CN107765117A - A kind of test device and method of optical module self-healing - Google Patents
A kind of test device and method of optical module self-healing Download PDFInfo
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- CN107765117A CN107765117A CN201710862600.2A CN201710862600A CN107765117A CN 107765117 A CN107765117 A CN 107765117A CN 201710862600 A CN201710862600 A CN 201710862600A CN 107765117 A CN107765117 A CN 107765117A
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- 230000003287 optical effect Effects 0.000 title claims abstract description 206
- 238000012360 testing method Methods 0.000 title claims abstract description 133
- 238000000034 method Methods 0.000 title claims abstract description 22
- 230000002159 abnormal effect Effects 0.000 claims description 23
- 238000010998 test method Methods 0.000 claims description 5
- 230000005540 biological transmission Effects 0.000 claims description 4
- 230000011664 signaling Effects 0.000 claims 1
- 238000004891 communication Methods 0.000 abstract description 12
- 230000005611 electricity Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
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- 238000012795 verification Methods 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
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- 230000004888 barrier function Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
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- 238000011056 performance test Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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Abstract
The invention discloses a kind of test device and method of optical module self-healing, including power supply and signal generator, it is related to field.This test device also includes：Test board, it which is provided with power interface, high-speed differential signal interface and indicator unit, power interface and be connected with power supply, high-speed differential signal interface is connected with signal generator；Optical module interface, it is on test board, optical module interface connects power interface, high-speed differential signal interface and indicator unit respectively, optical module to be tested connects optical module interface, optical module interface is used to high-speed differential signal caused by test voltage caused by power supply and signal generator is inputted into optical module to be tested respectively, is additionally operable to receive the output signal of the status-pin of optical module to be tested and is output to indicator unit.The self-healing of optical module after the present invention can fully verify abnormity of power supply and recover, avoid breaking down in actual applications the problem of can not recovering, it is ensured that communication quality.
Description
Technical field
The present invention relates to communication technical field, test device and the side of a kind of optical module self-healing are specifically related to
Method.
Background technology
With the high speed development of optical communication technique, SFP device SFP (Small Form-factor
Pluggable)/SFP+ optical modules turn into miscellaneous service light so that its is low in energy consumption, encapsulates the advantages of small and interface specification is succinct and received
The preferred packing forms of a volume data Communication ray module are sent out, are widely applied in telecommunications and field of data communication.SFP/SFP
+ optical module is made up of receiving portion, emitting portion and control section, and transmitting terminal converts electrical signals into optical signal, passes through light
After fibre transmission, optical signal is converted into electric signal by receiving terminal again, and the major function of control section is to light-receiving and emission part
Divide and do initial configuration and monitor the working condition of real-time optical module, while communicated with optical module host computer.
The problem of in order to find to exist early before optical module batch application, reduce the event of optical module in actual applications
Barrier, the function and performance verification of optical module are to apply preceding most important link, not only need to test optical module in normal work ring
Performance indications under border, it is also necessary to verify the fault-tolerance of optical module, so as to increase the robustness of optical module in the application, ensure light
Module correctly can work and communicate in various complicated application scenarios uninterruptedly.At present common light module test method be
Optical module performance test in the range of optical module power supply (3.3V ± 5%).Power supply unexpected abnormality in being worked for optical module
The common testing methods of situation are：After the equipment complete machine power-down rebooting or optical module power-down rebooting of optical module adaptation, pass through
Whether optical module can recover normal work to confirm optical module self-healing.But the laser of emitting portion driving core
The operating voltage range of piece (Laser Diode Driver, LD) and the micro-control unit chip (Micro of optical module control section
Control Unit, MCU) operating voltage range it is not quite identical.Which results in SFP/SFP+ optical modules in abnormal electrical power supply
Afterwards during self- recoverage, micro-control unit chip operation is normal and operation irregularity occurs in laser driving chip, so as to cause optical module
Normal work can not be recovered.Therefore, existing method of testing has uncertain for the working power environment of optical module power-down rebooting
Property, the integrity verification to optical module power supply environment can not be accomplished.
The content of the invention
For defect present in prior art, it is a primary object of the present invention to provide a kind of optical module self-healing
Test device and method, can fully verify abnormity of power supply and recover after optical module self-healing, avoid due to optical mode
Block test incomplete the problem of can not recovering of causing to break down in actual applications, it is ensured that communication quality.
The present invention provides a kind of test device of optical module self-healing, including power supply and signal generator, the survey
Trial assembly, which is put, also to be included：
Test board, it which is provided with power interface, high-speed differential signal interface and indicator unit, the power interface and electricity
Source is connected, and the high-speed differential signal interface is connected with signal generator；
Optical module interface, on the test board, the optical module interface connects the power interface, high speed respectively for it
Differential signal interface and indicator unit, optical module to be tested connect the optical module interface, and the optical module interface is used to divide
High-speed differential signal caused by test voltage caused by power supply and signal generator is not inputted into optical module to be tested, is additionally operable to
Receive the output signal of the status-pin of optical module to be tested and be output to the indicator unit.
On the basis of above-mentioned technical proposal, the test board is PCB；The indicator unit includes to be tested
Optical module is without receipts light LOS warning lights, optical module to be tested indicator lamp not in place and power supply indicator.
On the basis of above-mentioned technical proposal, the optical module interface is integrated device, and it includes：
Power supply circuit, its input connection power supply, its output end connect the power pin of optical module to be tested；
High-speed-differential circuit, its high-speed differential signal pin respectively with signal generator and optical module to be tested are connected；
Status signal circuit, its input are connected with the status-pin of optical module to be tested, the status signal circuit
Output end is connected with the indicator unit.
On the basis of above-mentioned technical proposal, the status-pin of optical module to be tested includes the transmission pass of optical module to be tested
Close enabled Tx_disable pins, LOS pins and TX_Fault pins.
On the basis of above-mentioned technical proposal, the test device also includes the test microcontroller on the test board
The micro-control unit of device, the test microcontroller and optical module to be tested is communicated to connect by I2C interface between integrated circuit.
On the basis of above-mentioned technical proposal, the test microcontroller is connected by GPIO interface and the optical module interface
Connect, the output signal of the status-pin for receiving optical module to be tested.
On the basis of above-mentioned technical proposal, the optical module interface is also connected with the control pin of optical module to be tested,
The test microcontroller is connected by GPIO interface with the optical module interface, the control pin output to optical module to be tested
Control signal.
The present invention also provides a kind of test of the test device using optical module self-healing as claimed in claim 1
Method, the method for testing comprise the following steps：
Optical module to be tested is connected with optical module interface；
Test voltage is adjusted to normal working voltage scope, the normal work of optical module to be tested is judged by indicator unit
Make；
Test voltage is adjusted in abnormal work voltage range, in the abnormal work voltage range, light to be tested
The laser driving chip of module can not normal work, but micro-control unit normal work shown by indicator unit and treated
Test optical module operation irregularity；
Test voltage returns to normal working voltage scope, judge optical module to be tested whether normal work.
On the basis of above-mentioned technical proposal, the method for determining the abnormal work voltage range is：Adjust test voltage
Magnitude of voltage, treat test optical module detected, when optical module operation irregularity to be tested, the magnitude of voltage of discriminating test voltage
In the abnormal work voltage range.
On the basis of above-mentioned technical proposal, the test device also includes test microcontroller, in the abnormal work
In voltage range, the test microcontroller obtains the parameter value of the internal register of optical module to be tested.
Compared with prior art, advantages of the present invention is as follows：
(1) by adjust the magnitude of voltage of test voltage treat test optical module tested, can accurately determine to be tested
The laser driving chip of optical module can not normal work, but the abnormal work voltage range of micro-control unit normal work.
(2) by the way that first test voltage is adjusted in abnormal work voltage range, then test voltage is returned to normally
Operating voltage range, judge optical module to be tested whether normal work.Optical module after abnormity of power supply can fully be verified and recovered
Self-healing, avoid due to optical module test it is incomplete cause to break down in actual applications can not recover the problem of,
Ensure communication quality.
(3) parameter value of optical module internal register to be tested is obtained by testing microcontroller, can be in test process
In its working condition confirmed by the special setting field of optical module, and analyze the reason for drawing optical module operation irregularity and determination
Solution method.
Brief description of the drawings
Fig. 1 is the test device schematic diagram of SFP optical module self-healings of the embodiment of the present invention；
Fig. 2 is the method for testing flow chart of SFP optical module self-healings of the embodiment of the present invention.
Reference：
Test board 1, power interface 11, high-speed differential signal interface 12, indicator unit 13, optical module interface 2, test are micro-
Controller 3, optical module 4 to be tested, power supply 5, signal generator 6.
Embodiment
Below in conjunction with the accompanying drawings and specific embodiment the present invention is described in further detail.
Shown in Figure 1, the embodiment of the present invention provides a kind of test device of optical module self-healing, this test device
Including test board 1, optical module interface 2, power supply 5 and signal generator 6.On test board 1, test board 1 divides optical module interface 2
Not Lian Jie power supply 5 and signal generator 6, optical module 4 to be tested connects optical module interface 2.
Test board 1 can be printed circuit board (PCB) (Printed Circuit Board, PCB), and test board 1 is provided with power supply
Interface 11, high-speed differential signal interface 12 and indicator unit 13.Power interface 11 is connected with power supply 5, and power supply 5 is used to produce survey
Voltage is tried, test voltage is no more than the normal working voltage of optical module 4 to be tested, the normal working voltage of SFP and SFP+ optical modules
For 3.3V ± 5%, corresponding test voltage scope arrives 3.3V ± 5% for 0.High-speed differential signal interface 12 and signal generator 6
Connection, signal generator 6 are used to produce the high-speed differential signal suitable for optical module 4 to be tested, it is possible to achieve optical mode to be tested
Block 4 is by the connection of test board 1 and signal generator 6 or realizes the high speed signal of optical module 4 to be tested from ring (optical module
Emission port and receiving port docking get up).In order to ensure signal impedance and electrical level match, multi-source agreement (Multi- is selected
Source Agreement, MSA) head is as high-speed differential signal interface 12.Power switch can also be set on test board 1, just
The switching manipulation of test voltage is carried out in tester.Test board 1 is provided with the instruction for showing the working condition of optical module 4 to be tested
Lamp unit 13, tester is facilitated quickly to judge the working condition of optical module 4 to be tested in test process.Indicator unit 13
Do not indicated in place without receipts light LOS warning lights (red), SFP/SFP+ optical modules to be tested including SFP/SFP+ optical modules to be tested
Lamp (red), power supply indicator (green) and other status indicator lamps.
Optical module interface 2 connects power interface 11, high-speed differential signal interface 12 and indicator unit 13, optical module respectively
Interface 2 is used for respectively that high-speed differential signal input caused by test voltage caused by power supply 5 and signal generator 6 is to be tested
Optical module 4, receive the output signal of the status-pin of optical module 4 to be tested and be output to indicator unit 13.
Optical module interface 2 includes power supply circuit, high-speed-differential circuit and status signal circuit, and the input of power supply circuit connects
Power supply 5 is connect, output end connects with the power pin of optical module 4 to be tested.High-speed-differential circuit connects the He of signal generator 6 respectively
The high-speed differential signal pin of optical module 4 to be tested.The status-pin of the input of status signal circuit and optical module 4 to be tested
Connection, the output end of status signal circuit are connected with indicator unit 13.
Optical module interface 2 is integrated device, the power supply circuit of optical module interface 2 according to SFP/SFP+ optical modules power supply unit
Split-phase closes protocol requirement design, and high-speed-differential circuit is set according to the HW High Way relevant portion agreement of SFP/SFP+ optical modules
Meter, status signal circuit design according to the control of SFP/SFP+ optical modules and status sections related protocol.
Transmission closing enabled Tx_disable pin of the status-pin of optical module 4 to be tested including optical module 4 to be tested,
LOS pins and TX_Fault pins.Such as send and close enabled Tx_disable pins, by monitoring and controlling the Tx_
The level value of disable pins obtains the luminance of optical module 4 to be tested.During laser fails, TX_Fault pins
Output signal is high level, is low level during normal work.In addition, Tx_disable pins as control pin can also by with
In controlling the optical port switching function of optical module 4 to be tested by operating the level state of the Tx_disable pins to realize.Treat
The first serial communication interface pin MOD-DEF1, the second serial communication interface can also be included by testing the status-pin of optical module 4
Pin MOD-DEF2 and ground connection MOD-DEF0.
By adjusting the magnitude of voltage of test voltage, be not only able to determine laser driving chip can not normal work, still
The abnormal work voltage range of micro-control unit normal work, and can fully verify optical module after the exception of power supply 5 and recovery
Self-healing, avoid due to optical module test it is incomplete cause to break down in actual applications can not recover the problem of,
Ensure communication quality.
This test device can also include the test microcontroller 3 on test board 1, and test microcontroller 3 includes electricity
Source partial circuit, control section circuit and I2C interface, for realizing test microcontroller 3 and the microcontroller list of optical module 4 to be tested
Member communication.Test microcontroller 3 be used for pass through integrated circuit between I2C (Inter-Integrated Circuit, I2C) interfaces with
The micro-control unit communication connection of optical module 4 to be tested.The inside of optical module 4 to be tested deposit is obtained by testing microcontroller 3
The parameter value of device, its working condition can be confirmed by the special setting field of optical module in test process, and analyze and draw
The reason for optical module operation irregularity and determination solution method.
USB interface can also be set on test board 1, and USB interface is connected with test microcontroller 3 so that tester can
To access each register value of optical module 4 to be tested by software by computer, can confirm to be measured in optical module certification
The working condition of optical module 4 is tried, while can confirm that the value in optical module 4 to be tested in special setting field is done and confirm, and is analyzed
The reason for drawing optical module operation irregularity and determination solution method.In order to facilitate test, USB interface and power interface 11, power supply
Switch can be arranged on the same side of test board 1.
Test microcontroller 3 passes through general input/output port GPIO (General Purpose Input Output) interface
It is connected with optical module interface 2, specifically, the output end of status signal circuit is also connected with testing the GPIO interface of microcontroller 3,
For the output signal for the status-pin for receiving optical module 4 to be tested.
Control pin of the optical module interface 2 also with optical module 4 to be tested is connected, and test microcontroller 3 passes through GPIO interface
It is connected with optical module interface 2, the control pin output control signal to optical module 4 to be tested.Specifically, status signal circuit
Control pin of the input also with optical module 4 to be tested is connected.
Optical module 4 to be tested is connected by optical module interface 2 with test board 1, for optical module 4 to be tested provide working power,
High-speed differential signal and control signal and reception state signal.It is that single-chip microcomputer and its peripheral components form to test microcontroller 3,
Test microcontroller 3 is led to as host computer by I2C interface between integrated circuit and the inside micro-control unit of optical module 4 to be tested
Letter, while be managed by GPIO interface to treat the control pin of test optical module 4 and status-pin.On test board 1 also
The reset switch of the inside micro-control unit of optical module 4 to be tested can be provided, multiple power sources electricity can be tested using power switch
Press the robustness of optical module under abnormal environment.For test board 1, it will usually the support of test board 1 is installed, to facilitate test to place.
In order to improve testing efficiency, multiple optical module interfaces 2 can be installed on test board 1, while to multiple to be tested
Optical module 4 is tested, and each optical module interface 2 can configure corresponding test microcontroller 3.
Shown in Figure 2, the embodiment of the present invention also provides a kind of method of testing of optical module self-healing, this test side
Method comprises the following steps：
S1. optical module 4 to be tested is connected with optical module interface 2.
S2. startup power supply 5 and signal generator 6, signal generator 6 produce the high speed difference suitable for optical module 4 to be tested
Sub-signal, test voltage is adjusted to the normal working voltage scope of optical module 4 to be tested, judges to treat by indicator unit 13
Test the normal work of optical module 4.
S3. power supply 5 is adjusted, test voltage is adjusted in abnormal work voltage range, in abnormal work voltage range,
The laser driving chip of optical module 4 to be tested can not normal work, but micro-control unit normal work passes through indicator lamp list
The display of member 13 operation irregularity of optical module 4 to be tested.
S4. power supply 5 is adjusted, test voltage is returned into normal working voltage scope, judges to treat by indicator unit 13
Test optical module 4 whether normal work.
Before step S1, it is thus necessary to determine that abnormal work voltage range, the method for determining abnormal work voltage range are：Adjust
The magnitude of voltage of whole test voltage, treat test optical module 4 using optical detecting unit and detected, when optical module 4 to be tested is not sent out
Light or it is luminous abnormal when, the magnitude of voltage of discriminating test voltage is in abnormal work voltage range.
Test optical module 4 is treated when being tested, can be connected using optical detecting unit with optical module 4 to be tested by optical fiber
Connect, optical detecting unit be used for judge optical module 4 to be tested under test voltage whether normal luminous.
This method of testing also includes：
S5. in abnormal work voltage range, test microcontroller 3 obtains the internal register of optical module 4 to be tested
Parameter value, and it is output to computer.
The present invention is not limited to the above-described embodiments, for those skilled in the art, is not departing from
On the premise of the principle of the invention, some improvements and modifications can also be made, these improvements and modifications are also considered as the protection of the present invention
Within the scope of.The content not being described in detail in this specification belongs to prior art known to professional and technical personnel in the field.
Claims (10)
1. a kind of test device of optical module self-healing, including power supply and signal generator, it is characterised in that the test
Device also includes：
Test board, which is provided with power interface, high-speed differential signal interface and indicator unit, and the power interface connects with power supply
Connect, the high-speed differential signal interface is connected with signal generator；
Optical module interface, on the test board, the optical module interface connects the power interface, high-speed-differential respectively for it
Signaling interface and indicator unit, optical module to be tested connect the optical module interface, and the optical module interface is used to respectively to
High-speed differential signal caused by test voltage caused by power supply and signal generator inputs optical module to be tested, is additionally operable to receive
The output signal of the status-pin of optical module to be tested is simultaneously output to the indicator unit.
2. the test device of optical module self-healing as claimed in claim 1, it is characterised in that：The test board is PCB
Circuit board；The indicator unit includes optical module to be tested without receipts light LOS warning lights, optical module to be tested indicator lamp not in place
And power supply indicator.
3. the test device of optical module self-healing as claimed in claim 1, it is characterised in that the optical module interface is
Integrated device, it includes：
Power supply circuit, its input connection power supply, its output end connect the power pin of optical module to be tested；
High-speed-differential circuit, its high-speed differential signal pin respectively with signal generator and optical module to be tested are connected；
Status signal circuit, its input are connected with the status-pin of optical module to be tested, the output of the status signal circuit
End is connected with the indicator unit.
4. the test device of optical module self-healing as claimed in claim 1, it is characterised in that：The shape of optical module to be tested
Enabled Tx_disable pins, LOS pins and TX_Fault pins are closed in the transmission that state pin includes optical module to be tested.
5. the test device of the optical module self-healing as described in any one of Claims 1-4, it is characterised in that：The survey
The test microcontroller also included on the test board is put in trial assembly, and the test microcontroller is micro- with optical module to be tested
Control unit is communicated to connect by I2C interface between integrated circuit.
6. the test device of optical module self-healing as claimed in claim 5, it is characterised in that：The test microcontroller
It is connected by GPIO interface with the optical module interface, the output signal of the status-pin for receiving optical module to be tested.
7. the test device of optical module self-healing as claimed in claim 5, it is characterised in that：The optical module interface is also
It is connected with the control pin of optical module to be tested, the test microcontroller is connected by GPIO interface and the optical module interface
Connect, the control pin output control signal to optical module to be tested.
8. a kind of method of testing of test device using optical module self-healing as claimed in claim 1, its feature exist
In the method for testing comprises the following steps：
Optical module to be tested is connected with optical module interface；
Test voltage is adjusted to normal working voltage scope, optical module normal work to be tested is judged by indicator unit；
Test voltage is adjusted in abnormal work voltage range, in the abnormal work voltage range, optical module to be tested
Laser driving chip can not normal work, but micro-control unit normal work shown to be tested by indicator unit
Optical module operation irregularity；
Test voltage returns to normal working voltage scope, judge optical module to be tested whether normal work.
9. the method for testing of optical module self-healing as claimed in claim 8, it is characterised in that determine the abnormal work
The method of voltage range is：The magnitude of voltage of test voltage is adjusted, test optical module is treated and is detected, when optical module work to be tested
When making abnormal, the magnitude of voltage of discriminating test voltage is in the abnormal work voltage range.
10. the method for testing of optical module self-healing as claimed in claim 8, it is characterised in that：The test device is also
Including testing microcontroller, in the abnormal work voltage range, the test microcontroller obtains optical module to be tested
The parameter value of internal register.
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| CN201710862600.2A CN107765117B (en) | 2017-09-22 | 2017-09-22 | A kind of test device and method of optical module self-healing |
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| CN107765117B CN107765117B (en) | 2019-09-17 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108646169A (en) * | 2018-05-15 | 2018-10-12 | 深圳极智联合科技股份有限公司 | A kind of BOSA test methods and system |
| CN110121122A (en) * | 2019-05-10 | 2019-08-13 | 南京牛芯微电子有限公司 | A kind of control method and system of optical module |
| CN111740783A (en) * | 2020-05-12 | 2020-10-02 | 杭州兰特普光电子技术有限公司 | Automatic calibration system and method for adjustable laser with protection |
| CN118275744A (en) * | 2024-06-03 | 2024-07-02 | 成都光创联科技有限公司 | Optical device test protection circuit and optical device test system |
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| CN105991184A (en) * | 2015-02-05 | 2016-10-05 | 四川泰瑞创通讯技术股份有限公司 | Self-recovery method of disabled transmitting terminal of optical module during OTDR test |
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| CN201976107U (en) * | 2011-03-02 | 2011-09-14 | 利尔达科技有限公司 | SFP (Small Formfactor Pluggable) + type optical communication testing device |
| CN103983821A (en) * | 2014-04-18 | 2014-08-13 | 烽火通信科技股份有限公司 | High-frequency performance test structure for pluggable optical module connector |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108646169A (en) * | 2018-05-15 | 2018-10-12 | 深圳极智联合科技股份有限公司 | A kind of BOSA test methods and system |
| CN110121122A (en) * | 2019-05-10 | 2019-08-13 | 南京牛芯微电子有限公司 | A kind of control method and system of optical module |
| CN110121122B (en) * | 2019-05-10 | 2022-04-19 | 南京牛芯微电子有限公司 | Optical module control method and system |
| CN111740783A (en) * | 2020-05-12 | 2020-10-02 | 杭州兰特普光电子技术有限公司 | Automatic calibration system and method for adjustable laser with protection |
| CN111740783B (en) * | 2020-05-12 | 2021-07-06 | 杭州兰特普光电子技术有限公司 | Automatic calibration system and method for adjustable laser with protection |
| CN118275744A (en) * | 2024-06-03 | 2024-07-02 | 成都光创联科技有限公司 | Optical device test protection circuit and optical device test system |
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|---|---|
| CN107765117B (en) | 2019-09-17 |
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