CN101553069B - Electronic stabilizer circuit - Google Patents
Electronic stabilizer circuit Download PDFInfo
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- CN101553069B CN101553069B CN 200810092110 CN200810092110A CN101553069B CN 101553069 B CN101553069 B CN 101553069B CN 200810092110 CN200810092110 CN 200810092110 CN 200810092110 A CN200810092110 A CN 200810092110A CN 101553069 B CN101553069 B CN 101553069B
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Abstract
The invention relates to an electronic stabilizer circuit which comprises a first lamp assembly, a second lamp assembly, a detection circuit and a latch circuit. The first lamp assembly comprises a first inductor and a plurality of accommodation regions. The second lamp assembly comprises a second inductor and at least one accommodation region. The detection circuit is used for receiving a directcurrent voltage signal and is coupled to each accommodation region of the first lamp assembly and each accommodation region of the second lamp assembly so as to be convenient for the detection circuit, the first inductor, the second inductor and lamp tubes to be accommodated properly in the accommodation regions to form a series circuit and produce a first signal. The latch circuit is coupled to the detection circuit so as to respond the first signal and selectively start or close the electronic stabilizer circuit.
Description
Technical field
The relevant a kind of electric stabilizer circuit of the present invention, particularly relevant a kind of the detection and the electric stabilizer circuit of all fluorescent tubes that reset automatically.
Background technology
Since fluorescent tube was invented appearance, its applied scope was also more and more wider, and wherein the known application of also behaving most the most extensive namely is illumination.Along with the raising of people to the illumination quality requirements, the electric stabilizer that is used to load fluorescent tube in the electric stabilizer circuit rises to and loads many fluorescent tubes also from only loading single fluorescent tube.
See also Fig. 1, be an existing electric stabilizer circuit 1, it comprises one first lamp group 11, one second lamp group 12, one drive circuit 13, electric capacity 150,151, switch element 152,153, a testing circuit, a lock-in circuit (latch circuit) 140 and preheat circuit 160,161.The first lamp group 11 comprises a resonant component 110, preheat circuit 111,112 and two disposal area (not shown), and wherein these two disposal areas are loaded fluorescent tube 113,114 respectively.The second lamp group 12 comprises a resonant component 120, preheat circuit 121,122 and two disposal area (not shown), and wherein these two disposal areas are loaded fluorescent tube 123,124 respectively.Drive circuit 13 is in order to start the switch element 152,153 in the electric stabilizer circuit 1.Each electronic component in the above-mentioned electric stabilizer circuit 1 knows usually that by having in the affiliated technical field the knowledgeable is known, and only describes the part more relevant with the present invention at this.
Because the fluorescent tube number that loads of electric stabilizer circuit 1 increased more in the past, the quality of illumination can be promoted significantly, but some shortcomings have also appearred in the electric stabilizer circuit that loads many fluorescent tubes.One of them shortcoming is, is not whether all fluorescent tubes all can be detected and be connected in the circuit.Particularly, the testing circuit of electric stabilizer circuit 1 comprises an electric capacity 141 and resistance 142,143,144.Resistance 142 is connected to a filament of a direct current voltage input end 163 and fluorescent tube 114; Resistance 143 is connected to a filament and the lock-in circuit 140 of fluorescent tube 124; Resistance 144 is connected to resistance 143 and lock-in circuit 140.
Because testing circuit is connected to fluorescent tube 114,124 and lock-in circuit 140, so lock-in circuit 140 can judge whether fluorescent tube 114,124 is connected in the circuit according to the voltage of node 17.Specifically, when arbitrary or both in fluorescent tube 114 and 124 are not connected in the circuit, whether the voltage of node 17 will descend, be connected in the circuit so that can learn electric stabilizer circuit 1 its fluorescent tube that loads.When all fluorescent tubes all are connected in the circuit, the voltage of node 17 will recover normally, and drive circuit 13 can start fluorescent tube again by restarting circuit 140.
By as can be known aforementioned, whether the fluorescent tube (being fluorescent tube 114,124) that the testing circuit that present electric stabilizer circuit 1 disposes only can detect a part is connected in the circuit, and can't detect all fluorescent tubes (that is can't detect fluorescent tube 111,121), this is for the user of electric stabilizer circuit, and real genus is inconvenient.
In sum, whether the fluorescent tube that electric stabilizer circuit can be detected load all is connected in the circuit, for this reason the industry in field need the target of effort badly.
Summary of the invention
The object of the present invention is to provide a kind of electric stabilizer circuit, whether this electric stabilizer circuit can detect the whole fluorescent tubes that itself load and all be connected in the circuit.
For reaching above-mentioned purpose, electric stabilizer circuit of the present invention comprises one first lamp group, one second lamp group, a testing circuit and a lock-in circuit.This first lamp group comprises one first inductor and a plurality of disposal area, and respectively this disposal area is suitable can a ccontaining fluorescent tube, so that these fluorescent tubes dispose with series system, connect with this first inductor in these disposal areas.This second lamp group is in parallel with this first lamp group, this second lamp group comprises one second inductor and at least one disposal area, this second inductor is connected to this first inductor, connect with this second inductor in this at least one disposal area, respectively this disposal area is suitable can a ccontaining fluorescent tube, so that this at least one fluorescent tube is connected with this second inductor.This testing circuit is connected to respectively this disposal area of this first lamp group and respectively this disposal area of this second lamp group, so that suitable these fluorescent tubes that can be ccontaining of this testing circuit, this first inductor, this second inductor, these disposal areas form series connection circuit, this testing circuit is in order to receive a direct current voltage signal and to produce one first signal.This lock-in circuit is coupled to this testing circuit, optionally opens or close this electric stabilizer circuit in order to respond this first signal.
Electric stabilizer circuit of the present invention, its testing circuit are coupled to all disposal areas in the electric stabilizer, so make that its testing circuit also is coupled to all fluorescent tubes when the ccontaining fluorescent tube of electric stabilizer circuit.Because all fluorescent tubes all are coupled to testing circuit, electric stabilizer circuit can be judged the state of fluorescent tube by the voltage on the testing circuit, and then makes its lock-in circuit open or close this electric stabilizer circuit according to the voltage on the testing circuit.
Description of drawings
To consult accompanying drawing below preferred embodiment of the present invention will be described in detail, know that usually the knowledgeable can understand purpose of the present invention, characteristics and advantage so that affiliated technical field has, wherein:
Fig. 1 is the schematic diagram of existing electric stabilizer circuit;
Fig. 2 is the schematic diagram of first preferred embodiment of the present invention;
Fig. 3 is the schematic diagram of second preferred embodiment of the present invention;
Fig. 4 is the schematic diagram of the 3rd preferred embodiment of the present invention;
Fig. 5 is the schematic diagram of the 4th preferred embodiment of the present invention; And
Fig. 6 is the schematic diagram of the 5th preferred embodiment of the present invention.
Embodiment
Below will explain content of the present invention by embodiment, embodiments of the invention are not must can implement as the described any particular environment of embodiment, application or particular form in order to limit the present invention.Therefore, only be explaination purpose of the present invention about the explanation of embodiment, but not in order to limit the present invention.The palpus expositor in following examples and the accompanying drawing, omits and does not illustrate with the non-directly related element of the present invention; And each interelement size relationship is careful for asking easy understanding in the accompanying drawing, and is non-in order to limit actual ratio.
One first preferred embodiment of the present invention is an electric stabilizer circuit 2 as shown in Figure 2, and it comprises one first lamp group 21, one second lamp group 22, a testing circuit, a lock-in circuit 24, electric capacity 251,253 and switch element 255,257.
Switch element 255,257 has a control end, one first end points and one second end points respectively.Electric capacity 251,253 has one first end points and one second end points respectively.Switch element 255,257 control end are coupled to one drive circuit 260.First end points of switch element 255 is coupled to first end points of electric capacity 251; Second end points of switch element 255 is coupled to first end points of switch element 257; The second end points ground connection of switch element 257 and be coupled to second end points of electric capacity 253; Second end points of electric capacity 251 is coupled to first end points of electric capacity 253.The first lamp group 21 is coupled to second end points of switch element 255, first end points of switch element 257, second end points of electric capacity 251 and first end points of electric capacity 253.The second lamp group 22 also is coupled to second end points of switch element 255, first end points of switch element 257, second end points of electric capacity 251 and first end points of electric capacity 253.
The first lamp group 21 comprises one first inductor 211, one first electric capacity 216, one first disposal area (not shown), one second disposal area (not shown) and a plurality of preheat circuit 214,215,270, wherein first disposal area is equipped with first fluorescent tube, 212, the second disposal areas and is equipped with second fluorescent tube 213.Connect with first inductor 211 in these disposal areas, particularly, first disposal area coupled in series to the first inductor 211 and second disposal area are coupled to first disposal area, so make first fluorescent tube 212 and second fluorescent tube 213 that are placed in wherein dispose with series system.First electric capacity 216 is coupled to last (i.e. second disposal area) of the disposal area of the first lamp group 21, so also is coupled to second fluorescent tube 213 wherein.First electric capacity 216 is coupled to first inductor 211 simultaneously.First inductor 211 and first electric capacity 216 can form the resonant circuit in the first lamp group 21, have in the technical field under the function of above-mentioned resonant circuit and effect can be and know the understanding easily of the knowledgeable institute usually, do not add at this and give unnecessary details.Preheat circuit 214 is coupled to first inductor 211 and first disposal area, that is is coupled to first fluorescent tube 212 that is placed in wherein simultaneously; Preheat circuit 215 is coupled to first disposal area and second disposal area, that is is coupled to first fluorescent tube 212 and second fluorescent tube 213 that is placed in wherein simultaneously; Preheat circuit 270 is coupled to second disposal area, that is is coupled to second fluorescent tube 213 that is placed in wherein simultaneously.When preheat circuit 214,215,270 is used to electric stabilizer circuit 2 startup just, first fluorescent tube 212 and second fluorescent tube 213 are carried out preheating.
On the other hand, the second lamp group 22 is in parallel with the first lamp group 21, and comprises one second inductor 221, one second electric capacity 226, one the 3rd disposal area (not shown) and a plurality of preheat circuit 225,271, and wherein the 3rd disposal area is equipped with one the 3rd fluorescent tube 223.Second inductor 221 is coupled to first inductor 211, and connects with second inductor 221 in the 3rd disposal area, makes the 3rd fluorescent tube 223 that is placed in the 3rd disposal area also connect with second inductor 221.Second electric capacity 226 is coupled to last (i.e. the 3rd fluorescent tube 223 disposal areas) of the fluorescent tube disposal area of the second lamp group 22, so also be coupled to the 3rd fluorescent tube 223 that is placed in wherein and.Second electric capacity 226 also is coupled to second inductor 221.Second inductor 221 and electric capacity 226 can form the resonant circuit in the first lamp group 22.Preheat circuit 225 is coupled to second inductor 221 and the 3rd disposal area, that is is coupled to the 3rd fluorescent tube 223 that is placed in wherein simultaneously; Preheat circuit 271 is coupled to the 3rd disposal area, that is is coupled to the 3rd fluorescent tube 223 that is placed in wherein simultaneously; Preheat circuit 271 more is coupled to preheat circuit 270.When preheat circuit 225,271 is used to electric stabilizer circuit and has just started, the 3rd fluorescent tube 223 is carried out preheating.
Testing circuit is coupled to each disposal area (i.e. first disposal area and second disposal area) of the first lamp group 21 and each disposal area (i.e. the 3rd disposal area) of the second lamp group 22.Further, so that the 3rd fluorescent tube 223 in first fluorescent tube 212, second fluorescent tube 213 in second disposal area and the 3rd disposal area in the testing circuit, first inductor 211, second inductor 221, first disposal area forms a series connection circuit, its detailed content will be in describing after a while.In addition, testing circuit is connected to node 200 in order to receive a direct current voltage signal, is the dc voltage input end 263 of electric stabilizer circuit 2 in present embodiment, for the usefulness that detects each fluorescent tube collapse state.In other embodiment, dc voltage input end 263 can be supplied by other dc voltage input end, also can reach the effect identical with this preferred embodiment, have in the technical field under it can be and know the knowledgeable's institute's understanding easily after consulting this preferred embodiment usually, not add at this and give unnecessary details.
Specifically, first fluorescent tube 212 of the first lamp group 21 is coupled to the 3rd fluorescent tube 223 that first inductor, 211, the second fluorescent tubes 213 are coupled to first fluorescent tube, 212, the second lamp groups 22 and is coupled to second inductor 221 and second fluorescent tube 213.Testing circuit comprises three sub-testing circuits, is respectively the first sub-testing circuit, the second sub-testing circuit and the 3rd sub-testing circuit.
Particularly, the first sub-testing circuit is coupled to a direct current voltage input end (for example node 200) to receive a direct current voltage and second disposal area, and when second disposal area was equipped with second fluorescent tube 213, the first sub-testing circuit also was coupled to second fluorescent tube 213.As shown in Figure 2, the first sub-testing circuit comprises node 200, first resistance 231 and second resistance 232 of series connection, and wherein second resistance 232 is connected with first resistance 231.Be to be coupled to dc voltage input end and second disposal area with, the first sub-testing circuit by first resistance 231 and the second electricity group 232.
The second sub-testing circuit is coupled to first disposal area and the 3rd disposal area, and when first disposal area and the 3rd disposal area were equipped with first fluorescent tube 212 and the 3rd fluorescent tube 223 respectively, the second sub-testing circuit also was coupled to first fluorescent tube 212 and the 3rd fluorescent tube 223.As shown in Figure 2, the second sub-testing circuit comprises the 3rd resistance 233, is to be coupled to first disposal area and the 3rd disposal area with the second sub-testing circuit by the 3rd resistance 233.In addition, the first sub-testing circuit and second sub-testing circuit filament 282 and the filament 281 of the 3rd fluorescent tube 223 by second fluorescent tube 213 is and is connected in series.
The 3rd sub-testing circuit is coupled to the 3rd disposal area and lock-in circuit 24, and as shown in Figure 2, the 3rd sub-testing circuit comprises one the 5th resistance 291, one the 6th resistance 292 and one detects electric capacity 293.The 5th resistance 291 is connected to lock-in circuit 24 and the 3rd disposal area; The 6th resistance 292 is connected to lock-in circuit 24 and the 5th resistance 291; Detect electric capacity 293 and be connected to lock-in circuit 24 and the 5th resistance 291, and be with the 6th electric capacity 292 and be connected in parallel.Whereby, the 3rd sub-testing circuit is coupled to the 3rd disposal area and lock-in circuit 24 by the 5th resistance 291, the 6th resistance 292 and detection electric capacity 293.When the 3rd disposal area was equipped with the 3rd fluorescent tube 223, the 5th resistance 291 of the 3rd sub-testing circuit also was coupled to the 3rd fluorescent tube 223.Filament 283 and the three sub-testing circuit of the second sub-testing circuit by filament 282, first inductor 211, second inductor 221 and the 3rd fluorescent tube 223 of first fluorescent tube 212 is and is connected in series.
In other words, node 200, first resistance 231, second resistance 232, second fluorescent tube 213, the 3rd fluorescent tube 223, the 3rd resistance 233, first fluorescent tube 212, first inductor 211, second inductor 221, the opposite side that returns the 3rd fluorescent tube 223 are connected with lock-in circuit 24, so, namely form aforesaid series circuit.
Next will explain orally testing circuit and how detect fluorescent tube (i.e. first fluorescent tube 212, second fluorescent tube 213 and the 3rd fluorescent tube 223) and whether all be connected in the circuit, and how electric stabilizer circuit 2 restarts.Lock-in circuit 24 comprises resistance 246,247, electric capacity 243 and switch element 245 and 248, and its concrete connected mode as shown in Figure 2.In this preferred embodiment, switch element 245 is PNP transistor; Switch element 248 is NPN transistor.In other embodiment, switch element 245 and 248 can replace by other switch element with identical characteristics.
Testing circuit is connected in a direct current voltage input end (as node 200) to receive a direct current voltage and to produce one first signal in the node 240 of 292 of the 5th resistance 291 and the 6th resistance, the switch element 245 of lock-in circuit 24 and 248 response these first signal conduction or shutoffs, thus drive circuit 260 is extinguished or restart all fluorescent tubes in the electric stabilizer circuit 2.For example, when the fluorescent tube of electric stabilizer circuit 2 had one not to be connected in the circuit, the magnitude of voltage of node 240 will be less than one first predeterminated voltage value, and the base voltage of switch element 245 will be dragged down, and makes switch element 245 be in the state of conducting.Because switch element 245 is in the state of conducting, resistance 246 will be higher than one second predeterminated voltage so that make switch element 248 conductings with the current potential of resistance 247 tie points, and then pin drive circuit 260.After fluorescent tube was replaced, the voltage of node 240 was drawn high the base voltage of switch element 245, with stopcock element 245 more than or equal to the 3rd predeterminated voltage value.Related, switch element 248 also turn-offs.At this moment, electric stabilizer circuit operates again.
From the above, the first sub-testing circuit in the testing circuit of first preferred embodiment, the second sub-testing circuit and the 3rd sub-testing circuit will be placed in first fluorescent tube 212 of first disposal area, second fluorescent tube 213 that is placed in second disposal area, the 3rd fluorescent tube 223 that is placed in the 3rd disposal area, first inductor 211 and second inductor 212 and conspire to create a series connection circuit.Because all fluorescent tubes (i.e. first fluorescent tube 212, second fluorescent tube 213 and the 3rd fluorescent tube 223) all in series circuit, therefore when any one fluorescent tube breaks down, all can change the running of lock-in circuit 24.By the configuration of first preferred embodiment, the previous problem that only can the test section fluorescent tube breaks down is solved.
One second preferable enforcement of the present invention is an electric stabilizer circuit 3 as shown in Figure 3.Electric stabilizer circuit 3 also comprises one first lamp group 21, one second lamp group 22, a testing circuit, a lock-in circuit 24, electric capacity 251,253 and switch element 255,257.The first lamp group 21, the second lamp group 22, lock-in circuit 24, electric capacity 251,253 and switch element 255,257 and connection relationship therebetween identical with the electric stabilizer circuit 2 of first embodiment, repeat no more in this omission.Hereinafter, the two different piece will be described, that is the connected mode of testing circuit.
Similarly, the testing circuit of electric stabilizer circuit 3 comprises three sub-testing circuits, is respectively the first sub-testing circuit, the second sub-testing circuit and the 3rd sub-testing circuit.The first sub-testing circuit is coupled to a direct current voltage input end (for example node 200, and node 200 is connected to dc voltage input end 263) to receive a direct current voltage and first disposal area.When first disposal area was equipped with first fluorescent tube 212, the first sub-testing circuit also was coupled to first fluorescent tube 212.As shown in Figure 3, the first sub-testing circuit comprises node 200, first resistance 231, second resistance 232 of series connection, and wherein second resistance 232 is connected with this first resistance 231.Therefore, the first sub-testing circuit is to be coupled to dc voltage input end and first disposal area by first resistance 231 and the second electricity group 232.
The second sub-testing circuit is coupled to second disposal area and the 3rd disposal area.When second disposal area and the 3rd disposal area ccontaining second fluorescent tube 213 of difference and the 3rd fluorescent tube 223, the second sub-testing circuit also is coupled to second fluorescent tube 213 and the 3rd fluorescent tube 223.As shown in Figure 3, the second sub-testing circuit comprises the 3rd resistance 233.The second sub-testing circuit is coupled to second disposal area and the 3rd disposal area by the 3rd electricity group 233.In addition, filament 282 and the first sub-testing circuit of the second sub-testing circuit by filament 283, first inductor 211, second inductor 221 and first fluorescent tube 212 of the 3rd fluorescent tube 223 is and is connected in series.
The 3rd sub-testing circuit is coupled to the 3rd disposal area and lock-in circuit 24, and as shown in Figure 3, the 3rd sub-testing circuit comprises one the 5th resistance 291, one the 6th resistance 292 and one detects electric capacity 294.The 5th resistance 291 is connected to lock-in circuit 24 and the 3rd disposal area; The 6th resistance 292 is connected to lock-in circuit 24 and the 5th resistance 291; Detect electric capacity 294 and be connected to lock-in circuit 24 and the 5th resistance 291, and be with the 6th electric capacity 292 and be connected in parallel, whereby, the 3rd sub-testing circuit is by the 5th resistance 291,292 resistances of the 6th resistance and detect electric capacity 294 and be coupled to the 3rd disposal area and lock-in circuit 24.
In other words, when ccontaining the 3rd fluorescent tube 223 in the 3rd disposal area, the 3rd sub-testing circuit also is coupled to the 3rd fluorescent tube 223.The 3rd sub-testing circuit is to be by the filament 280 of the filament 281 of the 3rd fluorescent tube 223 and second fluorescent tube 213 and the second sub-testing circuit to be connected in series.Therefore, the filament 280 of second fluorescent tube 213 in the filament 283 of the 3rd fluorescent tube 223 in the filament 282 of first fluorescent tube 2 12 in node 200, first resistance 231, second resistance 232, first disposal area, first inductor 211, second inductor 221, the 3rd disposal area, the 3rd resistance 233, second disposal area, the filament 281 that returns the 3rd fluorescent tube 223 is connected with lock-in circuit 24, so, namely form aforesaid series circuit.
From the above, with the another kind of connected mode different with first embodiment, first fluorescent tube 212, second fluorescent tube 213, the 3rd fluorescent tube 223, first inductor 211 and second inductor 212 are conspired to create a series connection circuit in the testing circuit of second preferred embodiment.Because all fluorescent tubes (i.e. first fluorescent tube 212, second fluorescent tube 213 and the 3rd fluorescent tube 223) equally all in series circuit, therefore when any one fluorescent tube breaks down, equally can change the running of lock-in circuit 24.
One the 3rd preferred embodiment of the present invention is an electric stabilizer circuit 4 as shown in Figure 4.Electric stabilizer circuit 4 comprises one first lamp group 21, one second lamp group 32, a testing circuit, a lock-in circuit 24, electric capacity 251,253 and switch element 255,257.The first lamp group 21, lock-in circuit 24, electric capacity 251,253 and switch element 255,257 and mode of connection identical with the electric stabilizer circuit 2 of aforementioned first preferred embodiment, repeat no more in this omission.Hereinafter, the two different piece will be described.
First of the electric stabilizer circuit 2 of electric stabilizer circuit 4 and aforementioned preferred embodiment be different be in, also comprise a preheat circuit 224 and one the 4th disposal area in the second lamp group 32, wherein ccontaining one the 4th fluorescent tube 222 in the 4th disposal area.Connect with second inductor 221 in the disposal area that the second lamp group 32 comprises (i.e. the 3rd disposal area and the 4th disposal area), so that the disposal area of the second lamp group 32 (i.e. the 3rd disposal area and the 4th disposal area) ccontaining the 3rd fluorescent tube 223 and the 4th fluorescent tube 222 connected with second inductor 221.
Particularly, the 4th disposal area is coupled to second inductor 221, and when ccontaining the 4th fluorescent tube 222 in the 4th disposal area, the 4th fluorescent tube 222 also is coupled to the 4th fluorescent tube 222; The 3rd fluorescent tube 223 is coupled to the 4th fluorescent tube 222 and second fluorescent tube 213.Preheat circuit 224,225 is coupled to the 4th disposal area, that is is coupled to the 4th fluorescent tube 222 that is placed in the 4th disposal area simultaneously.When preheat circuit 224,225 is used to electric stabilizer circuit 4 startup just, the 4th fluorescent tube 222 is carried out preheating.
Second different mode of connection that is in testing circuit of electric stabilizer circuit 4 and the electric stabilizer circuit 2 of aforementioned preferred embodiment.The testing circuit of electric stabilizer circuit 4 comprises three sub-testing circuits, is respectively the first sub-testing circuit, the second sub-testing circuit and the 3rd sub-testing circuit.The first sub-testing circuit is coupled to a direct current voltage input end (for example node 200, and node 200 is coupled to dc voltage input end 263) to receive a direct current voltage and second disposal area.When ccontaining second fluorescent tube 213 in second disposal area, the first sub-testing circuit also is coupled to second fluorescent tube 213.As shown in Figure 4, the first sub-testing circuit comprises first resistance 231 and second resistance 232 of series connection, and wherein second resistance 232 is connected with first resistance 231.Therefore, the first sub-testing circuit is coupled to dc voltage input end and second disposal area by first resistance 231 and second resistance 232.
The second sub-testing circuit is coupled to first disposal area and the 3rd disposal area.When first disposal area and the 3rd disposal area ccontaining first fluorescent tube 212 of difference and the 3rd fluorescent tube 223, the second sub-testing circuit also is coupled to first fluorescent tube 212 and the 3rd fluorescent tube 223.As shown in Figure 4, the second sub-testing circuit comprises the 3rd resistance 233.Second resistance 232 is coupled to first disposal area and the 3rd disposal area by the 3rd resistance 233.In addition, the filament 281 of the second sub-testing circuit by the 3rd fluorescent tube 223 is with the filament 280 of second fluorescent tube 213 and the first sub-testing circuit and is connected in series.
In addition, the 3rd sub-testing circuit is coupled to the 4th disposal area and lock-in circuit 24, and as shown in Figure 4, the 3rd sub-testing circuit comprises one the 5th resistance 291, one the 6th resistance 292 and one detects electric capacity 294.The 5th resistance 291 is connected to lock-in circuit 24 and the 4th disposal area; The 6th resistance 292 is connected to lock-in circuit 24 and the 5th resistance 291; Detect electric capacity 294 and be connected to lock-in circuit 24 and the 5th resistance 291, and be with the 6th electric capacity 292 and be connected in parallel, whereby, the 3rd sub-testing circuit is to be coupled to the 4th disposal area and lock-in circuit 24 by the 5th resistance 291,292 resistances of the 6th resistance and detection electric capacity 294.
In other words, when ccontaining the 4th fluorescent tube 222 in the 4th disposal area, the 3rd sub-testing circuit also is coupled to the 4th fluorescent tube 222.The second sub-testing circuit is to connect with the 3rd sub-testing circuit by first inductor 211 and second inductor 221.In other words, filament 284 and the lock-in circuit 24 of ccontaining the 4th fluorescent tube 222 in filament 282, first inductor 211, second inductor 221, the 4th disposal area of ccontaining first fluorescent tube 212 in filament 281, the 3rd resistance 233, first disposal area of ccontaining the 3rd fluorescent tube 223 in filament 280, the 3rd disposal area of ccontaining second fluorescent tube 213 of node 200, first resistance 231, second resistance 232, second disposal area form aforesaid series circuit.
From the above, no matter the first lamp group and the second lamp group comprise several disposal areas, testing circuit utilizes first inductor 211 and second inductor 212 that all fluorescent tubes that is placed in the disposal area are connected in the series circuit, therefore when any one fluorescent tube breaks down, all can change the running of lock-in circuit 24.
One the 4th preferred embodiment of the present invention is an electric stabilizer circuit 5 as shown in Figure 5.Electric stabilizer circuit 5 also comprises one first lamp group 21, one second lamp group 32, a testing circuit, a lock-in circuit 24, electric capacity 251,253 and switch element 255,257.The first lamp group 21, the second lamp group 32, lock-in circuit 24, electric capacity 251,253 and switch element 255,257 and mode of connection identical with aforementioned electronic ballast circuit 4, repeat no more in this omission.Hereinafter, the two different piece will be described.The different connected modes that are in testing circuit of electric stabilizer circuit 5 and electric stabilizer circuit 4.Similarly, the testing circuit of electric stabilizer circuit 5 comprises three sub-testing circuits, is respectively the first sub-testing circuit, the second sub-testing circuit and the 3rd sub-testing circuit.
The first sub-testing circuit is coupled to a direct current voltage input end (for example node 200, and node 200 is coupled to direct current pressure side 263) to receive a direct current voltage and first disposal area.When ccontaining first fluorescent tube 212 in first disposal area, the first sub-testing circuit also is coupled to first fluorescent tube 212.As shown in Figure 5, the first sub-testing circuit comprises first resistance 231 and second resistance 232, and wherein second resistance 232 is connected with first resistance 231.The first sub-testing circuit is coupled to dc voltage input end and first disposal area by first resistance 231 and second resistance 232.
The second sub-testing circuit is coupled to second disposal area and the 4th disposal area.When second disposal area and the 4th disposal area ccontaining second fluorescent tube 213 of difference and the 4th fluorescent tube 222, the second sub-testing circuit also is coupled to second fluorescent tube 213 and the 4th fluorescent tube 222.As shown in Figure 5, the second sub-testing circuit comprises the 3rd resistance 233, the second sub-testing circuits and is coupled to second disposal area and the 4th disposal area by the 3rd resistance 233.The first sub-testing circuit is connected with the second sub-testing circuit by first inductor 211 and second inductor 221.
In addition, the 3rd sub-testing circuit is coupled to the 3rd disposal area and lock-in circuit 24, and as shown in Figure 5, the 3rd sub-testing circuit comprises one the 5th resistance 291, one the 6th resistance 292 and one detects electric capacity 294.The 5th resistance 291 is connected to lock-in circuit 24 and the 3rd disposal area; The 6th resistance 292 is connected to lock-in circuit 24 and the 5th resistance 291; Detect electric capacity 294 and be connected to lock-in circuit 24 and the 5th resistance 291, and be with the 6th electric capacity 292 and be connected in parallel, whereby, the 3rd sub-testing circuit is to be coupled to the 3rd disposal area and lock-in circuit 24 by the 5th resistance 291,292 resistances of the 6th resistance and detection electric capacity 294.
In other words, when ccontaining the 3rd fluorescent tube 223 in the 3rd disposal area, the 3rd sub-testing circuit also is coupled to the 3rd fluorescent tube 223.The 3rd sub-testing circuit is to be by the filament 280 of the filament 281 of the 3rd fluorescent tube 223 and second fluorescent tube 213 and the second sub-testing circuit to be connected in series.
By above-mentioned configuration, the filament 280 of the filament 280 of second fluorescent tube 213 of the filament 284 of the 4th fluorescent tube 222 of the filament 282 of first fluorescent tube 212 of testing circuit node 200, first resistance 231, second resistance 232, first disposal area, first inductor 211, second inductor 221, the 4th disposal area, the 3rd resistance 233, second disposal area, the 3rd fluorescent tube 223 of the 3rd disposal area and lock-in circuit 24 form aforesaid series circuit.
With the another kind of connected mode different with the 3rd embodiment, ccontaining fluorescent tube, first inductor 211 and second inductor 212 in the disposal area of the first lamp group 21 and the second lamp group 22 conspires to create series circuit in the testing circuit of the 4th preferred embodiment.Because all fluorescent tubes all in series circuit, therefore when any one fluorescent tube breaks down, equally can change the running of lock-in circuit 24.
One the 5th preferred embodiment of the present invention is an electric stabilizer circuit 6 as shown in Figure 6.Electric stabilizer circuit 6 comprises one first lamp group 21, one second lamp group 52, a testing circuit, a lock-in circuit 24, electric capacity 251,253 and switch element 255,257.The first lamp group 21, lock-in circuit 24, electric capacity 251,253 and switch element 255,257 and mode of connection identical with the electric stabilizer circuit 5 of aforementioned the 4th preferred embodiment, repeat no more in this omission.Hereinafter, the two different piece will be described.
First of the electric stabilizer circuit 5 of electric stabilizer circuit 6 and aforementioned the 4th preferred embodiment be different to be also to comprise in the second lamp group 52 preheat circuit 228 and one the 5th disposal area (not shown), wherein ccontaining one the 5th fluorescent tube 227 in the 5th disposal area.Connect with second inductor 221 in the disposal area that the second lamp group 52 comprises (i.e. the 3rd disposal area, the 4th disposal area and the 5th disposal area), so that the 3rd ccontaining fluorescent tube 223, the 4th fluorescent tube 222 and the 5th fluorescent tube 227 are connected with second inductor 221.
Particularly, the 5th fluorescent tube 227 the 5th disposal area is coupled to second inductor 221, and when ccontaining the 5th fluorescent tube 227 in the 5th disposal area, the 5th fluorescent tube 227 also is coupled to second inductor 221; The 4th fluorescent tube 222 is coupled to the 5th fluorescent tube 227; The 3rd fluorescent tube 223 is coupled to the 4th fluorescent tube 222 and this second fluorescent tube 213.Preheat circuit 224,228 is coupled to the 5th fluorescent tube 227, when being used to electric stabilizer circuit 6 startup just, the 5th fluorescent tube 227 is carried out preheating.
Second different mode of connection that is in testing circuit of electric stabilizer circuit 6 and the electric stabilizer circuit 5 of aforementioned the 4th preferred embodiment.The first sub-testing circuit is to be coupled to a direct current voltage input end (for example node 200, and node 200 is coupled to dc voltage input end 263) to receive a direct current voltage and first disposal area.When ccontaining first fluorescent tube 212 in first disposal area, the first sub-testing circuit also is coupled to first fluorescent tube 212.As shown in Figure 6, the first sub-testing circuit comprises first resistance 231 and second resistance 232, and wherein second resistance 232 is connected with first resistance 231.Hereat, the first sub-testing circuit is coupled to dc voltage input end and first disposal area by first resistance 231 and second resistance 232.
The second sub-testing circuit is coupled to the 5th disposal area and the 4th disposal area.When the 5th disposal area and the 4th disposal area ccontaining the 5th fluorescent tube 227 of difference and the 4th fluorescent tube 222, the second sub-testing circuit also is coupled to the 5th fluorescent tube 227 and the 4th fluorescent tube 222.As shown in Figure 6, to comprise one the 4th resistance, 234, the second sub-testing circuits be to be coupled to the 5th disposal area and the 4th disposal area by the 4th resistance 234 to the second sub-testing circuit.It should be noted that at this first sub-testing circuit is that the filament 285 of filament 282, first inductor 211, second inductor 221 and the 5th fluorescent tube 227 by first fluorescent tube 212 is connected with the second sub-testing circuit.
The 3rd sub-testing circuit is coupled to the 4th disposal area and second disposal area.When the 4th disposal area and second disposal area ccontaining the 4th fluorescent tube 222 of difference and second fluorescent tube 213, the 3rd sub-testing circuit also is coupled to the 4th fluorescent tube 222 and second fluorescent tube 213.As shown in Figure 6, the 3rd sub-testing circuit comprises the 3rd resistance 233, the three sub-testing circuits and is coupled to the 4th disposal area and second disposal area by the 3rd resistance 233.It should be noted that at this filament 284 and the second sub-testing circuit of the 3rd sub-testing circuit by the 4th fluorescent tube 222 is and is connected in series.
In addition, the 4th sub-testing circuit is coupled to the 3rd disposal area and lock-in circuit 24, and as shown in Figure 6, the 4th sub-testing circuit comprises one the 5th resistance 291, one the 6th resistance 292 and one detects electric capacity 294.The 5th resistance 291 is connected to lock-in circuit 24 and the 3rd disposal area; The 6th resistance 292 is connected to lock-in circuit 24 and the 5th resistance 291; Detect electric capacity 294 and be connected to lock-in circuit 24 and the 5th resistance 291, and be with the 6th resistance 292 and be connected in parallel.Whereby, the 4th sub-testing circuit is coupled to the 3rd disposal area by the 5th resistance 291,292 resistances of the 6th resistance and detection electric capacity 294 and is coupled to lock-in circuit 24.
In other words, when ccontaining the 3rd fluorescent tube 223 in the 3rd disposal area, the 4th sub-testing circuit also is coupled to the 3rd fluorescent tube 223.Filament 281 and the filament 280 of second fluorescent tube 213 and the three sub-testing circuit of the 4th sub-testing circuit by the 3rd fluorescent tube 223 is and is connected in series.
By above-mentioned configuration, the filament 281 of the filament 280 of second fluorescent tube 213 of the filament 284 of the 4th fluorescent tube 222 of the filament 285 of the 5th fluorescent tube 227 of the filament 282 of first fluorescent tube 212 of node 200, first resistance 231, second resistance 232, first disposal area, first inductor 211, second inductor 221, the 5th disposal area, the 4th resistance 234, the 4th disposal area, the 3rd resistance 233, second disposal area, the 3rd fluorescent tube 223 of the 3rd disposal area and lock-in circuit 24 form aforesaid series circuit.
From the above, no matter the first lamp group and the second lamp group comprise several fluorescent tubes, testing circuit utilizes first inductor 211 and second inductor 212 fluorescent tube that all disposal areas are ccontaining to be connected in the series circuit, therefore when any one fluorescent tube breaks down, all can change the running of lock-in circuit 24.
The invention relates to an electric stabilizer circuit, the present invention is by a testing circuit that is coupled to each fluorescent tube of disposal area in the electric stabilizer circuit, whether detect each fluorescent tube all is connected in the circuit, and after all fluorescent tubes all are connected in the circuit, electric stabilizer circuit can restart all fluorescent tubes in the electric stabilizer circuit by the conducting of a lock-in circuit.So the present invention can effectively solve existing electric stabilizer circuit and can't detect all fluorescent tubes and whether be connected in problem in the circuit.
The above embodiments only are used for exemplifying enforcement aspect of the present invention, and explain technical characterictic of the present invention, are not to limit category of the present invention.Anyly be familiar with the change that this operator can unlaboredly be equal to or replace all belonging to the scope that the present invention advocates, interest field of the present invention should be as the criterion with the application's claim scope.
Claims (25)
1. electric stabilizer circuit comprises:
One first lamp group comprises:
One first inductor; And
A plurality of disposal areas, respectively this disposal area is suitable can a ccontaining fluorescent tube, so that these fluorescent tubes dispose with series system, connect with this first inductor in these disposal areas;
One second lamp group, in parallel with this first lamp group, comprise:
One second inductor is coupled to this first inductor;
Connect with this second inductor at least one disposal area, respectively this disposal area is suitable can a ccontaining fluorescent tube, so that this at least one fluorescent tube is connected with this second inductor;
One testing circuit, be coupled to respectively this disposal area of this first lamp group and respectively this disposal area of this second lamp group, so that suitable these fluorescent tubes that can be ccontaining of this testing circuit, this first inductor, this second inductor, these disposal areas form series connection circuit, this testing circuit is in order to receive a direct current voltage signal and to produce one first signal; And
One lock-in circuit is coupled to this testing circuit, receives this first signal that this testing circuit produces and responds this first signal and optionally open or close this electric stabilizer circuit.
2. electric stabilizer circuit according to claim 1 is characterized in that this first signal and respectively one of this fluorescent tube conduction status is relevant.
3. electric stabilizer circuit according to claim 1, these disposal areas that it is characterized in that this first lamp group have one first disposal area and one second disposal area, this first disposal area is connected to this first inductor, this second disposal area is connected to this first disposal area, this at least one disposal area of this second lamp group has one the 3rd disposal area, the 3rd disposal area is coupled to this second inductor and this second disposal area, and this testing circuit comprises:
One first sub-testing circuit is connected to a direct current voltage input end and this second disposal area, and wherein this d. c. voltage signal is to be received from this dc voltage input end;
One second sub-testing circuit is connected to this first disposal area and the 3rd disposal area; And
One the 3rd sub-testing circuit is connected to the 3rd disposal area and this lock-in circuit.
4. electric stabilizer circuit according to claim 3, it is characterized in that this first sub-testing circuit comprises one first resistance and second resistance of connecting with this first resistance, this first sub-testing circuit is connected to this dc voltage input end and this second disposal area by this first resistance and this second resistance.
5. electric stabilizer circuit according to claim 3 is characterized in that this second sub-testing circuit comprises one the 3rd resistance, and this second sub-testing circuit is connected to this first disposal area and the 3rd disposal area by the 3rd resistance.
6. electric stabilizer circuit according to claim 3 is characterized in that the 3rd sub-testing circuit comprises:
One the 5th resistance is connected to this lock-in circuit and the 3rd disposal area;
One the 6th resistance is connected to the 5th resistance; And
One detects electric capacity, is with the 6th resistance to be connected in parallel, and whereby, the 3rd sub-testing circuit is coupled to the 3rd disposal area and this lock-in circuit by the 5th resistance, the 6th resistance and this detection electric capacity.
7. electric stabilizer circuit according to claim 1, these disposal areas that it is characterized in that this first lamp group have one first disposal area and one second disposal area, this first disposal area is connected to this first inductor, this second disposal area is connected to this first disposal area, this at least one disposal area of this second lamp group has one the 3rd disposal area, the 3rd disposal area is connected to this second inductor and this second disposal area, and this testing circuit comprises:
One first sub-testing circuit is connected to a direct current voltage input end and this first disposal area, and wherein this d. c. voltage signal is to be received from this dc voltage input end;
One second sub-testing circuit is connected to this second disposal area and the 3rd disposal area; And
One the 3rd sub-testing circuit is connected to the 3rd disposal area and this lock-in circuit.
8. electric stabilizer circuit according to claim 7, it is characterized in that this first sub-testing circuit comprises one first resistance and second resistance of connecting with this first resistance, this first sub-testing circuit is connected to this dc voltage input end and this first disposal area by this first resistance and this second resistance.
9. electric stabilizer circuit according to claim 7 is characterized in that this second sub-testing circuit comprises one the 3rd resistance, and this second sub-testing circuit is connected to this second disposal area and the 3rd disposal area by the 3rd resistance.
10. electric stabilizer circuit according to claim 7 is characterized in that the 3rd sub-testing circuit comprises:
One the 5th resistance is connected to this lock-in circuit and the 3rd disposal area;
One the 6th resistance is connected in series with the 5th resistance; And
One detects electric capacity, is with the 6th electric capacity to be connected in parallel, and whereby, the 3rd sub-testing circuit is connected to the 3rd disposal area and this lock-in circuit by the 5th resistance, the 6th resistance and this detection electric capacity.
11. electric stabilizer circuit according to claim 1, it is characterized in that this second lamp group comprises a plurality of disposal areas, connect with this second inductor, respectively this disposal area is suitable can a ccontaining fluorescent tube, so that these ccontaining fluorescent tubes of these disposal areas of this second lamp group are connected with this second inductor.
12. electric stabilizer circuit according to claim 11, these disposal areas that it is characterized in that this first lamp group have one first disposal area and one second disposal area, this first disposal area and this first inductor and this second disposal area are connected in series, these disposal areas of this second lamp group have one the 3rd disposal area and one the 4th disposal area, the 4th disposal area and this second inductor and the 3rd disposal area are connected in series, and this testing circuit comprises:
One first sub-testing circuit is connected to a direct current voltage input end and this second disposal area, and wherein this d. c. voltage signal is to be received from this dc voltage input end;
One second sub-testing circuit is coupled to this first disposal area and the 3rd disposal area; And
One the 3rd sub-testing circuit is coupled to the 4th disposal area and this lock-in circuit.
13. electric stabilizer circuit according to claim 12, it is characterized in that this first sub-testing circuit comprises one first resistance and second resistance of connecting with this first resistance, this first sub-testing circuit is coupled to this dc voltage input end and this second disposal area by this first resistance and this second resistance.
14. electric stabilizer circuit according to claim 12 is characterized in that this second sub-testing circuit comprises one the 3rd resistance, this second sub-testing circuit is coupled to this first disposal area and the 3rd disposal area by the 3rd resistance.
15. electric stabilizer circuit according to claim 12 is characterized in that the 3rd sub-testing circuit comprises:
One the 5th resistance is connected to this lock-in circuit and the 4th disposal area;
One the 6th resistance is connected to the 5th resistance; And
One detects electric capacity, is connected to this lock-in circuit and the 5th resistance, and is with the 6th electric capacity and is connected in parallel, and whereby, the 3rd sub-testing circuit is coupled to the 4th disposal area and this lock-in circuit by the 5th resistance, the 6th resistance and this detection electric capacity.
16. electric stabilizer circuit according to claim 11, these disposal areas that it is characterized in that this first lamp group have one first disposal area and one second disposal area, this first disposal area is connected to this first inductor, this second disposal area is connected to this first disposal area, these disposal areas of this second lamp group have one the 3rd disposal area and one the 4th disposal area, the 4th disposal area is connected to this second inductor, the 3rd disposal area is connected to the 4th disposal area and this second disposal area, and this testing circuit comprises:
One first sub-testing circuit is connected to a direct current voltage input end and this first disposal area, and wherein this d. c. voltage signal is to be received from this dc voltage input end;
One second sub-testing circuit is connected to this second disposal area and the 4th disposal area; And
One the 3rd sub-testing circuit is connected to the 3rd disposal area and this lock-in circuit.
17. electric stabilizer circuit according to claim 16, it is characterized in that this first sub-testing circuit comprises one first resistance and second resistance of connecting with this first resistance, this first sub-testing circuit is connected to this dc voltage input end and this first disposal area by this first resistance and this second resistance.
18. electric stabilizer circuit according to claim 16 is characterized in that this second sub-testing circuit comprises one the 3rd resistance, this second sub-testing circuit is connected to this second disposal area and the 4th disposal area by the 3rd resistance.
19. electric stabilizer circuit according to claim 16 is characterized in that the 3rd sub-testing circuit comprises:
One the 5th resistance is connected to this lock-in circuit and the 3rd disposal area;
One the 6th resistance is connected in series with the 5th resistance; And
One detects electric capacity, is with the 6th electric capacity to be connected in parallel, and whereby, the 3rd sub-testing circuit is connected to the 3rd disposal area and this lock-in circuit by the 5th resistance, the 6th resistance and this detection electric capacity.
20. electric stabilizer circuit according to claim 11, these disposal areas that it is characterized in that this first lamp group have one first disposal area and one second disposal area, this first disposal area is connected to this first inductor, this second disposal area is connected to this first disposal area, these disposal areas of this second lamp group have one the 3rd disposal area, one the 4th disposal area and one the 5th disposal area, the 5th disposal area is connected to this second inductor, the 4th disposal area is connected to the 5th disposal area, the 3rd disposal area is connected to the 4th disposal area and this second disposal area, and this testing circuit comprises:
One first sub-testing circuit is connected to a direct current voltage input end and this first disposal area, and wherein this d. c. voltage signal is to be received from this dc voltage input end;
One second sub-testing circuit is connected to the 5th disposal area and the 4th disposal area;
One the 3rd sub-testing circuit is connected to the 4th disposal area and this second disposal area; And
One the 4th sub-testing circuit is connected to the 3rd disposal area and this lock-in circuit.
21. electric stabilizer circuit according to claim 20, it is characterized in that this first sub-testing circuit comprises one first resistance and second resistance of connecting with this first resistance, this first sub-testing circuit is connected to this dc voltage input end and this first disposal area by this first resistance and this second resistance.
22. electric stabilizer circuit according to claim 20 is characterized in that the 3rd sub-testing circuit comprises one the 3rd resistance, the 3rd sub-testing circuit is connected to this second disposal area and the 4th disposal area by the 3rd resistance.
23. electric stabilizer circuit according to claim 20 is characterized in that this second sub-testing circuit comprises one the 4th resistance, this second sub-testing circuit is connected to the 4th disposal area and the 5th disposal area by the 4th resistance.
24. electric stabilizer circuit according to claim 20 is characterized in that the 4th sub-testing circuit comprises:
One the 5th resistance is connected to this lock-in circuit and the 3rd disposal area;
One the 6th resistance is connected in series with the 5th resistance; And
One detects electric capacity, is with the 6th electric capacity to be connected in parallel, and whereby, the 4th sub-testing circuit is connected to the 3rd disposal area and this lock-in circuit by the 5th resistance, the 6th resistance and this detection electric capacity.
25. electric stabilizer circuit according to claim 11, it is characterized in that this first lamp group also comprises one first electric capacity, this first electric capacity is connected to last and this first inductor of these disposal areas of this first lamp group, this second lamp group also comprises one second electric capacity, and this second electric capacity is connected to last and this second inductor of these disposal areas of this second lamp group.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200810092110 CN101553069B (en) | 2008-04-02 | 2008-04-02 | Electronic stabilizer circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200810092110 CN101553069B (en) | 2008-04-02 | 2008-04-02 | Electronic stabilizer circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101553069A CN101553069A (en) | 2009-10-07 |
| CN101553069B true CN101553069B (en) | 2013-09-11 |
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ID=41156967
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200810092110 Expired - Fee Related CN101553069B (en) | 2008-04-02 | 2008-04-02 | Electronic stabilizer circuit |
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| Country | Link |
|---|---|
| CN (1) | CN101553069B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102711346B (en) * | 2011-03-28 | 2015-04-08 | 台达电子工业股份有限公司 | Multi-output electronic ballast |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1090459A (en) * | 1993-01-30 | 1994-08-03 | 菲利浦光灯制造公司 | Ballasting circuit |
| US5789866A (en) * | 1997-07-11 | 1998-08-04 | Energy Savings, Inc. | Electronic ballast with reversely wound filament winding |
| US5920155A (en) * | 1996-10-28 | 1999-07-06 | Matsushita Electric Works, Ltd. | Electronic ballast for discharge lamps |
| CN1419400A (en) * | 2001-09-25 | 2003-05-21 | 东芝照明技术株式会社 | Electronic ballast and luminous device |
-
2008
- 2008-04-02 CN CN 200810092110 patent/CN101553069B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1090459A (en) * | 1993-01-30 | 1994-08-03 | 菲利浦光灯制造公司 | Ballasting circuit |
| US5920155A (en) * | 1996-10-28 | 1999-07-06 | Matsushita Electric Works, Ltd. | Electronic ballast for discharge lamps |
| US5789866A (en) * | 1997-07-11 | 1998-08-04 | Energy Savings, Inc. | Electronic ballast with reversely wound filament winding |
| CN1419400A (en) * | 2001-09-25 | 2003-05-21 | 东芝照明技术株式会社 | Electronic ballast and luminous device |
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| Publication number | Publication date |
|---|---|
| CN101553069A (en) | 2009-10-07 |
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