CN107462184B - A kind of the parameter recalibration method and its equipment of structured light three-dimensional measurement system - Google Patents
A kind of the parameter recalibration method and its equipment of structured light three-dimensional measurement system Download PDFInfo
- Publication number
- CN107462184B CN107462184B CN201710695449.8A CN201710695449A CN107462184B CN 107462184 B CN107462184 B CN 107462184B CN 201710695449 A CN201710695449 A CN 201710695449A CN 107462184 B CN107462184 B CN 107462184B
- Authority
- CN
- China
- Prior art keywords
- projector
- camera
- parameter
- structured light
- error
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
A kind of the parameter recalibration method and its equipment of structured light three-dimensional measurement system increase auxiliary camera in the system with a camera and a projector and carry out recalibration to projector intrinsic parameter.High-precision white plate, projector projects structured light patterns are placed, original system camera and auxiliary camera acquire white plate pattern.Double camera is demarcated first, obtains auxiliary camera parameter;Secondly white plate is rebuild according to principle of stereoscopic vision using the photo of shooting, on the Dian Yun back projection of reconstruction to projector is practised physiognomy again, calculate corresponding projected phase, and it makes the difference to obtain phase residual error value with its actual phase, the error amount of projector transverse direction equivalent focal length and lateral optical center is finally calculated using the principle of least square, the recalibration for completing projector intrinsic parameter, improves the stated accuracy of structured light three-dimensional measurement system.
Description
Technical field
The present invention relates to the projector intrinsic parameter recalibration methods and its equipment in a kind of structured light three-dimensional measurement system, belong to
In technical field of computer vision.
Background technique
Structured light three-dimensional measurement system is a kind of important three-dimension measuring system in computer vision field, have quickly,
Assemble simple, high-precision feature.And the precision of system parameter then directly determines the measurement accuracy of system.
The parameter of structured light three-dimensional measurement system is obtained by demarcating, and the superiority and inferiority of scaling method, which directly determines, to be obtained
System parameter precision.The calibration of system at present mainly includes two parts, respectively camera calibration and projector calibrating.Phase
The research of machine calibration is long-standing, and classical method has the plane of Method of Direct Liner Transformation, the two-stage calibration method of Tsai, Zhang Zhengyou
Standardization and self-calibrating method etc..It is the most commonly used and mature with the plane reference method of Zhang Zhengyou at present, form different languages
Say tool box.Projector calibrating is the scaling method based on camera to complete, and different researchers establish different for projector
Mathematical model simultaneously gives corresponding scaling method, wherein more commonly one is projector is considered as a reversed phase
Machine enables projector " to shoot " photo, then demarcates to projector by the method for structure light.The mark of projector at present
Fixed still immature, above method proj ector parameters error obtained is often the several times of camera parameter error, this is also current
The measurement accuracy of structured light three-dimensional measurement system, the measuring system being especially made of a camera and a projector is not high
Main cause.
Summary of the invention
Existing projector calibrating technology there are aiming at the problem that, the invention proposes a kind of structured light three-dimensional measurement systems
The recalibration method and apparatus of middle projector intrinsic parameter, technical solution are as follows:
A kind of parameter recalibration method of structured light three-dimensional measurement system, structured light three-dimensional measurement system include a camera
With a projector, it is characterised in that: demarcated for the first time to the proj ector parameters in structured light three-dimensional measurement system first, so
An auxiliary camera is added in structured light three-dimensional measurement system afterwards, based on to intrinsic parameter in the first calibration process of proj ector parameters
Parameter error is attributed to the error of lateral principal point and lateral equivalent focal length in projector intrinsic parameter, then divided by the analysis of error
The specific influence of lateral principal point and lateral equivalent focal length both intrinsic parameter errors for system is precipitated, is marked again by auxiliary camera
The intrinsic parameter of projector is determined, to improve the stated accuracy of structured light three-dimensional measurement system;The following steps are included:
1) camera and projector are built into structured light three-dimensional measurement system, just deutero-albumose is carried out to the parameter of projector
Fixed, projector is projected one group of grating to testee, that is, scaling board and is obtained using phase measuring profilometer method through testee
That is the phase of scaling board case depth modulation, direct reverse obtains world coordinates accordingly:
Wherein, fcx,fcy,fpxRespectively represent the lateral equivalent focal length, longitudinal equivalent focal length and the transverse direction of projector etc. of camera
Imitate focal length;cccx,cccy,ccpxRespectively represent the lateral principal point of the lateral principal point of camera, longitudinal principal point and projector;Xw,Yw,Zw
Represent coordinate value of the certain point under world coordinate system in space;Due to fpxWith ccpxSeparately include error delta f and Δ cc, Δ
F=fT-fpx,fTFor fpxTrue value, Δ cc=ccT-ccpx, ccTFor ccpxTrue value, therefore the weight obtained by formula (1)~(3)
Cloud of laying foundations also includes error;R in formula (1)~(3)i,mj,tkBy Rc,Tc,Rp,TpIt obtains, wherein ri=r1~r9, mj=m1
~m9, tk=t1~t6, Rc,TcRepresent the spin matrix and translation vector of camera, Rp,TpRepresent the spin matrix peace of projector
The amount of shifting to, concrete form are as follows:
2) auxiliary camera, the position of setting are added in the structured light three-dimensional measurement system that a camera and projector are constituted
Basic demand is that auxiliary camera and original camera take scaling board simultaneously, and scaling board is placed in auxiliary camera and original camera
In tested region, combined calibrating is carried out to the dual camera systems being made of auxiliary camera and former camera, obtains the interior of auxiliary camera
Outer parameter matrix between parameter matrix and two cameras;
3) scaling board is measured and is rebuild, start projector projects grating pattern, two cameras acquire calibration respectively
Plate image is based on principle of stereoscopic vision, carries out rebuilding acquisition three dimensional point cloud PA to scaling board using the image of two cameras;
4) the three dimensional point cloud PA of acquisition is calculated according to projection equation and is projected in the projection plane of projector, obtained
uFAnd Xn, wherein uFThe column coordinate after projection plane, X are projected to for the proj ector parameters of the included error of three dimensional point cloud PAn
It indicates normalization projector coordinates, is defined as Xn=(Xp/Zp);According further to projector projects pattern phase and projection plane
One-to-one relationship directly obtains up, upColumn coordinate for the projector projects plane directly calculated by phase considers to sit in the world
An arbitrary point C in given space under mark systemw, remember Cw=[Xw Yw Zw] indicate coordinate of this under world coordinate system, then its
Corresponding point C in projector coordinates systempCoordinate be just denoted as Cw=[Xp Yp Zp];Projection equation is as follows:
Cp=RpCw+Tp (4)
It is hereby achieved that:
uF=fpxXn+ccpx (6)
up=(fpx+Δf)Xn+ccpx+Δcc (7)
Since projector intrinsic parameter includes error, resulting projection column coordinate uFWith error, and upPass through phase
It is directly calculated, does not include projector intrinsic parameter error, re-projection column coordinate u is calculatedFWith true column coordinate up, counterweight
Project column coordinate uFWith true column coordinate upIt makes the difference, obtains phase residual error;
5) all the points in the three dimensional point cloud PA of acquisition are handled according to step 4) is described, is obtained by column coordinate
uFWith upThe residual error set of composition can directly obtain u from phasep, u is obtained further according to a re-projection of cloud PAFAnd XnAfterwards using most
Small two, which multiply principle, obtains the corrected value of projector intrinsic parameter, the i.e. error amount of transverse direction equivalent focal length correction value delta f and lateral optical center
Δ cc obtains following formula according to the derivation in step 4)
up-uF=(Δ f) Xn+(Δcc) (8)
6) projector intrinsic parameter is directly corrected according to correction value delta f and Δ cc to get the mark again of projector intrinsic parameter is arrived
Definite value.
Equipment used in the parameter recalibration method of above structure light three-dimension measuring system, is characterized in that: including white
Scaling board, two industrial cameras, a Digital light projector, a computer and data transmission link and control route, will
One camera and projector point or so are fixed on bracket, and by camera in bracket one end, projector is hit exactly in bracket, adjust optical axis
Angle less parallel constitutes structured light three-dimensional measurement system, is then demarcated for the first time to this structured light three-dimensional measurement system, just
After the completion of secondary calibration, another auxiliary camera is placed in the bracket other end, adjusts the camera focus, focusing to tested plane, two
Platform camera and projector pass through data transmission link and control route is connect with computer, and it is unglazed that whole system is placed in one
In darkroom, white calibration plate is placed in focal distance front-rear position on projector projects direction, show that projected image can clearly
In tested flat area, two phase functions take calibration plate pattern simultaneously, starting computer-controlled program control projector to
Scaling board projects digital raster image, and acquires the plate image after being projected in real time by two cameras in left and right, completes acquisition
Afterwards, the image of acquisition is handled according to recalibration method, be obtained by calculation projector intrinsic parameter recalibration result and
System parameter after recalibration.
Advantages of the present invention and remarkable result: the mode for being all made of re-projection at present evaluates stated accuracy, but in projector
The calibrated error of parameter has no idea to find by re-projection, therefore is difficult to further increase the stated accuracy of projector intrinsic parameter.
The present invention increases auxiliary camera in the system with a camera and a projector and carries out recalibration to projector intrinsic parameter.
High-precision white plate, projector projects structured light patterns are placed, original system camera and auxiliary camera acquire white plate figure
Case.Double camera is demarcated first, obtains auxiliary camera parameter;Secondly using the photo of shooting according to principle of stereoscopic vision weight
Build white plate, the Dian Yun back projection of reconstruction to projector is practised physiognomy again on, calculate corresponding projected phase, and with
Its actual phase makes the difference to obtain phase residual error value, finally using the principle of least square be calculated projector transverse direction equivalent focal length and
The error amount of lateral optical center is corrected the projector intrinsic parameter of structured light three-dimensional measurement system, completes projector intrinsic parameter
Recalibration, further increase its three-dimensional stated accuracy or even measurement accuracy.System reconstructing result and recalibration after recalibration
Before compared to having clear improvement, absolute spatial position and relative accuracy are all improved.
Detailed description of the invention
Fig. 1 is impact analysis of the lateral principal point error for system;
Fig. 2 is the influence result signal of lateral principal point error;
Fig. 3 is impact analysis of the lateral equivalent focal length error for system;
Fig. 4 is the influence result signal of lateral equivalent focal length error pair;
Fig. 5 is using equipment structure chart used in the method for the present invention.
Specific embodiment
A kind of projector intrinsic parameter recalibration method of structured light three-dimensional measurement system of the present invention, specific to one
The measuring system of camera and a projector improves system calibrating precision.Specifically increase auxiliary camera on original system, places
High-precision white plate (scaling board), projector projects structured light patterns, original system camera and auxiliary camera acquisition white are flat
Plate pattern.Double camera is demarcated first, obtains auxiliary camera parameter;Secondly former according to stereoscopic vision using the photo of shooting
Reason rebuilds white plate, the Dian Yun back projection of reconstruction to projector is practised physiognomy again on, calculate corresponding projected phase,
And it makes the difference to obtain phase residual error value with its actual phase;Projector laterally equivalent coke finally is calculated using the principle of least square
Away from the error amount with lateral optical center, the recalibration of projector intrinsic parameter is completed, improves the calibration essence of structured light three-dimensional measurement system
Degree.
If the lateral principal point in projector intrinsic parameter is ccpx, true value ccT, influence of the error for system such as Fig. 1 institute
Show.MlMrRepresent the line of two o'clock on physical plane in space, Ml'Mr' represent the M after three-dimensional reconstructionlMr.Each coordinate in Fig. 1
System is defined as follows: Ow:{Xw Yw ZwRepresent world coordinate system, corresponding [Xw Yw Zw] certain point is represented in space in world coordinates
Coordinate value under system;Define Op:{Xp Yp ZpRepresent projector coordinates system, corresponding [Xp Yp Zp] represent certain point in space and exist
Coordinate value under projector coordinates system;Define Oc:{Xc Yc ZcRepresent camera coordinates system, corresponding [Xc Yc Zc] represent in space
Coordinate value of the certain point under camera coordinates system;Define { uc vcRepresent the pixel coordinate system of camera imaging front, corresponding ucWith
vcThe column coordinate and row coordinate of certain point on camera imaging front are respectively represented, unit is pixel;Define { up vpRepresent projection
Instrument projects the pixel coordinate system of front, corresponding upWith vpThe column coordinate and row for respectively representing certain point on projector projects front are sat
Mark, unit is pixel.Remember lateral principal point ccpxThe error for including is Δ cc, can be expressed as
Δ cc=ccT-ccpx
As seen from Figure 1, actual object MlMrError be more than the translation of position, but including certain rotation and
Deformation.Point cloud area after reconstruction is slightly larger than original objects, and not parallel with original objects.This means that the point cloud after rebuilding is deposited
In certain linear deformation, and the error as caused by principal point offset can't be reacted directly into the result of re-projection.Fig. 1 institute
Corresponding plane emulation signal is as shown in Figure 2.
If the lateral equivalent focal length in projector intrinsic parameter is fpx, true value fT, influence of the error for system such as Fig. 3
It is shown.As can be seen that the error of lateral equivalent focal length can't cause the obvious inclined of a cloud position as lateral principal point error
Difference.Point cloud after reconstruction is equipped with a kind of " tendency " of rotation compared to raw bits, and rotary middle point is denoted as M.And it can be seen that rotation
During turning, there is no the offsets for generating position by point M.Remember fpxError be Δ f, can indicate are as follows:
Δ f=fT-fpx
Wherein fTIt is the true value after correction, for example, in Fig. 3, Δ f < 0.Plane corresponding to Fig. 3 emulation signal such as Fig. 4
It is shown.
Structured-light system is generally made of a projector and a camera, and specific three-dimensional measurement scheme is as follows:
Projector projects one group of grating to testee, utilizes the available warp of certain methods in phase measuring profilometer
The phase that object surface depth is modulated, accordingly can directly reverse obtain world coordinates.Formula is as follows:
Wherein fcx,fcy,fpxRespectively represent the lateral equivalent focal length of camera, the transverse direction of longitudinal equivalent focal length and projector
Equivalent focal length.cccx,cccy,ccpxRespectively represent the lateral principal point of the lateral principal point of camera, longitudinal principal point and projector, Xw,
Yw,ZwRepresent coordinate value of the certain point under world coordinate system in space.Due to fpxWith ccpxIt include error, therefore by above formula
Obtained reconstruction point cloud also includes error.ri,mj,tkBy Rc,Tc,Rp,TpIt obtains, wherein ri=r1~r9, mj=m1~m9, tk=
t1~t6, Rc,TcRepresent the spin matrix and translation vector of camera, Rp,TpRepresent the spin matrix and translation vector of projector.It is fixed
Justice is as follows:
Above system parameter can be obtained by the first calibration to system parameter.
The bearing calibration of projector intrinsic parameter is specific as follows:
It is assumed that giving an arbitrary point C in space under world coordinate systemw, remember Cw=[Xw Yw Zw] indicate that the point is sat in the world
The coordinate under system is marked, then its corresponding point C in projector coordinates systempCoordinate be denoted as Cp=[Xp Yp Zp].Projection equation is such as
Under:
Cp=RpCw+Tp (4)
In practice, it needs to use normalized projector coordinates, is defined as Xn=(Xp/Zp)。
Further assume that uFIt is obtained for projection, contains intrinsic parameter error;And upIt is directly calculated, does not include interior for phase
Parameter error.It is then available:
uF=fpxXn+ccpx (6)
up=(fpx+Δf)Xn+ccpx+Δcc (7)
It is possible thereby to export
up-uF=(Δ f) Xn+(Δcc) (8)
According to the three-dimensional reconstruction formula of structure light it is found that u can be directly obtained from phasep, further according to the throwing again of true point cloud
Shadow obtains uFAnd XnAfterwards, correction value delta f and Δ cc can be obtained according to the principle of least square.
Such as Fig. 5, equipment used in the parameter recalibration method of structured light three-dimensional measurement system includes white calibration plate, two
Platform industrial camera, a Digital light projector, a computer and data transmission link and control route, by a camera and
Projector point or so is fixed on bracket, and by camera in bracket one end, projector is hit exactly in bracket, constitutes structural light three-dimensional measurement
System then demarcates this structured light three-dimensional measurement system for the first time, and after the completion of first calibration, another auxiliary camera is set
In the bracket other end, the camera focus is adjusted, is focused to tested plane, two cameras and projector pass through data transmission link
It is connect with control route with computer, whole system is placed in a unglazed darkroom, white calibration plate is placed in projector and is thrown
Focal distance front-rear position on direction is penetrated, makes projected image that can clearly be shown in tested flat area, is placed one after master plate
It opens with black dossal, two phase functions take calibration plate pattern simultaneously, and starting computer-controlled program controls projector to mark
Fixed board projects digital raster image, and acquires the plate image after being projected in real time by two cameras in left and right, after completing acquisition,
The image of acquisition is input in matched computer program, the recalibration result and again of projector intrinsic parameter is obtained by calculation
Calibrated system parameter.
1) as shown in figure 5, constructing the structured light three-dimensional measurement system being made of a camera and a projector first, and
System is demarcated.
2) as shown in figure 5, increasing auxiliary camera in original system structure, and one piece of high-precision white plate is placed in tested
In region, adjustment auxiliary camera is focused to focal plane.
3) auxiliary camera is demarcated, and on the basis of original structure light three-dimension measuring system, dual camera systems is carried out
Combined calibrating.
4) start projector projects grating pattern, two cameras acquire plate pattern in real time simultaneously respectively.
5) according to two collected photos of camera institute, point cloud registering and three-dimensional reconstruction are carried out according to principle of stereoscopic vision,
Obtain the three-dimensional point cloud of white plate.
7) three-dimensional point cloud of acquisition is projected on the plane of departure of projector according to proj ector parameters, i.e., according to the cloud
Re-projection obtain uFAnd Xn.U is obtained according further to phase calculationp, to uFAnd upIt makes the difference, obtains phase residual error.
8) corrected value of projector intrinsic parameter is calculated using the principle of least square according to phase residual error, completes system
The recalibration of parameter.
Claims (2)
1. a kind of parameter recalibration method of structured light three-dimensional measurement system, structured light three-dimensional measurement system include a camera and
One projector, it is characterised in that: the proj ector parameters in structured light three-dimensional measurement system are demarcated for the first time first, then
An auxiliary camera is added in structured light three-dimensional measurement system, is based on missing intrinsic parameter in the first calibration process of proj ector parameters
Parameter error, is attributed in projector intrinsic parameter the error of lateral principal point and lateral equivalent focal length by the analysis of difference, and post analysis
The specific influence of lateral principal point and lateral equivalent focal length both intrinsic parameter errors for system out, by auxiliary camera recalibration
The intrinsic parameter of projector, to improve the stated accuracy of structured light three-dimensional measurement system;The following steps are included:
1) camera and projector are built into structured light three-dimensional measurement system, the parameter of projector are demarcated for the first time,
Projector projects one group of grating to tested white calibration plate, using phase measuring profilometer method, obtains through being tested white calibration
The phase of plate surface depth modulation, direct reverse obtains world coordinates accordingly:
Wherein, fcx,fcy,fpxRespectively represent the equivalent coke of transverse direction of the lateral equivalent focal length of camera, longitudinal equivalent focal length and projector
Away from;cccx,cccy,ccpxRespectively represent the lateral principal point of the lateral principal point of camera, longitudinal principal point and projector;Xw,Yw,ZwIt represents
Coordinate value of the certain point under world coordinate system in space;Due to fpxWith ccpxSeparately include error delta f and Δ cc, Δ f=
fT-fpx,fTFor fpxTrue value, Δ cc=ccT-ccpx, ccTFor ccpxTrue value, therefore the reconstruction obtained by formula (1)~(3)
Point cloud also includes error;R in formula (1)~(3)i,mj,tkBy Rc,Tc,Rp,TpIt obtains, wherein ri=r1~r9, mj=m1~
m9, tk=t1~t6, Rc,TcRepresent the spin matrix and translation vector of camera, Rp,TpRepresent spin matrix and the translation of projector
Vector, concrete form are as follows:
2) auxiliary camera is added in the structured light three-dimensional measurement system that a camera and projector are constituted, the position of setting is basic
It is required that white calibration plate can be taken simultaneously for auxiliary camera and original camera, white calibration plate is placed in auxiliary camera and original
Have in the tested region of camera, combined calibrating is carried out to the dual camera systems being made of auxiliary camera and former camera, is assisted
Outer parameter matrix between the Intrinsic Matrix of camera and two cameras;
3) dialogue colour code fixed board is measured and is rebuild, and starts projector projects grating pattern, and two cameras acquire calibration respectively
Plate image is based on principle of stereoscopic vision, carries out rebuilding acquisition three-dimensional point using the image dialogue colour code fixed board that two cameras acquire
Cloud data PA;
4) the three dimensional point cloud PA of acquisition is calculated according to projection equation and is projected in the projection plane of projector, obtain uFWith
Xn, wherein uFThe column coordinate after projection plane, X are projected to for the proj ector parameters of the included error of three dimensional point cloud PAnIt indicates
Projector coordinates are normalized, X is defined asn=(Xp/Zp);One by one according further to projector projects pattern phase and projection plane
Corresponding relationship directly obtains up, upColumn coordinate for the projector projects plane directly calculated by phase considers in world coordinate system
An arbitrary point C in given space downw, remember Cw=[Xw Yw Zw] indicating coordinate of this under world coordinate system, then it is being projected
Corresponding point C in instrument coordinate systempCoordinate be just denoted as Cp=[Xp Yp Zp];Projection equation is as follows:
Cp=RpCw+Tp (4)
It is hereby achieved that:
uF=fpxXn+ccpx (6)
up=(fpx+Δf)Xn+ccpx+Δcc (7)
Since projector intrinsic parameter includes error, resulting projection column coordinate uFWith error, and upIt is direct by phase
It is calculated, does not include projector intrinsic parameter error, re-projection column coordinate u is calculatedFWith true column coordinate up, to re-projection
Column coordinate uFWith true column coordinate upIt makes the difference, obtains phase residual error;
5) all the points in the three dimensional point cloud PA of acquisition are handled according to step 4) is described, is obtained by column coordinate uFWith
upThe residual error set of composition can directly obtain u from phasep, u is obtained further according to a re-projection of cloud PAFAnd XnAfterwards, minimum is utilized
Two, which multiply principle, obtains the error amount Δ f of lateral equivalent focal length and the error amount Δ cc of lateral principal point, according to the derivation in step 4),
Obtain following formula
up-uF=(Δ f) Xn+(Δcc) (8)
6) projector intrinsic parameter is directly corrected according to error amount Δ f and Δ cc to get the recalibration value of projector intrinsic parameter is arrived.
2. equipment used in the parameter recalibration method of structured light three-dimensional measurement system according to claim 1, feature
It is: including white calibration plate, two industrial cameras, a Digital light projector, a computer and data transmission link
With control route, a camera and projector point or so are fixed on bracket, by camera in bracket one end, projector is in bracket
Center, adjust optical axis angle less parallel, constitute structured light three-dimensional measurement system, then to this structured light three-dimensional measurement system into
Another auxiliary camera is fixed on the bracket other end after the completion of first calibration by the first calibration of row, adjusts auxiliary camera coke
Away from, focusing to tested plane, two cameras and projector passes through data transmission link and control route is connect with computer, general
Whole system is placed in a unglazed darkroom, and white calibration plate is placed in focal distance front-rear position on projector projects direction,
Projected image is set clearly to be shown in white calibration plate region, two phase functions take the projection on white calibration plate simultaneously
Pattern, starting computer-controlled program controls projector and projects digital raster image to white calibration plate, and passes through left and right two
Camera acquires the white calibration plate image after being projected in real time, after completing acquisition, by the image of acquisition according to recalibration method into
Row processing, the recalibration result and the system parameter after recalibration that projector intrinsic parameter is obtained by calculation.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710695449.8A CN107462184B (en) | 2017-08-15 | 2017-08-15 | A kind of the parameter recalibration method and its equipment of structured light three-dimensional measurement system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710695449.8A CN107462184B (en) | 2017-08-15 | 2017-08-15 | A kind of the parameter recalibration method and its equipment of structured light three-dimensional measurement system |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107462184A CN107462184A (en) | 2017-12-12 |
CN107462184B true CN107462184B (en) | 2019-01-22 |
Family
ID=60549796
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710695449.8A Active CN107462184B (en) | 2017-08-15 | 2017-08-15 | A kind of the parameter recalibration method and its equipment of structured light three-dimensional measurement system |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN107462184B (en) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108132473A (en) * | 2017-12-25 | 2018-06-08 | 湖南卫导信息科技有限公司 | A kind of 3D methods of exhibiting of the navigation terminal test scene based on OpenGL |
CN109003308B (en) * | 2018-06-27 | 2022-03-18 | 浙江大学 | Special imaging range camera calibration system and method based on phase coding |
CN108827187B (en) * | 2018-07-28 | 2019-10-11 | 西安交通大学 | A kind of measuring three-dimensional profile system |
CN109194780B (en) * | 2018-08-15 | 2020-08-25 | 信利光电股份有限公司 | Rotation correction method and device of structured light module and readable storage medium |
CN109343076B (en) * | 2018-10-30 | 2020-06-19 | 合肥泰禾光电科技股份有限公司 | Distance calibration method and distance measuring device |
CN109712232B (en) * | 2018-12-25 | 2023-05-09 | 东南大学苏州医疗器械研究院 | Object surface contour three-dimensional imaging method based on light field |
CN110060301B (en) * | 2019-03-18 | 2023-02-10 | 盎锐(上海)信息科技有限公司 | Calibration system and method for projection grating modeling |
CN110118762B (en) * | 2019-05-14 | 2021-08-31 | 哈尔滨工业大学 | Flame CH group and NO molecule synchronous or selective excitation measuring device and method |
CN112292611A (en) * | 2019-05-24 | 2021-01-29 | 深圳市速腾聚创科技有限公司 | Coordinate correction method, coordinate correction device, computing equipment and computer storage medium |
CN110398199A (en) * | 2019-07-05 | 2019-11-01 | 内蒙古能建数字信息科技有限公司 | A kind of track clearance detection method |
CN110415303A (en) * | 2019-07-29 | 2019-11-05 | 华天慧创科技(西安)有限公司 | Scaling method is imaged in a kind of camera 3D imaging caliberating device and 3D |
TWI722703B (en) | 2019-12-09 | 2021-03-21 | 財團法人工業技術研究院 | Projecting appartus and projecting calibration method |
CN111397537B (en) * | 2020-04-03 | 2021-01-19 | 西安交通大学 | Principal point pixel coordinate solving method for projection system |
CN112361989B (en) * | 2020-09-30 | 2022-09-30 | 北京印刷学院 | Method for calibrating parameters of measurement system through point cloud uniformity consideration |
CN112284295B (en) * | 2020-10-28 | 2022-05-10 | 东南大学 | Camera and projector adjusting method for contour measurement |
CN112945090B (en) * | 2020-12-11 | 2023-04-21 | 深圳市菲森科技有限公司 | Calibration device and calibration method of three-dimensional measurement system |
CN113251951B (en) * | 2021-04-26 | 2024-03-01 | 湖北汽车工业学院 | Calibration method of line structured light vision measurement system based on single calibration surface mapping |
CN113298886B (en) * | 2021-07-27 | 2021-10-08 | 光量信息科技(宁波)有限公司 | Calibration method of projector |
CN113566709A (en) * | 2021-08-26 | 2021-10-29 | 苏州小优智能科技有限公司 | Calibration method and device of structured light measurement system and electronic equipment |
CN114463422B (en) * | 2022-04-14 | 2022-08-16 | 北京深度奇点科技有限公司 | Method and system for image measurement correction |
CN115526941B (en) * | 2022-11-25 | 2023-03-10 | 海伯森技术(深圳)有限公司 | Calibration device and calibration method for telecentric camera |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002086420A1 (en) * | 2001-04-19 | 2002-10-31 | Dimensional Photonics, Inc. | Calibration apparatus, system and method |
CN101697233B (en) * | 2009-10-16 | 2012-06-06 | 长春理工大学 | Structured light-based three-dimensional object surface reconstruction method |
CN103985121B (en) * | 2014-05-13 | 2017-02-01 | 北京航空航天大学 | Method for optical calibration of underwater projector structure |
CN104657982A (en) * | 2015-01-15 | 2015-05-27 | 华中科技大学 | Calibration method for projector |
CN105528770B (en) * | 2015-12-31 | 2018-11-06 | 河北工业大学 | A kind of projector lens distortion correction method |
CN106989695B (en) * | 2017-04-28 | 2020-03-31 | 广东工业大学 | Projector calibration method |
-
2017
- 2017-08-15 CN CN201710695449.8A patent/CN107462184B/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN107462184A (en) | 2017-12-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN107462184B (en) | A kind of the parameter recalibration method and its equipment of structured light three-dimensional measurement system | |
CN110207614B (en) | High-resolution high-precision measurement system and method based on double telecentric camera matching | |
CN105716542B (en) | A kind of three-dimensional data joining method based on flexible characteristic point | |
CN104240262B (en) | Camera external parameter calibration device and calibration method for photogrammetry | |
KR102236297B1 (en) | Calibration device and method for calibrating a dental camera | |
WO2018196303A1 (en) | Projector calibration method and apparatus based on multi-directional projection | |
CN109443245B (en) | Multi-line structured light vision measurement method based on homography matrix | |
CN110375648A (en) | The spatial point three-dimensional coordinate measurement method that the single camera of gridiron pattern target auxiliary is realized | |
CN107167093B (en) | A kind of the combined type measuring system and measurement method of laser line scanning and shadow Moire | |
CN110044301B (en) | Three-dimensional point cloud computing method based on monocular and binocular mixed measurement | |
CN105378794A (en) | 3d recording device, method for producing 3d image, and method for setting up 3d recording device | |
CN102721376A (en) | Calibrating method of large-field three-dimensional visual sensor | |
CN107808398B (en) | Camera parameter calculation device, calculation method, program, and recording medium | |
CN110398208A (en) | Big data deformation monitoring method based on photographic measuring apparatus system | |
CN108648242B (en) | Two-camera calibration method and device without public view field based on assistance of laser range finder | |
CN109285195B (en) | Monocular projection system pixel-by-pixel distortion correction method based on large-size target and application thereof | |
CN110260822B (en) | High-precision calibration method for multi-view structured light system | |
CN112415010B (en) | Imaging detection method and system | |
CN112489109B (en) | Three-dimensional imaging system method and device and three-dimensional imaging system | |
CN112815843A (en) | Online monitoring method for workpiece surface printing deviation in 3D printing process | |
CN106289086A (en) | A kind of for optical indicia dot spacing from the double camera measuring method of Accurate Calibration | |
JP3913901B2 (en) | Camera internal parameter determination device | |
CN109919856A (en) | Bituminous pavement construction depth detection method based on binocular vision | |
CN113724337A (en) | Camera dynamic external parameter calibration method and device without depending on holder angle | |
CN102628693A (en) | Method for registering camera spindle and laser beam in parallel |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
CB02 | Change of applicant information | ||
CB02 | Change of applicant information |
Address after: 210009 No. 87 Dingjiaqiao, Gulou District, Nanjing City, Jiangsu Province Applicant after: Southeast University Address before: No. 2, four archway in Xuanwu District, Nanjing, Jiangsu Applicant before: Southeast University |
|
GR01 | Patent grant | ||
GR01 | Patent grant |