CN101105393A - Vision measuring method for projecting multiple frequency grating object surface tri-dimensional profile - Google Patents
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Abstract
The invention belongs to the field of 3D contour measurement on object surface. The main technical features comprise: (1) projecting gratings with different frequencies to the object surface to obtain multiple phase diagrams; (2) unwrapping the phase diagrams with frequency synthesis method to obtain high-precision unwrapped phase; (3) matting corresponding points to external polar line with the unwrapped phase and calculating 3D contour of the object surface; and (4) in order to make the calculation result more reliable, using modulation degree as reliable reference of phase unwrapping and masking the phase with modulation degree less than the set threshold. The invention has the advantages of simple structure, non-contact, high precision, high speed, and easy implementation.
Description
Technical field the technical field of three-dimensional profile measurement of object surfaces
Background
The technology of measuring the object profile by adopting computer vision is a research hotspot of the current three-dimensional measurement, and has the advantages of simple structure, non-contact, high speed, high precision and high reliability. The method can be widely applied to the fields of aerospace, mechanical manufacturing, medical diagnosis, computer aided design and manufacturing, reverse engineering design, virtual reality, three-dimensional animation production and the like.
The recovery of the three-dimensional geometric information of an object by using a two-dimensional optical image mainly has two technical difficulties: firstly, although the gray scale of the optical image reflects the geometric information of the three-dimensional object, the gray scale is related to other factors such as the material, the texture, the light source and the like of the object, so that the recovery of the three-dimensional geometric shape of the object from the two-dimensional image is an inverse problem with multiple solutions; secondly, the problem of point correspondence is solved by recovering three-dimensional information by using a plurality of two-dimensional images, namely, the corresponding relation between characteristic points among a plurality of images is determined, and the problem is a multi-solution problem.
The grating with sinusoidal distribution is projected on the surface of the measured object, the image of the grating stripe distorted due to the fluctuation of the object surface is collected by the camera, and the phase information related to the object height is acquired by the phase shifting technology. This technique provides conditions for solving the problem of the multi-resolution of restoring three-dimensional geometric information of an object using a two-dimensional optical image. However, the phase extracted by projecting the grating stripe is folded between-pi and pi, and there is a 2 pi folding problem, and the real phase can be obtained by performing phase expansion. For an ideal simple phase diagram, the phase unwrapping is quite simple, in the unwrapping direction, the phases of two adjacent points are compared, if the phase difference between the two points is greater than-pi, then 2 pi is added to the latter point, and if the phase difference between the two points is greater than pi, then 2 pi is subtracted from the latter point. However, if the variation of the object surface also causes the phase variation of two adjacent points to be larger than pi, the phase unwrapping cannot be performed. The phase unwrapping becomes a bottleneck problem that restricts the application of the three-dimensional measurement technique.
The patent (CN 1203292C) divides the measurement area into 2 by Gray coding N And the phase of each strip-shaped area is obtained by utilizing a multi-step phase shift measurement technology, the combination of the strip-shaped areas and the multi-step phase shift measurement technology avoids the phase expansion problem, and the corresponding problem of image points on the left image and the right image can be solved only according to the constraints of the phase and the epipolar line. However, this method may generate an erroneous code due to a mach band effect (mach band effect), and is highly required for a measurement environment and sensitive to noise.
A method called double-frequency profilometry, only use the grating of a stripe in the full field projection at first, the expansion phase place of all image points in the measuring range is the same with folding phase place, distribute between-pi and pi, needn't expand; then, a grating with a plurality of stripes is projected, the phase obtained by the grating with the plurality of stripes has a 2 pi folding problem, and the number of the increase and decrease of 2 pi when the phase of the grating with the plurality of stripes is unfolded is determined by taking the phase of the grating with the single stripe as a reference and utilizing the relation between the phase and the height. Since a single fringe phase contains large noise, a large error is generated when a plurality of fringe grating phases are directly expanded by taking the single fringe phase as a reference. Still other projection schemes that use multiple gratings, such as the grating fringe index increment scheme (f =1,2,4,8, 16, 32, 64, 128), require a greater number of gratings to be projected.
Disclosure of Invention
The method comprises the steps of projecting gratings with three (or more) frequencies to the surface of an object, shooting grating stripes modulated by the surface of the object by cameras arranged on two sides of a projector, calculating the phase of each point on images shot by a left camera and a right camera by adopting a novel phase unwrapping technology, and realizing unique matching of the points on the left image and the right image by taking a phase value and an epipolar line in stereoscopic vision as constraints so as to obtain three-dimensional coordinates of each point on the surface of the object.
The method comprises the following steps:
(1) Generating virtual gratings by a computer, wherein the virtual gratings comprise three groups of phase-shift gratings, and projecting the generated gratings onto an object by using a projector;
(2) Acquiring fringe images on an object by using two cameras, and storing the fringe images in a memory of a computer;
(3) Processing the image shot by each camera by adopting a new phase unwrapping technology to obtain a phase value of each point on the image; the phase values corresponding to the same point on the object surface are equal on the images taken by the two cameras, and therefore the phase values can be used as a basis for matching the corresponding points.
(4) And (3) calibrating the two cameras to obtain internal parameters of the cameras, namely external parameters relative to world coordinates:
(5) And (3) performing three-dimensional reconstruction on each point according to the phase and the epipolar line, and calculating the three-dimensional coordinates of the surface points of the object:
1. projecting a grating of three (or more) frequencies, the three gratings having the following characteristics between their frequencies:
(1) The three gratings have higher frequency, so that the measured phase has higher precision, and the frequencies of the three gratings from high to low are respectively f 1 、f 2 、f 3 ；
(2) Relationship of grating frequency: f. of 1 -2f 2 +f 3 ≤1
(3) Projecting a grating, the light intensity of the surface of the object can be expressed as:
where R (x, y) represents the reflectivity of the object surface, A (x, y) represents the background intensity, B (x, y) represents the fringe intensity amplitude, φ x, y) represents the fringe phase, i =1,2,3, corresponding to frequency f 1 、f 2 、f 3 J =1,2,3,4 corresponds to the phase shift angle phi j Are respectively 0,
π、
(4) Frequency f 1 、f 2 、f 3 Corresponding phase phi of 1 (x，y)、φ 2 (x，y)、φ 3 (x, y) are calculated as follows:
ΔI 42 (x，y)＝I 4 (x，y)-I 2 (x，y)，ΔI 13 (x，y)＝I 1 (x，y)-I 3 (x，y)
2. spreading the phase by adopting a synthetic frequency technology;
(1) In a computerSynthesis of frequency f from gratings 1 and 2 12 (f 12 ＝f 1 -f 2 ) Of a grating of phase phi 12 (x, y); synthesis of frequency f from grating 2 and 3 23 (f 23 ＝f 2 -f 3 ) Of a grating of phase phi 23 (x, y) synthesized by gratings 1 and 3 at frequency f 13 (f 13 ＝f 1 -f 3 ) Of a grating of phase phi 13 (x, y), the phase of which is calculated as follows:
i＝1，2，3，j＝1，2，3，i＜j
(2) Synthesis of frequency f from gratings 1,2 and 3 123 (f 123 ＝f 1 -2f 2 +f 3 ) Of the grating of phase phi 123 The (x, y) calculation method is as follows:
(3) According to f 1 -2f 2 +f 3 Frequency relation of ≤ 1, frequency is f 123 The optical grating of (2) has only one stripe in the visible range of the camera, and the phase of the optical grating does not have the problem of 2 pi folding, namely the unfolding phase is equal to the folding phase, \58388 123 (x，y)＝φ 123 (x, y), so it can be used as a reference phase for other phase unwrapping;
(4) Calculating the frequency f 12 、f 23 、f 13 To spread out phi 13 (x, y) are examples:
(5) Then phase \58388 13 (x, y) as a reference, calculating the grating f 1 、f 2 、f 3 Is spread out of phase by 1 (x, y) are examples
(6) To improve the reliability of the phase, the unwrapped phase is further processed, e.g. by phi 1 (x，y)、φ 2 (x，y)、φ 3 The (x, few) voting method improves the reliability of the phase, or the modulation technique is adopted to improve the reliability of the phase.
3. Calibrating the two cameras to obtain internal parameters of the cameras and external parameters relative to world coordinates;
(1) Two cameras are arranged on two sides of the projector and are symmetrical to the optical axis of the projector;
(2) Vertically projecting a cross cursor to a plane with a certain distance by a projector, and adjusting the angles of the cameras until the central lines of the two cameras are superposed with the vertical line of the cross cursor;
(3) Adopting a planar calibration method of Zhangyingyou or other calibration methods to calibrate the camera and determining internal and external parameters of the camera; the intrinsic parameter of the camera is f (i) 、(u 0 (i) ，v 0 (i) 、dx (i) 、dy (i) The external parameter of the camera is R (i) 、T (i) ，i＝1，2
f (i) : the focal length of the lens, i is the serial number of the camera;
(u 0 (i) ，v 0 (i) ): pixel coordinates of an origin of an image coordinate system of the camera in a pixel coordinate system;
dx (i) 、dy (i) : distance between adjacent pixels in x and y directions;
R (i) : the matrix of the rotation is then rotated in a direction,
T (i) : translation vector, T (j) ＝[T x T y T z ]：
(4) Any point P (X) in space w’ ，Y w’ Z w ) The projection position p (u, v) on the image is determined by a projection matrix composed of internal and external parameters of the camera:
i =1,2,i is the camera number and the projection matrix M is 3 * 4, wherein:
4. the phase value and the epipolar line in the stereoscopic vision are used as constraints to realize the matching of points on the images shot by the left camera and the right camera;
(1) Fundamental Matrix F (Fundamental Matrix)
Wherein, 
i =1,2,i is the camera number, [ m [ ]] x M as an antisymmetric matrix
(2) Homogeneous coordinate P (X) of any point in space w， Y w， Z w， 1) The homogeneous coordinates of the projections on the two camera images are respectively p 1 (u 1 ，v 1 ，1)、p 2 (u 2 ，v 2 1); then there is
It gives p 1 And p 2 Must satisfy the relationship given p 1 In the case of (1), it is a case of p 2 I.e. the epipolar line equation on the image taken by the camera 2; on the contrary, at a given p 2 In the case of (2), it is a case with respect to p 1 I.e. the epipolar line equation on the image taken by the camera 1,
(3) A point p on the image captured by the camera 1 1 (u 1 ，v 1 ) Calculating the epipolar line equation parameters of the epipolar line on the image shot by the 2-camera, and searching for the epipolar line p 1 Points p of equal point phase value 2 (u 2 ，v 2 )，p 1 And p 2 Is a pair of matching points;
5. calculating the three-dimensional coordinates of the surface of the object by using the matched corresponding points;
(1) Known as p 1 (u 1 ，v 1 )，p 2 (u 2 ，v 2 ) Corresponding points which are the same point in space, and a projection matrix M (i) Then, the information about the spatial point P (X) can be obtained w， Y w， Z w ) 4 linear equations of coordinates of (c):
3 equations are selected to be solved or the least square method is used to solve 4 equations to solve the optimal solution, so that the calculation can be carried outP(X w， Y w， Z w ) The coordinate values of (a);
6. a computer, a projector and two cameras are adopted to form a measuring system.
Drawings
FIG. 1 is a schematic diagram of the hardware components of the present invention. The system consists of a projector for projecting grating, two CCD cameras at two sides of the projector, and a computer.
Fig. 2 is a general block diagram of a software process flow.
FIG. 3 is a flow chart of projecting a grating and capturing an image.
Fig. 4 is a flow chart for calculating a phase from an image.
Fig. 5 is a flow chart of calculating corresponding points from camera calibration parameters and phase data.
Fig. 6 is a flowchart of calculating three-dimensional coordinates from corresponding point data.
Fig. 7 is a diagram showing three-dimensional data obtained by measuring a mouse according to the present invention.
Detailed Description
The embodiments of an optical three-dimensional measurement method and system proposed by the present invention are described as follows:
as shown in FIG. 1, the measurement system of this embodiment is composed of cameras 1 and 2, a projector 3, a computer 4, and the like, wherein the computer is P4.8 GHz, two WAT 902H black-and-white CCD industrial cameras of WATEC, two OK series acquisition cards of M10A of Jiaheng company, two domestic GDS 35 lenses, and a HP vp6315 projector.
1) Generating virtual three groups of phase shift gratings with the number of stripes of 120, 116 and 113 by using a computer, and projecting the gratings onto an object by using a projector;
2) Two CCD cameras collect images and store the images in a computer;
3) Respectively processing 12 images shot by each camera to obtain a phase value of each point;
4) In order to make the calculation result more reliable, the modulation degree is used as the reliability basis of the unwrapped phase, and the phase with the modulation degree smaller than the set threshold value is subjected to mask processing.
5) Adopting a Zhangzhen scaling method; calibrating the camera to obtain the internal and external parameters of the camera and the distortion coefficient of the lens;
6) Calculating a basic matrix;
7) Determining a matching point pair according to an epipolar line equation and the phase value;
8) And calculating three-dimensional coordinates.
Claims (8)
1. The visual measurement method of the three-dimensional profile of the object surface of the projection multi-frequency grating is characterized in that: the method comprises the steps of projecting gratings with three (or more) frequencies to the surface of an object, shooting stripes modulated by the surface of the object by cameras arranged on two sides of a projector, calculating the phase of each point on images shot by a left camera and a right camera by adopting a phase unwrapping technology of synthesized frequency, taking a phase value and an epipolar line as constraints, realizing the matching of the points on the left image and the right image, and further solving the three-dimensional coordinates of each point on the surface of the object. It comprises the following steps.
(1) Generating virtual gratings by a computer, wherein the virtual gratings comprise three groups of phase-shift gratings, and projecting the generated gratings onto an object by using a projector;
(2) Acquiring fringe images on an object by using two cameras, and storing the fringe images in a memory of a computer;
(3) Processing the image shot by each camera by adopting a phase unwrapping technology of synthetic frequency to obtain a phase value of each point on the image;
the phase values corresponding to the same point on the object surface are equal on the images taken by the two cameras, and therefore the phase values can be used as a basis for matching of the corresponding points.
(4) And (3) calibrating the two cameras to obtain internal parameters of the cameras, external parameters relative to world coordinates and distortion coefficients of the lens:
(5) Searching corresponding matching points according to the phase and the epipolar line to form corresponding point pairs;
(6) And calculating the three-dimensional coordinates of the surface points of the object from the corresponding point pairs.
2. A method of measurement according to claim 1, characterized by projecting gratings of three (or more) frequencies, the following features between the frequencies of the three gratings.
(1) The three gratings have higher frequency, so that the measured phase has higher precision, and the frequencies of the three gratings are respectively f from high to low according to the frequency 1 、f 2 、f 3 Respectively, phase is phi 1 (x，y)、φ 2 (x，y)、φ 3 (x，y)。
(2) Relationship of grating frequency: f. of 1 -2f 2 +f 3 ≤1。
3. A method of measurement according to claim 1, characterized in that a new phase unwrapping technique is used.
(1) In the computer, the frequency f is synthesized by the gratings 1 and 2 12 (f 12 ＝f 1 -f 2 ) Phase phi 12 (x，y)
(2) In the computer, the frequency f is synthesized by the gratings 2 and 3 23 (f 23 ＝f 2 -f 3 ) Phase phi 23 (x，y)
(3) In the computer, the frequency f is synthesized by the gratings 3 and 1 13 (f 13 ＝f 1 -f 3 ) Phase phi 13 (x，y)
(4) In the computer, the equivalent frequency f is synthesized by the gratings 1,2 and 3 123 (f 123 ＝f 1 -2f 2 +f 3 ) Phase phi 123 (x，y)
(5) Synthesis frequency of f 123 The grating of (2) has only one stripe in the visual range of the camera, and the phase of the grating does not have the problem of 2 pi folding, so it is \58388 123 (x，y)＝φ 123 (x, y) which serves as a reference for other phase unwrapping;
(6) Spread frequency f 12 、f 23 、f 13 To spread f 13 The phase of (c) is as an example:
(7) And finally, the product is treated with \58388 31 (x, y) as a reference, expand the grating f 1 Phase diagram of
(8) Phi is formed by 1 (x，y)、φ 2 (x，y)、φ 3 (x, y) voting or using the modulation degree as the reliability basis of the unwrapped phase, and masking the phase whose modulation degree is less than the set threshold.
4. A method of measurement according to claim 1, characterized in that the two cameras are calibrated to obtain internal parameters of the cameras, i.e. external parameters relative to world coordinates.
(1) Two cameras are arranged on two sides of the projector and are symmetrical to an optical axis of the projector;
(2) Vertically projecting a cross cursor to a plane at a certain distance by a projector, and adjusting the angles of the cameras until the central lines of the two cameras are superposed with the vertical line of the cross cursor;
(3) And determining internal and external parameters of the camera by adopting a planar calibration method of a Zhang Zhengyou or other calibration methods.
5. A method of measurement according to claim 1, characterized in that the corresponding matching of points on the left and right images is achieved with the phase values and epi-polar lines as constraints.
6. A measuring method according to claim 1, characterized in that the three-dimensional coordinates of the points on the surface of the object are calculated using the pairs of corresponding points.
7. The measuring method according to claim 1, wherein the measuring system is composed of a computer, a projector and two cameras.
8. The measurement method according to claim 1, wherein the device for projecting the grating is included, and the projector is used as a grating projection device, and other grating projection schemes can be adopted, such as other grating projection devices consisting of an electro-displacement stage, a grating sheet and a light source.
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