CN107991836A - A kind of optical projection module containing safety monitoring function - Google Patents
A kind of optical projection module containing safety monitoring function Download PDFInfo
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- CN107991836A CN107991836A CN201711368910.5A CN201711368910A CN107991836A CN 107991836 A CN107991836 A CN 107991836A CN 201711368910 A CN201711368910 A CN 201711368910A CN 107991836 A CN107991836 A CN 107991836A
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- Prior art keywords
- conductive film
- transparent conductive
- transparent
- projection module
- transparent substrate
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B21/00—Projectors or projection-type viewers; Accessories therefor
- G03B21/14—Details
- G03B21/20—Lamp housings
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B21/00—Projectors or projection-type viewers; Accessories therefor
- G03B21/14—Details
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B21/00—Projectors or projection-type viewers; Accessories therefor
- G03B21/14—Details
- G03B21/20—Lamp housings
- G03B21/2086—Security or safety means in lamp houses
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N9/00—Details of colour television systems
- H04N9/12—Picture reproducers
- H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
- H04N9/3191—Testing thereof
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Computer Security & Cryptography (AREA)
- Geophysics And Detection Of Objects (AREA)
Abstract
The present invention provides a kind of optical projection module containing safety monitoring function, including：Light source, for launching light beam；Lens combination, for receiving the light beam of the light source transmitting, to project collimated light beam；Diffraction optical element, for receiving, collimated light beam described in beam splitting, with projective patterns light beam；Transparent substrate, surface attachment have transparent conductive film, are fixed on the top of the diffraction optical element；Control circuit, is electrically connected with the transparent conductive film, by monitoring the change of the transparent conductive film, and then assesses, judges the integrality of the transparent substrate and the luminance of the control light source.Optical projection module provided by the invention has the laser safety performance of higher.
Description
Technical field
The present invention relates to optics and opto-electronics, more particularly to a kind of optical projection module and its security control side
Method.
Technical background
The optical projection module of projection coding or structured bundle of light beams, is widely used in the 3-D scanning of object, space
The fields such as three-dimensional reconstruction, human-computer interaction.Optical projection module carries out target object by projection coding or the light beam of structuring
Space is demarcated, and gathers the information gathering of module for later image and the three-dimensional reconstruction of processor provides preparation.
For projecting the optical projection module of coding or structured bundle of light beams, light source and diffraction optical element are generally comprised
(DOE).Wherein, DOE is used for the light beam for receiving light source transmitting, and generates patterned beam in a manner of beam splitting, superposition.So-called figure
Case light beam is really a certain special case of coding or structured bundle of light beams, has uniform Energy distribution, high contrast and height not
The characteristics of correlation.Core components of the DOE as optical projection module, the quality of its performance directly decide optical projection module
The quality of the patterned beam projected, or even influence the precision of later stage three-dimensional reconstruction.
The optical projection module being integrated in consumer device, generally require complex environment, at a temperature of work, because
This, optical projection module or DOE are easy to the phenomenon damaged occur.It is on the other hand, artificial that to collide with, stagger along be also to accelerate DOE
Or an important factor for optical projection module damage.The optical projection module or DOE of damage would generally with single beam of intensive light or
Zero-order diffractive problem, if cannot in time find, handle, it is most likely that induce laser safety problem.
The content of the invention
The present invention is in order to solve the problems, such as laser safety that optical projection module is likely to occur in use, there is provided a kind of
Optical projection module and its method of controlling security.
Optical projection module provided by the invention includes：Light source, for launching light beam；Lens combination, for receiving and converging
The light beam of the poly- light source transmitting；Diffraction optical element, for receiving the light beam after lens combination convergence and projecting figure
Case light beam；Transparent substrate, is attached with transparent conductive film, is fixed on above the diffraction optical element；Wherein, it is described transparent
Conductive film has good resistive properties or electric conductivity；Control circuit, is electrically connected with the transparent conductive film and the light source
Connect, by monitoring the change of the transparent conductive film, assess the integrality of the transparent substrate, to control the hair of the light source
Light state.
Compared with prior art, beneficial effects of the present invention have：Transparent substrate is fixed on to the DOE of optical projection module
Light extraction side, and be electrically connected in its surface attachment transparent conductive film, transparent conductive film with control circuit；By monitoring in real time
The change of transparent conductive film, indirect assessment, the integrality for judging transparent substrate, and then to the luminance of optical projection module
Carry out security control.
Brief description of the drawings
Fig. 1 is a kind of structure diagram of optical projection module according to embodiments of the present invention.
Fig. 2 a are a kind of method of controlling security flow charts according to embodiments of the present invention.
Fig. 2 b are another method of controlling security flow charts according to embodiments of the present invention.
Fig. 3 is a kind of distribution pattern of transparent conductive film according to embodiments of the present invention.
Fig. 4 is another distribution pattern of transparent conductive film according to embodiments of the present invention.
Fig. 5 is a kind of structure diagram of optical projection module according to embodiments of the present invention.
Fig. 6 a are a kind of distribution modes of transparent conductive film 16e in Fig. 5.
Fig. 6 b are a kind of distribution modes of transparent conductive film 16d in Fig. 5.
Fig. 7 is a kind of structure diagram of optical projection module according to embodiments of the present invention.
Embodiment
The present invention is described in detail by specific embodiment below in conjunction with the accompanying drawings, for a better understanding of this hair
It is bright, but following embodiments are not intended to limit the scope of the invention.In addition, it is necessary to illustrate, the diagram provided in following embodiments
Only illustrate the basic conception of the present invention in a schematic way, the component related with the present invention is only shown in attached drawing rather than according to reality
Component count, shape during implementation and size are drawn, during its actual implementation shape, quantity and the ratio of each component can be it is a kind of with
The change of meaning, and its assembly layout form may also be increasingly complex.
Fig. 1 is a kind of structure diagram of optical projection module according to embodiments of the present invention.Optics in the embodiment
Project module, including base 10, light source 11, lens barrel 12, lens combination 13, DOE14, gasket 121, transparent substrate 15, transparent lead
Conductive film 16 and control circuit 18.Light source 11 is installed on base 10, launches light beam towards lens combination 13；Lens combination
13 beam modulations for launching light source 11 are collimated light beam, and directive DOE14；Collimated light beam is expanded, is superposed to pattern by DOE14
Change in light beam directive space.Further, transparent substrate 15 is arranged on the top of DOE14, is supported by gasket 121, is fixed；Thoroughly
Bright conductive film 16 is attached to the surface of transparent substrate 15, is electrically connected by plain conductor with control circuit 18；Control circuit 18
By contrast, analyze transparent conductive film 16 resistance variations or transparent conductive film between capacitance variation, assessment, judge
The integrality of transparent substrate 15, and the integrality according to transparent substrate 15, control the working status of optical projection module.
Base 10 provides a supporting role, and is generally used for installation light source 11 and carries lens barrel 12.In certain embodiments, bottom
Seat 10 is additionally operable to the heat dissipation and/or power supply of light source 11.Base 10 can be by the ceramics with heat conduction and/or conducting function, gold
One or more in category, alloy, plastic or other material are made.Preferably, base 10 by heat conduction function ceramics and printed circuit
Plate (PCB circuit board) is composed.
Light source 11 is bonded, is fixed on the side of base 10, for launching light beam.Light source 11 can be vertical cavity surface
The laser of transmitting or the edge-emitting laser on parallel resonance chamber surface, can launch the light of infrared, ultraviolet equiwavelength
Beam.In certain embodiments, light source 11 can also be that service life is long, the slow infrared or ultraviolet LED light source of optical attenuation.This hair
In bright embodiment, light source 11 preferably comprises the two dimensional VCSEL chip of at least one VCSEL light source, which can outwards throw
The infrared beam of ejected wave a length of 830nm or 940nm, and can realize that at least two is different according to relevant control circuit
Luminance.VCSEL array chip can be that nude film can also be by the chip after encapsulation, and difference lies in nude film is gathered around for both
There are the volume and thickness of smaller, and encapsulating chip then has more preferable stability and more easily connects.
Lens barrel 12 is pasted by epoxy glue, is fixed on 10 side of base, for isolating extraneous natural light and placement lens
The optical elements such as system 13, DOE14.Lens barrel 12 can be hollow square/rectangular parallelepiped structure or hollow circular cylinder
Either other suitable constructions are generally made by the one or more in the ceramics, plastics or alloy material of heat conduction.Specifically
Ground, lens barrel 12 can be integrally formed by Shooting Technique or stamping technique, can also split into several components, discrete processing
Combination forming.For the ease of the thermal conductive ceramic lens barrel of the encapsulation of lens combination 13, preferably separate structure.It is understood that
When assembling lens barrel 12, the geometry site of light source 11 and lens combination 13 should be considered, so that light source 11 is located at lens
Near the equivalent focal length of system 13.
Lens combination 13 is embedded in inside lens barrel 12, and the contact surface between lens combination 13 and lens barrel 12 can pass through epoxy
Glue bond is fixed, and can also be bolted, for receiving and converging the light beam of the transmitting of light source 11, in one embodiment,
Outwards projection collimated light beam.The lens combination 13 can only include a piece of lens, can also include that multi-disc is identical and/or different songs
The lens of rate.The material of lens can be transparent glass or resin or high molecular polymer.Preferably, lens system
System 13 includes the lens of two panels glass material.
DOE14 is process by transparent substrate, which etches or be embossed with diffraction pattern, is bonded by epoxy glue
The top of lens barrel 12 is fixed on, for receiving, the light beam that beam splitting is emitted after the convergence of lens combination 13, and outwards projects energy point
The patterned beam that cloth is uniform, contrast is high.When light source 11 includes multiple sub-light sources, DOE14 is used to be arranged sub-light source
Pattern by mirror image be superimposed in a manner of outwards project patterned beam.For manufacturing the transparent substrate of DOE14, its material can be with
It is glass or transparent plastic.In an embodiment of the present invention, the transparent substrate of the preferred glass materials of DOE14, which is used as, adds
Work raw material, surface etch or relief diffraction pattern in incident beam side.In some equivalent implementations, DOE14 includes
Two pieces or more than two pieces of glass or plastic, transparent substrate, the incidence of each piece of transparent substrate and/or the surface of outgoing beam
Etch or be embossed with diffraction pattern.
Gasket 121 is arranged on the top of DOE14, is adhesively fixed by epoxy glue, for carrying transparent substrate 15 and dividing
Every transparent substrate 15, DOE14.Gasket 121 can be hollow ring-type integrative-structure or block separate structure, generally
By having the function of that the one or more in the ceramics of heat conduction, metal, alloy, plastic or other material are process.It is to be appreciated that
The gasket 121 of separate structure, should include the consistent discrete gasket fritter of at least two specifications, so that transparent substrate 15 can
The steady top for being fixed on DOE14.For the ease of installing, the gasket in the embodiment of the present invention, it is therefore preferable to which there is thermal conductivity
Integral ceramic gasket.In some equivalent embodiments, optical projection module can not also include gasket 121.Specifically, can incite somebody to action
DOE14 is inlayed, is fixed on inside lens barrel, and using lens barrel design itself to support, fixed transparent substrate, with realize separate it is saturating
Bright substrate 15, the effect of DOE14.
Transparent substrate 15 is arranged on the top of gasket 121, is adhesively fixed by epoxy glue, for protect DOE14 to avoid
DOE14 is directly exposed in air.Specifically, the surface of transparent substrate 15 includes beam incident surface, beam exit face, at some
In embodiment, the one or more inclined end faces for being arranged on 15 longitudinal terminal surface of transparent substrate are further included.In some embodiments, thoroughly
DOE14 is sealed in lens barrel by bright substrate 15, gasket 121, further to reduce the interference of extraneous steam, dust to DOE performances.
Can be transparent glass, transparent plastic or other suitable materials for making the material of transparent substrate 15 similar to DOE14
Material.It is understood that since transparent substrate 15 is directly exposed in air, therefore it is required that the material for making transparent substrate 15
Matter must have stronger corrosion resistance, impact resistance, and will not cause actual shadow to the DOE14 patterned beams being emitted
Ring.It should be understood that transparent substrate described herein is actual it can be appreciated that the cover sheet that general module is included.
Transparent conductive film 16 is attached to transparent substrate 15 by the related feasible technique such as be deposited, be vapor-deposited or attach
Surface, there is good electric conductivity and/or resistive properties.It is to be appreciated that transparent conductive film 16 is to infrared beam, purple
Outer or other specific bands light beams have higher transmissivity.In an embodiment of the present invention, it is preferable that electrically conducting transparent is thin
Film 16 be preferably brittle transparent conductive film, and the transparent conductive film to infrared beam have be not less than 85% transmissivity,
Such as：ITO (tin indium oxide) or CTO (Cd2SnO4Cadmium stannate film) or CIO (CdIn2O4Metaindic acid cadmium film) film etc..Into
One step, the transparent conductive film 16 on 15 surface of transparent substrate is attached to, its distribution form can be distributed with random pattern, than
Such as, the distribution of grizzly bar shape, serpentine shape are distributed or are uniformly distributed, and do not limit specifically.
Control circuit 18 is electrically connected by plain conductor with transparent conductive film 16, light source 11, for measuring electrically conducting transparent
The integrality of film 16, and the working status of control light source 11 or optical projection module.The control circuit 18, includes CPU/
Microcontroller, register or other feasible logical operation devices, can carry out interrelated logic judgement, the storage of data and control
Operation, referring specifically to Fig. 2.In a kind of implementation, as shown in Figure 2 a, the measurement of control circuit interval (for example surveyed every 1s
Amount is once) resistance value or capacitance of transparent conductive film, and by the resistance value measured or capacitance and default safety threshold
Value section is compared, and judges whether its value exceedes secure threshold section, is such as exceeded secure threshold section, is then judged the transparent substrate
Integrality is damaged, and then controls the working status of optical projection module, i.e., makes relevant control to the luminance of light source, such as：
Close light source or reduce the luminous power of light source.In some equivalence enforcement methods, as shown in Figure 2 b, control circuit continuously measures
The resistance value or capacitance of transparent conductive film, by contrasting the resistance value or capacitance at current time and previous moment, judge
The integrality of transparent conductive film.Specifically, it is assumed that the resistance value that previous moment measures is R0Or capacitance is C0, when current
The resistance value that quarter measures is R or capacitance is C, then works as R-R0Or C-C0Value exceed default secure threshold or find R or
When significantly saltus step occurs suddenly in C, assert that the transparent substrate has damaged, and then control the working status of optical projection module,
Close light source or reduce the luminous power of light source.The benefit so set is that control circuit can in real time, quickly judge transparent
The integrality of substrate, with exclude it is in running order in, there is situation about damaging suddenly in transparent substrate.Control circuit 18 can be
Simple decision logic circuit or integrated circuit in the rigid circuit board of embedded base 10, are set with independent module
In 12 medial/lateral of lens barrel.In a kind of embodiment, control circuit is noted by continuous or compartment of terrain to the transparent conductive film
Enter low current, and the change in resistance of monitoring circuit, to judge the integrality of transparent conductive film, so as to infer the transparent substrate
Integrality.In some other embodiments, control circuit continues to inject constant or alternation to the transparent conductive film
Electric current, and detect voltage/capacitance variations of the transparent conductive film, to judge the integrality of transparent conductive film so that
Infer the integrality of the transparent substrate.Because transparent substrate 15 carries the effect of protection DOE, when extraneous environment, temperature hair
Changing, or the artificial damage colliding with, stagger along, being likely to result in transparent substrate 15；Once transparent substrate 15 is damaged,
It can not then recur to the effect of protection DOE, while DOE is there is also impaired possibility, so that the light beam of light source transmitting draws
Play security risk.By judging whether transparent substrate 15 is complete, and then judge whether DOE is in by the state of complete preservation or sentences
The integrality of disconnected whole optical projection module.
In a kind of structure diagram of optical projection module 100 shown in Fig. 1, transparent conductive film 16 is evenly affixed to
The upper surface (it should be understood that upper surface here refers to the beam exit face of transparent substrate) of transparent substrate 15 is with tilting
End face or notch 151, and pad/electrode 17 is set at inclined plane or notch 151.Transparent conductive film 16 passes through electrode 17
In the plain conductor access control circuit 18 that place is drawn.
In a kind of embodiment, control circuit 18 can be understood as the monitoring process of 15 integrality of transparent substrate：When saturating
When bright substrate 15 remains intact, the transparent conductive film 16 of transparent substrate upper surface is attached to, its resistive properties can be recognized
Surely it is invariable or is fluctuated in a rational resistance section, i.e., control circuit 18 monitors the resistance stabilization in circuit
In rational safe Resistance section.At this time, control circuit 18 keeps the normal luminous state of light source 11, and continues to monitor circuit
In resistance variations.When transparent substrate 15 occurs rupturing or damages, the electrically conducting transparent for being attached to 15 upper surface of transparent substrate is thin
The meeting of film 16 appearance at the same time is different degrees of to come off, is cracked, so as to cause the resistive properties of transparent conductive film 16 to occur significantly
Change, i.e., control circuit 18 monitors that the resistance in circuit crosses rational safe Resistance section.At this time, 18 basis of control circuit
The resistance value monitored deviates the degree in safe Resistance section, and selection reduces the luminous power of light source 11 or closes light source 11.
In similar to the optical projection module 100 shown in Fig. 1, transparent conductive film 16 can divide in another way
Cloth, referring particularly to Fig. 3.In a kind of embodiment, the form that transparent conductive film 16a can be distributed by grizzly bar shape is attached to
The upper surface of bright substrate 15.Wherein, transparent conductive film 16a includes at least two grizzly bars 161, and one end of each grizzly bar 161 is mutual
Conducting.It is understood that the grizzly bar quantity that transparent conductive film 16a is included is more, its resistance value is bigger.It is alternative at some
Embodiment in, transparent conductive film can also increase its resistance value by serpentine shape distribution.The benefit so set is,
On the one hand injection circuit value of the control circuit 18 to transparent conductive film 16a can further be reduced；In another aspect circuit more
Big monitoring resistor value is conducive to improve sensitivity of the control circuit 18 to transparent conductive film 16a Integrity Verifications.Specifically,
Control circuit 18 by temperature sensor (thermal resistance), can measure the change of the transparent conductive film 16a of grizzly bar shape distribution, with
Judge the integrality of transparent substrate 15 and control the luminance of light source 11.
Similarly, in the optical projection module 100 shown in Fig. 1, transparent conductive film can also be with interspersed grizzly bar shape
Mode is distributed, referring particularly to Fig. 4.In a kind of embodiment, the transparent conductive film 16b bags of 15 upper surface of transparent substrate are attached to
Include the transparent conductive film 16b and 16c of two relatively independent grizzly bar shape distributions.Wherein, transparent conductive film 16b (or 16c)
Including at least two grizzly bars 162 (or 163), and one end between each grizzly bar has identical electrode.It is different from Fig. 3 implementations
Mode, in the embodiment, the grizzly bar 162 and grizzly bar 163 between transparent conductive film 16b and transparent conductive film 16c are mutual
Interspersed distribution, so that transparent conductive film 16c and 16b forms interdigital capacitor.Specifically, transparent conductive film 16b passes through metal
In conducting wire access control circuit, driving electrodes are formed；And transparent conductive film 16c is hanging or grounding, induction electrode is formed.
Further, monitoring of the control circuit 18 to 15 integrality of transparent substrate, can be by measuring driving electrodes (grizzly bar) 162 and sense
The capacitance variations between the capacitance variations between electrode (grizzly bar) 163 or other grizzly bars are answered to assess, judge lens substrate 15
Integrality.
The benefit so set is, on the one hand, transparent need to only be led in the surface attachment of outgoing/incident beam of transparent substrate
Conductive film；On the other hand, sensitivity of the measurement with higher of the capacitance variations of single capacitance electrode arrangement, that is, contribute to be lifted
Sensitivity of the transparent conductive film to transparent substrate Integrity Verification.
In some alternate embodiments, the lower surface that transparent conductive film can also be attached to transparent substrate is (transparent
The plane of incidence of the light beam of substrate 15), its form being distributed can be uniformly distributed or with random pattern, distribution of shapes.
In some other alternate embodiments, the whole surface that transparent conductive film can also be attached to transparent substrate is (including upper and lower
Surface).The capacitance variations that control circuit can be formed according to the resistance variations or transparent conductive film of transparent conductive film, are weighed
The integrality of transparent substrate is judged, to realize the control of light source luminescent state.
Fig. 5 is a kind of structure diagram of optical projection module according to embodiments of the present invention.In the embodiment, optics is thrown
The structure of shadow module 200 is substantially similar with Fig. 1 embodiments, and difference lies in it is thin that optical projection module 200 includes electrically conducting transparent
Film 16d, 16e.Wherein, transparent conductive film 16d is attached to the upper surface of DOE14 (it should be understood that surface above here
Refer to the beam exit face of DOE14), transparent conductive film 16e be attached to transparent substrate 15 lower surface (transparent substrate 15
Beam incident surface), accessed respectively by plain conductor in control circuit 18a.
In a kind of embodiment, control circuit 18a injects low current to transparent conductive film 16d, 16e respectively, to obtain
The resistance value of transparent conductive film 16d, 16e, and the resistance R0 of transparent conductive film 16d is arranged to canonical reference resistance.Control
Circuit 18a processed is weighed, assessment by analyzing the change of the resistance of transparent conductive film 16e and the ratio of reference resistance R0 in real time
The integrality of transparent substrate 15 and the luminance for controlling light source.The benefit so set is, on the one hand, due to electrically conducting transparent
Film 16e is attached respectively to different optical element surfaces, therefore the optics member accompanying by the two from transparent conductive film 16d
The integrality of part will not cause to interfere with each other；On the other hand, by monitoring the resistance ratio of both transparent conductive film 16d, 16e
Value, can reduce influence of the external environment (such as change of temperature) to monitoring result (because the two residing environment mechanism is
The same, the method compared by numerical value can directly offset the change of outside environmental elements), so as to improve control circuit 18a
To the monitoring accuracy of 15 integrality of transparent substrate.
In another embodiment, transparent conductive film is evenly affixed to the whole upper surfaces of DOE14, and transparent conductive film is then
The whole lower surface of transparent substrate 15 is evenly affixed to, so that two discrete transparent conductive film planes form capacity plate antenna,
And accessed by plain conductor in control circuit.Control circuit judges transparent substrate indirectly by monitoring the change of capacity plate antenna
Integrality.
In another interchangeable embodiment, refering to Fig. 6 a and Fig. 6 b, transparent conductive film 16e1It is thin with electrically conducting transparent
Film 16d1Respectively with intert grizzly bar shape distribution form be attached to the lower surface of transparent substrate 15, DOE upper surface, with form
Two discrete interdigital capacitors corresponded.Specifically, discrete interdigital capacitor can be divided into two parts of upper and lower alignment；Wherein, under
Part is the first interdigital capacitor, and top is divided into the second interdigital capacitor.First (the second) interdigital capacitor includes driving electrodes 164
(166) and induction electrode 165 (167), driving electrodes 164 are corresponding with induction electrode 167, driving electrodes 166 and induced electricity
Pole 165 is corresponding.Monitorings of the control circuit 18a to discrete interdigital capacitor can specifically pass through：1st, driving electrodes 164 and sense are measured
The capacitance variations between electrode 167 are answered to realize；2nd, the capacitance variations measured between driving electrodes 166 and induction electrode 165 are real
It is existing；3rd, the capacitance measured between top or the driving electrodes 164 (166) and induction electrode 165 (167) of lower part interdigital capacitor becomes
Change and realize.
The benefit so set is that the change of discrete interdigital capacitor can be monitored by different measurement schemes with time-sharing multiplex
Change, further to lift sensitivity and flexibility ratio of the control circuit to transparent substrate Integrity Verification.
Fig. 7 is a kind of structure diagram of optical projection module according to embodiments of the present invention.Optics in the embodiment
The structure of projection module 300 is substantially similar with Fig. 3 embodiments, and difference lies in the optical projection module 300 includes transparent lead
Conductive film 16g, 16f and transparent conductive film 16i, 16h.Wherein, transparent conductive film 16g and transparent conductive film 16f divides
The upper surface of DOE14 and the lower surface of transparent substrate 15 are not attached to, and is accessed by financial conducting wire in control circuit, to form
The monitoring capacitance of one 15 integrality of monitoring transparent substrate is (it is to be appreciated that transparent conductive film 16g, 16f are equivalent to monitoring
Two electrodes of capacitance)；Wherein, transparent conductive film 16i and transparent conductive film 16h adheres to the upper and lower table of gasket 121 respectively
Face, and accessed by plain conductor in control circuit, to form a stable reference capacitance (it is to be appreciated that transparent lead
The electrode of conductive film 16i, 16h equivalent to reference capacitance).Since gasket 121 is for transparent substrate 15 and DOE14, it is
One discrete independent component, therefore the reference capacitance that transparent conductive film 16i, 16h are formed, its integrality/stability will not
Integrality/stability influence of capacitance is monitored be subject to transparent conductive film 16f, 16g composition.In a kind of embodiment, control
Circuit 18b judges the integrality of transparent substrate 15 by the ratio of contrastive detection capacitance and reference capacitance, and according to transparent
The complete luminance for sexually revising light source 11 of substrate 15.
The benefit so set is：By analyzing the change of ratio of the reference capacitance with monitoring capacitance, can effectively drop
Low extraneous factor (especially temperature) is improved assessment of the control circuit to transparent substrate integrality, is sentenced to monitoring the influence of capacitance
Disconnected accuracy rate.
Similarly, in some equivalent embodiments, the transparent conductive film 16g for being attached to 15 lower surface of transparent substrate can be with
The upper surface of transparent substrate 15 is arranged on, being similarly attached to the transparent conductive film 16f of the upper surface of DOE14 can also adhere to
In the diffraction pattern face of DOE14.
Traditional technological means, optical projection module provided by the invention are different from, its advantage is：Offer is attached with
The transparent substrate of transparent conductive film, transparent substrate are fixed on the DOE light extractions side of optical projection module by gasket.There is provided
Control circuit, is electrically connected by plain conductor with the transparent conductive film, to monitor the change of the resistance of transparent conductive film in real time
The capacitance variations that change or transparent conductive film are formed, indirect assessment, the integrality for judging transparent substrate.In addition, also add reference
Resistance or reference capacitance, further lift accuracy rate, sensitivity that control circuit judges transparent substrate integrality.Further
Ground, control circuit can carry out relevant control according to the integrality of transparent substrate to the luminance of optical projection module.
It should be understood that the above-mentioned embodiment referred to, the Integrity Verification of other optical elements can also be extended to, than
Such as：Applied to refraction optical element, reflective optical devices, diffraction optical element, polarization optical element, phase-shifted optical element it is complete
Whole property monitoring, can also be applied to the Integrity Verification of its a variety of optical element combination module.Its mode of texturing, does not do and has herein
Body limits, because being obvious for a person skilled in the art.It may be noted that according to the needs of implementation, can incite somebody to action
Each step/component described in this application is split as more multi-step/component, also can by two or more step/components or
The part operation of step/component is combined into new step/component, to achieve the object of the present invention.
Above content is that a further detailed description of the present invention in conjunction with specific preferred embodiments, it is impossible to is assert
The specific implementation of the present invention is confined to these explanations.For those skilled in the art, do not taking off
On the premise of from present inventive concept, some equivalent substitutes or obvious modification can also be made, and performance or purposes are identical, all should
When being considered as belonging to protection scope of the present invention.
Claims (10)
- A kind of 1. optical projection module, it is characterised in that including：Light source, for launching light beam；Lens combination, for receiving and converging the light beam of the light source transmitting；Diffraction optical element, for receiving light beam and projective patterns light beam after lens combination convergence；Transparent substrate, is attached with transparent conductive film, is fixed on above the diffraction optical element；Control circuit, is electrically connected with the transparent conductive film and the light source, by the change for monitoring the transparent conductive film Change, the integrality of the transparent substrate is assessed, to control the luminance of the light source.
- 2. optical projection module as claimed in claim 1, it is characterised in that the transparent conductive film is attached to described transparent The light beam incident end face of substrate and/or beam exit end face, and access in the control circuit.
- 3. optical projection module as claimed in claim 2, it is characterised in that the distribution pattern of the transparent conductive film includes One kind or more in uniform plane distribution pattern, grizzly bar shape distribution pattern, serpentine shape distribution pattern, interspersed grizzly bar shape distribution pattern The combination of kind.
- 4. optical projection module as claimed in claim 3, it is characterised in that the control circuit passes through continuously or discontinuously to institute Uniform plane distribution pattern or the transparent conductive film of grizzly bar shape distribution pattern or serpentine shape distribution pattern injection low current are stated, and Resistance variations in monitoring circuit, infer the integrality of the transparent substrate.
- 5. optical projection module as claimed in claim 3, it is characterised in that the control circuit by continuously or discontinuously to The transparent conductive film injection constant current or alternating current of the interspersed grizzly bar shape distribution pattern, and monitor the electrically conducting transparent The capacitance variations of film, infer the integrality of the transparent substrate.
- 6. optical projection module as claimed in claim 1, it is characterised in that the light beam incident end face of the diffraction optical element Or beam exit end face is attached with the first transparent conductive film；The light beam incident end face of the transparent substrate or beam exit end face It is attached with the second transparent conductive film；First transparent conductive film accesses the control with second transparent conductive film In circuit.
- 7. optical projection module as claimed in claim 6, it is characterised in that the control circuit is saturating by monitoring described second The change of bright conductive film and the resistance ratio of first transparent conductive film, assesses the integrality of the transparent substrate, and Control the luminance of the light source.
- 8. optical projection module as claimed in claim 6, it is characterised in that first transparent conductive film and described second Transparent conductive film forms the monitoring capacitance of the transparent substrate；The control circuit is become by monitoring the capacitance of the capacitance Change, assess the integrality of the transparent substrate, and control the luminance of the light source.
- 9. optical projection module as claimed in claim 6, it is characterised in that the transparent substrate is fixed on by pad support Above the diffraction optical element, the gasket upper surface and lower surface are attached with the 3rd transparent conductive film and transparent are led with the 4th Conductive film；3rd transparent conductive film is accessed in the control circuit with the 4th transparent conductive film, forms reference Capacitance；First transparent conductive film forms the monitoring capacitance of the transparent substrate with second transparent conductive film.
- 10. optical projection module as claimed in claim 9, it is characterised in that the control circuit is by monitoring the monitoring The change of capacitance and the ratio of the reference capacitance, assesses the integrality of the transparent substrate, and controls shining for the light source State.
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| WO2020038066A1 (en) * | 2018-08-22 | 2020-02-27 | Oppo广东移动通信有限公司 | Light projector and method for detecting rupture thereof, and depth camera and electronic device |
| CN109240029A (en) * | 2018-09-12 | 2019-01-18 | 深圳阜时科技有限公司 | A kind of optical projection mould group, sensing device and equipment |
| CN109406577A (en) * | 2018-09-12 | 2019-03-01 | 深圳阜时科技有限公司 | A kind of detection method |
| CN109269773A (en) * | 2018-09-13 | 2019-01-25 | 深圳阜时科技有限公司 | A kind of detection unit |
| CN109543515A (en) * | 2018-10-15 | 2019-03-29 | 华为技术有限公司 | Optical element and its monitoring system and method, active illuminating module, terminal |
| CN110175499A (en) * | 2018-10-15 | 2019-08-27 | 华为技术有限公司 | Optical element and its monitoring system and method, active illuminating module, terminal |
| CN110175499B (en) * | 2018-10-15 | 2024-09-03 | 华为技术有限公司 | Optical element, monitoring system and method thereof, active light emitting module and terminal |
| CN111090177A (en) * | 2018-10-24 | 2020-05-01 | 奇景光电股份有限公司 | Diffraction optical element module |
| CN109506894A (en) * | 2018-10-31 | 2019-03-22 | 深圳奥比中光科技有限公司 | Optics module safety monitoring assembly |
| CN109445231A (en) * | 2018-11-20 | 2019-03-08 | 深圳奥比中光科技有限公司 | A kind of depth camera and depth camera guard method |
| US20220146084A1 (en) * | 2019-03-27 | 2022-05-12 | Ams Sensors Singapore Pte. Ltd. | Safety interlock system for illumination systems |
| US11614227B2 (en) * | 2019-03-27 | 2023-03-28 | Ams Sensors Singapore Pte. Ltd. | Safety interlock system for illumination systems |
| CN110187596A (en) * | 2019-06-26 | 2019-08-30 | 业成科技（成都）有限公司 | Optical projection apparatus and electronic equipment |
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