CN108445618A - DSHOW standard micrometering systems and measurement method - Google Patents
DSHOW standard micrometering systems and measurement method Download PDFInfo
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- CN108445618A CN108445618A CN201810616298.7A CN201810616298A CN108445618A CN 108445618 A CN108445618 A CN 108445618A CN 201810616298 A CN201810616298 A CN 201810616298A CN 108445618 A CN108445618 A CN 108445618A
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
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Abstract
DSHOW standards micrometering system of the present invention, including：Image capture module：Image can be acquired from DSHOW standard microscope equipment；The MIcrosope image measurement module being connected to image capture module：And the data storage module being used cooperatively with MIcrosope image measurement module；MIcrosope image measurement module includes being equipped on user interface epigraph selecting module, Measurement Algorithm selecting module, measurement module；Measurement module refers to Measurement Algorithm module.
Description
Technical field
The present invention relates to automatic measuring system, more particularly to a kind of DSHOW standards micrometering system and measurement method.
Background technology
It is common to be measured microscopically tool software, it is usually provided by microscope manufacturer, such tool can only use
What producer provided checks the functions such as image, has stringent limitation, cannot meet client's fundamental measurement demand well, and not
Has the expansibility of software.And the equipment that each software can only use a producer.
Therefore, it is necessary to provide a kind of DSHOW standards micrometering system and measurement method to solve the above problems.
Invention content
An object of the present invention is to provide a kind of DSHOW standards micrometering system.
Technical solution is as follows：
A kind of DSHOW standards micrometering system, including：
Image capture module：Image can be acquired from DSHOW standard microscope equipment；
The MIcrosope image measurement module being connected to image capture module：
And the data storage module being used cooperatively with MIcrosope image measurement module；
MIcrosope image measurement module includes being equipped on user interface epigraph selecting module, Measurement Algorithm selecting module, measuring
Module；Measurement module refers to Measurement Algorithm module.
Further Measurement Algorithm is that point measures, straight line measures, circle measures, triangle measures or two line angle measurements etc..
Further, data storage module was closed micro- when software for reading setting data, log-on data, such as last time
Mirror multiplying power；Record etc. is measured for reading；For preserving setting data, log-on data, such as microscope when last time closing software
Multiplying power；Record etc. is measured for preserving.
Further, user interface is used for：Visualization device attribute reads, interface, the attributes such as including resolution ratio is arranged；It can
Interface, including paintbrush thickness, pattern, color etc. are preset depending on changing paintbrush；It visualizes LnkTools interface, including deduced image, leads
Go out table etc.；Visualization measurement interface, including manual measurement, scribing line etc.；It shows measurement result, measures information interface, including institute
Have and measures comment etc..
Further, equipped with equipment setup module in user interface.
Further, in user interface equipped with paintbrush presetting module, paintbrush it is default mainly to paintbrush type such as solid line,
Dotted line, paintbrush thickness such as 5pt, 10pt, the brush style such as Song typeface, black matrix, the attributes such as paintbrush size are configured, when for measuring
The attribute for waiting paintbrush is pre-set.
Further, equipped with LnkTools module in user interface, LnkTools includes following functions, startup correction,
Cross hairs setting, magnifying glass, DEMO measurements, export word, export excel, export measurement result etc..
Further, equipped with information module is measured in user interface, measure information expression is n times metrical information, packet
It includes and measures use color, the type of measurement such as dotted line measurement or parallel center line measurement every time, choose each measurement result, it can be with
Check detailed measurement data, such as the length etc. of center point coordinate X and Y and experiment curv.
Further, equipment setup module for connecting equipment automatically, and can open properties dialog by user, checks and sets
The parameters such as back-up resolution, equipment id, equipment exposure rate, white balance, have once in a while partial parameters read less than the case where, then only show
Show the parameter normally read；Or parameter setting is issued, change current microscope running parameter.
The present invention also provides a kind of measurement method, flow is as follows：
S1) image capture module real-time image acquisition data；
S2) selection microscope device is operated by subscriber interface module to be attached, while can be checked by equipment setup module
Device attribute or setting device attribute, also can by paintbrush presetting module be arranged paintbrush, wait all be measure before preparation；
S3）It is measured using straight line estimation algorithm；
S4）By LnkTools module export measurement structure, by data storage module store current measurement structure or other
Parameter；
S5）Measurement result details are checked by measuring information module.
Compared with prior art, the present invention is by the way of docking DSHOW standard agreements, more traditional survey tool software
With stronger compatibility, traditional survey tool can only support the image collecting function that producer provides, and the present invention can not only
Image is acquired, can also complete to measure function, preserve measurement data, check that measurement details, function are more perfect.It has access to simultaneously
Different manufacturers meet the microscope device of DSHOW standards, enhance platform autgmentability.On the whole platform autgmentability of the present invention it is strong,
Function expansibility is strong, service efficiency is high, perfect in shape and function, can greatly improve measurement working efficiency..
Description of the drawings
Fig. 1 is one of the structural schematic diagram of the present invention.
Fig. 2 is the second structural representation of the present invention.
Specific implementation mode
Embodiment：
It please referring to Fig.1 to Fig. 2, the present embodiment shows a kind of DSHOW standards micrometering system, including：
Image capture module：Image can be acquired from TWAIN standard microscope equipment；
The MIcrosope image measurement module being connected to image capture module：
And the data storage module being used cooperatively with MIcrosope image measurement module；
MIcrosope image measurement module includes being equipped on user interface epigraph selecting module, Measurement Algorithm selecting module, measuring
Module；Measurement module refers to that Measurement Algorithm module, Measurement Algorithm are straight line estimation algorithm.
Data storage module is for reading setting data, log-on data, such as microscope multiplying power when last time closing software；With
Record etc. is measured in reading；For preserving setting data, log-on data, such as microscope multiplying power when last time closing software；For
It preserves and measures record etc..
User interface is used for：Visualization device attribute reads, interface, the attributes such as including resolution ratio is arranged；Visualize paintbrush
Default interface, including paintbrush thickness, pattern, color etc.；Visualize LnkTools interface, including deduced image, export table etc.；
Visualization measurement interface, including manual measurement, scribing line etc.；It shows measurement result, measures information interface, including all measurement explanations
Word etc..
Equipped with equipment setup module in user interface.
Equipped with paintbrush presetting module in user interface, paintbrush is default mainly to paintbrush type such as solid line, dotted line, paintbrush
Thickness such as 5pt, 10pt, the brush style such as Song typeface, black matrix, the attributes such as paintbrush size are configured, paintbrush when for measuring
Attribute is pre-set.
Equipped with LnkTools module in user interface, LnkTools includes following functions, starts correction, cross hairs is set
It sets, magnifying glass, DEMO are measured, export word, export excel, export measurement result etc..
Equipped with information module is measured in user interface, measure information expression is n times metrical information, including is measured every time
Used color, the type of measurement such as dotted line measure or parallel center line measures, and choose each measurement result, can check detailed
Measurement data, for example, center point coordinate X and Y and experiment curv length etc..
Equipment setup module and can open properties dialog for connecting equipment automatically by user, check device resolution,
The parameters such as equipment id, equipment exposure rate, white balance, have once in a while partial parameters read less than the case where, then only display is normal reads
The parameter got；Or parameter setting is issued, change current microscope running parameter.
Measurement procedure is as follows：
S1) image capture module real-time image acquisition data；
S2) selection microscope device is operated by subscriber interface module to be attached, while can be checked by equipment setup module
Device attribute or setting device attribute, also can by paintbrush presetting module be arranged paintbrush, wait all be measure before preparation；
S3）It is measured using straight line estimation algorithm；
S4）By LnkTools module export measurement structure, by data storage module store current measurement structure or other
Parameter；
S5）Measurement result details are checked by measuring information module.
It is worth noting that, straight line estimation algorithm is one of the embodiment of the present embodiment, can also be：Point measures, is round
The Measurement Algorithms such as measurement, triangle measurement, two line angle measurements, two-point measurement, arc measuring, point to line measurement.
By the way of docking DSHOW standard agreements, more traditional survey tool software has stronger simultaneous the present embodiment
Capacitive, traditional survey tool can only support the image collecting function that producer provides, and the present invention can not only acquire image, also can
It completes to measure function, preserves measurement data, check that measurement details, function are more perfect.Different manufacturers satisfaction is had access to simultaneously
The microscope device of DSHOW standards enhances platform autgmentability.Platform autgmentability of the present invention is strong on the whole, function expansibility is strong,
Service efficiency height, can greatly improve measurement working efficiency at perfect in shape and function.
Above-described is only some embodiments of the present invention.For those of ordinary skill in the art, not
Under the premise of being detached from the invention design, various modifications and improvements can be made, these belong to the protection model of the present invention
It encloses.
Claims (10)
1. a kind of DSHOW standards micrometering system, it is characterised in that：Including：
Image capture module：Image can be acquired from DSHOW standard microscope equipment；
The MIcrosope image measurement module being connected to image capture module：
And the data storage module being used cooperatively with MIcrosope image measurement module；
MIcrosope image measurement module includes being equipped on user interface epigraph selecting module, Measurement Algorithm selecting module, measuring
Module；Measurement module refers to Measurement Algorithm module.
2. a kind of DSHOW standards micrometering system according to claim 1, it is characterised in that：Measurement Algorithm is that point is surveyed
Fixed, straight line measurement, circle measurement, triangle measurement or two line angle measurements etc..
3. a kind of DSHOW standards micrometering system according to claim 2, it is characterised in that：Data storage module is used
Data, log-on data are set in reading, such as microscope multiplying power when last time closing software；Record etc. is measured for reading；For
Preserve setting data, log-on data, such as microscope multiplying power when last time closing software；Record etc. is measured for preserving.
4. a kind of DSHOW standards micrometering system according to claim 3, it is characterised in that：User interface is used for：It can
It is read depending on changing device attribute, setting interface, the attributes such as including resolution ratio；It visualizes paintbrush and presets interface, including paintbrush thickness, sample
Formula, color etc.；Visualize LnkTools interface, including deduced image, export table etc.；Visualization measurement interface, including it is manual
It measures, scribing line etc.；It shows measurement result, measures information interface, including all measurement comments etc..
5. a kind of DSHOW standards micrometering system according to claim 4, it is characterised in that：It is carried in user interface
There is equipment setup module.
6. a kind of DSHOW standards micrometering system according to claim 5, it is characterised in that：It is carried in user interface
There are paintbrush presetting module, paintbrush default mainly to paintbrush type such as solid line, dotted line, paintbrush thickness such as 5pt, 10pt, paintbrush word
The body such as Song typeface, black matrix, the attributes such as paintbrush size are configured, and the attribute of paintbrush is pre-set when for measuring.
7. a kind of DSHOW standards micrometering system according to claim 6, it is characterised in that：It is carried in user interface
It includes following functions to have LnkTools module, LnkTools, starts correction, cross hairs setting, magnifying glass, DEMO measurements, export
Word, export excel, export measurement result etc..
8. a kind of DSHOW standards micrometering system according to claim 7, it is characterised in that：It is carried in user interface
Have and measure information module, measure information expression is n times metrical information, including measures used color, the type of measurement every time
If dotted line measurement or parallel center line measure, each measurement result is chosen, can check that detailed measurement data, such as central point are sat
Mark the length etc. of X and Y and experiment curv.
9. a kind of DSHOW standards micrometering system according to claim 8, it is characterised in that：Equipment setup module is used
In connection equipment automatically, and can properties dialog be opened by user, check device resolution, equipment id, equipment exposure rate, Bai Ping
Weighing apparatus etc. parameters, have once in a while partial parameters read less than the case where, then only show the parameter normally read；Or it issues parameter and sets
It sets, changes current microscope running parameter.
10. a kind of measurement method, it is characterised in that：It utilizes a kind of DSHOW standards micrometering system described in claim 9
It measures, flow is as follows：
S1) image capture module real-time image acquisition data；
S2) selection microscope device is operated by subscriber interface module to be attached, while can be checked by equipment setup module
Device attribute or setting device attribute, also can by paintbrush presetting module be arranged paintbrush, wait all be measure before preparation；
S3 it) is measured using straight line estimation algorithm；
S4) by LnkTools module export measurement structure, by data storage module store current measurement structure or other
Parameter；
S5 measurement result details) are checked by measuring information module.
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| CN201810616298.7A CN108445618A (en) | 2018-06-14 | 2018-06-14 | DSHOW standard micrometering systems and measurement method |
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| CN201810616298.7A CN108445618A (en) | 2018-06-14 | 2018-06-14 | DSHOW standard micrometering systems and measurement method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109117818A (en) * | 2018-08-30 | 2019-01-01 | 苏州富莱智能科技有限公司 | Material structure characteristic intelligent recognition analysis system and analysis method |
| CN109145846A (en) * | 2018-08-30 | 2019-01-04 | 苏州富莱智能科技有限公司 | Material microstructure intelligent recognition analysis system and analysis method |
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| CN109145846A (en) * | 2018-08-30 | 2019-01-04 | 苏州富莱智能科技有限公司 | Material microstructure intelligent recognition analysis system and analysis method |
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Application publication date: 20180824 |
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