CN100428404C - Enclosed infrared heating device for semiconductor wafer - Google Patents
Enclosed infrared heating device for semiconductor wafer Download PDFInfo
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- CN100428404C CN100428404C CNB2006100313694A CN200610031369A CN100428404C CN 100428404 C CN100428404 C CN 100428404C CN B2006100313694 A CNB2006100313694 A CN B2006100313694A CN 200610031369 A CN200610031369 A CN 200610031369A CN 100428404 C CN100428404 C CN 100428404C
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- water
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- heating
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- 238000010438 heat treatment Methods 0.000 title claims abstract description 45
- 239000004065 semiconductor Substances 0.000 title claims abstract description 16
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 46
- 239000000498 cooling water Substances 0.000 claims abstract description 26
- 230000005540 biological transmission Effects 0.000 claims abstract description 14
- 239000011521 glass Substances 0.000 claims abstract description 9
- 238000007789 sealing Methods 0.000 claims description 7
- 238000001816 cooling Methods 0.000 claims description 6
- 229910001369 Brass Inorganic materials 0.000 claims description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 2
- 239000010951 brass Substances 0.000 claims description 2
- 238000009413 insulation Methods 0.000 claims description 2
- 235000012431 wafers Nutrition 0.000 abstract description 16
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 4
- 230000003749 cleanliness Effects 0.000 abstract description 4
- 230000005855 radiation Effects 0.000 abstract description 4
- 239000000463 material Substances 0.000 abstract description 3
- 238000009826 distribution Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000011538 cleaning material Substances 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 239000003039 volatile agent Substances 0.000 description 1
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Abstract
一种半导体晶片的封闭式红外线加热装置,包括带密封盖板的壳体内部为红外线发生腔,壳体一侧设有由透射玻璃密封的透射窗口,所述腔中有两端分别安装在灯管排座和灯管座上的至少二根加热灯管,灯管另一侧装有反射板,各灯管座经绝缘柱安装在盖板上且同供电座相连,各灯管座中的冷却水通道两端的分进水口和分回水口分别同分水排的对应回水口和进水口连通,分水排中的冷却水通道与盖板中的冷却水通道连接,壳体中有冷却水通道同盖板中的所却水通道连通,壳两侧分别有进风口和出风口。本发明装置适用于半导体设备的运动晶片或固定晶片的辐射加热,它无污染性,能在真空环境下工作,并能用于加热洁净度要求很高的硅片等材料。
A closed infrared heating device for semiconductor wafers, comprising an infrared generating chamber inside a housing with a sealed cover plate, a transmission window sealed by transmission glass is provided on one side of the housing, and two ends of the chamber are respectively installed in lamps. There are at least two heating lamp tubes on the tube row seat and the lamp tube seat. The other side of the lamp tube is equipped with a reflector plate. Each lamp tube seat is installed on the cover plate through an insulating column and connected with the power supply seat. The sub-water inlet and sub-return port at both ends of the cooling water channel are respectively connected with the corresponding return water port and water inlet of the water diversion row. The cooling water channel in the water diversion row is connected with the cooling water channel in the cover plate. There is cooling water in the shell The channel communicates with the cooling water channel in the cover plate, and there are air inlets and air outlets on both sides of the shell. The device of the invention is suitable for the radiation heating of the moving chip or the fixed chip of the semiconductor equipment. It is non-polluting, can work in a vacuum environment, and can be used for heating materials such as silicon chips with high cleanliness requirements.
Description
技术领域 technical field
本发明为半导体材料加工设备,进一步是指对半导体晶片进行加热的封闭式红外线加热装置。The present invention is semiconductor material processing equipment, and further refers to a closed infrared heating device for heating semiconductor wafers.
背景技术 Background technique
半导体工艺线上的晶片加热一般采用非接触式辐射加热,传统的加热装置其加热灯管直接面对晶片进行加热,灯管没有冷却,由于散热不畅,致使灯管座和灯管表面的温升很高,造成高温挥发物影响系统的洁净度,灯管表面的高温使灯管玻壳软化,影响灯管的寿命,加热效率也不高。随着半导体制造工艺线的洁净度要求越来越高,晶片加热需要无污染加热方式和高热效率的加热装置。Wafer heating on the semiconductor process line generally adopts non-contact radiation heating. In traditional heating devices, the heating lamp directly faces the wafer for heating. The lamp is not cooled. Due to poor heat dissipation, the temperature of the lamp holder and the surface of the lamp The rise is very high, causing high-temperature volatiles to affect the cleanliness of the system. The high temperature on the surface of the lamp tube softens the glass bulb of the lamp tube, which affects the life of the lamp tube, and the heating efficiency is not high. As the cleanliness requirements of semiconductor manufacturing process lines are getting higher and higher, wafer heating requires non-polluting heating methods and heating devices with high thermal efficiency.
发明内容 Contents of the invention
本发明要解决的技术问题是,针对现有技术存在的缺陷,提出一种半导体晶片的封闭式红外线加热装置,它具有无污染性,能在真空环境下工作,并能用于加热洁净度要求很高的硅片等材料,被加热物体可以是运动物体,也可以是固定物体。The technical problem to be solved by the present invention is to propose a closed infrared heating device for semiconductor wafers in view of the defects in the prior art, which has no pollution, can work in a vacuum environment, and can be used for heating cleanliness requirements For materials such as very high silicon wafers, the object to be heated can be a moving object or a fixed object.
本发明的技术解决方案是,所述半导体晶片的封闭式红外线加热装置包括带密封盖板的壳体,壳体内部为红外线发生腔,其结构特点是,所述密封盖板相对的壳体一侧设有由透射玻璃密封的透射窗口,所述红外线发生腔中对应于所述透射窗口设有两端分别安装在灯管排座和灯管座上的至少二根加热灯管,与所述透射窗口相对的加热灯管另一侧装有反射板,与加热灯管数量对应的各灯管座经绝缘柱安装在盖板上且其电极同装在盖板上的绝缘供电座相连,所述各灯管座中的冷却水通道两端的分进水口和分回水口分别通过相应的水管同分水排的对应回水口和进水口连通,设有所述进水口和回水口的分水排中的冷却水通道经其总回水口和总进水口与盖板中的冷却水通道连接而形成水冷回路,所述壳体中亦有多路冷却水通道同盖板中的所述冷却水通道连通,在壳体对应两侧分别有至少一个进风口和出风口。The technical solution of the present invention is that the closed infrared heating device of the semiconductor wafer includes a housing with a sealing cover, and the inside of the housing is an infrared generating cavity. The structural feature is that the housing opposite to the sealing cover is The side is provided with a transmission window sealed by transmission glass. Corresponding to the transmission window, there are at least two heating lamp tubes with two ends respectively installed on the lamp tube seat and the lamp tube seat in the infrared generating cavity, and the The other side of the heating lamp tube opposite to the transmission window is equipped with a reflector, and each lamp tube seat corresponding to the number of heating lamp tubes is installed on the cover plate through an insulating column, and its electrodes are connected with the insulating power supply seat installed on the cover plate. The sub-water inlets and sub-return ports at both ends of the cooling water channel in each lamp holder are respectively communicated with the corresponding return water ports and water inlets of the water-distribution row through corresponding water pipes, and the water-distribution row with the water inlet and return port The cooling water channel in the housing is connected to the cooling water channel in the cover plate through its total return port and the main water inlet to form a water cooling circuit. There are also multiple cooling water channels in the housing that are the same as the cooling water channels in the cover plate In communication, there are at least one air inlet and air outlet on the corresponding two sides of the casing.
以下对本发明做出进一步说明。The present invention is further described below.
参见图1和图2,本发明所述装置包括带密封盖板6的壳体18,壳体18内部为红外线发生腔19,其结构特点是,所述密封盖板6相对的壳体18一侧设有由透射玻璃14密封的透射窗口20,所述红外线发生腔19中对应于所述透射窗口20设有两端分别安装在灯管排座11和灯管座16上的至少二根加热灯管8,与所述透射窗口20相对的加热灯管8另一侧装有反射板7,与加热灯管8数量对应的各灯管座16经绝缘柱1安装在盖板6上且其电极同装在盖板6上的绝缘供电座5相连,参见图1、2、4、5,所述各灯管座16中的冷却水通道两端的分进水口21和分回水口22分别通过相应的水管4同分水排17的对应回水口23和进水口24连通,设有所述进水口24和回水口23的分水排17中的冷却水通道经其总回水口25和总进水口26与盖板6中的冷却水通道连接而形成水冷回路,所述壳体18中亦有多路(参见图1所示)冷却水通道3同盖板6中的所述冷却水通道连通,在壳体18对应两侧分别有至少一个进风口2和出风口12。参见图1,还可在反射板7与盖板6之间设有冷却水套9,并可在灯管排座11中设置冷却水通道。Referring to Fig. 1 and Fig. 2, the device of the present invention includes a
本发明的技术原理和工作过程是(参见图1),电源通过绝缘供电座5向加热灯管8供电,灯管就产生大功率的红外辐射,红外线通过具有良好透光性和耐热性的透射玻璃14对晶片10进行加热,而发射板7可将尽可能多的红外线反射回去对晶片10加热,有效提高了装置的加热效率;冷却效果很好的冷却水套9能有效降低反射板7及腔体温度;灯管排座11和各灯管座16及壳体18、盖板6中均通水冷却,并经进风口2和出风口12对腔内进行压缩空气通风冷却而使所述灯管表面充分散热,整个装置冷却效果好。The technical principle and working process of the present invention are (referring to Fig. 1), the power supply supplies power to the
由以上可知,本发明为一种半导体晶片的封闭式红外线加热装置,适用于半导体设备的运动晶片或固定晶片(如硅片)的辐射加热,加热物体所处的真空度可优于1×10-4Pa以上,加热温度可在400℃-800℃范围,加热功率在5KW-25KW之间,加热晶片尺寸100-205mm;它无污染性,能在真空环境下工作,并能用于加热洁净度要求很高的硅片等材料。As can be seen from the above, the present invention is a closed infrared heating device for semiconductor wafers, which is suitable for radiation heating of moving wafers or fixed wafers (such as silicon wafers) of semiconductor equipment, and the vacuum degree of the heating object can be better than 1 × 10 Above -4 Pa, the heating temperature can be in the range of 400°C-800°C, the heating power is between 5KW-25KW, and the size of the heating wafer is 100-205mm; it is non-polluting, can work in a vacuum environment, and can be used for heating and cleaning Materials such as silicon wafers with high requirements.
附图说明 Description of drawings
图1是本发明一种实施例纵向剖视结构示意图;Fig. 1 is a schematic diagram of a longitudinal sectional structure of an embodiment of the present invention;
图2是图1中A-A向剖视结构;Fig. 2 is A-A to sectional structure in Fig. 1;
图3是图2中B-B向剖视的局部结构;Fig. 3 is the partial structure of B-B direction cross-section among Fig. 2;
图4是分水排17的一种实施例剖视结构示意图;Fig. 4 is a kind of embodiment cross-sectional structure schematic diagram of water-distributing
图5是灯管座16的一种实施例结构正视图;Fig. 5 is a structural front view of an embodiment of the
在所述附图中:In said attached drawings:
1-绝缘柱, 2-进风口, 3-冷却水通道,1-Insulation column, 2-Air inlet, 3-Cooling water channel,
4-水管, 5-绝缘供电座, 6-盖板,4-water pipe, 5-insulated power supply seat, 6-cover plate,
7-反射板, 8-加热灯管, 9-冷却水套,7-reflector, 8-heating lamp, 9-cooling water jacket,
10-晶片, 11-灯管排座, 12-出风口,10-chip, 11-lamp tube seat, 12-air outlet,
13-密封圈, 14-透射玻璃, 15-压板,13-sealing ring, 14-transmissive glass, 15-press plate,
16-灯管座, 17-分水排, 18-壳体,16-Lamp holder, 17-Water divider, 18-Shell,
19-红外线发生腔, 20-透射窗口, 21-分进水口,19-infrared generation cavity, 20-transmission window, 21-point water inlet,
22-分回水口,23-回水口,24-进水口,22-point return port, 23-return port, 24-water inlet,
25-总回水口,26-总进水口。25-total water return port, 26-total water inlet.
具体实施方式 Detailed ways
按照附图及上述结构的本发明装置,加热灯管8为五根,相应的灯管座16为五个,装置加热功率25KW,加热温度最高800℃;图1所示透射玻璃14采用高纯石英玻璃,它与壳体18之间装有耐高温密封圈13,并用压板15固定,反射板7用黄铜板制作,反射面镀金;绝缘供电座5采用瓷接线柱对加热灯管8进行真空隔离供电。According to the accompanying drawings and the device of the present invention with the above-mentioned structure, there are five
Claims (5)
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CNB2006100313694A CN100428404C (en) | 2006-03-17 | 2006-03-17 | Enclosed infrared heating device for semiconductor wafer |
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CN101038856A CN101038856A (en) | 2007-09-19 |
CN100428404C true CN100428404C (en) | 2008-10-22 |
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CN103076822B (en) * | 2012-12-27 | 2015-09-09 | 烟台睿创微纳技术有限公司 | Regulate control method and the implement device thereof for the treatment of device temperature processed in vacuum equipment |
CN105158873A (en) * | 2015-08-31 | 2015-12-16 | 武汉宇虹环保产业发展有限公司 | High-temperature sealed reflector device |
CN105551922B (en) * | 2015-12-11 | 2018-07-24 | 中国电子科技集团公司第四十八研究所 | A kind of SiC high temperature high-energy aluminum ion implantation apparatus |
CN107046081B (en) * | 2017-03-07 | 2019-06-14 | 东莞市科隆威自动化设备有限公司 | An anti-light decay furnace |
CN112738928B (en) * | 2020-12-04 | 2022-11-22 | 上海航天精密机械研究所 | Universal combined cooling type modular radiation heater |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN88211587U (en) * | 1988-04-01 | 1988-12-28 | 上海市交通大学 | Rapid annealing device |
US5194401A (en) * | 1989-04-18 | 1993-03-16 | Applied Materials, Inc. | Thermally processing semiconductor wafers at non-ambient pressures |
US5345534A (en) * | 1993-03-29 | 1994-09-06 | Texas Instruments Incorporated | Semiconductor wafer heater with infrared lamp module with light blocking means |
US5693578A (en) * | 1993-09-17 | 1997-12-02 | Fujitsu, Ltd. | Method of forming thin silicon oxide film with high dielectric breakdown and hot carrier resistance |
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2006
- 2006-03-17 CN CNB2006100313694A patent/CN100428404C/en not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN88211587U (en) * | 1988-04-01 | 1988-12-28 | 上海市交通大学 | Rapid annealing device |
US5194401A (en) * | 1989-04-18 | 1993-03-16 | Applied Materials, Inc. | Thermally processing semiconductor wafers at non-ambient pressures |
US5345534A (en) * | 1993-03-29 | 1994-09-06 | Texas Instruments Incorporated | Semiconductor wafer heater with infrared lamp module with light blocking means |
US5693578A (en) * | 1993-09-17 | 1997-12-02 | Fujitsu, Ltd. | Method of forming thin silicon oxide film with high dielectric breakdown and hot carrier resistance |
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Assignee: Hunan Hongtaiyang New Energy Science and Technology Co., Ltd. Assignor: No.48 Inst. China Electronics Tech Group Contract fulfillment period: 2009.9.16 to 2019.9.15 Contract record no.: 2009430000163 Denomination of invention: Enclosed infrared heating device for semiconductor chip Granted publication date: 20081022 License type: Exclusive license Record date: 20091027 |
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