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CN109669107A - Simulate the device and its analogy method of shelf depreciation - Google Patents

Simulate the device and its analogy method of shelf depreciation Download PDF

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Publication number
CN109669107A
CN109669107A CN201811412641.2A CN201811412641A CN109669107A CN 109669107 A CN109669107 A CN 109669107A CN 201811412641 A CN201811412641 A CN 201811412641A CN 109669107 A CN109669107 A CN 109669107A
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CN
China
Prior art keywords
effect transistor
pulse width
signal
shelf depreciation
electric current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201811412641.2A
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Chinese (zh)
Inventor
田晓云
岳永刚
霍峰
王亚平
范永强
艾博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inner Mongolia Ehv Power Supply Bureau Inner Mongolia Power Group Co ltd
Original Assignee
Inner Mongolia Ehv Power Supply Bureau Inner Mongolia Power Group Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Inner Mongolia Ehv Power Supply Bureau Inner Mongolia Power Group Co ltd filed Critical Inner Mongolia Ehv Power Supply Bureau Inner Mongolia Power Group Co ltd
Priority to CN201811412641.2A priority Critical patent/CN109669107A/en
Publication of CN109669107A publication Critical patent/CN109669107A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/20Preparation of articles or specimens to facilitate testing

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Generation Of Surge Voltage And Current (AREA)

Abstract

Disclose a kind of device and its analogy method for simulating shelf depreciation, emitter includes DC power supply, triggering and electric current pulse width control unit, field-effect transistor driving unit, high-voltage pulse generator, electromagnetic probe and air bag to be simulated, the triggering and electric current pulse width control unit include the pulse width control unit for issuing the trigger unit of trigger signal and issuing electric current pulse width signal based on trigger signal, and the field-effect transistor driving unit is based on trigger signal and electric current pulse width signal generates pulse signal and make-and-break time;The high-voltage pulse generator generates the transient electromagnetic pulse of predetermined pulse width and preset frequency based on the pulse signal and make-and-break time;The electromagnetic probe that air sac sealing to be simulated accommodates gas to be simulated and surrounded by the gas to be simulated, wherein the air bag to be simulated is detachably connected high-voltage pulse generator, and electromagnetic probe is electrically connected high-voltage pulse generator to generate spark gap.

Description

Simulate the device and its analogy method of shelf depreciation
Technical field
The present invention relates to shelf depreciation technical field, especially a kind of device and its analogy method for simulating shelf depreciation.
Background technique
It is in high-voltage isulation that shelf depreciation occurs under the action of strong electrical field for certain weak parts in Electric Power Equipment Insulation Common problem.Although shelf depreciation will not generally cause the penetrability breakdown of insulation, dielectric can be caused (especially Organic dielectric) local damage.If shelf depreciation long-term existence, it will lead to insulation degradation under certain condition or even hit It wears.Therefore, carrying out shelf depreciation test to power equipment is power equipment manufacture and a running important preventive trial.
Such as: switchgear is widely used in power grid, and shelf depreciation is one of main forms of its insulation defect, office Put the effective means that detection is also apparatus insulated situation in assessment switchgear.Partial Discharge Detection equipment tool based on TEV principle There is communication process decaying smaller, can be realized good detection sensitivity;It can decaying according to electromagnetic pulse signal and the time difference pair The Partial Discharge Sources of switchgear are positioned;The advantages that partial discharge of switchgear type can be analyzed, puts in the part of switchgear It is had been widely used in electro-detection.
However, finding in practice, the gas with various insulation of equipment can have the signal of surveyed shelf depreciation larger Influence, using pure gas atmosphere can not shelf depreciation in the various gases of accurate simulation, therefore develop a kind of portable quasi- The device and its analogy method of shelf depreciation shorten the week of equipment breakdown discovery defect elimination for improving switchgear scene inspection quality There is significant practical significance in phase.
Disclosed above- mentioned information are used only for enhancing the understanding to background of the present invention in the background section, it is thus possible to Information comprising not constituting the prior art known to a person of ordinary skill in the art in home.
Summary of the invention
In view of the above problems, the present invention implements to provide a kind of device and its analogy method for simulating shelf depreciation, energy Enough triggerings every time all generate the electromagnetic signal of identical energy, can output pulse width be ns grades electromagnetic pulse signal for ground electric wave Sensor receives, and complying fully with shelf depreciation in practice is duration very short transient process, the consistency of output signal or Repeatability and be capable of providing quantization calibration result simulation solid foundation be provided, the present invention it is portable, repeated it is strong, available on site Transient state low-voltage shelf depreciation.
The purpose of the present invention is be achieved by the following technical programs.
An aspect of of the present present invention, it is a kind of simulate shelf depreciation device include,
DC power supply;
Triggering and electric current pulse width control unit are electrically connected the DC power supply, the triggering and electric current pulse-width controlled list Member includes,
Trigger unit issues trigger signal, and
Pulse width control unit issues electric current pulse width signal based on trigger signal;
Field-effect transistor driving unit is electrically connected DC power supply and triggering and electric current pulse width control unit, the field effect Transistor driving unit is based on trigger signal and electric current pulse width signal generates pulse signal and make-and-break time;
High-voltage pulse generator, is electrically connected DC power supply and field-effect transistor driving unit, and the high-voltage pulse occurs Device generates the transient electromagnetic pulse of predetermined pulse width and preset frequency based on the pulse signal and make-and-break time;
Air bag to be simulated, the electromagnetic probe that sealing accommodates gas to be simulated and surrounded by the gas to be simulated, wherein The air bag to be simulated is detachably connected high-voltage pulse generator, and electromagnetic probe is electrically connected high-voltage pulse generator to generate spark Gap.
In the device of the simulation shelf depreciation, field-effect transistor driving unit includes metal oxide semiconductcor field effect Answer transistor.
In the device of the simulation shelf depreciation, Metal Oxide Semiconductor Field Effect Transistor is the oxidation of N-type metal Object semiconductor field effect transistor or P type metal oxide semiconductor field effect transistor
In the device of the simulation shelf depreciation, the DC power supply includes rechargeable lithium battery.
In the device of the simulation shelf depreciation, the trigger unit includes that end, the trigger unit electricity are compared in triggering It is connected to DC power supply, triggering compares end and keeps low level, and when trigger unit receives trigger signal, triggering is compared end and turned by low level Change high level into and by failing edge along triggering.
In the device of the simulation shelf depreciation, field-effect transistor driving unit is based on MOSFET and draws and control charging Capacitor generates transient electromagnetic pulse.
In the device of the simulation shelf depreciation, the high-voltage pulse generator is high-voltage pulse packet.
In the device of the simulation shelf depreciation, the no-load voltage ratio 2000: 1 of the high-voltage pulse packet, input voltage peak value is 22V, high voltage package pair side output voltage peak value are up to 60kV.
In the device of the simulation shelf depreciation, electromagnetic probe position-adjustable makes spark gap adjustable.
According to another aspect of the present invention, a kind of analogy method of the device of the simulation shelf depreciation includes following step Suddenly,
In the first step, triggering and electric current pulse width control unit, field-effect transistor driving unit and high-voltage pulse occur Device is electrically connected DC power supply, and field-effect transistor driving unit one end is electrically connected field-effect transistor driving unit, other end electricity High-voltage pulse generator is connected, electromagnetic wave transmission unit connects the high-voltage pulse generator via electromagnetic probe;
In the second step, trigger unit issues trigger signal, and pulse width control unit is based on trigger signal and issues electric current arteries and veins Bandwidth signals;
In third step, field-effect transistor driving unit is based on trigger signal and electric current pulse width signal generates pulse signal And make-and-break time;
In four steps, the high-voltage pulse generator is based on the pulse signal and make-and-break time generates predetermined pulse width With the transient electromagnetic pulse of preset frequency;
In the 5th step, electromagnetic probe is based on transient electromagnetic pulse and is generating spark gap in gas wait simulate.
The above description is only an overview of the technical scheme of the present invention, in order to make technological means of the invention clearer Understand, reach the degree that those skilled in the art can be implemented in accordance with the contents of the specification, and in order to allow the present invention Above and other objects, features and advantages can be more clearly understood, illustrated below with a specific embodiment of the invention Explanation.
Detailed description of the invention
By reading the detailed description in hereafter preferred embodiment, various other advantages and benefits of the present invention It will become apparent to those of ordinary skill in the art.Figure of description only for the purpose of illustrating preferred embodiments, And it is not to be construed as limiting the invention.It should be evident that drawings discussed below is only some embodiments of the present invention, For those of ordinary skill in the art, without creative efforts, it can also be obtained according to these attached drawings Other attached drawings.And throughout the drawings, identical component is presented with like reference characters.
In the accompanying drawings:
Fig. 1 is the structural schematic diagram of the device of simulation shelf depreciation according to an embodiment of the invention;
Fig. 2 is the triggering and electric current pulse width control unit of the device of simulation shelf depreciation according to an embodiment of the invention Schematic circuit;
Fig. 3 is showing for the field-effect transistor driving unit of the device of simulation shelf depreciation according to an embodiment of the invention Meaning property circuit diagram;
Fig. 4 is showing for the field-effect transistor driving unit of the device of simulation shelf depreciation according to an embodiment of the invention Meaning property circuit diagram;
Fig. 5 is that the high-voltage pulse generator of the device of simulation shelf depreciation according to an embodiment of the invention shows It is intended to;
Fig. 6 is the output voltage pulse signal waveform of the device of simulation shelf depreciation according to an embodiment of the invention Figure;
Fig. 7 is the consistency detection waveform diagram of the device of simulation shelf depreciation according to an embodiment of the invention;
Fig. 8 is the step schematic diagram of the analogy method of the device of simulation shelf depreciation according to an embodiment of the invention.
Below in conjunction with drawings and examples, the present invention will be further explained.
Specific embodiment
The specific embodiment that the present invention will be described in more detail below with reference to accompanying drawings.Although being shown in attached drawing of the invention Specific embodiment, it being understood, however, that may be realized in various forms the present invention without that should be limited by embodiments set forth here System.It is to be able to thoroughly understand the present invention on the contrary, providing these embodiments, and can be complete by the scope of the present invention Be communicated to those skilled in the art.
It should be noted that having used some vocabulary in the specification and claims to censure specific components.Ability Field technique personnel it would be appreciated that, technical staff may call the same component with different nouns.This specification and right It is required that not in such a way that the difference of noun is as component is distinguished, but with the difference of component functionally as differentiation Criterion."comprising" or " comprising " as mentioned throughout the specification and claims are an open language, therefore should be solved It is interpreted into " including but not limited to ".Specification subsequent descriptions are to implement better embodiment of the invention, so the description be with For the purpose of the rule of specification, the range that is not intended to limit the invention.Protection scope of the present invention is when the appended right of view It is required that subject to institute's defender.
In order to facilitate understanding of embodiments of the present invention, it is done by taking several specific embodiments as an example below in conjunction with attached drawing further Explanation, and each attached drawing does not constitute the restriction to the embodiment of the present invention.
The embodiment of the present invention will be specifically described in conjunction with Fig. 1-8.Fig. 1 is the simulation part of one embodiment of the present of invention The structural schematic diagram of the device of electric discharge, as shown in Figure 1, a kind of device for simulating shelf depreciation includes,
DC power supply 1;
Triggering and electric current pulse width control unit 2 are electrically connected the DC power supply 1, the triggering and electric current pulse-width controlled Unit 2 includes,
Trigger unit 3 issues trigger signal,
Pulse width control unit 4 issues electric current pulse width signal based on trigger signal;
Field-effect transistor driving unit 5 is electrically connected DC power supply 1 and triggering and electric current pulse width control unit 2, the field It imitates transistor driving unit 5 and is based on trigger signal and electric current pulse width signal generation pulse signal and make-and-break time;
High-voltage pulse generator 6 is electrically connected DC power supply 1 and field-effect transistor driving unit 5, the high-voltage pulse hair Raw device 6 generates the transient electromagnetic pulse of predetermined pulse width and preset frequency based on the pulse signal and make-and-break time;
Air bag 8 to be simulated, the electromagnetic probe 7 that sealing accommodates gas to be simulated and surrounded by the gas to be simulated, In, the air bag 8 to be simulated is detachably connected high-voltage pulse generator 6, electromagnetic probe 7 be electrically connected high-voltage pulse generator 6 with Generate spark gap.
For a further understanding of the present invention, in one embodiment, the device for simulating shelf depreciation includes triggering and electric current Pulse width control unit 2, MOSFET driving circuit control unit, high-voltage pulse generator 6, electromagnetic probe 7 and air bag to be simulated more than 8 A part composition.Triggering and electric current pulse width control unit 2 for MOSFET driving circuit provide pulse signal, control leading for MOSFET Logical and shutdown, and then pulsewidth, frequency are generated on electromagnetic probe 7 as the transient electromagnetic pulse of setting value.Due to using MOSFET Mode controls current impulse, and rear end the method for voltage signal can be used the high-voltage pulse packet of miniaturization, thus instead of volume compared with Big pulse transformer, entire calibration equipment realize miniaturization and portability.
In one embodiment, DC power supply 1 uses the lithium battery that can be used with cycle charging, and energy conservation and environmental protection solves simultaneously It has determined the power issue of field construction operation, has avoided separately connecing power supply at the scene, the selection and cooperation of electronic device use energy-saving square Formula, so that theoretical stand-by time is up to 16 hours.
In one embodiment, electromagnetic pulse conditioning unit includes triggering and electric current pulse width control unit 2, MOSFET driving Circuit control unit, high-voltage pulse generator 6, energy production are being set in such a way that MOSFET is drawn and controls charging capacitor The weight and size that equipment is reduced on meter, are convenient for carrying.Current impulse is controlled using MOSFET mode, rear end is to voltage signal Method the high-voltage pulse packet of miniaturization can be used, to realize entire calibration equipment instead of the biggish pulse transformer of volume Miniaturization and portability.
In one embodiment, according to requiring, the input of single pulse signal uses artificial key triggering mode, triggers mode For standby mode, therefore after the opening of DC power supply 1, working cell is constantly in state to be triggered, triggering compare end+Tr1 and- Tr1 maintains low level, after trigger unit 3Q2 receives trigger signal, compares end-Tr1 and is in high level, and by failing edge along touching Hair, CMOS enter working condition, and pulse width control unit 4 starts simultaneously at starting.Switch triggering and electric current pulse width control unit 2 are as schemed Shown in 2.
In the device preferred embodiment of the simulation shelf depreciation, the DC power supply 1 includes rechargeable lithium battery.
In the device preferred embodiment of the simulation shelf depreciation, the trigger unit 3 includes that end is compared in triggering, described 3 electric connection DC power supply 1 of trigger unit, triggering compare end and keep low level, when trigger unit 3 receives trigger signal, triggering ratio It is triggered compared with end by low transition at high level and by failing edge edge.
In one embodiment, field-effect transistor driving unit 5 shown in Fig. 3 is controlled by upper level switch triggering unit 3 System, and provide stable incoming level for rear stage MOSFET and control the make-and-break time of MOSFET.
In the device preferred embodiment of the simulation shelf depreciation, field-effect transistor driving unit 5 is aoxidized including metal Object semiconductor field effect transistor.
In the device preferred embodiment of the simulation shelf depreciation, Metal Oxide Semiconductor Field Effect Transistor N Type metal oxide semiconductor field effect transistor or P type metal oxide semiconductor field effect transistor.
In the device preferred embodiment of the simulation shelf depreciation, field-effect transistor driving unit 5 is led based on MOSFET Draw and control charging capacitor and generates transient electromagnetic pulse
In one embodiment, MOSFET output unit output level shown in Fig. 4 is determined by capacitor C6 and resistance R4, defeated Energy is determined by the charging efficiency that MOSFET make-and-break time and 4-6V DC power supply 1 are capacitor C6 out.It is connect in the switch of DC power supply 1 Under logical state, 4-6V DC power supply 1 is always capacitor C6 charging, which is the waiting turnaround time of tester, about In 2~5s or so, to guarantee that the steeper rising edge of MOSFET output voltage, the resistance of output loop are set as zero.
In the device preferred embodiment of the simulation shelf depreciation, the high-voltage pulse generator 6 is high-voltage pulse packet.
In the device preferred embodiment of the simulation shelf depreciation, the no-load voltage ratio 2000: 1 of the high-voltage pulse packet, input Voltage peak is 22V, and high voltage package pair side output voltage peak value is up to 60kV.
In one embodiment, the no-load voltage ratio 2000: 1 of high-voltage pulse packet shown in fig. 5, input voltage peak value are 22V, high pressure It wraps secondary side output voltage peak value and reaches as high as 60kV, the setting of sharp plate spark gap distance can be according to verified sensor device Response sensitivity determines that magnetic probe 7 is electrically connected high-voltage pulse generator 6 to generate spark gap as 4mm.
In the device preferred embodiment of the simulation shelf depreciation, electromagnetic probe position-adjustable makes spark gap can It adjusts.
In one embodiment, the voltage pulse signal such as Fig. 6 institute exported under high-voltage pulse packet no-load condition by MOSFET Show, which is about 2ns, pulsewidth 22ns.After pulse packet, which is incorporated to, seals in spark gap, flowed through in electric discharge moment Also as shown, as seen from the figure, which is about 2.5ns, half peak value is about the pulsed current signal in circuit 20ns complies fully with practical pulse current of PD wave character.
Since ground electric wave detection sensor is the response to electromagnetic wave integral energy signal, the electromagnetism of checker output Wave integrated signal energy demand has consistency, i.e., triggers the electromagnetic signal for all generating identical energy every time.As shown in fig. 7, being Verifier is certain in strength of discharge, and spark gap is certain, one timing of hookup, when exporting certain frequency discharge pulse, through TEV The collected TEV pulse train waveform of sensor, as seen from the figure, each discharge pulse amplitude size is certain, illustrates that the present invention has Preferable consistency, and by repeatedly testing, the repetitive rate of pulse amplitude and energy is almost 100%.
According to another aspect of the present invention, as shown in figure 8, the analogy method of the device of simulation shelf depreciation described in one kind Include the following steps,
In first step S1, triggering and electric current pulse width control unit 2, field-effect transistor driving unit 5 and high-voltage pulse Generator 6 is electrically connected DC power supply 1, and 5 one end of field-effect transistor driving unit is electrically connected field-effect transistor driving unit 5, The other end is electrically connected high-voltage pulse generator 6, and electromagnetic wave transmission unit 8 connects the high-voltage pulse via electromagnetic probe 7 and occurs Device 6;
In second step S2, trigger unit 3 issues trigger signal, and pulse width control unit 4 is based on trigger signal and issues electricity Pulse width signal is flowed,
In third step S3, field-effect transistor driving unit 5 is based on trigger signal and electric current pulse width signal generates pulse Signal and make-and-break time;
In the fourth step s 4, the high-voltage pulse generator 6 is based on the pulse signal and make-and-break time generates and makes a reservation for The transient electromagnetic pulse of pulsewidth and preset frequency,
In the 5th step S5, electromagnetic probe 7 is based on transient electromagnetic pulse and is generating spark gap in gas wait simulate.
Although embodiment of the present invention is described in conjunction with attached drawing above, the invention is not limited to above-mentioned Specific embodiments and applications field, above-mentioned specific embodiment are only schematical, directiveness, rather than restricted 's.Those skilled in the art are under the enlightenment of this specification and in the range for not departing from the claims in the present invention and being protected In the case where, a variety of forms can also be made, these belong to the column of protection of the invention.

Claims (10)

1. a kind of device for simulating shelf depreciation comprising,
DC power supply;
Triggering and electric current pulse width control unit are electrically connected the DC power supply, the triggering and electric current pulse width control unit packet It includes,
Trigger unit issues trigger signal, and
Pulse width control unit issues electric current pulse width signal based on trigger signal;
Field-effect transistor driving unit, is electrically connected DC power supply and triggering and electric current pulse width control unit, and crystal is imitated in the field Pipe driving unit is based on trigger signal and electric current pulse width signal generates pulse signal and make-and-break time;
High-voltage pulse generator is electrically connected DC power supply and field-effect transistor driving unit, the high-voltage pulse generator base The transient electromagnetic pulse of predetermined pulse width and preset frequency is generated in the pulse signal and make-and-break time;
Air bag to be simulated, the electromagnetic probe that sealing accommodates gas to be simulated and surrounded by the gas to be simulated, wherein described Air bag to be simulated is detachably connected high-voltage pulse generator, and electromagnetic probe is electrically connected high-voltage pulse generator to generate between spark Gap.
2. the device of simulation shelf depreciation according to claim 1, wherein preferred, field-effect transistor driving unit packet Include Metal Oxide Semiconductor Field Effect Transistor.
3. the device of simulation shelf depreciation according to claim 2, wherein Metal Oxide Semiconductor Field Effect Transistor For N-type Metal Oxide Semiconductor Field Effect Transistor or P type metal oxide semiconductor field effect transistor.
4. the device of simulation shelf depreciation according to claim 1, wherein the DC power supply includes chargeable lithium electricity Pond.
5. the device of simulation shelf depreciation according to claim 1, wherein the trigger unit includes that end is compared in triggering, The trigger unit electric connection DC power supply, triggering compare end and keep low level, when trigger unit receives trigger signal, triggering ratio It is triggered compared with end by low transition at high level and by failing edge edge.
6. the device of simulation shelf depreciation according to claim 1, wherein field-effect transistor driving unit is based on MOSFET Traction and control charging capacitor generate transient electromagnetic pulse.
7. the device of simulation shelf depreciation according to claim 1, wherein the high-voltage pulse generator is high-voltage pulse Packet.
8. the device of simulation shelf depreciation according to claim 7, wherein the no-load voltage ratio 2000: 1 of the high-voltage pulse packet, Input voltage peak value is 22V, and high voltage package pair side output voltage peak value is up to 60kV.
9. the device of simulation shelf depreciation according to claim 1, wherein electromagnetic probe position-adjustable makes between spark Gap is adjustable.
10. a kind of analogy method of the device of simulation shelf depreciation of any of claims 1-9 comprising following step Suddenly,
In first step (S1), triggering and electric current pulse width control unit, field-effect transistor driving unit and high-voltage pulse occur Device is electrically connected DC power supply, and field-effect transistor driving unit one end is electrically connected field-effect transistor driving unit, other end electricity High-voltage pulse generator is connected, electromagnetic wave transmission unit connects the high-voltage pulse generator via electromagnetic probe;
In second step (S2), trigger unit issues trigger signal, and pulse width control unit is based on trigger signal and issues electric current arteries and veins Bandwidth signals;
In third step (S3), field-effect transistor driving unit is based on trigger signal and electric current pulse width signal generates pulse signal And make-and-break time;
In four steps (S4), the high-voltage pulse generator is based on the pulse signal and make-and-break time generates predetermined pulse width With the transient electromagnetic pulse of preset frequency;
In the 5th step (S5), electromagnetic probe is based on transient electromagnetic pulse and is generating spark gap in gas wait simulate.
CN201811412641.2A 2018-11-23 2018-11-23 Simulate the device and its analogy method of shelf depreciation Pending CN109669107A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112904168A (en) * 2021-01-13 2021-06-04 深圳市灿升实业发展有限公司 Semiconductor breakdown voltage detection device

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JP2013142672A (en) * 2012-01-12 2013-07-22 Mitsubishi Cable Ind Ltd Partial discharge measuring device
CN103698678A (en) * 2013-12-13 2014-04-02 上海交通大学 Parallel connection method and parallel connection device for multiple local discharge signals
CN203965489U (en) * 2014-06-17 2014-11-26 三泰电力技术(南京)股份有限公司 A kind of shelf depreciation high voltage pulse generation device
CN204028342U (en) * 2014-08-02 2014-12-17 贵州电力试验研究院 A kind of calibration equipment of the Partial discharge detector based on electromagnetic signal
CN206804801U (en) * 2017-04-19 2017-12-26 湖北西塞山发电有限公司 A kind of detecting system of accurate measurement inside switch cabinet shelf depreciation

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Publication number Priority date Publication date Assignee Title
JP2013142672A (en) * 2012-01-12 2013-07-22 Mitsubishi Cable Ind Ltd Partial discharge measuring device
CN202770954U (en) * 2012-08-20 2013-03-06 广东电网公司电力科学研究院 Test model for simulating point discharge
CN103698678A (en) * 2013-12-13 2014-04-02 上海交通大学 Parallel connection method and parallel connection device for multiple local discharge signals
CN203965489U (en) * 2014-06-17 2014-11-26 三泰电力技术(南京)股份有限公司 A kind of shelf depreciation high voltage pulse generation device
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CN206804801U (en) * 2017-04-19 2017-12-26 湖北西塞山发电有限公司 A kind of detecting system of accurate measurement inside switch cabinet shelf depreciation

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112904168A (en) * 2021-01-13 2021-06-04 深圳市灿升实业发展有限公司 Semiconductor breakdown voltage detection device
CN112904168B (en) * 2021-01-13 2021-10-29 深圳市灿升实业发展有限公司 Semiconductor breakdown voltage detection device

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