CN109669107A - Simulate the device and its analogy method of shelf depreciation - Google Patents
Simulate the device and its analogy method of shelf depreciation Download PDFInfo
- Publication number
- CN109669107A CN109669107A CN201811412641.2A CN201811412641A CN109669107A CN 109669107 A CN109669107 A CN 109669107A CN 201811412641 A CN201811412641 A CN 201811412641A CN 109669107 A CN109669107 A CN 109669107A
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- effect transistor
- pulse width
- signal
- shelf depreciation
- electric current
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/20—Preparation of articles or specimens to facilitate testing
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Generation Of Surge Voltage And Current (AREA)
Abstract
Disclose a kind of device and its analogy method for simulating shelf depreciation, emitter includes DC power supply, triggering and electric current pulse width control unit, field-effect transistor driving unit, high-voltage pulse generator, electromagnetic probe and air bag to be simulated, the triggering and electric current pulse width control unit include the pulse width control unit for issuing the trigger unit of trigger signal and issuing electric current pulse width signal based on trigger signal, and the field-effect transistor driving unit is based on trigger signal and electric current pulse width signal generates pulse signal and make-and-break time;The high-voltage pulse generator generates the transient electromagnetic pulse of predetermined pulse width and preset frequency based on the pulse signal and make-and-break time;The electromagnetic probe that air sac sealing to be simulated accommodates gas to be simulated and surrounded by the gas to be simulated, wherein the air bag to be simulated is detachably connected high-voltage pulse generator, and electromagnetic probe is electrically connected high-voltage pulse generator to generate spark gap.
Description
Technical field
The present invention relates to shelf depreciation technical field, especially a kind of device and its analogy method for simulating shelf depreciation.
Background technique
It is in high-voltage isulation that shelf depreciation occurs under the action of strong electrical field for certain weak parts in Electric Power Equipment Insulation
Common problem.Although shelf depreciation will not generally cause the penetrability breakdown of insulation, dielectric can be caused (especially
Organic dielectric) local damage.If shelf depreciation long-term existence, it will lead to insulation degradation under certain condition or even hit
It wears.Therefore, carrying out shelf depreciation test to power equipment is power equipment manufacture and a running important preventive trial.
Such as: switchgear is widely used in power grid, and shelf depreciation is one of main forms of its insulation defect, office
Put the effective means that detection is also apparatus insulated situation in assessment switchgear.Partial Discharge Detection equipment tool based on TEV principle
There is communication process decaying smaller, can be realized good detection sensitivity;It can decaying according to electromagnetic pulse signal and the time difference pair
The Partial Discharge Sources of switchgear are positioned;The advantages that partial discharge of switchgear type can be analyzed, puts in the part of switchgear
It is had been widely used in electro-detection.
However, finding in practice, the gas with various insulation of equipment can have the signal of surveyed shelf depreciation larger
Influence, using pure gas atmosphere can not shelf depreciation in the various gases of accurate simulation, therefore develop a kind of portable quasi-
The device and its analogy method of shelf depreciation shorten the week of equipment breakdown discovery defect elimination for improving switchgear scene inspection quality
There is significant practical significance in phase.
Disclosed above- mentioned information are used only for enhancing the understanding to background of the present invention in the background section, it is thus possible to
Information comprising not constituting the prior art known to a person of ordinary skill in the art in home.
Summary of the invention
In view of the above problems, the present invention implements to provide a kind of device and its analogy method for simulating shelf depreciation, energy
Enough triggerings every time all generate the electromagnetic signal of identical energy, can output pulse width be ns grades electromagnetic pulse signal for ground electric wave
Sensor receives, and complying fully with shelf depreciation in practice is duration very short transient process, the consistency of output signal or
Repeatability and be capable of providing quantization calibration result simulation solid foundation be provided, the present invention it is portable, repeated it is strong, available on site
Transient state low-voltage shelf depreciation.
The purpose of the present invention is be achieved by the following technical programs.
An aspect of of the present present invention, it is a kind of simulate shelf depreciation device include,
DC power supply;
Triggering and electric current pulse width control unit are electrically connected the DC power supply, the triggering and electric current pulse-width controlled list
Member includes,
Trigger unit issues trigger signal, and
Pulse width control unit issues electric current pulse width signal based on trigger signal;
Field-effect transistor driving unit is electrically connected DC power supply and triggering and electric current pulse width control unit, the field effect
Transistor driving unit is based on trigger signal and electric current pulse width signal generates pulse signal and make-and-break time;
High-voltage pulse generator, is electrically connected DC power supply and field-effect transistor driving unit, and the high-voltage pulse occurs
Device generates the transient electromagnetic pulse of predetermined pulse width and preset frequency based on the pulse signal and make-and-break time;
Air bag to be simulated, the electromagnetic probe that sealing accommodates gas to be simulated and surrounded by the gas to be simulated, wherein
The air bag to be simulated is detachably connected high-voltage pulse generator, and electromagnetic probe is electrically connected high-voltage pulse generator to generate spark
Gap.
In the device of the simulation shelf depreciation, field-effect transistor driving unit includes metal oxide semiconductcor field effect
Answer transistor.
In the device of the simulation shelf depreciation, Metal Oxide Semiconductor Field Effect Transistor is the oxidation of N-type metal
Object semiconductor field effect transistor or P type metal oxide semiconductor field effect transistor
In the device of the simulation shelf depreciation, the DC power supply includes rechargeable lithium battery.
In the device of the simulation shelf depreciation, the trigger unit includes that end, the trigger unit electricity are compared in triggering
It is connected to DC power supply, triggering compares end and keeps low level, and when trigger unit receives trigger signal, triggering is compared end and turned by low level
Change high level into and by failing edge along triggering.
In the device of the simulation shelf depreciation, field-effect transistor driving unit is based on MOSFET and draws and control charging
Capacitor generates transient electromagnetic pulse.
In the device of the simulation shelf depreciation, the high-voltage pulse generator is high-voltage pulse packet.
In the device of the simulation shelf depreciation, the no-load voltage ratio 2000: 1 of the high-voltage pulse packet, input voltage peak value is
22V, high voltage package pair side output voltage peak value are up to 60kV.
In the device of the simulation shelf depreciation, electromagnetic probe position-adjustable makes spark gap adjustable.
According to another aspect of the present invention, a kind of analogy method of the device of the simulation shelf depreciation includes following step
Suddenly,
In the first step, triggering and electric current pulse width control unit, field-effect transistor driving unit and high-voltage pulse occur
Device is electrically connected DC power supply, and field-effect transistor driving unit one end is electrically connected field-effect transistor driving unit, other end electricity
High-voltage pulse generator is connected, electromagnetic wave transmission unit connects the high-voltage pulse generator via electromagnetic probe;
In the second step, trigger unit issues trigger signal, and pulse width control unit is based on trigger signal and issues electric current arteries and veins
Bandwidth signals;
In third step, field-effect transistor driving unit is based on trigger signal and electric current pulse width signal generates pulse signal
And make-and-break time;
In four steps, the high-voltage pulse generator is based on the pulse signal and make-and-break time generates predetermined pulse width
With the transient electromagnetic pulse of preset frequency;
In the 5th step, electromagnetic probe is based on transient electromagnetic pulse and is generating spark gap in gas wait simulate.
The above description is only an overview of the technical scheme of the present invention, in order to make technological means of the invention clearer
Understand, reach the degree that those skilled in the art can be implemented in accordance with the contents of the specification, and in order to allow the present invention
Above and other objects, features and advantages can be more clearly understood, illustrated below with a specific embodiment of the invention
Explanation.
Detailed description of the invention
By reading the detailed description in hereafter preferred embodiment, various other advantages and benefits of the present invention
It will become apparent to those of ordinary skill in the art.Figure of description only for the purpose of illustrating preferred embodiments,
And it is not to be construed as limiting the invention.It should be evident that drawings discussed below is only some embodiments of the present invention,
For those of ordinary skill in the art, without creative efforts, it can also be obtained according to these attached drawings
Other attached drawings.And throughout the drawings, identical component is presented with like reference characters.
In the accompanying drawings:
Fig. 1 is the structural schematic diagram of the device of simulation shelf depreciation according to an embodiment of the invention;
Fig. 2 is the triggering and electric current pulse width control unit of the device of simulation shelf depreciation according to an embodiment of the invention
Schematic circuit;
Fig. 3 is showing for the field-effect transistor driving unit of the device of simulation shelf depreciation according to an embodiment of the invention
Meaning property circuit diagram;
Fig. 4 is showing for the field-effect transistor driving unit of the device of simulation shelf depreciation according to an embodiment of the invention
Meaning property circuit diagram;
Fig. 5 is that the high-voltage pulse generator of the device of simulation shelf depreciation according to an embodiment of the invention shows
It is intended to;
Fig. 6 is the output voltage pulse signal waveform of the device of simulation shelf depreciation according to an embodiment of the invention
Figure;
Fig. 7 is the consistency detection waveform diagram of the device of simulation shelf depreciation according to an embodiment of the invention;
Fig. 8 is the step schematic diagram of the analogy method of the device of simulation shelf depreciation according to an embodiment of the invention.
Below in conjunction with drawings and examples, the present invention will be further explained.
Specific embodiment
The specific embodiment that the present invention will be described in more detail below with reference to accompanying drawings.Although being shown in attached drawing of the invention
Specific embodiment, it being understood, however, that may be realized in various forms the present invention without that should be limited by embodiments set forth here
System.It is to be able to thoroughly understand the present invention on the contrary, providing these embodiments, and can be complete by the scope of the present invention
Be communicated to those skilled in the art.
It should be noted that having used some vocabulary in the specification and claims to censure specific components.Ability
Field technique personnel it would be appreciated that, technical staff may call the same component with different nouns.This specification and right
It is required that not in such a way that the difference of noun is as component is distinguished, but with the difference of component functionally as differentiation
Criterion."comprising" or " comprising " as mentioned throughout the specification and claims are an open language, therefore should be solved
It is interpreted into " including but not limited to ".Specification subsequent descriptions are to implement better embodiment of the invention, so the description be with
For the purpose of the rule of specification, the range that is not intended to limit the invention.Protection scope of the present invention is when the appended right of view
It is required that subject to institute's defender.
In order to facilitate understanding of embodiments of the present invention, it is done by taking several specific embodiments as an example below in conjunction with attached drawing further
Explanation, and each attached drawing does not constitute the restriction to the embodiment of the present invention.
The embodiment of the present invention will be specifically described in conjunction with Fig. 1-8.Fig. 1 is the simulation part of one embodiment of the present of invention
The structural schematic diagram of the device of electric discharge, as shown in Figure 1, a kind of device for simulating shelf depreciation includes,
DC power supply 1;
Triggering and electric current pulse width control unit 2 are electrically connected the DC power supply 1, the triggering and electric current pulse-width controlled
Unit 2 includes,
Trigger unit 3 issues trigger signal,
Pulse width control unit 4 issues electric current pulse width signal based on trigger signal;
Field-effect transistor driving unit 5 is electrically connected DC power supply 1 and triggering and electric current pulse width control unit 2, the field
It imitates transistor driving unit 5 and is based on trigger signal and electric current pulse width signal generation pulse signal and make-and-break time;
High-voltage pulse generator 6 is electrically connected DC power supply 1 and field-effect transistor driving unit 5, the high-voltage pulse hair
Raw device 6 generates the transient electromagnetic pulse of predetermined pulse width and preset frequency based on the pulse signal and make-and-break time;
Air bag 8 to be simulated, the electromagnetic probe 7 that sealing accommodates gas to be simulated and surrounded by the gas to be simulated,
In, the air bag 8 to be simulated is detachably connected high-voltage pulse generator 6, electromagnetic probe 7 be electrically connected high-voltage pulse generator 6 with
Generate spark gap.
For a further understanding of the present invention, in one embodiment, the device for simulating shelf depreciation includes triggering and electric current
Pulse width control unit 2, MOSFET driving circuit control unit, high-voltage pulse generator 6, electromagnetic probe 7 and air bag to be simulated more than 8
A part composition.Triggering and electric current pulse width control unit 2 for MOSFET driving circuit provide pulse signal, control leading for MOSFET
Logical and shutdown, and then pulsewidth, frequency are generated on electromagnetic probe 7 as the transient electromagnetic pulse of setting value.Due to using MOSFET
Mode controls current impulse, and rear end the method for voltage signal can be used the high-voltage pulse packet of miniaturization, thus instead of volume compared with
Big pulse transformer, entire calibration equipment realize miniaturization and portability.
In one embodiment, DC power supply 1 uses the lithium battery that can be used with cycle charging, and energy conservation and environmental protection solves simultaneously
It has determined the power issue of field construction operation, has avoided separately connecing power supply at the scene, the selection and cooperation of electronic device use energy-saving square
Formula, so that theoretical stand-by time is up to 16 hours.
In one embodiment, electromagnetic pulse conditioning unit includes triggering and electric current pulse width control unit 2, MOSFET driving
Circuit control unit, high-voltage pulse generator 6, energy production are being set in such a way that MOSFET is drawn and controls charging capacitor
The weight and size that equipment is reduced on meter, are convenient for carrying.Current impulse is controlled using MOSFET mode, rear end is to voltage signal
Method the high-voltage pulse packet of miniaturization can be used, to realize entire calibration equipment instead of the biggish pulse transformer of volume
Miniaturization and portability.
In one embodiment, according to requiring, the input of single pulse signal uses artificial key triggering mode, triggers mode
For standby mode, therefore after the opening of DC power supply 1, working cell is constantly in state to be triggered, triggering compare end+Tr1 and-
Tr1 maintains low level, after trigger unit 3Q2 receives trigger signal, compares end-Tr1 and is in high level, and by failing edge along touching
Hair, CMOS enter working condition, and pulse width control unit 4 starts simultaneously at starting.Switch triggering and electric current pulse width control unit 2 are as schemed
Shown in 2.
In the device preferred embodiment of the simulation shelf depreciation, the DC power supply 1 includes rechargeable lithium battery.
In the device preferred embodiment of the simulation shelf depreciation, the trigger unit 3 includes that end is compared in triggering, described
3 electric connection DC power supply 1 of trigger unit, triggering compare end and keep low level, when trigger unit 3 receives trigger signal, triggering ratio
It is triggered compared with end by low transition at high level and by failing edge edge.
In one embodiment, field-effect transistor driving unit 5 shown in Fig. 3 is controlled by upper level switch triggering unit 3
System, and provide stable incoming level for rear stage MOSFET and control the make-and-break time of MOSFET.
In the device preferred embodiment of the simulation shelf depreciation, field-effect transistor driving unit 5 is aoxidized including metal
Object semiconductor field effect transistor.
In the device preferred embodiment of the simulation shelf depreciation, Metal Oxide Semiconductor Field Effect Transistor N
Type metal oxide semiconductor field effect transistor or P type metal oxide semiconductor field effect transistor.
In the device preferred embodiment of the simulation shelf depreciation, field-effect transistor driving unit 5 is led based on MOSFET
Draw and control charging capacitor and generates transient electromagnetic pulse
In one embodiment, MOSFET output unit output level shown in Fig. 4 is determined by capacitor C6 and resistance R4, defeated
Energy is determined by the charging efficiency that MOSFET make-and-break time and 4-6V DC power supply 1 are capacitor C6 out.It is connect in the switch of DC power supply 1
Under logical state, 4-6V DC power supply 1 is always capacitor C6 charging, which is the waiting turnaround time of tester, about
In 2~5s or so, to guarantee that the steeper rising edge of MOSFET output voltage, the resistance of output loop are set as zero.
In the device preferred embodiment of the simulation shelf depreciation, the high-voltage pulse generator 6 is high-voltage pulse packet.
In the device preferred embodiment of the simulation shelf depreciation, the no-load voltage ratio 2000: 1 of the high-voltage pulse packet, input
Voltage peak is 22V, and high voltage package pair side output voltage peak value is up to 60kV.
In one embodiment, the no-load voltage ratio 2000: 1 of high-voltage pulse packet shown in fig. 5, input voltage peak value are 22V, high pressure
It wraps secondary side output voltage peak value and reaches as high as 60kV, the setting of sharp plate spark gap distance can be according to verified sensor device
Response sensitivity determines that magnetic probe 7 is electrically connected high-voltage pulse generator 6 to generate spark gap as 4mm.
In the device preferred embodiment of the simulation shelf depreciation, electromagnetic probe position-adjustable makes spark gap can
It adjusts.
In one embodiment, the voltage pulse signal such as Fig. 6 institute exported under high-voltage pulse packet no-load condition by MOSFET
Show, which is about 2ns, pulsewidth 22ns.After pulse packet, which is incorporated to, seals in spark gap, flowed through in electric discharge moment
Also as shown, as seen from the figure, which is about 2.5ns, half peak value is about the pulsed current signal in circuit
20ns complies fully with practical pulse current of PD wave character.
Since ground electric wave detection sensor is the response to electromagnetic wave integral energy signal, the electromagnetism of checker output
Wave integrated signal energy demand has consistency, i.e., triggers the electromagnetic signal for all generating identical energy every time.As shown in fig. 7, being
Verifier is certain in strength of discharge, and spark gap is certain, one timing of hookup, when exporting certain frequency discharge pulse, through TEV
The collected TEV pulse train waveform of sensor, as seen from the figure, each discharge pulse amplitude size is certain, illustrates that the present invention has
Preferable consistency, and by repeatedly testing, the repetitive rate of pulse amplitude and energy is almost 100%.
According to another aspect of the present invention, as shown in figure 8, the analogy method of the device of simulation shelf depreciation described in one kind
Include the following steps,
In first step S1, triggering and electric current pulse width control unit 2, field-effect transistor driving unit 5 and high-voltage pulse
Generator 6 is electrically connected DC power supply 1, and 5 one end of field-effect transistor driving unit is electrically connected field-effect transistor driving unit 5,
The other end is electrically connected high-voltage pulse generator 6, and electromagnetic wave transmission unit 8 connects the high-voltage pulse via electromagnetic probe 7 and occurs
Device 6;
In second step S2, trigger unit 3 issues trigger signal, and pulse width control unit 4 is based on trigger signal and issues electricity
Pulse width signal is flowed,
In third step S3, field-effect transistor driving unit 5 is based on trigger signal and electric current pulse width signal generates pulse
Signal and make-and-break time;
In the fourth step s 4, the high-voltage pulse generator 6 is based on the pulse signal and make-and-break time generates and makes a reservation for
The transient electromagnetic pulse of pulsewidth and preset frequency,
In the 5th step S5, electromagnetic probe 7 is based on transient electromagnetic pulse and is generating spark gap in gas wait simulate.
Although embodiment of the present invention is described in conjunction with attached drawing above, the invention is not limited to above-mentioned
Specific embodiments and applications field, above-mentioned specific embodiment are only schematical, directiveness, rather than restricted
's.Those skilled in the art are under the enlightenment of this specification and in the range for not departing from the claims in the present invention and being protected
In the case where, a variety of forms can also be made, these belong to the column of protection of the invention.
Claims (10)
1. a kind of device for simulating shelf depreciation comprising,
DC power supply;
Triggering and electric current pulse width control unit are electrically connected the DC power supply, the triggering and electric current pulse width control unit packet
It includes,
Trigger unit issues trigger signal, and
Pulse width control unit issues electric current pulse width signal based on trigger signal;
Field-effect transistor driving unit, is electrically connected DC power supply and triggering and electric current pulse width control unit, and crystal is imitated in the field
Pipe driving unit is based on trigger signal and electric current pulse width signal generates pulse signal and make-and-break time;
High-voltage pulse generator is electrically connected DC power supply and field-effect transistor driving unit, the high-voltage pulse generator base
The transient electromagnetic pulse of predetermined pulse width and preset frequency is generated in the pulse signal and make-and-break time;
Air bag to be simulated, the electromagnetic probe that sealing accommodates gas to be simulated and surrounded by the gas to be simulated, wherein described
Air bag to be simulated is detachably connected high-voltage pulse generator, and electromagnetic probe is electrically connected high-voltage pulse generator to generate between spark
Gap.
2. the device of simulation shelf depreciation according to claim 1, wherein preferred, field-effect transistor driving unit packet
Include Metal Oxide Semiconductor Field Effect Transistor.
3. the device of simulation shelf depreciation according to claim 2, wherein Metal Oxide Semiconductor Field Effect Transistor
For N-type Metal Oxide Semiconductor Field Effect Transistor or P type metal oxide semiconductor field effect transistor.
4. the device of simulation shelf depreciation according to claim 1, wherein the DC power supply includes chargeable lithium electricity
Pond.
5. the device of simulation shelf depreciation according to claim 1, wherein the trigger unit includes that end is compared in triggering,
The trigger unit electric connection DC power supply, triggering compare end and keep low level, when trigger unit receives trigger signal, triggering ratio
It is triggered compared with end by low transition at high level and by failing edge edge.
6. the device of simulation shelf depreciation according to claim 1, wherein field-effect transistor driving unit is based on MOSFET
Traction and control charging capacitor generate transient electromagnetic pulse.
7. the device of simulation shelf depreciation according to claim 1, wherein the high-voltage pulse generator is high-voltage pulse
Packet.
8. the device of simulation shelf depreciation according to claim 7, wherein the no-load voltage ratio 2000: 1 of the high-voltage pulse packet,
Input voltage peak value is 22V, and high voltage package pair side output voltage peak value is up to 60kV.
9. the device of simulation shelf depreciation according to claim 1, wherein electromagnetic probe position-adjustable makes between spark
Gap is adjustable.
10. a kind of analogy method of the device of simulation shelf depreciation of any of claims 1-9 comprising following step
Suddenly,
In first step (S1), triggering and electric current pulse width control unit, field-effect transistor driving unit and high-voltage pulse occur
Device is electrically connected DC power supply, and field-effect transistor driving unit one end is electrically connected field-effect transistor driving unit, other end electricity
High-voltage pulse generator is connected, electromagnetic wave transmission unit connects the high-voltage pulse generator via electromagnetic probe;
In second step (S2), trigger unit issues trigger signal, and pulse width control unit is based on trigger signal and issues electric current arteries and veins
Bandwidth signals;
In third step (S3), field-effect transistor driving unit is based on trigger signal and electric current pulse width signal generates pulse signal
And make-and-break time;
In four steps (S4), the high-voltage pulse generator is based on the pulse signal and make-and-break time generates predetermined pulse width
With the transient electromagnetic pulse of preset frequency;
In the 5th step (S5), electromagnetic probe is based on transient electromagnetic pulse and is generating spark gap in gas wait simulate.
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112904168A (en) * | 2021-01-13 | 2021-06-04 | 深圳市灿升实业发展有限公司 | Semiconductor breakdown voltage detection device |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN202770954U (en) * | 2012-08-20 | 2013-03-06 | 广东电网公司电力科学研究院 | Test model for simulating point discharge |
JP2013142672A (en) * | 2012-01-12 | 2013-07-22 | Mitsubishi Cable Ind Ltd | Partial discharge measuring device |
CN103698678A (en) * | 2013-12-13 | 2014-04-02 | 上海交通大学 | Parallel connection method and parallel connection device for multiple local discharge signals |
CN203965489U (en) * | 2014-06-17 | 2014-11-26 | 三泰电力技术(南京)股份有限公司 | A kind of shelf depreciation high voltage pulse generation device |
CN204028342U (en) * | 2014-08-02 | 2014-12-17 | 贵州电力试验研究院 | A kind of calibration equipment of the Partial discharge detector based on electromagnetic signal |
CN206804801U (en) * | 2017-04-19 | 2017-12-26 | 湖北西塞山发电有限公司 | A kind of detecting system of accurate measurement inside switch cabinet shelf depreciation |
-
2018
- 2018-11-23 CN CN201811412641.2A patent/CN109669107A/en active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013142672A (en) * | 2012-01-12 | 2013-07-22 | Mitsubishi Cable Ind Ltd | Partial discharge measuring device |
CN202770954U (en) * | 2012-08-20 | 2013-03-06 | 广东电网公司电力科学研究院 | Test model for simulating point discharge |
CN103698678A (en) * | 2013-12-13 | 2014-04-02 | 上海交通大学 | Parallel connection method and parallel connection device for multiple local discharge signals |
CN203965489U (en) * | 2014-06-17 | 2014-11-26 | 三泰电力技术(南京)股份有限公司 | A kind of shelf depreciation high voltage pulse generation device |
CN204028342U (en) * | 2014-08-02 | 2014-12-17 | 贵州电力试验研究院 | A kind of calibration equipment of the Partial discharge detector based on electromagnetic signal |
CN206804801U (en) * | 2017-04-19 | 2017-12-26 | 湖北西塞山发电有限公司 | A kind of detecting system of accurate measurement inside switch cabinet shelf depreciation |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112904168A (en) * | 2021-01-13 | 2021-06-04 | 深圳市灿升实业发展有限公司 | Semiconductor breakdown voltage detection device |
CN112904168B (en) * | 2021-01-13 | 2021-10-29 | 深圳市灿升实业发展有限公司 | Semiconductor breakdown voltage detection device |
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