CN107290377B - A sample plate positioning device for a total reflection X-ray fluorescence spectrometer - Google Patents
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Abstract
本发明涉及一种全反射X荧光光谱仪的样品盘定位装置，包括位于探测器下方的样品盘架，样品盘架的底面能够水平抽拉，样品盘水平设置于样品盘架的底面上，在样品盘架底面的下方设有压紧装置，在样品盘架两侧边框上设有水平定位装置。本发明解决了水平装样系统的全反射X射线荧光仪的装样和样品定位问题，定位装置不影响入射和出射光，该结构操作简单，位置固定。
The invention relates to a sample tray positioning device for a total reflection X-ray fluorescence spectrometer, which includes a sample tray rack located below a detector, the bottom surface of the sample tray rack can be drawn horizontally, and the sample tray is horizontally arranged on the bottom surface of the sample tray rack, and the A pressing device is provided under the bottom surface of the tray rack, and a horizontal positioning device is provided on both side frames of the sample tray rack. The invention solves the problem of sample loading and sample positioning of the total reflection X-ray fluorescence instrument of the horizontal sample loading system, the positioning device does not affect the incident and outgoing light, the structure is simple to operate, and the position is fixed.
Description
技术领域technical field
本发明属于全反射X荧光光谱仪的设计，具体涉及一种全反射X荧光光谱仪的样品盘定位装置。The invention belongs to the design of a total reflection X-ray fluorescence spectrometer, in particular to a sample disk positioning device of a total reflection X-ray fluorescence spectrometer.
背景技术Background technique
全反射X荧光光谱仪(TXRF)具有灵敏度高(pg-ng)，样品用量少(ng-μg，包括微米级微尘样品)，定量准确、样品无需消化，即可直接和多元素同时分析等一系列突出优点。TXRF体积小，可带到取样现场，能够分析中子活化(NAA)不能分析的Pb，S，As等元素。Total reflection X-ray fluorescence spectrometer (TXRF) has high sensitivity (pg-ng), less sample consumption (ng-μg, including micron dust samples), accurate quantification, samples can be directly analyzed simultaneously with multiple elements without digestion, etc. A series of outstanding advantages. TXRF is small in size and can be taken to the sampling site, and can analyze Pb, S, As and other elements that cannot be analyzed by neutron activation (NAA).
TXRF与普通的ED-XRF不同之处在于经过切割反射体，当X射线发生全反射时，入射X射线和出射线的强度相等，消除了原级X射线在反射体上的相干和不相干散射现象，使散射本底降低了3个多量级，从而大大提高了峰背比。TXRF就是利用X射线全反射原理，将样品在反射体兼样品架上涂成薄层进行激发，达到降低散射本底、提高峰背比，以实现痕量元素分析的一项高新分析技术。The difference between TXRF and ordinary ED-XRF is that after cutting the reflector, when the X-ray is totally reflected, the intensity of the incident X-ray and the outgoing ray are equal, eliminating the coherent and incoherent scattering of the primary X-ray on the reflector The phenomenon reduces the scattering background by more than 3 orders of magnitude, thereby greatly improving the peak-to-background ratio. TXRF is a high-tech analysis technology that uses the principle of total X-ray reflection to coat the sample in a thin layer on the reflector and sample holder for excitation to reduce the scattering background, increase the peak-to-background ratio, and achieve trace element analysis.
TXRF样品架的位置位于探测器正下方，用于承载样品盘，第二次全反射应该发生在样品盘表面中部。对Mo靶X射线荧光全反射角度为0.1度，微小的位置变化会造成很大的误差，因此，对样品架及定位装置精度要求严格。The position of the TXRF sample holder is located directly below the detector to hold the sample disk, and the second total reflection should occur in the middle of the surface of the sample disk. The total reflection angle of X-ray fluorescence for Mo target is 0.1 degree, and a small position change will cause a large error. Therefore, the accuracy of the sample holder and positioning device is strictly required.
布鲁克的TXRF仪的样品盘是竖直放置，固定样品盘采用夹片式固定方式，将样品架向外拉出，装样后将样品架送入进行测量，这种装样方式对固体微尘颗粒样品测量存在困难。The sample tray of Bruker’s TXRF instrument is placed vertically, and the fixed sample tray adopts a clip-type fixing method. The sample rack is pulled out, and the sample rack is sent in for measurement after loading the sample. This loading method is very sensitive to solid dust Particulate samples are difficult to measure.
对于水平装样系统，不适合采用夹片式样品架及定位，样品架装在入射光方向及两侧都会影响入射光到达样品盘表面，装在出射光方向影响样品放入与取出，不方便仪器调试。For the horizontal sample loading system, it is not suitable to use the clip-type sample rack and positioning. The sample rack installed in the direction of the incident light and on both sides will affect the incident light to reach the surface of the sample plate, and the direction of the outgoing light will affect the insertion and removal of the sample, which is inconvenient. Instrument debugging.
发明内容Contents of the invention
本发明的目的在于针对现有技术中存在的问题，提供一种适用于水平装样系统的全反射X荧光光谱仪的样品盘定位装置，方便仪器调试及装放样品和定位。The object of the present invention is to solve the problems existing in the prior art, and provide a sample tray positioning device suitable for a total reflection X-ray fluorescence spectrometer of a horizontal sample loading system, which is convenient for instrument debugging, loading and positioning of samples.
本发明的技术方案如下：一种全反射X荧光光谱仪的样品盘定位装置，包括位于探测器下方的样品盘架，样品盘架的底面能够水平抽拉，样品盘水平设置于样品盘架的底面上，在样品盘架底面的下方设有压紧装置，在样品盘架两侧边框上设有水平定位装置。The technical scheme of the present invention is as follows: a sample tray positioning device for a total reflection X-ray fluorescence spectrometer, including a sample tray rack located below the detector, the bottom surface of the sample tray rack can be drawn horizontally, and the sample tray is horizontally arranged on the bottom surface of the sample tray rack On the top, a pressing device is provided under the bottom surface of the sample tray rack, and a horizontal positioning device is provided on the side frames of the sample tray rack.
进一步，如上所述的全反射X荧光光谱仪的样品盘定位装置，其中，所述的压紧装置包括倾斜设置的压板和与压板端部连接的升降轴，所述升降轴的上端连接有弹簧，弹簧的顶端设有钢珠，当样品盘处于测量位置时，通过样品盘架的底面下压所述压紧装置的压板一侧，使压板另一侧端部的升降轴向上运动顶起所述钢珠，从而压紧样品盘。Further, the sample tray positioning device of the total reflection X-ray fluorescence spectrometer as described above, wherein the pressing device includes a pressing plate arranged obliquely and a lifting shaft connected to the end of the pressing plate, and a spring is connected to the upper end of the lifting shaft, The top of the spring is provided with a steel ball. When the sample tray is in the measuring position, the bottom surface of the sample tray holder presses down one side of the pressing plate of the pressing device, so that the lifting shaft at the other end of the pressing plate moves upward to lift the Steel balls, thereby compressing the sample pan.
进一步，如上所述的全反射X荧光光谱仪的样品盘定位装置，其中，所述压板能以圆柱销为中心转动，在压板设升降轴的一端下方连接复位弹簧。Further, in the sample tray positioning device of the total reflection X-ray fluorescence spectrometer as described above, wherein the pressing plate can rotate around the cylindrical pin, and a return spring is connected under the end of the pressing plate where the lifting shaft is arranged.
进一步，如上所述的全反射X荧光光谱仪的样品盘定位装置，其中，所述的水平定位装置包括位于样品盘架两侧边框上的凸缘，在所述凸缘上设有定位顶珠，所述定位顶珠顶住样品盘的边缘。Further, the sample tray positioning device of the total reflection X-ray fluorescence spectrometer as described above, wherein, the horizontal positioning device includes flanges located on both sides of the sample tray frame, and positioning beads are arranged on the flanges, so that The positioning beads rest against the edge of the sample pan.
本发明的有益效果如下：本发明所提供的全反射X荧光光谱仪的样品盘定位装置采用抽拉上顶式，与布鲁克的TXRF仪的样品架不同。该装置的样品盘固定结构，方便装样、放样，以及样品到位后的固定。将样品盘架水平抽出，可实现样品放入与取出。样品盘定位点位于样品盘边缘，不影响入射和出射光，方便仪器调试及装放样品和定位，对于固体微尘颗粒样品也不影响测量。本发明解决了水平装样系统的全反射X射线荧光仪的装样和样品定位问题，该结构操作简单，位置固定。The beneficial effects of the present invention are as follows: the sample tray positioning device of the total reflection X-ray fluorescence spectrometer provided by the present invention adopts a pull-up top type, which is different from the sample holder of Bruker's TXRF instrument. The sample tray fixing structure of the device is convenient for sample loading, setting out, and fixing of samples after they are in place. Pull out the sample rack horizontally to realize putting in and taking out samples. The positioning point of the sample tray is located on the edge of the sample tray, which does not affect the incident and outgoing light, which is convenient for instrument debugging, loading and positioning of samples, and does not affect the measurement of solid dust particle samples. The invention solves the problem of sample loading and sample positioning of the total reflection X-ray fluorescence instrument of the horizontal sample loading system, and the structure is simple to operate and the position is fixed.
附图说明Description of drawings
图1为本发明全反射X荧光光谱仪的样品盘定位装置结构原理图；Fig. 1 is the structural schematic diagram of the sample tray positioning device of the total reflection X-ray fluorescence spectrometer of the present invention;
图2为样品盘定位装置的机械结构图；Fig. 2 is a mechanical structure diagram of the sample tray positioning device;
图3为样品盘定位装置的俯视图；3 is a top view of the sample tray positioning device;
图4为样品盘定位装置处于不同位置的结构原理图。Fig. 4 is a schematic diagram of the structure of the sample tray positioning device in different positions.
图中，1.探测器 2.样品盘 3.样品盘架 4.压板 5.压紧件 6.凸缘 7.定位顶珠8.圆柱销 9.复位弹簧 10.升降轴In the figure, 1. Detector 2. Sample tray 3. Sample tray rack 4. Press plate 5. Press piece 6. Flange 7. Positioning top ball 8. Cylindrical pin 9. Return spring 10. Lifting shaft
具体实施方式Detailed ways
下面结合附图和实施例对本发明进行详细的描述。The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.
如图1所示，本发明所提供的全反射X荧光光谱仪的样品盘定位装置，包括位于探测器1下方的样品盘架3，样品盘架3的底面能够水平抽拉，样品盘2水平设置于样品盘架3的底面上，在样品盘架底面的下方设有压紧装置，压紧装置包括倾斜设置的压板4和位于压板端部的压紧件5，在样品盘架两侧边框上设有水平定位装置。As shown in Figure 1, the sample tray positioning device of the total reflection X-ray fluorescence spectrometer provided by the present invention includes a sample tray rack 3 located below the detector 1, the bottom surface of the sample tray rack 3 can be drawn horizontally, and the sample tray 2 is arranged horizontally On the bottom surface of the sample rack 3, a pressing device is provided below the bottom surface of the sample rack. The pressing device includes a pressing plate 4 arranged obliquely and a pressing member 5 located at the end of the pressing plate. Equipped with horizontal positioning device.
作为一个具体的实施例，压紧装置的结构如图2所示，所述压紧装置包括倾斜设置的压板4，在压板一端的上方连接升降轴10，所述升降轴10的上端连接有弹簧，弹簧的顶端设有钢珠，升降轴、弹簧、钢珠即构成了压紧件5的一种实施方式。压板4能以圆柱销8为中心转动，在压板4设升降轴的一端下方连接复位弹簧9。当样品盘2处于测量位置时(即位于探测器1的正下方)，通过样品盘架3的底面下压所述压紧装置的压板4一侧，压板4便围绕圆柱销8发生旋转，使压板另一侧端部的升降轴10向上运动，升降轴10通过弹簧顶起钢珠，从而通过钢珠压紧样品盘2。As a specific embodiment, the structure of the pressing device is shown in Figure 2. The pressing device includes a pressing plate 4 arranged obliquely, and a lifting shaft 10 is connected above one end of the pressing plate, and a spring is connected to the upper end of the lifting shaft 10. , The top of the spring is provided with a steel ball, and the lifting shaft, the spring, and the steel ball constitute an embodiment of the pressing member 5. Pressing plate 4 can be rotated with cylindrical pin 8 as the center, and reset spring 9 is connected below the end of pressing plate 4 where the lifting shaft is established. When the sample disk 2 is in the measurement position (that is, directly below the detector 1), the bottom surface of the sample disk holder 3 presses down on the side of the pressing plate 4 of the pressing device, and the pressing plate 4 rotates around the cylindrical pin 8, so that The elevating shaft 10 at the other end of the pressing plate moves upwards, and the elevating shaft 10 lifts up the steel ball through the spring, thereby compressing the sample tray 2 through the steel ball.
由于在压板4连接升降轴的一端下方连接有复位弹簧9，当样品盘2随着样品盘架3外抽时，样品盘架3的底面脱离压板4，压板4连接升降轴的一端被复位弹簧9下拉，使得升降轴10随之向下运动。由于升降轴10的下移释放了其顶端弹簧对钢珠的压紧力，使样品盘2能够随样品盘架3向外抽拉。Since the return spring 9 is connected below the end of the pressure plate 4 connected to the lifting shaft, when the sample tray 2 is pulled out along with the sample tray rack 3, the bottom surface of the sample tray 3 is separated from the press plate 4, and the end of the press plate 4 connected to the lift shaft is moved by the return spring. 9 pull down, so that the lifting shaft 10 moves downwards thereupon. Since the downward movement of the lifting shaft 10 releases the pressing force of the top spring on the steel ball, the sample tray 2 can be pulled outward along with the sample tray rack 3 .
如图3所示，所述水平定位装置包括位于样品盘架3两侧边框上的凸缘6，在所述凸缘6上设有定位顶珠7，所述定位顶珠7顶住样品盘2的边缘。在本实施例中，一侧凸缘上设置两个定位顶珠，另一侧凸缘上设置一个定位顶珠。As shown in FIG. 3 , the horizontal positioning device includes flanges 6 positioned on both side frames of the sample tray rack 3 , on which flanges 6 are provided with positioning top beads 7 , and the positioning top beads 7 withstand the bottom of the sample tray 2 . edge. In this embodiment, two positioning balls are provided on one side flange, and one positioning ball is provided on the other side flange.
在装样时，将样品盘架底面抽出，如图4中所示的A状态，将样品盘2放置在样品盘架3的表面；然后将样品盘架3送回，在样品盘架3推回到位时将压板4压下，把压板端部的压紧件5顶起压紧样品盘2，如图4中所示的B状态；样品盘2上面通过凸缘6上的定位顶珠保证样品盘的水平位置，如图4中所示的C状态。When loading samples, pull out the bottom surface of the sample rack, and place the sample rack 2 on the surface of the sample rack 3 in state A shown in Figure 4; When returning to the position, press down the pressure plate 4, and press the pressing part 5 at the end of the pressure plate to press the sample plate 2, as shown in the B state in Figure 4; The horizontal position of the disc is in state C as shown in FIG. 4 .
显然，本领域的技术人员可以对本发明进行各种改动和变型而不脱离本发明的精神和范围。这样，倘若对本发明的这些修改和变型属于本发明权利要求及其同等技术的范围之内，则本发明也意图包含这些改动和变型在内。Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and equivalent technologies, the present invention also intends to include these modifications and variations.
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