CN109766276B - Open platform test method, device, computer readable storage medium and system - Google Patents
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Abstract
The invention discloses an open platform testing method, which comprises the following steps: judging the test type of a target to be tested when the target to be tested is detected; according to the confirmed test type of the target to be tested, acquiring a test scheme corresponding to the test type in a preset test scheme storage area; and calling the test scheme to test the target to be tested. The invention also discloses an open platform testing device, a computer readable storage medium and a system. According to the method, the test platform with the test scheme is configured on the Android or Android Thins of the open platform, so that the corresponding test scheme is acquired according to the test requirement of the tested object to realize the test requirement, the test scheme is prevented from being independently configured according to the test object, and further the beneficial effect of improving the test efficiency is achieved.
Description
Technical Field
The invention relates to the technical field of open Android or Android Thins system platform testing, in particular to an open platform testing method, an open platform testing device, a computer readable storage medium and a computer readable storage system.
Background
Along with the rapid development of intelligent products, the application field of intelligent operating systems is also expanding, and many intelligent products use open Android or Android thongs systems. In the existing open Android or Android Thins system, the test requirements are various, so that the test modes to be realized are different, the existing test modes generally comprise that a test platform is built according to the independent test modes to perform the test operation of the independent products, and the efficiency speed of the test modes is low and the workload of constructing the related test platform is high due to the diversity of the test modes, so that the test results are influenced.
The foregoing is provided merely for the purpose of facilitating understanding of the technical solutions of the present invention and is not intended to represent an admission that the foregoing is prior art.
Disclosure of Invention
The invention mainly aims to provide an open platform testing method, which aims to solve the technical problems that when testing platforms with different testing modes are created in an open Android or Android thin system in the prior art, the corresponding testing schemes are required to be created due to excessive testing contents and testing types, so that the workload of creating the testing platforms is large, and the testing efficiency is reduced.
In order to achieve the above object, the present invention provides an open platform testing method, which includes the following steps:
judging the test type of a target to be tested when the target to be tested is detected;
according to the confirmed test type of the target to be tested, acquiring a test scheme corresponding to the test type in a preset test scheme storage area;
and calling the test scheme to test the target to be tested.
Preferably, before the step of determining the test type of the target to be tested when the target to be tested is detected, the method further includes:
starting a preset test platform;
and calling the test scheme through the test platform to test the target to be tested.
Preferably, the step of starting a preset test platform further includes:
the system interface definition language client of the test platform is connected with the data platform;
and when the data platform connection is confirmed to be successful, confirming that the starting of the preset test platform is completed.
Preferably, the step of acquiring, in a preset test plan storage area, a test plan corresponding to the test type according to the confirmed test type of the target to be tested further includes:
confirming whether the acquired test items of the test scheme meet the test operation of the target to be tested or not;
and when the test scheme is confirmed to be incapable of meeting the test operation of the target to be tested, initiating the test item adjustment requirement of the test scheme.
Preferably, the step of calling the test scheme to test the target to be tested further includes:
confirming whether the target to be tested is a sensor or not;
when the target to be tested is confirmed to be a sensor, registering a test monitor of the target to be tested, and acquiring test data of the target to be tested by the registered test monitor.
Preferably, after the step of confirming whether the target to be tested is a sensor, the method further includes:
when the target to be tested is confirmed not to be the sensor, an ADB test command is sent to the target to be tested;
and receiving a test result returned by the ADB test command executed by the target to be tested, and displaying the test result in a preset format.
Preferably, the open platform test method further comprises:
acquiring a test requirement of a target to be tested, and creating a test scheme corresponding to the test requirement;
and adding the created test scheme to a preset test platform.
In addition, to achieve the above object, the present invention also provides an open-type platform testing device, including: the system comprises a memory, a processor and an open platform test program stored on the memory and capable of running on the processor, wherein the open platform test program realizes the steps of the open platform test method when being executed by the processor.
The present invention also provides a computer-readable storage medium comprising: the system comprises a memory, a processor and an open platform test program stored on the memory and capable of running on the processor, wherein the open platform test program realizes the steps of the open platform test method when being executed by the processor.
The invention also provides an open platform test system, which realizes the steps of the open platform test method when being executed.
According to the open platform testing method, when the object to be tested is detected, the testing type of the object to be tested is judged; according to the confirmed test type of the target to be tested, acquiring a test scheme corresponding to the test type in a preset test scheme storage area; and calling the test scheme to test the target to be tested. By configuring the test platform with the test scheme on the Android or Android Things of the open platform, when the tested object is connected with the test platform with the test scheme, the corresponding test scheme is acquired according to the test requirement of the tested object to realize the test requirement, and by configuring the test platform with the test scheme, the test scheme is prevented from being independently configured according to the test object, and the beneficial effect of improving the test efficiency is further improved.
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FIG. 1 is a schematic diagram of a terminal/device structure of a hardware operating environment according to an embodiment of the present invention;
FIG. 2 is a flowchart of a first embodiment of an open platform testing method according to the present invention;
FIG. 3 is a flowchart of a second embodiment of an open platform testing method according to the present invention;
fig. 4 is a schematic diagram of a test data structure of the test platform.
The achievement of the objects, functional features and advantages of the present invention will be further described with reference to the accompanying drawings, in conjunction with the embodiments.
Detailed Description
It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
The main solutions of the embodiments of the present invention are: judging the test type of a target to be tested when the target to be tested is detected; according to the confirmed test type of the target to be tested, acquiring a test scheme corresponding to the test type in a preset test scheme storage area; and calling the test scheme to test the target to be tested.
Because of the open Android or Android Thins system in the prior art, the test modes are various, and when the test platforms with different test modes are created, the test efficiency is low due to the large workload of the test platform creation.
According to the solution provided by the invention, the test platform with the test scheme is configured on the Android or Android thins of the open platform, so that when the tested object is connected with the test platform with the test scheme, the corresponding test scheme is obtained according to the test requirement of the tested object to realize the test requirement, and the test platform with the test scheme is configured, so that the test scheme is prevented from being independently configured according to the test object, and further the beneficial effect of improving the test efficiency is achieved.
As shown in fig. 1, fig. 1 is a schematic diagram of a terminal structure of a hardware running environment according to an embodiment of the present invention.
The terminal of the embodiment of the invention can be a PC, and also can be mobile or non-mobile terminal equipment such as a smart phone, a tablet personal computer, an electronic book reader, a portable computer and the like.
As shown in fig. 1, the terminal may include: a processor 1001, such as a CPU, a network interface 1004, a user interface 1003, a memory 1005, a communication bus 1002. Wherein the communication bus 1002 is used to enable connected communication between these components. The user interface 1003 may include a Display, an input unit such as a Keyboard (Keyboard), and the optional user interface 1003 may further include a standard wired interface, a wireless interface. The network interface 1004 may optionally include a standard wired interface, a wireless interface (e.g., WI-FI interface). The memory 1005 may be a high-speed RAM memory or a stable memory (non-volatile memory), such as a disk memory. The memory 1005 may also optionally be a storage device separate from the processor 1001 described above.
It will be appreciated by those skilled in the art that the terminal structure shown in fig. 1 is not limiting of the terminal and may include more or fewer components than shown, or may combine certain components, or a different arrangement of components.
As shown in FIG. 1, an operating system, a network communication module, a user interface module, and an open platform test application may be included in memory 1005, which is a type of computer storage medium.
In the terminal shown in fig. 1, the network interface 1004 is mainly used for connecting to a background server and performing data communication with the background server; the user interface 1003 is mainly used for connecting a client (user side) and performing data communication with the client; and the processor 1001 may be configured to call an open platform test application stored in the memory 1005 and perform the following operations:
judging the test type of a target to be tested when the target to be tested is detected;
according to the confirmed test type of the target to be tested, acquiring a test scheme corresponding to the test type in a preset test scheme storage area;
and calling the test scheme to test the target to be tested.
Further, the processor 1001 may call the open platform test application stored in the memory 1005, and further perform the following operations:
starting a preset test platform;
and calling the test scheme through the test platform to test the target to be tested.
Further, the processor 1001 may call the open platform test application stored in the memory 1005, and further perform the following operations:
the system interface definition language client of the test platform is connected with the data platform;
and when the data platform connection is confirmed to be successful, confirming that the starting of the preset test platform is completed.
Further, the processor 1001 may call the open platform test application stored in the memory 1005, and further perform the following operations:
confirming whether the acquired test items of the test scheme meet the test operation of the target to be tested or not;
and when the test scheme is confirmed to be incapable of meeting the test operation of the target to be tested, initiating the test item adjustment requirement of the test scheme.
Further, the processor 1001 may call the open platform test application stored in the memory 1005, and further perform the following operations:
confirming whether the target to be tested is a sensor or not;
when the target to be tested is confirmed to be a sensor, registering a test monitor of the target to be tested, and acquiring test data of the target to be tested by the registered test monitor.
Further, the processor 1001 may call the open platform test application stored in the memory 1005, and further perform the following operations:
when the target to be tested is confirmed not to be the sensor, an ADB test command is sent to the target to be tested;
and receiving a test result returned by the ADB test command executed by the target to be tested, and displaying the test result in a preset format.
Further, the processor 1001 may call the open platform test application stored in the memory 1005, and further perform the following operations:
acquiring a test requirement of a target to be tested, and creating a test scheme corresponding to the test requirement;
and adding the created test scheme to a preset test platform.
Referring to fig. 2, fig. 2 is a flow chart of a first embodiment of an open platform testing method according to the present invention, where the open platform testing method includes:
step S10, judging the test type of a target to be tested when the target to be tested is detected;
in the current test requirement, connecting a target to be tested with a hardware terminal provided with a test system, and confirming the test type of the target to be tested based on the target to be tested. In practical applications, the test types of targets to be tested may include, but are not limited to, production line testing, burn-in testing, DQA automation testing, and laboratory LCD screen reliability testing. The mode of confirming the test type can be realized by acquiring the test purpose of the target to be tested or directly confirming the target type of the target to be tested.
Further, based on the current test requirement, when the target to be tested is tested, the current test terminal needs to be confirmed to start the test platform, that is, before the step of judging the test type of the target to be tested when the target to be tested is detected, the method further comprises:
starting a preset test platform;
and calling the test scheme through the test platform to test the target to be tested.
In practical application, the test platform is generally installed at a preset test terminal, the test terminal is an intelligent terminal with an Android or Android thongs system, such as a notebook computer, a PC end and the like, and the test terminal is provided with the Android or Android thongs system and is configured with the test platform, wherein the test platform can be packaged and defined as an ATS APP, when the terminal to be tested is connected to the preset test platform, the test platform of the test terminal, that is, the ATS APP, is required to be started, further, in order to improve system compatibility, the test platform is also associated with a data platform, the data platform is defined as a Driver APP, the Driver APP is an independent platform and can be expanded, and when test operation is realized, the ATS APP and the Driver APP are connected through an AIDL Client.
In this way, when executing the test operation, the test platform and the data platform need to be associated through the pre-created AIDL Client, that is, the step of starting the preset test platform further includes:
the system interface definition language client of the test platform is connected with the data platform;
and when the data platform connection is confirmed to be successful, confirming that the starting of the preset test platform is completed.
When the test platform, namely the ATS APP is installed to the test terminal of the Android or Android Thins system, android Things Driver APP is required to be installed for the Android Thins system product except for the ATS APP, and the ATS APP performs related hardware test through Android Application layers of APIs and Driver APP operation bottom hardware. The installed Driver APP is responsible for unified loading and destruction of all external devices. And the ATS APP, namely Driver APP, is associated through a registration driving interface client, and as the registration driving interface client is related to the system type of the current test terminal, the registration driving interface is an android registration driving interface, in practical application, the registration interface client is built by building an android interface definition language, namely AIDL, in the ATS APP, and loading and installing of the device Driver of the test terminal are realized through the registration interface client.
Step S20, according to the confirmed test type of the target to be tested, acquiring a test scheme corresponding to the test type in a preset test scheme storage area;
according to the confirmed test type of the target to be tested, acquiring a test scheme corresponding to the test type in a preset test scheme storage area by using the test type, wherein the test scheme is a test scheme stored when a test platform of the target test terminal is configured, namely, the test scheme is packaged by executing a corresponding test step of the test type.
In addition, when the test solution is obtained, due to different test requirements and test results, the possible test solution cannot be applied to the test of the target to be tested, so, according to the confirmed test type of the target to be tested, the step of obtaining the test solution corresponding to the test type in the preset test solution storage area further includes:
confirming whether the acquired test items of the test scheme meet the test operation of the target to be tested or not;
and when the test scheme is confirmed to be incapable of meeting the test operation of the target to be tested, initiating the test item adjustment requirement of the test scheme.
And reading the test content of the test scheme, and confirming whether the test items of the test scheme meet the test operation of the target to be tested or not according to the test content. In practical application, the confirmation mode can be that a technician reads the description text of the test scheme or related technical data to confirm the test content of the test scheme, and confirms whether the test scheme meets the test operation of the target to be tested according to the test content, and when the test scheme is confirmed to fail to meet the test operation of the target to be tested, the test item adjustment requirement of the test scheme is initiated, and the test item adjustment requirement can be sent to a corresponding technician, so that the technician adjusts the test scheme according to the test item adjustment requirement, and further performs the test operation of the target to be tested according to the adjusted test scheme.
Step S30, calling the test scheme to test the target to be tested.
Executing test operation on the target to be tested according to the acquired test scheme, wherein the test operation of the target to be tested is realized by directly executing the test scheme, so that the step of calling the test scheme to test the target to be tested further comprises the following steps:
confirming whether the target to be tested is a sensor or not;
when the target to be tested is confirmed to be a sensor, registering a test monitor of the target to be tested, and acquiring test data of the target to be tested by the registered test monitor.
When the test operation of the target to be tested is executed, whether the target to be tested is a Sensor or not is further determined, and then the corresponding acquisition operation of the result of executing the test scheme is performed, in practical application, the target to be tested may include, but is not limited to, whether the target to be tested is a Sensor or not, and the test mode of the target to be tested may include, but is not limited to, ADB command test or screen operation test, so when the target to be tested is tested by the Sensor, the PC inputs an ADB instruction for testing the Sensor, where the ADB instruction may be defined as follows:
adb shell am broadcast-a ACTION_READ_PROXIMITY_SENSOR_DATA
through the instruction, the device monitors Sensor data of the system.
In addition, when testing various sensors, the ADB command and 2 testing operation modes of screen operation can be applied, and the testing steps of the two testing modes are as follows:
a. via ADB command, the sensor results are viewed, the content of which can be as follows: the adb shell cat/sdcard/tonly/log/ATSLogFile
b. And executing the testing operation of the Sensor by using screen operation, registering a Sensor monitor by directly clicking a test Sensor item, capturing Sensor data reported by an Android bottom layer, and directly displaying a result above the screen.
In addition, after the step of confirming whether the target to be tested is a sensor, the method further includes:
when the target to be tested is confirmed not to be the sensor, an ADB test command is sent to the target to be tested;
and receiving a test result returned by the ADB test command executed by the target to be tested, and displaying the test result in a preset format.
Taking a test purpose of acquiring a software version as an example when the target to be tested is confirmed to be a non-sensor, the test steps are as follows:
acquiring corresponding version information before testing, and inputting an ADB instruction entering an automatic test mode at a PC end, wherein the ADB instruction is defined as follows:
Adbshellamstart-n ats.tonly.com.displayats/
ats.tonly.com.displayats.ats.AtsTestListActivity--ei MODE 0
through the instruction, the equipment loads a testing tool of a corresponding testing mode and enters a mode to be tested;
in addition, based on the device type of the object to be tested, the test of the object to be tested also comprises two test modes, namely an ADB command test and screen operation test, wherein the ADB command test and screen operation test steps are as follows:
a. by using an ADB command mode, for example, acquiring software version information, the version acquisition command can be input through the PC end:
adb shell am broadcast-a ACTION_GET_APK_VERSION--es PACKAGE_NAME"ats.tonly.com.displayats"
the ATS receives the command and calls the Android API to obtain the specified version information, and then executes the ADB command to view the version result, where the content of the ADB command is as follows:
adb shell cat/sdcard/tonly/log/ATSLogFile
b. and using screen operation, directly clicking the test item for acquiring the software version information by a tester, and directly displaying a result above the screen through an acquired version API provided by Android.
In the embodiment, the test platform with the test scheme is configured in Android or Android thongs of the open platform so as to acquire the corresponding test scheme according to the test requirement of the tested object to realize the test requirement, thereby avoiding the independent configuration of the test scheme according to the test object and further improving the test efficiency.
Further, referring to fig. 3, fig. 3 is a flow chart of a second embodiment of the open platform testing method according to the present invention, where the open platform testing method includes:
step S40, obtaining a test requirement of a target to be tested, and creating a test scheme corresponding to the test requirement;
and S50, adding the created test scheme to a preset test platform.
In this embodiment, in the test terminal configured with the current test platform, the test terminal is an Android or Android thin intelligent terminal applying the platform, and the test platform is a terminal application packaged as an ATS APP, when configuring the test platform, the test terminal needs to install Android Things Driver APP in addition to installing the ATS APP, and the ATS APP performs related hardware test by operating the bottom hardware through Android Application layers of APIs and Driver APP. The test data structures of the test platform and the tested object can be as shown in fig. 4, and fig. 4 is a schematic diagram of the test data structure of the test platform. According to the configured test platform, a corresponding test scheme is created according to the currently applicable test content, and the test scheme can be written by related technicians through test requirements or an existing historical test scheme is applied, and the created test scheme is stored in a preset test scheme storage area so as to be obtained when a target to be tested is tested.
In addition, the embodiment of the invention also provides a computer readable storage medium, wherein the computer readable storage medium stores an open platform test program, and the open platform test program realizes the following operations when being executed by a processor:
judging the test type of a target to be tested when the target to be tested is detected;
according to the confirmed test type of the target to be tested, acquiring a test scheme corresponding to the test type in a preset test scheme storage area;
and calling the test scheme to test the target to be tested.
Further, the open platform test program, when executed by the processor, further performs the following operations:
starting a preset test platform;
and calling the test scheme through the test platform to test the target to be tested.
Further, the open platform test program, when executed by the processor, further performs the following operations:
the system interface definition language client of the test platform is connected with the data platform;
and when the data platform connection is confirmed to be successful, confirming that the starting of the preset test platform is completed.
Further, the open platform test program, when executed by the processor, further performs the following operations:
confirming whether the acquired test items of the test scheme meet the test operation of the target to be tested or not;
and when the test scheme is confirmed to be incapable of meeting the test operation of the target to be tested, initiating the test item adjustment requirement of the test scheme.
Further, the open platform test program, when executed by the processor, further performs the following operations:
confirming whether the target to be tested is a sensor or not;
when the target to be tested is confirmed to be a sensor, registering a test monitor of the target to be tested, and acquiring test data of the target to be tested by the registered test monitor.
Further, the open platform test program, when executed by the processor, further performs the following operations:
when the target to be tested is confirmed not to be the sensor, an ADB test command is sent to the target to be tested;
and receiving a test result returned by the ADB test command executed by the target to be tested, and displaying the test result in a preset format.
Further, the open platform test program, when executed by the processor, further performs the following operations:
acquiring a test requirement of a target to be tested, and creating a test scheme corresponding to the test requirement;
and adding the created test scheme to a preset test platform.
The invention also provides an open platform test system, which realizes the content of the embodiment of the open platform test method when being executed.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or system. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, medicament or system comprising such element.
The foregoing embodiment numbers of the present invention are merely for the purpose of description, and do not represent the advantages or disadvantages of the embodiments.
From the above description of the embodiments, it will be clear to those skilled in the art that the above-described embodiment method may be implemented by means of software plus a necessary general hardware platform, but of course may also be implemented by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art in the form of a software product stored in a storage medium (e.g. ROM/RAM, magnetic disk, optical disk) as described above, comprising instructions for causing a terminal device (which may be a mobile phone, a computer, a server, an air conditioner, or a network device, etc.) to perform the method according to the embodiments of the present invention.
The foregoing description is only of the preferred embodiments of the present invention, and is not intended to limit the scope of the invention, but rather is intended to cover any equivalents of the structures or equivalent processes disclosed herein or in the alternative, which may be employed directly or indirectly in other related arts.
Claims (6)
1. An open platform testing method is characterized by comprising the following steps:
acquiring a test requirement of a target to be tested, and creating a test scheme corresponding to the test requirement;
adding the created test scheme to a preset test platform, wherein the test platform is installed to a preset test terminal, the test terminal is terminal equipment with an Android or Android links system and is configured with the test platform, the test platform is associated with a data platform through a registration driving interface client, the registration driving interface is an Android registration driving interface, the registration driving interface client is related to the system type of the current test terminal, the data platform is an independent drive APP, and the test platform performs related hardware test by operating bottom hardware through Android Application layers of APIs and drive APP;
judging the test type of a target to be tested when the target to be tested is detected;
according to the confirmed test type of the target to be tested, acquiring a test scheme corresponding to the test type in a preset test scheme storage area;
invoking the test scheme to test the target to be tested;
before the step of judging the test type of the target to be tested when the target to be tested is detected, the method further comprises the following steps:
starting a preset test platform;
invoking the test scheme through the test platform to test the target to be tested;
the step of starting a preset test platform further comprises the following steps:
the system interface definition language client of the test platform is connected with the data platform;
when the data platform is confirmed to be successfully connected, confirming that the starting of the preset test platform is completed;
the step of acquiring the test scheme corresponding to the test type in the preset test scheme storage area according to the confirmed test type of the target to be tested, further comprises the following steps:
confirming whether the acquired test items of the test scheme meet the test operation of the target to be tested or not;
and when the test scheme is confirmed to be incapable of meeting the test operation of the target to be tested, initiating the test item adjustment requirement of the test scheme.
2. The open platform testing method of claim 1, wherein the step of invoking the testing scheme to test the target under test further comprises:
confirming whether the target to be tested is a sensor or not;
when the target to be tested is confirmed to be a sensor, registering a test monitor of the target to be tested, and acquiring test data of the target to be tested by the registered test monitor.
3. The open platform testing method according to claim 2, wherein after the step of confirming whether the target to be tested is a sensor, further comprising:
when the target to be tested is confirmed not to be the sensor, an ADB test command is sent to the target to be tested;
and receiving a test result returned by the ADB test command executed by the target to be tested, and displaying the test result in a preset format.
4. An open platform testing device, characterized in that the open platform testing device comprises: a memory, a processor and an open platform test program stored on the memory and executable on the processor, which when executed by the processor, implements the steps of the open platform test method of any one of claims 1 to 3.
5. A computer-readable storage medium, the computer-readable storage medium comprising: a memory, a processor and an open platform test program stored on the memory and executable on the processor, which when executed by the processor, implements the steps of the open platform test method of any one of claims 1 to 3.
6. An open platform test system, wherein the open platform test system, when executed, performs the steps of the open platform test method of any one of claims 1 to 3.
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Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105095089A (en) * | 2015-09-14 | 2015-11-25 | 北京金山安全软件有限公司 | Method and device for testing performance of application software |
| CN105224869A (en) * | 2014-06-12 | 2016-01-06 | 腾讯科技（深圳）有限公司 | Assembly test method and device |
| CN106598874A (en) * | 2017-02-08 | 2017-04-26 | 郑州云海信息技术有限公司 | Method and device for automatically testing software |
| CN107454124A (en) * | 2016-05-31 | 2017-12-08 | 阿里巴巴集团控股有限公司 | Equipment automatization method and device |
| CN107643978A (en) * | 2016-07-20 | 2018-01-30 | 平安科技（深圳）有限公司 | The method and apparatus of function of application test |
| CN107864442A (en) * | 2017-10-27 | 2018-03-30 | Tcl通力电子（惠州）有限公司 | Method of testing based on intelligent sound equipment, intelligent sound equipment and storage medium |
| CN108280026A (en) * | 2018-01-23 | 2018-07-13 | 网易（杭州）网络有限公司 | Automated testing method and device, storage medium, electronic equipment |
| CN108572919A (en) * | 2018-05-30 | 2018-09-25 | 平安普惠企业管理有限公司 | Automated testing method, device, computer equipment and storage medium |
| CN108733568A (en) * | 2018-05-25 | 2018-11-02 | 平安科技（深圳）有限公司 | Application testing method, device, equipment and readable storage medium |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10120788B2 (en) * | 2017-01-23 | 2018-11-06 | Accenture Global Solutions Limited | Cloud connected automated testing in multiple operating environments using multiple parallel test threads |
| US10409711B2 (en) * | 2017-06-12 | 2019-09-10 | International Business Machines Corporation | Automatically running tests against WEB APIs based on specifications |
-
2018
- 2018-12-29 CN CN201811653274.5A patent/CN109766276B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105224869A (en) * | 2014-06-12 | 2016-01-06 | 腾讯科技（深圳）有限公司 | Assembly test method and device |
| CN105095089A (en) * | 2015-09-14 | 2015-11-25 | 北京金山安全软件有限公司 | Method and device for testing performance of application software |
| CN107454124A (en) * | 2016-05-31 | 2017-12-08 | 阿里巴巴集团控股有限公司 | Equipment automatization method and device |
| CN107643978A (en) * | 2016-07-20 | 2018-01-30 | 平安科技（深圳）有限公司 | The method and apparatus of function of application test |
| CN106598874A (en) * | 2017-02-08 | 2017-04-26 | 郑州云海信息技术有限公司 | Method and device for automatically testing software |
| CN107864442A (en) * | 2017-10-27 | 2018-03-30 | Tcl通力电子（惠州）有限公司 | Method of testing based on intelligent sound equipment, intelligent sound equipment and storage medium |
| CN108280026A (en) * | 2018-01-23 | 2018-07-13 | 网易（杭州）网络有限公司 | Automated testing method and device, storage medium, electronic equipment |
| CN108733568A (en) * | 2018-05-25 | 2018-11-02 | 平安科技（深圳）有限公司 | Application testing method, device, equipment and readable storage medium |
| CN108572919A (en) * | 2018-05-30 | 2018-09-25 | 平安普惠企业管理有限公司 | Automated testing method, device, computer equipment and storage medium |
Non-Patent Citations (2)
| Title |
|---|
| Android智能终端功能测试方法设计与系统实现;刘璐;《软件》;20141215(第12期);第83-86页 * |
| Teaching Second-Level Java and Software Engineering with Android;Sarah Heckman et.al;《 2011 24TH IEEE-CS CONFERENCE ON SOFTWARE ENGINEERING EDUCATION AND TRAINING (CSEET)》;第540-542页 * |
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