CN102135448B - Surface reflectance spectrum measuring method capable of preventing ambient light interference - Google Patents
Surface reflectance spectrum measuring method capable of preventing ambient light interference Download PDFInfo
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- CN102135448B CN102135448B CN2010106195804A CN201010619580A CN102135448B CN 102135448 B CN102135448 B CN 102135448B CN 2010106195804 A CN2010106195804 A CN 2010106195804A CN 201010619580 A CN201010619580 A CN 201010619580A CN 102135448 B CN102135448 B CN 102135448B
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Abstract
The invention discloses a surface reflectance spectrum measuring method capable of preventing ambient light interference. The method comprises the following steps: a beam sent from a light source passes through a chopper and then is modulated according to first preset frequency so as to obtain the modulated light; the modulated light irradiates the surface of a measured object at a probe through an input end of a Y-type optical fiber, and then the modulated light is reflected by the surface of the measured object so as to obtain the reflected light; the reflected light enters the probe and then is guided to a spectrometer through an output end of the Y-type optical fiber; the spectrometer samples the reflected light continuously at second preset frequency under the control of a computer so as to obtain a multiple reflection spectrum sequence; data corresponding to the same wavelength in the multiple reflection spectrum sequence are sequenced in a time order in the computer so as to obtain light intensity sequences of various wavelengths; Fourier transform is carried out on the light intensity sequences of various wavelengths so as to obtain the maximum harmonic components; and the maximum harmonic components are sequenced in a wavelength sequence so as to obtain a reflectance spectrum without the ambient light interference.
Description
Technical field
The present invention relates to the analysis to reflectance spectrum, particularly a kind of surface reflectivity spectral measurement method that prevents ambient light interference can be measured surperficial composition or its texture of testee quickly.
Background technology
Adopt the rayed testee surface of different wave length and measure its reflected light; Can obtain the reflectance spectrum on testee surface; Can obtain the information such as composition or surface microstructure of testee to the further analysis of reflectance spectrum, have extensively and significant values.But there is the interference of surround lighting in this measurement, need under darkroom or shading condition, carry out, and brings very big difficulty to measurement like this, and for example: when measuring the reflectance spectrum on human body tongue surface, the interference of surround lighting is exactly to be difficult to eliminate simply.
Summary of the invention
For fear of the interference of measuring light, the expanding application scope is measured surperficial composition or its texture of testee quickly, the invention provides a kind of surface reflectivity spectral measurement method that prevents ambient light interference, said method comprising the steps of:
(1) light beam that sends of light source is modulated light according to first predeterminated frequency through chopper, obtains the light after the modulation;
(2) light after the said modulation shines the testee surface through the input end of y-type optical fiber at the probe place, and the light after the said modulation obtains reflected light in said testee surface reflection;
(3) said reflected light gets into said probe, is directed at spectrometer through the output terminal of said y-type optical fiber;
(4) said spectrometer carries out continuous sampling with second predeterminated frequency to said reflected light under the control of computing machine, obtains several reflectance spectrum sequences S
i, wherein, the value of i is a positive integer;
(5) in said computing machine, according to time sequencing with said several reflectance spectrum sequences S
iIn the corresponding data of same wavelength
Sort, obtain the light intensity sequence of each wavelength;
(6) in said computing machine; Light intensity sequence to said each wavelength is carried out Fourier transform; Obtain maximum harmonic component
wherein, the value of j is a positive integer;
(7) in said computing machine; According to each wavelength order said maximum harmonic component
is sorted, obtain reflectance spectrum.
Second predeterminated frequency is specially described in the step (4): be higher than the said first predeterminated frequency n doubly, wherein, the value of n is the positive integer greater than 2.
Said maximum harmonic component
is specially: the identical harmonic component that most wavelength amplitudes are maximum.
The beneficial effect of technical scheme provided by the invention is:
The invention provides a kind of surface reflectivity spectral measurement method that prevents ambient light interference; This method has got access to the reflectance spectrum of getting rid of ambient light interference; Avoid the interference of measuring light, enlarged range of application, realized measuring quickly testee surface composition or its texture; And this prevents that the surface reflectivity spectral measurement method of ambient light interference can be applied to medical field, environmental protection field and other relevant fields.
Description of drawings
Fig. 1 is a structural representation provided by the invention;
Fig. 2 is the process flow diagram that prevents the surface reflectivity spectral measurement method of ambient light interference provided by the invention.
The list of parts of each label representative is following in the accompanying drawing:
1: light source 2: chopper
3: testee 4:Y type optical fiber
5: spectrometer 6: computing machine
Embodiment
For making the object of the invention, technical scheme and advantage clearer, will combine accompanying drawing that embodiment of the present invention is done to describe in detail further below.
For fear of the interference of measuring light, the expanding application scope is measured surperficial composition or its texture of testee quickly, and the embodiment of the invention provides a kind of surface reflectivity spectral measurement method that prevents ambient light interference, referring to Fig. 1 and Fig. 2,
101: light beam that light source 1 sends is modulated light according to first predeterminated frequency through chopper 2, obtains the light after the modulation;
Wherein, the value of first predeterminated frequency is set according to the needs in the practical application, and when specifically realizing, the embodiment of the invention does not limit this.
102: the light after the modulation shines testee 3 surfaces through the input end of y-type optical fiber 4 at the probe place, the light after the modulation obtains reflected light in testee 3 surface reflections;
103: reflected light gets into probe, is directed at spectrometer 5 through the output terminal of y-type optical fiber 4;
104: spectrometer 5 carries out continuous sampling with second predeterminated frequency to reflected light under the control of computing machine 6, obtains several reflectance spectrum sequences S
i
Wherein, second predeterminated frequency is specially: be higher than the first predeterminated frequency n doubly, the value of n is the positive integer greater than 2, and the value of n can be set according to the needs in the practical application, and when specifically realizing, the embodiment of the invention does not limit this.Wherein the value of i is a positive integer.
105: in computing machine 6, according to time sequencing with several reflectance spectrum sequences S
iIn the corresponding data of same wavelength
Sort, obtain the light intensity sequence of each wavelength;
106: in computing machine 6; Light intensity sequence to each wavelength is carried out Fourier transform, obtains maximum harmonic component
Wherein, Maximum harmonic component
is specially: the identical harmonic component that most wavelength amplitudes are maximum, the value of j is a positive integer.
107: in computing machine 6; According to each wavelength order maximum harmonic component
is sorted, obtain reflectance spectrum.
Promptly got access to the reflectance spectrum of getting rid of ambient light interference through above-mentioned steps 101-step 107.
With a concrete embodiment feasibility that prevents the surface reflectivity spectral measurement method of ambient light interference provided by the invention is described below, is seen for details hereinafter and describe:
Embodiment 1: as shown in Figure 1, the light beam that light source 1 sends is through chopper 2, and the light of being exported is modulated according to first predeterminated frequency; Light after the modulation gets into y-type optical fiber 3, is shone on the testee 3 at the probe place by y-type optical fiber 3, through testee 3 surface reflections; Obtain reflected light; Reflected light gets into y-type optical fiber 3 again and reaches spectrometer 5, under the control of computing machine 6, to be higher than the first predeterminated frequency n, second predeterminated frequency doubly reflected light is carried out continuous sampling, obtains reflectance spectrum sequence S
i, according to time sequencing, in computing machine with reflectance spectrum sequence S
iIn the corresponding data of same wavelength
Sort, obtain the light intensity sequence of each wavelength, the light intensity sequence of each wavelength is carried out Fourier transform obtain its maximum harmonic component
According to each wavelength order with maximum harmonic component
Sort, obtain the reflectance spectrum on testee 3 surfaces, this reflectance spectrum has been got rid of the interference of surround lighting.
In sum; The embodiment of the invention provides a kind of surface reflectivity spectral measurement method that prevents ambient light interference; This method has got access to the reflectance spectrum of getting rid of ambient light interference; Avoided the interference of measuring light, enlarged range of application, this method can be used on the composition and micromechanism on Measuring Object surface; And this prevents that the surface reflectivity spectral measurement method of ambient light interference can be applied to medical field, environmental protection field and other relevant fields.
It will be appreciated by those skilled in the art that accompanying drawing is the synoptic diagram of a preferred embodiment, the invention described above embodiment sequence number is not represented the quality of embodiment just to description.
The above is merely preferred embodiment of the present invention, and is in order to restriction the present invention, not all within spirit of the present invention and principle, any modification of being done, is equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (2)
1. a surface reflectivity spectral measurement method that prevents ambient light interference is characterized in that, said method comprising the steps of:
(1) light beam that sends of light source is modulated light according to first predeterminated frequency through chopper, obtains the light after the modulation;
(2) light after the said modulation shines the testee surface through the input end of y-type optical fiber at the probe place, and the light after the said modulation obtains reflected light in said testee surface reflection;
(3) said reflected light gets into said probe, is directed at spectrometer through the output terminal of said y-type optical fiber;
(4) said spectrometer carries out continuous sampling with second predeterminated frequency to said reflected light under the control of computing machine, obtains several reflectance spectrum sequences S
i, wherein, the value of i is a positive integer;
(5) in said computing machine, according to time sequencing with said several reflectance spectrum sequences S
iIn the corresponding data of same wavelength
Sort, obtain the light intensity sequence of each wavelength;
(6) in said computing machine; Light intensity sequence to said each wavelength is carried out Fourier transform; Obtain maximum harmonic component
wherein, the value of j is a positive integer;
(7) in said computing machine; According to each wavelength order said maximum harmonic component
is sorted, obtain reflectance spectrum;
Wherein, said second predeterminated frequency is specially: be higher than the said first predeterminated frequency n doubly, wherein, the value of n is the positive integer greater than 2.
2. the surface reflectivity spectral measurement method that prevents ambient light interference according to claim 1; It is characterized in that said maximum harmonic component
is specially: the identical harmonic component that most wavelength amplitudes are maximum.
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| Application Number | Priority Date | Filing Date | Title |
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| CN2010106195804A CN102135448B (en) | 2010-12-31 | 2010-12-31 | Surface reflectance spectrum measuring method capable of preventing ambient light interference |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2010106195804A CN102135448B (en) | 2010-12-31 | 2010-12-31 | Surface reflectance spectrum measuring method capable of preventing ambient light interference |
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| CN102135448A CN102135448A (en) | 2011-07-27 |
| CN102135448B true CN102135448B (en) | 2012-08-22 |
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| CN2010106195804A Expired - Fee Related CN102135448B (en) | 2010-12-31 | 2010-12-31 | Surface reflectance spectrum measuring method capable of preventing ambient light interference |
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Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102033049B (en) * | 2010-12-31 | 2012-04-18 | 天津大学 | Absorption hyperspectral spectrum measurement method for eliminating ambient stray light interference |
| CN103592286A (en) * | 2012-08-13 | 2014-02-19 | 天津精利为科技有限公司 | Method for calculating concentration of interfered element through calculated concentration of element |
| CN103592287B (en) * | 2012-08-13 | 2019-09-17 | 天津精利为科技有限公司 | Pass through the method for the measurement intensity and concentration calculation the intensity of disturbed element concentration of element |
| CN103308164B (en) * | 2013-05-29 | 2016-02-24 | 南京宝光检测技术有限公司 | The method of signal coupling is carried out based on flare image position coupling |
| CN112710388B (en) * | 2019-10-24 | 2022-07-01 | 北京小米移动软件有限公司 | Ambient light detection method, ambient light detection device, terminal device, and storage medium |
| CN112485226B (en) * | 2020-11-06 | 2024-03-26 | 航天新气象科技有限公司 | Interface detection method, device, equipment and computer equipment |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2052532U (en) * | 1989-05-03 | 1990-02-07 | 湖南省湘潭市应用技术研究所 | Differential laser instrument of reflectivity & transmissivity |
| CN101379376A (en) * | 2006-02-07 | 2009-03-04 | 阿斯利康(瑞典)有限公司 | Device and method for spectrometric system |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19958136B4 (en) * | 1999-12-02 | 2004-02-05 | Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto | Self-calibrating interference spectroscopic measuring arrangement |
| DE102007045449B4 (en) * | 2007-09-24 | 2009-11-26 | Sartorius Ag | Method and device for calibrating a sensor by means of a drying balance |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2052532U (en) * | 1989-05-03 | 1990-02-07 | 湖南省湘潭市应用技术研究所 | Differential laser instrument of reflectivity & transmissivity |
| CN101379376A (en) * | 2006-02-07 | 2009-03-04 | 阿斯利康(瑞典)有限公司 | Device and method for spectrometric system |
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