gray envelope of the feature image is the interference signal envelope. For an optical surface with a sudden change in refractive index, the extreme gray points represent the position information of the optical surface, so the distance between the extreme gray points represents the distance between the corresponding optical surfaces, and the optical path change of the
光学延迟线6光程扫描范围一般在1~3mm,而一个镜头的光学表面间光程差可达上百毫米。本发明中通过改变参考臂和样品臂的光程匹配状况从而得到不同深度范围光学表面的干涉信号。当参考臂不变,在样品臂中通过高精度导轨17移动光纤准直器18,可能发生干涉的样品深度范围也随之移动;当样品臂不变,移动参考臂中光纤准直器12也有同样的效果;或者也可以同时移动参考臂中光纤准直器12和样品臂中移动光纤准直器18。本实施方案中采用第一种方案,即参考臂不变,在样品臂中通过高精度导轨17移动光纤准直器18。最后结合成像起始位置的移动距离和相邻光学表面在各自特征图像中位置,计算相邻光学表面的间距值。另外为扩大穿透深度,在样品臂中使用细平行光束进行扫描。The optical path scanning range of the
本实施方案中宽带光源1为中心波长为1310nm,半高全宽为95nm的近红外宽带光源,根据公式其相干长度约为7.97μm;光纤耦合器2选用2×2宽带耦合器,中心波长在1310nm,带宽100nm,分光比50∶50;高精度导轨17读数精度1μm,用于光纤准直器18的上下精确移动,光纤准直器18整形的细平行光束直径为500μm。In this embodiment, the
本实施方案中偏振控制器3用于参考臂反射光和样品后向反射光的偏振态匹配,从而提高系统信噪比。采用了干涉信号载频技术,将参考臂中位相调制器5的调制频率设在500kHz,使信号与低频噪声在频域上能有效分离。采用低噪声前置放大器实施电路滤波及后续软件的数字滤波。该装置对样品在深度方向(z方向)扫描由RSOD实现,横向扫描选择样品扫描方式,利用电动微位移平台17实现。In this embodiment, the
使用信号发生器生成频率为500Hz,峰峰值为2V的三角波信号驱动扫描振镜15,信号发生器同时生成与三角波信号有固定延迟、占空比可调的门触发矩阵信号,用于触发数据采集卡10进行数据采集,采样频率5M/s。本实施方案中设定门触发矩阵信号相对三角波信号延迟20%,单次轴向扫描采样2048点,系统轴向成像范围1.074mm(空气中),图像分辨率为800*406,单个像素点对应空气中距离d为2.645μm。Use a signal generator to generate a triangular wave signal with a frequency of 500 Hz and a peak-to-peak value of 2 V to drive the scanning
下面对测量步骤作进一步说明(参见图1)。The measurement steps are further described below (see Figure 1).
步骤00,首先使样品臂扫描光束通过待测镜头光轴,具体方法为打开光源,遮掩参考臂反射光后,微移待测镜头位置,当光电探测器8探测到的光强最大时认为扫描光束已通过待测镜头光轴。Step 00, first make the scanning beam of the sample arm pass through the optical axis of the lens to be tested. The specific method is to turn on the light source, cover the reflected light of the reference arm, and slightly move the position of the lens to be tested. When the light intensity detected by the
步骤10,对待测镜头第一个光学表面进行光学相干层析成像。
执行软件控制信号发生器产生三角波信号,驱动光学延迟线6开始进行光程扫描,同时触发信号触发数据采集卡10开始数据采集,电动微位移平台19做横向往复运动,计算机11进行图像重建并显示,得到第一个光学表面的二维横截面层析图像。Execute the software to control the signal generator to generate a triangular wave signal, drive the
步骤20,改变相干层析成像起始位置,对待测镜头下一个光学表面进行光学相干层析成像。
沿光线入射方向向样品位置移动样品臂中光纤准直器18,移动距离Δz,相干层析成像起始位置也随之移动,方向相同,从而能够对样品更深位置进行层析成像。光纤准直器18移动距离Δz可由高精度导轨17读出,Δz小于系统轴向成像范围(空气中),观察图像中是否包含下一个光学表面,若否继续移动光纤准直器18Δz,若是执行下一步骤,同时记光纤准直器18移动总量为xi。i∈{1,2,...,N-1},N为与待测光学表面间距相关的光学表面总数,即有N-1个相邻光学表面间距。Moving the
步骤30,若已得到与待测光学表面间距相关的全部光学表面的特征图像,执行步骤40,否则执行步骤20。Step 30, if the characteristic images of all the optical surfaces related to the distance between the optical surfaces to be measured have been obtained, execute step 40, otherwise execute
步骤40,对已得到的特征图像进行数据处理,求得所需的光学表面间距值。Step 40, data processing is performed on the obtained feature image to obtain the required distance between optical surfaces.
步骤40包括:Step 40 includes:
步骤41,在特征图像中确定光学表面中心位置,记第j个光学表面在其特征图像中的像素点位置为zj,j∈{1,2,...,N}。Step 41, determine the center position of the optical surface in the characteristic image, record the pixel point position of the jth optical surface in its characteristic image as z j , j∈{1, 2, . . . , N}.
沿图像深度方向,做灰度值投射统计,在本实施方案中图像大小为800*406,在每一深度位置(共406处),统计所有像素点(800个)灰度值的总和,极值点位置代表光学表面位置。Along the depth direction of the image, the gray value projection statistics are done. In this embodiment, the image size is 800*406. At each depth position (406 places in total), the sum of the gray value of all pixels (800) is counted. Value point locations represent optical surface locations.
步骤42,计算相邻两光学表面间距值,并记第i个相邻光学表面间距值为li,计算公式为i∈{1,2,...,N-1},xi为对应相干层析成像起始位置移动量,ni为间隔的材料折射率,d为层析图像单个像素点对应光程值。Step 42, calculate the distance between two adjacent optical surfaces, and record the distance between the i-th adjacent optical surfaces as l i , the calculation formula is i ∈ {1, 2, ..., N-1}, x i is the movement amount of the starting position of the corresponding coherence tomography, n i is the refractive index of the interval material, and d is the optical path corresponding to a single pixel of the tomographic image value.
图5为数据处理的示意图。Fig. 5 is a schematic diagram of data processing.
图6为对一物镜的测量结果示意图,物镜共5个光学表面,每个光学表面的特征图像如图中所示,按照上述数据处理方法计算得4个相邻光学表面间距值分别为:l1=6.021mm,l2=4.066mm,l3=10.750mm,l4=5.929mm。Fig. 6 is a schematic diagram of the measurement results of an objective lens. The objective lens has 5 optical surfaces in total, and the characteristic image of each optical surface is as shown in the figure. According to the above-mentioned data processing method, the distance values of 4 adjacent optical surfaces are calculated as: 1 1 =6.021 mm, l 2 =4.066 mm, l 3 =10.750 mm, l 4 =5.929 mm.
步骤43,根据步骤42得到的相邻两光学表面间距值得到所需两光学表面间距值。In step 43 , according to the distance between two adjacent optical surfaces obtained in step 42 , the required distance between two optical surfaces is obtained.
对图6中物镜所需的光学表面间距是空气间隔即第3个光学表面与第4个光学表面的间距d、物镜总厚度即第1个光学表面和第5个光学表面的间距L。由步骤42中已得到的4个相邻光学表面间距值可得:d=l3=10.750mm,L=l1+l2+l3+l4=26.766mm。The distance between the optical surfaces required for the objective lens in Figure 6 is the air gap, that is, the distance d between the third optical surface and the fourth optical surface, and the total thickness of the objective lens, that is, the distance L between the first optical surface and the fifth optical surface. From the distance values of the four adjacent optical surfaces obtained in step 42, it can be obtained: d=l 3 =10.750 mm, L=l 1 +l 2 +l 3 +l 4 =26.766 mm.
本领域的技术人员在不脱离权利要求书确定的本发明的精神和范围的条件下,还可以对以上内容进行各种各样的修改。因此本发明的范围并不仅限于以上的说明,而是由权利要求书的范围来确定的。Various modifications can be made to the above contents by those skilled in the art without departing from the spirit and scope of the present invention defined by the claims. Therefore, the scope of the present invention is not limited to the above description, but is determined by the scope of the claims.
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Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
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Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2916623Y (en) * | 2006-07-05 | 2007-06-27 | 中国科学院上海光学精密机械研究所 | Frequency domain optical coherence tomography device for full-depth detection |
CN201026206Y (en) * | 2007-04-24 | 2008-02-27 | 浙江大学 | A spectral domain OCT imaging device based on optical scanning delay line |
-
2011
- 2011-11-11 CN CN201110357756.8A patent/CN102494623B/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2916623Y (en) * | 2006-07-05 | 2007-06-27 | 中国科学院上海光学精密机械研究所 | Frequency domain optical coherence tomography device for full-depth detection |
CN201026206Y (en) * | 2007-04-24 | 2008-02-27 | 浙江大学 | A spectral domain OCT imaging device based on optical scanning delay line |
Non-Patent Citations (5)
Title |
---|
ADOLF F. FERCHER: "OPTICAL COHERENCE TOMOGRAPHY", 《JOURNAL OF BIOMEDICAL OPTICS》, vol. 1, no. 2, 30 April 1996 (1996-04-30), pages 157 - 173 * |
GUOHUA SHI等: "Adaptive optics optical coherence tomography for retina imaging", 《CHINESE OPTICS LETTERS》, vol. 6, no. 6, 10 June 2008 (2008-06-10), pages 424 - 425 * |
史国华等: "基于光学相干层析技术的光学表面间距测量方法", 《中国激光》, vol. 36, 31 December 2009 (2009-12-31), pages 210 - 214 * |
史国华等: "采用频域快速延迟线的光学相干层析系统的研制", 《光电工程》, vol. 33, no. 10, 31 October 2006 (2006-10-31), pages 1 - 4 * |
王玲等: "基于快速扫描延迟线相位调制的光纤型光学相干层析系统", 《中国激光》, vol. 35, no. 3, 31 March 2008 (2008-03-31), pages 472 - 476 * |
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CN117109450A (en) * | 2023-07-25 | 2023-11-24 | 广东工业大学 | A high-resolution spectral confocal interference thin film thickness measurement method with adaptive parameter spectrum estimation |
CN117109450B (en) * | 2023-07-25 | 2024-05-10 | 广东工业大学 | High-resolution spectrum confocal interference film thickness measuring method for self-adaptive parameter spectrum estimation |
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