CN108415149A - A kind of macro micro- double-view field synchronous imaging microscope - Google Patents
A kind of macro micro- double-view field synchronous imaging microscope Download PDFInfo
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- CN108415149A CN108415149A CN201810082475.8A CN201810082475A CN108415149A CN 108415149 A CN108415149 A CN 108415149A CN 201810082475 A CN201810082475 A CN 201810082475A CN 108415149 A CN108415149 A CN 108415149A
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
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Abstract
The invention discloses a kind of macro micro- double-view field synchronous imaging microscopes, including low-powered microscope part and high-power microscope part；The low-powered microscope part includes semi-transparent semi-reflecting prism (1), low power industrial lens (2), testee (3), semi-transparent semi-reflecting film (4), coaxial light source (6), imaging sensor A (7), clamper (9) and culture dish (10)；High-power microscope part includes testee (3), semi-transparent semi-reflecting film (4), high power industrial lens (5), imaging sensor B (8) and culture dish (10).The present invention is imaged while being imaged using low-powered microscope using high-power microscope, and double light path is imaged simultaneously, avoid it is low using real-time caused by still image splicing, the problem of poor reliability.
Description
Technical field
The present invention relates to optical image technology field, especially a kind of macro micro- double-view field synchronous imaging microscope, using double
Light path builds macro micro- double-view field synchronous imaging microscope, while realizing the imaging of the tow sides to same object, the different visuals field.
Background technology
Currently, high-power microscope has very wide application, it is convenient for resolve minutiae, high certainty of measurement, but due to it
With small field of view, the small depth of field is focused the shortcomings of difficult, and low-powered microscope has the advantages of big visual field, the big depth of field, easily focusing.It is existing
Most single vision systems be to use ultramicroscopic observation and determination details, utilize several static detail pictures splicings
Wide-field global image is built, but the problem of its real-time difference is never well solved；Part microscope passes through
It replaces camera lens and switches over visual field, cannot realize low range and high magnification synchronous imaging simultaneously in this way；Although zoom microscope can
To obtain the image in the different visuals field, but still low range and powerful image cannot be obtained simultaneously；Entitled " compound microscope "
Patent of invention (Patent No. 200910306753.4) provide a kind of compound microscope, which realizes to same
The high power of visual field is differentiated to be observed with low power, but it realizes that double light path, visual field are single by sharing same object lens.The patent of invention exists
It is transformed in original single vision system-based, while realizing and macro micro- double vision open country of same target tow sides is imaged；In addition
By the way that by high-power microscope object lens partial inversion, low power objective part is just set, realizes and the tow sides of same object plane are observed；It adopts
Wide range operation space is obtained with the long object distance of low power, light source is coaxial with low power objective, it realizes precisely to the heart, it is thin to obtain target
Section.
Invention content
It is carried out at the same time the shortcomings that high power imaging is with low power imaging function in order to overcome most microscopes not have, the present invention carries
Can macro micro- double-view field synchronous imaging microscope that tow sides high power is imaged with low power be carried out to same object simultaneously for a kind of,
It solves the problems, such as the first location difficulty of high power small field of view and is difficult to real-time update global image.
The technical scheme is that：A kind of macro micro- double-view field synchronous imaging microscope, including low-powered microscope part and
High-power microscope part；
The low-powered microscope part includes semi-transparent semi-reflecting prism 1, low power industrial lens 2, testee 3, semi-transparent semi-reflecting
Low power industrial lens 2, institute is clamped in film 4, coaxial light source 6, imaging sensor A7, clamper 9 and culture dish 10, the clamper 9
The upper end that imaging sensor A7 is located at low power industrial lens 2 is stated, the semi-transparent semi-reflecting prism 1 is arranged in low power industrial lens 2,
Low power industrial lens 2 are equipped with coaxial light source through-hole, and the coaxial light source lead to the hole site is adapted with semi-transparent semi-reflecting prism 1,
2 bottom of low power industrial lens is equipped with culture dish 10, and the culture dish 10 is placed on objective table 13；
The high-power microscope part includes testee 3, semi-transparent semi-reflecting film 4, high power industrial lens 5, imaging sensor
B8 and culture dish 10, the high power industrial lens 5 are located at 13 lower end of objective table, and described image sensor B8 is set to high power industry mirror
First 5 bottom.
Further, low-powered microscope imaging optical path and high-power microscope imaging optical path share semi-transparent semi-reflecting film 4 to light into
Row proportional reflection and transmission, realize the illumination of double light path.
Further, the low power industrial lens 2 are just being placed in 3 side of testee, and the high power industrial lens 5 are inverted in
The other side of testee 4 is realized and is imaged to the tow sides of same object.
Further, described image sensor A7 and imaging sensor B8 are using CCD/CMOS imaging sensors.
Further, the low power industrial lens 2 carry out Global localization macroscopically and observation to testee 3.
Further, the high power industrial lens 5 carry out microcosmic imaging to the details of testee 3, and coordinate low power lens
It is imaged simultaneously, the location information of synchronized update high power visual field.
Further, incident light 11 enters low power lens barrel from coaxial light source 6, is totally reflected by semi-transparent semi-reflecting prism 1,
The light of reflection is radiated at the upper surface of testee 3, and secondary transmission and reflection occurs by semi-transparent semi-reflecting film 4, secondary reflection
Light 12 is transmitted into imaging sensor A7, the light 14 of secondary transmission along low-powered microscope imaging optical path by semi-transparent semi-reflecting prism 1
Enter imaging sensor B8 by high power industrial lens 5 along high-power microscope imaging optical path.
Compared with prior art, the beneficial effects of the invention are as follows：
(1) low power lens focal length is longer in the present invention, and distance is longer between camera lens and testee, reserves wide range operation
Space.
(2) present invention is provided with adjustable coaxial light source, light-inletting quantity can be adjusted to obtain accurate, clear figure
Picture.
(3) present invention solves the problems, such as the first location difficulty of high power small field of view and is difficult to real-time update global image.
(4) present invention is imaged, double light path is simultaneously while being imaged using low-powered microscope using high-power microscope
Imaging, avoid it is low using real-time caused by still image splicing, the problem of poor reliability.
Description of the drawings
Fig. 1 is the structural diagram of the present invention.
Fig. 2 is the semi-transparent semi-reflecting film light path schematic diagram of the present invention.
In figure：The semi-transparent semi-reflecting prisms of 1-, 2- low power industrial lens, 3- testees, 4- semi-transparent semi-reflecting films, 5- high power industry
Camera lens, 6- coaxial light sources, 7- imaging sensors A, 8- imaging sensor B, 9- clamper, 10- culture dishes, 11- incident lights, 12-
Reflected light, 13- objective tables, 14- transmitted lights.
Specific implementation mode
In the description of the present invention, it is to be understood that, term "center", " longitudinal direction ", " transverse direction ", "upper", "lower",
The orientation or positional relationship of the instructions such as "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside" is
It is based on the orientation or positional relationship shown in the drawings, is merely for convenience of description of the present invention and simplification of the description, rather than instruction or dark
Show that signified device or element must have a particular orientation, with specific azimuth configuration and operation, therefore should not be understood as pair
The limitation of the present invention.In addition, term " first ", " second " etc. are used for description purposes only, it is not understood to indicate or imply phase
To importance or implicitly indicate the quantity of indicated technical characteristic.The feature for defining " first ", " second " etc. as a result, can
To express or implicitly include one or more this feature.In the description of the present invention, unless otherwise indicated, " multiple "
It is meant that two or more.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " installation ", " phase
Even ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected；It can
Can also be electrical connection to be mechanical connection；It can be directly connected, can also indirectly connected through an intermediary, Ke Yishi
Connection inside two elements.For the ordinary skill in the art, above-mentioned term can be understood by concrete condition
Concrete meaning in the present invention.
The present invention is further illustrated with reference to the accompanying drawings and examples.
As shown in Figure 1, microscopic system includes low-powered microscope part and high-power microscope part, low-powered microscope part
Including semi-transparent semi-reflecting prism 1, low power industrial lens 2, testee 3, semi-transparent semi-reflecting film 4, coaxial light source 6, imaging sensor A7,
Clamper 9 and culture dish 10, high-power microscope part include testee 3, semi-transparent semi-reflecting film 4, high power industrial lens 5, image
Sensor B8 and culture dish 10, when work, incident light 11 enters low power lens barrel from coaxial light source, is sent out by semi-transparent semi-reflecting prism 1
Raw total reflection, the light of reflection are radiated at the upper surface of testee 3, and secondary transmission occurs by semi-transparent semi-reflecting film 4 and reflects, two
The light 12 of secondary reflection is transmitted into CCD/CMOS imaging sensors along low-powered microscope imaging optical path by semi-transparent semi-reflecting prism 1
The light 14 of A7, secondary transmission enter CCD/CMOS imaging sensors along high-power microscope imaging optical path by high power industrial lens 5
B8.Double light path is imaged simultaneously, simultaneous observation, realizes the real-time update of macro micro- double-view field information.By adjusting semi-transparent semi-reflecting film
Transflection ratio adjusts the light-inletting quantity of high low power lens.
As shown in Fig. 2, light is radiated at 3 upper surface of testee from low power lens, by semi-transparent semi-reflecting film 4 according to transflection ratio
Example is transmitted and is reflected, and transmitted light 14, which enters by high power industrial lens 5 in CCD/CMOS imaging sensors B8, realizes high power
Details is imaged；Reflected light 12 enters low power industrial lens 2 along original optical path, and CCD/ is transmitted by semi-transparent semi-reflecting prism 1
Cmos image sensor A7 realizes the imaging of the low power overall situation.Low power lens is just being placed in 3 top of testee, and high power camera lens is inverted in 3
Micro- double light path synchronous imaging macro to the tow sides of testee 3 is realized in lower section.
Operation principle：
Macro micro- double light path synchronous imaging is realized using twin-lens.Low power lens, main function are carried out to testee
Global localization macroscopically and observation；High power camera lens, main function are to carry out microcosmic imaging to the details of testee, and match
Low power lens is closed to be imaged simultaneously, it can be with the location information of synchronized update high power visual field.By the way that low power lens is just placed in testee
Top, high power camera lens are inverted in below testee, realize macro micro- double-view field synchronous imaging to same object tow sides.It is logical
It crosses and changes the transflection ratio of part reflective semitransparent film to change the light-inletting quantity of high low power lens.
It is enlightenment with above-mentioned desirable embodiment according to the present invention, through the above description, relevant staff is complete
Various changes and amendments can be carried out without departing from the scope of the technological thought of the present invention' entirely.The technology of this invention
Property range is not limited to the contents of the specification, it is necessary to determine its technical scope according to right.
Claims (5)
1. a kind of macro micro- double-view field synchronous imaging microscope, which is characterized in that including low-powered microscope part and high-power microscope
Part；
The low-powered microscope part includes semi-transparent semi-reflecting prism (1), low power industrial lens (2), testee (3), semi-transparent half
Anti- film (4), coaxial light source (6), imaging sensor A (7), clamper (9) and culture dish (10), clamper (9) clamping are low
Times industrial lens (2), described image sensor A (7) are located at the upper end of low power industrial lens (2), the semi-transparent semi-reflecting prism (1)
It is arranged in low power industrial lens (2), coaxial light source through-hole, coaxial light source through-hole position is equipped in low power industrial lens (2)
It sets and is adapted with semi-transparent semi-reflecting prism (1), culture dish (10), the culture dish (10) are equipped in low power industrial lens (2) bottom
It places on objective table (13)；
The high-power microscope part includes testee (3), semi-transparent semi-reflecting film (4), high power industrial lens (5), image sensing
Device B (8) and culture dish (10), the high power industrial lens (5) are located at objective table (13) lower end, and described image sensor B (8) is set
Bottom in high power industrial lens (5)；
The low power industrial lens (2) are just being placed in testee (3) side, and the high power industrial lens (5) are inverted in measured object
The other side of body (4) is realized and is imaged to the tow sides of same object；
Low-powered microscope imaging optical path and high-power microscope imaging optical path share semi-transparent semi-reflecting film (4) light is carried out it is proportional anti-
It penetrates and transmits, realize the illumination of double light path.
2. the macro micro- double-view field synchronous imaging microscope of one kind according to claim 1, which is characterized in that incident light (11) from
Coaxial light source (6) enters low power lens barrel, is totally reflected by semi-transparent semi-reflecting prism (1), the light of reflection is radiated at testee
(3) by semi-transparent semi-reflecting film (4) secondary transmission and reflection occur for upper surface, and the light (12) of secondary reflection is along low-powered microscope
Imaging optical path is transmitted into imaging sensor A (7) by semi-transparent semi-reflecting prism (1), and the light (14) of secondary transmission is micro- along high power
Mirror imaging optical path enters imaging sensor B (8) by high power industrial lens (5).
3. the macro micro- double-view field synchronous imaging microscope of one kind according to claim 1, which is characterized in that described image senses
Device A (7) and imaging sensor B (8) are using CCD/CMOS imaging sensors.
4. the macro micro- double-view field synchronous imaging microscope of one kind according to claim 1, which is characterized in that the low power industry
Camera lens (2) carries out Global localization macroscopically and observation to testee (3).
5. the macro micro- double-view field synchronous imaging microscope of one kind according to claim 1, which is characterized in that the high power industry
Camera lens (5) carries out microcosmic imaging to the details of testee (3), and low power lens is coordinated to be imaged simultaneously, synchronized update high power visual field
Location information.
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| CN201810082475.8A CN108415149A (en) | 2018-01-29 | 2018-01-29 | A kind of macro micro- double-view field synchronous imaging microscope |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110542687A (en) * | 2019-07-02 | 2019-12-06 | 中国工程物理研究院激光聚变研究中心 | Detection device and detection method for appearance defects of microscopic elements |
| CN111929297A (en) * | 2020-07-15 | 2020-11-13 | 北京倍肯恒业科技发展股份有限公司 | Co-machine rapid detection device based on coaxial light source system and application thereof |
| CN113030096A (en) * | 2021-02-25 | 2021-06-25 | 无锡金元启信息技术科技有限公司 | Industrial product micro hole wall defect imaging device and identification algorithm |
| CN118642262A (en) * | 2024-08-14 | 2024-09-13 | 浙江大学 | Automatic end effector tip initialization positioning device and method for micro-operation system |
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| CN110542687A (en) * | 2019-07-02 | 2019-12-06 | 中国工程物理研究院激光聚变研究中心 | Detection device and detection method for appearance defects of microscopic elements |
| CN111929297A (en) * | 2020-07-15 | 2020-11-13 | 北京倍肯恒业科技发展股份有限公司 | Co-machine rapid detection device based on coaxial light source system and application thereof |
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| CN118642262A (en) * | 2024-08-14 | 2024-09-13 | 浙江大学 | Automatic end effector tip initialization positioning device and method for micro-operation system |
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Application publication date: 20180817 |