CN109061238B - Flip type vertical compression joint POGO conduction device - Google Patents
Flip type vertical compression joint POGO conduction device Download PDFInfo
- Publication number
- CN109061238B CN109061238B CN201810906358.9A CN201810906358A CN109061238B CN 109061238 B CN109061238 B CN 109061238B CN 201810906358 A CN201810906358 A CN 201810906358A CN 109061238 B CN109061238 B CN 109061238B
- Authority
- CN
- China
- Prior art keywords
- flip
- lower base
- tested
- pogo
- head
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2464—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the contact point
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/46—Bases; Cases
- H01R13/502—Bases; Cases composed of different pieces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The utility model discloses a flip type vertical compression joint POGO conducting device which comprises an upper flip, a lower base and a middle floating plate, wherein the upper flip is hinged to the upper end of the middle floating plate, the middle floating plate is arranged at the upper end of the lower base in parallel, a floating tool is arranged between the middle floating plate and the lower base, a needle die is arranged on the upper flip, a compression joint elastic sheet is of a flat plate structure and comprises a panel switching part to be tested, an FPC switching part and a bending part, the bending part consists of at least two parallel metal conduction bands which are arranged at intervals, each metal conduction band is made of a material which can conduct electricity and can elastically deform, and the width of a probe head is not more than 4 and not more than the width of the probe head. The utility model has simple structure and convenient use, is convenient for placing the display panel to be tested, and effectively ensures the vertical compression joint of the needle mould on the flip cover of the POGO conduction device and the connector of the display panel to be tested and the conduction performance of the needle mould.
Description
Technical Field
The utility model relates to a POGO conduction device, belongs to the technical field of display panel test conduction parts, and particularly relates to a flip-type vertical compression joint POGO conduction device.
Background
Along with the continuous progress of technology, display panels are rapidly developed in the society of today, and are widely used in the fields of mobile phones, computers, and the like. In order to ensure the service life of mobile phones and computer screens, a series of performance index tests are required to be carried out on the display panel, the test method is to install the display panel in a test fixture, conduct the display panel by using the POGO conduction device to complete the performance test, and the liquid crystal product can be determined to be qualified after the display panel meets various test indexes.
In the prior art, the POGO conducting device is mainly divided into two main types, one is a flip-type POGO conducting device (shown as a Chinese patent CN 204203580U) and the other is a vertical compression joint type POGO conducting device (shown as a Chinese patent CN 207517340U); the flip-type POGO conducting device is convenient for placing the display panel to be tested, and can not ensure the vertical compression joint of the needle mould on the flip-type POGO conducting device and the connector of the display panel to be tested; the vertical crimping type POGO conducting device can ensure the vertical crimping of the pin die on the flip cover and the display panel connector to be tested, but is inconvenient for placing the display panel to be tested.
In order to solve the problems of the POGO conduction device in the prior art, chinese patent No. CN203941360U discloses a detection end device used on a liquid crystal module detector, which comprises a fixed substrate, a floating pressure plate and a turnover assembly; the turnover assembly is arranged on the surface of the fixed substrate in a turnover way and comprises a circuit substrate, a front fixed plate is arranged on the front side surface of the circuit substrate, and a rear fixed plate is arranged on the rear side surface of the circuit substrate; the board body of the front fixing board is provided with a connector for connecting with the module connector to be tested; the board surface of the fixed base plate is provided with a vertical guide column and a profile groove for placing a module connector to be tested, the vertical guide column is sleeved with a floating compression joint plate, and a pressure spring is arranged between the plate body of the floating compression joint plate and the plate body of the fixed base plate. The utility model integrates the advantages of 2 POGO conducting devices in the prior art, realizes that the connector on the turnover assembly can be pressed downwards along the vertical direction to be in butt joint and conduction with the module connector to be tested, improves the alignment and positioning precision, reduces the damage rate of the module connector to be tested, and prolongs the service life of the connector on the detection end device.
However, the pin die in the patent adopts a spring thimble connector, and the spring thimble connector is formed by riveting three basic components of a pin shaft, a spring and a needle tube through a precise instrument.
In order to further solve the technical problem of the spring thimble connector, chinese patent No. CN206515372U discloses a flat probe for testing an integrated circuit, which includes an upper contact end, a bending section and a lower contact end, wherein the bending section is provided with a spring portion for providing elastic deformation and a relay portion for conducting; the upper end of the relay part is integrally formed with the upper contact end, and the lower end of the relay part is fixedly contacted with the side edge of the lower contact end. The service life of the utility model can reach more than 5 times of that of a conventional probe, and the conduction performance is better than that of a common probe, but the whole width of the bending section of the utility model is basically equal to the width of the probe head, and only one relay part conducts electricity, so that the area of the relay part used for conducting electricity is small, thereby causing the technical problems of high probe impedance and poor conduction performance; and secondly, the bending section comprises a spring part and a relay part, so that the bending section is inconvenient to process and manufacture.
In chinese utility model patents CN107850623a and CN107850624a, a probe structure is disclosed, the probe having: an elastic part; a 1 st contact portion having a pair of leg portions extending from one end of the elastic portion in a longitudinal direction and being deflectable in a direction approaching each other, and a pair of contact portions arranged at front ends of the pair of leg portions, being biased in the longitudinal direction by the elastic portion via the pair of leg portions, and being contactable with the concave contact of the inspection object; and a 2 nd contact portion disposed at the other end of the elastic portion and electrically connected to the 1 st contact portion. With a gap between the pair of feet. Although the pair of contact points of the leg portion and the concave contact point can be stably connected with each other in a low level by using the utility model, the width of the bending part of the elastic part is not limited, so that the bending part for conducting electricity can have the technical problems of large probe impedance and poor conductivity due to small area.
In summary, how to effectively ensure the vertical compression connection between the pin die on the flip cover of the POGO conducting device and the connector of the display panel to be tested and the conducting performance of the pin die on the premise of being convenient for placing the display panel to be tested is the technical problem to be solved by the utility model.
Disclosure of Invention
Aiming at the defects in the prior art, the technical problem to be solved by the utility model is to provide the flip type vertical compression joint POGO conduction device, which is convenient for placing the display panel to be tested and effectively ensures the vertical compression joint and the conduction performance of the needle mould on the flip of the POGO conduction device and the connector of the display panel to be tested.
In order to solve the technical problems, the flip type vertical compression POGO conducting device comprises an upper flip, a lower base and a middle floating plate, wherein the upper flip is hinged to the upper end of the middle floating plate, the middle floating plate is arranged at the upper end of the lower base in parallel, a floating tool for realizing the vertical translation of the middle floating plate relative to the lower base is arranged between the middle floating plate and the lower base, a positioning structure for bearing a panel to be tested is arranged on the lower base, a needle die for conducting the panel to be tested is arranged on the upper flip, a compression elastic piece for conducting the panel to be tested is arranged in the needle die, the compression elastic piece is of a flat plate structure, the compression elastic piece comprises a panel to be tested, an FPC switching part and a bending part, the panel to be tested, the FPC switching part and the bending part are integrally formed by metal materials, a probe head is arranged on the panel to be tested and the FPC switching part, each metal tape is composed of at least two parallel and spaced metal tapes, and the width of each metal tape is equal to or less than or equal to 4 conductive tapes/bending parts and is equal to or less than the width of each metal probe head.
In a preferred embodiment of the present utility model, the width of the probe head is 3 times the width of the metal tape.
In a preferred embodiment of the present utility model, a first protrusion for counteracting the resilience force of the panel to be tested is disposed on a side of the panel to be tested switching part, and a center of gravity of the first protrusion and a center of the bending part are located on the same side of the panel to be tested switching part.
In a preferred embodiment of the present utility model, the side surface of the FPC changeover portion is provided with a second protrusion for counteracting the resilience force of the FPC changeover portion, and the center of gravity of the second protrusion and the center of the bent portion are located on the same side of the FPC changeover portion.
In a preferred embodiment of the present utility model, the shape of each metallic tape comprises any one of a C-shape, an M-shape, an S-shape, an i-shape, an arcuate shape, and a multiple S-shape.
In a preferred embodiment of the utility model, the lower base comprises a base and a positioning block, the positioning block is fixedly connected with the base through a bolt, and a positioning structure is arranged on the positioning block.
In a preferred embodiment of the present utility model, the positioning structure is a groove corresponding to the panel to be tested.
In a preferred embodiment of the utility model, the floating tool comprises a guide structure, a pressure spring and an upper limit structure, wherein the fixed end of the guide structure is fixedly connected with the lower base, the movable end of the guide structure is fixedly connected with the middle floating plate, the pressure spring is arranged between the middle floating plate and the lower base, and one end of the upper limit structure is fixedly connected with the lower base, and the other end of the upper limit structure is in matched limit with the middle floating plate.
In a preferred embodiment of the present utility model, the guide structure includes a linear bearing and a guide rod, the linear bearing is fixedly connected with the lower base, the guide rod is fixedly connected with the middle floating plate, and the linear bearing and the guide rod are in sliding fit.
In a preferred embodiment of the utility model, a locking tool for limiting the upward lifting of the middle floating plate when the middle floating plate is conducted is arranged between the middle floating plate and the lower base, and the locking tool comprises a buckle fixedly connected with the lower base and a clamping hook fixedly connected with the middle floating plate.
The beneficial effects of the utility model are as follows: the utility model has simple structure and convenient use, is convenient for placing the display panel to be tested, and effectively ensures the vertical compression joint of the needle mould on the flip cover of the POGO conduction device and the connector of the display panel to be tested and the conduction performance of the needle mould; according to the utility model, the crimp elastic piece in the needle die is designed into a flat plate structure, the width of the metal conduction band of the crimp elastic piece is optimized in structure, and the bending part is designed into at least 2 metal conduction bands which are arranged in parallel, so that the area of the bending part for conducting electricity is effectively increased, the impedance of the crimp elastic piece is reduced, the conductivity of the crimp elastic piece is improved, and meanwhile, the crimp elastic piece only comprises one bending part which plays a role of spring reset and also plays a role of conducting electricity, compared with a comparison document, the spring part is omitted, and the manufacture of the crimp elastic piece is facilitated; furthermore, the bending part is designed into any one of C shape, S shape, M shape, I shape, bow shape and multiple S shape, so that the area of the bending part is further increased, and the crimping shrapnel has smaller impedance and better conductivity; furthermore, the utility model can buffer the force when the probe contacts the product connector and the FPC by arranging the metal arc conduction band between the panel switching part and the bending part to be tested and between the FPC switching part and the metal bending part; furthermore, through the through holes arranged on the probe head of the FPC switching part, the probe deforms when being connected with the FPC, so that the contact area between the probe and the FPC is increased, and the success rate of the test is improved; furthermore, the first bulge with the same bending direction is arranged on the panel switching part to be tested, and the second bulge with the same bending direction is arranged on the FPC switching part, so that the moment generated when the panel switching part to be tested and the FPC switching part are reset and rebound is effectively balanced, and the whole structure of the crimping spring piece is not damaged when the crimping spring piece is reset after being compressed; finally, through the shape design of the probe head, the crimping shrapnel can be used for connecting various products with machines, thereby improving the universality of the crimping shrapnel; furthermore, the lower base is designed to be of a split structure, so that the positioning blocks with different positioning structures can be quickly replaced according to different types of display panels, and the universality of the display is improved; furthermore, the upper flip cover is directly hinged to the upper end of the middle floating plate, so that a sliding guide structure of the upper flip cover is omitted, and the structure of the upper flip cover is more compact compared with that of a CN203941360U patent.
Drawings
Fig. 1 is a schematic diagram of a flip-type vertical compression-bonding POGO conducting device according to an embodiment of the present utility model; (non-conducting state)
FIG. 2 is a schematic diagram of a flip-top type vertical compression POGO conducting device according to an embodiment of the present utility model; (on state)
FIG. 3 is a cross-sectional view of a floating fixture in a flip-type vertical compression POGO conducting device according to an embodiment of the present utility model;
FIG. 4 is a front view of the upper flip cover of a flip-type vertical crimp POGO conducting device according to an embodiment of the present utility model;
fig. 5 is a schematic diagram of a crimp dome on a pin die in a flip-top type vertical crimp POGO conducting device according to an embodiment of the present utility model;
fig. 6 is a schematic diagram of a crimp dome on a pin die in a flip-top vertical crimp POGO conducting device according to an embodiment of the present utility model;
in the figure: 1-turning up the cover; 2-a lower base; 3-an intermediate floating plate; 4-floating tooling; 5-needle molding; 6-positioning structure; 7-locking the tool; 8-a guide boss; 9-a guide groove; 10-crimping an elastic sheet; 2.1-a base; 2.2-positioning blocks; 4.1-guiding structure; 4.2-a compression spring; 4.3-an upper limit structure; 5.1-a panel switching part to be tested; 5.2-FPC adapter; 5.3-bending part; 5.3.1-metal conduction band; 5.1.1-first protrusions; 5.2.1-second protrusions; 7.1-a buckle; 7.2-hooks.
Detailed Description
The present utility model will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present utility model more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the utility model.
As shown in the attached drawings, the flip-type vertical compression joint POGO conducting device comprises an upper flip 1, a lower base 2 and a middle floating plate 3, wherein the upper flip 1 is hinged to the upper end of the middle floating plate 3, the middle floating plate 3 is arranged at the upper end of the lower base 2 in parallel, a floating tool 4 for realizing the vertical translation of the middle floating plate 3 relative to the lower base 2 is arranged between the middle floating plate 3 and the lower base 2, a positioning structure 6 for bearing a panel to be tested is arranged on the lower base 2, a needle mould 5 for conducting the panel to be tested is arranged on the upper flip 1, the arrangement position of the positioning structure 6 corresponds to the arrangement position of the needle mould 5, the crimp elastic sheet used for connecting the product connector in the pin die 5 is of a flat plate structure, the crimp elastic sheet 10 is used for connecting a panel switching part 5.1 to be tested of the product connector, an FPC switching part 5.2 used for connecting an FPC and a bending part 5.3 used for conducting the panel switching part 5.1 to be tested and the FPC switching part 5.2 and capable of elastically deforming, and the bending part 5.3 provides elastic deformation that the panel switching part 5.1 to be tested and the FPC switching part 5.2 axially approach or axially depart from each other, and the elastic deformation is equivalent to a spring of a conventional probe, so that the probe can have no guarantee of a good foundation for a long time. The panel switching part 5.1 to be tested and the FPC switching part 5.2 are respectively provided with a probe head, and the panel switching part 5.1 to be tested, the FPC switching part 5.2 and the bending part 5.3 are integrally formed. The bending part 5.3 is composed of two parallel metal conduction bands 5.3.1 which are arranged at intervals, the width/4 of the probe head is smaller than or equal to the width/3 of each metal conduction band 5.3.1, each metal conduction band 5.3.1 is made of a material which can conduct electricity and elastically deform, and meanwhile, the width of the bending part 5.3 is 2-4 times of the width of the probe head. The optimal scheme of the utility model is as follows: the width of the bending part 5.3 is 3 times of the width of the probe head. By increasing the width of the bending part 5.3, the conductive area of the bending part 5.3 can be effectively increased, thereby reducing the impedance of the crimping shrapnel and improving the conductivity of the crimping shrapnel. Each metal conduction band 5.3.1 is made of a material which can conduct electricity and can elastically deform, the impedance of each metal conduction band 3.1 is smaller than 50 milliohms, the overcurrent capacity of each metal conduction band 5.3.1 is larger than 3 amperes, and the metal conduction bands 5.3.1 of the utility model can be used for the utility model as long as the two requirements are met, any material and shape of the metal conduction bands 5.3.1 which can conduct electricity and can realize elastic deformation can be used for the utility model, the service life of each metal conduction band 5.3.1 is 20 ten thousand times, and the service temperature is-40 ℃ to +120 ℃. Further, the projection shape of the bending portion 5.3 in the thickness direction thereof includes any one of a C-shape, an M-shape, an S-shape, an i-shape, an arcuate shape, and a multi-S-shape. Through reasonable selection of the shape of the bending part 5.3, the impedance of the crimping shrapnel can be effectively reduced and the conductivity of the crimping shrapnel can be improved. Further, in order to enable the utility model to effectively buffer when being connected with a product connector and an FPC, a metal arc conduction band 5.4 is arranged between the panel switching part 5.1 to be tested and the bending part 5.3, a metal arc conduction band 5.4 is arranged between the FPC switching part 5.2 and the bending part 5.3, and the metal arc conduction band 5.4 is made of a material which can conduct electricity and can elastically deform and can be semicircular, arc-shaped and the like.
In order to increase the contact area between the FPC switching part 5.2 and the FPC, through holes are designed on the probe heads of the FPC switching part, and meanwhile, the number of the probe heads is increased; the probe head is also made of a material which can conduct electricity and can elastically deform. Further, in order to balance the moment generated by the panel switching part 5.1 to be tested and the FPC switching part 5.2 during compression rebound, the first bulge 5.1.1 for counteracting the rebound force of the panel switching part 5.1 to be tested is arranged on the panel switching part 5.1 to be tested, and the direction of the first bulge 5.1.1 is the same as the bending direction of the bending part 5.3; the FPC changeover portion 5.2 is provided with a second protrusion 5.2.1 for counteracting the resilience of the FPC changeover portion 5.2, and the direction of the second protrusion 5.2.1 is the same as the bending direction of the bending portion 5.3. Furthermore, in order to use and test various product connectors, the probe head of the panel adapter 1 to be tested is any one of a P head, a B head, a T head, an F head, a W head, an M head, a V head, an O head and an R head; the probe head of the FPC adapter 2 is any one of a P head, a B head, a T head, an F head, a W head, an M head, a V head, an O head and an R head. The side of the panel switching part 5.1 to be tested is further provided with a first bulge 5.1.1 for counteracting the resilience force of the panel switching part 5.1 to be tested, and the center of gravity of the first bulge 5.1.1 and the center of the bending part 5.3 are positioned on the same side of the panel switching part 5.1 to be tested. Further, a second protrusion 5.2.1 for counteracting the resilience force of the FPC adaptor 5.2 is arranged on the side surface of the FPC adaptor 5.2, and the center of gravity of the second protrusion 5.2.1 and the center of the bending part 5.3 are located on the same side of the FPC adaptor 5.2.
The lower base 2 comprises a base 2.1 and a positioning block 2.2, wherein the positioning block 2.2 is fixedly connected with the base 2.1 through bolts, and a positioning structure 6 is arranged on the positioning block 2.2. The positioning structure 6 may be a groove corresponding to the panel to be tested; the panel to be tested can also be provided with 3 bosses, 2 bosses in the 3 bosses are arranged in parallel and correspond to the width of the panel to be tested, and the other 1 boss is arranged vertically to the 2 bosses; likewise, the boss and the groove can be matched for use, and the technical scheme capable of positioning the display panel to be tested belongs to the protection scope of the utility model.
Further, as the upper flip 1 is hinged with the lower base 2 through the hinge shaft, the upper flip 1 and the lower base 2 may not be kept in a horizontal state when being folded down, the upper flip 1 is provided with the guide boss 8, the positioning block 2.2 is provided with the guide groove 9, the arrangement position of the guide boss 8 corresponds to the arrangement position of the guide groove 9, and the central axis of the guide groove 9 is parallel to the central axis of the floating tool 4.
The floating tool 4 comprises a guide structure 4.1, a pressure spring 4.2 and an upper limit structure 4.3, wherein the fixed end of the guide structure 4.1 is fixedly connected with a lower base 2, the movable end of the guide structure 4.1 is fixedly connected with a middle floating plate 3, the pressure spring 4.2 is arranged between the middle floating plate 3 and the lower base 2, one end of the upper limit structure 4.3 is fixedly connected with the lower base 2, and the other end of the upper limit structure is matched and limited with the middle floating plate 3. The guide structure 4.1 comprises a linear bearing and a guide rod, wherein the linear bearing is fixedly connected with the lower base 2, the guide rod is fixedly connected with the middle floating plate 3, and the linear bearing is in sliding fit with the guide rod. A locking tool 7 for limiting the upward lifting of the middle floating plate 3 when being conducted is arranged between the middle floating plate 3 and the lower base 2, and the locking tool 7 comprises a buckle 7.1 fixedly connected with the lower base 2 and a clamping hook 7.2 fixedly connected with the middle floating plate 3.
It should be understood that the foregoing is only illustrative of the present utility model, but the scope of the present utility model is not limited thereto, and any changes or substitutions that may be easily contemplated by those skilled in the art within the scope of the present utility model are intended to be included in the scope of the present utility model.
Claims (8)
1. The utility model provides a flip formula perpendicular crimping POGO switching on device, includes flip (1), lower base (2) and middle kickboard (3), flip (1) upward articulate in middle kickboard (3) upper end, middle kickboard (3) parallel arrangement in lower base (2) upper end, middle kickboard (3) with be provided with between lower base (2) and be used for realizing floating frock (4) of translation about middle kickboard (3) for lower base (2), be provided with location structure (6) that are used for bearing the panel that awaits measuring on lower base (2), upward be provided with on flip (1) be used for switching on needle mould (5) of panel that awaits measuring, be provided with the crimping shell fragment that is used for switching on the panel that awaits measuring in needle mould (5), its characterized in that: the crimping shell fragment is flat plate structure, the crimping shell fragment includes panel switching portion (5.1) to be tested, FPC switching portion (5.2) and kink (5.3), panel switching portion (5.1) to be tested, FPC switching portion (5.2) and kink (5.3) are by metal material integrated into one piece, all be provided with the probe head on panel switching portion (5.1) to be tested and FPC switching portion (5.2), the shape of probe head is P head, B head, T head, F head, W head, M head, V head, O head, R head any one of group, kink (5.3) are by at least two parallel interval arrangement's metal conduction band (5.3.1), every metal conduction band (5.3.1) are made by the material that both can electrically conduct but also elastic deformation, the width of each metal conduction band (5.3.1) is less than or equal to the width of probe head/3.1; the side of the panel switching portion (5.1) to be tested is provided with a first bulge (5.1.1) for counteracting the resilience force of the panel switching portion (5.1) to be tested, and the center of gravity of the first bulge (5.1.1) and the center of the metal bending portion (5.3) are located on the same side of the panel switching portion (5.1) to be tested.
2. The flip-top vertical compression POGO conduction device as claimed in claim 1, wherein: the width of the probe head is 3 times of the width of the metal conduction band (5.3.1).
3. The flip-top vertical compression POGO conduction device as claimed in claim 1, wherein: the side of FPC switching portion (5.2) is provided with second arch (5.2.1) that are used for counteracting FPC switching portion (5.2) resilience force, the focus of second arch (5.2.1) with the center of metal kink (5.3) is located the same side of FPC switching portion (5.2).
4. The flip-top vertical compression POGO conduction device as claimed in claim 1, wherein: the shape of each metal conduction band (5.3.1) comprises any one of C shape, M shape, S shape and I shape.
5. The flip-top vertical compression POGO conduction device as claimed in claim 1, wherein: the lower base (2) comprises a base (2.1) and a positioning block (2.2), the positioning block (2.2) is fixedly connected with the base (2.1) through a bolt, and a positioning structure (6) is arranged on the positioning block (2.2).
6. The flip-top vertical compression POGO conduction device according to claim 1 or 5, wherein: the positioning structure (6) is a groove corresponding to the panel to be tested.
7. The flip-top vertical compression POGO conduction device as claimed in claim 1, wherein: the floating tool (4) comprises a guide structure (4.1), a pressure spring (4.2) and an upper limiting structure (4.3), wherein the fixed end of the guide structure (4.1) is fixedly connected with the lower base (2), the movable end of the guide structure (4.1) is fixedly connected with the middle floating plate (3), the pressure spring (4.2) is arranged between the middle floating plate (3) and the lower base (2), one end of the upper limiting structure (4.3) is fixedly connected with the lower base (2), and the other end of the upper limiting structure is in matched limiting with the middle floating plate (3); the guide structure (4.1) comprises a linear bearing and a guide rod, wherein the linear bearing is fixedly connected with the lower base (2), the guide rod is fixedly connected with the middle floating plate (3), and the linear bearing is in sliding fit with the guide rod.
8. The flip-top vertical compression POGO conduction device as claimed in claim 1, wherein: the locking tool (7) used for limiting the upward lifting of the middle floating plate (3) when being conducted is arranged between the middle floating plate (3) and the lower base (2), and the locking tool (7) comprises a buckle (7.1) fixedly connected with the lower base (2) and a clamping hook (7.2) fixedly connected with the middle floating plate (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810906358.9A CN109061238B (en) | 2018-08-10 | 2018-08-10 | Flip type vertical compression joint POGO conduction device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810906358.9A CN109061238B (en) | 2018-08-10 | 2018-08-10 | Flip type vertical compression joint POGO conduction device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109061238A CN109061238A (en) | 2018-12-21 |
| CN109061238B true CN109061238B (en) | 2023-10-10 |
Family
ID=64683261
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810906358.9A Active CN109061238B (en) | 2018-08-10 | 2018-08-10 | Flip type vertical compression joint POGO conduction device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109061238B (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109782032B (en) * | 2019-01-14 | 2024-10-22 | 武汉精毅通电子技术有限公司 | Prevent manual misoperation's perpendicular crimping POGO conduction device and test fixture that lights a lamp |
| CN109686287B (en) * | 2019-01-17 | 2024-01-19 | 武汉精毅通电子技术有限公司 | Display panel test structure capable of simulating production line multiple conversion signals and jig |
| CN110471201B (en) * | 2019-08-14 | 2022-06-03 | 武汉精毅通电子技术有限公司 | Crimping jig |
| CN111562409B (en) * | 2020-04-04 | 2022-04-29 | 武汉精毅通电子技术有限公司 | Display panel detects with two upset pressure heads and display panel detection tool |
| CN113941672B (en) * | 2021-10-21 | 2023-10-31 | 江苏创源电子有限公司 | Bending device |
| TWI788149B (en) * | 2021-12-20 | 2022-12-21 | 漢民測試系統股份有限公司 | Probe card |
| CN117970080B (en) * | 2024-03-29 | 2024-06-21 | 四川锐坤电子技术有限公司 | FPC test clamp |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102427001A (en) * | 2011-11-08 | 2012-04-25 | 江苏辉能电气有限公司 | Contact pressure control mechanism for molded case low-voltage circuit breaker |
| CN203241443U (en) * | 2013-05-09 | 2013-10-16 | 金英杰 | Clamp of unpacked chip testing tool |
| CN104062785A (en) * | 2014-06-25 | 2014-09-24 | 苏州华兴源创电子科技有限公司 | Detection end device for liquid crystal module detector |
| CN205178110U (en) * | 2015-11-02 | 2016-04-20 | 深圳市鑫德胜电子科技有限公司 | Electricity connecting terminal group structure |
| CN106153988A (en) * | 2016-06-24 | 2016-11-23 | 段超毅 | Contact conducting structure, contact conducting device and plate are to board test device |
| CN107850623A (en) * | 2016-06-17 | 2018-03-27 | 欧姆龙株式会社 | Probe |
| CN208805532U (en) * | 2018-08-10 | 2019-04-30 | 武汉精测电子集团股份有限公司 | A kind of clamshell vertically crimps POGO conducting device |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140327462A1 (en) * | 2013-05-03 | 2014-11-06 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Test socket providing mechanical stabilization for pogo pin connections |
| JP6239382B2 (en) * | 2013-12-27 | 2017-11-29 | 株式会社エンプラス | Socket for electrical parts |
-
2018
- 2018-08-10 CN CN201810906358.9A patent/CN109061238B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102427001A (en) * | 2011-11-08 | 2012-04-25 | 江苏辉能电气有限公司 | Contact pressure control mechanism for molded case low-voltage circuit breaker |
| CN203241443U (en) * | 2013-05-09 | 2013-10-16 | 金英杰 | Clamp of unpacked chip testing tool |
| CN104062785A (en) * | 2014-06-25 | 2014-09-24 | 苏州华兴源创电子科技有限公司 | Detection end device for liquid crystal module detector |
| CN205178110U (en) * | 2015-11-02 | 2016-04-20 | 深圳市鑫德胜电子科技有限公司 | Electricity connecting terminal group structure |
| CN107850623A (en) * | 2016-06-17 | 2018-03-27 | 欧姆龙株式会社 | Probe |
| CN106153988A (en) * | 2016-06-24 | 2016-11-23 | 段超毅 | Contact conducting structure, contact conducting device and plate are to board test device |
| CN208805532U (en) * | 2018-08-10 | 2019-04-30 | 武汉精测电子集团股份有限公司 | A kind of clamshell vertically crimps POGO conducting device |
Non-Patent Citations (1)
| Title |
|---|
| 基于良率改善的IC测试探针优化设计;王支刚 等;电子世界;第101-103页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109061238A (en) | 2018-12-21 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109061238B (en) | Flip type vertical compression joint POGO conduction device | |
| CN108828276B (en) | POGO conducting device capable of preventing human misoperation | |
| CN108572264B (en) | Crimping shell fragment of single buffering passageway | |
| CN105807213A (en) | Testing device for flat lead chip | |
| CN111562412B (en) | Probe and circuit inspection device provided with same | |
| CN105676114A (en) | Flat pin chip tester | |
| CN111579833B (en) | Probe and connector suitable for high-current high-speed signal test | |
| CN208805532U (en) | A kind of clamshell vertically crimps POGO conducting device | |
| CN109686287B (en) | Display panel test structure capable of simulating production line multiple conversion signals and jig | |
| CN205450202U (en) | A testing arrangement for flat pin chip | |
| CN111579837B (en) | Probe and connector suitable for high-current high-speed signal test | |
| US11860191B2 (en) | Probe module | |
| CN202710618U (en) | Electric performance test fixture for one-driving-two circuit board | |
| CN109782032B (en) | Prevent manual misoperation's perpendicular crimping POGO conduction device and test fixture that lights a lamp | |
| CN111579836A (en) | Probe and connector suitable for high-current high-speed signal test | |
| CN212364376U (en) | Probe and connector suitable for high-current high-speed signal test | |
| CN212514714U (en) | Probe and connector suitable for high-current high-speed signal test | |
| CN110927616A (en) | Conductive positioning testing device on LED lamp tube testing production line | |
| CN212364375U (en) | Probe and connector suitable for high-current high-speed signal test | |
| CN213305860U (en) | Novel PCB based on RF function detection end in antenna production | |
| CN212872566U (en) | Conducting rubber strip test module | |
| CN220209298U (en) | Novel charging head | |
| CN212514713U (en) | Probe and connector suitable for high-current high-speed signal test | |
| CN212364377U (en) | Probe and connector suitable for high-current high-speed signal test | |
| CN209022774U (en) | A kind of adaptivity contact bindiny mechanism and its charging bow |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |